INDEX PRELIMINARY MX29F1611 16M-BIT [2M x 8/1M x 16] CMOS SINGLE VOLTAGE PAGEMODE FLASH EEPROM FEATURES • Low VCC write inhibit is equal to or less than 3.2V • Software and hardware data protection • Page program operation - Internal address and data latches for 128 bytes/64 words per page - Page programming time: 5ms typical - Byte programming time: 39us in average • Low power dissipation - 80mA active current - 100uA standby current • CMOS inputs and outputs • Two independently Protected sectors • Industry standard surface mount packaging - 44 lead SOP • • • • • • 5V ± 5% write, erase and read JEDEC-standard EEPROM commands Endurance: 10,000 cycles Fast access time: 100/120/150ns Fast pagemode access time: 50/60/70ns Page access depth: 16 bytes/8 words, page address A0, A1, A2 • Sector erase architecture - 16 equal sectors of 128k bytes each - Sector erase time: 150ms typical • Auto Erase and Auto Program Algorithms - Automatically erases any one of the sectors or the whole chip with Erase Suspend capability - Automatically programs and verifies data at specified addresses • Status Register feature for detection of program or erase cycle completion GENERAL DESCRIPTION The MX29F1611 is a 16-mega bit Pagemode Flash memory organized as either 1M wordx16 or 2M bytex8. The MX29F1611 includes 16-128KB(131,072 Bytes) blocks or 16-64KW(65,536 Words)blocks. MXIC's Flash memories offer the most cost-effective and reliable read/ write non-volatile random access memory and fast page mode access. The MX29F1611 is packaged 44-pin SOP. It is designed to be reprogrammed and erased insystem or in-standard EPROM programmers. To allow for simple in-system reprogrammability, the MX29F1611 does not require high input voltages for programming. Five-volt-only commands determine the operation of the device. Reading data out of the device is similar to reading from an EPROM. MXIC Flash technology reliably stores memory contents even after 10,000 cycles. The MXIC's cell is designed to optimize the erase and programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and programming operations produces reliable cycling. The MX29F1611 uses a 5V ± 5% VCC supply to perform the Auto Erase and Auto Program algorithms. The standard MX29F1611 offers access times as fast as 100ns,allowing operation of high-speed microprocessors without wait. To eliminate bus contention, the MX29F1611 has separate chip enable CE, output enable (OE), and write enable (WE) controls. The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC +1V. MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and programming. The MX29F1611 uses a command register to manage this functionality. P/N: PM0440 1 REV. 1.6, JUL. 16, 1998 INDEX MX29F1611 PIN DESCRIPTION PIN CONFIGURATIONS WE A18 A17 A7 A6 A5 A4 A3 A2 A1 A0 CE GND OE Q0 Q8 Q1 Q9 Q2 Q10 Q3 Q11 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 MX29F1611 44 SOP(500mil) 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 WP A19 A8 A9 A10 A11 A12 A13 A14 A15 A16 BYTE GND Q15/A-1 Q7 Q14 Q6 Q13 Q5 Q12 Q4 VCC SYMBOL PIN NAME A0 - A19 Address Input Q0 - Q14 Data Input/Output Q15/A - 1 Q15(Word mode)/LSB addr.(Byte mode) CE Chip Enable Input OE Output Enable Input WE Write Enable Input WP Sector Write Protect Input BYTE Word/Byte Selection Input VCC Power Supply GND Ground Pin REV. 1.6, JUL. 16, 1998 P/N: PM0440 2 INDEX MX29F1611 BLOCK DIAGRAM WE OE WP PWD WRITE PROGRAM/ERASE CONTROL STATE INPUT HIGH VOLTAGE MACHINE LOGIC (WSM) BYTE COMMAND INTERFACE LATCH Q15/A-1 AND BUFFER Y-DECODER A0-A19 X-DECODER ADDRESS REGISTER MX29F1611 (CIR) FLASH ARRAY ARRAY SOURCE HV Y-PASS GATE PGM DATA HV SENSE AMPLIFIER COMMAND DATA DECODER COMMAND DATA LATCH Y-SELECT PAGE PROGRAM DATA LATCH Q0-Q15/A-1 I/O BUFFER REV. 1.6, JUL. 16, 1998 P/N: PM0440 3 INDEX MX29F1611 Table1.PIN DESCRIPTIONS SYMBOL A0 - A19 TYPE INPUT NAME AND FUNCTION ADDRESS INPUTS: for memory addresses. Addresses are internally latched during a write cycle. Q0 - Q7 INPUT/OUTPUT LOW-BYTE DATA BUS: Input data and commands during Command Interface Register(CIR) write cycles. Outputs array,status and identifier data in the appropriate read mode. Floated when the chip is de-selected or the outputs are disabled. Q8 - Q14 INPUT/OUTPUT HIGH-BYTE DATA BUS: Inputs data during x 16 Data-Write operations. Outputs array, identifier data in the appropriate read mode; not used for status register reads. Floated when the chip is de-selected or the outputs are disabled . Q15/A -1 INPUT/OUTPUT Selects between high-byte data INPUT/OUTPUT(BYTE = HIGH) and LSB ADDRESS(BYTE = LOW) CE INPUT CHIP ENABLE INPUTS: Activate the device's control logic, Input buffers, decoders and sense amplifiers. With CE high, the device is deselected and power consumption reduces to Standby level upon completion of any current program or erase operations. CE must be low to select the device. OE INPUT OUTPUT ENABLES: Gates the device's data through the output buffers during a read cycle OE is active low. WE INPUT WRITE ENABLE: Controls writes to the Command Interface Register(CIR). WE is active low. WP INPUT WRITE PROTECT: Top or Bottom sector can be protected by writing a nonvolatile protect-bit for each sector. When WP is high, all sectors can be programmed or erased regardless of the state of the protect-bits. The WP input buffer is disabled when PWD transitions low(deep power-down mode). BYTE INPUT BYTE ENABLE: BYTE Low places device in x8 mode. All data is then input or output on Q0-7 and Q8-14 float. AddressQ15/A-1 selects between the high and low byte. BYTE high places the device in x16 mode, and turns off the Q15/A-1 input buffer. Address A0, then