DATA SHEET MOS INTEGRATED CIRCUIT µPD72107 LAP-B CONTROLLER Link Access Procedure Balanced mode The µPD72107 is an LSI that supports LAP-B protocol specified by the ITU-T recommended X.25 on a single chip. FEATURES • Complied with ITU-T recommended X.25 (LAP-B84 • Memory-based interface edition) Memory-based command HDLC frame control Memory-based status Memory-based transmit/receive data Sequence control • MAX.4 Mbps serial transfer rate Flow control • NRZ, NRZI coding • ITU-T recommended X.75 supported • TTC standard JT-T90 supported • Optional functions Option frame Global address frame Error check deletion frame • Powerful test functions Data loopback function Loopback test link function Frame trace function • Abundant statistical information • Detailed mode setting function • Modem control function • On-chip DMAC (Direct Memory Access Controller) 24-bit address Byte/word transfer enabled (switch with external pin) ORDERING INFORMATION Part Number Package µPD72107CW 64-pin plastic shrink DIP (750 mils) µPD72107GC-3B9 80-pin plastic QFP (14 x 14 mm) µPD72107L 68-pin plastic QFJ (950 x 950 mils) The information in this document is subject to change without notice. Document No. S12962EJ5V0DS00 (5th edition) Date Published October 1998 N CP(K) Printed in Japan © 1998 µPD72107 BLOCK DIAGRAM D0-D7 A16D8 -A23D15 A0-A15 IORD IOWR MRD MWR UBE CS ASTB AEN READY HLDRQ HLDAK CRQ INT CLRINT B/W PU TxC TxD Internal controller TxFIFO RTS CTS Bus interface Internal bus CD Receiver RxFIFO DMAC RxC VCC GND RESET CLK RxD Name Function Bus interface An interface between the µPD72107 and external memory or external host processor Internal controller Manages LAP-B protocol including control of the DMAC block, transmitter block, and receiver block DMAC (Direct Memory Access Controller) Controls the transfer of data on the external memory to the internal controller or transmitter block, and controls the writing of data in the internal controller or receiver block to the external memory TxFIFO A 16-byte buffer for when transmit data is sent from the DMAC to the transmitter block RxFIFO A 32-byte buffer for when receive data is sent from the receiver block to the DMAC Transmitter Converts the contents of TxFIFO into an HDLC frame and transmits it as serial data Receiver Receives HDLC frame and writes internal data to RxFIFO Internal bus An 8-bit address bus and 8-bit data bus that connect the internal controller, DMAC, FIFO, serial block, and bus interface block 2 Transmitter µPD72107 PIN CONFIGURATION (Top View) 64-pin plastic shrink DIP (750 mils) µ PD72107CW IC 1 64 RTS RxC 2 63 CD RxD 3 62 CRQ TxC 4 61 AEN TxD 5 60 ASTB CTS 6 59 READY IC 7 58 HLDAK RESET 8 57 HLDRQ NC 9 56 CLRINT IC 10 55 INT B/W 11 54 UBE PU 12 53 MWR CLK 13 52 MRD GND 14 51 GND A0 15 50 IOWR A1 16 49 IORD A2 17 48 CS A3 18 47 VCC A4 19 46 D7 A5 20 45 D6 A6 21 44 D5 A7 22 43 D4 A8 23 42 D3 A9 24 41 D2 A10 25 40 D1 A11 26 39 D0 A12 27 38 A23D15 A13 28 37 A22D14 A14 29 36 A21D13 A15 30 35 A20D12 A16D8 31 34 A19D11 A17D9 32 33 A18D10 3 µPD72107 80-pin plastic QFP (14 × 14 mm) NC D2 D5 D4 D3 VCC NC VCC D7 D6 CS GND IOWR IORD UBE MWR MRD INT CLRINT NC µ PD72107GC-3B9 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 NC 1 