ELPIDA EBJ21UE8BDS0

PRELIMINARY DATA SHEET
2GB DDR3 SDRAM SO-DIMM
EBJ21UE8BDS0 (256M words × 64 bits, 2 Ranks)
Specifications
Features
• Density: 2GB
• Organization
 256M words × 64 bits, 2 ranks
• Mounting 16 pieces of 1G bits DDR3 SDRAM sealed
in FBGA
• Package: 204-pin socket type small outline dual in
line memory module (SO-DIMM)
 PCB height: 30.0mm
 Lead pitch: 0.6mm
 Lead-free (RoHS compliant) and Halogen-free
• Power supply: VDD = 1.5V ± 0.075V
• Data rate: 1600Mbps/1333Mbps/1066Mbps (max.)
• Eight internal banks for concurrent operation
(components)
• Interface: SSTL_15
• Burst lengths (BL): 8 and 4 with Burst Chop (BC)
• /CAS Latency (CL): 6, 7, 8, 9, 10, 11
• /CAS write latency (CWL): 5, 6, 7, 8
• Precharge: auto precharge option for each burst
access
• Refresh: auto-refresh, self-refresh
• Refresh cycles
 Average refresh period
7.8µs at 0°C ≤ TC ≤ +85°C
3.9µs at +85°C < TC ≤ +95°C
• Operating case temperature range
 TC = 0°C to +95°C
• Double-data-rate architecture; two data transfers per
clock cycle
• The high-speed data transfer is realized by the 8 bits
prefetch pipelined architecture
• Bi-directional differential data strobe (DQS and /DQS)
is transmitted/received with data for capturing data at
the receiver
• DQS is edge-aligned with data for READs; centeraligned with data for WRITEs
• Differential clock inputs (CK and /CK)
• DLL aligns DQ and DQS transitions with CK
transitions
• Commands entered on each positive CK edge; data
and data mask referenced to both edges of DQS
• Data mask (DM) for write data
• Posted /CAS by programmable additive latency for
better command and data bus efficiency
• On-Die-Termination (ODT) for better signal quality
 Synchronous ODT
 Dynamic ODT
 Asynchronous ODT
• Multi Purpose Register (MPR) for temperature read
out
• ZQ calibration for DQ drive and ODT
• Programmable Partial Array Self-Refresh (PASR)
• /RESET pin for Power-up sequence and reset
function
• SRT range:
 Normal/extended
• Programmable Output driver impedance control
Document No. E1513E10 (Ver. 1.0)
Date Published June 2009 (K) Japan
Printed in Japan
URL: http://www.elpida.com
Elpida Memory, Inc. 2009
EBJ21UE8BDS0
Ordering Information
Part number
Data rate
Mbps (max.)
Component
JEDEC speed bin
(CL-tRCD-tRP)
EBJ21UE8BDS0-GN-F
1600
DDR3-1600K (11-11-11)
EBJ21UE8BDS0-DJ-F
1333
DDR3-1333H (9-9-9)
EBJ21UE8BDS0-AE-F
1066
DDR3-1066F (7-7-7)
Package
Preliminary Data Sheet E1513E10 (Ver. 1.0)
2
Contact
pad
204-pin SO-DIMM
Gold
(lead-free and
halogen-free)
Mounted devices
EDJ1108BDSE-GL-F
EDJ1108BDSE-GN-F
EDJ1108BDSE-GL-F
EDJ1108BDSE-GN-F
EDJ1108BDSE-DJ-F
EDJ1108BDSE-GL-F
EDJ1108BDSE-GN-F
EDJ1108BDSE-DJ-F
EDJ1108BDSE-AE-F
EBJ21UE8BDS0
Pin Configurations
Front side
1 pin
71 pin 73 pin
203 pin
2 pin
72 pin 74 pin
204 pin
Back side
Front side
Back side
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
1
VREFDQ
103
/CK0
2
VSS
104
/CK1
3
VSS
105
VDD
4
DQ4
106
VDD
5
DQ0
107
A10 (AP)
6
DQ5
108
BA1
7
DQ1
109
BA0
8
VSS
110
/RAS
9
VSS
111
VDD
10
/DQS0
112
VDD
11
DM0
113
/WE
12
DQS0
114
/CS0
13
VSS
115
/CAS
14
VSS
116
ODT0
15
DQ2
117
VDD
16
DQ6
118
VDD
17
DQ3
119
A13
18
DQ7
120
ODT1
19
VSS
121
/CS1
20
VSS
122
NC
21
DQ8
123
VDD
22
DQ12
124
VDD
23
DQ9
125
NC
24
DQ13
126
VREFCA
25
VSS
127
VSS
26
VSS
128
VSS
27
/DQS1
129
DQ32
28
DM1
130
DQ36
29
DQS1
131
DQ33
30
/RESET
132
DQ37
31
VSS
133
VSS
32
VSS
134
VSS
33
DQ10
135
/DQS4
34
DQ14
136
DM4
35
DQ11
137
DQS4
36
DQ15
138
VSS
37
VSS
