AD ADG466BRM

a
FEATURES
Fault and Overvoltage Protection up to 640 V
Signal Paths Open Circuit with Power Off
Signal Path Resistance of RON with Power On
44 V Supply Maximum Ratings
Low On Resistance
ADG466/ADG467 60 V typ
1 nA Max Path Current Leakage @ +258C
Low R ON Match (5 V max)
Low Power Dissipation 0.8 mW typ
Latch-Up Proof Construction
APPLICATIONS
ATE Equipment
Sensitive Measurement Equipment
Hot-Insertion Rack Systems
Triple and Octal
Channel Protectors
ADG466/ADG467
FUNCTIONAL BLOCK DIAGRAMS
VDD
VSS
VDD
VD1
VS1
VD1
VS1
VD2
VS2
VD2
VS2
VS3
VD3
VS3
VD8
VS8
VD3
ADG466
VIN
VIN
Each channel protector has an independent operation and consists of an n-channel MOSFET, a p-channel MOSFET and an
n-channel MOSFET, connected in series. The channel protector behaves just like a series resistor during normal operation,
i.e., (VSS + 2 V) < VIN < (VDD – 1.5 V). When a channel’s analog input exceeds the power supplies (including VDD and VSS =
0 V), one of the MOSFETs will switch off, clamping the output
to either VSS + 2 V or VDD – 1.5 V. Circuitry and signal source
protection is provided in the event of an overvoltage or power
loss. The channel protectors can withstand overvoltage inputs
from –40 V to +40 V. See the Circuit Information section of
this data sheet.
The ADG466 and ADG467 can operate off both bipolar and
unipolar supplies. The channels are normally on when power is
connected and open circuit when power is disconnected. With
power supplies of ± 15 V, the on-resistance of the ADG466 and
ADG467
VDD
VOUT
VOUT
VDD
OUTPUT CLAMPED
@ VDD – 1.5V
GENERAL DESCRIPTION
The ADG466 and ADG467 are triple and octal channel protectors, respectively. The channel protector is placed in series
with the signal path. The channel protector will protect sensitive
components from voltage transience in the signal path whether
the power supplies are present or not. Because the channel
protection works whether the supplies are present or not, the
channel protectors are ideal for use in applications where
correct power sequencing can’t always be guaranteed (e.g., hotinsertion rack systems) to protect analog inputs. This is discussed further, and some example circuits are given in the
Applications section of this data sheet.
VSS
ADG467 is 60 Ω typ with a leakage current of ± 1 nA max.
When power is disconnected, the input leakage current is approximately ±5 nA typ.
The ADG466 is available in 8-lead DIP, SOIC and µSOIC
packages. The ADG467 is available in an 18-lead SOIC package
and a 20-lead SSOP package.
PRODUCT HIGHLIGHTS
1. Fault Protection.
The ADG466 and ADG467 can withstand continuous voltage inputs from –40 V to +40 V. When a fault occurs due to
the power supplies being turned off or due to an overvoltage
being applied to the ADG466 and ADG467, the output is
clamped. When power is turned off, current is limited to the
microampere level.
2. Low Power Dissipation.
3. Low RON.
ADG466/ADG467 60 Ω typ.
