GS76024AB BGA Commercial Temp Industrial Temp 8, 10, 12 ns 3.3 V VDD Center VDD and VSS 256K x 24 6Mb Asynchronous SRAM Features 119-bump Ball Grid Array Package • Fast access time: 8, 10, 12 ns • CMOS low power operation: 260/210/180 mA at minimum cycle time • Single 3.3 V ± 0.3V power supply • All inputs and outputs are TTL-compatible • Fully static operation • Industrial Temperature Option: –40 to 85°C • Package B: 14 mm x 22 mm, 119-bump, 1.27 mm pitch BGA Description The GS76024A is a high speed CMOS static RAM organized as 262,144 words by 24 bits. Static design eliminates the need for external clocks or timing strobes. Operating on a single 3.3 V power supply and all inputs and outputs are TTLcompatible. The GS76024A is available in a 119-bump BGA package. Block Diagram A0 Row Decoder Memory Array Address Input A17 Column Decoder CE I/O Buffer Control WE OE DQ1 DQ24 Pin Descriptions Symbol Description Symbol Description A0 to A17 Address input DQ1 to DQ24 Data input/output WE Write enable input OE Output enable input CE Chip enable input VDD +3.3V power supply VSS Ground Rev: 1.02 12/2005 1/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB 119-bump, 1.27 mm Pitch BGA Pad Out—Top View (Package B) 1 2 3 4 5 6 7 A NC A3 A2 A16 A1 A0 NC B NC A7 A6 CE A5 A4 NC C DQ13 NC VDD, NC A17 VSS, NC NC DQ12 D DQ14 VDD VSS VSS VSS VDD DQ11 E DQ15 NC VDD VSS VDD NC DQ10 F DQ16 VDD VSS VSS VSS VDD DQ9 G DQ17 NC VDD VSS VDD NC DQ8 H DQ18 VDD VSS VSS VSS VDD DQ7 J VDD VSS VDD VSS VDD VSS VDD K DQ19 VDD VSS VSS VSS VDD DQ6 L DQ20 NC VDD VSS VDD NC DQ5 M DQ21 VDD VSS VSS VSS VDD DQ4 N DQ22 NC VDD VSS VDD NC DQ3 P DQ23 VDD VSS VSS VSS VDD DQ2 R DQ24 NC NC NC NC NC DQ1 T NC A11 A10 WE A9 A8 NC U NC A15 A14 OE A13 A12 NC Note: Bumps 3C and 5C are actually NCs but should be wired C3 = VDD and C5 = VSS to assure compatibility with future versions. Rev: 1.02 12/2005 2/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Truth Table CE OE WE Mode DQ0 to DQ23 VDD Current H X X Not selected High Z ISB1, ISB2 L L H Read Data Out L X L Write Data In L H H Output disable High Z IDD Note: X: “H” or “L” Absolute Maximum Ratings Parameter Symbol Rating Unit Supply Voltage VDD –0.5 to +4.6 V Input Voltage VIN –0.5 to VDD +0.5 (≤ 4.6 V max.) V Output Voltage VOUT –0.5 to VDD +0.5 (≤ 4.6 V max.) V Allowable BGA power dissipation PD 1.5 W Storage temperature TSTG –55 to 150 o C Note: Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation shall be restricted to Recommended Operating Conditions. Exposure to higher than recommended voltages for extended periods of time could affect device reliability. Recommended Operating Conditions Parameter Symbol Min Typ Max Unit Supply Voltage for -8/10/12 VDD 3.0 3.3 3.6 V Input High Voltage VIH 2.0 — VDD+0.3 V Input Low Voltage VIL –0.3 — 0.8 V Ambient Temperature, Commercial Range TAc 0 — 70 o C Ambient Temperature, Industrial Range TAi –40 — 85 o C Notes: 1. Input overshoot voltage should be less than VDD +2 V and not exceed 20 ns. 2. Input undershoot voltage should be greater than –2 V and not exceed 20 ns. Rev: 1.02 12/2005 3/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Capacitance Parameter Symbol Test Condition Max Unit Input Capacitance CIN VIN = 0 V 10 pF I/O Capacitance COUT VOUT = 0 V 7 pF Notes: 1. Tested at TA = 25°C, f = 1 MHz 2. These parameters are sampled and are not 100% tested DC I/O Pin Characteristics Parameter Symbol Test Conditions Min Max Input Leakage Current IIL VIN = 0 to VDD –2 uA 2 uA Output Leakage Current IOL Output High Z, VOUT = 0 to VDD –1 uA 1 uA Output High Voltage VOH IOH = –4 mA 2.4 — Output Low Voltage VOL IOL = +4 mA — 0.4 V Rev: 1.02 12/2005 4/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB AC Test Conditions Output Load 1 Parameter Conditions Input high level VIH = 2.4 V Input low level VIL = 0.4 V Input rise time tr = 1 V/ns Input fall time tf = 1 V/ns Input reference level 1.4 V Output Load 2 Output reference level 1.4 V 3.3 V Output load Fig. 1& 2 DQ 50Ω 30pF1 VT = 1.4 V 589Ω DQ Notes: 1. Includes scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted 3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ. 5pF1 434Ω Power Supply Currents Parameter Symbol Test Conditions 0 to 70°C –40 to 85°C 8 ns 10 ns 12 ns 8 ns 10 ns 12 ns IDD CE ≤ VIL All other inputs ≥ VIH or ≤ VIL Min. cycle time IOUT = 0 mA 260 mA 210 mA 180 mA 280 mA 230 mA 200 mA Standby Current ISB1 CE ≥ VIH All other inputs ≥ VIH or ≤VIL Min. cycle time 60 mA 50 mA 50 mA 80 mA 70 mA 70 mA Standby Current ISB2 CE ≥ VDD - 0.2V All other inputs ≥ VDD - 0.2V or ≤ 0.2V Operating Supply Current Rev: 1.02 12/2005 20 mA 5/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. 