STMICROELECTRONICS LIS3LV02DQ

LIS3LV02DQ
MEMS INERTIAL SENSOR
3-Axis - ±2g/±6g Digital Output Low Voltage Linear Accelerometer
Features
■
2.16V TO 3.6V SINGLE SUPPLY
OPERATION
■
1.8V COMPATIBLE IOs
■
I2C/SPI DIGITAL OUTPUT INTERFACES
■
PROGRAMMABLE 12 or 16 BIT DATA
REPRESENTATION
■
INTERRUPT ACTIVATED BY MOTION
■
PROGRAMMABLE INTERRUPT
THRESHOLD
■
EMBEDDED SELF TEST
■
HIGH SHOCK SURVIVABILITY
■
ECO-PACK COMPLIANT
QFPN-28
trimmed to better match the sensing element
characteristics.
The LIS3LV02DQ has a user selectable full scale
of ±2g, ±6g and it is capable of measuring
acceleration over a bandwidth of 640 Hz for all
axes. The device bandwidth may be selected
accordingly to the application requirements. A
self-test capability allows the user to check the
functioning of the system
Description
The LIS3LV02DQ is a three axes digital output
linear accelerometer that includes a sensing
element and an IC interface able to take the
information from the sensing element and to
provide the measured acceleration signals to the
external world through an I2C/SPI serial interface.
The sensing element, capable of detecting the
acceleration, is manufactured using a dedicated
process developed by ST to produce inertial
sensors and actuators in silicon.
The IC interface instead is manufactured using a
CMOS process that allows high level of integration
to design a dedicated circuit which is factory
The device may be configured to generate an
inertial wake-up/free-fall interrupt signal when a
programmable acceleration threshold is crossed
at least in one of the three axes.
The LIS3LV02DQ is available in plastic SMD
package and it is specified over a temperature
range extending from -40°C to +85°C.
The LIS3LV02DQ belongs to a family of products
suitable for a variety of applications:
■
Free-Fall detection
■
Motion activated functions in portable terminals
■
Antitheft systems and Inertial navigation
■
Gaming and Virtual Reality input devices
■
Vibration Monitoring and Compensation
Order codes
Part number
Op. Temp. range, °C
Package
Packing
LIS3LV02DQ
-40 to +85
QFPN-28
Tray
LIS3LV02DQ-TR
-40 to +85
QFPN-28
Tape and Reel
October 2005
CD00047926
Rev 1
1/42
www.st.com
42
LIS3LV02DQ
Contents
1
2
3
4
Block Diagram & Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
1.1
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
1.2
QFN Pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Mechanical and Electrical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1
Mechanical characteristics1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.2
Electrical characteristics1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.3
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.4
Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.4.2
Zero-g level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.4.3
Self Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Functionality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.1
Sensing element . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.2
IC Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.3
Factory calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Application Hints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.1
5
2.4.1
Soldering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Digital Interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
5.1
I2C Serial Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
5.1.1
5.2
I2C Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
SPI Bus Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
5.2.1
SPI Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.2.2
SPI Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5.2.3
SPI Read in 3-wires mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6
Register mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
7
Register Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.1
2/42
WHO_AM_I (0Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
CD00047926
LIS3LV02DQ
8
7.2
OFFSET_X (16h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.3
OFFSET_Y (17h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.4
OFFSET_Z (18h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.5
GAIN_X (19h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.6
GAIN_Y (1Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.7
GAIN_Z (1Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.8
CTRL_REG1 (20h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.9
CTRL_REG2 (21h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
7.10
CTRL_REG3 (22h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
7.11
HP_FILTER_RESET (23h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
7.12
STATUS_REG (27h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
7.13
OUTX_L (28h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
7.14
OUTX_H (29h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
7.15
OUTY_L (2Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7.16
OUTY_H (2Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7.17
OUTZ_L (2Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7.18
OUTZ_H (2Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7.19
FF_WU_CFG (30h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7.20
FF_WU_SRC (31h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
7.21
FF_WU_ACK (32h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
7.22
FF_WU_THS_L (34h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
7.23
FF_WU_THS_H (35h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
7.24
FF_WU_DURATION (36h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
7.25
DD_CFG (38h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
7.26
DD_SRC (39h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.27
DD_ACK (3Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.28
DD_THSI_L (3Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
7.29
DD_THSI_H (3Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
7.30
DD_THSE_L (3Eh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
7.31
DD_THSE_H (3Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Typical performance characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8.1
Mechanical Characteristics at 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
CD00047926
3/42
LIS3LV02DQ
8.2
8.3
Mechanical Characteristics derived from measurement in the
-40°C to +85°C temperature range
38
Electro-Mechanical characteristics at 25°C . . . . . . . . . . . . . . . . . . . . . . . . . 39
9
Package Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
10
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
4/42
CD00047926
LIS3LV02DQ
1 Block Diagram & Pin Description
1
Block Diagram & Pin Description
1.1
Block diagram
Figure 1.
Block Diagram
X+
Y+
Σ∆
CHARGE
AMPLIFIER
Z+
Reconstruction
CS
Filter
SCL/SPC
2
I C
a
DE
MUX
MUX
Σ∆
Reconstruction
Σ∆
Reconstruction
Regs
Array
Filter
Z-
SDA/SDO/SDI
SDO
SPI
YX-
SELF TEST
CONTROL LOGIC
&
INTERRUPT GEN.
CLOCK
TRIMMING
CIRCUITS
RDY/INT
QFPN-28 Pin description
28
Z
1
NC
NC
NC
NC
NC
NC
NC
Pin Connection
22
NC 1
Y
21 NC
GND
Reserved
VDD
VDD
LIS3LV02DQ
(TOP VIEW)
Reserved
GND
X
Reserved
GND
RDY/INT
CK
NC 7
CD00047926
CS
SCL/SPC
VDD_IO
14
SDA/SDI/SDO
8
NC
DIRECTION OF THE
DETECTABLE
ACCELERATIONS
15 NC
NC
Figure 2.
SDO
1.2
REFERENCE
Filter
5/42
LIS3LV02DQ
1 Block Diagram & Pin Description
Table 1.
6/42
Pin description
Pin#
Name
Function
1
NC
2
GND
0V supply
3
Vdd
Power supply
4
Reserved
5
GND
6
RDY/INT
7, 8
NC
Internally not connected
9
SDO
SPI Serial Data Output
10
SDA/
SDI/
SDO
I2C Serial Data (SDA)
SPI Serial Data Input (SDI)
3-wire Interface Serial Data Output (SDO)
11
Vdd_IO
12
SCL/SPC
13
CS
14, 15
NC
Internally not connected
16
CK
Optional External clock, if not used either leave unconnected or
connect to GND
17
GND
18
Reserved
19
Vdd
20
Reserved
21-28
NC
Internally not connected
Either leave unconnected or connect to GND
0V supply
Data ready/inertial wake-up and free-fall interrupt
Power supply for I/O pads
I2C Serial Clock (SCL)
SPI Serial Port Clock (SPC)
SPI enable
I2C/SPI mode selection (1: I2C mode; 0: SPI enabled)
0V supply
Either leave unconnected or connect to Vdd_IO
Power supply
Connect to Vdd
Internally not connected
CD00047926
LIS3LV02DQ
2 Mechanical and Electrical specifications
2
Mechanical and Electrical specifications
2.1
Mechanical characteristics1
Table 2.