4. Trench Isolation Latch-Up Proof Construction.
A dielectric trench separates the p- and n-channel MOSFETs
thereby preventing latch-up.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1998
ADG466/ADG467–SPECIFICATIONS
Dual Supply1 (V
DD
= +15 V, VSS = –15 V, GND = 0 V, unless otherwise noted)
Parameter
ADG466
+258C
B1
FAULT PROTECTED CHANNEL
Fault-Free Analog Signal Range2
ADG467
+258C B1
Units
Test Conditions/Comments
V min
V max
Ω typ
Ω max
Ω max
Ω max
Output Open Circuit
5
VSS + 1.2
VDD – 0.8
80
95
6
6
RON
60
∆RON
RON Match
3
4
VSS + 1.2
VDD – 0.8
75
80
4
6
± 0.1
±1
±1
±5
± 0.04
±1
± 0.2
±5
nA typ
nA max
± 0.2
±2
± 0.4
±5
± 0.2
±2
± 0.4
±5
nA typ
nA max
± 0.5
±1
±2
±5
± 0.5
±2
±2
± 10
nA typ
nA max
± 0.005
± 0.015
± 0.1
± 0.5
± 0.006
± 0.015
± 0.16
± 0.5
µA typ
µA max
LEAKAGE CURRENTS
Channel Output Leakage, IS(ON)
(without Fault Condition)
Channel Input Leakage, ID(ON)
(with Fault Condition)
Channel Input Leakage, ID(OFF)
(with Power Off and Fault)
Channel Input Leakage, ID(OFF)
(with Power Off and Output S/C)
POWER REQUIREMENTS
IDD
ISS
VDD/VSS
± 0.05
± 0.5
± 0.05
± 0.5
0
± 20
±8
±8
0
± 20
62
± 0.05
± 0.5
± 0.05
± 0.5
0
± 20
±8
±8
0
± 20
–10 V ≤ VS ≤ +10 V, IS = 1 mA
–5 V ≤ VS ≤ +5 V
VS = ± 10 V, IS = 1 mA
VS = VD = ± 10 V
VS = ± 25 V
VD = Open Circuit
VDD = 0 V, VSS = 0 V
VS = ± 35 V,
VD = Open Circuit
VDD = 0 V, VSS = 0 V
VS = ± 35 V, VD = 0 V
µA typ
µA max
µA typ
µA max
V min
V max
NOTES
1
Temperature range is as follows: B Version: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. A
ADG466/ADG467
ABSOLUTE MAXIMUM RATINGS 1
PIN CONFIGURATIONS
(TA = +25°C unless otherwise noted)
8-Lead
DIP, SOIC
and mSOIC
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44 V
VS, VD, Analog Input Overvoltage with Power ON2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . VSS – 20 V to VDD + 20 V
VS, VD, Analog Input Overvoltage with Power OFF2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–35 V to +35 V
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 mA
(Pulsed at 1 ms, 10% Duty Cycle Max)
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +125°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Plastic DIP Package
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 125°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +260°C
SOIC Package
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 160°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
µSOIC Package
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 160°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
SSOP Package
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 130°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
18-Lead
SOIC
8 VDD
VD1 1
18 VDD
7 VS1
VD2 2
17 VS1
TOP VIEW
VD3 3 (Not to Scale) 6 VS2
VD3 3
16 VS2
VSS 4
VD4 4
VD1 1
VD2 2
ADG466
5 VS3
ADG467
15 VS3
VD5 5
TOP VIEW 14 VS4
(Not to Scale)
VD6 6
13 VS5
12 VS6
VD7 7
VD8 8
11 VS7
VSS 9
10 VS8
20-Lead
SSOP
VD1 1
20 NC
VD2 2
19 VDD
VD3 3
18 VS1
VD4 4
VD5 5
17 VS2
ADG467
16 VS3
TOP VIEW 15
VS4
(Not to Scale)
VD7 7
14 VS5
VD6 6
VD8 8
13 VS6
VSS 9
12 VS7
NC 10
11 VS8
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
Overvoltages at S or D will be clamped by the channel protector, see Circuit
Information section of the data sheet.
NC = NO CONNECT
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Options
ADG466BN
ADG466BR
ADG466BRM
ADG467BR
ADG467BRS
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
8-Lead Plastic DIP
8-Lead Small Outline Package
8-Lead Micro Small Outline Package
18-Lead Small Outline Package
20-Lead Shrink Small Outline Package
N-8
SO-8
RM-8
R-18
RS-20
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG466/ADG467 features proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
REV. A
–3–
WARNING!
