IDT IDT5T93GL10NLGI

IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
2.5V LVDS 1:10
GLITCHLESS CLOCK BUFFER
TERABUFFER™ II
FEATURES:
•
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•
•
•
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•
IDT5T93GL10
DESCRIPTION:
Guaranteed Low Skew < 25ps (max)
Very low duty cycle distortion < 100ps (max)
High speed propagation delay < 2ns (max)
Up to 650MHz operation
Glitchless input clock switching
Selectable inputs
Hot insertable and over-voltage tolerant inputs
3.3V / 2.5V LVTTL, HSTL, eHSTL, LVEPECL (2.5V), LVPECL (3.3V),
CML, or LVDS input interface
Selectable differential inputs to ten LVDS outputs
Power-down mode
2.5V VDD
Available in VFQFPN package
The IDT5T93GL10 2.5V differential clock buffer is a user-selectable differential input to ten LVDS outputs . The fanout from a differential input to ten LVDS
outputs reduces loading on the preceding driver and provides an efficient clock
distribution network. The IDT5T93GL10 can act as a translator from a differential
HSTL, eHSTL, LVEPECL (2.5V), LVPECL (3.3V), CML, or LVDS input to
LVDS outputs. A single-ended 3.3V / 2.5V LVTTL input can also be used to
translate to LVDS outputs. The redundant input capability allows for a glitchless
change-over from a primary clock source to a secondary clock source.
Selectable inputs are controlled by SEL. During the switchover, the output will
disable low for up to three clock cycles of the previously-selected input clock.
The outputs will remain low for up to three clock cycles of the newly-selected
clock, after which the outputs will start from the newly-selected input. A FSEL
pin has been implemented to control the switchover in cases where a clock
source is absent or is driven to DC levels below the minimum specifications.
The IDT5T93GL10 outputs can be asynchronously enabled/disabled.
When disabled, the outputs will drive to the value selected by the GL pin. Multiple
power and grounds reduce noise.
APPLICATIONS:
• Clock distribution
FUNCTIONAL BLOCK DIAGRAM
GL
G1
PD
A1
OUTPUT
CONTROL
Q1
OUTPUT
CONTROL
Q2
OUTPUT
CONTROL
Q3
OUTPUT
CONTROL
Q4
OUTPUT
CONTROL
Q5
OUTPUT
CONTROL
Q6
OUTPUT
CONTROL
Q7
OUTPUT
CONTROL
Q8
OUTPUT
CONTROL
Q9
OUTPUT
CONTROL
Q10
Q1
Q2
1
A1
A2
0
A2
SEL
FSEL
G2
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
Q3
Q4
Q5
Q6
Q7
Q8
Q9
Q10
JANUARY 2007
1
© 2007 Integrated Device Technology, Inc.
DSC 6184/15
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
FSEL
VDD
Q8
Q8
Q9
Q9
Q10
Q10
VDD
SEL
PIN CONFIGURATION
40 39 38 37 36 35 34 33 32 31
G1
1
30
G2
VDD
2
29
PD
GND
3
28
VDD
Q1
4
27
Q7
Q1
5
26
Q7
Q2
6
25
Q6
Q2
7
24
Q6
VDD
8
23
VDD
A1
9
22
A2
A1
10
21
A2
GND
VFQFPN
TOP VIEW
2
GND
VDD
Q5
Q5
Q4
Q4
Q3
Q3
VDD
GL
11 12 13 14 15 16 17 18 19 20
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
CAPACITANCE(1) (TA = +25°C, F = 1.0MHz)
ABSOLUTE MAXIMUM RATINGS(1)
Max
Unit
VDD
Symbol
Power Supply Voltage
Description
–0.5 to +3.6
V
VI
Input Voltage
–0.5 to +3.6
V
VO
Output Voltage(2)
–0.5 to VDD +0.5
V
TSTG
Storage Temperature
–65 to +150
°C
TJ
Junction Temperature
150
°C
Symbol
CIN
Parameter
Min
Typ.
Max.
Unit
Input Capacitance
—
—
3
pF
NOTE:
1. This parameter is measured at characterization but not tested
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. Not to exceed 3.6V.
RECOMMENDED OPERATING RANGE
Symbol
TA
VDD
Description
Ambient Operating Temperature
Internal Power Supply Voltage
Min.