becomes the lowest order address. VCC DEVICE POWER SUPPLY(5V± 5%) GND GROUND REV. 1.6, JUL. 16, 1998 P/N: PM0440 4 INDEX MX29F1611 BUS OPERATION Flash memory reads, erases and writes in-system via the local CPU . All bus cycles to or from the flash memory conform to standard microprocessor bus cycles. Table 2.1 Bus Operations for Word-Wide Mode (BYTE = VIH) Mode Notes CE OE WE A0 A1 A9 Q0-Q7 Q8-Q14 Q15/A-1 Read 1 VIL VIL VIH X X X DOUT DOUT DOUT OutputDisable 1 VIL VIH VIH X X X HighZ HighZ HighZ Standby 1 VIH X X X X X HighZ HIghZ HighZ DeepPower-Down 1 X X X X X X HighZ HighZ HighZ ManufacturerID 2,4 VIL VIL VIH VIL VIL VID C2H 00H 0B DeviceID 2,4 VIL VIL VIH VIH VIL VID F7H 00H 0B Write 1,3 VIL VIH VIL X X X DIN DIN DIN Table2.2 Bus Operations for Byte-Wide Mode (BYTE = VIL) Mode Notes CE OE WE A0 A1 A9 Q0-Q7 Q8-Q14 Q15/A-1 Read 1 VIL VIL VIH X X X DOUT DOUT VIL/VIH OutputDisable 1 VIL VIH VIH X X X HighZ HighZ X Standby 1 VIH X X X X X HighZ HIghZ X DeepPower-Down 1 X X X X X X HighZ HighZ X ManufacturerID 2,4 VIL VIL VIH VIL VIL VID C2H HighZ VIL DeviceID 2,4 VIL VIL VIH VIH VIL VID F7H HighZ VIL Write 1,3 VIL VIH VIL X X X DIN HighZ VIL/VIH NOTES : 1.X can be VIH or VIL for address or control pins. 2. A0 and A1 at VIL provide manufacturer ID codes. A0 at VIH and A1 at VIL provide device ID codes. A0 at VIL, A1 at VIH and with appropriate sector addresses provide Sector Protect Code.(Refer to Table 4) 3. Commands for different Erase operations, Data program operations or Sector Protect operations can only be successfully completed through proper command sequence. 4. VID = 11.5V- 12.5V. 5. Q15/A-1 = VIL, Q0 - Q7 =D0-D7 out . Q15/A-1 = VIH, Q0 - Q7 = D8 -D15 out. REV. 1.6, JUL. 16, 1998 P/N: PM0440 5 INDEX MX29F1611 WRITE OPERATIONS will only respond to status reads. During a sector/chip erase cycle, the CIR will respond to status reads and erase suspend. After the write state machine has completed its task, it will allow the CIR to respond to its full command set. The CIR stays at read status register mode until the microprocessor issues another valid command sequence. Commands are written to the COMMAND INTERFACE REGISTER (CIR) using standard microprocessor write timings. The CIR serves as the interface between the microprocessor and the internal chip operation. The CIR can decipher Read Array, Read Silicon ID, Erase and Program command. In the event of a read command, the CIR simply points the read path at either the array or the silicon ID, depending on the specific read command given. For a program or erase cycle, the CIR informs the write state machine that a program or erase has been requested. During a program cycle, the write state machine will control the program sequences and the CIR Device operations are selected by writing commands into the CIR. Table 3 below defines 16 Mbit flash family command. TABLE 3. COMMAND DEFINITIONS Command Sequence Read/ Reset Bus Write Cycles Req'd Silicon Page/Byte ID Read Program Chip Erase Sector Erase Erase Erase Read Clear Suspend Resume Status Reg. Status Reg. 4 4 4 6 6 3 3 4 3 First Bus Write Cycle Addr Data 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH Second Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H Third Bus Write Cycle Addr Data 5555H F0H 5555H 90H 5555H A0H 5555H 80H 5555H 80H 5555H B0H 5555H D0H 5555H 70H 5555H 50H RA RD 00H/01H C2H/F7H PA PD 5555H AAH 5555H AAH Fourth Bus Addr Read/Write Cycle Data Fifth Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H Sixth Bus Write Cycle Addr Data 5555H 10H SA 30H X SRD REV. 1.6, JUL. 16, 1998 P/N: PM0440 6 INDEX MX29F1611 COMMAND DEFINITIONS(continue Table 3.) Command Sequence Sector Sector Protection Unprotect . 6 6 Bus Write Cycles Req'd Verify Sector Protect Sleep Abort 4 3 3 First Bus Write Cycle Addr Data 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH Second Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H Third Bus Write Cycle Addr Data 5555H 60H 5555H 60H 5555H 90H 5555H C0H 5555H E0H Fourth Bus Addr Read/Write Cycle Data 5555H AAH 5555H AAH * C2H* Fifth Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H Sixth Bus Write Cycle Addr Data SA** 20H SA** 40H Notes: 1.Address bit A15 -- A19 = X = Don't care for all address commands except for Program Address(PA) and Sector Address(SA). 5555H and 2AAAH address command codes stand for Hex number starting from A0 to A14. 2. Bus operations are defined in Table 2. 3. RA = Address of the memory location to be read. PA = Address of the memory location to be programmed. Addresses are latched on the falling edge of the WE pulse. SA = Address of the sector to be erased. The combination of A16 -- A19 will uniquely select any sector. 4. RD = Data read from location RA during read operation. PD = Data to be programmed at location PA. Data is latched on the rising edge of WE. SRD = Data read from status register. 