IDT IDT5T9306

IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER
TERABUFFER™ II
FEATURES:
DESCRIPTION:
•
•
•
•
•
•
•
•
The IDT5T9306 2.5V differential clock buffer is a user-selectable differential
input to six LVDS outputs. The fanout from a differential input to six LVDS outputs
reduces loading on the preceding driver and provides an efficient clock
distribution network. The IDT5T9306 can act as a translator from a differential
HSTL, eHSTL, LVEPECL (2.5V), LVPECL (3.3V), CML, or LVDS input to
LVDS outputs. A single-ended 3.3V / 2.5V LVTTL input can also be used to
translate to LVDS outputs. The redundant input capability allows for an
asynchronous change-over from a primary clock source to a secondary clock
source. Selectable reference inputs are controlled by SEL.
The IDT5T9306 outputs can be asynchronously enabled/disabled. When
disabled, the outputs will drive to the value selected by the GL pin. Multiple power
and grounds reduce noise.
•
•
•
•
Guaranteed Low Skew < 25ps (max)
Very low duty cycle distortion < 125ps (max)
High speed propagation delay < 1.75ns (max)
Additive phase jitter, RMS 0.159ps (typical) @ 125MHz
Up to 1GHz operation
Selectable inputs
Hot insertable and over-voltage tolerant inputs
3.3V / 2.5V LVTTL, HSTL, eHSTL, LVEPECL (2.5V), LVPECL (3.3V),
CML, or LVDS input interface
Selectable differential inputs to six LVDS outputs
Power-down mode
2.5V VDD
Available in VFQFPN package
APPLICATIONS:
• Clock distribution
FUNCTIONAL BLOCK DIAGRAM
GL
G
PD
A1
A2
0
SEL
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
Q1
OUTPUT
CONTROL
Q2
OUTPUT
CONTROL
Q3
OUTPUT
CONTROL
Q4
OUTPUT
CONTROL
Q5
OUTPUT
CONTROL
Q6
Q1
Q2
1
A1
A2
OUTPUT
CONTROL
1
Q3
Q4
Q5
Q6
IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
NC
Q5
Q5
Q6
Q6
VDD
SEL
PIN CONFIGURATION
28 27 26 25 24 23 22
G
1
21
PD
VDD
2
20
VDD
Q1
3
19
Q4
Q1
4
18
Q4
VDD
5
17
VDD
A1
6
16
A2
A1
7
15
A2
Q2
VDD
VDD
Q3
10 11 12 13 14
Q3
9
Q2
8
GL
GND
VFQFPN
TOP VIEW
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
CAPACITANCE(1) (TA = +25°C, F = 1.0MHz)
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Max
Unit
VDD
Power Supply Voltage
Description
–0.5 to +3.6
V
VI
Input Voltage
–0.5 to +3.6
V
VO
Output Voltage(2)
–0.5 to VDD +0.5
V
TSTG
Storage Temperature
–65 to +150
°C
TJ
Junction Temperature
150
°C
Symbol
CIN
Parameter
Min
Typ.
Max.
Unit
Input Capacitance
—
—
3
pF
NOTE:
1. This parameter is measured at characterization but not tested
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. Not to exceed 3.6V.
RECOMMENDED OPERATING RANGE
Symbol
TA
VDD
Description
Ambient Operating Temperature
Internal Power Supply Voltage
Min.
–40
2.3
Typ.
+25
2.5
Max.
+85
2.7
Unit
°C
V
PIN DESCRIPTION
Symbol
A[1:2]
A[1:2]
I/O
I
I
Type
Adjustable(1,4)
Adjustable(1,4)
G
I
LVTTL
GL
I
LVTTL
Qn
Qn
SEL
PD
O
O
I
I
LVDS
LVDS
LVTTL
LVTTL
VDD
GND
NC
PWR
PWR
Description
Clock input. A[1:2] is the "true" side of the differential clock input.
Complementary clock inputs. A[1:2] is the complementary side of A[1:2]. For LVTTL single-ended operation, A[1:2] should be set to the
desired toggle voltage for A[1:2]:
3.3V LVTTL VREF = 1650mV
2.5V LVTTL VREF = 1250mV
Gate control for differential outputs Q1 and Q1 through Q6 and Q6. When G is LOW, the differential outputs are active. When G is
HIGH, the differential outputs are asynchronously driven to the level designated by GL(2).
Specifies output disable level. If HIGH, "true" outputs disable HIGH and "complementary" outputs disable LOW. If LOW, "true"
outputs disable LOW and "complementary" outputs disable HIGH.