–40
2.3
Typ.
+25
2.5
Max.
+85
2.7
Unit
°C
V
PIN DESCRIPTION
Symbol
A[1:2]
A[1:2]
I/O
I
I
Type
Adjustable(1,4)
Adjustable(1,4)
G1
I
LVTTL
G2
I
LVTTL
GL
I
LVTTL
Qn
Qn
SEL
PD
O
O
I
I
LVDS
LVDS
LVTTL
LVTTL
FSEL
VDD
I
LVTTL
PWR
Description
Clock input. A[1:2] is the "true" side of the differential clock input.
Complementary clock inputs. A[1:2] is the complementary side of A[1:2]. For LVTTL single-ended operation, A[1:2] should be set to the
desired toggle voltage for A[1:2]:
3.3V LVTTL VREF = 1650mV
2.5V LVTTL VREF = 1250mV
Gate control for differential outputs Q1 and Q1 through Q5 and Q5. When G1 is LOW, the differential outputs are active. When G1 is
HIGH, the differential outputs are asynchronously driven to the level designated by GL(2).
Gate control for differential outputs Q6 and Q6 through Q10 and Q10. When G2 is LOW, the differential outputs are active. When G2 is
HIGH, the differential outputs are asynchronously driven to the level designated by GL(2).
Specifies output disable level. If HIGH, "true" outputs disable HIGH and "complementary" outputs disable LOW. If LOW, "true"
outputs disable LOW and "complementary" outputs disable HIGH.
Clock outputs
Complementary clock outputs
Reference clock select. When LOW, selects A2 and A2. When HIGH, selects A1 and A1.
Power-down control. Shuts off entire chip. If LOW, the device goes into low power mode. Inputs and outputs are disabled. Both
"true" and "complementary" outputs will pull to VDD. Set HIGH for normal operation.(3)
At a rising edge, FSEL forces select to the input designated by SEL. Set LOW for normal operation.
Power supply for the device core and inputs
PWR
Ground
GND
NOTES:
1. Inputs are capable of translating the following interface standards:
Single-ended 3.3V and 2.5V LVTTL levels
Differential HSTL and eHSTL levels
Differential LVEPECL (2.5V) and LVPECL (3.3V) levels
Differential LVDS levels
Differential CML levels
2. Because the gate controls are asynchronous, runt pulses are possible. It is the user's responsibility to either time the gate control signals to minimize the possibility of runt
pulses or be able to tolerate them in down stream circuitry.
3. It is recommended that the outputs be disabled before entering power-down mode. It is also recommended that the outputs remain disabled until the device completes powerup after asserting PD.
4. The user must take precautions with any differential input interface standard being used in order to prevent instability when there is no input signal.
3
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVTTL(1)
Symbol
Parameter
Input Characteristics
IIH
Input HIGH Current
IIL
Input LOW Current
VIK
Clamp Diode Voltage
VIN
DC Input Voltage
VIH
DC Input HIGH
VIL
DC Input LOW
VTHI
DC Input Threshold Crossing Voltage
Single-Ended Reference Voltage(3)
VREF
Test Conditions
VDD = 2.7V
VDD = 2.7V
VDD = 2.3V, IIN = -18mA
3.3V LVTTL
2.5V LVTTL
Min.
Typ.(2)
Max
Unit
—
—
—
- 0.3
1.7
—
—
—
—
—
—
- 0.7
±5
±5
- 1.2
+3.6
—
0.7
—
—
—
μA
VDD /2
1.65
1.25
V
V
V
V
V
V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
3. For A[1:2] single-ended operation, A[1:2] is tied to a DC reference voltage.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR DIFFERENTIAL INPUTS(1)
Symbol
Parameter
Input Characteristics
IIH
Input HIGH Current
IIL
Input LOW Current
VIK
Clamp Diode Voltage
VIN
DC Input Voltage
VDIF
DC Differential Voltage(2)
VCM
DC Common Mode Input Voltage(3)
Test Conditions
VDD = 2.7V
VDD = 2.7V
VDD = 2.3V, IIN = -18mA
Min.