139
VSS
38
VSS
140
DQ38
39
DQ16
141
DQ34
40
DQ20
142
DQ39
41
DQ17
143
DQ35
42
DQ21
144
VSS
43
VSS
145
VSS
44
VSS
146
DQ44
45
/DQS2
147
DQ40
46
DM2
148
DQ45
47
DQS2
149
DQ41
48
VSS
150
VSS
49
VSS
151
VSS
50
DQ22
152
/DQS5
51
DQ18
153
DM5
52
DQ23
154
DQS5
53
DQ19
155
VSS
54
VSS
156
VSS
55
VSS
157
DQ42
56
DQ28
158
DQ46
57
DQ24
159
DQ43
58
DQ29
160
DQ47
59
DQ25
161
VSS
60
VSS
162
VSS
61
VSS
163
DQ48
62
/DQS3
164
DQ52
63
DM3
165
DQ49
64
DQS3
166
DQ53
65
VSS
167
VSS
66
VSS
168
VSS
67
DQ26
169
/DQS6
68
DQ30
170
DM6
Preliminary Data Sheet E1513E10 (Ver. 1.0)
3
EBJ21UE8BDS0
Front side
Back side
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
69
DQ27
171
DQS6
70
DQ31
172
VSS
71
VSS
173
VSS
72
VSS
174
DQ54
73
CKE0
175
DQ50
74
CKE1
176
DQ55
75
VDD
177
DQ51
76
VDD
178
VSS
77
NC
179
VSS
78
NC
180
DQ60
79
BA2
181
DQ56
80
NC
182
DQ61
81
VDD
183
DQ57
82
VDD
184
VSS
83
A12 (/BC)
185
VSS
84
A11
186
/DQS7
85
A9
187
DM7
86
A7
188
DQS7
87
VDD
189
VSS
88
VDD
190
VSS
89
A8
191
DQ58
90
A6
192
DQ62
91
A5
193
DQ59
92
A4
194
DQ63
93
VDD
195
VSS
94
VDD
196
VSS
95
A3
197
SA0
96
A2
198
NC
97
A1
199
VDDSPD
98
A0
200
SDA
99
VDD
201
SA1
100
VDD
202
SCL
101
CK0
203
VTT
102
CK1
204
VTT
Preliminary Data Sheet E1513E10 (Ver. 1.0)
4
EBJ21UE8BDS0
Pin Description
Pin name
Function
A0 to A13
Address input
Row address
Column address
A10 (AP)
Auto precharge
A0 to A13
A0 to A9
A12 (/BC)
Burst chop
BA0, BA1, BA2
Bank select address
DQ0 to DQ63
Data input/output
/RAS
Row address strobe command
/CAS
Column address strobe command
/WE
Write enable
/CS0, /CS1
Chip select
CKE0, CKE1
Clock enable
CK0, CK1
Clock input
/CK0, /CK1
Differential clock input
DQS0 to DQS7, /DQS0 to /DQS7
Input and output data strobe
DM0 to DM7
Input mask
SCL
Clock input for serial PD
SDA
Data input/output for serial PD
SA0, SA1
Serial address input
VDD
Power for internal circuit
VDDSPD
Power for serial EEPROM
VREFCA
Reference voltage for CA
VREFDQ
Reference voltage for DQ
VSS
Ground
VTT
I/O termination supply for SDRAM
/RESET
Set DRAM to known state
ODT0, ODT1
ODT control
NC
No connection
Preliminary Data Sheet E1513E10 (Ver. 1.0)
5
EBJ21UE8BDS0
Serial PD Matrix
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
1
0
0
1
0
0
1
1
93H
256/256/0-116
-DJ, -AE
1
0
0
1
0
0
1
0
92H
176/256/0-116
SPD revision
0
0
0
1
0
0
0
0
10H
Revision 1.0
2
Key byte/DRAM device type
0
0
0
0
1
0
1
1
0BH
DDR3 SDRAM
3
Key byte/module type
0
0
0
0
0
0
1
1
03H
SO-DIMM
4
SDRAM density and banks
0
0
0
0
0
0
1
0
02H
1G bits, 8 banks
5
SDRAM addressing
0
0
0
1
0
0
0
1
11H
14 rows, 10 columns
6
Module nominal voltage, VDD
0
0
0
0
0
0
0
0
00H
1.5V
7
Module organization
0
0
0
0
1
0
0
1
09H
2 ranks/×8 bits
8
Module memory bus width
0
0
0
0
0
0
1
1
03H
64 bits/non-ECC
9
Fine timebase (FTB) dividend/divisor
0
1
0
1
0
0
1
0
52H
5/2
10
Medium timebase (MTB) dividend
0
0
0
0
0
0
0
1
01H
1
11
Medium timebase (MTB) divisor
0
0
0
0
1
0
0
0
08H
8
12
SDRAM minimum cycle time
(tCK (min.))
-GN
0
0
0
0
1
0
1
0
0AH
1.25ns
0
0
0
0
1
1
0
0
0CH
1.5ns
Byte No. Function described
0
1
Number of serial PD bytes written/SPD
device size/CRC coverage
-GN
-DJ
0
0
0
0
1
1
1
1
0FH
1.875ns
13
Reserved
-AE
0
0
0
0
0
0
0
0
00H
—
14
SDRAM /CAS latencies supported, LSB
-GN
1
0
1
1
1
1
0
0
BCH
CL = 6, 7, 8, 9, 11
- DJ
0
0
1
1
1
1
0
0
3CH
CL = 6, 7, 8, 9
-AE
0
0
0
1
1
1
0
0
1CH
CL = 6, 7, 8
15
SDRAM /CAS latencies supported, MSB
0
0
0
0
0
0
0
0
00H
—
16
SDRAM minimum /CAS latencies time
(tAA (min.))
