TI SN65LVDS048AD

SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
LVDS QUAD DIFFERENTIAL LINE RECEIVER
FEATURES
•
•
•
•
•
•
•
•
•
•
•
•
•
•
>400 Mbps (200 MHz) Signaling Rates
Flow-Through Pinout Simplifies PCB Layout
50 ps Channel-to-Channel Skew (Typ)
200 ps Differential Skew (Typ)
Propagation Delay Times 2.7 ns (Typ)
3.3-V Power Supply Design
High Impedance LVDS Inputs on Power Down
Low-Power Dissipation (40 mW at 3.3 V Static)
Accepts Small Swing (350 mV) Differential
Signal Levels
Supports Open, Short, and Terminated Input
Fail-Safe
Industrial Operating Temperature Range
(–40°C to 85°C)
Conforms to TIA/EIA-644 LVDS Standard
Available in SOIC and TSSOP Packages
Pin-Compatible With DS90LV048A From
National
SN65LVDS048AD (Marked as LVDS048A)
SN65LVDS048APW (Marked as DL048A)
(TOP VIEW)
RIN1–
RIN1+
RIN2+
RIN2–
RIN3–
RIN3+
RIN4+
RIN4–
1
16
EN
2
15
3
14
4
13
5
12
ROUT1
ROUT2
VCC
GND
ROUT3
ROUT4
6
11
7
10
8
9
EN
functional diagram
EN
EN
RIN1+
RIN1–
RIN2+
RIN2–
R1
ROUT1
R2
ROUT2
R3
ROUT3
R4
ROUT4
RIN3+
RIN3–
RIN4+
RIN4–
DESCRIPTION
The SN65LVDS048A is a quad differential line receiver that implements the electrical characteristics of
low-voltage differential signaling (LVDS). This signaling technique lowers the output voltage levels of 5-V
differential standard levels (such as EIA/TIA-422B) to reduce the power, increase the switching speeds, and
allow operation with a 3.3-V supply rail. Any of the quad differential receivers will provide a valid logical output
state with a ±100-mV differential input voltage within the input common-mode voltage range. The input
common-mode voltage range allows 1 V of ground potential difference between two LVDS nodes
The intended application of this device and signaling technique is for point-to-point baseband data transmission
over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board
traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation
characteristics of the media, the noise coupling to the environment, and other system characteristics.
The SN65LVDS048A is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2002, Texas Instruments Incorporated
SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
TRUTH TABLE (1)
DIFFERENTIAL INPUT
ENABLES
RIN+– RIN–
OUTPUT
EN
EN
H
L or
OPEN
VID ≥ 100 mV
H
VID ≤ –100 mV
Open/short or terminated
X
(1)
ROUT
L
H
All other conditions
Z
H = high level, L = low level, X = irrelevant, Z = high impedance
(off)
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
VCC
VCC
50 Ω
300 kΩ
300 kΩ
VCC
5Ω
EN,EN
Output
7V
Input
Input
7V
7V
300 kΩ
7V
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1) (2)
UNIT
VCC
Supply voltage range
–0.3 V to 4 V
VI(RIN+,
RIN-)
Input voltage range
–0.3 V to 4 V
Enable input voltage (EN, EN )
VO(ROUT)
–0.3 V to (VCC +0.3 V)
Output voltage
Bus-pin (RIN+, RIN–) electrostatic
–0.3 V to (VCC +0.3 V)
discharge (3)
Continuous power dissipation
Storage temperature range
–65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
(1)
(2)
(3)
2
> 10 kV
See Dissipation Rating Table
260°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
Tested in accordance with MIL-STD-883C Method 3015.7.
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SN65LVDS048A
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SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
DISSIPATION RATING TABLE
(1)
PACKAGE
TA ≤ 25°C
POWER RATING
OPERATING FACTOR (1)
ABOVE TA = 25°C
TA = 85°C
POWER RATING
D
950 mW
7.6 mW/°C
494 mW
PW
774 mW
6.2 mW/°C
402 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air
flow.