60 D1 HLDRQ 2 59 D0 HLDAK 3 58 A23D15 READY ASTB AEN 4 5 6 57 56 55 A22D14 A21D13 NC NC CRQ CD 7 8 9 54 53 52 A20D12 A19D11 A18D10 RTS 10 51 NC NC IC RxC RxD NC 11 12 13 14 15 50 49 48 47 46 NC A17D9 A16D8 A15 A14 TxC TxD CTS 16 17 18 45 44 43 A13 A12 A11 IC 19 42 A10 NC 20 41 NC A9 NC A6 A7 A8 A1 A2 A3 A4 A5 A0 GND GND NC B/W PU CLK IC NC 4 RESET 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 µPD72107 68-pin plastic QFJ (950 × 950 mils) NC 2 1 HLDRQ IC 3 HLDAK RxC 4 READY RxD 5 ASTB NC 6 AEN TxC 7 CRQ TxD 8 CD CTS 9 RTS IC µ PD72107L RESET 10 68 67 66 65 64 63 62 61 60 CLRINT IOWR A0 17 53 IORD A1 18 52 CS A2 19 51 VCC A3 20 50 VCC A4 21 49 D7 A5 22 48 D6 A6 23 47 D5 A7 24 46 D4 A8 25 45 D3 A9 26 44 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 D2 D1 GND 54 D0 55 16 A23D15 15 GND A22D14 GND A21D13 MRD A20D12 56 A19D11 14 A18D10 CLK NC MWR A17D9 57 A16D8 13 A15 PU A14 UBE A13 INT 58 A12 59 12 A11 11 A10 IC B/W 5 µPD72107 1. PINS 1.1 Pin Functions SDIP QFP QFJ Pin Name VCC GND CLK Active I/O Pin No. Pin No. Pin No. 47 68 50 70 51 14 27 15 51 28 16 74 55 13 26 14 Function Level – – +5 V power supply – – Ground (0 V) Note that there is more than one ground pin. I – (Clock) RESET System clock input Input clock of 1 MHz to 8.2 MHz. 8 22 10 I L (Reset) Initializes the internal µ PD72107. Active width of more than 7 CLK clock cycles is required (clock input is required). After reset, this pin becomes a bus slave. PU 12 25 13 I – Pull up to high level when using in normal operation. 48 71 52 I L When bus master (Pull Up) CS (Chip Select) Set to disable. When bus slave Read/write operation from the host processor at low level is enabled. MRD 52 75 56 (Memory Read) O L 3-state When bus master Reads the data of the external memory at low level. When bus slave High impedance MWR 53 76 57 (Memory Write) O L 3-state When bus master Writes the data to the external memory at low level. When bus slave High impedance IORD 49 72 53 I L (I/O Read) This pin is used when the external host processor reads the contents of the internal registers of the µ PD72107. IOWR 50 73 54 I L (I/O Write) This pin is used when the external host processor writes the data to the internal registers of the µ PD72107. ASTB (Address Strobe) 6 60 5 64 O H This pin is used to latch the address output from the µ PD72107 externally. µPD72107 SDIP QFP QFJ Pin Name NC Active I/O Pin No. Pin No. Pin No. 9 1, 7, 1 11, 15, 5 20, 21, 35 (No Connection) Function Level – – Use this pin open. – – Do not connect anything to this pin. I/O L/H 29, 40, 41, 50, 51, 55, 61, 69, 80 IC 1 12 2 (Internally 7 19 9 10 23 11 54 77 58 Connected) UBE (Upper Byte Enable) 3-state When bus master (output) The signal output from this pin changes according to the input value of the B/W pin. • Byte transfer mode (B/W = 0) UBE is always high impedance. • Word transfer mode (B/W = 1) Indicates that valid data is either in pins D0 to D7 or pins A16D8 to A23D15 (or both). UBE A0 0 0 0 1 1 0 1 1 D0 to D7 A16D8 to A23D15 × × × × When bus slave (input) UBE pin becomes input, and indicates that valid data is either in pins D0 to D7 or pins A16D8 to A23D15. UBE A0 D0 to D7 A16D8 to A23D15 0 0 0 1 1 0 × 1 1 × × × 7 µPD72107 Pin Name B/W SDIP