Typ.(4)
Max
Unit
—
—
—
- 0.3
0.1
0.05
—
—
- 0.7
±5
±5
- 1.2
+3.6
—
VDD
μA
V
V
V
V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. VDIF specifies the minimum input differential voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The DC differential
voltage must be maintained to guarantee retaining the existing HIGH or LOW input. The AC differential voltage must be achieved to guarantee switching to a new state.
3. VCM specifies the maximum allowable range of (VTR + VCP) /2.
4. Typical values are at VDD = 2.5V, +25°C ambient.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVDS(1)
Symbol
Parameter
Output Characteristics
VOT(+)
Differential Output Voltage for the True Binary State
VOT(-)
Differential Output Voltage for the False Binary State
ΔVOT
Change in VOT Between Complementary Output States
VOS
Output Common Mode Voltage (Offset Voltage)
ΔVOS
Change in VOS Between Complementary Output States
IOS
Outputs Short Circuit Current
Differential Outputs Short Circuit Current
IOSD
Test Conditions
Min.
Typ.(2)
Max
Unit
VOUT + and VOUT - = 0V
VOUT + = VOUT -
247
247
—
1.125
—
—
—
—
—
—
1.2
—
12
6
454
454
50
1.375
50
24
12
mV
mV
mV
V
mV
mA
mA
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
4
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL
Symbol
Parameter
VDIF
Input Signal Swing(1)
Value
Units
1
V
VX
Differential Input Signal Crossing Point
750
mV
DH
Duty Cycle
50
%
VTHI
Input Timing Measurement Reference Level
tR, tF
Input Signal Edge Rate(4)
(2)
(3)
Crossing Point
V
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL
Symbol
Parameter
VDIF
Input Signal Swing(1)
Value
Units
1
V
VX
Differential Input Signal Crossing Point
900
mV
DH
Duty Cycle
50
%
VTHI
Input Timing Measurement Reference Level
tR, tF
Input Signal Edge Rate(4)
(2)
(3)
Crossing Point
V
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND
LVPECL (3.3V)
Symbol
Parameter
VDIF
Input Signal Swing(1)
VX
Differential Input Signal Crossing Point
(2)
DH
Duty Cycle
VTHI
Input Timing Measurement Reference Level(3)
tR, tF
Input Signal Edge Rate
Value
Units
732
mV
LVEPECL
1082
mV
LVPECL
1880
(4)
50
%
Crossing Point
V
2
V/ns
NOTES:
1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment.
This device meets the VX specification under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
5
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVDS
Symbol
Parameter
VDIF
Input Signal Swing(1)
Value
Units
400
mV
VX
Differential Input Signal Crossing Point
1.2
V
DH
Duty Cycle
50
%
VTHI
Input Timing Measurement Reference Level(3)
tR, tF
Input Signal Edge Rate(4)
(2)
Crossing Point
V
2
V/ns
NOTES:
1. The 400mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 1.2V crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
AC DIFFERENTIAL INPUT SPECIFICATIONS(1)
Symbol
Parameter
Min.
Typ.
Max
Unit
VDIF
AC Differential Voltage(2)
0.1
—
3.6
V
VIX
VCM
Differential Input Crosspoint Voltage
Common Mode Input Voltage Range(3)
0.05
0.05
—
—
VDD
VDD
V
V
VIN
Input Voltage
- 0.3
+3.6
V
NOTES:
1. The output will not change state until the inputs have crossed and the minimum differential voltage defined by VDIF has been met or exceeded.
2. VDIF specifies the minimum input voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The AC differential voltage
must be achieved to guarantee switching to a new state.
3. VCM specifies the maximum allowable range of (VTR + VCP) /2.
POWER SUPPLY CHARACTERISTICS FOR LVDS OUTPUTS(1)
Symbol
IDDQ
ITOT
IPD
Parameter
Quiescent VDD Power Supply Current
Total Power VDD Supply Current
Total Power Down Supply Current
Test Conditions
VDD = Max., All Input Clocks = LOW(2)
Outputs enabled
VDD = 2.7V., FREFERENCE CLOCK = 650MHz
PD = LOW
NOTES:
1. These power consumption characteristics are for all the valid input interfaces and cover the worst case conditions.
2. The true input is held LOW and the complementary input is held HIGH.
6
Typ.