5. Only Q0-Q7 command data is taken, Q8-Q15 = Don't care. * Refer to Table 4, Figure 12. ** Only the top and the bottom sectors have protect- bit feature. SA = (A19,A18,A17,A16) = 0000B or 1111B is valid. REV. 1.6, JUL. 16, 1998 P/N: PM0440 7 INDEX MX29F1611 DEVICE OPERATION SILICON ID READ The Silicon ID Read mode allows the reading out of a binary code from the device and will identify its manufacturer and type. This mode is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. This mode is functional over the entire temperature range of the device. MX29F1611 is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in Table 3. To activate this mode, the programming equipment must force VID (11.5V~12.5V) on address pin A9. Two identifier bytes may then be sequenced from the device outputs by toggling address A0 from VIL to VIH. All addresses are don't cares except A0 and A1. To terminate the operation, it is necessary to write the read/reset command sequence into the CIR. Byte 0 (A0=VIL) represents the manfacturer's code (MXIC=C2H) and byte 1 (A0=VIH) the device identifier code (MX29F1611=F7H). The manufacturer and device codes may also be read via the command register, for instances when the Table 4. MX29F1611 Silion ID Codes and Verify Sector Protect Code Type A19 A18 A17 A16 A1 A0 Manufacturer Code X X X X VIL VIL C2H* 1 1 0 0 0 0 1 0 MX29F1611 Device Code X X X X VIL VIH F7H* 1 1 1 1 0 1 1 1 VIH VIL C2H** 1 1 0 0 0 0 1 0 Verify Sector Protect Sector Address*** Code(HEX) DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0 * MX29F1611 Manufacturer Code = C2H, Device Code = F7H when BYTE = VIL MX29F1611 Manufacturer Code = 00C2H, Device Code = 00F7H when BYTE = VIH ** Outputs C2H at protected sector address, 00H at unprotected scetor address. ***Only the top and the bottom sectors have protect-bit feature. Sector address = (A19, A18,A17,A16) = 0000B or 1111B REV. 1.6, JUL. 16, 1998 P/N: PM0440 8 INDEX MX29F1611 Any attempt to write to the device without the three-cycle command sequence will not start the internal Write State Machine(WSM), no data will be written to the device. READ/RESET COMMAND The read or reset operation is initiated by writing the read/ reset command sequence into the command register. Microprocessor read cycles retrieve array data from the memory. The device remains enabled for reads until the CIR contents are altered by a valid command sequence. After three-cycle command sequence is given, a byte(word) load is performed by applying a low pulse on the WE or CE input with CE or WE low (respectively) and OE high. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. Maximum of 128 bytes of data may be loaded into each page by the same procedure as outlined in the page program section below. The device will automatically power-up in the read/reset state. In this case, a command sequence is not required to read data. Standard microprocessor read cycles will retrieve array data. This default value ensures that no spurious alteration of the memory content occurs during the power transition. Refer to the AC Read Characteristics and Waveforms for the specific timing parameters. BYTE-WIDE LOAD/WORD-WIDE LOAD Byte(word) loads are used to enter the 128 bytes(64 words) of a page to be programmed or the software codes for data protection. A byte load(word load) is performed by applying a low pulse on the WE or CE input with CE or WE low (respectively) and OE high. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. The MX29F1611 is accessed like an EPROM. When CE and OE are low and WE is high the data stored at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever CE or OE is high. This dual line control gives designers flexibility in preventing bus contention. Note that the read/reset command is not valid when program or erase is in progress. Either byte-wide load or word-wide load is determined(Byte = VIL or VIH is latched) on the falling edge of the WE(or CE) during the 3rd command write cycle. PAGE READ PROGRAM The MX29F1611 offers fast page mode read feature. The users can take the access time advantage if keeping CE, OE at low and the same page address (A3~A19 unchanged). Please refer to Figure 5-2 for detailed timing waveform. The system performance could be enhanced by initiating 1 normal read and 7 fast page reads(for word mode A0~A2) or 15 fast page reads(for byte mode altering A-1~A2). Any page to be programmed should have the page in the erased state first, i.e. performing sector erase is suggested before page programming can be performed. The device is programmed on a page basis. If a byte(word) of data within a page is to be changed, data for the entire page can be loaded into the device. Any byte(word) that is not loaded during the programming of its page will be still in the erased state (i.e. FFH). Once the bytes of a page are loaded into the device, they are simultaneously programmed during the internal programming period. After the first data byte(word) has been loaded into the device, successive bytes(words) are entered in the same manner. Each new byte(word) to be programmed must have its high to low transition on WE (or CE) within 30us of the low to high transition of WE (or CE) of the preceding byte(word). A6 to A19 specify the page address, i.e., the device is page-aligned on 128 PAGE PROGRAM To initiate Page program mode, a three-cycle command sequence is required. There are two " unlock" write cycles. These are followed by writing the page program command-A0H. REV. 1.6, JUL. 16, 1998 P/N: PM0440 9 INDEX MX29F1611 bytes(64 words)boundary. The page address must be valid during each high to low transition of WE or CE. A-1 to A5 specify the byte address within the page, A0 to A5 specify the word address withih the page. The byte(word) may be loaded in any order; sequential loading is not required. If a high to low transition of CE or WE is not detected whithin 100us of the last low to high transition, the load period will end and the internal programming period will start. The Auto page program terminates when status on DQ7 is '1' at which time the device stays at read status register mode until the CIR contents are altered by a valid command sequence.