QFP QFJ Pin No. Pin No. Pin No. 11 24 12 I/O Active Function Level I L/H (Byte/Word) Specifies the data bus that accesses the external memory when bus master. B/W = 0 Byte units (8 bits) B/W = 1 Word units (16 bits) After power-on, fix the status of the B/W pin. In the case of word access, the lower data bus is the contents data of even addresses. READY 59 4 63 I H An input signal that is used to extend the MRD and MWR signal widths output by the µPD72107 to (Ready) adapt to low-speed memory. When the READY signal is low level, the MRD and MWR signals maintain active low. Do not change the READY signal at any time other than the specified setup/ hold time. HLDRQ 57 2 61 O H A hold request signal to the external host processor. When a DMA operation is performed in the µPD72107, (Hold Request) this signal is activated to switch from bus slave to bus master. HLDAK 58 3 62 I H A hold acknowledge signal from the external host processor. When the µPD72107 detects that this (Hold Acknowledge) signal is active, the bus slave switches to bus master, and a DMA operation is started. AEN 61 6 65 O H (Address Enable) When bus master, this signal enables the latched higher addresses and outputs them to system address bus. This signal is also used for disabling other system bus drivers. A0, A1 15, 16 30, 31 17, 18 I/O – 3-state Bidirectional 3-state address lines. When bus master (output) Indicate the lower 2-bit addresses of memory access. When bus slave (input) Input addresses when the external host processor I/O accesses the µPD72107. A2 to A15 17 to 30 32 to 47 (except 40, 41) 19 to 32 O 3-state – When bus master Output bit 2 to bit 15 of memory access addresses. When bus slave Become high impedance. 8 µPD72107 SDIP Pin Name A16D8 to A23D15 QFP QFJ Pin No. Pin No. Pin No. 31 to 38 48 to 58 33 to 41 Active I/O I/O – (except 50, (except 35) 3-state 39 to 46 59 to 67 Bidirectional 3-state address/data buses. Multiplex pins of the higher 16 bits to 23 bits of addresses 51, 55) D0 to D7 Function Level and the higher 8 bits to 15 bits of data. 42 to 49 (except 61) I/O – 3-state Bidirectional 3-state data buses. When bus master When writing to external memory, these pins become input if reading at output. When bus slave Usually, these pins become high impedance. When the external host processor reads I/O of the µPD72107, the internal register data is output. CRQ 62 8 66 I H A signal requesting command execution to the (Command µPD72107 by the external host processor. The Request) µPD72107 starts fetching commands from on the external memory at the rising edge of this signal. INT 55 78 59 O H An interrupt signal from the µ PD72107 to the 56 79 60 I H A signal inactivating the INT signal being output by (Interrupt) CLRINT external host processor. the µPD72107. The µPD72107 generates the CLRINT (Clear Interrupt) signal in the LSI internal circuit at the rising edge of this signal, and forcibly makes the INT output signal low. CTS (Clear To Send) 6 18 8 I – A general-purpose input pin. The µPD72107 reports the “CTS pin change detection status” to the external host processor when the input level of this pin is changed in the generalpurpose input/output pin support (setting RSSL to 1 by the “system