ETC HY5V16CF-H

HY5V16CF
2 Banks x 512K x 16Bit Synchronous DRAM
DESCRIPTION
The Hynix HY5V16CF is a 16,777,216-bit CMOS Synchronous DRAM, ideally suited for the main memory applications which require
large memory density and high bandwidth. HY5V16CF is organized as 2banks of 524,288x16.
HY5V16CF is offering fully synchronous operation referenced to a positive edge of the clock. All inputs and outputs are synchronized
with the rising edge of the clock input. The data paths are internally pipelined to achieve very high bandwidth. All input and output voltage levels are compatible with LVTTL.
Programmable options include the length of pipeline (Read latency of 2 or 3), the number of consecutive read or write cycles initiated
by a single control command (Burst length of 1,2,4,8 or Full page), and the burst count sequence(sequential or interleave). A burst of
read or write cycles in progress can be terminated by a burst terminate command or can be interrupted and replaced by a new burst
read or write command on any cycle. (This pipelined design is not restricted by a `2N` rule.)
FEATURES
•
Single 3.3±0.3V power supply Note)
•
Auto refresh and self refresh
•
All device pins are compatible with LVTTL interface
•
4096 refresh cycles / 64ms
•
JEDEC standard 60Ball FD-BGA with 0.65mm of
•
Programmable Burst Length and Burst Type
pin pitch
- 1, 2, 4, 8 or Full page for Sequential Burst
•
All inputs and outputs referenced to positive edge of
- 1, 2, 4 or 8 for Interleave Burst
system clock
•
Data mask function by UDQM or LDQM
•
Internal four banks operation
•
Programmable CAS Latency ; 2, 3 Clocks
ORDERING INFORMATION
Part No.
Clock Frequency
HY5V16CF-H
133MHz
HY5V16CF-S
100MHz
Power
Normal
Organization
2Banks x
512Kbits x16
Interface
LVTTL
Package
10.1x 6.4 60Ball 0.65
Pin -pitch FD-BGA
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any responsibility for use of
circuits described. No patent licenses are implied.
Rev. 0.0/Jun.01
HY5V16CF
PIN CONFIGURATION
(16 M S D R A M )
PIN DESCRIPTION
PIN
PIN NAME
CLK
Clock
CKE
Clock Enable
CS
Chip Select
BA
Bank Address
A0 ~ A10
Address
Row Address Strobe,
R A S , C A S, W E
Column Address Strobe,
Write Enable
DESCRIPTION
The system clock input. All other inputs are registered to the SDRAM on the
rising edge of CLK
Controls internal clock signal and when deactivated, the SDRAM will be one
of the states among power down, suspend or self refresh
Enables or disables all inputs except CLK, CKE and DQM
S e l e c t s b a n k t o b e a c t i v a t e d d u r i n g R A S activity
S e l e c t s b a n k t o b e r e a d / w r i t t e n d u r i n g C A S activity
Row Address : RA0 ~ RA11, Column Address : CA0 ~ CA7
Auto-precharge flag : A10
R A S , C A S and W E define the operation
Refer function truth table for details
LDQM, UDQM
Data Input/Output Mask
Controls output buffers in read mode and masks input data in write mode
DQ0 ~ DQ15
Data Input/Output
Multiplexed data input / output pin
V D D /V S S
Power Supply/Ground
Power supply for internal circuits and input buffers
V D D Q /V S S Q
Data Output Power/Ground
Power supply for output buffers
NC
No Connection
No connection
Rev. 0.0/Jun.01
2
HY5V16CF
FUNCTIONAL BLOCK DIAGRAM
512Kbit x 2banks x 16 I/O Synchronous DRAM
Refresh
Ref. Addr .[0:11]
Auto/Self Refresh
Address[0:10]
Counter
Row Decoder
Refresh
Interval Timer
Row Addr. Latch/ Predecoder
Self Refresh Counter
512 Kx16
Bank 0
Sense AMP & I/O gates
Column Decoder
CLK
DQ0
DQ1
Register
DQ2
Row Active
CS
RAS
CAS
State Machine
BA(A11)
C o l u m n A d d r.