(Refer to table 3,6 and Figure 1,7,8) SECTOR ERASE Sector erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command-80H. Two more "unlock" write cycles are then followed by the sector erase command-30H. The sector address is latched on the falling edge of WE, while the command (data) is latched on the rising edge of WE. Sector erase does not require the user to program the device prior to erase. The system is not required to provide any controls or timings during these operations. The automatic sector erase begins on the rising edge of the last WE pulse in the command sequence and terminates when the status on DQ7 is "1" at which time the device stays at read status register mode. The device remains enabled for read status register mode until the CIR contents are altered by a valid command sequence.(Refer to table 3,6 and Figure 3,4,7,9)) CHIP ERASE Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command-80H. Two more "unlock" write cycles are then followed by the chip erase command-10H. Chip erase does not require the user to program the device prior to erase. ERASE SUSPEND This command only has meaning while the the WSM is executing SECTOR or CHIP erase operation, and therefore will only be responded to during SECTOR or CHIP erase operation. After this command has been executed, the CIR will initiate the WSM to suspend erase operations, and then return to Read Status Register mode. The WSM will set the DQ6 bit to a "1". Once the WSM has reached the Suspend state,the WSM will set the DQ7 bit to a "1", At this time, WSM allows the CIR to respond to the Read Array, Read Status Register, Abort and Erase Resume commands only. In this mode, the CIR will not resopnd to any other comands. The WSM will continue to run, idling in the SUSPEND state, regardless of the state of all input control pins. The automatic erase begins on the rising edge of the last WE pulse in the command sequence and terminates when the status on DQ7 is "1" at which time the device stays at read status register mode. The device remains enabled for read status register mode until the CIR contents are altered by a valid command sequence.(Refer to table 3,6 and Figure 2,7,9) Table 5. MX29F1611 Sector Address Table (Byte-Wide Mode) A19 A18 A17 A16 Address Range[A19, -1] SA0 0 0 0 0 000000H--01FFFFH SA1 0 0 0 1 020000H--03FFFFH SA2 0 0 1 0 040000H--05FFFFH SA3 0 0 1 1 060000H--07FFFFH SA4 0 1 0 0 080000H--09FFFFH ... .... ... ... ................ 1 1 1 1 1E0000H--1FFFFFH SA15 ERASE RESUME This command will cause the CIR to clear the suspend state and set the DQ6 to a '0', but only if an Erase Suspend command was previously issued. Erase Resume will not have any effect in all other conditions. REV. 1.6, JUL. 16, 1998 P/N: PM0440 10 INDEX MX29F1611 READ STATUS REGISTER CLEAR STATUS REGISTER The MXIC's16 Mbit flash family contains a status register which may be read to determine when a program or erase operation is complete, and whether that operation completed successfully. The status register may be read at any time by writing the Read Status command to the CIR. After writing this command, all subsequent read operations output data from the status register until another valid command sequence is written to the CIR. A Read Array command must be written to the CIR to return to the Read Array mode. The Eraes fail status bit (DQ5) and Program fail status bit (DQ4) are set by the write state machine, and can only be reset by the system software. These bits can indicate various failure conditions(see Table 6). By allowing the system software to control the resetting of these bits, several operations may be performed (such as cumulatively programming several pages or erasing multiple blocks in squence). The status register may then be read to determine if an error occurred during that programming or erasure series. This adds flexibility to the way the device may be programmed or erased. Additionally, once the program(erase) fail bit happens, the program (erase) operation can not be performed further. The program(erase) fail bit must be reset by system software before further page program or sector (chip) erase are attempted. To clear the status register, the Clear Status Register command is written to the CIR. Then, any other command may be issued to the CIR. Note again that before a read cycle can be initiated, a Read command must be written to the CIR to specify whether the read data is to come from the Array, Status Register or Silicon ID. The status register bits are output on DQ2 - DQ7(table 6) whether the device is in the byte-wide (x8) or word-wide (x16) mode for the MX29F1611. In the word-wide mode the upper byte, DQ(8:15) is set to 00H during a Read Status command. In the byte-wide mode, DQ(8:14) are tri-stated and DQ15/A-1 retains the low order address function. DQ0-DQ1 is set to 0H in either x8 or x16 mode. It should be noted that the contents of the status register are latched on the falling edge of OE or CE whichever occurs last in the read cycle. This prevents possible bus errors which might occur if the contents of the status register change while reading the status register. CE or OE must be toggled with each subsequent status read, or the completion of a program or erase operation will not be evident. The Status Register is the interface between the microprocessor and the Write State Machine (WSM). When the WSM is active, this register will indicate the status of the WSM, and will also hold the bits indicating whether or not the WSM was successful in performing the desired operation. The WSM sets status bits four through seven and clears bits six and seven, but cannot clear status bits four and five. If Erase fail or Program fail status bit is detected, the Status Register is not cleared until the Clear Status Register command is written. The MX29F1611 automatically outputs Status Register data when