Clock outputs
Complementary clock outputs
Reference clock select. When LOW, selects A2 and A2. When HIGH, selects A1 and A1.
Power-down control. Shuts off entire chip. If LOW, the device goes into low power mode. Inputs and outputs are disabled. Both
"true" and "complementary" outputs will pull to VDD. Set HIGH for normal operation.(3)
Power supply for the device core and inputs
Power supply return for all power
No connect; recommended to connect to GND
NOTES:
1. Inputs are capable of translating the following interface standards:
Single-ended 3.3V and 2.5V LVTTL levels
Differential HSTL and eHSTL levels
Differential LVEPECL (2.5V) and LVPECL (3.3V) levels
Differential LVDS levels
Differential CML levels
2. Because the gate controls are asynchronous, runt pulses are possible. It is the user's responsibility to either time the gate control signals to minimize the possibility of runt
pulses or be able to tolerate them in down stream circuitry.
3. It is recommended that the outputs be disabled before entering power-down mode. It is also recommended that the outputs remain disabled until the device completes powerup after asserting PD.
4. The user must take precautions with any differential input interface standard being used in order to prevent instability when there is no input signal.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE FOR LVTTL(1)
Symbol
Parameter
Input Characteristics
IIH
Input HIGH Current
IIL
Input LOW Current
VIK
Clamp Diode Voltage
VIN
DC Input Voltage
VIH
DC Input HIGH
VIL
DC Input LOW
VTHI
DC Input Threshold Crossing Voltage
Single-Ended Reference Voltage(3)
VREF
Test Conditions
VDD = 2.7V
VDD = 2.7V
VDD = 2.3V, IIN = -18mA
3.3V LVTTL
2.5V LVTTL
Min.
Typ.(2)
Max
Unit
—
—
—
- 0.3
1.7
—
—
—
—
—
—
- 0.7
—
—
—
VDD /2
1.65
1.25
±5
±5
- 1.2
+3.6
—
0.7
—
—
—
μA
V
V
V
V
V
V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
3. For A[1:2] single-ended operation, A[1:2] is tied to a DC reference voltage.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE FOR
DIFFERENTIAL INPUTS(1)
Symbol
Parameter
Input Characteristics
IIH
Input HIGH Current
IIL
Input LOW Current
VIK
Clamp Diode Voltage
VIN
DC Input Voltage
VDIF
DC Differential Voltage(3)
VCM
DC Common Mode Input Voltage(4)
Test Conditions
VDD = 2.7V
VDD = 2.7V
VDD = 2.3V, IIN = -18mA
Min.
Typ.(2)
Max
Unit
—
—
—
- 0.3
0.1
0.05
—
—
- 0.7
—
—
—
±5
±5
- 1.2
+3.6
—
VDD
μA
V
V
V
V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
3. VDIF specifies the minimum input differential voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The DC differential
voltage must be maintained to guarantee retaining the existing HIGH or LOW input. The AC differential voltage must be achieved to guarantee switching to a new state.
4. VCM specifies the maximum allowable range of (VTR + VCP) /2.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVDS(1)
Symbol
Parameter
Output Characteristics
VOT(+)
Differential Output Voltage for the True Binary State
VOT(-)
Differential Output Voltage for the False Binary State
ΔVOT
Change in VOT Between Complementary Output States
VOS
Output Common Mode Voltage (Offset Voltage)
ΔVOS
Change in VOS Between Complementary Output States
IOS
Outputs Short Circuit Current
Differential Outputs Short Circuit Current
IOSD
Test Conditions
Min.
Typ.(2)
Max
Unit
VOUT + and VOUT - = 0V
VOUT + = VOUT -
247
247
—
1.125
—
—
—
—
—
—
1.2
—
12
6
454
454
50
1.375
50
24
12
mV
mV
mV
V
mV
mA
mA
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, TA = +25°C ambient.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL
Symbol
VDIF
Parameter
Input Signal Swing(1)
(2)
Value
Units
1
V
VX
Differential Input Signal Crossing Point
750
mV
DH
Duty Cycle
50
%
(3)
VTHI
Input Timing Measurement Reference Level
tR, tF
Input Signal Edge Rate(4)
Crossing Point
V
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL
Symbol
VDIF
Parameter
Input Signal Swing(1)
(2)
Value
Units
1
V
VX
Differential Input Signal Crossing Point
900
mV
DH
Duty Cycle
50
%
(3)
VTHI
Input Timing Measurement Reference Level
tR, tF
Input Signal Edge Rate(4)
Crossing Point
V
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND
LVPECL (3.3V)
Symbol
Parameter
Value
(1)
VDIF
Input Signal Swing
VX
Differential Input Signal Crossing Point(2)
DH
Duty Cycle
732
mV
LVEPECL
1082
mV
LVPECL
1880
50
(3)
VTHI
Input Timing Measurement Reference Level
tR, tF
Input Signal Edge Rate(4)
Units
%
Crossing Point
V
2
V/ns
NOTES:
1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment.