Symbol
FS
Dres
So
TCS0
Off
LTOff
TCOff
Mechanical Characteristics
(All the parameters are specified @ Vdd=2.5V, T=25°C unless otherwise noted)
Parameter
Measurement range3
Device Resolution
Min.
Typ.2
FS bit set to 0
±1.8
±2.0
g
FS bit set to 1
±5.6
±6.0
g
1.0
mg
Test conditions
Full-scale = 2g
BW=40Hz
Max.
Unit
Full-scale = 2g, 12 bit
representation
974
1024
1074
LSb/g
Full-scale = 6g, 12 bit
representation
323
340
357
LSb/g
Sensitivity
Sensitivity Change Vs
Temperature
Zero-g Level Offset
Accuracy4,5
Zero-g Level Offset Long
Term Accuracy6
Zero-g Level Change Vs
Temperature
Full-scale = 2g, 12 bit
representation
0.025
%/°C
Full-scale = 2g
X, Y axis
-20
+20
mg
Full-scale = 2g
Z axis
-40
+40
mg
Full-scale = 6g
X, Y axis
-40
+40
mg
Full-scale = 6g
Z axis
-60
+60
mg
Full-scale = 2g
X, Y axis
-2
+2
%FS
Full-scale = 2g
Z axis
-5
+5
%FS
Full-scale = 6g
X, Y axis
-1
+1
%FS
Full-scale = 6g
Z axis
-2
+2
%FS
Max Delta from 25°C
CD00047926
0.2
mg/°C
7/42
LIS3LV02DQ
2 Mechanical and Electrical specifications
Table 2.
Symbol
NL
CrAx
Vst
Mechanical Characteristics (continued)
(All the parameters are specified @ Vdd=2.5V, T=25°C unless otherwise noted)
Parameter
Test conditions
Min.
Typ.2
Max.
Unit
Best fit straight line
X, Y axis
Full-scale = 2g
BW=40Hz
±2
%FS
Best fit straight line
Z axis
Full-scale = 2g
BW=40Hz
±3
%FS
Non Linearity
Cross Axis
Self test Output Change
BW
System Bandwidth9
Top
Operating Temperature
Range
Wh
Product Weight
-3.5
7,8
3.5
%
Full-scale=2g
X axis
100
240
400
LSb
Full-scale=2g
Y axis
100
240
400
LSb
Full-scale=2g
Z axis
30
150
350
LSb
Full-scale=6g
X axis
30
80
130
LSb
Full-scale=6g
Y axis
30
80
130
LSb
Full-scale=6g
Z axis
10
50
120
LSb
ODRx/4
-40
Hz
+85
0.2
°C
gram
Note: 1 The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2 Typical specifications are not guaranteed
3 Verified by wafer level test and measurement of initial offset and sensitivity
4 Zero-g level offset value after MSL3 preconditioning
5 Offset can be eliminated by enabling the built-in high pass filter (HPF)
6 Results of accelerated reliability tests. Report available upon request
7 Self Test output changes with the power supply. Self test “output change” is defined as
OUTPUT[LSb](Self-test bit on ctrl_reg1=1)-OUTPUT[LSb](Self-test bit on ctrl_reg1=0). 1LSb=1g/1024 at
12bit representation, 2g Full-Scale
8 Output data reach 99% of final value after 5/ODR when enabling Self-Test mode due to device
filtering
9 ODR is output data rate. Refer to table 4 for specifications
8/42
CD00047926
LIS3LV02DQ
Table 3.
Symbol
FS
Dres
So
TCS0
Off
LTOff
TCOff
NL
CrAx
2 Mechanical and Electrical specifications
Mechanical Characteristics
(All the parameters are specified @ Vdd=3.3V, T=25°C unless otherwise noted)
Parameter
Measurement range3
Device Resolution
Min.
Typ.2
FS bit set to 0
±1.7
±2.0
g
FS bit set to 1
±5.3
±6.0
g
1.0
mg
Test conditions
Full-scale = 2g
BW=40Hz
Max.
Unit
Full-scale = 2g, 12 bit
representation
920
1024
1126
LSb/g
Full-scale = 6g, 12 bit
representation
306
340
374
LSb/g
Sensitivity
Sensitivity Change Vs
Temperature
Zero-g Level Offset
Accuracy4,5
Zero-g Level Offset Long
Term Accuracy6
Zero-g Level Change Vs
Temperature
Full-scale = 2g, 12 bit
representation
0.025
%/°C
Full-scale = 2g
X, Y axis
-70
70
mg
Full-scale = 2g
Z axis
-90
90
mg
Full-scale = 6g
X, Y axis
-90
90
mg
Full-scale = 6g
Z axis
-100
100
mg
Full-scale = 2g
X, Y axis
-4.5
+4.5
%FS
Full-scale = 2g
Z axis
-6
+6
%FS
Full-scale = 6g
X, Y axis
-1.8
+1.8
%FS
Full-scale = 6g
Z axis
-2.2
+2.2
%FS
Max Delta from 25°C
0.2
mg/°C
Best fit straight line
X, Y axis
Full-scale = 2g
BW=40Hz
±2
%FS
Best fit straight line
Z axis
Full-scale = 2g
BW=40Hz
±3
%FS
Non Linearity
Cross Axis
-3.5
CD00047926
3.5
%
9/42
LIS3LV02DQ
2 Mechanical and Electrical specifications
Table 3.
Symbol
Vst
Mechanical Characteristics (continued)
(All the parameters are specified @ Vdd=3.3V, T=25°C unless otherwise noted)
Parameter
Self test Output Change
BW
System Bandwidth9
Top
Operating Temperature
Range
Wh
Product Weight
Min.
Typ.2
Max.
Unit
Full-scale=2g
X axis
250
550
900
LSb
Full-scale=2g
Y axis
250
550
900
LSb
Full-scale=2g
Z axis
100
350
600
LSb
Full-scale=6g
X axis
80
180
300
LSb
Full-scale=6g
Y axis
80
180
300
LSb
Full-scale=6g
Z axis
30
120
200
LSb
Test conditions
7,8
ODRx/4
-40
Hz
+85
0.2
°C
gram
Note: 1 The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2 Typical specifications are not guaranteed
3 Verified by wafer level test and measurement of initial offset and sensitivity
4 Zero-g level offset value after MSL3 preconditioning
5 Offset can be eliminated by enabling the built-in high pass filter (HPF)
6 Results of accelerated reliability tests
7 Self Test output changes with the power supply. Self test “output change” is defined as
OUTPUT[LSb](Self-test bit on ctrl_reg1=1)-OUTPUT[LSb](Self-test bit on ctrl_reg1=0). 1LSb=1g/1024 at
12bit representation, 2g Full-Scale
8 Output data reach 99% of final value after 5/ODR when enabling Self-Test mode due to device
filtering
9 ODR is output data rate. Refer to table 4 for specifications
10/42
CD00047926
LIS3LV02DQ
2 Mechanical and Electrical specifications
Electrical characteristics1
2.2
Table 4.