read after Chip Erase, Sector Erase, Page Program or Read Status Command write cycle. The default state of the Status Register after powerup and return from deep power-down mode is (DQ7, DQ6, DQ5, DQ4) = 1000B. DQ3 = 0 or 1 depends on sector-protect status, can not be changed by Clear Status Register Command or Write State Machine. DQ2 = 0 or 1 depends on Sleep status, During Sleep mode or Abort mode DQ2 is set to "1"; DQ2 is reset to "0" by Read Array command. REV. 1.6, JUL. 16, 1998 P/N: PM0440 11 INDEX MX29F1611 TABLE 6. MX29F1611 STATUS REGISTER IN PROGRESS STATUS NOTES DQ7 PROGRAM 1,2, 6,7 0 0 0 0 0/1 0/1 ERASE 1,3, 6,7 0 0 0 0 0/1 0/1 SUSPEND (NOT COMPLETE) 1,4, 6,7 0 1 0 0 0/1 0/1 1 1 0 0 0/1 0/1 (COMPLETE) COMPLETE FAIL DQ6 DQ5 DQ4 DQ3 DQ2 PROGRAM 1,2, 6,7 1 0 0 0 0/1 0/1 ERASE 1,3, 6,7 1 0 0 0 0/1 0/1 PROGRAM 1,5, 6,7 1 0 0 1 0/1 0/1 ERASE 1,5, 6,7 1 0 1 0 0/1 0/1 6,7 1 0 0 0 0/1 * AFTER CLEARING STATUS REGISTER NOTES: -1. DQ7 : WRITE STATE MACHINE STATUS 1 = READY, 0 = BUSY DQ6 : ERASE SUSPEND STATUS 1 = SUSPEND, 0 = NO SUSPEND DQ5 : ERASE FAIL STATUS 1 = FAIL IN ERASE, 0 = SUCCESSFUL ERASE DQ4 : PROGRAM FAIL STATUS 1 = FAIL IN PROGRAM, 0 = SUCCESSFUL PROGRAM DQ3 : SECTOR-PROTECT STATUS 1 = SECTOR 0 OR/AND 15 PROTECTED 0 = NONE OF SECTOR PROTECTED DQ2 : SLEEP STATUS 1 = DEVICE IN SLEEP STATUS 0 = DEVICE NOT IN SLEEP STATUS DQ1 - 0 = RESERVED FOR FUTURE ENHANCEMENTS. These bits are reserved for future use ; mask them out when polling the Status Register. 2. PROGRAM STATUS is for the status during Page Programming or Sector Unprotect mode. 3. ERASE STATUS is for the status during Sector/Chip Erase or Sector Protection mode. 4. SUSPEND STATUS is for both Sector and Chip Erase mode . 5. FAIL STATUS bit(DQ4 or DQ5) is provided during Page Program or Sector/Chip Erase modes respectively. 6. DQ3 = 0 or1 depends on Sector-Protect Status. 7. DQ2 = 0 or 1 depends on whether device is in the Sleep mode or not . * Once in the Sleep mode, DQ2 is set to "1", and is reset by read array command only.- REV. 1.6, JUL. 16, 1998 P/N: PM0440 12 INDEX MX29F1611 five write command cycles in activating sector protection mode followed by the Unprotect Sector command - 40H, the automatic Unprotect operation begins on the rising edge of the last WE pulse in the command sequence and terminates when the Status on DQ7 is '1' at which time the device stays at the read status register mode.(Refer to table 3,6 and Figure 11,12) HARDWARE SECTOR PROTECTION The MX29F1611 features sector protection. This feature will disable both program and erase operations in either the top or the bottom sector (0 or 15). The sector protection feature is enabled using system software by the user(Refer to table 3). The device is shipped with both sectors unprotected. Alternatively, MXIC may protect sectors in the factory prior to shipping the device. The device remains enabled for read status register mode until the CIR contents are altered by a valid command sequence. SECTOR PROTECTION Either Protect or Unprotect sector mode is accomplished by keeping WP high, i.e. protect-bit status can only be changed with a valid command sequence and WP at high. When WP is high, all sectors can be programmed or erased regardless of the state of the protect-bits. Protectbit status will not be changed during chip/sector erase operations. With WP at VIL, only unprotected sectors can be programmed or erased. To activate this mode, a six-bus cycle operation is required. There are two 'unlock' write cycles. These are followed by writing the 'set-up' command. Two more 'unlock' write cycles are then followed by the Lock Sector command - 20H. Sector address is latched on the falling edge of CE or WE of the sixth cycle of the command sequence. The automatic Lock operation begins on the rising edge of the last WE pulse in the command sequence and terminates when the Status on DQ7 is '1' at which time the device stays at the read status register mode. SLEEP MODE The MX29F1611 features two software controlled lowpower modes : Sleep and Abort modes. Sleep mode is allowed during any current operations except that once Suspend command is issued, Sleep command is ignored. Abort mode is excuted only during Page Program and Chip/Sector Erase mode. The device remains enabled for read status register mode until the CIR contents are altered by a valid command sequence (Refer to table 3,6 and Figure 10,12 ). To activate Sleep mode, a three-bus cycle operation is required. The C0H command (Refer to table 3) puts the device in the Sleep mode. Once in the Sleep mode and with CMOS input level applied, the current of the device is 100uA. VERIFY SECTOR PROTECT To verify the Protect status of the Top and the Bottom sector, operation is initiated by writing Silicon ID read command into the command register. Following the command write, a read cycle from address XXX0H retrieves the Manufacturer code of C2H. A read cycle from XXX1H returns the Device code F7H. A read cycle from appropriate address returns information as to which sectors are protected. To terminate the operation, it is necessary to write the read/reset command sequence into the CIR. (Refer to table 3,4 and Figure 12) The Sleep command allows the device to COMPLETE current operations before going into Sleep mode. Once current operation is done, device stays at read status register mode. The status registers are not reset during sleep command. Program or erase fail bit may have been set if during program/erase mode the device retry exceeds maximum count. During Sleep mode, the status registers, Silicon ID codes remain valid and can still be read. The Device Sleep Status bit - DQ2 