This device meets the VX specification under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVDS
Symbol
VDIF
Parameter
Value
Units
400
mV
Input Signal Swing(1)
(2)
VX
Differential Input Signal Crossing Point
1.2
V
DH
Duty Cycle
50
%
VTHI
Input Timing Measurement Reference Level(3)
tR, tF
Input Signal Edge Rate(4)
Crossing Point
V
2
V/ns
NOTES:
1. The 400mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 1.2V crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
AC DIFFERENTIAL INPUT SPECIFICATIONS(1)
Symbol
Parameter
Min.
Typ.
Max
Unit
VDIF
AC Differential Voltage(2)
0.1
—
3.6
V
VIX
VCM
Differential Input Crosspoint Voltage
Common Mode Input Voltage Range(3)
0.05
0.05
—
—
VDD
VDD
V
V
VIN
Input Voltage
- 0.3
+3.6
V
NOTES:
1. The output will not change state until the inputs have crossed and the minimum differential voltage range defined by VDIF has been met or exceeded.
2. VDIF specifies the minimum input voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The AC differential voltage
must be achieved to guarantee switching to a new state.
3. VCM specifies the maximum allowable range of (VTR + VCP) /2.
POWER SUPPLY CHARACTERISTICS FOR LVDS OUTPUTS(1)
Symbol
IDDQ
ITOT
IPD
Parameter
Quiescent VDD Power Supply Current
Total Power VDD Supply Current
Total Power Down Supply Current
Test Conditions
VDD = Max., All Input Clocks = LOW(2)
Outputs enabled
VDD = 2.7V., FREFERENCE CLOCK = 1GHz
PD = LOW
Typ.
—
Max
240
Unit
mA
—
—
250
5
mA
mA
NOTES:
1. These power consumption characteristics are for all the valid input interfaces and cover the worst case conditions.
2. The true input is held LOW and the complementary input is held HIGH.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
AC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(1,5)
Symbol
Skew Parameters
tSK(O)
tSK(P)
tSK(PP)
Propagation Delay
tPLH
tPHL
Parameter
Min.
Typ.
Max
Unit
Same Device Output Pin-to-Pin Skew(2)
Pulse Skew(3)
—
—
25
125
ps
ps
Part-to-Part Skew(4)
—
—
—
—
300
ps
Propagation Delay A, A Crosspoint to Qn, Qn Crosspoint
—
1.25
1.75
ns
—
—
1
GHz
Output Gate Enable Crossing VTHI to Qn/Qn Crosspoint
—
—
3.5
ns
Output Gate Disable Crossing VTHI to Qn/Qn Crosspoint Driven to GL Designated Level
—
—
3.5
ns
—
—
—
—
100
100
μS
μS
fO
Frequency Range(6)
Output Gate Enable/Disable Delay
tPGE
tPGD
Power Down Timing
tPWRDN
PD Crossing VTHI to Qn = VDD, Qn = VDD
Output Gate Disable Crossing VTHI to Qn/Qn Driven to GL Designated Level
tPWRUP
RMS Additive Phase Jitter
RMS Additive Phase Jitter @ 25MHz (12kHz – 10MHz Integration Range)
tJIT
0.541
ps
RMS Additive Phase Jitter @ 125MHz (12kHz – 20MHz Integration Range)
0.159
ps
RMS Additive Phase Jitter @ 156.25MHz (12kHz – 20MHz Integration Range)
0.185
ps
NOTES:
1. AC propagation measurements should not be taken within the first 100 cycles of startup.
2. Skew measured between crosspoints of all differential output pairs under identical input and output interfaces, transitions and load conditions on any one device.
3. Skew measured is the difference between propagation delay times tPHL and tPLH of any differential output pair under identical input and output interfaces, transitions and load conditions
on any one device.
4. Skew measured is the magnitude of the difference in propagation times between any single differential output pair of two devices, given identical transitions and load conditions
at identical VDD levels and temperature.
5. All parameters are tested with a 50% input duty cycle.
6. Guaranteed by design but not production tested.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
DIFFERENTIAL AC TIMING WAVEFORMS
1/fo
+ VDIF
VDIF = 0
- VDIF
A[1:2] - A[1:2]
tPHL
tPLH
+ VDIF
VDIF = 0
- VDIF
Qn - Qn
tSK(O)
tSK(O)
+ VDIF
VDIF = 0
- VDIF
Qm - Qm
Output Propagation and Skew Waveforms
NOTES:
1. Pulse skew is calculated using the following expression:
tSK(P) = | tPHL - tPLH |
Note that the tPHL and tPLH shown above are not valid measurements for this calculation because they are not taken from the same pulse.