initialization command”). The change of input level is recognized only when the same level is sampled twice in succession after sampling in 8-ms cycles and detecting the change. Moreover, when the external host processor issues a “general-purpose input/output pin read command” to the µPD72107, the µPD72107 reports the pin information of this pin to the external host processor by a “general-purpose input/output pin read response status”. The change can be detected even in the clock input stop status of TxC and RxC. 9 µPD72107 SDIP Pin Name RTS QFP QFJ Pin No. Pin No. Pin No. 64 10 68 Active I/O O Function Level – (Request To Send) A general-purpose output pin. The output value of this pin can be changed by issuing an “RTS pin write command” from the external host processor to the µPD72107. Moreover, when the external host processor issues a “general-purpose input/output pin read command” to the µPD72107, the µPD72107 reports the pin information of this pin to the external host processor by a “general-purpose input/output pin read response status”. CD 63 9 67 I – A general-purpose input pin. The µPD72107 reports the “CD pin change detection (Carrier Detect) status” to the external host processor when the input level of this pin is changed in the generalpurpose input/output pin support (setting RSSL to 1 by the “system initialization command”). The change of input level is recognized only when the same level is sampled twice in succession after sampling in 8-ms cycles and detecting the change. Moreover, when the external host processor issues a “general-purpose input/output pin read command” to the µPD72107, the µPD72107 reports the pin information of this pin to the external host processor by a “general-purpose input/output pin read response status”. The change can be detected even in the clock input stop status of TxC and RxC. TxD 5 17 7 O – A serial transmit data output pin. 4 16 6 I/O – When CLK is set to 01 or 10 by “operation mode (Transmit Data) TxC (Transmit Clock) 3-state setting LCW” (output) Outputs a clock that divides by 16 the input signal of the RxC pin or CLK pin made by the µPD72107. Caution TxC becomes input because CLK = 00 is the default after reset. It becomes output after setting CLK to 01 or 10 by “operation mode setting LCW”. When CLK is set to 00 by “operation mode setting LCW” (input) Inputs transmit clock externally. Remark LCW: abbreviation for Link Command Word 10 µPD72107 SDIP QFP QFJ Active Pin Name I/O RxD Function Pin No. Pin No. Pin No. Level 3 14 4 I – A serial receive data input pin. 2 13 3 I – When CLK is set to 01 or 10 by “operation mode (Receive Data) RxC (Receive Clock) setting LCW” Sixteen times the clock input of the transmit/receive clock for the on-chip DPLL of the µ PD72107 When CLK is set to 00 by “operation mode setting LCW” One time the clock input of the receive clock Remark LCW: abbreviation for Link Command Word 1.2 Pin Status after Reset of µ PD72107 The status of the output pins and input/output pins after reset in the µ PD72107 is as shown in Table 1-1. Table 1-1. Pin Status after Reset Pin Number I/O During Reset TxC I/O Note High impedance TxD O H I/O Note High impedance O Note High impedance A16D8 to A23D15 I/O