33C408 4 Megabit (512K x 8-Bit) CMOS SRAM Memory Logic Diagram FEATURES: DESCRIPTION: • RAD-PAK® Technology radiation-hardened against natural space radiation • 524,288 x 8 bit organization · Total dose hardness: - > 100 krad (Si), depending upon space mission • Excellent Single Event Effect · - SELTH: > 68 MeV/mg/cm2 Maxwell Technologies’ 33C408 high-density 4 Megabit SRAM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. Using Maxwell’s radiation-hardened RAD-PAK® packaging technology, the 33C408 realizes a high density, high performance, and low power consumption. Its fully static design eliminates the need for external clocks, while the CMOS circuitry reduces power consumption and provides higher reliability. The 33C408 is equipped with eight common input/output lines, chip select and output enable, allowing for greater system flexibility and eliminating bus contention. The 33C408 features the same advanced 512K x 8-bit SRAM, high-speed, and low-power demand as the commercial counterpart. · - SEUTH: = 3 MeV/mg/cm2 • • • • • • • - SEU saturated cross section: 6E-9 cm2/bit Package: - 32-Pin RAD-PAK® flat pack - 32-Pin Non-RAD-PAK® flat pack Fast access time: - 20, 25, 30 ns maximum times available Single 5V + 10% power supply Fully static operation - No clock or refresh required Three state outputs TTL compatible inputs and outputs Low power: - Standby: 60 mA (TTL); 10 mA (CMOS) - Operation: 180 mA (20 ns); 170 mA (25 ns); 160 mA (30 ns) Maxwell Technologies' patented RAD-PAK packaging technology incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, RAD-PAK provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S. 04.16.02 REV 8 (858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com All data sheets are subject to change without notice 1 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM TABLE 1. PINOUT DESCRIPTION PIN SYMBOL DESCRIPTION 12-5, 27, 26, 23, 25, 4, 28, 3, 31, 2, 30, 1 A0-A18 29 WE Write Enable 22 CS Chip Select 24 OE Output Enable 13-15, 17-21 I/O 1-I/O 8 32 VCC Power (+5.0V) 16 VSS Ground Address Inputs Data Inputs/Outputs TABLE 2. 33C408 ABSOLUTE MAXIMUM RATINGS PARAMETER SYMBOL MIN MAX UNIT VCC -0.5 7.0 V VIN, VOUT -0.5 VCC +0.5 V Power Dissipation PD -- 1.0 W Storage Temperature TS -65 +150 °C Operating Temperature TA -55 +125 °C Voltage on VCC supply relative to VSS Voltage on any pin relative to VSS TABLE 3. DELTA LIMITS PARAMETER VARIATION ICC1 ±10% of stated vaule in Table 6 ISB ±10% of stated vaule in Table 6 ISB1 ±10% of stated vaule in Table 6 ILI ±10% of stated vaule in Table 6 04.16.02 REV 8 All data sheets are subject to change without notice 2 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM TABLE 4. 33C408 RECOMMENDED OPERATING CONDITIONS (VCC = 5.0 + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE NOTED) PARAMETER Supply Voltage SYMBOL MIN MAX UNIT VCC 4.5 5.5 V VSS 0 0 V Input High Voltage 1 VIH 2.2 VCC+0.5 V Input Low Voltage 2 VIL -0.5 0.8 V -- 1.21 °C/W Ground ΘJC Thermal Impedance 1. VIH (max) = VCC +2.0V ac (pulse width < 10 ns) for I < 20 mA 2. VIL (min) = -2.0V ac(pulse width < 10 ns) for I < 20 mA TABLE 5. 33C408 DC ELECTRICAL CHARACTERISTICS (VCC = 5V + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) SYMBOL PARAMETER CONDITION SUBGROUPS MIN MAX UNIT Input Leakage Current ILI VIN = VSS to VCC 1, 2, 3 -2 2 µA Output Leakage Current ILO CS=VIH or OE=VIH or WE=VIL, VOUT =VSS to VCC 1, 2, 3 -2 2 µA Output Low Voltage VOL IOL = 8mA 1, 2, 3 -- 0.4 V Output High Voltage VOH IOH = -4mA 1, 2, 3 2.4 -- V Operating Current -20 -25 -30 ICC Min cycle, 100% Duty, CS=VIL, IOUT=0mA, VIN = VIH or VIL 1, 2, 3 ---- 180 170 160 Standby Power Supply Current ISB CS = VIH, Min Cycle 1, 2, 3 -- 60 mA CMOS Standby Power Supply Current ISB1 CS > VCC - 0.2V, f = 0 MHz, VIN > VCC - 0.2V or VIN < 0.2V 1, 2, 3 -- 10 mA Input Capacitance 1 CIN VIN = 0V, f = 1MHz, TA = 25 °C 1, 2, 3 -- 7 pF CI/O VI/O = 0V 4, 5, 6 -- 8 pF Output Capacitance 1 mA 1. Guaranteed by design. TABLE 6. 