DATA SHEET 8GB DDR3L SDRAM SO-DIMM EBJ81UG8EBU0 (1024M words × 64 bits, 2 Ranks) Specifications Features • Density: 8GB • Organization 1024M words × 64 bits, 2 ranks • Mounting 16 pieces of 4G bits DDR3L SDRAM sealed in FBGA • Package: 204-pin socket type small outline dual in-line memory module (SO-DIMM) PCB height: 30.0mm Lead pitch: 0.6mm Lead-free (RoHS compliant) and Halogen-free • Power supply: 1.35V (typ.) VDD = 1.283V to 1.45V Backward compatible for VDD = 1.5V ± 0.075V • Data rate: 1600Mbps/1333Mbps (max.) Backward compatible to1066Mbps/800Mbps/667Mbps • Eight internal banks for concurrent operation (components) • Burst lengths (BL): 8 and 4 with Burst Chop (BC) • /CAS Latency (CL): 5, 6, 7, 8, 9, 10, 11 • /CAS write latency (CWL): 5, 6, 7, 8 • Precharge: auto precharge option for each burst access • Refresh: auto-refresh, self-refresh • Refresh cycles Average refresh period 7.8µs at 0°C ≤ TC ≤ +85°C 3.9µs at +85°C < TC ≤ +95°C • Operating case temperature range TC = 0°C to +95°C • Double-data-rate architecture: two data transfers per clock cycle • The high-speed data transfer is realized by the 8 bits prefetch pipelined architecture • Bi-directional differential data strobe (DQS and /DQS) is transmitted/received with data for capturing data at the receiver • DQS is edge-aligned with data for READs; centeraligned with data for WRITEs • Differential clock inputs (CK and /CK) • DLL aligns DQ and DQS transitions with CK transitions • Commands entered on each positive CK edge; data and data mask referenced to both edges of DQS • Data mask (DM) for write data • Posted /CAS by programmable additive latency for better command and data bus efficiency • On-Die-Termination (ODT) for better signal quality Synchronous ODT Dynamic ODT Asynchronous ODT • Multi Purpose Register (MPR) for pre-defined pattern read out • ZQ calibration for DQ drive and ODT • Programmable Partial Array Self-Refresh (PASR) • /RESET pin for Power-up sequence and reset function • SRT range: Normal/extended • Programmable Output driver impedance control Document No. E1812E30 (Ver. 3.0) Date Published November 2011 (K) Japan Printed in Japan URL: http://www.elpida.com Elpida Memory, Inc. 2011 EBJ81UG8EBU0 Ordering Information Part number Data rate Mbps (max.) EBJ81UG8EBU0-GN-F 1600 EBJ81UG8EBU0-DJ-F 1333 Component JEDEC speed bin (CL-tRCD-tRP) Package Contact pad DDR3L-1600K (11-11-11) 204-pin SO-DIMM (lead-free and Gold DDR3L-1333H (9-9-9) halogen-free) Mounted devices EDJ4208EBBG-GN-F EDJ4208EBBG-GN-F EDJ4208EBBG-DJ-F Detailed Information For detailed electrical specifications and further information, please refer to the component DDR3L SDRAM datasheet EDJ4204EBBG, EDJ4208EBBG (E1808E). Data Sheet E1812E30 (Ver. 3.0) 2 EBJ81UG8EBU0 Pin Configurations Front side Back side Front side Back side Front side Back side Pin No. Pin name Pin No. Pin name Pin No. Pin No. Pin No. Pin name Pin No. Pin name 1 VREFDQ 2 VSS KEY 143 DQ35 144 VSS 3 VSS 4 DQ4 73 145 VSS 146 DQ44 5 DQ0 6 DQ5 75 VDD 76 VDD 147 DQ40 148 DQ45 7 DQ1 8 VSS 77 NC 78 A15 149 DQ41 150 VSS 9 VSS 10 /DQS0 79 BA2 80 A14 151 VSS 152 /DQS5 11 DM0 12 DQS0 81 VDD 82 VDD 153 DM5 154 DQS5 13 VSS 14 VSS 83 A12(/BC) 84 A11 155 VSS 156 VSS 15 DQ2 16 DQ6 85 A9 86 A7 157 DQ42 158 DQ46 17 DQ3 18 DQ7 87 VDD 88 VDD 159 DQ43 160 DQ47 19 VSS 