CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 D Phase-Lock Loop Clock Driver for Double D D D D D D D D D PW PACKAGE (TOP VIEW) Data-Rate Synchronous DRAM Applications Spread Spectrum Clock Compatible Operating Frequency: 60 MHz to 180 MHz Low Jitter (cyc–cyc): ±50 ps Distributes One Differential Clock Input to Four Differential Clock Outputs Enters Low Power Mode and Three-State Outputs When Input CLK Signal Is Less Than 20 MHz or PWRDWN Is Low Operates From Dual 2.5-V Supplies 28-Pin TSSOP Package Consumes < 200-µA Quiescent Current External Feedback PIN (FBIN, FBIN) Are Used to Synchronize the Outputs to the Input Clocks GND Y0 Y0 VDDQ GND CLK CLK VDDQ AVDD AGND VDDQ Y1 Y1 GND 1 28 2 27 3 26 4 25 5 24 6 23 7 22 8 21 9 20 10 19 11 18 12 17 13 16 14 15 GND Y3 Y3 VDDQ PWRDWN FBIN FBIN VDDQ FBOUT FBOUT VDDQ Y2 Y2 GND description The CDCV855 is a high-performance, low-skew, low-jitter zero delay buffer that distributes a differential clock input pair (CLK, CLK) to four differential pairs of clock outputs (Y[0:3], Y[0:3]) and one differential pair of feedback clock outputs (FBOUT, FBOUT). When PWRDWN is high, the outputs switch in phase and frequency with CLK. When PWRDWN is low, all outputs are disabled to a high-impedance state (3-state), and the PLL is shut down (low-power mode). The device also enters this low-power mode when the input frequency falls below a suggested detection frequency that is below 20 MHz (typical 10 MHz). An input frequency detection circuit detects the low-frequency condition and after applying a >20-MHz input signal this detection circuit turns on the PLL again and enables the outputs. When AVDD is tied to GND, the PLL is turned off and bypassed for test purposes. The CDCV855 is also able to track spread spectrum clocking for reduced EMI. Since the CDCV855 is based on PLL circuitry, it requires a stabilization time to achieve phase-lock of the PLL. This stabilization time is required following power up. The CDCV855 is characterized for both commercial and industrial temperature ranges. AVAILABLE OPTIONS PACKAGED DEVICES TA TSSOP (PW) 0°C to 70°C CDCV855PW – 40°C to 85°C CDCV855IPW Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Copyright 2002, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 FUNCTION TABLE (Select Functions) INPUTS OUTPUTS PLL AVDD GND PWRDWN CLK CLK Y[0:3] Y[0:3] FBOUT FBOUT H L H L H L H Bypassed/Off GND H H L H L H L Bypassed/Off X L L H Z Z Z Z Off X L H L Z Z Z Z Off 2.5 V (nom) H L H L H L H On 2.5 V (nom) H H L H L H L On 2.5 V (nom) X <20 MHz{ <20 MHz{ Z Z Z Z Off † Typically 10 MHz functional block diagram 3 2 PWRDWN 12 24 Powerdown and Test Logic 9 AVDD 13 17 16 26 27 FBIN PLL 23 22 Terminal Functions TERMINAL NAME NO. I/O DESCRIPTION AGND 10 Ground for 2.5-V analog supply AVDD CLK, CLK 9 2.5-V analog supply FBIN, FBIN FBOUT, FBOUT GND PWRDWN 6, 7 I Differential clock input 23, 22 I Feedback differential clock input 19, 20 O Feedback differential clock output 1, 5, 14, 15, 28 24 Ground I Control input to turn device in the power-down mode VDDQ Y[0:3] 4, 8, 11, 18, 21, 25 3, 12, 17, 26 O Buffered output copies of input clock, CLK Y[0:3] 2, 13, 16, 27 O Buffered output copies of input clock, CLK 2 Y1 Y1 Y2 Y2 Y3 Y3 FBOUT 20 FBOUT 7 CLK FBIN 19 6 CLK Y0 Y0 2.5-V supply POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 absolute maximum ratings over operating free-air temperature (unless otherwise noted)† Supply voltage range, VDDQ, AVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 3.6 V Input voltage range, VI (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VDDQ + 0.5 V Output voltage range, VO (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VDDQ + 0.5 V Input clamp current, IIK (VI < 0 or VI > VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Output clamp current, IOK (VO < 0 or VO > VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous output current, IO (VO = 0 to VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous current to GND or VDDQ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA Package thermal impedance, θJA (see Note 3): PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105.8°C/W Storage temperature range Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed. 2. This value is limited to 3.6 V maximum. 