Column Active
Latch & Counter
Overflow
Burst Length
Counter
WE
Data Input/Output Buffers
Precharge
CKE
Address
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
UDQM
DQ14
Column Decoder
LDQM
Row Addr. Latch/ Predecoder
Mode Register
Rev. 0.0/Jun.01
DQ15
Sense AMP & I/O gates
512Kx16
Bank 1
Test Mode
I/O Control
3
HY5V16CF
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Rating
Unit
Ambient Temperature
TA
0 ~ 70
°C
Storage Temperature
TS T G
-55 ~ 125
°C
Voltage on Any Pin relative to V S S
V IN, V O U T
-1.0 ~ 4.6
V
Voltage on V D D relative to V S S
VDD, VD D Q
-1.0 ~ 4.6
V
Short Circuit Output Current
IO S
50
mA
Power Dissipation
PD
1
W
Soldering Temperature ⋅ T i m e
TSOLDER
260 ⋅ 10
°C ⋅ S e c
Note : Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION
Parameter
( T A = 0 t o 7 0 °C )
Symbol
Min
Typ.
Max
Unit
Note
Power Supply Voltage
VD D , VDDQ
3.0
3.3
3.6
V
1
Input High Voltage
V IH
2.0
3.0
V DDQ + 2.0
V
1,2
Input Low Voltage
V IL
V S S Q - 2.0
0
0.8
V
1,3
Note :
1.All voltages are referenced to VSS = 0 V
2.V IH (max) is acceptable 5.6V AC pulse width with ≤ 3ns of duration
3.V IL (min) is acceptable -2.0V AC pulse width with ≤ 3ns of duration
AC OPERATING CONDITION
( T A = 0 t o 7 0 ° C , V D D = 3 . 3 ± 0 . 3 VN o t e 2 , V S S = 0 V )
Parameter
AC Input High / Low Level Voltage
Input Timing Measurement Reference Level Voltage
Input Rise / Fall Time
Output Timing Measurement Reference Level
Output Load Capacitance for Access Time Measurement
Symbol
Value
Unit
V I H / V IL
2.4/0.4
V
Vtrip
1.4
V
tR / tF
1
ns
Voutref
1.4
V
CL
50
pF
Note
1
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF)
For details, refer to AC/DC output circuit
Rev. 0.0/Jun.01
4
HY5V16CF
CAPACITANCE
( T A = 2 5° C , f = 1 M H z )
Parameter
Pin
Input capacitance
Symbol
Min
Max
Unit
CLK
C I1
2
4
pF
A0 ~ A11, BA0, BA1, CKE, C S, RAS,
CI 2
2.5
5
pF
C I/O
2
6.5
pF
CAS, W E, UDQM, LDQM
Data input / output capacitance
DQ0 ~ DQ15
OUTPUT LOAD CIRCUIT
Vtt=1.4V
RT=250 Ω
Output
Output
50pF
50 pF
DC Output Load Circuit
DC CHARACTERISTICS I
Parameter
AC Output Load Circuit
( T A = 0 t o 7 0 ° C , V DD =3.3 ± 0 . 3 V Note3)
Symbol
Min.