20 VSS 89 A8 90 A6 161 VSS 162 VSS 21 DQ8 22 DQ12 91 A5 92 A4 163 DQ48 164 DQ52 23 DQ9 24 DQ13 93 VDD 94 VDD 165 DQ49 166 DQ53 25 VSS 26 VSS 95 A3 96 A2 167 VSS 168 VSS 27 /DQS1 28 DM1 97 A1 98 A0 169 /DQS6 170 DM6 29 DQS1 30 /RESET 99 VDD 100 VDD 171 DQS6 172 VSS 31 VSS 32 VSS 101 CK0 102 CK1 173 VSS 174 DQ54 33 DQ10 34 DQ14 103 /CK0 104 /CK1 175 DQ50 176 DQ55 35 DQ11 36 DQ15 105 VDD 106 VDD 177 DQ51 178 VSS 37 VSS 38 VSS 107 A10(AP) 108 BA1 179 VSS 180 DQ60 39 DQ16 40 DQ20 109 BA0 110 /RAS 181 DQ56 182 DQ61 41 DQ17 42 DQ21 111 VDD 112 VDD 183 DQ57 184 VSS 43 VSS 44 VSS 113 /WE 114 /CS0 185 VSS 186 /DQS7 45 /DQS2 46 DM2 115 /CAS 116 ODT0 187 DM7 188 DQS7 Pin name CKE0 74 Pin name CKE1 47 DQS2 48 VSS 117 VDD 118 VDD 189 VSS 190 VSS 49 VSS 50 DQ22 119 A13 120 ODT1 191 DQ58 192 DQ62 51 DQ18 52 DQ23 121 /CS1 122 NC 193 DQ59 194 DQ63 53 DQ19 54 VSS 123 VDD 124 VDD 195 VSS 196 VSS 55 VSS 56 DQ28 125 NC 126 VREFCA 197 SA0 198 NC 57 DQ24 58 DQ29 127 VSS 128 VSS 199 VDDSPD 200 SDA 59 DQ25 60 VSS 129 DQ32 130 DQ36 201 SA1 202 SCL 61 VSS 62 /DQS3 131 DQ33 132 DQ37 203 VTT 204 VTT 63 DM3 64 DQS3 133 VSS 134 VSS 65 VSS 66 VSS 135 /DQS4 136 DM4 67 DQ26 68 DQ30 137 DQS4 138 VSS 69 DQ27 70 DQ31 139 VSS 140 DQ38 71 VSS 72 VSS 141 DQ34 142 DQ39 Data Sheet E1812E30 (Ver. 3.0) 3 EBJ81UG8EBU0 Pin Description Pin name Function A0 to A15 Address input Row address Column address A10 (AP) Auto precharge A0 to A15 A0 to A9 A12 (/BC) Burst chop BA0, BA1, BA2 Bank select address /RAS Row address strobe /CAS Column address strobe /WE Write enable /CS0, /CS1 Chip select CKE0, CKE1 Clock enable CK0, CK1 Clock input /CK0, /CK1 Differential clock input ODT0, ODT1 ODT control DQ0 to DQ63 Data input/output DQS0 to DQS7, /DQS0 to /DQS7 Input and output data strobe DM0 to DM7 Input mask SCL Clock input for serial PD SDA Data input/output for serial PD SA0, SA1 VDD* 1 Address input for serial PD Power for internal circuit VDDSPD Power for serial PD VREFCA Reference voltage for CA VREFDQ Reference voltage for DQ VSS Ground VTT I/O termination supply for SDRAM /RESET Set DRAM to a known state NC No connection Note: 1. The VDD and VDDQ pins are tied common to a single power-plane on these designs. Front side 1 pin 71 pin 73 pin 203 pin 2 pin 72 pin 74 pin 204 pin Back side Data Sheet E1812E30 (Ver. 3.0) 4 EBJ81UG8EBU0 Serial PD Matrix -DJ -GN Byte No. Function described Hex Comments Hex Comments 0 Number of serial PD bytes written/SPD device size/CRC coverage 92h 176/256/0-116 92h 176/256/0-116 1 SPD revision 10h Rev.1.0 10h Rev.1.0 2 Key byte/DRAM device type 0Bh DDR3 SDRAM 0Bh DDR3 SDRAM 3 Key byte/module type 03h SO-DIMM 03h SO-DIMM 4 SDRAM density and banks 04h 4G bits, 8 banks 04h 4G bits, 8 banks 5 SDRAM addressing 21h 16 rows, 10 columns 21h 16 rows, 10 columns 6 Module nominal voltage, VDD 02h 1.5V/1.35V 02h 1.5V/1.35V 7 Module organization 09h 2 ranks/×8 bits 09h 2 ranks/x8 bits 8 Module memory bus width 03h 64 bits/non-ECC 03h 64 bits/non-ECC 9 Fine timebase (FTB) dividend/divisor 52h 5/2 52h 5/2 10 Medium timebase (MTB) dividend 01h 1 01h 1 11 Medium timebase (MTB) divisor 08h 8 08h 8 12 SDRAM minimum cycle time (tCK (min.)) 0Ch 1.5ns 0Ah 1.25ns 13 Reserved 00h — 00h — 14 SDRAM CAS latencies supported, LSB 7Eh 5, 6, 7, 8, 9, 10 FEh 5, 6, 7, 8, 9, 10, 11 15 SDRAM CAS latencies