Symbol
Vdd
Vdd_IO
Idd
Electrical Characteristics
(All the parameters are specified @ Vdd=2.5V, T=25°C unless otherwise noted)
Min.
Typ.2
Max.
Unit
Supply voltage
2.16
2.5
3.6
V
I/O pads Supply voltage
1.71
Vdd
V
Parameter
Test conditions
T = 25°C, Vdd=2.5V
0.60
0.75
mA
T = 25°C, Vdd=3.3V
0.65
0.80
mA
Supply current
VIH
Digital High level Input
voltage
VIL
Digital Low level Input
voltage
VOH
High level Output Voltage
VOL
Low level Output Voltage
0.8*Vdd
_IO
V
0.2*Vdd
_IO
0.9*Vdd
_IO
V
V
0.1*Vdd
_IO
V
10
µA
IddPdn
Current consumption in
Power-down mode
T = 25°C
1
ODR1
Output Data Rate1
Dec factor = 512
40
Hz
ODR2
Output Data Rate 2
Dec factor = 128
160
Hz
ODR3
Output Data Rate 3
Dec factor = 32
640
Hz
ODR4
Output Data Rate 4
Dec factor = 8
2560
Hz
BW
System Bandwidth3
ODRx/4
Hz
Ton
Turn-on time4
5/ODRx
s
Top
Operating Temperature
Range
-40
+85
°C
Note: 1 The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2 Typical specifications are not guaranteed
3 Digital filter cut-off frequency
4 Time to obtain valid data after exiting Power-Down mode
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LIS3LV02DQ
2 Mechanical and Electrical specifications
2.3
Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage to
the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 5.
Absolute maximum ratings
Symbol
Vdd
Vdd_IO
Vin
Ratings
Supply voltage
I/O pins Supply voltage
Input voltage on any control pin
(CS, SCL/SPC, SDA/SDI/SDO, CK)
Maximum Value
Unit
-0.3 to 6
V
-0.3 to Vdd +0.1
V
-0.3 to Vdd_IO +0.3
V
3000g for 0.5 ms
APOW
Acceleration (Any axis, Powered, Vdd=2.5V)
AUNP
Acceleration (Any axis, Unpowered)
TOP
Operating Temperature Range
-40 to +85
°C
TSTG
Storage Temperature Range
-40 to +125
°C
4.0 (HBM)
kV
200 (MM)
V
1.5 (CDM)
kV
ESD
10000g for 0.1 ms
3000g for 0.5 ms
10000g for 0.1 ms
Electrostatic discharge protection
Note: 1 Supply voltage on any pin should never exceed 6.0V.
This is a Mechanical Shock sensitive device, improper handling can cause
permanent damages to the part
This is an ESD sensitive device, improper handling can cause permanent damages
to the part
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2.4
Terminology
2.4.1
Sensitivity
2 Mechanical and Electrical specifications
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the earth, noting the output value, rotating the
sensor by 180 degrees (point to the sky) and noting the output value again. By doing so, ±1g
acceleration is applied to the sensor. Subtracting the larger output value from the smaller one
and divide the result by 2 leads to the actual sensitivity of the sensor. This value changes very
little over temperature and also very little over time. The Sensitivity Tolerance describes the
range of Sensitivities of a large population of sensor.
2.4.2
Zero-g level
Zero-g level Offset (Off) describes the deviation of an actual output signal from the ideal output
signal if there is no acceleration present. A sensor in a steady state on a horizontal surface will
measure 0g in X axis and 0g in Y axis whereas the Z axis will measure 1g. The output is ideally
in the middle of the dynamic range of the sensor (content of OUT registers 00h, 00h with 16 bit
representation, data expressed as 2’s complement number). A deviation from ideal value in this
case is called Zero-g offset. Offset is to some extent a result of stress to a precise MEMS
sensor and therefore the offset can slightly change after mounting the sensor onto a printed
circuit board or exposing it to extensive mechanical stress. Offset changes little over
temperature, see “Zero-g level change vs. temperature”. The Zero-g level of an individual
sensor is stable over lifetime. The Zero-g level tolerance describes the range of Zero-g levels of
a population of sensors.
2.4.3
Self Test
Self Test allows to test the mechanical and electric part of the sensor, allowing the seismic
mass to be moved by means of an electrostatic test-force. The Self Test function is off when the
self-test bit of ctrl_reg1 (control register 1) is programmed to ‘0‘. When the self-test bit of
ctrl_reg1 is programmed to ‘1‘ an actuation force is applied to the sensor, simulating a definite
input acceleration. In this case the sensor outputs will exhibit a change in their DC levels which
is related to the selected full scale and depending on the Supply Voltage through the device
sensitivity. When Self Test is activated, the device output level is given by the algebraic sum of
the signals produced by the acceleration acting on the sensor and by the electrostatic testforce. If the output signals change within the amplitude specified inside table 2 or table 3, than
the sensor is working properly and the parameters of the interface chip are within the defined
specification.
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LIS3LV02DQ
3 Functionality
3
Functionality
The LIS3LV02DQ is a high performance, low-power, digital output 3-axis linear accelerometer
packaged in a QFN package. The complete device includes a sensing element and an IC
interface able to take the information from the sensing element and to provide a signal to the
external world through an I2C/SPI serial interface.
3.1
Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The
technology allows to carry out suspended silicon structures which are attached to the substrate
in a few points called anchors and are free to move in the direction of the sensed acceleration.
To be compatible with the traditional packaging techniques a cap is placed on top of the
sensing element to avoid blocking the moving parts during the moulding phase of the plastic
encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal
position, causing an imbalance in the capacitive half-bridge. This imbalance is measured using
charge integration in response to a voltage pulse applied to the sense capacitor.
At steady state the nominal value of the capacitors are few pF and when an acceleration is
applied the maximum variation of the capacitive load is up to 100fF.
3.2
IC Interface
The complete measurement chain is composed by a low-noise capacitive amplifier which
converts into an analog voltage the capacitive unbalancing of the MEMS sensor and by three
Σ∆ analog-to-digital converters, one for each axis, that translate the produced signal into a
digital bitstream.
The Σ∆ converters are coupled with dedicated reconstruction filters which remove the high
frequency components of the quantization noise and provide low rate and high resolution digital
words.
The charge amplifier and the Σ∆ converters are operated respectively at 61.5 kHz and 20.5
kHz.
The data rate at the output of the reconstruction depends on the user selected Decimation
Factor (DF) and spans from 40 Hz to 2560 Hz.
The acceleration data may be accessed through an I2C/SPI interface thus making the device
particularly suitable for direct interfacing with a microcontroller.
The LIS3LV02DQ features a Data-Ready signal (RDY) which indicates when a new set of
measured acceleration data is available thus simplifying data synchronization in digital system
employing the device itself.