Note High impedance D0 to D7 I/O Note High impedance MRD O Note High impedance High impedance Pin Name 64-pin SDIP 80-pin QFP 68-pin QFJ 4 16 6 5 17 7 15, 16 30, 31 17, 18 17 to 30 32 to 47 (except 40, 41) 19 to 32 31 to 38 48 to 58 (except 50, 51, 55) 33 to 41 (except 35) 39 to 46 59 to 67 (except 61) 42 to 49 52 75 56 A0, A1 A2 to A15 53 76 57 MWR O Note 54 77 58 UBE I/O Note High impedance 55 78 59 INT O L 57 2 61 HLDRQ O L 60 5 64 ASTB O L 61 6 65 AEN O L 64 10 68 RTS O H Note 3-state Remarks 1. The status after reset is released is the same as the status during reset. 2. Input low level to the RESET pin for more than 7 clocks of the system clock. 11 µPD72107 2. ELECTRICAL SPECIFICATIONS Absolute Maximum Ratings (TA = +25°C) Parameter Symbol Conditions Ratings Unit –0.5 to +7.0 V Power supply voltage VDD Input voltage VI –0.5 to V DD + 0.3 V Output voltage VO –0.5 to V DD + 0.3 V Operating ambient temperature TA –40 to +85 °C Storage temperature Tstg –40 to +125 °C Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any parameter. That is, the absolute maximum ratings are rated values at which the product is on the verge of suffering physical damage, and therefore the product must be used under conditions that ensure that the absolute maximum ratings are not exceeded. DC Characteristics (TA = –40 to +85°C, VDD = 5 V ±10%) Parameter Input voltage, low Symbol Conditions MIN. TYP. MAX. Unit VILC CLK pin –0.5 +0.8 V VIL Other pins –0.5 +0.8 V VIHC CLK and PU pins +3.3 VDD + 0.3 V VIH Other pins +2.2 VDD + 0.3 V Output voltage, low VOL I OL = 2.5 mA 0.4 V Output voltage, high VOH I OH = –400 µA Power supply current I DD At operation Input leakage current I LI Output leakage current I LO Input voltage, high 0.7 × V DD V 20 50 mA 0 V ≤ V IN ≤ V DD ±10 µA 0 V ≤ V OUT ≤ VDD ±10 µA Capacitance (TA = +25°C, VDD = 0 V) Parameter Symbol Conditions MIN. TYP. MAX. Unit Input capacitance CI f C = 1 MHz – 8 15 pF Output capacitance CO Unmeasured pins returned to 0 V – 8 15 pF I/O capacitance CIO – 8 20 pF 12 µPD72107 AC Characteristics (TA = –40 to +85°C, VDD = 5 V ±10%) When bus master (1) Parameter Symbol Conditions MIN. MAX. Unit 1000 ns CLK cycle time t CYK 121 CLK low-level time t KKL 50 ns CLK high-level time t KKH 50 ns CLK rise time t KR 1.5 – 3.0 V 10 ns CLK fall time t KF 3.0 – 1.5 V 10 ns Load condition DUT CL = 50 pF CL includes jig capacitance. Caution If the load capacitance exceeds 50 pF due to the configuration of the circuit, keep the load capacitance of this device to within 50 pF by inserting a buffer or by some other means. Remark DUT: device under test AC test input/output waveform (except clock) 2.4 V 2.2 V 2.2 V Test points 0.8 V 0.8 V 0.4 V System clock tKF tKR tKKL 3.0 V CLK 1.5 V tKKH tCYK 13 µPD72107 When bus master (2) Parameter Symbol Conditions MIN. MAX. Unit HLDRQ ↑ delay time (vs. CLK ↓) t DHQH 100 ns HLDRQ ↓ delay time (vs. CLK ↑) t DHQL 100 ns HLDAK setup time (vs. CLK ↑) t SHA 35 ns HLDAK hold time (vs. CLK ↑) t HHA 20 ns AEN ↑ delay time (vs. CLK ↓) t DAEH 100 ns AEN ↓ delay time (vs. CLK ↑) t DAEL 100 ns ASTB ↑ delay time (vs. CLK ↑) t DSTH 70 ns ASTB high-level width t STSTH ASTB ↓ delay time (vs. CLK ↓) t DSTL 100 ns ADR/UBE/MRD/MWR delay time (vs. CLK ↑) t DA 100 ns ADR/UBE/MRD/MWR float time (vs. CLK ↑) t FA 70 ns ADR setup time (vs. ASTB ↓) t SAST t KKH–35 ns ADR hold time (vs. ASTB ↓) t HSTA t KKL –20 ns MRD ↓ delay time (vs. ADR float) t DAR 0 ns MRD ↓ delay time (vs. CLK ↑) t DRL MRD low-level width t RRL2 MRD ↑ delay time (vs. CLK ↑) t DRH Data setup time (vs. MRD ↑) t SDR 100 ns Data hold time (vs. MRD ↑) t HRD 0 ns MWR ↓ delay time (vs. CLK ↑) t DWL MWR low-level width t WWL2 MWR ↑ delay time (vs. CLK ↑) t DWH READY setup time (vs. CLK ↑) t SRY 35 ns READY hold time (vs. CLK ↑) t HRY 20 ns 14 t KKH–15 ns 70 2t CYK–50 ns ns 70 70 2t CYK–50 ns ns ns 70 ns When bus master CLK tDHQL tDHQH HLDRQ tSHA tHHA tHHA HLDAK tDAEH tDAEL AEN tDSTL tDSTH ASTB tSTSTH A16D8-A23D15 Hi-Z Address tSAST A0, A1/A2-A15 UBE tDA Hi-Z Output data tHSTA Hi-Z Hi-Z Address tWWL2 MWR Hi-Z Hi-Z tDWL tHRY tHRY tDWH READY tFA A16D8-A23D15 tSRY Hi-Z tSRY Address tDAR tSDR tHRD tDRH Hi-Z MRD 15 tRRL2 tDRL tFA Hi-Z µPD72107 tDA Hi-Z Input data µPD72107 When bus slave (1) Parameter Symbol Conditions MIN. MAX. Unit IOWR low-level width tWWL 100 ns CS low-level hold time (vs. IOWR ↑) t HWCS 0 ns ADR/UBE/CS low-level setup time (vs. IOWR ↓) tSAW 0 ns ADR/UBE hold time (vs. IOWR ↑) t HWA 0 ns Data setup time (vs. IOWR ↑) t SDW 100 ns Data hold time (vs. IOWR ↑) t HWD 0 ns IORD low-level width t RRL 150 ns ADR/CS low-level setup time (vs. IORD ↓) tSAR 35 ns ADR/CS low-level hold time (vs. IORD ↑) t HRA 0 ns Data delay time (vs. IORD ↓) t DRD Data float time (vs. IORD ↑) t FRD 10 RESET low-level width t RSTL 7tCYK ns VDD setup time (vs. RESET ↑) t SVDD 1000 ns RESET ↑ –1st • IOWR/IORD tSYWR 2tCYK ns IOWR/IORD recovery time t RVWR 200 ns 16 120 ns 100 ns µPD72107 When bus slave CS tSAW tWWL tHWCS IOWR tHWA A0-A23 UBE tSDW tHWD D0-D15 CS A0-A23 tSAR tHRA tRRL IORD tDRD D0-D15 tFRD Hi-Z VDD Hi-Z tSVDD tRSTL RESET tSYWR IORD/IOWR tRVWR IORD tRVWR tRVWR IOWR tRVWR 17 µPD72107 When bus slave (2) Parameter Symbol Conditions MIN. MAX. Unit IOWR/IORD high-level setup time (vs. HLDAK ↑) tSWR –20 ns IOWR/IORD high-level hold time (vs. AEN ↓) t HWR 100 ns HLDAK tSWR IOWR/IORD AEN tHWR IOWR/IORD When bus slave (3) Parameter Symbol Conditions MIN. MAX. 100 Unit CLRINT high-level width t CLCLH INT ↑ delay time (vs. CLK ↑) t DIH 100 ns INT ↓ delay time (vs. CLRINT ↑) t DIL 100 ns CRQ high-level width t CRCRH 100 CLK CLRINT tCLCLH INT tDIH tDIL CRQ tCRCRH 18 ns ns µPD72107 Serial block (1) Parameter Symbol Conditions When on-chip DPLL is not used MIN. MAX. Unit 250 DC ns TxC/RxC cycle time t CYS TxC/RxC low-level time t SSL 110 ns TxC/RxC high-level time tSSH 110 ns TxC/RxC rise time t SR 20 ns TxC/RxC fall time t SF 12 ns TxD delay time (vs. TxC ↓) t DTXD 100 ns RxD setup time (vs. RxC ↑) t SRXD 50 ns RxD hold time (vs. RxC ↑) t HRXD 70 ns Serial clock (when on-chip DPLL is not used) tSF tSR tSSL 2.2 V TxC/RxC tSSH 0.8 V tCYS TxC (input) tDTXD tDTXD TxD RxC tSRXD tHRXD RxD 19 µPD72107 Serial block (2) Parameter Symbol RxC cycle time Conditions t CYR MIN. MAX. When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) 30.3 125 1000 Unit ns RxC low-level time t SSRL When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) 10 50 ns RxC high-level time t SSRH