0
1
1
0
1
0
0
1
69H
13.125ns
SDRAM write recovery time (tWR (min))
0
1
1
1
1
0
0
0
78H
15ns
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
0
0
0
0
30H
6ns
17
18
19
SDRAM minimum /RAS to /CAS delay
0
(tRCD)
SDRAM minimum row active to row active
delay (tRRD)
0
-GN, -DJ
0
0
1
1
1
1
0
0
3CH
7.5ns
SDRAM minimum row precharge time
(tRP)
-AE
0
1
1
0
1
0
0
1
69H
13.125ns
21
SDRAM upper nibbles for tRAS and tRC
0
0
0
1
0
0
0
1
11H
22
SDRAM minimum active to precharge time
(tRAS), LSB
0
-GN
0
0
1
1
0
0
0
18H
35ns
20
-DJ
0
0
1
0
0
0
0
0
20H
36ns
-AE
0
0
1
0
1
1
0
0
2CH
37.5ns
Preliminary Data Sheet E1513E10 (Ver. 1.0)
6
EBJ21UE8BDS0
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
1
0
0
0
0
0
0
1
81H
48.125ns
-DJ
1
0
0
0
1
0
0
1
89H
49.125ns
-AE
1
0
0
1
0
1
0
1
95H
50.625ns
0
1
1
1
0
0
0
0
70H
110ns
0
0
0
0
0
0
1
1
03H
110ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
0
0
0
0
0
0
00H
30.0ns
0
0
0
0
0
0
0
1
01H
37.5ns
1
1
1
1
0
0
0
0
F0H
30.0ns
Byte No. Function described
23
24
25
26
27
28
SDRAM minimum active to active /autorefresh time (tRC), LSB
-GN
SDRAM minimum refresh recovery time
delay (tRFC), LSB
SDRAM minimum refresh recovery time
delay (tRFC), MSB
SDRAM minimum internal write to read
command delay (tWTR)
SDRAM minimum internal read to
precharge command delay (tRTP)
Upper nibble for tFAW
-GN, -DJ
-AE
29
Minimum four activate window delay time
(tFAW)
-GN, -DJ
0
0
1
0
1
1
0
0
2CH
37.5ns
30
SDRAM output drivers supported
1
0
0
0
0
0
1
1
83H
DLL-off/RZQ/6, 7
31
SDRAM refresh options
1
0
0
0
0
0
0
1
81H
PASR/2X refresh at
+85C° to +95C°
32
Module thermal sensor
0
0
0
0
0
0
0
0
00H
Not Incorporated
33
SDRAM device type
0
0
0
0
0
0
0
0
00H
Standard
-AE
34 to 59 Reserved
0
0
0
0
0
0
0
0
00H
—
60
Module nominal height
0
0
0
0
1
1
1
1
0FH
29 < height ≤ 30mm
61
Module maximum thickness
0
0
0
1
0
0
0
1
11H
62
Reference raw card used
0
0
1
0
0
1
0
1
25H
Raw Card F1
63
Address mapping from edge connecter to
0
DRAM
0
0
0
0
0
0
0
00H
Standard
64 to
116
Module specific section
0
0
0
0
0
0
0
0
00H
—
0
0
0
0
0
0
1
0
02H
Elpida Memory
1
1
1
1
1
1
1
0
FEH
Elpida Memory
117
118
Module ID: manufacturer’s JEDEC ID
code, LSB
Module ID: manufacturer’s JEDEC ID
code, MSB
119
Module ID: manufacturing location
×
×
×
×
×
×
×
×
××
120
Module ID: manufacturing date
×
×
×
×
×
×
×
×
××
Year code (BCD)
121
Module ID: manufacturing date
×
×
×
×
×
×
×
×
××
Week code (BCD)
122 to
125
Module ID: module serial number
×
×
×
×
×
×
×
×
××
126
Cyclical redundancy code (CRC)
-GN
0
0
1
1
0
0
1
1
33H
-DJ
1
0
0
1
1
0
1
1
9BH
-AE
1
1
0
1
1
0
0
1
D9H
Preliminary Data Sheet E1513E10 (Ver. 1.0)
7
EBJ21UE8BDS0
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
1
1
0
0
0
1
0
1
C5H
-DJ
0
1
1
1
0
1
1
0
76H
-AE
1
1
0
1
1
1
1
1
DFH
Byte No. Function described
127
Cyclical redundancy code (CRC)
-GN
Comments
128
Module part number
0
1
0
0
0
1
0
1
45H
E
129
Module part number
0
1
0
0
0
0
1
0
42H
B
130
Module part number
0
1
0
0
1
0
1
0
4AH
J
131
Module part number
0
0
1
1
0
0
1
0
32H
2
132
Module part number
0
0
1
1
0
0
0
1
31H
1
133
Module part number
0
1
0
1
0
1
0
1
55H
U
134
Module part number
0
1
0
0
0
1
0
1
45H
E
135
Module part number
0
0
1
1
1
0
0
0
38H
8
136
Module part number
0
1
0
0
0
0
1
0
42H
B
137
Module part number
0
1
0
0
0
1
0
0
44H
D
138
Module part number
0
1
0
1
0
0
1
1
53H
S
139
Module part number
0
0
1
1
0
0
0
0
30H
0
140
Module part number
0
0
1
0
1
1
0
1
2DH
—
141
Module part number
-GN
0
1
0
0
0
1
1
1
47H
G
-DJ
0
1
0
0
0
1
0
0
44H
D
-AE
0
1
0
0
0
0
0
1
41H
A
0
1
0
0
1
1
1
0
4EH
N
-DJ
0
1
0
0
1
0
1
0
4AH
J
-AE
0
1
0
0
0
1
0
1
45H
E
142
Module part number
-GN
143
Module part number
0
0
1
