ALSC AS29LV160T

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• Organization: 2M×8 / 1M×16
• Sector architecture
- One 16K; two 8K; one 32K; and thirty-one 64K byte sectors
- One 8K; two 4K; one 16K; and thirty-one 32K word sectors
- Boot code sector architecture—T (top) or B (bottom)
- Erase any combination of sectors or full chip
• Single 2.7-3.6V power supply for read/write operations
• Sector protection
• High speed 70/80/90/120 ns address access time
• Automated on-chip programming algorithm
- Automatically programs/verifies data at specified address
• Automated on-chip erase algorithm
- Automatically preprograms/erases chip or specified
sectors
• Hardware RESET pin
- Resets internal state machine to read mode
3LQDUUDQJHPHQW
48-pin TSOP
Erase voltage
generator
Input/output
buffers
Reset
VSS
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
VSS
OE
DQ0
DQ8
DQ1
DQ9
DQ2
DQ10
DQ3
DQ11
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
RESET
Program/erase
control
BYTE
Command
register
Program voltage
generator
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STB
Chip enable
Output enable
Logic
CE
OE
STB
Timer
Data latch
Y decoder
Y gating
X decoder
Cell matrix
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
VCC detector
Address latch
WE
DQ0–DQ15 (A-1)
44-pin SO
A15
A14
A13
A12
A11
A10
A9
A8
A19
NC
WE
RESET
NC
NC
RY/BY
A18
A17
A7
A6
A5
A4
A3
A2
A1
RY/BY
VCC
Sector protect/
erase voltage
switches
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
WE
A19
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
A16
BYTE
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE
VSS
CE
A0
A0–A19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
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• Low power consumption
- 200 nA typical automatic sleep mode current
- 200 nA typical standby current
- 10 mA typical read current
• JEDEC standard software, packages and pinouts
- 48-pin TSOP
- 44-pin SO (availability TBD)
• CFI (Common Flash Interface) compliant
• Detection of program/erase cycle completion
- DQ7 DATA polling
- DQ6 toggle bit
- RY/BY output
• Erase suspend/resume
- Supports reading data from or programming data to a
sector not being erased
• Low VCC write lock-out below 1.5V
• 10 year data retention at 150C
• 100,000 write/erase cycle endurance
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29LV160-70
29LV160-80
29LV160-90
29LV160-120
Unit
Maximum access time
tAA
70
80
90
120
ns
Maximum chip enable access time
tCE
70
80
90
120
ns
Maximum output enable access time
tOE
30
30
35
50
ns
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The AS29LV160 is a 16 megabit, 3.0 volt Flash memory organized as 2 Megabyte of 8 bits/1 Megabyte of 16 bits each. For
flexible erase and program capability, the 8 megabits of data is divided into thirty-five sectors: one 16K, two 8K, one 32K, and
thirty-one 64k byte sectors; or one 8K, two 4K, one 16K, and thirty-one 32K word sectors. The ×8 data appears on DQ0–DQ7;
the ×16 data appears on DQ0–DQ15. The AS29LV160 is offered in JEDEC standard 48-pin TSOP, 48-pin BGA, and 44-pin SO
(availability TBD) packages. This device is designed to be programmed and erased in-system with a single 3.0V VCC supply. The
device can also be reprogrammed in standard EPROM programmers.
The AS29LV160 offers access times of 70/80/90/120 ns, allowing 0-wait state operation of high speed microprocessors. To
eliminate bus contention the device has separate chip enable (CE), write enable (WE), and output enable (OE) controls. Word
mode (×16 output) is selected by BYTE = high. Byte mode (×8 output) is selected by BYTE = low.
The AS29LV160 is fully compatible with the JEDEC single power supply Flash standard. Write commands are sent to the
command register using standard microprocessor write timings. An internal state-machine uses register contents to control the
erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase
operations. Read data from the device occurs in the same manner as other Flash or EPROM devices. Use the program command
sequence to invoke the automated on-chip programming algorithm that automatically times the program pulse widths and
verifies proper cell margin. Use the erase command sequence to invoke the automated on-chip erase algorithm that preprograms
the sector (if it is not already programmed before executing the erase operation), times the erase pulse widths, and verifies
proper cell margin.