When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) 10 50 ns RxC rise time t SRR When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) 5 10 ns RxC fall time t SRF When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) 5 10 ns Transmit/receive data cycle t CYD When on-chip DPLL is used (source clock = RxC) When on-chip DPLL is used (source clock = CLK) TxC low-level time t TCTCL TxC high-level time t TCTCH TxD delay time (vs. TxC ↓) t DTCTD TxD hold time (vs. TxC ↑) t HTCTD When on-chip DPLL is used ns 16000 0.5tCYD–25 ns 0.5tCYD–25 ns 50 0.5tCYD–25 Serial clock (when on-chip DPLL is used) tCYR tSSRL tSSRH tSRF tSRR RxC TxC tTCTCL tTCTCH tDTCTD tHTCTD TxD tCYD 20 500 2000 ns ns µPD72107 Serial block (3) Parameter Symbol Conditions MIN. MAX. Unit RTS ↑ delay time (vs. CLK ↑) t DRTH 100 ns RTS ↓ delay time (vs. CLK ↑) t DRTL 100 ns CD setup time (vs. CLK ↑) t SCD 35 ns CD hold time (vs. CLK ↑) t HCD 20 ns CTS setup time (vs. CLK ↑) t SCT 35 ns CTS hold time (vs. CLK ↑) t HCT 20 ns CLK RTS tDRTL tDRTH tHCD CD tSCD tHCT CTS tSCT 21 µPD72107 3. APPLICATION CIRCUIT EXAMPLE (1) Connection with SIFC (µ PD98201) µ PD72107 µPD98201 TxD BINA RxD BOUT1 TxC BCLK LAP-B SIFC RxC 22 Local memory 64 Kbytes RD Host processor MEMR MEMW IOR IOW WR CS UBE A0-A15 D0-D15 µ PD72107 MRD MWR IORD IOWR CS A B µ PD71086 OE Decoder AB0-AB7 AB8-AB15 A B µ PD71086 OE A0-A15 A0-A15 4. SYSTEM CONFIGURATION EXAMPLES µPD72107 System Configuration Example (Local Memory Type) D0-D7 AB16-AB19 BHE DB0-DB15 A B µ PD71086 OE A B µ PD71086 OE A16D8-A23D15 UBE D0-D15 AEN INT Local bus request HLDRQ HLDAK 23 µPD72107 WAIT INT Access contention resolution circuit 24 µ PD72107 System Configuration Example (Main Memory Sharing Type) µ PD72107 Host processor µ PD70116 µ PD71059 INT INTAK INT INTAK INT INTP CS A0 IORD IOWR CS MRD MWR HLDRQ HLDAK AEN ASTB RD WR D0-D7 RD WR HLDRQ HLDAK ASTB A16-A19 D0-D7 Decoder STB OE OE STB µ PD71082 A16-A19 A16D8-A23D15 AD8-AD15 µ PD71082×3 A0-A15 A0-A15 AD0-AD7 UBE UBE BUF R/W BUFEN D8-D15 µ PD71086×2 T OE D0-D7 RD WR CS UBE D0-D7 D8-D15 Memory µPD72107 µPD72107 5. PACKAGE DRAWINGS 64 PIN PLASTIC SHRINK DIP (750 mil) 64 33 1 32 A K J L I H F D C N B M R M G NOTES 1. Controlling dimension millimeter. 2. Each lead centerline is located within 0.17 mm (0.007 inch) of its true position (T.P.) at maximum material condition. 3. Item "K" to center of leads when formed parallel. ITEM MILLIMETERS INCHES A 58.0 +0.68 –0.20 2.283 +0.028 –0.008 B 1.78 MAX. 0.070 MAX. C 1.778 (T.P.) 0.070 (T.P.) D 0.50±0.10 0.020 +0.004 –0.005 F 0.9 MIN. 0.035 MIN. G 3.2±0.3 0.126±0.012 H 0.51 MIN. 0.020 MIN. I 4.05 +0.26 –0.20 0.159 +0.011 –0.008 J 5.08 MAX. 0.200 MAX. K 19.05 (T.P.) 0.750 (T.P.) L 17.0±0.2 0.669 +0.009 –0.008 M 0.25 +0.10 –0.05 0.010 +0.004 –0.003 N 0.17 0.007 R 0 to 15° 0 to 15° P64C-70-750A,C-3 25 µPD72107 80 PIN PLASTIC QFP (14x14) A B 41 40 60 61 detail of lead end C D S R Q 21 20 80 1 F J G I H M K P M N L NOTE Each lead centerline is located within 0.13 mm (0.005 inch) of its true position (T.P.) at maximum material condition. ITEM MILLIMETERS INCHES A 17.2±0.4 0.677±0.016 B 14.0±0.2 0.551 +0.009 –0.008 C 14.0±0.2 0.551 +0.009 –0.008 D 17.2±0.4 0.677±0.016 F 0.825 0.032 G 0.825 