2. AC propagation measurements should not be taken within the first 100 cycles of startup.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
+ VDIF
VDIF = 0
- VDIF
A[1:2] - A[1:2]
VIH
VTHI
VIL
GL
tPLH
VIH
VTHI
VIL
G
tPGD
tPGE
+ VDIF
VDIF = 0
- VDIF
Qn - Qn
Differential Gate Disable/Enable Showing Runt Pulse Generation
NOTE:
1. As shown, it is possible to generate runt pulses on gate disable and enable of the outputs. It is the user's responsibility to time the G signal to avoid this problem.
A1 - A1
+VDIF
VDIF=0
-VDIF
A2 - A2
+VDIF
VDIF=0
-VDIF
G
VIH
VTHI
VIL
PD
VIH
VTHI
VIL
+VDIF
VDIF=0
-VDIF
Qn - Qn
Power Down Timing
NOTES:
1. It is recommended that outputs be disabled before entering power-down mode. It is also recommended that the outputs remain disabled until the device completes power-up after
asserting PD.
2. The POWER DOWN TIMING diagram assumes that GL is HIGH.
3. It should be noted that during power-down mode, the outputs are both pulled to VDD. In the POWER DOWN TIMING diagram this is shown when Qn-Qn goes to VDIF = 0.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
TEST CIRCUITS AND CONDITIONS
VIN
~50Ω
Transmission Line
VDD/2
A
D.U.T.
Pulse
Generator
VIN
A
~50Ω
Transmission Line
-VDD/2
Scope
50Ω
50Ω
Test Circuit for Differential Input
DIFFERENTIAL INPUT TEST CONDITIONS
Symbol
VDD = 2.5V ± 0.2V
Unit
VTHI
Crossing of A and A
V
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
VDD
A
Pulse
Generator
Qn
RL
A
D.U.T.
VOS
VOD
RL
Qn
Test Circuit for DC Outputs and Power Down Tests
VDD/2
SCOPE
CL
Z = 50Ω
Pulse
Generator
A
Qn
50Ω
A
D.U.T.
50Ω
Qn
Z = 50Ω
CL
-VDD/2
Test Circuit for Propagation, Skew, and Gate Enable/Disable Timing
LVDS OUTPUT TEST CONDITION
Symbol
VDD = 2.5V ± 0.2V
Unit
CL
0(1)
8(1,2)
pF
RL
50
Ω
NOTES:
1. Specifications only apply to "Normal Operations" test condition. The TIA/EIA specification load is for reference only.
2. The scope inputs are assumed to have a 2pF load to ground. TIA/EIA - 644 specifies 5pF between the output pair. With CL = 8pF, this gives the test circuit appropriate 5pF equivalent
load.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
RECOMMENDED LANDING PATTERN
NL 28 pin
NOTE:
All dimensions are in millimeters.
IDT™ / ICS™ LVDS CLOCK BUFFER TERABUFFER™ II
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IDT5T9306 REV. A OCTOBER 23, 2007
IDT5T9306
2.5V LVDS 1:6 CLOCK BUFFER TERABUFFER™ II
ORDERING INFORMATION
IDT
XXXXX
Device Type
XX
Package
X
Process
I
-40°C to +85°C (Industrial)
NL
Thermally Enhanced Plastic Very Fine Pitch
Quad Flat No Lead Package
5T9306
2.5V 1:6 LVDS Clock Buffer Terabuffer™ II
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For Tech Support
800-345-7015
408-284-8200
Fax: 408-284-2775
[email protected]
480-763-2056
Corporate Headquarters
Asia Pacific and Japan
Europe
Integrated Device Technology, Inc.
6024 Silver Creek Valley Road
San Jose, CA 95138
United States
800 345 7015
+408 284 8200 (outside U.S.)
Integrated Device Technology
Singapore (1997) Pte. Ltd.
Reg. No. 199707558G
435 Orchard Road
#20-03 Wisma Atria
Singapore 238877
+65 6 887 5505
IDT Europe, Limited
321 Kingston Road
Leatherhead, Surrey
KT22 7TU
England
+44 (0) 1372 363 339
Fax: +44 (0) 1372 378851
© 2007 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are
trademarks of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and
marks are or may be trademarks or registered trademarks used to identify products or services of their respective owners.
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