Boot sector architecture enables the system to boot from either the top (AS29LV160T) or the bottom (AS29LV160B) sector.
Sector erase architecture allows specified sectors of memory to be erased and reprogrammed without altering data in other
sectors. A sector typically erases and verifies within 1.0 seconds. Hardware sector protection disables both program and erase
operations in all, or any combination of, the nineteen sectors. The device provides true background erase with Erase Suspend,
which puts erase operations on hold to either read data from, or program data to, a sector that is not being erased. The chip erase
command will automatically erase all unprotected sectors.
A factory shipped AS29LV160 is fully erased (all bits = 1). The programming operation sets bits to 0. Data is programmed into
the array one byte at a time in any sequence and across sector boundaries. A sector must be erased to change bits from 0 to 1.
Erase returns all bytes in a sector to the erased state (all bits = 1). Each sector is erased individually with no effect on other
sectors.
The device features single 3.0V power supply operation for Read, Write, and Erase functions. Internally generated and regulated
voltages are provided for the Program and Erase operations. A low VCC detector automatically inhibits write operations during
power transtitions. The RY/BY pin, DATA polling of DQ7, or toggle bit (DQ6) may be used to detect end of program or erase
operations. The device automatically resets to the read mode after program/erase operations are completed. DQ2 indicates which
sectors are being erased.
The AS29LV160 resists accidental erasure or spurious programming signals resulting from power transitions. Control register
architecture permits alteration of memory contents only after successful completion of specific command sequences. During
power up, the device is set to read mode with all program/erase commands disabled when VCC is less than VLKO (lockout
voltage). The command registers are not affected by noise pulses of less than 5 ns on OE, CE, or WE. To initiate write commands,
CE and WE must be logical zero and OE a logical 1.
When the device’s hardware RESET pin is driven low, any program/erase operation in progress is terminated and the internal
state machine is reset to read mode. If the RESET pin is tied to the system reset circuitry and a system reset occurs during an
automated on-chip program/erase algorithm, data in address locations being operated on may become corrupted and requires
rewriting. Resetting the device enables the system’s microprocessor to read boot-up firmware from the Flash memory.
The AS29LV160 uses Fowler-Nordheim tunnelling to electrically erase all bits within a sector simultaneously. Bytes are
programmed one at a time using EPROM programming mechanism of hot electron injection.
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Mode
CE
OE
WE
A0
A1
A6
A9
RESET
ID read MFR code
L
L
H
L
L
L
VID
H
Code
ID read device code
L
L
H
H
L
L
VID
H
Code
Read
L
L
H
A0
A1
A6
A9
H
DOUT
Standby
H
X
X
X
X
X
X
H
High Z
Output disable
L
H
H
X
X
X
X
H
High Z
Write
L
H
L
A0
A1
A6
A9
H
DIN
Enable sector protect
L
VID
Pulse/L
L
H
L
VID
H
X
Sector unprotect
L
VID
Pulse/L
L
H
H
VID
H
X
Temporary sector
unprotect
X
X
X
X
X
X
X
VID
X
L
L
H
L
H
L
VID
H
Code
L
L
H
L
H
H
VID
H
Code
X
X
X
X
X
X
X
L
High Z
Verify sector protect†
Verify sector unprotect
†
Hardware Reset
DQ
L = Low (<VIL) = logic 0; H = High (>VIH) = logic 1; VID = 10.0 ± 1.0V; X = don’t care.
In ×16 mode, BYTE = VIH. In ×8 mode, BYTE = VIL with DQ8-DQ14 in high Z and DQ15 = A-1.
†Verification of sector protect/unprotect during A9 = V
ID.
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Item
Description
ID MFR code,
device code
Selected by A9 = VID(9.5V–10.5V), CE = OE = A1 = A6 = L, enabling outputs.
When A0 is low (VIL) the output data = 52h, a unique Mfr. code for Alliance Semiconductor Flash products.