0.032 H 0.30±0.10 0.012 +0.004 –0.005 I 0.13 0.005 J 0.65 (T.P.) 0.026 (T.P.) K 1.6±0.2 L 0.8±0.2 M 0.15 +0.10 –0.05 0.063±0.008 0.031 +0.009 –0.008 0.006 +0.004 –0.003 N 0.10 0.004 P 2.7±0.1 0.106 +0.005 –0.004 Q 0.1±0.1 0.004±0.004 R 5°±5° 5°±5° S 3.0 MAX. 0.119 MAX. S80GC-65-3B9-5 26 µPD72107 68 PIN PLASTIC QFJ (950 x 950 mil) A B 68 1 G H C D J E F S U K Q M N M P I NOTES 1. Controlling dimension S T ITEM MILLIMETERS 25.2±0.2 0.992±0.008 B 24.20±0.1 0.953 +0.004 −0.005 C 24.20±0.1 0.953 +0.004 −0.005 D 25.2±0.2 0.992±0.008 E 1.94±0.15 0.076 +0.007 −0.006 F 0.6 0.024 G 4.4±0.2 0.173 +0.009 −0.008 H 2.8±0.2 0.110 +0.009 −0.008 I 0.9 MIN. 0.035 MIN. J 3.4±0.1 0.134 +0.004 −0.005 K 1.27 (T.P.) 0.050 (T.P.) M 0.42±0.08 0.017 +0.003 −0.004 N 0.12 0.005 P 23.12±0.2 0.910 +0.009 −0.008 Q 0.15 0.006 T R 0.8 R 0.031 U 0.22 +0.08 −0.07 0.009 +0.003 −0.004 millimeter. 2. Each lead centerline is located within 0.12 mm of its true position (T.P.) at maximum material condition. INCHES A P68L-50A1-3 27 µPD72107 6. RECOMMENDED SOLDERING CONDITIONS The µ PD72107 should be soldered and mounted under the following recommended conditions. For the details of the recommended soldering conditions, refer to the document Semiconductor Device Mounting Technology Manual (C10535E). For soldering methods and conditions other than those recommended below, contact your NEC sales representative. Surface mounting type • µ PD72107GC-3B9: 80-pin plastic QFP (14 × 14 mm) Soldering Method Soldering Conditions Recommended Condition Symbol Infrared reflow Package peak temperature: 235°C, Time: 30 sec. Max. (at 210°C or higher), Count: three times or less IR35-00-3 VPS Package peak temperature: 215°C, Time: 40 sec. Max. (at 200°C or higher), Count: three times or less VP15-00-3 Wave soldering Solder bath temperature: 260°C, Time: 10 sec. Max., Count: one time, Preheating temperature: 120°C Max. (package surface temperature) WS60-00-1 Partial heating Pin temperature: 300°C Max., Duration: 3 sec. Max. (per pin row) – Caution Do not use different soldering methods together (except for partial heating). • µ PD72107L: 68-pin plastic QFJ (950 × 950 mils) Soldering Method Soldering Conditions Recommended Condition Symbol VPS Package peak temperature: 215°C, Time: 40 sec. Max. (at 200°C or higher), Count: one time Partial heating Pin temperature: 300°C Max., Duration: 3 sec. Max. (per pin row) VP15-00-1 – Insertion type • µ PD72107CW: 64-pin plastic shrink DIP (750 mils) Soldering Method Soldering Conditions Wave soldering (pin only) Solder bath temperature: 260°C Max., Time: 10 sec. Max. Partial heating Pin temperature: 300°C Max., Duration: 3 sec. Max. (per a pin) Caution Wave soldering must be applied only to pins. Be sure to avoid jet soldering the package body. 28 µPD72107 [MEMO] 29 µPD72107 [MEMO] 30 µPD72107 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS device behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function. 31 µPD72107 The export of this product from Japan is prohibited without governmental license. To export or re-export this product from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales representative. No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product. M4 96.5 2