3. The package thermal impedance is calculated in accordance with JESD 51. recommended operating conditions (see Note 4) MIN Supply voltage, VDDQ, AVDD TYP PWRDWN CLK, CLK, FBIN, FBIN High level input voltage, High-level voltage VIH PWRDWN DC input signal voltage (see Note 5) 2.7 V –0.3 VDDQ/2 – 0.18 0.7 V VDDQ/2 + 0.18 1.7 CLK, FBIN Output differential cross-voltage, VO(X) (see Note 7) 0.36 VDDQ/2 – 0.2 VDDQ/2 – 0.2 Input differential pair cross-voltage, VI(X) (see Note 7) Commercial Industrial V V V mA 12 mA 1 4 V/ns 0 85 –40 85 Low-level output current, IOL Input slew rate, SR (see Figure 7) VDDQ/2 VDDQ + 0.6 VDDQ/2 + 0.2 V VDDQ/2 + 0.2 –12 High-level output current, IOH Operating free free-air air temperature temperature, TA VDDQ + 0.3 VDDQ –0.3 Differential input signal voltage, VID (see Note 6) UNIT 2.3 CLK, CLK, FBIN, FBIN Low level input voltage, Low-level voltage VIL MAX V °C NOTES: 4. Unused inputs must be held high or low to prevent them from floating. 5. DC input signal voltage specifies the allowable dc execution of differential input. 6. Differential input signal voltage specifies the differential voltage |VTR – VCP| required for switching, where VTR is the true input level and VCP is the complementary input level. 7. Differential cross-point voltage is expected to track variations of VDDQ and is the voltage at which the differential signals must be crossing. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MAX UNIT –1.2 V Input voltage VOH High level output voltage High-level VOL Low level output voltage Low-level IOH IOL VOD Output voltage swing VOX Output differential cross-voltage} II Input current VDDQ = 2.7 V, VI = 0 V to 2.7 V ±10 µA IOZ High-impedance-state output current VDDQ = 2.7 V, VO = VDDQ or GND ±10 µA IDD(PD) Power-down current on VDDQ + AVDD CLK and CLK = 0 MHz; PWRDWN = Low; Σ of IDD and AIDD 100 200 µA Differential outputs are terminated with 120 Ω / CL = 14 pF 150 180 AIDD CI VDDQ = 2.3 V, II = –18 mA VDDQ = min to max, IOH = –1 mA TYP† VIK IDD All inputs MIN High-level output current VDDQ = 2.3 V, VDDQ = 2.3 V, IOL = 12 mA VO = 1 V Low-level output current VDDQ = 2.3 V, VO = 1.2 V Dynamic current on VDDQ Supply current on AVDD VDDQ – 0.1 1.7 VDDQ = 2.3 V, IOH = –12 mA VDDQ = min to max, IOL = 1 mA V 0.1 –18 –32 mA 26 35 mA 1.1 Differential outputs are terminated with 120 Ω Differential outputs are terminated with 120 Ω / CL = 0 pF V 0.6 VDDQ/2 – 0.2 VDDQ – 0.4 VDDQ/2 V VDDQ/2 + 0.2 fO = 167 MHz fO = 167 MHz VDDQ = 2.5 V mA 130 160 8 10 mA Input capacitance VI = VDDQ or GND 2 2.5 3 pF CO Output capacitance VDDQ = 2.5 V VO = VDDQ or GND 2.5 3 3.5 pF † All typical values are at respective nominal VDDQ. ‡ Differential cross-point voltage is expected to track variation of VDDQ and is the voltage at which the differential signals must be crossing. timing requirements over recommended ranges of supply voltage and operating free-air temperature PARAMETER fCLK Operating clock frequency Input clock duty cycle MIN MAX UNIT 60 180 MHz 40% 60% Stabilization time (PLL mode)W 10 µs Stabilization time (Bypass mode)w 30 ns § Recovery time required when the device goes from power-down mode into bypass mode (test mode with AVDD at GND). ¶ Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a fixed-frequency, fixed-phase reference signal must be present at CLK. Until phase lock is obtained, the specifications for propagation delay, skew, and jitter parameters given in the switching characteristics table are not applicable. This parameter does not apply for input modulation under SSC application. 