Max
Unit
Note
Input Leakage Current
IL I
-1
1
uA
1
Output Leakage Current
IL O
-1
1
uA
2
Output High Voltage
VOH
2.4
-
V
IO H = - 4 m A
Output Low Voltage
VOL
-
0.4
V
IO L = + 4 m A
Note :
1 . V I N = 0 t o 3 . 6 V , A l l o t h e r p i n s a r e n o t t e s t e d u n d e r V IN = 0 V
2.DO U T is disabled, V O U T =0 to 3.6
Rev. 0.0/Jun.01
5
HY5V16CF
DC CHARACTERISTICS II
( T A = 0 t o 7 0 °C , V D D = 3 . 3 ± 0 . 3 V
Note5
, VSS =0V)
Speed
Parameter
Operating Current
Precharge Standby Current
in Power Down Mode
Symbol
ID D 1
Test Condition
Burst length=1, One bank active
tRC ≥ tR C( m i n ) , I O L = 0 m A
ID D 2 P
C K E ≤ V IL(max), tC K = min
ID D 2 P S
C K E ≤ V IL(max), tC K =
-H
-S
110
90
∞
Unit
Note
mA
1
2
mA
1
mA
50
mA
12
mA
7
mA
5
mA
50
mA
20
mA
C K E ≥ V IH ( m i n ) , C S ≥ V I H ( m i n ) , t C K = m i n
ID D 2 N
Input signals are changed one time during
2clks. All other pins ≥ V D D -0.2V or ≤ 0.2V
Precharge Standby Current
in Non Power Down Mode
ID D 2 N S
C K E ≥ V IH ( m i n ) , t C K =
∞
Input signals are stable.
Active Standby Current
in Power Down Mode
ID D 3 P
C K E ≤ V IL(max), tC K = min
ID D 3 P S
C K E ≤ V IL(max), tC K =
∞
C K E ≥ V IH ( m i n ) , C S ≥ V I H ( m i n ) , t C K = m i n
ID D 3 N
Input signals are changed one time during
2clks. All other pins ≥ V D D -0.2V or ≤ 0.2V
Active Standby Current
in Non Power Down Mode
ID D 3 N S
Burst Mode Operating Current
ID D 4
C K E ≥ V IH ( m i n ) , t C K =
∞
Input signals are stable.
tC K ≥ tC K ( m i n ) , I O L = 0 m A
All banks active
Auto Refresh Current
ID D 5
tR R C ≥ tR R C ( m i n ) , A l l b a n k s a c t i v e
Self Refresh Current
ID D 6
CKE ≤ 0.2V
CL=3
CL=2
150
100
mA
100
mA
100
mA
1
mA
1
2
Note :
1.ID D 1 a n d I D D 4 depend on output loading and cycle rates. Specified values are measured with the output open
2.Min. of tRRC (Refresh R A S cycle time) is shown at AC CHARACTERISTICS II
Rev. 0.0/Jun.01
6
HY5V16CF
AC CHARACTERISTICS I
(AC operating conditions unless otherwise noted)
-H
Parameter
Unit
Min
System clock
cycle time
C A S Latency = 3
-S
Symbol
tCK3
Max
7.5
Min
10
1000
ns
1000
tCK2
10
Clock high pulse width
tCHW
3
-
3
-
ns
1
Clock low pulse width
tCLW
3
-
3
-
ns
1
6
ns
Access time from
clock
C A S Latency = 2
Note
Max
10
ns
C A S Latency = 3
tAC3
6
C A S Latency = 2
tAC2
8
-
8
ns
2
Data-out hold time
tOH
2.5
-
2.5
-
ns
Data-Input setup time
tDS
2
-
2
-
ns
1
Data-Input hold time
tDH
1
-
1
-
ns
1
Address setup time
tAS
2
-
2
-
ns
1
Address hold time
tAH
1
-
1
-
ns
1
CKE setup time
tCKS
2
-
2
-
ns
1
CKE hold time
tCKH
1
-
1
-
ns
1
Command setup time
tCS
2
-
2
-
ns
1
Command hold time
tCH
1
-
1
-
ns
1
CLK to data output in low Z-time
tOLZ
1.5
-
1
-
ns
CLK to data output