supported, MSB 00h — 00h — 16 SDRAM minimum CAS latencies time (tAA (min.)) 69h 13.125ns 69h 13.125ns 17 SDRAM minimum write recovery time (tWR (min.)) 78h 15ns 78h 15ns 18 SDRAM minimum /RAS to /CAS delay (tRCD (min.)) 69h 13.125ns 69h 13.125ns 19 SDRAM minimum row active to row active delay (tRRD (min.)) 30h 6ns 30h 6ns 20 SDRAM minimum row precharge time (tRP (min.)) 69h 13.125ns 69h 13.125ns 21 SDRAM upper nibbles for tRAS and tRC 11h — 11h — 20h 36ns 18h 35ns 89h 49.125ns 81h 48.125ns 20h 260ns 20h 260ns 08h 260ns 08h 260ns 3Ch 7.5ns 3Ch 7.5ns 3Ch 7.5ns 3Ch 7.5ns 22 23 24 25 26 27 SDRAM minimum active to precharge time (tRAS (min.)), LSB SDRAM minimum active to active /auto-refresh time (tRC (min.)), LSB SDRAM minimum refresh recovery time delay (tRFC (min.)), LSB SDRAM minimum refresh recovery time delay (tRFC (min.)), MSB SDRAM minimum internal write to read command delay (tWTR (min.)) SDRAM minimum internal read to precharge command delay (tRTP (min.)) 28 Upper nibble for tFAW 00h 30ns 00h 30ns 29 Minimum four activate window delay time (tFAW (min.)) F0h 30ns F0h 30ns 30 SDRAM optional features 83h DLL-off, RZQ/6, 7 83h DLL-off, RZQ/6, 7 81h PASR/2X refresh at +85ºC to +95ºC 31 SDRAM thermal and refresh options 81h PASR/2X refresh at +85ºC to +95ºC 32 Module thermal sensor 00h Not incorporated 00h Not incorporated 33 SDRAM device type 00h Standard 00h Standard 34 to 59 Reserved 00h — 00h — Data Sheet E1812E30 (Ver. 3.0) 5 EBJ81UG8EBU0 -DJ -GN Byte No. Function described Hex Comments Hex Comments 60 Module nominal height 0Fh 29 < height ≤ 30mm 0Fh 29 < height ≤ 30mm 61 Module maximum thickness 11h Dual sides 11h Dual sides 62 Reference raw card used 65h Raw Card F3 65h Raw Card F3 63 Address mapping from edge connector to DRAM 00h Standard 00h Standard 64 to 116 Reserved 00h — 00h — 117 Module ID: manufacturer’s JEDEC ID code, LSB 02h Elpida Memory 02h Elpida Memory 118 Module ID: manufacturer’s JEDEC ID code, MSB FEh Elpida Memory FEh Elpida Memory 119 Module ID: manufacturing location ×× — ×× — 120 Module ID: manufacturing date yy Year code (BCD) yy Year code (BCD) 121 Module ID: manufacturing date ww Week code (BCD) ww Week code (BCD) 122 to 125 Module ID: module serial number ×× — ×× — 126 Cyclical redundancy code (CRC) 30h — E5h — 127 Cyclical redundancy code (CRC) 4Fh — 91h — 128 Module part number 45h E 45h E 129 Module part number 42h B 42h B 130 Module part number 4Ah J 4Ah J 131 Module part number 38h 8 38h 8 132 Module part number 31h 1 31h 1 133 Module part number 55h U 55h U 134 Module part number 47h G 47h G 135 Module part number 38h 8 38h 8 136 Module part number 45h E 45h E 137 Module part number 42h B 42h B 138 Module part number 55h U 55h U 139 Module part number 30h 0 30h 0 140 Module part number 2Dh — 2Dh — 141 Module part number 44h D 47h G 142 Module part number 4Ah J 4Eh N 143 Module part number 2Dh — 2Dh — 144 Module part number 46h F 46h F 145 Module part number 20h (Space) 20h (Space) 146 Module revision code 30h Initial 30h Initial 147 Module revision code 20h (Space) 20h (Space) 148 SDRAM manufacturer’s JEDEC ID code, LSB 02h Elpida Memory 02h Elpida Memory 149 SDRAM manufacturer’s JEDEC ID code, MSB FEh Elpida Memory FEh Elpida Memory 150 to 175 Manufacturer's specific data 176 to 255 Open for customer use 00h — 00h — Data Sheet E1812E30 (Ver. 3.0) 6 EBJ81UG8EBU0 Block Diagram /CS0 /CS1 RDQS0 /RDQS0 RDQ[7:0] RDM0 DQS /CS /DQS DQ[7:0] DM D0 DQS /CS /DQS DQ[7:0] DM RDQS1 /RDQS1 RDQ[15:8] RDM1 DQS /CS /DQS DQ[7:0] DM D4 DQS /CS /DQS DQ[7:0] DM RDQS2 /RDQS2 RDQ[23:16] RDM2 DQS /CS /DQS DQ[7:0] DM D1 DQS /CS /DQS DQ[7:0] DM RDQS3 /RDQS3 RDQ[31:24] RDM3 DQS /CS /DQS DQ[7:0] DM D13 DQS /CS /DQS DQ[7:0] DM RDQS4 /RDQS4 RDQ[39:32] RDM4 DQS /CS /DQS DQ[7:0] DM D6 DQS /CS /DQS DQ[7:0] DM RDQS5 /RDQS5 RDQ[47:40] RDM5 DQS /CS /DQS DQ[7:0] DM D10 DQS /CS /DQS DQ[7:0] DM D2 RDQS6 /RDQS6 RDQ[55:48] RDM6 DQS /CS /DQS DQ[7:0] DM DQS /CS /DQS DQ[7:0] DM D7 RDQS7 /RDQS7 RDQ[63:56] RDM7 DQS /CS /DQS DQ[7:0] DM DQS /CS /DQS DQ[7:0] DM D3 /CS0 /CS1 CKE0 CKE1 ODT0 ODT1 BA[2:0] A[15:0] /RAS /CAS /WE /RESET D8 D12 D9 Rank0 SDRAMs Rank1 SDRAMs Rank0 SDRAMs Rank1 SDRAMs Rank0 SDRAMs Rank1 SDRAMs All SDRAMs All SDRAMs All SDRAMs All SDRAMs All SDRAMs All SDRAMs 3.3pF CK0 /CK0 D5 Rank0 SDRAMs 3.3pF CK1 /CK1 Rank1 SDRAMs D14 15Ω D15 D11 DQ[63:0] DQS[7:0] /DQS[7:0] DM[7:0] RDQ[63:0] RDQS[7:0] /RDQS[7:0] RDM[7:0] 39Ω BA[2:0] A[15:0] /RAS /CAS /WE VTT 39Ω /CS[1:0] CKE[1:0] ODT[1:0] V2 D12 V1 V9 D13 V8 D14 D15 V3 30Ω CK[1:0] V7 V4 D8 V5 D9 VTT 0.1µF VDD V6 D10 D11 /CK[1:0] 240Ω V4 D0 V5 D1 V3 D4 D2 V8 D5 VDDSPD VDD VTT VREFCA VREFDQ VSS V7 V1 D6 ZQ (Each SDRAM) D3 VTT V2 VSS V6 D7 Rank0 V9 Rank1 Serial PD All SDRAMs All SDRAMs All SDRAMs All SDRAMs, Serial PD Address, command and control line Serial PD SCL SA0 SA1 VSS Note : 1. DQ wiring may be changed within a byte. SCL SDA A0 A1 A2 WP VSS Data Sheet E1812E30 (Ver. 3.0) 7 SDA EBJ81UG8EBU0 Electrical Specifications • All voltages are referenced to VSS (GND). Absolute Maximum Ratings Parameter Symbol Value Unit Notes Power supply voltage VDD −0.4 to +1.975 V 1, 3, 4 Input voltage VIN −0.4 to +1.975 V 1, 4 Output voltage VOUT −0.4 to +1.975 V 1, 4 Reference voltage VREFCA −0.4 to 0.6 × VDD V 3, 4 Reference voltage for DQ VREFDQ −0.4 to 0.6 × VDDQ V 3, 4 1, 2, 4 Storage temperature Tstg −55 to +100 °C Power dissipation PD 8 W Short circuit output current IOUT 50 mA 1, 4 Notes: 1. Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Storage temperature is the case surface temperature on the center/top side of the DRAM. 3. VDD and VDDQ must be within 300mV of each other at all times; and VREF must be not greater than 0.6 × VDDQ, When VDD and VDDQ are less than 500mV; VREF may be equal to or less than 300mV. 4. DDR3L SDRAM component specification. Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Operating Temperature Condition Parameter Symbol Rating Unit Notes Operating case temperature TC 0 to +95 °C 1, 2, 3 Notes: 1. Operating temperature is the case surface temperature on the center/top side of the DRAM. 2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. During operation, the DRAM case temperature must be maintained between 0°C to +85°C under all operating conditions. 