The LIS3LV02DQ may also be configured to generate an inertial Wake-Up, Direction Detection
and Free-Fall interrupt signal accordingly to a programmed acceleration event along the
enabled axes.
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3.3
3 Functionality
Factory calibration
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (Off).
The trimming values are stored inside the device by a non volatile structure. Any time the
device is turned on, the trimming parameters are downloaded into the registers to be employed
during the normal operation. This allows the user to employ the device without further
calibration.
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LIS3LV02DQ
4 Application Hints
4
Application Hints
Figure 3.
LIS3LV02DQ Electrical Connection
28
Z
22
1
Y
1
21
X
LIS3LV02DQ
10uF
(TOP VIEW)
7
100nF
15
8
14
DIRECTION OF THE
DETECTABLE
ACCELERATIONS
CS
SCL/SPC
SDO
RDY/INT
Vdd
SDA/SDI/SDO
Vdd_IO
GND
Digital signal from/to signal controller.Signal’s levels are defined by proper selection of Vdd_IO
The device core is supplied through Vdd line while the I/O pads are supplied through Vdd_IO
line. Power supply decoupling capacitors (100 nF ceramic, 10 µF Al) should be placed as near
as possible to the pin 3 of the device (common design practice).
All the voltage and ground supplies must be present at the same time to have proper behavior
of the IC (refer to Fig. 3). It is possible to remove Vdd mantaining Vdd_IO without blocking the
communication busses.
The functionality of the device and the measured acceleration data is selectable and accessible
through the I2C/SPI interface.When using the I2C, CS must be tied high while SDO must be left
floating. Refer to application note AN2041 for further information on device usage.
4.1
Soldering Information
The QFN-28 package is lead free and green package qualified for soldering heat resistance
according to JEDEC J-STD-020C. Central die pad and pin #1 indicator are physically
connected to GND. Land pattern and soldering recommendations are available upon request.
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5
5 Digital Interfaces
Digital Interfaces
The registers embedded inside the LIS3LV02DQ may be accessed through both the I2C and
SPI serial interfaces. The latter may be SW configured to operate either in 3-wire or 4-wire
interface mode.
The serial interfaces are mapped onto the same pads. To select/exploit the I2C interface, CS
line must be tied high (i.e connected to Vdd_IO).
Table 6.
Serial interface pin description
PIN Name
SPI enable
CS
I2C/SPI mode selection (1: I2C mode; 0: SPI enabled)
SCL/SPC
SDA/SDI/SDO
SDO
5.1
PIN Description
I2C Serial Clock (SCL)
SPI Serial Port Clock (SPC)
I2C Serial Data (SDA)
SPI Serial Data Input (SDI)
3-wire Interface Serial Data Output (SDO)
SPI Serial Data Output (SDO)
I2C Serial Interface
The LIS3LV02DQ I2C is a bus slave. The I2C is employed to write the data into the registers
whose content can also be read back.
The relevant I2C terminology is given in the table below
Table 7.
Serial interface pin description
Term
Transmitter
Receiver
Master
Slave
Description
The device which sends data to the bus
The device which receives data from the bus
The device which initiates a transfer, generates clock signals and terminates a
transfer
The device addressed by the master
There are two signals associated with the I2C bus: the Serial Clock Line (SCL) and the Serial
DAta line (SDA). The latter is a bidirectional line used for sending and receiving the data to/from
the interface. Both the lines are connected to Vdd_IO through a pull-up resistor embedded
inside the LIS3LV02DQ. When the bus is free both the lines are high.
The I2C interface is compliant with Fast Mode (400 kHz) I2C standards as well as the Normal
Mode.
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5 Digital Interfaces
5.1.1
I2C Operation
The transaction on the bus is started through a START (ST) signal. A START condition is
defined as a HIGH to LOW transition on the data line while the SCL line is held HIGH. After this
has been transmitted by the Master, the bus is considered busy. The next byte of data
transmitted after the start condition contains the address of the slave in the first 7 bits and the
eighth bit tells whether the Master is receiving data from the slave or transmitting data to the
slave. When an address is sent, each device in the system compares the first seven bits after a
start condition with its address. If they match, the device considers itself addressed by the
Master. The Slave ADdress (SAD) associated to the LIS3LV02DQ is 0011101b.
Data transfer with acknowledge is mandatory. The transmitter must release the SDA line during
the acknowledge pulse. The receiver must then pull the data line LOW so that it remains stable
low during the HIGH period of the acknowledge clock pulse. A receiver which has been
addressed is obliged to generate an acknowledge after each byte of data has been received.
The I2C embedded inside the LIS3LV02DQ behaves like a slave device and the following
protocol must be adhered to. After the start condition (ST) a salve address is sent, once a slave
acknowledge (SAK) has been returned, a 8-bit sub-address will be transmitted: the 7 LSb
represent the actual register address while the MSB enables address auto increment. If the
MSb of the SUB field is 1, the SUB (register address) will be automatically incremented to allow
multiple data read/write.
The slave address is completed with a Read/Write bit. If the bit was ‘1’ (Read), a repeated
START (SR) condition will have to be issued after the two sub-address bytes; if the bit is ‘0’
(Write) the Master will transmit to the slave with direction unchanged.
Transfer when Master is writing one byte to slave
Master
ST
SAD + W
SUB
Slave
DATA
SAK
SAK
SP
SAK
Transfer when Master is writing multiple bytes to slave:
Master
ST
SAD + W
SUB
Slave
DATA
SAK
SAK
DATA
SAK
SP
SAK
Transfer when Master is receiving (reading) one byte of data from slave:
Master
ST
SAD + W
Slave
SUB
SR
SAK
SAD + R
SAK
NMAK
SAK
SP
DATA
Transfer when Master is receiving (reading) multiple bytes of data from slave
Master
ST
SAD + W
Slave
SAK
Master
Slave
SUB
SR
SAD + R
SAK
SAK
MAK
DATA
MAK
NMAK
DATA
SP
DATA
Data are transmitted in byte format (DATA). Each data transfer contains 8 bits. The number of
bytes transferred per transfer is unlimited. Data is transferred with the Most Significant bit (MSb)
first. If a receiver can’t receive another complete byte of data until it has performed some other
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5 Digital Interfaces
function, it can hold the clock line, SCL LOW to force the transmitter into a wait state. Data
transfer only continues when the receiver is ready for another byte and releases the data line. If
a slave receiver doesn’t acknowledge the slave address (i.e. it is not able to receive because it
is performing some real time function) the data line must be left HIGH by the slave. The Master
can then abort the transfer. A LOW to HIGH transition on the SDA line while the SCL line is
HIGH is defined as a STOP condition. Each data transfer must be terminated by the generation
of a STOP (SP) condition.
In order to read multiple bytes, it is necessary to assert the most significant bit of the subaddress field. In other words, SUB(7) must be equal to 1 while SUB(6-0) represents the
address of first register to read.
In the presented communication format MAK is Master Acknowledge and NMAK is No Master
Acknowledge.
5.2
SPI Bus Interface
The LIS3LV02DQ SPI is a bus slave. The SPI allows to write and read the registers of the
device.
