ETC IDT74FCT163501CPF

IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
3.3V CMOS 18-BIT
REGISTERED TRANSCEIVER
IDT74FCT163501A/C
DESCRIPTION:
FEATURES:
The FCT163501 18-bit registered transceivers are built using advanced
dual metal CMOS technology. These high-speed, low-power 18-bit
registered bus transceivers combine D-type latches and D-type flip-flops to
allow data flow in transparent, latched and clocked modes. Data flow in each
direction is controlled by output-enable (OEAB and OEBA), latch enable
(LEAB and LEBA) and clock (CLKAB and CLKBA) inputs. For A-to-B data
flow, the device operates in transparent mode when LEAB is high. When
LEAB is low, the A data is latched if CLKAB is held at a high or low logic level.
If LEAB is low, the A bus data is stored in the latch/flip-flop on the low-to-high
transition of CLKAB. OEAB performs the output enable function on the B port.
Data flow from B port to A port is similiar but requires using OEBA, LEBA
and CLKBA. Flow-through organization of signal pins simplifies layout. All
inputs are designed with hysteresis for improved noise margin.
The FCT163501 has series current limiting resistors. These offer low
ground bounce, minimal undershoot, and controlled output fall timesreducing the need for external series terminating resistors.
• 0.5 MICRON CMOS Technology
• Typical tSK(o) (Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• VCC = 3.3V ± 0.3V, Normal Range, or VCC = 2.7V to 3.6V, Extended
Range
µ W typ. static)
• CMOS power levels (0.4µ
• Rail-to-rail output swing for increased noise margin
• Low Ground Bounce (0.3V typ.)
• Inputs (except I/O) can be driven by 3.3V or 5V components
• Available in SSOP, TSSOP, and TVSOP packages
FUNCTIONAL BLOCK DIAGRAM
OEAB
1
CLKBA
30
LEBA
28
OEBA
27
CLKAB
55
LEAB
A1
2
3
C
C
D
D
54
C
C
D
D
B1
TO 17 OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
APRIL 2002
1
© 2002 Integrated Device Technology, Inc.
DSC-2776/6
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Description
Max
Unit
OEAB
1
56
GND
VTERM(2)
Terminal Voltage with Respect to GND
–0.5 to +4.6
V
LEAB
2
55
CLKAB
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to 7
V
A1
3
54
B1
VTERM(4)
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
GND
4
53
GND
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +60
mA
A2
5
52
B2
A3
6
51
B3
VCC
7
50
VCC
A4
8
49
B4
A5
9
48
B5
A6
10
47
B6
GND
11
46
GND
A7
12
45
B7
A8
13
44
B8
A9
14
43
B9
A10
15
42
B10
Symbol
Conditions
Typ.
Max.
Unit
CIN
Input Capacitance
VIN = 0V
3.5
6
pF
COUT
Output Capacitance
VOUT = 0V
3.5
8
pF
A11
16
41
B11
A12
17
40
B12
GND
18
39
GND
A13
19
38
B13
A14
20
37
B14
A15
21
36
B15
VCC
22
35
VCC
A16
23
34
B16
A17
24
33
B17
GND
25
32
GND
A18
26
31
B18
OEBA
27
30
CLKBA
LEBA
28
29
GND
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Outputs and I/O terminals.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
FUNCTION TABLE(1,4)
Inputs
SSOP/ TSSOP/ TVSOP
TOP VIEW
Description
OEAB
A-to-B Output Enable Input
OEBA
B-to-A Output Enable Input (Active LOW)
LEAB
A-to-B Latch Enable Input
LEBA
B-to-A Latch Enable Input
CLKAB
A-to-B Clock Input
CLKBA
B-to-A Clock Input
Ax
A-to-B Data Inputs or B-to-A 3-State Outputs
Bx
B-to-A Data Inputs or A-to-B 3-State Outputs
Outputs
Bx
OEAB
LEAB
CLKAB
Ax
L
X
X
X
Z
H
H
X
L
L
H
H
X
H
H
H
L
↑
L
L
H
L
↑
H
H
H
L
L
X
B(2)
H
L
H
X
B(3)
NOTES:
1. A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA, and
CLKBA.
2. Output level before the indicated steady-state input conditions were established.
3. Output level before the indicated steady-state input conditions were established,
provided that CLKAB was HIGH before LEAB went LOW.
4. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High-Impedance
↑ = LOW-to-HIGH Transition
PIN DESCRIPTION
Pin Names
Parameter(1)
2
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V
Symbol
VIH
Parameter
Min.
Typ.(2)
Max.
Unit
2
—
5.5
V
2
—
VCC+0.5
–0.5
—
0.8
VI = 5.5V
—
—
±1
Input HIGH Current (I/O pins)
VI = VCC
—
—
±1
Input LOW Current (Input pins)
VI = GND
—
—
±1
Input LOW Current (I/O pins)
VI = GND
—
—
±1
VO = VCC
—
—
±1
VO = GND
—
—
±1
—
–0.7
–1.2
V
–36
–60
–110
mA
mA
Input HIGH Level (Input pins)
Test Conditions(1)
Guaranteed Logic HIGH Level
Input HIGH Level (I/O pins)
VIL
Input LOW Level (Input and I/O pins) Guaranteed Logic LOW Level
IIH
Input HIGH Current (Input pins)
IIL
VCC = Max.
IOZH
High Impedance Output Current
IOZL
(3-State Output pins)
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
IODH
Output HIGH Current
VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
(3)
IODL
Output LOW Current
VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
(3)
VOH
Output HIGH Voltage
VCC = Min.