RECOMMENDED OPERATING CONDITIONS
VCC
MIN
NOM
MAX
3
3.3
3.6
V
3
V
Supply voltage
Receiver input voltage
GND
|V
|V
VIC
Common-mode input voltage
TA
Operating free-air temperature
UNIT
|
ID
2
|
ID
2
2.4 V
VCC– 0.8
–40
25
85
°C
MIN TYP (2)
MAX
UNIT
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted) (1)
PARAMETER
VIT+
Differential input high threshold voltage
VIT–
Differential input low threshold voltage
V(CMR)
Common mode voltage range
IIN
Input current
TEST CONDITIONS
VCM = 1.2 V, 0.05 V, 2.35 V (3)
100
–100
mV
VID = 200 mV pk to pk (4)
0.1
2.3
V
VIN = 2.8 V
–20
±1
20
µA
–20
±1
20
µA
20
µA
VIN = 0 V
VIN = 3.6 V,
VCC = 3.6 V or 0 V
–20
±1
IOH = -0.4 mA, VID = 200 mV
VCC = 0 V
2.7
3.2
V
IOH = -0.4 mA, input terminated
2.7
3.2
V
IOH = -0.4 mA, input shorted
2.7
VOH
Output high voltage
VOL
Output low voltage
IOL = 2 mA, VID = -200 mV
0.05
0.25
V
IOS
Output short circuit current
Enabled, VOUT = 0 V (5)
–65
–100
mA
IO(Z)
Output 3-state current
Disabled, VOUT = 0 V or VCC
–1
1
µA
VIH
Input high voltage
VIL
Input low voltage
II
Input current (enables)
VIN = 0 V or VCC,
Other input = VCC or GND
VIK
Input clamp voltage
ICL = –18 mA
ICC
No load supply current, receivers enabled
EN = VCC, Inputs open
ICC(Z)
No load supply current, receivers disabled
EN = GND, Inputs open
(1)
(2)
(3)
(4)
(5)
3.2
V
2.0
VCC
V
GND
0.8
V
–10
10
µA
–1.5
8
15
mA
0.6
1.5
mA
–0.8
V
Current into device pin is defined as positive. Current out of the device is defined as negative. All voltages are referenced to ground,
unless otherwise specified.
All typical values are at 25°C and with a 3.3-V supply.
VCC is always higher than RIN+ and RIN- voltage, RIN- and RIN+ have a voltage range of -0.2 V to VCC-VID/2. To be compliant with ac
specifications the common voltage range is 0.1 V to 2.3 V.
The VCMR range is reduced for larger VID, Example: If VID = 400 mV, the VCMR is 0.2 V to 2.2 V. The fail-safe condition with inputs
shorted is not supported over the common-mode range of 0 V to 2.4 V, but is supported only with inputs shorted and no external
common-mode voltage applied. A VID up to VCC-0 V may be applied to the RIN+ and RIN- inputs with the common-mode voltage set to
VCC/2. Propagation delay and differential pulse skew decrease when VID is increased from 200 mV to 400 mV. Skew specifications
apply for 200 mV < VID < 800 mV over the common-mode range.
Output short circuit current (IOS) is specified as magnitude only, minus sign indicates direction only. Only one output should be shorted
at a time. Do not exceed maximum junction temperature specification.