The Serial Interface interacts with the outside world with 4 wires: CS, SPC, SDI and SDO.
Figure 4.
Read & write protocol
CS
SPC
SDI
DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0
RW
MS AD5 AD4 AD3 AD2 AD1 AD0
SDO
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
CS is the Serial Port Enable and it is controlled by the SPI master. It goes low at the start of the
transmission and goes back high at the end. SPC is the Serial Port Clock and it is controlled by
the SPI master. It is stopped high when CS is high (no transmission). SDI and SDO are
respectively the Serial Port Data Input and Output. Those lines are driven at the falling edge of
SPC and should be captured at the rising edge of SPC.
Both the Read Register and Write Register commands are completed in 16 clock pulses or in
multiple of 8 in case of multiple byte read/write. Bit duration is the time between two falling
edges of SPC. The first bit (bit 0) starts at the first falling edge of SPC after the falling edge of
CS while the last bit (bit 15, bit 23, ...) starts at the last falling edge of SPC just before the rising
edge of CS.
bit 0: RW bit. When 0, the data DI(7:0) is written into the device. When 1, the data DO(7:0) from
the device is read. In latter case, the chip will drive SDO at the start of bit 8.
bit 1: MS bit. When 0, the address will remain unchanged in multiple read/write commands.
When 1, the address will be auto incremented in multiple read/write commands.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
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5 Digital Interfaces
bit 8-15: data DI(7:0) (write mode). This is the data that will be written into the device (MSb
first).
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
In multiple read/write commands further blocks of 8 clock periods will be added. When MS bit is
0 the address used to read/write data remains the same for every block. When MS bit is 1 the
address used to read/write data is incremented at every block.
The function and the behavior of SDI and SDO remain unchanged.
5.2.1
SPI Read
Figure 5.
SPI Read protocol
CS
SPC
SDI
RW
MS AD5 AD4 AD3 AD2 AD1 AD0
SDO
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
The SPI Read command is performed with 16 clock pulses. Multiple byte read command is
performed adding blocks of 8 clock pulses at the previous one.
bit 0: READ bit. The value is 1.
bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
bit 16-... : data DO(...-8). Further data in multiple byte reading.
Figure 6.
Multiple bytes SPI Read Protocol (2 bytes example)
CS
SPC
SDI
RW
MS AD5 AD4 AD3 AD2 AD1 AD0
SDO
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0 DO15DO14DO13DO12DO11DO10DO9 DO8
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5.2.2
5 Digital Interfaces
SPI Write
Figure 7.
SPI Write protocol
CS
SPC
SDI
DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0
RW
MS AD5 AD4 AD3 AD2 AD1 AD0
The SPI Write command is performed with 16 clock pulses. Multiple byte write command is
performed adding blocks of 8 clock pulses at the previous one.
bit 0: WRITE bit. The value is 0.
bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple writing.
bit 2 -7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DI(7:0) (write mode). This is the data that will be written inside the device (MSb
first).
bit 16-... : data DI(...-8). Further data in multiple byte writing.
Figure 8.
Multiple bytes SPI Write Protocol (2 bytes example)
CS
SPC
SDI
DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0 DI15 DI14 DI13 DI12 DI11 DI10 DI9 DI8
RW
MS AD5 AD4 AD3 AD2 AD1 AD0
5.2.3
SPI Read in 3-wires mode
3-wires mode is entered by setting to 1 bit SIM (SPI Serial Interface Mode selection) in
CTRL_REG2.
Figure 9.
SPI Read protocol in 3-wires mode
CS
SPC
SDI/O
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
RW
MS
AD5 AD4 AD3 AD2 AD1 AD0
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5 Digital Interfaces
The SPI Read command is performed with 16 clock pulses:
bit 0: READ bit. The value is 1.
bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb
first).
Multiple read command is also available in 3-wires mode.
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6
6 Register mapping
Register mapping
The table given below provides a listing of the 8 bit registers embedded in the device and the
related address.
Table 8.
Registers address map
Register Address
Reg. Name
Type
Default
Binary
Comment
Hex
rw
0000000 - 0001110
00 - 0E
r
0001111
0F
rw
0010000 - 0010101
10 - 15
OFFSET_X
rw
0010110
16
Calibration
Loaded at boot
OFFSET_Y
rw
0010111
17
Calibration
Loaded at boot
OFFSET_Z
rw
0011000
18
Calibration
Loaded at boot
GAIN_X
rw
0011001
19
Calibration
Loaded at boot
GAIN_Y
rw
0011010
1A
Calibration
Loaded at boot
GAIN_Z
rw
0011011
1B
Calibration
Loaded at boot
0011100 -0011111
1C-1F
WHO_AM_I
Reserved
00111010
Dummy register
Reserved
Reserved
CTRL_REG1
rw
0100000
20
00000111
CTRL_REG2
rw
0100001
21
00000000
CTRL_REG3
rw
0100010
22
00001000
HP_FILTER RESET
r
0100011
23
dummy
0100100-0100110
24-26
Dummy register
Not Used
STATUS_REG
rw
0100111
27
00000000
OUTX_L
r
0101000
28
output
OUTX_H
r
0101001
29
output
OUTY_L
r
0101010
2A
output
OUTY_H
r
0101011
2B
output
OUTZ_L
r
0101100
2C
output
OUTZ_H
r
0101101
2D
output
r
0101110
2E
Reserved
0101111
2F
Not Used
FF_WU_CFG
rw
0110000
30
00000000
FF_WU_SRC
rw
0110001
31
00000000
FF_WU_ACK
r
0110010
32
dummy
0110011
33
0110100
34
FF_WU_THS_L
rw
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Not Used
00000000
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LIS3LV02DQ
6 Register mapping
Table 8.
Registers address map (continued)
Register Address
Reg. Name
Type
Default
Binary
Comment
Hex
FF_WU_THS_H
rw
0110101
35
00000000
FF_WU_DURATION
rw
0110110
36
00000000
0110111
37
Not Used
DD_CFG
rw
0111000
38
00000000
DD_SRC
rw
0111001
39
00000000
DD_ACK
r
0111010
3A
dummy
0111011
3B
Dummy register
Not Used
DD_THSI_L
rw
0111100
3C
00000000
DD_THSI_H
rw
0111101
3D
00000000
DD_THSE_L
rw
0111110
3E
00000000
DD_THSE_H
rw
0111111
3F
00000000
1000000-1111111
40-7F
Reserved
Registers marked as reserved must not be changed. The writing to those registers may cause
permanent damages to the device.
The content of the registers that are loaded at boot should not be changed. They contain the
factory calibration values. Their content is automatically restored when the device is poweredup.
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7
7 Register Description
Register Description
The device contains a set of registers which are used to control its behavior and to retrieve
acceleration data. The registers 7.2 to 7.7 contain the factory calibration values, it is not
necessary to change their value for normal device operation.