ESD SENSITIVE DEVICE
ADG466/ADG467–Typical Performance Characteristics
ADG466
80
POSITIVE OVERVOLTAGE
ON INPUT
RLOAD = 100kV
CLOAD = 100pF
VDD = +10V
VSS = –10V
75
70
65
RON – V
55
15V
VDD, VSS =65V
60
VDD, VSS =615V
10V
VDD, VSS =610V
50
VDD, VSS =613.5V
5V
45
CHANNEL PROTECTOR
OUTPUT
0V
40
35
30
–10
–5V TO +15V STEP INPUT
–5V
616.5V
–5
0
VD – Volts
5
10
Ch1
Figure 1. On Resistance as a Function of VDD and VD
(Input Voltage)
5.00V
Ch2
5.00V
M50.0ns
Ch1
500mV
Figure 4. Positive Overvoltage Transience Response
70
65
VDD = +15V
VSS = –15V
5V
NEGATIVE OVERVOLTAGE
ON INPUT
RLOAD = 100kV
CLOAD = 100pF
VDD = +10V
VSS = –10V
60
0V
55
CHANNEL PROTECTOR
OUTPUT
1258C
RON – V
–5V
50
858C
–10V
45
40
–15V
258C
35
5V TO –15V STEP INPUT
–408C
30
25
–10
–5
0
VD – Volts
5
10
Ch1
Figure 2. On Resistance as a Function of Temperature
and VD (Input Voltage)
5.00V
Ch2
5.00V
M50.0ns
500mV
Figure 5. Negative Overvoltage Transience Response
ADG467
105
10V TO +10 V INPUT
95
65V
85
RON – V
Ch1
RLOAD =100kV
VDD=+5V
VSS=–5V
20V
1
75
VCLAMP=4.5V
615V
65
OUTPUT
613.5V 610V
2
55
45
–10
–5
0
VD – Volts
5
VCLAMP=4V
616.5V
10
Ch1
5.00V
Ch2
5.00V
M100ms
Ch1
500mV
Figure 6. Overvoltage Ramp
Figure 3. On Resistance as a Function of VDD and VD
(Input Voltage)
–4–
REV. A
ADG466/ADG467
0
–12
–10
–14
–20
OFF ISOLATION – dB
–10
GAIN – dB
–16
–18
–20
–22
–24
–30
–40
–50
–60
–70
–80
–26
–90
–28
–30
1M
–100
10k
30M
10M
100k
FREQUENCY – Hz
Figure 7. Frequency Response (Magnitude) of the ADG467,
VDD /VSS = ± 15 V and Input Signal Level of ± 100 mV
1M
FREQUENCY – Hz
10M
40M
Figure 10. Off Isolation of the ADG467, VDD/V SS = 0 V and
Input Signal Level of ± 100 mV
TEK RUN: 5.00GS/s ET SAMPLE
105.359
82.859
11.8ns
PHASE – Degrees
60.359
37.859
1
15.359
–7.141
–29.641
12.2ns
–52.161
–76.641
2
–97.161
100
1k
10k
100k
FREQUENCY – Hz
1M
10M
–10
–10
–20
–14
–30
–18
–40
–22
–50
–26
–60
–70
–90
–42
–100
–46
1M
10M
–50
100k
40M
FREQUENCY – Hz
Figure 9. Crosstalk Between Adjacent Channels of the
ADG467, VDD/VSS = ±15 V and Input Signal Level of ±100 mV
REV. A
2.00V
M 10.0ns
CH1
2.2V
–36
–38
100k
CH2
–30
–80
–110
10k
2.00V
Figure 11. Propagation Delay Through ADG467, VDD/VSS =
± 15 V, Channel 1 Input and Channel 2 Output
GAIN – dB
CROSSTALK – dB
Figure 8. Frequency Response (Phase) of the ADG467,
VDD /VSS = ± 15 V and Input Signal Level of ± 100 mV
CH1
1M
FREQUENCY – Hz
10M
40M
Figure 12. Frequency Response (Magnitude) of the ADG466,
VDD /VSS = ± 15 V and Input Signal Level of ± 100 mV
–5–
105.3
0
82.8
–10
60.3
–20
OFF ISOLATION – dB
PHASE – Degrees
ADG466/ADG467
37.8
15.3
–7.1
–29.6
–52.1
–30
–40
–50
–60
–70
–76.6
–80
–92.1
–90
100
1k
10k
100k
FREQUENCY – Hz
1M
10M
–100
10k
40M
100k
1M
FREQUENCY – Hz
10M
40M
Figure 15. Off Isolation of the ADG466, VDD/V SS = 0 V and
Input Signal Level of ± 100 mV
Figure 13. Frequency Response (Phase) of the ADG466, V DD/
VSS = ± 15 V and Input Signal Level of ± 100 mV
TEK RUN: 2.5GS/s ET SAMPLE
0
–10
22.0ns
CROSSTALK – dB
–20
–30
1
–40
–50
–60
18.0ns
–70
–80
2
–90
–100
10k
100k
1M
FREQUENCY – Hz
10M
40M
CH1
Figure 14. Crosstalk Between Adjacent Channels of the
ADG466, VDD/VSS = ±15 V and Input Signal Level of ±100 mV
1.00V
CH2
1.00V
M 20.0ns
CH1
760V
Figure 16. Propagation Delay Through ADG466, VDD/VSS =
± 15 V, Channel 1 Input and Channel 2 Output
–6–
REV. A
ADG466/ADG467
case of a negative overvoltage the threshold voltage is given by
VSS – VTP where VTP is the threshold voltage of the PMOS device (2 V typ). If the input voltage exceeds these threshold voltages, the output of the channel protector (no load) is clamped at
these threshold voltages. However, the channel protector output
will clamp at a voltage that is inside these thresholds if the output is loaded. For example with an output load of 1 kΩ, VDD =
15 V and a positive overvoltage. The output will clamp at VDD –
VTN – ∆V = 15 V – 1.5 V – 0.6 V = 12.9 V where ∆V is due to I
× R voltage drop across the channels of the MOS devices (see
Figure 19). As can be seen from Figure 19, the current during
fault condition is determined by the load on the output (i.e.,
VCLAMP/RL ). However, if the supplies are off, the fault current is
limited to the nano-ampere level.
