NSC CLC115AI

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CLC115
Quad, Closed-Loop Monolithic Buffer
General Description
Features
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Closed-loop, quad buffer
700MHz small-signal bandwidth
270V/µs slew rate
0.08%/0.04° differential gain/phase
60dB channel isolation (10MHz)
-62dBc 2nd and 3rd harmonics at 20MHz
60mA current output per channel
Applications
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CLC115AJP
CLC115AJE
CLC115ALC
CLC115AMC
-40°C
-40°C
-40°C
-55°C
to
to
to
to
Multi-channel video distribution
Video switching buffers
High-speed analog multiplexing
Channelized EW
High-density buffering
Instrumentation amps
Active filters
CLC115
Quad, Closed-Loop Monolithic Buffer
June 1999
+85°C
+85°C
+85°C
+125°C
8-pin plastic DIP
8-pin plastic SOIC
dice
dice qualified to Method 5008,
MIL-STD-883, Level B
MIL-STD-883, Level B
Contact factory for other packages and DESC SMD number.
Pinout
© 1999 National Semiconductor Corporation
Printed in the U.S.A.
http://www.national.com
CLC115 Electrical Characteristics (Vcc = +5V, RL = 100Ω; unless specified)
Min/max ratings are based on product characterization and simulation. Individual parameters are tested as noted. Outgoing quality levels are
determined from tested parameters.
Package Thermal Resistance
Package
Plastic (AJP)
Surface Mount (AJE)
Reliability Information
Transistor Count
http://www.national.com
64
2
θJC
θJA
55°C/W
45°C/W
105°C/W
115°C/W
CLC115 Typical Performance Characteristics
3
Ω; unless specified)
(TA = +25°, VCC = ±5V, RL = 100Ω
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http://www.national.com
CLC115
Quad, Closed-Loop Monolithic Buffer
Customer Design Applications Support
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the president of National Semiconductor Corporation. As used herein:
1. Life support devices or systems are devices or systems which, a) are intended for surgical implant into the body, or b) support or
sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect its safety or effectiveness.
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National Semiconductor
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