will indicate that the device in the sleep mode. A few retries are required if Protect status can not be verified successfully after each operation. SECTOR UNPROTECT Writing the Read Array command wakes up the device out of sleep mode. DQ2 is reset to "0" and Device returns to standby current level. It is also possible to unprotect the sector , same as the first REV. 1.6, JUL. 16, 1998 P/N: PM0440 13 INDEX MX29F1611 ABORT MODE LOW VCC WRITE INHIBIT To activate Abort mode, a three-bus cycle operation is required. The E0H command (Refer to table 3) only stops Page program or Sector /Chip erase operation currently in progress and puts the device in Sleep mode. But unlike the sleep command, the program or erase operation will not be completed. Since the data in some page/sectors is no longer valid due to an incomplete program or erase operation, the program fail (DQ4) or erase fail (DQ5)bit will be set. To avoid initiation of a write cycle during VCC power-up and power-down, a write cycle is locked out for VCC less than VLKO(= 3.2V , typically 3.5V). If VCC < VLKO, the command register is disabled and all internal program/ erase circuits are disabled. Under this condition the device will reset to the read mode. Subsequent writes will be ignored until the VCC level is greater than VLKO. It is the user's responsibility to ensure that the control pins are logically correct to prevent unintentional write when VCC is above VLKO. After the abort command is executed and with CMOS input level applied, the device current is reduced to the same level as in sleep modes. WRITE PULSE "GLITCH" PROTECTION During Abort mode, the status registers, Silicon ID codes remain valid and can still be read. The Device Sleep Status bit - DQ2 will indicate that the device in the sleep mode. Noise pulses of less than 10ns (typical) on CE or WE will not initiate a write cycle. Similar to the sleep mode, A read array command MUST be written to bring the device out of the abort state without incurring any wake up latency. Note that once device is waken up, Clear status register mode is required before a program or erase operation can be executed. LOGICAL INHIBIT Writing is inhibited by holding any one of OE = VIL,CE = VIH or WE = VIH. To initiate a write cycle CE and WE must be a logical zero while OE is a logical one. DATA PROTECTION The MX29F1611 is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transitions. During power up the device automatically resets the internal state machine in the Read Array mode. Also, with its control register architecture, alteration of the memory contents only occurs after successful completion of specific multi-bus cycle command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and power-down transitions or system noise. REV. 1.6, JUL. 16, 1998 P/N: PM0440 14 INDEX MX29F1611 Figure 1. AUTOMATIC PAGE PROGRAM FLOW CHART START Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data A0H Address 5555H Write Program Data/Address NO Loading End? YES Wait 100us Read Status Register NO SR7 = 1 ? YES SR4 = 0 NO ? YES Page Program Completed YES Program Error To Continue Other Operations, Do Clear S.R. Mode First Program another page? NO Operation Done, Device Stays At Read S.R. Mode Note : S.R. Stands for Status Register REV. 1.6, JUL. 16, 1998 P/N: PM0440 15 INDEX MX29F1611 Figure 2. AUTOMATIC CHIP ERASE FLOW CHART START Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 80H Address 5555H Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 10H Address 5555H Read Status Register NO NO To Execute Suspend Mode ? SR7 = 1 ? YES Erase Suspend Flow (Figure 4.) YES SR5 = 0 ? NO YES Chip Erase Completed Erase Error To Continue Other Operations, Do Clear S.R. Mode First Operation Done, Device Stays at Read S.R. Mode REV. 1.6, JUL. 16, 1998 P/N: PM0440 16 INDEX MX29F1611 Figure 3. AUTOMATIC SECTOR ERASE FLOW CHART START Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 80H Address 5555H Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 30H Sector Address Read Status Register NO NO SR7 = 1 ? To Execute Suspend Erase ? YES Erase Suspend Flow (Figure 4.) YES SR5 = 0 ? NO YES Sector Erase Completed Operation Done, Device Stays at Read S.R. Mode Erase Error To Continue Other Operations, Do Clear S.R. Mode First REV. 1.6, JUL. 16, 1998 P/N: PM0440 17 INDEX MX29F1611 Figure 4. ERASE SUSPEND/ERASE RESUME FLOW CHART START Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data B0H Address 5555H Read Status Register NO SR7 = 1 ? YES SR6 = 1 ? NO NO SR5 = 0 ? YES YES Erase has completed Erase Suspend Operation Done, Device Stays at Read S,R, Mode Write Data AAH Address 5555H Erase Error To Continue Other Operations, Do Clear S.R. Mode First Write Data 55H Address 2AAAH Write Data F0H Address 5555H Read Array NO Reading End ? YES Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data D0H Address 5555H Continue Erase REV. 1.6, JUL. 16, 1998 P/N: PM0440 18 INDEX MX29F1611 ELECTRICAL SPECIFICATIONS NOTICE: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is stress rating only and functional operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability. NOTICE: Specifications contained within the following tables are subject to change. ABSOLUTE MAXIMUM RATINGS RATING Ambient Operating Temperature VALUE 0°C to 70°C Storage Temperature -65°C to 125°C Applied Input Voltage -0.5V to 7.0V Applied Output Voltage -0.5V to 7.0V VCC to Ground Potential -0.5V to 7.0V A9 -0.5V to 13.5V CAPACITANCE TA = 25°C, f = 1.0 MHz SYMBOL PARAMETER CIN COUT MIN. TYP. MAX. UNIT CONDITIONS Input Capacitance 14 pF VIN = 0V Output Capacitance 16 pF VOUT = 0V SWITCHING TEST CIRCUITS 1.8K ohm