When A0 is high (VIH), DOUT represents the device code for the AS29LV160.
Read mode
Selected with CE = OE = L, WE = H. Data is valid in tACC time after addresses are stable, tCE after CE is low
and tOE after OE is low.
Standby
Selected with CE = H. Part is powered down, and ICC reduced to <1.0 µA when CE = VCC ± 0.3V = RESET. If
activated during an automated on-chip algorithm, the device completes the operation before entering
standby.
Output disable
Part remains powered up; but outputs tri-stated with OE pulled high.
Write
Selected with CE = WE = L, OE = H. Accomplish all Flash erasure and programming through the command
register. Contents of command register serve as inputs to the internal state machine. Address latching occurs
on the falling edge of WE or CE, whichever occurs later. Data latching occurs on the rising edge WE or CE,
whichever occurs first. Filters on WE prevent spurious noise events from appearing as write commands.
Enable
sector protect
Hardware protection circuitry implemented with external programming equipment causes the device to
disable program and erase operations for specified sectors. For in-system sector protection, refer to Sector
protect algorithm on page 15.
Disables sector protection for all sectors using external programming equipment. All sectors must be
Sector unprotect protected prior to sector unprotection. For in-system sector unprotection, refer to Sector unprotect
algorithm on page 15.
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Item
Description
Verify sector
protect/
unprotect
Verifies write protection for sector. Sectors are protected from program/erase operations on commercial
programming equipment. Determine if sector protection exists in a system by writing the ID read command
sequence and reading location XXX02h, where address bits A12–18 select the defined sector addresses. A
logical 1 on DQ0 indicates a protected sector; a logical 0 indicates an unprotected sector.
Temporarily disables sector protection for in-system data changes to protected sectors. Apply +10V to RESET
Temporary
to activate temporary sector unprotect mode. During temporary sector unprotect mode, program protected
sector unprotect sectors by selecting the appropriate sector address. All protected sectors revert to protected state on removal
of +10V from RESET.
RESET
Resets the interal state machine to read mode. If device is programming or erasing when RESET = L, data
may be corrupted.
Deep
power down
Hold RESET low to enter deep power down mode (<1 µA). Recovery time to start of first read cycle is 50ns.
Enabled automatically when addresses remain stable for 300ns. Typical current draw is 1 µA with no current
Automatic sleep drawn by the external devices from teh output pin. Existing data is available to the system during this mode.