33C408 AC TEST CONDITIONS AND CHARACTERISTICS (VCC = 5.0 + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE NOTED) PARAMETER MIN TYP MAX UNITS Input Pulse Level 0.0 -- 3.0 V -- -- 1.5 V Output Timing Measurement Reference Level 04.16.02 REV 8 All data sheets are subject to change without notice 3 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM TABLE 6. 33C408 AC TEST CONDITIONS AND CHARACTERISTICS (VCC = 5.0 + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE NOTED) PARAMETER MIN TYP MAX UNITS Input Rise/Fall Time -- -- 3.0 ns Input Timing Measurement Reference Level -- -- 1.5 V TABLE 7. 33C408 AC CHARACTERISTICS FOR READ CYCLE (VCC = 5V + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) PARAMETER SYMBOL SUBGROUPS Read Cycle Time -20 -25 -30 tRC 9, 10, 11 Address Access Time -20 -25 -30 tAA Chip Select Access Time -20 -25 -30 tCO Output Enable to Output Valid -20 -25 -30 tOE Chip Enable to Output in Low-Z -20 -25 -30 tLZ Output Enable to Output in Low-Z -20 -25 -30 tOLZ Chip Deselect to Output in High-Z -20 -25 -30 tHZ Output Disable to Output in High-Z -20 -25 -30 tOHZ Output Hold from Address Change -20 -25 -30 tOH 04.16.02 REV 8 MIN TYP MAX 20 25 30 ---- ---- ---- ---- 20 25 30 ---- ---- 20 25 30 ---- ---- 10 12 14 ---- 3 3 3 ---- ---- 0 0 0 ---- ---- 5 6 8 ---- ---- 5 6 8 ---- 3 5 6 ---- ---- UNIT ns ns 9, 10, 11 ns 9, 10, 11 9, 10, 11 ns ns 9, 10, 11 ns 9, 10, 11 ns 9, 10, 11 ns 9, 10, 11 ns 9, 10, 11 All data sheets are subject to change without notice 4 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM TABLE 7. 33C408 AC CHARACTERISTICS FOR READ CYCLE (VCC = 5V + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) PARAMETER SYMBOL SUBGROUPS Chip Select to Power Up Time -20 -25 -30 tPU 9, 10, 11 Chip Select to Power Down Time -20 -25 -30 tPD MIN TYP MAX ---- 0 0 0 ---- ---- 10 15 20 ---- UNIT ns ns 9, 10, 11 TABLE 8. 33C408 FUNCTIONAL DESCRIPTION CS WE OE MODE I/O PIN SUPPLY CURRENT H X1 X1 Not Select High-Z ISB, ISB1 L H H Output Disable High-Z ICC L H L Read DOUT ICC L X1 Write DIN ICC L 1. X = don’t care. Subgroups TABLE 9. 33C408 AC CHARACTERISTICS FOR WRITE CYCLE (VCC = 5V + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) PARAMETER SUBGROUPS SYMBOL Write Cycle Time -20 -25 -30 9, 10, 11 tWC Chip Select to End of Write -20 -25 -30 9, 10, 11 Address Setup Time -20 -25 -30 9, 10, 11 Address Valid to End of Write -20 -25 -30 9, 10, 11 04.16.02 REV 8 MIN TYP MAX 20 25 30 ---- ---- 14 15 17 ---- ---- 0 0 0 ---- ---- 14 15 17 ---- ---- UNIT ns tCW ns tAS ns tAW ns All data sheets are subject to change without notice 5 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM TABLE 9. 33C408 AC CHARACTERISTICS FOR WRITE CYCLE (VCC = 5V + 10%, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) PARAMETER SUBGROUPS SYMBOL Write Pulse Width (OE High) -20 -25 -30 9, 10, 11 tWP Write Recovery Time -20 -25 -30 9, 10, 11 Write to Output in High-Z -20 -25 -30 9, 10, 11 Write Pulse Width (OE Low) -20 -25 -30 9, 10, 11 Data to Write Time Overlap -20 -25 -30 9, 10, 11 End Write to Output Low-Z -20 -25 -30 9, 10, 11 Data Hold from Write Time -20 -25 -30 9, 10, 11 04.16.02 REV 8 MIN TYP MAX 14 15 17 ---- ---- 0 0 0 ---- ---- ---- 5 5 6 ---- ---- 20 25 30 ---- 9 10 11 ---- ---- ---- 6 7 8 ---- 0 0 0 ---- ---- UNIT ns tWR ns tWHZ ns tWP1 ns tDW ns tOW ns tDH ns All data sheets are subject to change without notice 6 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM FIGURE 1. AC TEST LOADTIMING WAVEFORM OF READ CYCLE(1) FIGURE 2. TIMING WAVEFORM OF READ CYCLE (2) Read Cycle Notes: 1. WE is high for read cycle. 2. All read cycle timing is referenced form the last valid address to the first transition address. 