TC54 Voltage Detector Features General Description • ±2.0% Detection Thresholds • Small Packages: 3-Pin SOT-23A, 3-Pin SOT-89, and TO-92 • Low Current Drain: 1 µA (Typical) • Wide Detection Range: 1.1V to 6.0V • Wide Operating Voltage Range: 0.7V to 10V The TC54 series are CMOS voltage detectors that are especially well suited for battery-powered applications because of their extremely low 1 µA operating current and small surface-mount packaging. Each part is lasertrimmed to the desired threshold voltage, which can be specified from 1.4V to 6.0V with a 2% tolerance. Applications • • • • • Battery Voltage Monitoring Microprocessor Reset System Brown-Out Protection Switching Circuit in Battery Backup Level Discriminator The TC54 is available with either an open-drain or complementary output stage. During operation, the TC54's output (VOUT) remains in the logic-high state as long as VIN is greater than the specified threshold voltage (VDET –). When VIN falls below VDET –, the output is driven to a logic-low. VOUT remains low until VIN rises above VDET – by an amount VHYST, whereupon it resets to a logic-high. Package Types Functional Block Diagram TC54VC only 3-Pin SOT-23A VIN 3-Pin SOT-89 VIN 3 VIN TC54 TC54 VOUT – 1 VOUT + VREF 2 VSS 1 2 3 VOUT VIN VSS 3-Pin TO-92 123 VSS TC54VN has open-drain output. TC54VC has complementary(push-pull) output. VOUT VIN VSS Note: 3-Pin SOT-23A is equivalent to the EIAJ SC-59 Device Features Output Reset Delay Std. Trip Points(1) (typical) Active Low No 1.4V, 2.1V, 2.7V, 2.9V Active Low No 3.0V, 4.2V, 4.3V Device Type State TC54VN Open-Drain TC54VC Push-Pull Note 1: Custom Trip Points available. Minimum order requirement. Information available upon request. © 2007 Microchip Technology Inc. DS21434H-page 1 TC54 1.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings † Input Voltage ...................................................................+12V † Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operation sections of the specifications is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Output Current ..............................................................50 mA Output Voltage: CMOS................(VSS – 0.3V) to (VIN + 0.3V) Open-Drain.....................(VSS – 0.3V) to 12V Power Dissipation (TA ≤ 70°C): 3-Pin SOT-23A .......................................................240 mW 3-Pin SOT-89..........................................................500 mW 5-Pin SOT-23A .......................................................240 mW 3-Pin TO-92 ............................................................300 mW Operating Temperature Range........................-40°C to +85°C Storage Temperature Range .........................-65°C to +150°C DC CHARACTERISTICS Electrical Specifications: Unless otherwise noted, TA = +25°C. Parameter Operating Voltage Quiescent Current Threshold Voltage (Note 1) Hysteresis Voltage Output Current Tempco of (VDET–) Delay Time Note 1: Sym Min Typ Max Units VIN 0.7 — 10.0 V (VDET –) ≥ 1.6V 0.7 — 6.0 V (VDET –) < 1.6V — 0.8 2.7 µA VIN = 2.0V — 0.9 3.0 VIN = 3.0V — 1.0 3.2 VIN = 4.0V ISS VDET – VHYST IOUT Test Conditions VIN = 5.0V — 1.1 3.6 1.37 1.4 1.43 2.06 2.1 2.14 TC54VX21 2.65 2.7 2.75 TC54VX27 2.84 2.9 2.96 TC54VX29 2.94 3.0 3.06 TC54VX30 4.12 4.2 4.28 TC54VX42 4.21 4.3 4.39 TC54VX43 V 28 70 112 42 105 168 VDET = 2.1V (typical) 54 135 216 VDET = 2.7V (typical) 58 145 232 VDET = 2.9V (typical) 60 150 240 VDET = 3.0V (typical) 84 210 336 VDET = 4.2V (typical) 86 215 344 3.0 7.7 — 5.0 10.1 — VOL = 0.5V, VIN = 3.0V 6.0 11.5 — VOL = 0.5V, VIN = 4.0V VOL = 0.5V, VIN = 5.0V 7.0 13.0 — — -10.0 -2.0 TC (VDET –) — ±100 — tDLY — — 0.2 mV TC54VX14 VDET = 1.4V (typical) VDET = 4.3V (typical) mA VOL = 0.5V, VIN = 2.0V TC54VC Only: VOH = VIN – 2.1V, VIN = 8.0V ppm/°C -40°C ≤ TA ≤ 85°C ms VDET – → VOUT inversion For other voltage options, please contact your regional Microchip sales office. DS21434H-page 2 © 2007 Microchip Technology Inc. TC54 VDET –+VHYST VDET VDD tDLY OUTPUT FIGURE 1-1: VOH Timing Diagram. © 2007 Microchip Technology Inc. DS21434H-page 3 TC54 2.0 PIN DESCRIPTIONS The descriptions of the pins are listed in Table 2-1. TABLE 2-1: PIN FUNCTION TABLE Pin No. (3-Pin SOT-23A) 2.1 Pin No. (3-Pin SOT-89) Pin No. (3-Pin TO-92) Symbol 1 1 1 VOUT Digital Output 3 2 2 VIN Analog Input 2 3 3 VSS Ground Terminal — Tab — VIN Analog Input Digital Output (VOUT) VOUT goes low when VIN drops below VDET – and returns high when VIN rises above VDET – + VHYST. (See Figure 3-1). 2.3 Analog Input (VIN) Ground Terminal (VSS) VSS provides the negative reference for the analog input voltage. Typically, the circuit ground is used. 2.4 2.2 Description No Connect (NC) No internal connection. VIN can be used for power supply monitoring or a voltage level that requires monitoring. DS21434H-page 4 © 2007 Microchip Technology Inc. TC54 3.0 DETAILED DESCRIPTION In normal steady-state operation when VIN > VDET –, the output will be at a logic-high (see Figure 3-1). In the case of the TC54VN, this is an open-drain condition. If the input falls below VDET –, the output will pull down (Logic 0) to VSS. Generally, VOUT can pull down to within 0.5V of VSS at rated output current and input voltage. (See Section 1.0 “Electrical Characteristics”). VIN The output (VOUT) will stay valid until the input voltage falls below the minimum operating voltage (VINMIN) of 0.7V. Below this minimum operating voltage the output is undefined. During power-up (or anytime VIN has fallen below VINMIN), VOUT will remain undefined until VIN rises above VINMIN. Once this occurs, the output will become valid. VOUT will be in its active-low state, while VINMIN < VIN < VDET+ (therefore, VDET + = VDET – + VHYST). If the input rises above VDET+, the output will assume its inactive state (high for TC54VC, open-drain for TC54VN). VDET + VHYST Release Voltage or RESET Voltage Detect Voltage VDET – Minimum Operating Voltage Ground Level VOUT Output Voltage Ground Level FIGURE 3-1: Timing Diagram. © 2007 Microchip Technology Inc. DS21434H-page 5 TC54 4.0 APPLICATIONS INFORMATION 4.1 Modifying the Trip Point, VDET – Although the TC54 has a pre-programmed VDET –, it is sometimes necessary to make adjustments during prototyping. This can be accomplished by connecting an external resistor divider to a TC54, which has a VDET – lower than that of VSOURCE (Figure 4-1). To maintain detector accuracy, the bleeder current through the divider should be significantly higher than the 1 µA operating current required by the TC54. A reasonable value for this bleeder current is 100 µA (100 times the 1 µA required by the TC54). For example, if VDET – = 2V and the desired trip point is 2.5V, the value of R1 + R2 is 25 kΩ (2.5V/100 µA). The value of R1 + R2 can be rounded to the nearest standard value and plugged into the equation of Figure 4-1 to calculate values for R1 and R2. 1% tolerance resistors are recommended. 