mode
If an address is changed, automatic sleep mode is disabled and new data is returned within standard access
times.
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Bottom boot sector architecture (AS29LV160B)
Top boot sector architecture (AS29LV160T)
Sector
×8
×16
Size
(Kbytes)
×8
×16
Size
(Kbytes)
0
000000-003FFF
00000-01FFF
16
000000-00FFFF
00000-07FFF
64
1
004000-005FFF
02000-02FFF
8
010000-01FFFF
08000-0FFFF
64
2
006000-007FFF
03000-03FFF
8
020000-02FFFF
10000-17FFF
64
3
008000-00FFFF
04000-07FFF
32
030000-03FFFF
18000-1FFFF
64
4
010000-01FFFF
08000-0FFFF
64
040000-04FFFF
20000-27FFF
64
5
020000-02FFFF
10000-17FFF
64
050000-05FFFF
28000-2FFFF
64
6
030000-03FFFF
18000-1FFFF
64
060000-06FFFF
30000-37FFF
64
7
040000-04FFFF
20000-27FFF
64
070000-07FFFF
38000-3FFFF
64
8
050000-05FFFF
28000-2FFFF
64
080000-08FFFF
40000-47FFF
64
9
060000-06FFFF
30000-37FFF
64
090000-09FFFF
48000-4FFFF
64
10
070000-07FFFF
38000-3FFFF
64
0A0000-0AFFFF
50000-57FFF
64
11
080000-08FFFF
40000-47FFF
64
0B0000-0BFFFF
58000-5FFFF
64
12
090000-09FFFF
48000-4FFFF
64
0C0000-0CFFFF
60000-67FFF
64
13
0A0000-0AFFFF
50000-57FFF
64
0D0000-0DFFFF
68000-6FFFF
64
14
0B0000-0BFFFF
58000-5FFFF
64
0E0000-0EFFFF
70000-77FFF
64
15
0C0000-0CFFFF
60000-67FFF
64
0F0000-0FFFFF
78000-7FFFF
64
16
0D0000-0DFFFF
68000-6FFFF
64
100000-10FFFF
80000-87FFF
64
17
0E0000-0EFFFF
70000-77FFF
64
110000-11FFFF
88000-8FFFF
64
18
0F0000-0FFFFF
78000-7FFFF
64
120000-12FFFF
90000-97FFF
64
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Bottom boot sector architecture (AS29LV160B)
Top boot sector architecture (AS29LV160T)
Sector
×8
×16
Size
(Kbytes)
×8
×16
Size
(Kbytes)
19
100000-10FFFF
80000-87FFF
64
130000-13FFFF
98000-9FFFF
64
20
110000-11FFFF
88000-8FFFF
64
140000-14FFFF
A0000-A7FFF
64
21
120000-12FFFF
90000-97FFF
64
150000-15FFFF
A8000-AFFFF
64
22
130000-13FFFF
98000-9FFFF
64
160000-16FFFF
B0000-B7FFF
64
23
140000-14FFFF
A0000-A7FFF
64
170000-17FFFF
B8000-BFFFF
64
24
150000-15FFFF
A8000-AFFFF
64
180000-18FFFF
C0000-C7FFF
64
25
160000-16FFFF
B0000-B7FFF
64
190000-19FFFF
C8000-CFFFF
64
26
170000-17FFFF
B8000-BFFFF
64
1A0000-1AFFFF
D0000-D7FFF
64
27
180000-18FFFF
C0000-C7FFF
64
1B0000-1BFFFF
D8000-DFFFF
64
28
190000-19FFFF
C8000-CFFFF
64
1C0000-1CFFFF
E0000-E7FFF
64
29
1A0000-1AFFFF
D0000-D7FFF
64
1D0000-1DFFFF
E8000-EFFFF
64
30
1B0000-1BFFFF
D8000-DFFFF
64
1E0000-1EFFFF
F0000-F7FFF
64
31
1C0000-1CFFFF
E0000-E7FFF
64
1F0000-1F7FFF
F8000-FBFFF
32
32
1D0000-1DFFFF
E8000-EFFFF
64
1F8000-1F9FFF
FC000-FCFFF
8
33
1E0000-1EFFFF
F0000-F7FFF
64
1FA000-1FBFFF
FD000-FDFFF
8
34
1F0000-1FFFFF
F8000-FFFFF
64
1FC000-1FFFFF
FE000-FFFFF
16
In word mode, there are one 8K word, two 4K word, one 16K word, and fifteen 32K word sectors. Address range is A19–A-1 if BYTE = VIL; address range is
A19–A0 if BYTE = VIH.