0
1
1
0
1
2DH
—
144
Module part number
0
1
0
0
0
1
1
0
46H
F
145
Module part number
0
0
1
0
0
0
0
0
20H
(Space)
146
Module revision code
0
0
1
1
0
0
0
0
30H
Initial
147
Module revision code
0
0
1
0
0
0
0
0
20H
(Space)
0
0
0
0
0
0
1
0
02H
Elpida Memory
1
1
1
1
1
1
1
0
FEH
Elpida Memory
148
149
150 to
175
176 to
254
SDRAM manufacturer’s JEDEC ID code,
LSB
SDRAM manufacturer’s JEDEC ID code,
MSB
Manufacturer's specific data
Intel extreme memory profile
-GN
-DJ, -AE
255
Refer to SPD for Intel Extreme Memory Profile Section
0
0
0
Open for customer use
Preliminary Data Sheet E1513E10 (Ver. 1.0)
8
0
0
0
0
0
00H
Not supported
EBJ21UE8BDS0
SPD for Intel Extreme Memory Profile (EBJ21UE8BDS0-GN)
Byte No. Function described
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
176
Intel extreme memory profile ID string
0
0
0
0
1
1
0
0
0CH
177
Intel extreme memory profile ID string
0
1
0
0
1
0
1
0
4AH
178
Intel extreme memory profile
organization type
0
0
0
0
0
0
1
1
03H
Intel extreme memory profile revision
0
0
0
1
0
0
0
1
11H
Revision 1.1
0
0
0
0
0
0
0
1
01H
1
0
0
0
0
1
0
0
0
08H
8
0
0
0
0
0
0
0
1
01H
1
0
0
0
0
1
0
0
0
08H
8
0
0
0
0
0
0
0
0
00H
179
180
181
182
183
184
Medium timebase (MTB) dividend
for profile 1
Medium timebase (MTB) divisor
for profile 1
Medium timebase (MTB) dividend
for profile 2
Medium timebase (MTB) divisor
for profile 2
Reserved for global byte
Comments
Intel Extreme Memory
Profile ID String
Intel Extreme Memory
Profile ID String
Profile 1: Enabled /
Profile 2: Enabled /
Profile 1: 1 DIMM per
CH / Profile 2: 1
DIMM per CH /
[For Profile 1]
Byte No. Function described
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
185
0
0
1
0
1
0
1
0
2AH
1.50V
0
0
0
0
1
0
1
0
0AH
DDR3-1600
0
1
1
0
1
0
0
1
69H
13.125ns
1
0
1
1
1
1
0
0
BCH
6, 7, 8, 9, 11
0
0
0
0
0
0
0
0
00H
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
0
1
0
0
1
69H
13.125ns
15ns
186
187
188
189
190
191
192
Module VDD voltage level
SDRAM minimum cycle time
(tCK (min.))
SDRAM minimum /CAS latencies time
(tAA (min.))
SDRAM /CAS latencies supported, LSB
(CL MASK)
SDRAM /CAS latencies supported, MSB
(CL MASK)
Minimum CAS write latency time
(tCWL(min))
SDRAM minimum row precharge time
(tRP)
SDRAM minimum /RAS to /CAS delay
(tRCD)
193
SDRAM write recovery time (tWR (min))
0
1
1
1
1
0
0
0
78H
194
SDRAM upper nibbles for tRAS and tRC
0
0
0
1
0
0
0
1
11H
0
0
0
1
1
0
0
0
18H
35ns
1
0
0
0
0
1
1
0
86H
48.75ns
0
0
1
1
1
1
1
1
3FH
7.8µs
0
0
0
0
0
0
0
0
00H
7.8µs
0
1
1
1
0
0
0
0
70H
110ns
0
0
0
0
0
0
1
1
03H
110ns
0
0
1
1
1
1
0
0
3CH
7.5ns
195
196
197
198
199
200
201
SDRAM minimum active to precharge
time (tRAS), LSB
SDRAM minimum active to active /autorefresh time (tRC), LSB
Maximum average periodic refresh interval
(tREFI), LSB
Maximum average periodic refresh interval
(tREFI), MSB
SDRAM minimum refresh recovery time
delay (tRFC), LSB
SDRAM minimum refresh recovery time
delay (tRFC), MSB
SDRAM minimum internal read to
precharge command delay (tRTP)
Preliminary Data Sheet E1513E10 (Ver. 1.0)
9
EBJ21UE8BDS0
Byte No. Function described
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
202
SDRAM minimum row active to row active
0
delay (tRRD)
0
1
1
0
0
0
0
30H
6ns
203
Upper nibble for tFAW
0
0
0
0
0
0
0
0
00H
30.0ns
1
1
1
1
0
0
0
0
F0H
30.0ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
204
205
206
207
208
209
Minimum four activate window delay time
(tFAW)
SDRAM minimum internal write to read
command delay (tWTR)
Write to read & read to write command
turn-around time pull-in
Back to back command turn-around time
pull-in
System address/ command rate (1N or 2N
mode)
Auto self-refresh performance (sub 1x