3. Some applications require operation of the DRAM in the Extended Temperature Range between +85°C and +95°C case temperature. Full specifications are guaranteed in this range, but the following additional conditions apply: a) Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to 3.9µs. (This double refresh requirement may not apply for some devices.) b) If Self-refresh operation is required in the Extended Temperature Range, then it is mandatory to either use the Manual Self-Refresh mode with Extended Temperature Range capability (MR2 bit [A6, A7] = [0, 1]) or enable the optional Auto Self-Refresh mode (MR2 bit [A6, A7] = [1, 0]). Data Sheet E1812E30 (Ver. 3.0) 8 EBJ81UG8EBU0 Recommended DC Operating Conditions (TC = 0°C to +85°C) Parameter Symbol min. typ. max. Unit Notes Supply voltage VDD, VDDQ 1.283 1.35 1.45 V 1, 2, 3 VSS 0 0 0 V 1 VDDSPD 3.0 3.3 3.6 V VREFCA (DC) 0.49 × VDD — 0.51 × VDD V 1, 4, 5 VREFDQ (DC) 0.49 × VDD — 0.51 × VDD V 1, 4, 5 Input reference voltage for address, command inputs Input reference voltage for DQ, DM inputs Notes: 1. 2. 3. 4. DDR3L SDRAM component specification. Under all conditions VDDQ must be less than or equal to VDD. VDDQ tracks with VDD. AC parameters are measured with VDD and VDDQ tied together. The AC peak noise on VREF may not allow VREF to deviate from VREF(DC) by more than ±1% VDD (for reference: approx. ±13.5 mV). 5. For reference: approx. VDD/2 ±13.5 mV. Data Sheet E1812E30 (Ver. 3.0) 9 EBJ81UG8EBU0 DC Characteristics 1 (TC = 0°C to +85°C, VDD = 1.283V to 1.45V, VSS = 0V) Data rate (Mbps) Parameter Operating current (ACT-PRE) (Another rank is in IDD2P1) Operating current (ACT-PRE) (Another rank is in IDD3N) Operating current (ACT-READ-PRE) (Another rank is in IDD2P1) Operating current (ACT-READ-PRE) (Another rank is in IDD3N) 1600 1333 Symbol max. max. Unit IDD0 800 760 mA IDD0 960 920 mA IDD1 920 880 mA IDD1 1080 1040 mA IDD2P1 560 560 mA Fast PD Exit Slow PD Exit Precharge power-down standby current IDD2P0 320 320 mA Precharge standby current IDD2N 720 720 mA Precharge standby ODT current IDD2NT 720 720 mA Precharge quiet standby current IDD2Q 720 720 mA Active power-down current (Always fast exit) IDD3P 624 592 mA Active standby current IDD3N 880 880 mA IDD4R 1280 1160 mA IDD4R 1440 1320 mA IDD4W 1320 1200 mA IDD4W 1480 1360 mA IDD5B 2280 2280 mA IDD5B 2440 2440 mA IDD7 1960 1880 mA IDD7 2120 2040 mA IDD8 272 272 mA Operating current (Burst read operating) (Another rank is in IDD2P1) Operating current (Burst read operating) (Another rank is in IDD3N) Operating current (Burst write operating) (Another rank is in IDD2P1) Operating current (Burst write operating) (Another rank is in IDD3N) Burst refresh current (Another rank is in IDD2P1) Burst refresh current (Another rank is in IDD3N) All bank interleave read current (Another rank is in IDD2P1) All bank interleave read current (Another rank is in IDD3N) RESET low current Self-Refresh Current (TC = 0°C to +85°C, VDD = 1.283V to 1.45V) Parameter Self-refresh current normal temperature range Self-refresh current extended temperature range Auto self-refresh current (optional) Symbol max. Unit IDD6 352 mA IDD6ET 400 mA IDD6TC — mA Data Sheet E1812E30 (Ver. 3.0) 10 Notes Notes EBJ81UG8EBU0 Timings used for IDD and IDDQ Measurement-Loop Patterns DDR3L-1600 DDR3L-1333 Parameter 11-11-11 9-9-9 Unit CL 11 9 nCK tCK min. 1.25 1.5 ns nRCD min. 11 9 nCK nRC min. 39 33 nCK nRAS min. 28 24 nCK nRP min. 11 9 nCK nFAW 24 20 nCK nRRD 5 4 nCK nRFC 208 174 nCK Data Sheet E1812E30 (Ver. 3.0) 11 EBJ81UG8EBU0 Pin Functions CK, /CK (input pins) CK and /CK are differential clock inputs. All address and control input signals are sampled on the crossing