4.2 Other Applications Low operating power and small physical size make the TC54 series ideal for many voltage detector applications, such as those shown in Figures 4-2, 4-3 and 4-4. Figure 4-2 shows a low-voltage gate drive protection circuit that prevents overheating of the logiclevel MOSFET due to insufficient gate voltage. When the input signal is below the threshold of the TC54VN, its output grounds the gate of the MOSFET. Figure 4-3 and Figure 4-4 show the TC54 in conventional voltage monitoring applications. 4.3V 270Ω VCC VIN RL VOUT TC54VX MTP3055EL VSOURCE VSS R2 VIN R1 TC54 VOUT VSS FIGURE 4-2: Protection. MOSFET Low Drive + VIN – TC54VX VOUT R1 V SOURCE = ------------------- = V DET R1 + R2 VSS Where: VSOURCE VDET – Note: = Voltage to be monitored = Threshold Voltage setting of TC54 BATLOW FIGURE 4-3: Battery Voltage Monitor. In this example, VSOURCE must be greater than (VDET –) FIGURE 4-1: Modify Trip-point of the TC54 using External Resistor Divider. VIN + Pwr Sply TC54VX VOUT Power Good – VSS FIGURE 4-4: DS21434H-page 6 Power Good Monitor. © 2007 Microchip Technology Inc. TC54 5.0 PACKAGING INFORMATION 5.1 Package Marking Information 3-Pin SOT-23A 3-Pin TO-92 3-Pin SOT-89 2 4 1 2 3 4 1 2 3 4 1 5 6 7 8 3 1 , 2 ,& 3 1 represents output configuration (CMOS or Nch) and first integer of voltage Ex: CMOS 3.x = 2 D Symbol Output Voltage B CMOS 1. C CMOS 2. D CMOS 3. E CMOS 4. F CMOS 5. H CMOS 6. 5 I CMOS 7. Symbol Output Voltage L Nch 1. M Nch 2. N Nch 3. P Nch 4. R Nch 5. S Nch 6. T Nch 7. 6 represents first decimal of output voltage (0-9) Ex: CMOS 3.x = D 4 Symbol Voltage Symbol Voltage 0 .0 6 .6 1 .1 7 .7 2 .2 8 .8 3 .3 9 .9 4 .4 5 .5 ) 3 4 & 4 represents assembly lot code © 2007 Microchip Technology Inc. 7 8 = 54X (fixed) represents output configuration (CMOS or Nch) Ex: CMOS 3.x = C Symbol Output C CMOS N N-Channel represents first integer of detect voltage Symbol Voltage 2 2. 3 3. 4 4. 5 5. 6 6. represents first decimal of detect voltage Symbol Voltage Symbol Voltage 0 .0 5 .5 1 .1 6 .6 2 .2 7 .7 3 .3 8 .8 4 .4 9 .9 represents the output Delay Time Symbol Delay Time 0 No Delay represents the device accuracy Symbol Accuracy 1 ±1.0% (custom) 2 ±2.0% (standard) DS21434H-page 7 TC54 /HDG3ODVWLF6PDOO2XWOLQH7UDQVLVWRU&%>627$@ 1RWH )RUWKHPRVWFXUUHQWSDFNDJHGUDZLQJVSOHDVHVHHWKH0LFURFKLS3DFNDJLQJ6SHFLILFDWLRQORFDWHGDW KWWSZZZPLFURFKLSFRPSDFNDJLQJ D e1 e 2 1 E E1 N b A c A2 φ L A1 8QLWV 'LPHQVLRQ/LPLWV 1XPEHURI3LQV 0,//,0(7(56 0,1 120 0$; 1 /HDG3LWFK H %6& 2XWVLGH/HDG3LWFK H 2YHUDOO+HLJKW $ ± 0ROGHG3DFNDJH7KLFNQHVV $ ± 6WDQGRII $ ± 2YHUDOO:LGWK ( ± 0ROGHG3DFNDJH:LGWK ( ± 2YHUDOO/HQJWK ' ± )RRW/HQJWK / ± )RRW$QJOH ± /HDG7KLFNQHVV F ± %6& /HDG:LGWK E ± 1RWHV 'LPHQVLRQV'DQG(GRQRWLQFOXGHPROGIODVKRUSURWUXVLRQV0ROGIODVKRUSURWUXVLRQVVKDOOQRWH[FHHGPPSHUVLGH 'LPHQVLRQLQJDQGWROHUDQFLQJSHU$60(<0 %6& %DVLF'LPHQVLRQ7KHRUHWLFDOO\H[DFWYDOXHVKRZQZLWKRXWWROHUDQFHV 0LFURFKLS 7HFKQRORJ\ 'UDZLQJ &% DS21434H-page 8 © 2007 Microchip Technology Inc. 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DS21434H-page 9 TC54 /HDG3ODVWLF7UDQVLVWRU2XWOLQH=%>72@ 1RWH )RUWKHPRVWFXUUHQWSDFNDJHGUDZLQJVSOHDVHVHHWKH0LFURFKLS3DFNDJLQJ6SHFLILFDWLRQORFDWHGDW KWWSZZZPLFURFKLSFRPSDFNDJLQJ E A N 1 L 1 2 3 b e c D R 8QLWV 'LPHQVLRQ/LPLWV 1XPEHURI3LQV ,1&+(6 0,1 1 0$; 3LWFK H %RWWRPWR3DFNDJH)ODW ' %6& 2YHUDOO:LGWK ( 2YHUDOO/HQJWK $ 0ROGHG3DFNDJH5DGLXV 5 7LSWR6HDWLQJ3ODQH / ± /HDG7KLFNQHVV F /HDG:LGWK E 1RWHV 'LPHQVLRQV$DQG(GRQRWLQFOXGHPROGIODVKRUSURWUXVLRQV0ROGIODVKRUSURWUXVLRQVVKDOOQRWH[FHHGSHUVLGH 