40 mA © 2003, GSI Technology GS76024AB AC Characteristics Read Cycle Parameter Symbol Read cycle time -8 -10 -12 Unit Min Max Min Max Min Max tRC 8 — 10 — 12 — ns Address access time tAA — 8 — 10 — 12 ns Chip enable access time (CE) tAC — 8 — 10 — 12 ns Byte enable access time (UB, LB) tAB — 3.5 — 4 — 5 ns Output enable to output valid (OE) tOE — 3.5 — 4 — 5 ns Output hold from address change tOH 3 — 3 — 3 — ns Chip enable to output in low Z (CE) tLZ* 3 — 3 — 3 — ns Output enable to output in low Z (OE) tOLZ* 0 — 0 — 0 — ns Byte enable to output in low Z (UB, LB) tBLZ* 0 — 0 — 0 — ns Chip disable to output in High Z (CE) tHZ* — 4 — 5 — 6 ns Output disable to output in High Z (OE) tOHZ* — 3.5 — 4 — 5 ns Byte disable to output in High Z (UB, LB) tBHZ* — 3.5 — 4 — 5 ns * These parameters are sampled and are not 100% tested Read Cycle 1: CE = OE = VIL, WE = VIH tRC Address tAA tOH Data Out Rev: 1.02 12/2005 Previous Data Data valid 6/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Read Cycle 2: WE = VIH tRC Address tAA CE tAC tHZ tLZ OE Data Out tOE tOLZ tOHZ Data valid High impedance Write Cycle Parameter Symbol Write cycle time -8 -10 -12 Unit Min Max Min Max Min Max tWC 8 — 10 — 12 — ns Address valid to end of write tAW 5.5 — 7 — 8 — ns Chip enable to end of write tCW 5.5 — 7 — 8 — ns Byte enable to end of write tBW 5.5 — 7 — 8 — ns Data set up time tDW 4 — 4.5 — 6 — ns Data hold time tDH 0 — 0 — 0 — ns Write pulse width tWP 5.5 — 7 — 8 — ns Address set up time tAS 0 — 0 — 0 — ns Write recovery time (WE) tWR 0 — 0 — 0 — ns Write recovery time (CE) tWR1 0 — 0 — 0 — ns Output Low Z from end of write tWLZ* 3 — 3 — 3 — ns Write to output in High Z tWHZ* — 3.5 — 4 — 5 ns * These parameters are sampled and are not 100% tested. Rev: 1.02 12/2005 7/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Write Cycle 1: WE control tWC Address tAW tWR OE tCW CE tAS tWP WE tDW Data In tDH Data valid tWHZ tWLZ Data Out High impedance Write Cycle 2: CE control tWC Address tAW tWR1 OE tAS tCW CE tWP WE tDW Data In Data valid Data Out Rev: 1.02 12/2005 tDH High impedance 8/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Package Dimensions—119-Bump FPBGA (Package B, Variation 1) (Date Code: yyww.31) Pin #1 Corner BOTTOM VIEW A1 Ø0.10S C Ø0.30S C AS B S Ø0.60~0.90 (119x) 1 2 3 4 5 6 7 Ø1.00(3x) REF 20.32 22±0.20 19.50 B 0.70 REF 1.27 7.62 12.00 C Rev: 1.02 12/2005 0.15 C 30 TYP. 14±0.20 SEATING PLANE 0.50~0.70 2.06.±0.13 0.90±0.10 0.15 C A 0.20(4x) 0.56±0.05 A B C D E F G H J K L M N P R T U 1.27 A B C D E F G H J K L M N P R T U 7 6 5 4 3 2 1 9/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Package Dimensions—119-Bump FPBGA (Package B, Variation 2) (Date Code: yyww.3H) TOP VIEW A1 1 2 3 4 5 6 BOTTOM VIEW A1 Ø0.10S C Ø0.30S C AS B S Ø0.60~0.90 (119x) 7 7 6 5 4 3 2 1 A B C D E F G H J K L M N P R T U 20.32 22±0.10 1.27 A B C D E F G H J K L M N P R T U B 1.27 C Rev: 1.02 12/2005 SEATING PLANE A 0.20(4x) 14±0.10 0.50~0.70 1.86.±0.13 0.15 C 7.62 10/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Ordering Information Part Number1 Package Access Time Temp. Range GS76024AB-8 119-Bump BGA2 8 ns Commercial GS76024AB-10 119-Bump BGA2 10 ns Commercial GS76024AB-12 119-Bump BGA2 12 ns Commercial GS76024AB-8I 119-Bump BGA2 8 ns Industrial GS76024AB-10I 119-Bump BGA2 10 ns Industrial GS76024AB-12I 119-Bump BGA2 12 ns Industrial Status Notes: 1. Customers requiring Tape and Reel should add the character “T” to the end of the part number. For example: GS76024AB-12T. 2. Please see pages 9 and 10 for date code information for Variation 1 and Variation 2 of the 119-bump BGA. Rev: 1.02 12/2005 11/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology GS76024AB Revision History Rev. Code: Old; New Types of Changes Format or Content • Creation of new datasheet GS76024A_r1 GS76024A_r1; GS76024A_r1_01 Content/Format GS76024A_r1_01; GS76024A_r1_02 Content Rev: 1.02 12/2005 Page/Revisions/Reason • Updated format • Added variation information to package mechanical • Added Variation 2 119 BGA to datasheet • Added date codes to mechanicals 12/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2003, GSI Technology