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SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted) (1)
PARAMETER
TEST CONDITIONS
MIN
TYP (2)
MAX
UNIT
tPHL
Differential propagation delay, high-to-low
1.9
2.7
3.7
ns
tPLH
Differential propagation delay, low-to-high
1.9
2.9
3.7
ns
200
450
ps
50
500
ps
1
ns
) (3)
tSK(p)
Differential pulse skew (tPHLD - tPLHD
tSK(o)
Differential channel-to-channel skew; same device (4)
tSK(pp)
Differential part-to-part skew (5)
tSK(lim)
Differential part-to-part
skew (6)
1.5
ns
tr
Rise time
0.5
1
ns
tf
Fall time
0.5
1
ns
tPHZ
Disable time high to Z
8
9
ns
tPLZ
Disable time low to Z
6
8
ns
tPZH
Enable time Z to high
8
10
ns
tPZL
Enable time Z to low
7
8
ns
f(MAX)
(1)
(2)
(3)
(4)
(5)
(6)
(7)
4
Maximum operating
frequency (7)
CL = 15 pF
VID = 200 mV
(see Figure 1 and Figure 2)
RL = 2 K Ω
CL = 15 pF
(see Figure 3 and Figure 4)
All channels switching
200
250
MHz
Generator waveform for all tests unless otherwise specified: f = 1 MHz, ZO = 50 Ω, tr and tf (0%–100%) ≤ 3 ns for RIN.
All typical values are at 25°C and with a 3.3-V supply.
tSK(p)|tPLH – tPHL| is the magnitude difference in differential propagation delay time between the positive going edge andthe negative
going edge of the same channel.
tSK(o) is the differential channel-to-channel skew of any event on the same device.
tSK(pp) is the differential part-to-part skew, and is defined as the difference between the minimum and the maximum specified differential
propagation delays. This specification applies to devices at the same VCC and within 5°C of each other within the operating temperature
range.
tsk(lim) part-to-part skew, is the differential channel-to-channel skew of any event between devices. This specification applies to devices
over recommended operating temperature and voltage ranges, and across process distribution. tsk(lim) is defined as |Min - Max|
differential propagation delay.
f(MAX) generator input conditions: tr = tf < 1 ns (0% to 100%), 50% duty cycle, 0 V to 3 V. Output criteria: duty cycle = 45% to 55%,VOD >
250 mV, all channels switching
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SN65LVDS048A
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SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
PARAMETER MEASUREMENT INFORMATION
RIN+
Generator
RIN–
R
ROUT
CL
50 Ω
50 Ω
Receiver Enabled
Figure 1. Receiver Propagation Delay and Transition Time Test Circuit
RIN–
1.3 V
OV Differential
VID = 200 mV
1.2 V
RIN+
1.1 V
tPLH
ROUT
tPHL
1.5 V
20%
tr
80%
80%
VOH
1.5 V
20%
VOL
tf
Figure 2. Receiver Propagation Delay and Transition Time Waveforms
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SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
PARAMETER MEASUREMENT INFORMATION (continued)
VCC
RIN+
Generator
RIN–
EN
50 Ω
S1
RL
Device
Under
Test
EN
ROUT
CL
1/4 65LVDS048A
CL Includes Load and Test Jig Capacitance.
S1 = VCC for tPZL and tPLZ Measurements.
S1 = GND for tPZH and tPHZ Measurements.
Figure 3. Receiver 3-State Delay Test Circuit
1.5 V
EN When EN = GND or Open
1.5 V
3V
0V
3V
EN When EN = VCC
0V
tPLZ
tPZL
VCC
Output When
VID = –100 mV
Output When
VID = 100 mV
50%
0.5 V
tPHZ
VOL
tPZH
VOH
0.5 V
50%
GND
Figure 4. Receiver 3-State Delay Waveforms
6
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SN65LVDS048A
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SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
TYPICAL CHARACTERISTICS
OUTPUT HIGH VOLTAGE
vs
POWER SUPPLY VOLTAGE
OUTPUT LOW VOLTAGE
vs
POWER SUPPLY VOLTAGE
3.6
57
TA = 25°C
VID = 200 mV
VOL − Output Low Voltage − mV
VOH − Output High Voltage − V
TA = 25°C
VID = 200 mV
3.4
3.2
3
2.8
3
3.3
56
55
54
53
52
3.6
3
VCC − Power Supply Voltage − V
Figure 5.
Figure 6.