'LPHQVLRQLQJDQGWROHUDQFLQJSHU$60(<0 %6& %DVLF'LPHQVLRQ7KHRUHWLFDOO\H[DFWYDOXHVKRZQZLWKRXWWROHUDQFHV 0LFURFKLS 7HFKQRORJ\ 'UDZLQJ &% DS21434H-page 10 © 2007 Microchip Technology Inc. TC54 APPENDIX A: REVISION HISTORY Revision H (December 2007) • Updated Features section. • Removed 5-Pin SOT-23 related information. • Updated Output Current (IOUT) Electrical Specification. • Removed 7.7V (typical) Voltage Trip Point Option. Max Trip Point Voltage is now 6.0V. • Updated Pin Function Table. • Updated Packaging Specification Information. • Added Revision History section. • Updated Product Identification System page. Revision G (August 2004) • Undocumented changes. Revision F (July 2004) • Undocumented changes. Revision E (April 2003) • Undocumented changes. Revision D (October 2002) • Undocumented changes. Revision C (July 2002) • Undocumented changes. Revision B (May 2002) • Undocumented changes. Revision A (March 2001) • Original Release of this Document. © 2007 Microchip Technology Inc. DS21434H-page 11 TC54 NOTES: DS21434H-page 12 © 2007 Microchip Technology Inc. TC54 PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. Device X XX X X X XX XX Output Detected Extra Tolerance Temp. Pkg Taping Config. Voltage Feature Direction Code Device: TC54V: Output Configuration: N C Voltage Detector Examples: a) b) = Nch Open-Drain = CMOS Output c) Detected Voltage: 14 21 27 29 30 42 43 = = = = = = = 1.4V 2.1V 2.7V 2.9V 3.0V 4.2V 4.3V d) e) Extra Feature Code: 0 = Fixed Tolerance: 2 = 2% Temperature: E = -40°C to +85°C f) g) Package: Taping Direction: CB = Plastic Small Outline Transistor, SOT-23A, 3-lead, MB = Plastic Small Outline Transistor, SOT-89, 3-lead, ZB = Plastic Transistor Outline, TO-92, 3-lead h) 713 = Standard Taping i) © 2007 Microchip Technology Inc. TC54VC1402ECB713: Tape and Reel, 1.4V Voltage Detector, 2% Tol., SOT-23A-3. TC54VC1402EMB713: Tape and Reel, 1.4V Voltage Detector, 2% Tol., SOT-89-3. TC54VC1402EZB: 1.4V Voltage Detector, 2% Tol., TO-92. TC54VC2102ECB713: Tape and Reel, 2.1V Voltage Detector, 2% Tol., SOT-23A-3. TC54VC2102EMB713: Tape and Reel, 2.1V Voltage Detector, 2% Tol., SOT-89-3. TC54VC2102EZB: 2.1V Voltage Detector, 2% Tol., TO-92. TC54VC2702ECB713: Tape and Reel, 2.7V Voltage Detector, 2% Tol., SOT-23A-3. TC54VC3002ECB713: Tape and Reel, 3.0V Voltage Detector, 2% Tol., SOT-23A-3. TC54VN4202ECB713: Tape and Reel, 4.2V Voltage Detector,2% Tol., SOT-23A-3. DS21434H-page 13 TC54 NOTES: DS21434H-page 14 © 2007 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, Accuron, dsPIC, KEELOQ, KEELOQ logo, microID, MPLAB, PIC, PICmicro, PICSTART, PRO MATE, rfPIC and SmartShunt are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. AmpLab, FilterLab, Linear Active Thermistor, Migratable Memory, MXDEV, MXLAB, SEEVAL, SmartSensor and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Application Maestro, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, FlexROM, fuzzyLAB, In-Circuit Serial Programming, ICSP, ICEPIC, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, PICkit, PICDEM, PICDEM.net, PICLAB, PICtail, PowerCal, PowerInfo, PowerMate, PowerTool, REAL ICE, rfLAB, Select Mode, Smart Serial, SmartTel, Total Endurance, UNI/O, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 2007, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. Microchip received ISO/TS-16949:2002 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. © 2007 Microchip Technology Inc. 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