—
Max
295
Unit
mA
—
—
305
5
mA
mA
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
AC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(1,5)
Symbol
Skew Parameters
tSK(O)
tSK(P)
Parameter
Min.
Typ.
Max
Unit
Same Device Output Pin-to-Pin Skew(2)
Pulse Skew(3)
—
—
—
—
25
100
ps
ps
tSK(PP)
Propagation Delay
tPLH
tPHL
Part-to-Part Skew(4)
—
—
300
ps
Propagation Delay A, A Crosspoint to Qn, Qn Crosspoint
—
1.5
2
ns
—
—
650
MHz
Output Gate Enable Crossing VTHI to Qn/Qn Crosspoint
—
—
3.5
ns
Output Gate Disable Crossing VTHI to Qn/Qn Crosspoint Driven to GL Designated Level
—
—
3.5
ns
PD Crossing VTHI to Qn = VDD, Qn = VDD
Output Gate Disable Crossing VTHI to Qn/Qn Driven to GL Designated Level
—
—
—
—
100
100
μS
μS
fO
Frequency Range(6)
Output Gate Enable/Disable Delay
tPGE
tPGD
Power Down Timing
tPWRDN
tPWRUP
NOTES:
1. AC propagation measurements should not be taken within the first 100 cycles of startup.
2. Skew measured between crosspoints of all differential output pairs under identical input and output interfaces, transitions and load conditions on any one device.
3. Skew measured is the difference between propagation delay times tPHL and tPLH of any single differential output pair under identical input and output interfaces, transitions and load
conditions on any one device.
4. Skew measured is the magnitude of the difference in propagation times between any single differential output pair of two devices, given identical transitions and load conditions
at identical VDD levels and temperature.
5. All parameters are tested with a 50% input duty cycle.
6. Guaranteed by design but not production tested.
7
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
DIFFERENTIAL AC TIMING WAVEFORMS
1/fo
+ VDIF
VDIF = 0
- VDIF
A[1:2] - A[1:2]
tPHL
tPLH
+ VDIF
VDIF = 0
- VDIF
Qn - Qn
tSK(O)
tSK(O)
Qm - Qm
Output Propagation and Skew Waveforms
NOTES:
1. Pulse skew is calculated using the following expression:
tSK(P) = | tPHL - tPLH |
Note that the tPHL and tPLH shown above are not valid measurements for this calculation because they are not taken from the same pulse.
2. AC propagation measurements should not be taken within the first 100 cycles of startup.
8
+ VDIF
VDIF = 0
- VDIF
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
+ VDIF
VDIF = 0
- VDIF
A[1:2] - A[1:2]
VIH
VTHI
VIL
GL
tPLH
VIH
VTHI
VIL
Gx
tPGE
tPGD
+ VDIF
VDIF = 0
- VDIF
Qn - Qn
Differential Gate Disable/Enable Showing Runt Pulse Generation
NOTE:
1. As shown, it is possible to generate runt pulses on gate disable and enable of the outputs. It is the user's responsibility to time their Gx signals to avoid this problem.
A1 - A1
+ VDIF
VDIF = 0
- VDIF
A2 - A2
+ VDIF
VDIF = 0
- VDIF
VIH
VTHI
VIL
SEL
+ VDIF
VDIF = 0
- VDIF
Qn - Qn
Glitchless Output Operation with Switching Input Clock Selection
NOTES:
1. When SEL changes, the output clock goes LOW on the falling edge of the output clock up to three cycles later. The output then stays LOW for up to three clock cycles of the
new input clock. After this, the output starts with the rising edge of the new input clock.
2. AC propagation measurements should not be taken within the first 100 cycles of startup.
9
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
FSEL Operation for When Current Clock Dies
NOTES:
1. When the differential on the selected clock goes below the minimum DC differential, the outputs clock goes to an unknown state. When this happens, the SEL pin should be toggled
and FSEL asserted in order to force selection of the new input clock. The output clock will start up after a number of cycles of the newly-selected input clock.
2. The FSEL pin should stay asserted until the problem with the dead clock can be fixed in the system.
3. It is recommended that the FSEL be tied HIGH for systems that use only one input. If this is not possible, the user must guarantee that the unused input have a differential greater
than or equal to the minimum DC differential specified in the datasheet.