of the positive edge of CK and negative edge of /CK. Output (read) data is referenced to the crossings of CK and /CK (both directions of crossing). /CS (input pins) All commands are masked when /CS is registered high. /CS provides for external rank selection on systems with multiple ranks. /CS is considered part of the command code. /RAS, /CAS, and /WE (input pins) /RAS, /CAS and /WE (along with /CS) define the command being entered. A0 to A15 (input pins) Provided the row address for active commands and the column address for read/write commands to select one location out of the memory array in the respective bank. (A10(AP) and A12(/BC) have additional functions, see below) The address inputs also provide the op-code during mode register set commands. [Address Pins Table] Address (A0 to A15) Row address (RA) Column address (CA) AX0 to AX15 AY0 to AY9 Notes A10(AP) (input pin) A10 is sampled during read/write commands to determine whether auto-precharge should be performed to the accessed bank after the read/write operation. (high: auto-precharge; low: no auto-precharge) A10 is sampled during a precharge command to determine whether the precharge applies to one bank (A10 = low) or all banks (A10 = high). If only one bank is to be precharged, the bank is selected by bank addresses (BA). A12 (/BC) (input pin) A12 is sampled during read and write commands to determine if burst chop (on-the-fly) will be performed. (A12 = high: no burst chop, A12 = low: burst chopped.) BA0 to BA2 (input pins) BA0, BA1 and BA2 define to which bank an active, read, write or precharge command is being applied. BA0 and BA1 also determine if a mode register is to be accessed during a MRS cycle. [Bank Select Signal Table] BA0 BA1 BA2 Bank 0 L L L Bank 1 H L L Bank 2 L H L Bank 3 H H L Bank 4 L L H Bank 5 H L H Bank 6 L H H Bank 7 H H H Remark: H: VIH. L: VIL. Data Sheet E1812E30 (Ver. 3.0) 12 EBJ81UG8EBU0 CKE (input pins) CKE high activates, and CKE low deactivates, internal clock signals and device input buffers and output drivers. Taking CKE low provides precharge power-down and self-refresh operation (all banks idle), or active power-down (row active in any bank). CKE is asynchronous for self-refresh exit. After VREF has become stable during the power-on and initialization sequence, it must be maintained for proper operation of the CKE receiver. For proper self-refresh entry and exit, VREF must be maintained to this input. CKE must be maintained high throughout read and write accesses. Input buffers, excluding CK, /CK, ODT and CKE are disabled during power-down. Input buffers, excluding CKE, are disabled during self-refresh. DQ (input and output pins) Bi-directional data bus. DQS and /DQS (input and output pins) Output with read data, input with write data. Edge-aligned with read data, centered in write data. The data strobe DQS is paired with differential signals /DQS to provide differential pair signaling to the system during READs and WRITEs. ODT (input pins) ODT (registered high) enables termination resistance internal to the DDR3 SDRAM. When enabled, ODT is only applied to each DQ, DQS, /DQS, DM. The ODT pin will be ignored if the mode register (MR1) is programmed to disable ODT. DM (input pins) DM is the reference signal of the data input mask function. DMs are