7.1
WHO_AM_I (0Fh)
W7
W7, W0
W6
W5
W4
W3
W2
W1
W0
LIS3LV02DQ Physical Address equal to 3Ah
Addressing this register the physical address of the device is returned. For LIS3LV02DQ the
physical address assigned in factory is 3Ah.
7.2
OFFSET_X (16h)
OX7
OX7, OX0
7.3
OX5
OX4
OX3
OX2
OX1
OX0
OY3
OY2
OY1
OY0
OZ3
OZ2
OZ1
OZ0
Digital Offset Trimming for X-Axis
OFFSET_Y (17h)
OY7
DOY7, DOY0
7.4
OX6
OY6
OY5
OY4
Digital Offset Trimming for Y-Axis
OFFSET_Z (18h)
OZ7
OZ7, OZ0
OZ6
OZ5
OZ4
Digital Offset Trimming for Z-Axis
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7 Register Description
7.5
GAIN_X (19h)
GX7
GX7, GX0
7.6
GX4
GX3
GX2
GX1
GX0
GY3
GY2
GY1
GY0
GZ3
GZ2
GZ1
GZ0
ST
Zen
Yen
Xen
GAIN_Y (1Ah)
GY7, GY0
GY6
GY5
GY4
Digital Gain Trimming for Y-Axis
GAIN_Z (1Bh)
GZ7
GZ7, GZ0
7.8
GX5
Digital Gain Trimming for X-Axis
GY7
7.7
GX6
GZ6
GZ5
GZ4
Digital Gain Trimming for Z-Axis
CTRL_REG1 (20h)
PD1
PD0
DF1
DF0
PD1, PD0
Power Down Control
(00: power-down mode; 01, 10, 11: device on)
DF1, DF0
Decimation Factor Control
(00: decimate by 512; 01: decimate by 128; 10: decimate by 32; 11: decimate by 8)
ST
Self Test Enable
(0: normal mode; 1: self-test active)
Zen
Z-axis enable
(0: axis off; 1: axis on)
Yen
Y-axis enable
(0: axis off; 1: axis on)
Xen
X-axis enable
(0: axis off; 1: axis on)
PD1, PD0 bit allows to turn on the turn the device out of power-down mode. The device is in
power-down mode when PD1, PD0= “00” (default value after boot). The device is in normal
mode when either PD1 or PD0 is set to 1.
DF1, DF0 bit allows to select the data rate at which acceleration samples are produced. The
default value is 00 which corresponds to a data-rate of 40Hz. By changing the content of DF1,
DF0 to “01”, “10” and “11” the selected data-rate will be set respectively equal to 160Hz, 640Hz
and to 2560Hz.
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7 Register Description
ST bit is used to activate the self test function. When the bit is set to one, an output change will
occur to the device outputs (refer to table 2 and 3 for specification) thus allowing to check the
functionality of the whole measurement chain.
Zen bit enables the Z-axis measurement channel when set to 1. The default value is 1.
Yen bit enables the Y-axis measurement channel when set to 1. The default value is 1.
Xen bit enables the X-axis measurement channel when set to 1. The default value is 1.
7.9
CTRL_REG2 (21h)
FS
BDU
BLE
BOOT
IEN
DRDY
SIM
DAS
FS
Full Scale selection
(0: ±2g; 1: ±6g)
BDU
Block Data Update
(0: continuous update; 1: output registers not updated until MSB and LSB reading)
BLE
Big/Little Endian selection
(0: little endian; 1: big endian)
BOOT
Reboot memory content
IEN
Interrupt ENable
(0: data ready on RDY pad; 1: int req on RDY pad)
DRDY
Enable Data-Ready generation
SIM
SPI Serial Interface Mode selection
(0: 4-wire interface; 1: 3-wire interface)
DAS
Data Alignment Selection
(0: 12 bit right justified; 1: 16 bit left justified)
FS bit is used to select Full Scale value. After the device power-up the default full scale value is
+/-2g. In order to obtain a +/-6g full scale it is necessary to set FS bit to ‘1’.
BDU bit is used to inhibit output registers update until both upper and lower register parts are
read. In default mode (BDU= ‘0’) the output register values are updated continuously. If for any
reason it is not sure to read faster than output data rate it is recommended to set BDU bit to ‘1’.
In this way the content of output registers is not updated until both MSB and LSB are read
avoiding to read values related to different sample time.
BLE bit is used to select Big Endian or Little Endian representation for output registers. In Big
Endian’s one MSB acceleration value is located at addresses 28h (X-axis), 2Ah (Y-axis) and
2Ch (Z-axis) while LSB acceleration value is located at addresses 29h (X-axis), 2Bh (Y-axis)
and 2Dh (Z-axis). In Little Endian representation (Default, BLE=‘0‘) the order is inverted (refer
to data register description for more details).
BOOT bit is used to refresh the content of internal registers stored in the flash memory block.
At the device power up the content of the flash memory block is transferred to the internal
registers related to trimming functions to permit a good behavior of the device itself. If for any
reason the content of trimming registers was changed it is sufficient to use this bit to restore
correct values. When BOOT bit is set to ‘1’ the content of internal flash is copied inside
corresponding internal registers and it is used to calibrate the device. These values are factory
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7 Register Description
trimmed and they are different for every accelerometer. They permit a good behavior of the
device and normally they have not to be changed. At the end of the boot process the BOOT bit
is set again to ‘0’.
IEN bit is used to switch the value present on data-ready pad between Data-Ready signal and
Interrupt signal. At power up the Data-ready signal is chosen. It is however necessary to modify
DRDY bit to enable Data-Ready signal generation.
DRDY bit is used to enable Data-Ready (RDY/INT) pin activation. If DRDY bit is ‘0’ (default
value) on Data-Ready pad a ‘0’ value is present. If a Data-Ready signal is desired it is
necessary to set to ‘1’ DRDY bit. Data-Ready signal goes to ‘1’ whenever a new data is
available for all the enabled axis. For example if Z-axis is disabled, Data-Ready signal goes to
‘1’ when new values are available for both X and Y axis. Data-Ready signal comes back to ‘0’
when all the registers containing values of the enabled axis are read. To be sure not to loose
any data coming from the accelerometer data registers must be read before a new Data-Ready
rising edge is generated. In this case Data-ready signal will have the same frequency of the
data rate chosen.
SIM bit selects the SPI Serial Interface Mode. When SIM is ‘0’ (default value) the 4-wire
interface mode is selected. The data coming from the device are sent to SDO pad. In 3-wire
interface mode output data are sent to SDA_SDI pad.
DAS bit permits to decide between 12 bit right justified and 16 bit left justified representation of
data coming from the device. The first case is the default case and the most significant bits are
replaced by the bit representing the sign.