CIRCUIT INFORMATION
Figure 17 below shows a simplified schematic of a channel
protector circuit. The circuit is made up of four MOS transistors—two NMOS and two PMOS. One of the PMOS devices
does not lie directly in the signal path but is used to connect the
source of the second PMOS device to its backgate. This has the
effect of lowering the threshold voltage and so increasing the
input signal range of the channel for normal operation. The
source and backgate of the NMOS devices are connected for the
same reason. During normal operation the channel protectors
have a resistance of 60 Ω typ. The channel protectors are very
low power devices, and even under fault conditions the supply
current is limited to sub microampere levels. All transistors are
dielectrically isolated from each other using a trench isolation
method. This makes it impossible to latch up the channel
protectors. For an explanation, see Trench Isolation section.
Figures 18, 20 and 21 show the operating conditions of the
signal path transistors during various fault conditions. Figure 18
shows how the channel protectors operate when a positive overvoltage is applied to the channel protector.
VSS
VDD – VTN*
(+13.5V)
PMOS
POSITIVE
OVERVOLTAGE
(+20V)
NMOS
NMOS
SATURATED
PMOS
VDD
VSS
PMOS
NMOS
NONSATURATED
VDD (+15V)
VDD
VSS (–15V)
NMOS
NONSATURATED
VDD (+15V)
*VTN = NMOS THRESHOLD VOLTAGE (+1.5V)
Figure 17. The Channel Protector Circuit
Figure 18. Positive Overvoltage on the Channel Protector
Overvoltage Protection
The first NMOS transistor goes into a saturated mode of operation as the voltage on its Drain exceeds the Gate voltage (VDD) –
the threshold voltage (VTN). This situation is shown in Figure
19. The potential at the source of the NMOS device is equal to
VDD – VTN. The other MOS devices are in a nonsaturated mode of
operations.
When a fault condition occurs on the input of a channel protector, the voltage on the input has exceeded some threshold voltage set by the supply rail voltages. The threshold voltages are
related to the supply rails as follows. For a positive overvoltage,
the threshold voltage is given by VDD – VT where VTN is the
threshold voltage of the NMOS transistor (1.5 V typ). In the
VD
VG
VS
DV
(VDD =15V)
(+20V)
(+13.5V)
PMOS
N+
OVERVOLTAGE
OPERATION
(SATURATED)
N CHANNEL
EFFECTIVE
SPACE CHARGE
REGION
VT = 1.5V
P–
N+
N+
(VG – VT = 13.5V)
NMOS
NONSATURATED
OPERATION
VCLAMP
RL
IOUT
Figure 19. Positive Overvoltages Operation of the Channel Protector
REV. A
–7–
ADG466/ADG467
TRENCH ISOLATION
When a negative overvoltage is applied to the channel protector
circuit, the PMOS transistor enters a saturated mode of operation as the drain voltage exceeds VSS – VTP. See Figure 20 below. As in the case of the positive overvoltage, the other MOS
devices are nonsaturated.
NEGATIVE
OVERVOLTAGE
(–20V)
NEGATIVE
OVERVOLTAGE
(–20V)
NMOS
The MOS devices that make up the channel protector are isolated from each other by an oxide layer (trench) (see Figure 22).
When the NMOS and PMOS devices are not electrically isolated from each other, there exists the possibility of “latch-up”
caused by parasitic junctions between CMOS transistors. Latchup is caused when P-N junctions that are normally reverse biased become forward biased, causing large currents to flow,
which can be destructive.