refresh and IDD6 impacts)
Default - No
adjustment
Default - No
adjustment
System operates in
default mode
TBD
210 to
218
Reserved
0
0
0
0
0
0
0
0
00H
219
Vendor personality byte
0
0
0
0
0
0
0
0
00H
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
220
Module VDD voltage level (extreme
settings)
0
0
1
0
1
1
0
0
2CH
1.60V
221
SDRAM minimum cycle time (tCK (min))
0
0
0
0
1
0
1
0
0AH
DDR3-1600
222
Minimum CAS latency time (tAA (min))
0
1
1
0
1
0
0
1
69H
13.125ns
1
0
1
1
1
1
0
0
BCH
6, 7, 8, 9, 11
0
0
0
0
0
0
0
0
00H
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
0
1
0
0
1
69H
13.125ns
15ns
[For Profile 2]
Byte No. Function described
223
224
225
226
227
SDRAM /CAS latencies supported, LSB
(CL MASK)
SDRAM /CAS latencies supported, MSB
(CL MASK)
Minimum CAS write latency time
(tCWL (min))
SDRAM minimum row precharge time
(tRP)
SDRAM minimum /RAS to /CAS delay
(tRCD)
228
SDRAM write recovery time (tWR (min))
0
1
1
1
1
0
0
0
78H
229
SDRAM upper nibbles for tRAS and tRC
0
0
0
1
0
0
0
1
11H
0
0
0
1
1
0
0
0
18H
35ns
1
0
0
0
0
1
1
0
86H
48.75ns
0
0
1
1
1
1
1
1
3FH
7.8us
0
0
0
0
0
0
0
0
00H
7.8us
0
1
1
1
0
0
0
0
70H
110ns
0
0
0
0
0
0
1
1
03H
110ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
1
1
0
0
0
0
30H
6ns
230
231
232
233
234
235
236
237
SDRAM minimum active to precharge time
(tRAS), LSB
SDRAM minimum active to active /autorefresh time (tRC), LSB
Maximum average periodic refresh interval
(tREFI), LSB
Maximum average periodic refresh interval
(tREFI), MSB
SDRAM minimum refresh recovery time
delay (tRFC), LSB
SDRAM minimum refresh recovery time
delay (tRFC), MSB
SDRAM minimum internal read to
precharge command delay (tRTP)
SDRAM minimum row active to row active
delay (tRRD)
Preliminary Data Sheet E1513E10 (Ver. 1.0)
10
EBJ21UE8BDS0
Byte No. Function described
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
238
0
0
0
0
0
0
0
0
00H
30.0ns
1
1
1
1
0
0
0
0
F0H
30.0ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
0
00H
239
240
241
242
243
244
Upper nibble for tFAW
Minimum four activate window delay time
(tFAW)
SDRAM minimum internal write to read
command delay (tWTR)
Write to read & read to write command
turn-around time pull-in
Back to back command turn-around time
pull-in
System address/ command rate (1N or 2N
mode)
Auto self-refresh performance (sub 1x
refresh and IDD6 impacts)
245 to
253
Reserved
0
0
0
0
0
0
0
0
00H
254
Vendor personality byte
0
0
0
0
0
0
0
0
00H
Preliminary Data Sheet E1513E10 (Ver. 1.0)
11
Default - No
adjustment
Default - No
adjustment
System operates in
default mode
TBD
EBJ21UE8BDS0
Block Diagram
/RESET
VTT
VDDSPD
VREFCA
VREFDQ
VDD
VSS
"
Rs3
Rs1
Rs1
"
Serial PD
SDRAMs (D0 to D15), SPD
D2
Notes :
1. DQ wiring may be changed within a byte.
2. DQ, DQS, /DQS, ODT, DM, CKE, /CS relationships
must be maintained as shown.
* D0 to D15: 1G bits DDR3 SDRAM
Address, BA: A0 to A13, BA0 to BA2
Command: /RAS, /CAS, /WE
U1: 256 bytes EEPROM
Rs1: 159
Rs2: 369
Rs3: 309
Rs4: 2409
V2
D8
V1V9
D7
V8
V3
D10
V7
V4
V4
V5
D3
V5
D11
D12
D4
V6
V6
VTT
V3
D9
D14
V2
D0
V1
V9
D13
D5
V7
D15
V8
D6
Address and Control lines
Preliminary Data Sheet E1513E10 (Ver. 1.0)
12
SCL
SCL
SA0
A0
SA1
A1
A2
Rs4
"
"
Rs1
"
/RESET:SDRAMs (D0 to D15)
D1
Rs4
!
"
!
Rs1
Rs4
Rs1
SPD
SDRAMs (D0 to D15)
SDRAMs (D0 to D15)
SDRAMs (D0 to D15)
Rs4
!
Rs4
Rs4
Rs3
Rs2
Rs2
Rs2
Rs2
Rs2
Rs3
Rs4
!
"
Rs1
"
!
Rs1
!
Rs4
!
Rs4
Rs1
"
Rs1
"
SDA
U0
WP
SDA
Rs4
"
!
Rs1
Rs1
Rs1
Rs4
Rs1
Rs1
"
Rs1
Rs3
Rs2
Rs2
Rs2
!
Rs1
Rs1
!
Rs4
Rs1
Rs4
Rs1
"
Rs1
Rs1
Rs1
"
!
"
Rs1
!
Rs1
Rs4
Rs4
Rs1
Rs4
Rs1
Rs1
"
Rs1
Rs1
!
!
Rs1
!
Rs1
!
Rs1
Rs2
Rs2
!
EBJ21UE8BDS0
Electrical Specifications
• All voltages are referenced to VSS (GND).