7.10
CTRL_REG3 (22h)
ECK
HPDD
HPFF
FDS
res
res
CFS1
CFS0
ECK
External Clock. Default value: 0
(0: clock from internal oscillator; 1: clock from external pad)
HPDD
High Pass filter enabled for Direction Detection. Default value: 0
(0: filter bypassed; 1: filter enabled)
HPFF
High Pass filter enabled for Free-Fall and Wake-Up. Default value: 0
(0: filter bypassed; 1: filter enabled)
FDS
Filtered Data Selection. Default value: 0
(0: internal filter bypassed; 1: data from internal filter)
CFS1, CFS0
High-pass filter Cut-off Frequency Selection. Default value: 00
(00: Hpc=512
01: Hpc=1024
10: Hpc=2048
11: Hpc=4096)
FDS bit enables (FDS=1) or bypass (FDS=0) the high pass filter in the signal chain of the
sensor
CFS1, CFS0 bits defines the coefficient Hpc to be used to calculate the -3dB cut-off frequency
of the high pass filter:
0.318 ODRx
f cu toff = --------------- ⋅ ----------------Hpc
2
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7.11
7 Register Description
HP_FILTER_RESET (23h)
Dummy register. Reading at this address zeroes instantaneously the content of the internal
high pass-filter. Read data is not significant.
7.12
STATUS_REG (27h)
ZYXOR
7.13
ZOR
YOR
XOR
ZYXOR
X, Y and Z axis Data Overrun
ZOR
Z axis Data Overrun
YOR
Y axis Data Overrun
XOR
X axis Data Overrun
ZYXDA
X, Y and Z axis new Data Available
ZDA
Z axis new Data Available
YDA
Y axis new Data Available
XDA
X axis new Data Available
ZYXDA
ZDA
YDA
XDA
OUTX_L (28h)
XD7
XD7, XD0
XD6
XD5
XD4
XD3
XD2
XD1
XD0
X axis acceleration data LSB
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the MSB
acceleration data and depends by bit DAS in CTR_REG2 reg as described in the following
section.
7.14
OUTX_H (29h)
XD15 XD14 XD13 XD12 XD11 XD10
XD15, XD8
XD9
XD8
X axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. XD15-XD12=XD11, XD11, XD11, XD11).
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data.
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7 Register Description
7.15
OUTY_L (2Ah)
YD7
YD7, YD0
YD6
YD5
YD4
YD3
YD2
YD1
YD0
Y axis acceleration data LSB
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the MSB
acceleration data and depends by bit DAS in CTR_REG2 reg as described in the following
section.
7.16
OUTY_H (2Bh)
YD15 YD14 YD13 YD12 YD11 YD10
YD15, YD8
YD9
YD8
Y axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. YD15-YD12=YD11, YD11, YD11, YD11).
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data.
7.17
OUTZ_L (2Ch)
ZD7
ZD7, ZD0
ZD6
ZD5
ZD4
ZD3
ZD2
ZD1
ZD0
Z axis acceleration data LSB
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the MSB
acceleration data and depends by bit DAS in CTR_REG2 reg as described in the following
section.
7.18
OUTZ_H (2Dh)
ZD15
ZD15, ZD8
ZD14
ZD13
ZD12
ZD11
ZD10
ZD9
ZD8
Z axis acceleration data MSB
When reading the register in “12 bit right justified” mode the most significant bits (15:12) are
replaced with bit 11 (i.e. ZD15-ZD12=ZD11, ZD11, ZD11, ZD11).
In Big Endian Mode (bit BLE CTRL_REG2 set to ‘1’) the content of this register is the LSB
acceleration data
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7.19
7 Register Description
FF_WU_CFG (30h)
AOI
LIR
ZHIE ZLIE YHIE YLIE XHIE XLIE
AOI
And/Or combination of Interrupt events interrupt request. Default value: 0.
(0: OR combination of interrupt events;
1: AND combination of interrupt events)
LIR
Latch interrupt request. Default value: 0.
(0: interrupt request not latched;
1: interrupt request latched)
ZHIE
Enable Interrupt request on Z high event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
ZLIE
Enable Interrupt request on Z low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
YHIE
Enable Interrupt request on Y high event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
YLIE
Enable Interrupt request on Y low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
XHIE
Enable Interrupt request on X high event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
XLIE
Enable Interrupt request on X low event. Default value: 0.
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Free-fall and inertial wake-up configuration register.
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7 Register Description
7.20
FF_WU_SRC (31h)
X
7.21
IA
ZH
ZL
YH
YL
XH
IA
Interrupt Active. Default value: 0
(0: no interrupt has been generated;
1: one or more interrupt event has been generated)
ZH
Z High. Default value: 0
(0: no interrupt; 1: ZH event has occurred)
ZL
Z Low. Default value: 0
(0: no interrupt; 1: ZL event has occurred)
YH
Y High. Default value: 0
(0: no interrupt; 1: YH event has occurred)
YL
Y Low. Default value: 0
(0: no interrupt; 1: YL event has occurred)
XH
X High. Default value: 0
(0: no interrupt; 1: XH event has occurred)
XL
X Low. Default value: 0
(0: no interrupt; 1: XL event has occurred)
XL
FF_WU_ACK (32h)
Dummy register. If LIR bit in FF_WU_CFG=1 allows the refresh of FF_WU_SRC. Read data is
not significant.
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7.22
7 Register Description
FF_WU_THS_L (34h)
THS7 THS6 THS5 THS4 THS3 THS2 THS1 THS0
THS7, THS0
7.23
Free-fall / Inertial Wake Up Acceleration Threshold LSB
FF_WU_THS_H (35h)
THS15 THS14 THS13 THS12 THS11 THS10 THS9
THS15, THS8
7.24
THS8
Free-fall / Inertial Wake Up Acceleration Threshold MSB
FF_WU_DURATION (36h)
FWD7 FWD6 FWD5 FWD4 FWD3 FWD2 FWD1 FWD0
FWD7, FWD0
Minimum duration of the Free-fall/Wake-up event
Set the minimum duration of the free-fall/wake-up event to be recognized.
FF_WU_Duration (Dec)
Duration ( s ) = --------------------------------------------------------------ODR
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7 Register Description
7.25
DD_CFG (38h)
IEND
LIR
ZHIE
ZLIE
YLIE
XHIE
XLIE
IEND
Interrupt enable on Direction change. Default value: 0
(0: disabled;
1: interrupt signal enabled)
LIR
Latch Interrupt request into DD_SRC reg with the DD_SRC reg cleared by reading
DD_ACK reg. Default value: 0.
(0: interrupt request not latched;
1: interrupt request latched)
ZHIE
Enable interrupt generation on Z high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
ZLIE
Enable interrupt generation on Z low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
YHIE
Enable interrupt generation on Y high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
YLIE
Enable interrupt generation on Y low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
XHIE
Enable interrupt generation on X high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
XLIE
Enable interrupt generation on X low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Direction-detector configuration register
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YHIE
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LIS3LV02DQ
7.26
7 Register Description
DD_SRC (39h)
X
IA
ZH
ZL
YH
YL
XH
XL
IA
Interrupt event from direction change.