VSS – VTP*
(–13V)
NMOS
PMOS
SATURATED
NONSATURATED
VSS (–15V)
VDD (+15V)
CMOS devices are normally isolated from each other by Junction Isolation. In Junction Isolation, the N and P wells of the
CMOS transistors form a diode that is reverse-biased under
normal operation. However, during overvoltage conditions, this
diode becomes forward biased. A Silicon-Controlled Rectifier
(SCR) type circuit is formed by the two transistors causing a
significant amplification of the current that, in turn, leads to
latch-up. With Trench Isolation, this diode is removed; the
result is a latch-up proof circuit.
NONSATURATED
VDD (+15V)
*VTP = PMOS THRESHOLD VOLTAGE (–2V)
Figure 20. Negative Overvoltage on the Channel Protector
The channel protector is also functional when the supply rails
are down (e.g., power failure) or momentarily unconnected
(e.g., rack system). This is where the channel protector has an
advantage over more conventional protection methods such as
diode clamping (see Applications Information). When VDD and
VSS equal 0 V, all transistors are off and the current is limited to
subnano-ampere levels (see Figure 21).
VG
VS
T
R
E
N
C
H
(0V)
POSITIVE OR
NEGATIVE
OVERVOLTAGE
NMOS
PMOS
NMOS
P+
N–
VG
VD
P-CHANNEL
P+
VD
VS
T
R
E
N
C
H
N+
N-CHANNEL
P–
N+
T
R
E
N
C
H
BURIED OXIDE LAYER
SUBSTRATE (BACKGATE)
OFF
VDD (0V)
OFF
VSS (0V)
OFF
VDD (0V)
Figure 22. Trench Isolation
Figure 21. Channel Protector Supplies Equal to Zero Volts
–8–
REV. A
ADG466/ADG467
APPLICATIONS INFORMATION
Overvoltage and Power Supply Sequencing Protection
Again this ensures that signals on the inputs of the CMOS devices never exceed the supplies.
The ADG466 and ADG467 are ideal for use in applications
where input overvoltage protection is required and correct
power supply sequencing cannot always be guaranteed. The
overvoltage protection ensures that the output voltage of the
channel protector will not exceed the threshold voltages set by
the supplies (see Circuit Information) when there is an overvoltage on the input. When the input voltage does not exceed these
threshold voltages, the channel protector behaves like a series
resistor (60 Ω typ). The resistance of the channel protector does
vary slightly with operating conditions (see Typical Performance
Graphs).
High Voltage Surge Suppression
The power sequencing protection is afforded by the fact that
when the supplies to the channel protector are not connected,
the channel protector becomes a high resistance device. Under
this condition all transistors in the channel protector are off and
the only currents that flow are leakage currents, which are at the
µA level.
EDGE
CONNECTOR
+5V
–5V
VDD
The ADG466 and ADG467 are not intended for use in high
voltage applications like surge suppression. The ADG466
and ADG467 have breakdown voltages of VSS – 20 V and
VDD + 20 V on the inputs when the power supplies are connected. When the power supplies are disconnected, the breakdown voltages on the input of the channel protector are ± 35 V.
In applications where inputs are likely to be subject to overvoltages exceeding the breakdown voltages quoted for the channel
protectors, transient voltage suppressors (TVSs) should be used.
These devices are commonly used to protect vulnerable circuits
from electric overstress such as that caused by electrostatic
discharge, inductive load switching and induced lightning. However, TVSs can have a substantial standby (leakage) current
(300 µA typ) at the reverse standoff voltage. The reverse standoff
voltage of a TVS is the normal peak operating voltage of the
circuit. Also TVS offer no protection against latch-up of sensitive
CMOS devices when the power supplies are off. The best solution
is to use a channel protector in conjunction with a TVS to provide
the best leakage current specification and circuit protection.