3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL levels. 4. At any given temperature and voltage condition, tHZ(max) is less than tLZ(min) both for a given device and from device to device. 5. Transition is measured + 200mV from steady state voltage. This parameter is sampled and not 100% tested. 6. Device is continuously selected with CS = VIL. 7. Address valid prior to coincident with CS transition low. 8. For common I/O applications, minimization or elimination of bus contention condition is necessary during read and write cycle. 04.16.02 REV 8 All data sheets are subject to change without notice 7 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM FIGURE 3. TIMING WAVEFORM OF WRITE CYCLE(1) FIGURE 4. TIMING WAVEFORM OF WRITE CYCLE(2) FIGURE 5. TIMING WAVEFORM OF WRITE CYCLE (3) 04.16.02 REV 8 All data sheets are subject to change without notice 8 ©2002 Maxwell Technologies All rights reserved. 4 Megabit (512K x 8-Bit) CMOS SRAM 33C408 WRITE CYCLE NOTE: 1. 2. All write cycle timing is referenced from the last valid address to the first transition address. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going low and WE going low: A write ends at the earliest transition among CS going high and WE going high. t is measured from beginning of write to the end of write. t is measured from the later of CS going low to end of write. 3. 4. t is measured from the address valid to the beginning of write. 5. t is measured form the end of write to the address change. TWR applied in case a write ends as CS, or WR going high. If OE, CS and WE are in the Read Mode during this period, the I/O pins are in the output low-Z state. 6. Inputs of opposite phase of the output must not be applied because bus contention can occur. For common I/O applications, minimization or elimination of bus contention conditions is necessary 7. during read and write cycle. 8. IC CS goes low simultaneously with WE going low or after WE going low, the outputs remain high impedance state. D is the read data of the new address. 9. 10. When CS is low: I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be applied. WP CW AS WR OUT 04.16.02 REV 8 All data sheets are subject to change without notice 9 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM 32 PIN RAD-PAK® FLAT PACKAGE DIMENSION SYMBOL MIN NOM MAX A 0.120 0.135 0.155 b 0.013 0.015 0.020 c 0.008 0.010 0.012 D -- 0.930 0.940 E 0.635 0.645 0.655 E1 -- -- 0.690 E2 0.550 0.565 -- E3 0.030 0.040 -- e 0.050 BSC L 0.390 0.400 0.410 Q 0.026 0.098 -- S1 0.005 0.082 -- N 32 F32-06 Note: All dimensions in inchesImportant Notice: 04.16.02 REV 8 All data sheets are subject to change without notice 10 ©2002 Maxwell Technologies All rights reserved. 4 Megabit (512K x 8-Bit) CMOS SRAM 33C408 These data sheets are created using the chip manufacturers published specifications. Maxwell Technologies verifies functionality by testing key parameters either by 100% testing, sample testing or characterization. The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information. Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies. Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts. 04.16.02 REV 8 All data sheets are subject to change without notice 11 ©2002 Maxwell Technologies All rights reserved. 33C408 4 Megabit (512K x 8-Bit) CMOS SRAM Product Ordering Options Model Number 33C408 XX F X -XX Option Details Feature Access Time 20 = 20 ns 25 = 25 ns 30 = 30 ns Screening Flow Monolithic S = Maxwell Class S B = Maxwell Class B E = Engineering (testing @ +25°C) I = Industrial (testing @ -55°C, +25°C, +125°C) Package F = Flat Pack Radiation Feature RP = RAD-PAK® package RT = Non-RAD-PAK® package Base Product Nomenclature 4 Megabit CMOS SRAM 04.16.02 REV 8 All data sheets are subject to change without notice 12 ©2002 Maxwell Technologies All rights reserved.