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Notes
Power supply voltage
VDD
−0.4 to +1.975
V
1, 3, 4
Input voltage
VIN
−0.4 to +1.975
V
1, 4
Output voltage
VOUT
−0.4 to +1.975
V
1, 4
Reference voltage
VREFCA
−0.4 to 0.6 × VDD
V
3, 4
Reference voltage for DQ
VREFDQ
−0.4 to 0.6 × VDDQ
V
3, 4
1, 2, 4
Storage temperature
Tstg
−55 to +100
°C
Power dissipation
PD
8
W
Short circuit output current
IOUT
50
mA
1, 4
Notes: 1. Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage temperature is the case surface temperature on the center/top side of the DRAM.
3. VDD and VDDQ must be within 300mV of each other at all times; and VREF must be not greater than
0.6 × VDDQ, When VDD and VDDQ are less than 500mV; VREF may be equal to or less than 300mV.
4. DDR3 SDRAM component specification.
Caution
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Operating Temperature Condition
Parameter
Symbol
Rating
Unit
Notes
Operating case temperature
TC
0 to +95
°C
1, 2, 3
Notes: 1. Operating temperature is the case surface temperature on the center/top side of the DRAM.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be
supported. During operation, the DRAM case temperature must be maintained between 0°C to +85°C
under all operating conditions.
3. Some applications require operation of the DRAM in the Extended Temperature Range between +85°C
and +95°C case temperature. Full specifications are guaranteed in this range, but the following additional
conditions apply:
a)
Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to
3.9µs. (This double refresh requirement may not apply for some devices.)
b)
If Self-refresh operation is required in the Extended Temperature Range, then it is mandatory to
either use the Manual Self-Refresh mode with Extended Temperature Range capability (MR2 bit
[A6, A7] = [0, 1]) or enable the optional Auto Self-Refresh mode (MR2 bit [A6, A7] = [1, 0]).
Preliminary Data Sheet E1513E10 (Ver. 1.0)
13
EBJ21UE8BDS0
Recommended DC Operating Conditions (TC = 0°C to +85°C)
Parameter
Symbol
min.
typ.
max.
Unit
Notes
Supply voltage
VDD, VDDQ
1.425
1.5
1.575
V
1, 2, 3
VSS
0
0
0
V
1
3.6
VDDSPD
3.0
3.3
Input reference voltage
VREFCA (DC)
0.49 × VDDQ
0.50 × VDDQ 0.51 × VDDQ
V
1, 4, 5
Input reference voltage for DQ
VREFDQ (DC)
0.49 × VDDQ
0.50 × VDDQ 0.51 × VDDQ
V
1, 4, 5
Termination voltage
VTT
VDDQ/2 – TBD
TBD
V
Notes: 1.
2.
3.
4.
VDDQ/2 + TBD
V
DDR3 SDRAM component specification.
Under all conditions VDDQ must be less than or equal to VDD.
VDDQ tracks with VDD. AC parameters are measured with VDD and VDDQ tied together.
The AC peak noise on VREF may not allow VREF to deviate from VREF(DC) by more than ±1% VDD (for
reference: approx ±15 mV).
5. For reference: approx. VDD/2 ±15 mV.
Preliminary Data Sheet E1513E10 (Ver. 1.0)
14
EBJ21UE8BDS0
DC Characteristics 1 (TC = 0°C to +85°C, VDD = 1.5V ± 0.075V, VSS = 0V)
Parameter
Symbol
Data rate (Mbps)
max.
Unit
Operating current
(ACT-PRE)
(Another rank is in IDD2P1)
IDD0
1600
1333
1066
1200
1080
960
mA
Operating current
(ACT-PRE)
(Another rank is in IDD3N)
IDD0
1600
1333
1066
1440
1280
1160
mA
Operating current
(ACT-READ-PRE)
(Another rank is in IDD2P1)
IDD1
1600
1333
1066
1320
1200
1080
mA
Operating current
(ACT-READ-PRE)
(Another rank is in IDD3N)
IDD1
1600
1333
1066
1560
1400
1280
mA
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
1600
1333
1066
720
640
560
240
224
208
1040
960
880
1040
960
880
960
880
800
720
640
560
1200
1040
960
2200
1920
1560
2440
2120
1760
2280
2000
1640
2520
2200
1840
2600
2480
2360
2840
2680
2560
3160
2800
2440
3400
3000
2640
IDD2P1
Precharge power-down standby current
IDD2P0
Precharge standby current
IDD2N
Precharge standby ODT current
IDD2NT
Precharge quiet standby current
IDD2Q
Active power-down current
(Always fast exit)
IDD3P
Active standby current
IDD3N
Operating current
(Burst read operating)
(Another rank is in IDD2P1)
Operating current
(Burst read operating)
(Another rank is in IDD3N)
Operating current
(Burst write operating)
(Another rank is in IDD2P1)
Operating current
(Burst write operating)
(Another rank is in IDD3N)
IDD4R
IDD4R
IDD4W
IDD4W
Burst refresh current
(Another rank is in IDD2P1)
IDD5B
Burst refresh current
(Another rank is in IDD3N)
IDD5B
All bank interleave read current
(Another rank is in IDD2P1)
IDD7
All bank interleave read current
(Another rank is in IDD3N)
IDD7
Preliminary Data Sheet E1513E10 (Ver. 1.0)
15
Notes
mA
Fast PD Exit
mA
Slow PD Exit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
EBJ21UE8BDS0
Self-Refresh Current (TC = 0°C to +85°C, VDD = 1.5V ± 0.075V)
Parameter
Self-refresh current
normal temperature range
Self-refresh current
extended temperature range
Auto self-refresh current (optional)
Symbol
max.
Unit
IDD6
160
mA
IDD6ET
288
mA
IDD6TC

mA
Notes
Timings used for IDD and IDDQ Measurement-Loop Patterns
DDR3-1600
DDR3-1333
DDR3-1066
Parameter
11-11-11
9-9-9
7-7-7
Unit
CL
11
9
7
tCK
tCK min.