(0: no direction changes detected;
1: direction has changed from previous measurement)
ZH
Z High. Default value: 0
(0: Z below THSI threshold;
1: Z accel. exceeding THSE threshold along positive direction of acceleration axis)
ZL
Z Low. Default value: 0
(0: Z below THSI threshold;
1: Z accel. exceeding THSE threshold along negative direction of acceleration axis)
YH
Y High. Default value: 0
(0: Y below THSI threshold;
1: Y accel. exceeding THSE threshold along positive direction of acceleration axis)
YL
Y Low. Default value: 0
(0: Y below THSI threshold;
1: Y accel. exceeding THSE threshold along negative direction of acceleration axis)
XH
X High. Default value: 0
(0: X below THSI threshold;
1: X accel. exceeding THSE threshold along positive direction of acceleration axis)
XL
X Low. Default value: 0
(0: X below THSI threshold;
1: X accel. exceeding THSE threshold along negative direction of acceleration axis)
Direction detector source register
7.27
DD_ACK (3Ah)
Dummy register. If LIR bit in DD_CFG=1 allows the refresh of DD_SRC. Read data is not
significant.
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7 Register Description
7.28
DD_THSI_L (3Ch)
THSI7
THSI7, THSI0
7.29
THSI6
THSI3
THSI2
THSI1
THSI0
THSI10
THSI9
THSI8
THSE1
THSE0
THSE9
THSE8
DD_THSI_H (3Dh)
THSI15, THSI8
THSI14
THSI13
THSI12
THSI11
Direction detection Internal Threshold MSB
DD_THSE_L (3Eh)
THSE7
THSE7, THSE0
7.31
THSI4
Direction detection Internal Threshold LSB
THSI15
7.30
THSI5
THSE6
THSE5
THSE4
THSE3
THSE2
Direction detection External Threshold LSB
DD_THSE_H (3Fh)
THSE15 THSE14 THSE13 THSE12 THSE11 THSE10
THSE15, THSE8
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Direction detection External Threshold MSB
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LIS3LV02DQ
8 Typical performance characteristics
8
Typical performance characteristics
8.1
Mechanical Characteristics at 25°C
Figure 10. x-axis 0-g level at 2.5V
Figure 11. y-axis 0-g level at 2.5V
20
25
18
20
14
Percent of parts (%)
Percent of parts (%)
16
12
10
8
6
4
15
10
5
2
0
−10
−5
0
0−g LEVEL (mg)
5
0
−10
10
Figure 12. z-axis 0-g level at 2.5V
−5
0
0−g LEVEL (mg)
5
10
Figure 13. x-axis sensitivity at 2.5V
25
20
18
16
Percent of parts (%)
Percent of parts (%)
20
15
10
5
14
12
10
8
6
4
2
0
−20
−15
−10
−5
0
5
0−g LEVEL (mg)
10
15
20
20
18
18
16
16
14
14
12
10
8
6
4
1020
1025
sensitivity (LSb/g)
1030
12
10
8
6
4
2
0
1010
1015
Figure 15. z-axis sensitivity at 2.5V
Percent of parts (%)
Percent of parts (%)
Figure 14. y-axis sensitivity at 2.5V
0
1010
20
2
1015
1020
1025
sensitivity (LSb/g)
0
1010
1030
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1015
1020
1025
sensitivity (LSb/g)
1030
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LIS3LV02DQ
8 Typical performance characteristics
8.2
Mechanical Characteristics derived from measurement in the
-40°C to +85°C temperature range
Figure 17. y-axis 0-g level change vs.
temperature at 2.5V
25
25
20
20
Percent of parts (%)
Percent of parts (%)
Figure 16. x-axis 0-g level change vs.
temperature at 2.5V
15
10
5
0
ο
0−g level drift (mg/ C)
25
25
20
20
15
10
5
0
0.05
0.1 0.15 0.2 0.25
ο
0−g level drift (mg/ C)
0.3
0.35
15
10
5
−0.5
0
0.5
0−g level drift (mg/οC)
0
−0.035 −0.034 −0.033 −0.032 −0.031 −0.03 −0.029 −0.028 −0.027
sensitivity drift (%/οC)
1
Figure 20. y-axis sensitivity change vs.
temperature at 2.5V
Figure 21. z-axis sensitivity change vs.
temperature at 2.5V
40
14
35
12
30
Percent of parts (%)
16
10
8
6
25
20
15
4
10
2
5
0
0.005
0
Figure 19. x-axis sensitivity change vs.
temperature at 2.5V
Percent of parts (%)
Percent of parts (%)
0
−0.05
0.5
Figure 18. z-axis 0-g level change vs.
temperature at 2.5V
Percent of parts (%)
10
5
0
−0.5
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15
0.006
0.007
0.008
sensitivity drift (%/οC)
0.009
0
−0.05
0.010
CD00047926
−0.045
−0.04
−0.035 −0.03 −0.025
sensitivity drift (%/οC)
−0.02
−0.015
LIS3LV02DQ
8.3
8 Typical performance characteristics
Electro-Mechanical characteristics at 25°C
80
80
60
60
40
40
0−g level (mg)
0−g level (mg)
Figure 22. x and y axis 0-g level as function of Figure 23. z axis 0-g level as function of supply
supply voltage
voltage
20
0
−20
20
0
−20
−40
−40
−60
−60
−80
2
2.2
2.4
2.6
2.8
3
3.2
Supply Voltage (V)
3.4
−80
2
3.6
Figure 24. Current consumption in PowerDown mode (Vdd=2.5V)
2.2
2.4
2.6
2.8
3
3.2
Supply Voltage (V)
3.4
3.6
Figure 25. Current consumption in Operational
mode (Vdd=2.5V)
30
20
18
16
Percent of parts (%)
Percent of parts (%)
25
20
15
10
14
12
10
8
6
4
5
2
0
−5
0
current consumption (uA)
0
500
5
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550
600
650
current consumption (uA)
700
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LIS3LV02DQ
9 Package Information
9
Package Information
In order to meet environmental requirements, ST offers these devices in ECOPACK® packages.
These packages have a Lead-free second level interconnect. The category of second Level
Interconnect is marked on the package and on the inner box label, in compliance with JEDEC
Standard JESD97. The maximum ratings related to soldering conditions are also marked on
the inner box label. ECOPACK is an ST trademark.
ECOPACK specifications are available at: www.st.com.
Figure 26. QFPN-28 Mechanical Data & Package Dimensions
mm
inch
DIM.
A
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
1.70
1.80
1.90
0.067
0.071
0.075
A1
0.05
A3
0.002
0.203
0.008
b
0.30
0.35
0.40
0.012
0.014
0.016
D
6.85
7.0
7.15
0.270
0.275
0.281
D1
4.90
5.00
5.10
0.192
0.197
0.20
E
6.85
7.0
7.15
0.270
0.275
0.281
E1
4.90
5.00
5.10
0.192
0.197
0.20
e
L
0.80
0.45
0.55
OUTLINE AND
MECHANICAL DATA
0.0315
0.65
0.018 0..022 0.025
L1
0.10
0.004
ddd
0.08
0.003
QFPN-28 (7x7x1.8mm)
Quad Flat Package No lead
7787120 C
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10
10 Revision history
Revision history
Date
Revision
7-Oct-2005
1
Changes
Initial release.
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Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
All other names are the property of their respective owners
© 2005 STMicroelectronics - All rights reserved
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