FSEL Operation for When Opposite Clock Dies
NOTES:
1. When the differential on the non-selected clock goes below the minimum DC differential, the outputs clock goes to an unknown state. When this happens, the FSEL pin should
be asserted in order to force selection of the new input clock. The output clock will start up after a number of cycles of the newly-selected input clock.
2. The FSEL pin should stay asserted until the problem with the dead clock can be fixed in the system.
3. It is recommended that the FSEL be tied HIGH for systems that use only one input. If this is not possible, the user must guarantee that the unused input have a differential greater
than or equal to the minimum DC differential specified in the datasheet.
10
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
A1 - A1
+VDIF
VDIF=0
-VDIF
A2 - A2
+VDIF
VDIF=0
-VDIF
FSEL
VIH
VTHI
VIL
SEL
VIH
VTHI
VIL
+VDIF
VDIF=0
-VDIF
Qn - Qn
Selection of Input While Protecting Against When Opposite Clock Dies
NOTES:
1. If the user holds FSEL HIGH, the output will not be affected by the deselected input clock.
2. The output will immediately be driven to LOW once FSEL is asserted. This may cause glitching on the output. The output will restart with the input clock selected by the SEL
pin.
3. If the user decides to switch input clocks, the user must de-assert FSEL, then assert FSEL after toggling the SEL input pin. The output will be driven LOW and will restart with
the input clock selected by the SEL pin.
A1 - A1
+VDIF
VDIF=0
-VDIF
A2 - A2
+VDIF
VDIF=0
-VDIF
Gx
VIH
VTHI
VIL
PD
VIH
VTHI
VIL
+VDIF
VDIF=0
-VDIF
Qn - Qn
Power Down Timing
NOTES:
1. It is recommended that outputs be disabled before entering power-down mode. It is also recommended that the outputs remain disabled until the device completes power-up after
asserting PD.
2. The POWER DOWN TIMING diagram assumes that GL is HIGH.
3. It should be noted that during power-down mode, the outputs are both pulled to VDD. In the POWER DOWN TIMING diagram this is shown when Qn - Qn goes to VDIF = 0.
11
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND CONDITIONS
VIN
~50Ω
Transmission Line
VDD/2
A
D.U.T.
Pulse
Generator
VIN
A
~50Ω
Transmission Line
-VDD/2
Scope
50Ω
50Ω
Test Circuit for Differential Input
DIFFERENTIAL INPUT TEST CONDITIONS
Symbol
VDD = 2.5V ± 0.2V
Unit
VTHI
Crossing of A and A
V
12
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
VDD
A
Pulse
Generator
Qn
RL
A
D.U.T.
VOS
VOD
RL
Qn
Test Circuit for DC Outputs and Power Down Tests
VDD/2
SCOPE
CL
Z = 50Ω
Pulse
Generator
A
Qn
50Ω
A
D.U.T.
50Ω
Qn
Z = 50Ω
CL
-VDD/2
Test Circuit for Propagation, Skew, and Gate Enable/Disable Timing
LVDS OUTPUT TEST CONDITION
Symbol
VDD = 2.5V ± 0.2V
Unit
CL
0(1)
8(1,2)
pF
RL
50
Ω
NOTES:
1. Specifications only apply to "Normal Operations" test condition. The TIA/EIA specification load is for reference only.
2. The scope inputs are assumed to have a 2pF load to ground. TIA/EIA - 644 specifies 5pF between the output pair. With CL = 8pF, this gives the test circuit appropriate 5pF equivalent
load.
13
IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
RECOMMENDED LANDING PATTERN
NL 40 pin
NOTE:
All dimensions are in millimeters.
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IDT5T93GL10
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XXXXX
Device Type
XX
Package
X
Process
I
-40°C to +85°C (Industrial)
NL
Thermally Enhanced Plastic Very Fine Pitch
Quad Flat No Lead Package
VFQFPN - Green
NLG
5T93GL10
CORPORATE HEADQUARTERS
6024 Silver Creek Valley Road
San Jose, CA 95138
2.5V LVDS 1:10 Glitchless Clock Buffer
Terabuffer™ II
for SALES:
800-345-7015 or 408-284-8200
fax: 408-284-2775
www.idt.com
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for Tech Support:
[email protected]