1.25
1.5
1.875
ns
nRCD min.
11
9
7
nCK
nRC min.
39
33
27
nCK
nRAS min.
28
24
20
nCK
nRP min.
11
9
7
nCK
nFAW
24
20
20
nCK
nRRD
5
4
4
nCK
nRFC
88
74
59
nCK
DC Characteristics 2 (TC = 0°C to +85°C, VDD, VDDQ = 1.5V ± 0.075V)
(DDR3 SDRAM Component Specification)
Parameter
Symbol
Value
Input leakage current
ILI
2
µA
VDD ≥ VIN ≥ VSS
Output leakage current
ILO
5
µA
DDQ ≥ VOUT ≥ VSS
Preliminary Data Sheet E1513E10 (Ver. 1.0)
16
Unit
Notes
EBJ21UE8BDS0
Pin Functions
CK, /CK (input pin)
CK and /CK are differential clock inputs. All address and control input signals are sampled on the crossing of the
positive edge of CK and negative edge of /CK. Output (read) data is referenced to the crossings of CK and /CK
(both directions of crossing).
/CS (input pin)
All commands are masked when /CS is registered high. /CS provides for external rank selection on systems with
multiple ranks. /CS is considered part of the command code.
/RAS, /CAS, and /WE (input pins)
/RAS, /CAS and /WE (along with /CS) define the command being entered.
A0 to A13 (input pins)
Provided the row address for active commands and the column address for read/write commands to select one
location out of the memory array in the respective bank. (A10(AP) and A12(/BC) have additional functions, see
below) The address inputs also provide the op-code during mode register set commands.
[Address Pins Table]
Address (A0 to A13)
Row address (RA)
Column address (CA)
AX0 to AX13
AY0 to AY9
Notes
A10(AP) (input pin)
A10 is sampled during read/write commands to determine whether auto-precharge should be performed to the
accessed bank after the read/write operation. (high: auto-precharge; low: no auto-precharge)
A10 is sampled during a precharge command to determine whether the precharge applies to one bank (A10 = low)
or all banks (A10 = high). If only one bank is to be precharged, the bank is selected by bank addresses (BA).
A12 (/BC) (input pin)
A12 is sampled during read and write commands to determine if burst chop (on-the-fly) will be performed.
(A12 = high: no burst chop, A12 = low: burst chopped.)
BA0 to BA2 (input pins)
BA0, BA1 and BA2 define to which bank an active, read, write or precharge command is being applied. BA0 and
BA1 also determine if a mode register is to be accessed during a MRS cycle.
[Bank Select Signal Table]
BA0
BA1
BA2
Bank 0
L
L
L
Bank 1
H
L
L
Bank 2
L
H
L
Bank 3
H
H
L
Bank 4
L
L
H
Bank 5
H
L
H
Bank 6
L
H
H
Bank 7
H
H
H
Remark: H: VIH. L: VIL.
Preliminary Data Sheet E1513E10 (Ver. 1.0)
17
EBJ21UE8BDS0
CKE (input pin)
CKE high activates, and CKE low deactivates, internal clock signals and device input buffers and output drivers.
Taking CKE low provides precharge power-down and self-refresh operation (all banks idle), or active power-down
(row active in any bank). CKE is asynchronous for self-refresh exit. After VREF has become stable during the
power-on and initialization sequence, it must be maintained for proper operation of the CKE receiver. For proper
self-refresh entry and exit, VREF must be maintained to this input. CKE must be maintained high throughout read
and write accesses. Input buffers, excluding CK, /CK, ODT and CKE are disabled during power-down. Input
buffers, excluding CKE, are disabled during self-refresh.
DQ (input and output pins)
Bi-directional data bus.
DQS and /DQS (input and output pin)
Output with read data, input with write data. Edge-aligned with read data, centered in write data.
The data strobe DQS is paired with differential signals /DQS to provide differential pair signaling to the system during
READs and WRITEs.
ODT (input pins)
ODT (registered high) enables termination resistance internal to the DDR3 SDRAM. When enabled, ODT is only
applied to each DQ, DQS, /DQS, DM. The ODT pin will be ignored if the mode register (MR1) is programmed to
disable ODT.
DM (input pins)
DM is the reference signal of the data input mask function. DMs are sampled at the cross point of DQS and /DQS.
VDD (power supply pins)
1.5V is applied. (VDD is for the internal circuit.)
VDDSPD (power supply pin)
3.3V is applied (For serial EEPROM).
VSS (power supply pin)
Ground is connected.
VTT (power supply pin)
I/O termination supply for SDRAM.
VREFDQ (power supply)
Reference voltage for DQ.
VREFCA (power supply)
Reference voltage for CA.
/RESET (input pin)
/RESET is negative active signal (active low) and is referred to GND.
Detailed Operation Part, Electrical Characteristics and Timing Waveforms
Refer to the EDJ1104BDSE, EDJ1108BDSE datasheet (E1494E).