DEVICE UNDER TEST +5V CL 6.2K ohm DIODES = IN3064 OR EQUIVALENT CL = 100 pF Including jig capacitance SWITCHING TEST WAVEFORMS Vcc 2.0V 2.0V TEST POINTS 0.8V 0.8V 0V OUTPUT INPUT AC TESTING: Inputs are driven at Vcc for a logic "1" and 0V for a logic "0". Input pulse rise and fall times are < 10ns. REV. 1.6, JUL. 16, 1998 P/N: PM0440 19 INDEX MX29F1611 DC CHARACTERISTICS = 0°C to 70°C, VCC = 5V± 5% SYMBOL PARAMETER NOTES MIN. IIL Input Load Current ILO TYP. MAX. UNITS TEST CONDITIONS 1 ±10 uA VCC = VCC Max VIN = VCC or GND Output Leakage Current 1 ±10 uA VCC = VCC Max VIN = VCC or GND ISB1 VCC Standby Current(CMOS) 1 50 100 uA VCC = VCC Max CE = VCC ± 0.2V ICC1 VCC Read Current 1 80 120 mA VCC = VCC Max CMOS: CE = GND ± 0.2V BYTE = GND ± 0.2V or VCC ± 0.2V Inputs = GND ± 0.2V or VCC ± 0.2V f = 10MHz, IOUT = 0 mA ICC2 VCC Read Current 1 60 100 mA VCC = VCC Max, CMOS: CE = GND ± 0.2V BYTE = VCC ± 0.2V or GND ± 0.2V Inputs = GND ± 0.2V or VCC ± 0.2V TTL: CE = VIL, BYTE = VIH or VIL Inputs = VIL or VIH, f = 5MHz, IOUT = 0mA ICC3 VCC Erase Suspend Current 1,2 5 10 mA CE = VIH BLock Erase Suspended ICC4 VCC Program Current 1 30 50 mA Program in Progress ICC5 VCC Erase Current 1 30 50 mA Erase in Progress VIL Input Low Voltage 3 -0.3 0.1 V VIH Input High Voltage 4 4.0 VCC+0.3 V VOL Output Low Voltage 0.45 V IOL = 2.1mA VOH Output High Voltage V IOH = -400uA 2.4 NOTES: 1. All currents are in RMS unless otherwise noted. Typical values at VCC = 5.0V, T = 25°C. These currents are valid for all product versions (package and speeds). 2. ICC3 is specified with the device de-selected. If the device is read while in erase suspend mode, current draw is the sum of ICC3 and ICC1/2. 3. VIL min. = -1.0V for pulse width is equal to or less than 50ns. VIL min. = -2.0V for pulse width is equal to or less than 20ns. 4. VIH max. = VCC + 1.5V for pulse width is equal to or less than 20ns. If VIH is over the specified maximum value, read operation cannot be guaranteed. REV. 1.6, JUL. 16, 1998 P/N: PM0440 20 INDEX MX29F1611 AC CHARACTERISTICS READ OPERATIONS 29F1611-10 MIN. MAX. 29F1611-12 MIN. MAX. SYMBOL DESCRIPTIONS tACC Address to Output Delay 100 120 tPA Page Mode Access Time 50 tCE CE to Output Delay tOE OE to Output Delay tDF OE High to Output Delay 0 tOH Address to Output hold 0 tBACC BYTE to Output Delay 100 120 tBHZ BYTE Low to Output in High Z 55 55 29F1611-15 MIN. MAX. UNIT CONDITIONS 150 ns CE=OE=VIL 60 70 ns CE= OE = VIL 100 120 150 ns OE=VIL 55 60 70 ns CE=VIL 55 ns CE=VIL ns CE=OE=VIL 150 ns CE= OE=VIL 70 ns CE=VIL 55 0 55 0 0 0 NOTE: TEST CONDITIONS: • Input pulse levels: 0V/Vcc • Input rise and fall times: 10ns • Output load: 1TTL gate+100pF(Including scope and jig) • Reference levels for measuring timing: 0.8V, 2.0V 1. tDF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. REV. 1.6, JUL. 16, 1998 P/N: PM0440 21 INDEX MX29F1611 Figure 5-1. NORMAL READ TIMING WAVEFORMS Vcc Power-up Standby Device and Outputs Enabled address selection Standby Vcc Power-down Data valid VIH ADDRESSES STABLE ADDRESSES VIL VIH CE VIL VIH OE VIL tDF VIH WE tOE VIL tCE tOH VOH DATA OUT HIGH Z HIGH Z Data out valid VOL tACC 5.0V VCC GND NOTE: 1. For real world application, BYTE pin should be either static high(word mode) or static low(byte mode); dynamic switching of BYTE pin is not recommended. REV. 1.6, JUL. 16, 1998 P/N: PM0440 22 INDEX MX29F1611 Figure 5-2. PAGE READ TIMING WAVEFORMS VALID ADDRESS A3~A19 A0~A2(Word mode) A-1~A2(Byte mode) tACC CE tPA tPA tPA OE tOH tDF tOE* DATA OUT Figure 6. BYTE TIMING WAVEFORMS VIH ADDRESSES STABLE ADDRESSES VIL VIH CE VIL VIH OE VIL tDF tBACC VIH tOE BYTE VIL tCE tOH VOH DATA(DQ0-DQ7) HIGH Z Data Output HIGH Z Data Output VOL tACC tBHZ VOH DATA(DQ8-DQ15) HIGH Z HIGH Z Data Output VOL REV. 1.6, JUL. 16, 1998 P/N: PM0440 23 INDEX MX29F1611 AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS SYMBOL DESCRIPTION 29F1611-10 MIN. MAX. 29F1611-12 MIN. MAX. 29F1611-15 MIN. MAX. UNIT tWC Write Cycle Time 100 120 150 ns tAS Address Setup Time 0 0 0 ns tAH Address Hold Time 45 50 60 ns tDS Data Setup Time 45 50 60 ns tDH Data Hold Time 10 10 10 ns tOES Output Enable Setup Time 0 0 0 ns tCES CE Setup Time 0 0 0 ns tGHWL Read Recover TimeBefore Write 0 0 0 tCS CE Setup Time 0 0 0 ns tCH CE Hold Time 0 0 0 ns tWP Write Pulse Width 45 50 60 ns tWPH Write Pulse Width High 50 50 50 ns tBALC Byte(Word) Address Load Cycle 0.3 tBAL Byte(Word) Address Load Time 100 100 100 us tSRA Status Register Access Time 100 120 150 ns tCESR CE Setup before S.R. Read 100 100 100 ns tVCS VCC Setup Time 2 2 2 us 30 0.3 30 0.3 30 us REV. 1.6, JUL. 16, 1998 P/N: PM0440 24 INDEX MX29F1611 Figure 7. COMMAND WRITE TIMING WAVEFORMS tCH CE tOES tCS OE tWC WE tGHWL tWPH tWP tAS ADDRESSES tAH VALID tDH tDS HIGH Z DATA (D/Q) VCC DIN tVCS NOTE: 1. BYTE pin is treated as address pin All timing specifications for BYTE pin are the same as those for address pin. 2. BYTE pin is sampled on the falling edge of WE or CE during the 3rd command write bus cycle; for real world application, BYTE pin should be either static high(word mode) or static low(byte mode). REV. 1.6, JUL. 16, 1998 P/N: PM0440 25 INDEX MX29F1611 Figure 8. AUTOMATIC PAGE PROGRAM TIMING WAVEFORMS A0~A5 AAH 55H 55H A-1 (byte mode only) 55H A6~A14 tAS 2AH Word offset Address Last Word offset Address Low/High Byte Select Last Low/High Byte Select Page Address 55H tAH Page Address A15~A19 tWC tBAL tBALC CE tWP tWPH WE tCES OE tDS tDH tSRA DATA AAH 55H A0H Write Last Write Data Data SRD NOTE: 1.Please refer to page 9 for detail page program operation. REV. 1.6, JUL. 16, 1998 P/N: PM0440 26 INDEX MX29F1611 Figure 9. AUTOMATIC SECTOR/CHIP ERASE TIMING WAVEFORMS A0~A14 5555H tAS 2AAAH 5555H 5555H 2AAAH */5555H tAH A15 SA/* A16~A19 tCESR CE# tWP tWPH WE tWC tCES OE tDS tDH tSRA DATA AAH 55H 80H AAH 55H 30H/10H SRD NOTES: 1."