VDD = +5V
VSS
VSS = –5V
ADC
ANALOG IN
–2.5V TO +2.5V
ADC
ADG466
LOGIC
CONTROL
LOGIC
LOGIC
TVSs
BREAKDOWN
VOLTAGE = 20V
ADG466
GND
Figure 24. High Voltage Protection
Figure 23. Overvoltage and Power Supply Sequencing
Protection
Figure 23 shows a typical application that requires overvoltage
and power supply sequencing protection. The application shows
a Hot-Insertion rack system. This involves plugging a circuit
board or module into a live rack via an edge connector. In this
type of application it is not possible to guarantee correct power
supply sequencing. Correct power supply sequencing means
that the power supplies should be connected before any external
signals. Incorrect power sequencing can cause a CMOS device
to “latch up.” This is true of most CMOS devices regardless of
the functionality. RC networks are used on the supplies of the
channel protector (Figure 23) to ensure that the rest of the
circuitry is powered up before the channel protectors. In this
way, the outputs of the channel protectors are clamped well
below VDD and VSS until the capacitors are charged. The diodes
ensure that the supplies on the channel protector never exceed
the supply rails of the board when it is being disconnected.
REV. A
Figure 24 shows an input protection scheme that uses both a
TVS and channel protector. The TVS is selected with a reverse
standoff voltage that is much greater than operating voltage of
the circuit (TVSs with higher breakdown voltages tend to have
better standby leakage current specifications) but is inside the
breakdown voltage of the channel protector. This circuit protects the circuitry whether the power supplies are present
or not.
–9–
ADG466/ADG467
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
8-Lead Small Outline IC (SO-8)
0.1968 (5.00)
0.1890 (4.80)
0.430 (10.92)
0.348 (8.84)
8
5
0.280 (7.11)
0.240 (6.10)
1
4
0.325 (8.25)
0.300 (7.62)
0.060 (1.52)
0.015 (0.38)
PIN 1
0.210 (5.33)
MAX
SEATING
PLANE
0.022 (0.558) 0.100 0.070 (1.77)
0.014 (0.356) (2.54) 0.045 (1.15)
BSC
0.015 (0.381)
0.008 (0.204)
SEATING
PLANE
0.0688 (1.75)
0.0532 (1.35)
0.0500 0.0192 (0.49)
(1.27) 0.0138 (0.35)
BSC
0.0196 (0.50)
x 45°
0.0099 (0.25)
0.0098 (0.25)
0.0075 (0.19)
8°
0°
0.0500 (1.27)
0.0160 (0.41)
11
1
10
0.212 (5.38)
0.205 (5.21)
20
0.311 (7.9)
0.301 (7.64)
0.4193 (10.65)
0.3937 (10.00)
0.2992 (7.60)
0.2914 (7.40)
10
0.1043 (2.65)
0.0926 (2.35)
0.0291 (0.74)
x 45°
0.0098 (0.25)
8°
0.0500 0.0192 (0.49)
0°
(1.27) 0.0138 (0.35) SEATING 0.0125 (0.32)
PLANE
BSC
0.0091 (0.23)
0.07 (1.78)
0.066 (1.67)
0.078 (1.98) PIN 1
0.068 (1.73)
0.0500 (1.27)
0.0157 (0.40)
0.008 (0.203)
0.002 (0.050)
0.0256
(0.65)
BSC
SEATING 0.009 (0.229)
PLANE
0.005 (0.127)
8°
0°
0.037 (0.94)
0.022 (0.559)
8-Lead Micro Small Outline IC (RM-8)
0.122 (3.10)
0.114 (2.90)
8
5
0.199 (5.05)
0.187 (4.75)
0.122 (3.10)
0.114 (2.90)
1
4
PRINTED IN U.S.A.
0.0118 (0.30)
0.0040 (0.10)
0.2440 (6.20)
0.2284 (5.80)
0.295 (7.50)
0.271 (6.90)
9
PIN 1
4
20-Lead Shrink Small Outline Package (RS-20)
0.4625 (11.75)
0.4469 (11.35)
1
5
1
0.0098 (0.25)
0.0040 (0.10)
18-Lead Small Outline IC (R-18)
18
8
PIN 1
0.195 (4.95)
0.115 (2.93)
0.130
(3.30)
MIN
0.160 (4.06)
0.115 (2.93)
0.1574 (4.00)
0.1497 (3.80)
C2207a–0–5/98
8-Lead Plastic DIP (N-8)
PIN 1
0.0256 (0.65) BSC
0.120 (3.05)
0.112 (2.84)
0.043 (1.09)
0.037 (0.94)
0.006 (0.15)
0.002 (0.05)
SEATING
PLANE
0.120 (3.05)
0.112 (2.84)
0.018 (0.46)
0.008 (0.20)
0.011 (0.28)
0.003 (0.08)
–10–
33°
27°
0.028 (0.71)
0.016 (0.41)
REV. A