Preliminary Data Sheet E1513E10 (Ver. 1.0)
18
EBJ21UE8BDS0
Physical Outline
Unit: mm
Front side
21.15
2.00 Min
9.00
3.80 Max
(DATUM -A-)
4x Full R
1
203
6.00
4.00 Min
Component area
(Front)
A
B
21.00
2.15
2.45
39.00
D
1.00 ± 0.10
67.60
Back side
63.60
2.45
2.15
Component area
(Back)
20.00
30.00
4.00
204
2
C
(DATUM -A-)
Detail A
Detail B
0.45 ± 0.03
Detail C
FULL R
1.65
3.00
4.00 ± 0.10
0.35 Max
2.55 Min
0.60
1.00 ± 0.10
Detail D
Contact pad
0.2 Max
0.35 Max
3.00
1.35
ECA-TS2-0215-01
Preliminary Data Sheet E1513E10 (Ver. 1.0)
19
EBJ21UE8BDS0
CAUTION FOR HANDLING MEMORY MODULES
When handling or inserting memory modules, be sure not to touch any components on the modules, such as
the memory ICs, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on
these components to prevent damaging them.
In particular, do not push module cover or drop the modules in order to protect from mechanical defects,
which would be electrical defects.
When re-packing memory modules, be sure the modules are not touching each other.
Modules in contact with other modules may cause excessive mechanical stress, which may damage the
modules.
MDE0202
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR MOS DEVICES
Exposing the MOS devices to a strong electric field can cause destruction of the gate
oxide and ultimately degrade the MOS devices operation. Steps must be taken to stop
generation of static electricity as much as possible, and quickly dissipate it, when once
it has occurred. Environmental control must be adequate. When it is dry, humidifier
should be used. It is recommended to avoid using insulators that easily build static
electricity. MOS devices must be stored and transported in an anti-static container,
static shielding bag or conductive material. All test and measurement tools including
work bench and floor should be grounded. The operator should be grounded using
wrist strap. MOS devices must not be touched with bare hands. Similar precautions
need to be taken for PW boards with semiconductor MOS devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS DEVICES
No connection for CMOS devices input pins can be a cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level may be
generated due to noise, etc., hence causing malfunction. CMOS devices behave
differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed
high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected
to VDD or GND with a resistor, if it is considered to have a possibility of being an output
pin. The unused pins must be handled in accordance with the related specifications.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Power-on does not necessarily define initial status of MOS devices. Production process
of MOS does not define the initial operation status of the device. Immediately after the
power source is turned ON, the MOS devices with reset function have not yet been
initialized. Hence, power-on does not guarantee output pin levels, I/O settings or
contents of registers. MOS devices are not initialized until the reset signal is received.
Reset operation must be executed immediately after power-on for MOS devices having
reset function.
CME0107
Preliminary Data Sheet E1513E10 (Ver. 1.0)
20
EBJ21UE8BDS0
The information in this document is subject to change without notice. Before using this document, confirm that this is the latest version.
No part of this document may be copied or reproduced in any form or by any means without the prior
written consent of Elpida Memory, Inc.
Elpida Memory, Inc. does not assume any liability for infringement of any intellectual property rights
(including but not limited to patents, copyrights, and circuit layout licenses) of Elpida Memory, Inc. or
third parties by or arising from the use of the products or information listed in this document. No license,
express, implied or otherwise, is granted under any patents, copyrights or other intellectual property
rights of Elpida Memory, Inc. or others.
Descriptions of circuits, software and other related information in this document are provided for
illustrative purposes in semiconductor product operation and application examples. The incorporation of
these circuits, software and information in the design of the customer's equipment shall be done under
the full responsibility of the customer. Elpida Memory, Inc. assumes no responsibility for any losses
incurred by customers or third parties arising from the use of these circuits, software and information.
[Product applications]
Be aware that this product is for use in typical electronic equipment for general-purpose applications.
Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability.
However, users are instructed to contact Elpida Memory's sales office before using the product in
aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment,
medical equipment for life support, or other such application in which especially high quality and
reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury.
[Product usage]
Design your application so that the product is used within the ranges and conditions guaranteed by
Elpida Memory, Inc., including the maximum ratings, operating supply voltage range, heat radiation
characteristics, installation conditions and other related characteristics. Elpida Memory, Inc. bears no
responsibility for failure or damage when the product is used beyond the guaranteed ranges and
conditions. Even within the guaranteed ranges and conditions, consider normally foreseeable failure
rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so
that the equipment incorporating Elpida Memory, Inc. products does not cause bodily injury, fire or other
consequential damage due to the operation of the Elpida Memory, Inc. product.
[Usage environment]
Usage in environments with special characteristics as listed below was not considered in the design.
Accordingly, our company assumes no responsibility for loss of a customer or a third party when used in
environments with the special characteristics listed below.
Example:
1) Usage in liquids, including water, oils, chemicals and organic solvents.
2) Usage in exposure to direct sunlight or the outdoors, or in dusty places.
3) Usage involving exposure to significant amounts of corrosive gas, including sea air, CL 2 , H 2 S, NH 3 ,
SO 2 , and NO x .
4) Usage in environments with static electricity, or strong electromagnetic waves or radiation.
5) Usage in places where dew forms.
6) Usage in environments with mechanical vibration, impact, or stress.
7) Usage near heating elements, igniters, or flammable items.
If you export the products or technology described in this document that are controlled by the Foreign
Exchange and Foreign Trade Law of Japan, you must follow the necessary procedures in accordance
with the relevant laws and regulations of Japan. Also, if you export products/technology controlled by
U.S. export control regulations, or another country's export control laws or regulations, you must follow
the necessary procedures in accordance with such laws or regulations.
If these products/technology are sold, leased, or transferred to a third party, or a third party is granted
license to use these products, that third party must be made aware that they are responsible for
compliance with the relevant laws and regulations.
M01E0706
Preliminary Data Sheet E1513E10 (Ver. 1.0)
21