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Bottom boot sector architecture
Top boot sector architecture
(AS29LV160B)
(AS29LV160T)
Sector
A19 A18 A17 A16
A15
A14
A13
A12
A19
A18
A17
A16
A15
A14
A13
A12
0
0
0
0
0
0
0
0
X
0
0
0
0
0
X
X
X
1
0
0
0
0
0
0
1
0
0
0
0
0
1
X
X
X
2
0
0
0
0
0
0
1
1
0
0
0
1
0
X
X
X
3
0
0
0
0
0
1
X
X
0
0
0
1
1
X
X
X
4
0
0
0
0
1
X
X
X
0
0
1
0
0
X
X
X
5
0
0
0
1
0
X
X
X
0
0
1
0
1
X
X
X
6
0
0
0
1
1
X
X
X
0
0
1
1
0
X
X
X
7
0
0
1
0
0
X
X
X
0
0
1
1
1
X
X
X
8
0
0
1
0
1
X
X
X
0
1
0
0
0
X
X
X
9
0
0
1
1
0
X
X
X
0
1
0
0
1
X
X
X
10
0
0
1
1
1
X
X
X
0
1
0
1
0
X
X
X
11
0
1
0
0
0
X
X
X
0
1
0
1
1
X
X
X
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Bottom boot sector architecture
Top boot sector architecture
(AS29LV160B)
(AS29LV160T)
Sector
12
0
1
0
0
1
X
X
X
0
1
1
0
0
X
X
X
13
0
1
0
1
0
X
X
X
0
1
1
0
1
X
X
X
14
0
1
0
1
1
X
X
X
0
1
1
1
0
X
X
X
15
0
1
1
0
0
X
X
X
0
1
1
1
1
X
X
X
16
0
1
1
0
1
X
X
X
1
0
0
0
0
X
X
X
17
0
1
1
1
0
X
X
X
1
0
0
0
1
X
X
X
18
0
1
1
1
1
X
X
X
1
0
0
1
0
X
X
X
19
1
0
0
0
0
X
X
X
1
0
0
1
1
X
X
X
20
1
0
0
0
1
X
X
X
1
0
1
0
0
X
X
X
21
1
0
0
1
0
X
X
X
1
0
1
0
1
X
X
X
22
1
0
0
1
1
X
X
X
1
0
1
1
0
X
X
X
23
1
0
1
0
0
X
X
X
1
0
1
1
1
X
X
X
24
1
0
1
0
1
X
X
X
1
1
0
0
0
X
X
X
25
1
0
1
1
0
X
X
X
1
1
0
0
1
X
X
X
26
1
0
1
1
1
X
X
X
1
1
0
1
0
X
X
X
27
1
1
0
0
0
X
X
X
1
1
0
1
1
X
X
X
28
1
1
0
0
1
X
X
X
1
1
1
0
0
X
X
X
29
1
1
0
1
0
X
X
X
1
1
1
0
1
X
X
X
30
1
1
0
1
1
X
X
X
1
1
1
1
0
X
X
X
31
1
1
1
0
0
X
X
X
1
1
1
1
1
0
X
X
32
1
1
1
0
1
X
X
X
1
1
1
1
1
1
0
0
33
1
1
1
1
0
X
X
X
1
1
1
1
1
1
0
1
34
1
1
1
1
1
X
X
X
1
1
1
1
1
1
1
X
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Bus Write Operations1
Command Length
1st bus cycle
2nd bus cycle
Address
Data
1
X
F0
3
555
AA
2AA
Auto Select
3
555
AA
Program
4
555
Unlock
Bypass
3
Unlock
Bypass
Program
4th bus cycle
5th bus cycle
6th bus cycle
Address
Data
55
X
FO
2AA
55
555
90
*2
*2
AA
2AA
55
555
A0
PA
PD
555
AA
2AA
55
555
20
2
X
A0
PA
PD
Unlock
Bypass
Reset
2
X
90
X
OO
Chip Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
555
10
Block Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
BA
30
Erase
Suspend
1
X
B0
Erase
Resume
1
X
30
CFI Query
1
X
98
Read/Reset
Address Data
3rd bus cycle
Address Data Address Data Address Data
Key: L =Low (<VIL); H = High (>VIH); X =Don’t care
)RXUWKEXVF\FOHLQWKHDXWRVHOHFWPRGHLVDUHDGF\FOHZLWKWKHIROORZLQJH[SHFWHGGDWDVHHQH[WWDEOH7KHUHFDQEHVXFFHVVLYHUHDGF\FOHVZLWKDGGUHVV;
;;LQDQ\RUGHU
5($'FRGHV
Mode
A19–A12
A6
A1
A0
Code
1
L
L
L
52h
×8 T boot
X
L
L
H
CAh
×8 B boot
X
L
L
H
49h
×16 T boot
X
L
L
H
22C4h
×16 B boot
X
L
L
H
2249h
Sector address
L
H
L
01h protected
00h unprotected
MFR code (Alliance Semiconductor)
Device code
X
Sector protection
Key: L =Low (<VIL); H = High (>VIH); X =Don’t care
8/30/01; V.0.9.5
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Bus Write Operations1
Command
Length
1st bus cycle
2nd bus cycle
Address
Data
1
X
F0
3
AAA
AA
555
Auto Select
3
AAA
AA
Program
4
AAA
Unlock
Bypass
3
Unlock
Bypass
Program
4th bus cycle
5th bus cycle
6th bus cycle
Address
Data
55
X
FO
555
55
AAA
90
*2
*
AA
555
55
AAA
A0
PA
PD
AAA
AA
555
55
AAA
20
2
X
A0
PA
PD
Unlock
Bypass
Reset
2
X
90
X
OO
Chip Erase
6
AAA
AA
555
55
AAA
80
AAA
AA
555
55
AAA
10
Block Erase
6
AAA
AA
555
55
AAA
80
AAA
AA
555
55
BA
30
Erase
Suspend
1
X
B0
Erase
Resume
1
X
30
CFI query
1
X
98
Read/Reset
Address Data
3rd bus cycle
Address Data Address Data Address Data
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H[SHFWHG
8/30/01; V.0.9.5