IOH = –0.1mA
VIN = VIH or VIL
VCC = 3V
VCC = Max.
V
µA
µA
50
90
200
VCC-0.2
—
—
IOH = –3mA
2.4
3
—
IOH = –8mA
2.4
3
—
VCC = Min.
IOL = 0.1mA
—
—
0.2
VIN = VIH or VIL
IOL = 16mA
—
0.2
0.4
IOL = 24mA
—
0.3
0.55
IOL = 24mA
—
0.3
0.5
–60
–135
–240
mA
—
150
—
mV
—
0.1
10
µA
(5)
V
VIN = VIH or VIL
VOL
Output LOW Voltage
VCC = 3V
V
VIN = VIH or VIL
IOS
Short Circuit Current
VH
Input Hysteresis
ICCL
ICCH
ICCZ
Quiescent Power Supply Current
(4)
VCC = Max., VO = GND(3)
—
VCC = Max.
VIN = GND or VCC
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. VOH = VCC–0.6V at rated current.
3
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
—
2
30
µA
VIN = VCC
VIN = GND
—
60
100
µA/
MHz
VIN = VCC
VIN = GND
—
0.6
1
mA
fI = 5MHz
VIN = VCC - 0.6V
—
0.6
1
50% Duty Cycle
VIN = GND
—
3
5(5)
—
3
5.3(5)
Symbol
Parameter
∆ICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = VCC - 0.6V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
OEAB = OEBA = VCC or GND
One Input Togging
50% Duty Cycle
Total Power Supply Current(6)
VCC = Max.,Outputs Open
fCP = 10MHz (xCLKAB)
50% Duty Cycle
IC
OEAB = OEBA = VCC
LEAB = GND
One Bit Toggling
VCC = Max.,Outputs Open
VIN = VCC
fCP = 10MHz (xCLKAB)
50% Duty Cycle
VIN = GND
OEAB = OEBA = VCC
LEAB = GND
fI = 2.5MHz
VIN = VCC - 0.6V
50% Duty Cycle
VIN = GND
Eighteen Bits Toggling
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, +25°C ambient.
3. Per TTL driven input. All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
∆ICC = Power Supply Current for a TTL High Input
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE(1)
Symbol
fMAX
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
tSU
tH
tSU
tH
tW
tW
tSK(o)
Parameter
CLKAB or CLKBA frequency
Propagation Delay
Ax to Bx or Bx to Ax
Propagation Delay
LEBA to Ax, LEAB to Bx
Propagation Delay
CLKBA to Ax, CLKAB to Bx
Output Enable Time
OEBA to Ax, OEAB to Bx
Output Disable Time
OEBA to Ax, OEAB to Bx
Set-up Time HIGH or LOW
Ax to CLKAB, Bx to CLKBA
Hold Time HIGH or LOW
Ax to CLKAB, Bx to CLKBA
Set-up Time HIGH or LOW
Clock LOW
Ax to LEAB, Bx to LEBA
Clock HIGH
Hold Time HIGH or LOW
Ax to LEAB, Bx to LEBA
LEAB or LEBA Pulse Width HIGH(4)
CLKAB or CLKBA Pulse Width HIGH or LOW(4)
Output Skew(5)
FCT163501A
Min.(3)
Max.
—
150
1.5
5.1
Condition(2)
CL = 50pF
RL = 500Ω
FCT163501C
Min.(3)
Max.
—
150
1.5
4.6
Unit
ns
ns
1.5
5.6
1.5
5.3
ns
1.5
5.6
1.5
5.3
ns
1.5
6
1.5
5.6
ns
1.5
5.6
1.5
5.2
ns
3
—
3
—
ns
0
—
0
—
ns
3
1.5
1.5
—
—
—
3
1.5
1.5
—
—
—
ns
3
3
—
—
—
0.5
3
3
—
—
—
0.5
ns
ns
ns
ns
NOTES:
1. Propagation Delays and Enable/Disable times are with VCC = 3.3V ±0.3V, Normal Range. For VCC = 2.7V to 3.6V, Extended Range, all Propagation Delays and Enable/Disable
times should be degraded by 20%.
2. See test circuit and waveforms.
3. Minimum limits are guaranteed but not tested on Propagation Delays.
4. This parameter is guaranteed but not tested.
5. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
5
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
6v
Open
V CC
500Ω
GND
V OUT
VIN
Pulse
Generator
D.U.T.
50pF
RT
500Ω
Test
Switch
Open Drain
Disable Low
Enable Low
6V
Disable High
Enable High
GND
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
CL
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tREM
tSU
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
3V
1.5V
0V
tH
Pulse Width
Set-up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
DISABLE
3V
1.5V
CONTROL
INPUT
tPZL
VOH
1.5V
VOL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
OUTPUT
NORMALLY
HIGH
Propagation Delay
SWITCH
6V
tPZH
SWITCH
GND
0V
tPLZ
3V
3V
1.5V
0.3V
VOL
tPHZ
0.3V
VOH
1.5V
0V
0V
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
3. if VCC is below 3V, input voltage swings should be adjusted not to exceed VCC.
6
IDT74FCT163501A/C
3.3V CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XX
FCT XXX
Temp. Range
Family
XXXX
X
Device Type Package
PV
PA
PF
Shrink Small Outline Package
Thin Shrink Small Outline Package
Thin Very Small Outline Package
501A
501C
Non-Inverting 18-Bit Registered Transceiver
163
Double-Density 3.3Volt
74
− 40°C to +85°C
DATA SHEET DOCUMENT HISTORY
4/22/2002
Removed blank speed grade
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7
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