sampled at the cross point of DQS and /DQS. VDD (power supply pins) 1.35V is applied. (VDD is for the internal circuit.) VDDSPD (power supply pin) 3.3V is applied (For serial PD). VSS (power supply pins) Ground is connected. VTT (power supply pins) I/O termination supply for SDRAM. VREFDQ (power supply pin) Reference voltage for DQ. VREFCA (power supply pin) Reference voltage for CA. /RESET (input pin) /RESET is negative active signal (active low) and is referred to VSS. Data Sheet E1812E30 (Ver. 3.0) 13 EBJ81UG8EBU0 Physical Outline Unit: mm Front side 21.15 2.00 Min 9.00 3.80 Max (DATUM -A-) Full R 1 203 6.00 4.00 Min Component area (Front) A B 21.00 2.15 2.45 39.00 D 1.00 ± 0.10 67.60 Back side 63.60 2.45 2.15 20.00 30.00 204 Component area (Back) 4.00 ± 0.10 2 C (DATUM -A-) Detail A Detail B 0.45 ± 0.03 Detail C FULL R 1.65 3.00 4.00 ± 0.10 0.35 Max 2.55 Min 0.60 1.00 ± 0.10 Detail D Contact pad 0.2 Max 0.35 Max 3.00 1.35 ECA-TS2-0215-02 Note: 1. Tolerances on all dimensions ±0.15 unless otherwise specified. Data Sheet E1812E30 (Ver. 3.0) 14 EBJ81UG8EBU0 CAUTION FOR HANDLING MEMORY MODULES When handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory ICs, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on these components to prevent damaging them. In particular, do not push module cover or drop the modules in order to protect from mechanical defects, which would be electrical defects. When re-packing memory modules, be sure the modules are not touching each other. Modules in contact with other modules may cause excessive mechanical stress, which may damage the modules. MDE0202 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR MOS DEVICES Exposing the MOS devices to a strong electric field can cause destruction of the gate oxide and ultimately degrade the MOS devices operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it, when once it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. MOS devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. MOS devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor MOS devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS DEVICES No connection for CMOS devices input pins can be a cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of being an output pin. The unused pins must be handled in accordance with the related specifications. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Power-on does not necessarily define initial status of MOS devices. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the MOS devices with reset function have not yet been initialized. Hence, power-on does not guarantee output pin levels, I/O settings or contents of registers. MOS devices are not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for MOS devices having reset function. CME0107 Data Sheet E1812E30 (Ver. 3.0) 15 EBJ81UG8EBU0 The information in this document is subject to change without notice. Before using this document, confirm that this is the latest version. No part of this document may be copied or reproduced in any form or by any means without the prior written consent of Elpida Memory, Inc. Elpida Memory, Inc. does not assume any liability for infringement of any intellectual property rights (including but not limited to patents, copyrights, and circuit layout licenses) of Elpida Memory, Inc. or third parties by or arising from the use of the products or information listed in this document. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of Elpida Memory, Inc. or others. Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of the customer's equipment shall be done under the full responsibility of the customer. Elpida Memory, Inc. assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. [Product applications] Be aware that this product is for use in typical electronic equipment for general-purpose applications. Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability. However, this product is not intended for use in the product in aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment, medical equipment for life support, or other such application in which especially high quality and reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk of bodily injury. Customers are instructed to contact Elpida Memory's sales office before using this product for such applications. [Product usage] Design your application so that the product is used within the ranges and conditions guaranteed by Elpida Memory, Inc., including the maximum ratings, operating supply voltage range, heat radiation characteristics, installation conditions and other related characteristics. Elpida Memory, Inc. bears no responsibility for failure or damage when the product is used beyond the guaranteed ranges and conditions. Even within the guaranteed ranges and conditions, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Elpida Memory, Inc. products does not cause bodily injury, fire or other consequential damage due to the operation of the Elpida Memory, Inc. product. [Usage environment] Usage in environments with special characteristics as listed below was not considered in the design. Accordingly, our company assumes no responsibility for loss of a customer or a third party when used in environments with the special characteristics listed below. Example: 1) Usage in liquids, including water, oils, chemicals and organic solvents. 2) Usage in exposure to direct sunlight or the outdoors, or in dusty places. 3) Usage involving exposure to significant amounts of corrosive gas, including sea air, CL 2 , H 2 S, NH 3 , SO 2 , and NO x . 4) Usage in environments with static electricity, or strong electromagnetic waves or radiation. 5) Usage in places where dew forms. 6) Usage in environments with mechanical vibration, impact, or stress. 7) Usage near heating elements, igniters, or flammable items. If you export the products or technology described in this document that are controlled by the Foreign Exchange and Foreign Trade Law of Japan, you must follow the necessary procedures in accordance with the relevant laws and regulations of Japan. Also, if you export products/technology controlled by U.S. export control regulations, or another country's export control laws or regulations, you must follow the necessary procedures in accordance with such laws or regulations. If these products/technology are sold, leased, or transferred to a third party, or a third party is granted license to use these products, that third party must be made aware that they are responsible for compliance with the relevant laws and regulations. M01E1007 Data Sheet E1812E30 (Ver. 3.0) 16