OUTPUT SHORT CIRCUIT CURRENT
vs
POWER SUPPLY VOLTAGE
DIFFERENTIAL TRANSITION VOLTAGE
vs
POWER SUPPLY VOLTAGE
−76
− Differential Transition Voltage − mV
TA = 25°C
VO = 0 V
−72
−68
−64
−60
3
3.3
VCC − Power Supply Voltage − V
3.6
VIT+ VIT−
I OS − Output Short Circuit Current − mA
3.6
50
−80
−56
3.3
VCC − Power Supply Voltage − V
TA = 25°C
40
30
20
10
0
3
Figure 7.
3.3
VCC − Power Supply Voltage − V
3.6
Figure 8.
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SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
TYPICAL CHARACTERISTICS (continued)
DIFFERENTIAL PROPAGATION DELAY
vs
COMMON-MODE VOLTAGE
4
t PLH, t PHL − Differential Propagation Delay − ns
t PLH, t PHL − Differential Propagation Delay − ns
DIFFERENTIAL PROPAGATION DELAY
vs
DIFFERENTIAL INPUT VOLTAGE
tPLH
3
tPHL
2
TA = 25°C
f = 20 MHz
VCM = 1.2 V
CI = 15 pF
VCC = 3.3 V
1
0
0
500
1000
1500
2000
2500
Differential Input Voltage − mV
4
tPLH
3
tPHL
2
TA = 25°C
f = 20 MHz
VCM = 1.2 V
CI = 15 pF
VCC = 3.3 V
1
0
−0.5
3000
0
0.5
1
1.5
Common-Mode Voltage − V
Figure 9.
Figure 10.
DATA TRANSFER RATE
vs
FREE-AIR TEMPERATURE
800
Data Transfer Rate − Mxfr/s
750
700
650
600
215 −1 prbs NRZ
VCC = 3.3 V
VID = 0.4 V
VIC = 1.2 V
CL = 5.5 pF
40% Open Eye
4 Receivers Switching
Input Jitter < 45 ps
550
500
450
400
−40
−20
0
20
40
60
TA − Free-Air Temperature − °C
Figure 11.
8
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80
2
2.5
SN65LVDS048A
www.ti.com
SLLS451B – SEPTEMBER 2000 – REVISED SEPTEMBER 2002
APPLICATION INFORMATION
FAIL SAFE
One of the most common problems with differential signaling applications is how the system responds when no
differential voltage is present on the signal pair. The LVDS receiver is like most differential line receivers, in that
its output logic state can be indeterminate when the differential input voltage is between –100 mV and 100 mV
and within its recommended input common-mode voltage range. TI's LVDS receiver is different in how it handles
the open-input circuit situation, however.
Open-circuit means that there is little or no input current to the receiver from the data line itself. This could be
when the driver is in a high-impedance state or the cable is disconnected. When this occurs, the LVDS receiver
will pull each line of the signal pair to near VCC through 300-kΩ resistors as shown in Figure 10. The fail-safe
feature uses an AND gate with input voltage thresholds at about 2.3 V to detect this condition and force the
output to a high-level regardless of the differential input voltage.
VCC
300 kΩ
300 kΩ
A
Rt = 100 Ω (Typ)
Y
B
VIT ≈ 2.3 V
Figure 12. Open-Circuit Fail Safe of the LVDS Receiver
It is only under these conditions that the output of the receiver will be valid with less than a 100-mV differential
input voltage magnitude. The presence of the termination resistor, Rt, does not affect the fail-safe function as
long as it is connected as shown in the figure. Other termination circuits may allow a dc current to ground that
could defeat the pullup currents from the receiver and the fail-safe feature.
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PACKAGE OPTION ADDENDUM
www.ti.com
6-Dec-2006
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN65LVDS048AD
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048ADG4
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048ADR
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048ADRG4
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048APW
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048APWG4
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048APWR
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVDS048APWRG4
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
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