in high Z-time
C A S Latency = 3
tOHZ3
ns
5.4
C A S Latency = 2
tOHZ2
6
ns
Note :
1.Assume tR / tF (input rise and fall time ) is 1ns
2.Access times to be measured with input signals of 1v/ns edge rate
Rev. 0.0/Jun.01
7
HY5V16CF
AC CHARACTERISTICS I
-H
Parameter
-S
Symbol
Unit
Min
Max
Min
Max
Operation
tR C
65
-
70
-
ns
Auto Refresh
tR R C
65
-
70
-
ns
R A S to C A S Delay
tR C D
20
-
20
-
ns
R A S Active Time
tR A S
45
120K
50
120K
ns
RAS Precharge Time
tR P
20
-
20
-
ns
R A S to R A S Bank Active Delay
tR R D
15
-
20
-
ns
C A S to C A S Delay
tC C D
1
-
1
-
CLK
Write Command to Data-In Delay
tW T L
0
-
0
-
CLK
Data-In to Precharge Command
tD P L
1
-
1
-
CLK
Data-In to Active Command
tD A L
4
-
3
-
CLK
DQM to Data-Out Hi-Z
tD Q Z
2
-
2
-
CLK
DQM to Data-In Mask
tD Q M
0
-
0
-
CLK
MRS to New Command
tM R D
1
-
1
-
CLK
C A S Latency = 3
tP R O Z 3
3
-
3
-
CLK
C A S Latency = 2
tP R O Z 2
2
-
2
-
CLK
Power Down Exit Time
tP D E
1
-
1
-
CLK
Self Refresh Exit Time
tS R E
1
-
1
-
CLK
Refresh Time
tR E F
-
64
-
64
ms
Note
R A S Cycle Time
Precharge to Data
Output Hi-Z
1
Note :
1. A new command can be given tRRC after self refresh exit
Rev. 0.0/Jun.01
8
HY5V16CF
DEVICE OPERATING OPTION TABLE
HY5V16CF-H
C A S Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
133MHz(7.5ns)
3CLKs
3CLKs
6CLKs
9CLKs
3CLKs
5.4ns
2.5ns
125MHz(8ns)
3CLKs
3CLKs
6CLKs
9CLKs
3CLKs
6ns
2.5ns
100MHz(10ns)
3CLKs
3CLKs
6CLKs
9CLKs
3CLKs
6ns
2.5ns
HY5V16CF-S
C A S Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
100MHz(10ns)
3CLKs
2CLKs
5CLKs
8CLKs
3CLKs
6ns
2.5ns
83MHz(12ns)
2CLKs
2CLKs
5CLKs
7CLKs
2CLKs
6ns
3ns
66MHz(15ns)
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
6ns
3ns
Rev. 0.0/Jun.01
9
HY5V16CF
COMMAND TRUTH TABLE
Command
A10/
ADDR
CKEn-1
CKEn
CS
RAS
CAS
WE
DQM
Mode Register Set
H
X
L
L
L
L
X
OP code
H
X
X
X
No Operation
H
X
X
X
L
H
H
H
Bank Active
H
X
L
L
H
H
X
H
X
L
H
L
H
X
AP
RA
Read
Note
V
L
CA
Read with Autoprecharge
V
H
Write
L
H
X
L
H
L
L
X
CA
Write with Autoprecharge
H
X
L
L
H
L
X
Burst Stop
H
X
DQM
H
Auto Refresh
H
H
L
L
L
Entry
H
L
L
L
H
H
H
X
Exit
L
H
L
L
V
X
V
X
H
X
X
L
H
X
X
X
X
X
L
H
H
H
H
X
X
X
L
H
H
H
H
X
X
X
L
H
H
H
H
X
X
X
L
V
V
V
L
Precharge
X
X
X
Self Refresh1
H
L
H
X
Precharge selected Bank
Entry
V
H
Precharge All Banks
X
X
power down
Exit
Clock
BA
Entry
L
H
H
L
Suspend
Exit
L
X
H
X
X
X
X
Note :
1. Exiting Self Refresh occurs by asynchronously bringing CKE from low to high
2 . X = D o n′ t c a r e , H = L o g i c H i g h , L = L o g i c L o w . B A = B a n k A d d r e s s , R A = R o w A d d r e s s , C A = C o l u m n A d d r e s s ,
Opcode = Operand Code, NOP = No Operation
Rev. 0.0/Jun.01
10
HY5V16CF
PACKAGE INFORMATION
60 Ball FD-BGA Package
Rev. 0.0/Jun.01
11