*" means "don't care" in this diagram. 2."SA" means "Sector Adddress". REV. 1.6, JUL. 16, 1998 P/N: PM0440 27 INDEX MX29F1611 Figure 10. SECTOR PROTECTION ALGORITHM START, PLSCNT=0 Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 60H Address 5555H Write Data AAH Address 5555H Write Data 55H Address 2AAAH Increment PLSCNT, To Protect Sector Again Write Data 20H, Sector Address* Read Status Register NO SR7 = 1 ? NO YES Protect Sector Operation Terminated PLSCNT = 25 ? YES NO Device Failed To Verify Protect Status ? YES Verify Protect Status Flow (Figure 12) NO Data = C2H ? YES Device Stays at Read S.R. Mode Sector Protected,Operation Done, Device Stays at Verify Sector Protect Mode NOTE : *Only the Top or the Bottom Sector Address is vaild in this feature. i.e. Sector Address = (A19,A18,A17,A16) = 0000B or 1111B REV. 1.6, JUL. 16, 1998 P/N: PM0440 28 INDEX MX29F1611 Figure 11. SECTOR UNPROTECT ALGORITHM START, PLSCNT=0 Write Data AAH Address 5555H Write Data 55H Address 2AAAH Write Data 60H Address 5555H Write Data AAH Address 5555H Write Data 55H Address 2AAAH Increment PLSCNT, To Unprotect Sector Again Write Data 40H, Sector Address* Read Status Register NO SR7 = 1 ? NO YES Unprotect Sector Operation Terminated PLSCNT = 25 ? YES NO Device Failed To Verify Protect Status ? YES Verify Protect Status Flow (Figure 12) NO Data = 00H ? YES Device Stays at Read S.R. Mode Sector Unprotected,Operation Done, Device Stays at Verify Sector Protect Mode NOTE : *Only the Top or the Bottom Sector Address is vaild in this feature. i.e. Sector Address = (A19,A18,A17,A16) = 0000B or 1111B REV. 1.6, JUL. 16, 1998 P/N: PM0440 29 INDEX MX29F1611 Figure 12. VERIFY SECTOR PROTECT FLOW CHART START Write Data AAH, Address 5555H Write Data 55H, Address 2AAAH Write Data 90H, Address 5555H Ptoect Status Read* * 1. Protect Status: Data Outputs C2H as Protected Sector Verified Code. Data Outputs 00H as Unprotected Sector Verified Code. 2. Sepecified address will be either (A19,A18,A17,A16,A1,A0) = (000010) or (111110), the rest of the address pins are don't care. 3. Silicon ID and Test Row lock status can be read via this Flow Chart. Refer to Table 4. REV. 1.6, JUL. 16, 1998 P/N: PM0440 30 INDEX MX29F1611 Figure 13. COMMAND WRITE TIMING WAVEFORMS(Alternate CE Controlled) tWH WE tOES tWS OE tWC CE tGHWL tCPH tCP tAS ADDRESSES tAH VALID tDH tDS HIGH Z DATA (D/Q) VCC DIN tVCS NOTE: 1. BYTE pin is treated as Address pin. All timing specifications for BYTE pin are the same as those for address pin. 2. BYTE pin is sampled on the falling edge of WE or CE during the 3rd command write bus cycle; for real world applicaton, BYTE oin should be either static high(word mode) or static low(byte mode). REV. 1.6, JUL. 16, 1998 P/N: PM0440 31 INDEX MX29F1611 Figure 14. AUTOMATIC PAGE PROGRAM TIMING WAVEFORM(Alternate CE Controlled) A0~A5 AAH 55H 55H A-1 ((Byte Mode Only) 55H A6~A14 tAS 2AH Word offset Address Last Word Offset Address Low/High Byte Select Last Low/High Byte Select Page Address 55H tAH Page Address A15~A19 tWC tBALC WE tCP tCPH tBAL CE(1) tCES OE tDS tDH tSRA DATA AAH 55H A0H Write Last Write Data Data SRD NOTE: 1.Please refer to page 9 for detail page program operation. REV. 1.6, JUL. 16, 1998 P/N: PM0440 32 INDEX MX29F1611 ERASE AND PROGRAMMING PERFORMANCE LIMITS TYP. MAX. (Note 1) UNITS Chip/Sector Erase Time 100 (Note 2) ms Page Programming Time 5 (Note 3) ms Chip Programming Time 80 150 sec PARAMETER Erase/Program Cycles MIN. 10,000 Byte Program Time Cycles 39 us *Note 1: MAX values are all evaluated with polling the status in stead of internal state machine time out. *Note 2: The IC internal state machine is set 2000 ms as maximum chip/sector erase time out. *Note 3: We set 60 ms as production test condition, whereas, the IC internal state machine is set 150 ms as maximum programming time out. LATCHUP CHARACTERISTICS MIN. MAX. Input Voltage with respect to GND on all pins except I/O pins -1.0V 13.5V Input Voltage with respect to GND on all I/O pins -1.0V Vcc + 1.0V -100mA +100mA Current Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time. REV. 1.6, JUL. 16, 1998 P/N: PM0440 33 INDEX MX29F1611 44-PIN PLASTIC SOP ITEM MILLIMETERS INCHES A 28.70 max. 1.130 max. B 1.10 [REF] .043 [REF] C 1.27 [TP] .050 [TP] D .40 ± .10 [Typ.] .016 ± .004 [Typ.] E .010 min. .004 min. F 3.00 max. .118 max. G 2.80 ± .13 .110 ± .005 H 16.04 ± .30 .631 ± .012 I 12.60 .496 J 1.72 .068 K .15 ± .10 [Typ.] .006 ± .004 [Typ.] 44 23 1 22 H A I G J F K E L NOTE: .80 ± .20 .031 ± .008 D C B L Each lead centerline is located within .25 mm[.01 inch] of its true position [TP] at maximum material condition. REV. 1.6, JUL. 16, 1998 P/N: PM0440 34 INDEX MX29F1611 Revision History Rev. # 1.1 1.2 1.3 1.4 1.5 1.6 Description Write-Erase cycles change from 1,000/10,000 to 100,000. Programming Performance table updated again Write-Erase cycles change from 100,000 to 10,000 Correct Page Programming waveform and delete RY/BY,PWD wafewaves on Page 26 & Page 32 respetively VIL MAX. 0.1-->0.4 ; VIH MIN. 4-->3.5 VIL MAX. 0.4-->0.1 ; VIH MIN. 3.5-->4 Date 10/29/1997 03/19/1998 04/09/1998 04/10/1998 07/13/1998 07/16/1998 REV. 1.6, JUL. 16, 1998 P/N: PM0440 35 WWW.ALLDATASHEET.COM Copyright © Each Manufacturing Company. All Datasheets cannot be modified without permission. This datasheet has been download from : www.AllDataSheet.com 100% Free DataSheet Search Site. Free Download. No Register. Fast Search System. www.AllDataSheet.com