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 switching characteristics PARAMETER tPLH} tPHL} tjit(per) ( )§ Test mode/CLK to any output High-to-low level propagation delay time Test mode/CLK to any output Jitter (period), (period) See Figure 5 tjit(cc) ( )§ Jitter (cycle-to-cycle), (cycle to cycle) See Figure 2 tjit(hper) jit(h er)§ Half-period Half eriod jitter, See Figure 6 tslr(o) TEST CONDITIONS Low-to-high level propagation delay time Output clock slew rate, rate See Figure 7 tsk(o)¶ Output skew, See Figure 4 ns 4.5 ns ps ps 100/133/167/180 MHz –35 35 66 MHz –60 60 100/133/167/180 MHz –50 50 66 MHz –130 130 100 MHz –90 90 133/167/180 MHz –75 75 Load = 120Ω / 14 pF 1 2 V/ns Load = 120Ω / 4 pF 1 3 V/ns 66 MHz –180 180 100/133 MHz –130 130 167/180 MHz –90 90 66 MHz –230 230 100/133 MHz –170 170 167/180 MHz –100 100 66 MHz –150 150 100/133/167/180 MHz –100 100 tr, tf Output rise and fall times (20% – 80%) Load: 120 Ω/14 pF † All typical values are at a respective nominal VDDQ. ‡ Refers to transition of noninverting output § This parameter is assured by design but can not be 100% production tested. ¶ All differential output pins are terminated with 120 Ω/14 pF. POST OFFICE BOX 655303 UNIT 55 SSC on Static phase offset, offset See Figure 3(a) MAX 4.5 –55 Dynamic phase hase offset (this includes jitter), See Figure 3(b) t(Ø) TYP† 66 MHz SSC off td(Ø)w MIN • DALLAS, TEXAS 75265 650 ps ps s ps ps 50 ps 900 ps 5 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 PARAMETER MEASUREMENT INFORMATION VDD/2 CDCV855 SCOPE C = 14 pF –VDD/2 Z = 50 Ω R = 10 Ω Z = 60 Ω R = 50 Ω V(TT) Z = 60 Ω R = 10 Ω Z = 50 Ω C = 14 pF R = 50 Ω –VDD/2 V(TT) –VDD/2 NOTE: V(TT) = GND Figure 1. Output Load Test Circuit Yx, FBOUT Yx, FBOUT tc(n) tc(n+1) tjit(cc) = tc(n) – tc(n+1) Figure 2. Cycle-to-Cycle Jitter 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 PARAMETER MEASUREMENT INFORMATION CLK CLK FBIN FBIN t(φ) n ∑1 t(φ) n+1 n=N t(φ) n t(φ) = N (N is a Large Number of Samples) (a) Static Phase Offset CLK CLK FBIN FBIN t(φ) td(φ) t(φ) td(φ) td(φ) td(φ) (b) Dynamic Phase Offset Figure 3. Phase Offset Yx Yx Yx, FBOUT Yx, FBOUT tsk(o) Figure 4. Output Skew POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 PARAMETER MEASUREMENT INFORMATION Yx, FBOUT Yx, FBOUT tc(n) Yx, FBOUT Yx, FBOUT 1 fo tjit(per) = tc(n) – 1 fo Figure 5. Period Jitter Yx, FBOUT Yx, FBOUT t(hper_n+1) t(hper_n) 1 fo 1 tjit(hper) = t(hper_n) – 2xfo Figure 6. Half-Period Jitter 80% 80% VID, VOD Clock Inputs and Outputs 20% 20% tslrr(i), tslrr(o) tslrf(i), tslrf(o) Figure 7. Input and Output Slew Rates 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 CDCV855, CDCV855I 2.5-V PHASE-LOCK LOOP CLOCK DRIVER SCAS660A – SEPTEMBER 2001 – REVISED DECEMBER 2002 MECHANICAL DATA PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE 14 PINS SHOWN 0,30 0,19 0,65 14 0,10 M 8 0,15 NOM 4,50 4,30 6,60 6,20 Gage Plane 0,25 1 7 0°–ā8° A 0,75 0,50 Seating Plane 0,15 0,05 1,20 MAX PINS ** 0,10 8 14 16 20 24 28 A MAX 3,10 5,10 5,10 6,60 7,90 9,80 A MIN 2,90 4,90 4,90 6,40 7,70 9,60 DIM 4040064/F 01/97 NOTES: A. B. C. D. All linear dimensions are in millimeters. This drawing is subject to change without notice. Body dimensions do not include mold flash or protrusion not to exceed 0,15. Falls within JEDEC MO-153 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by government requirements, testing of all parameters of each product is not necessarily performed. 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