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Item
Description
Reset/Read
Initiate read or reset operations by writing the Read/Reset command sequence into the command
register. This allows the microprocessor to retrieve data from the memory. Device remains in read
mode until command register contents are altered.
Device automatically powers up in read/reset state. This feature allows only reads, therefore
ensuring no spurious memory content alterations during power up.
AS29LV160 provides manufacturer and device codes in two ways. External PROM programmers
typically access the device codes by driving +10V on A9. AS29LV160 also contains an ID Read
command to read the device code with only +3V, since multiplexing +10V on address lines is
generally undesirable.
ID Read
Initiate device ID read by writing the ID Read command sequence into the command register.
Follow with a read sequence from address XXX00h to return MFR code. Follow ID Read command
sequence with a read sequence from address XXX01h to return device code.
To verify write protect status on sectors, read address XXX02h. Sector addresses A19–A12 produce
a 1 on DQ0 for protected sector and a 0 for unprotected sector.
Exit from ID read mode with Read/Reset command sequence.
Hardware Reset
Holding RESET low for 500 ns resets the device, terminating any operation in progress; data
handled in the operation is corrupted. The internal state machine resets 20 µs after RESET is driven
low. RY/BY remains low until internal state machine resets. After RESET is set high, there is a delay
of 50 ns for the device to permit read operations.
Programming the AS29LV160 is a four bus cycle operation performed on a byte-by-byte or wordby-word basis. Two unlock write cycles precede the Program Setup command and program data
write cycle. Upon execution of the program command, no additional CPU controls or timings are
necessary. Addresses are latched on the falling edge of CE or WE, whichever is last; data is latched
on the rising edge of CE or WE, whichever is first. The AS29LV160’s automated on-chip program
algorithm provides adequate internally-generated programming pulses and verifies the
programmed cell margin.
Byte/word
Programming
Check programming status by sampling data on the RY/BY pin, or either the DATA polling (DQ7)
or toggle bit (DQ6) at the program address location. The programming operation is complete if
DQ7 returns equivalent data, if DQ6 = no toggle, or if RY/BY pin = high.
The AS29LV160 ignores commands written during programming. A hardware reset occurring
during programming may corrupt the data at the programmed location.
AS29LV160 allows programming in any sequence, across any sector boundary. Changing data from
0 to 1 requires an erase operation. Attempting to program data 0 to 1 results in either DQ5 = 1
(exceeded programming time limits); reading this data after a read/reset operation returns a 0.
When programming time limit is exceeded, DQ5 reads high, and DQ6 continues to toggle. In this
state, a Reset command returns the device to read mode.
8/30/01; V.0.9.5
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Item
Description
The unlock bypass feature increases the speed at which the system programs bytes or words to the
device because it bypasses the first two unlock cycles of the standard program command sequence.
To initiate the unlock bypass command sequence, two unlock cycles must be written, then
followed by a third cycle which has the unlock bypass command, 20h.
Unlock Bypass
Command Sequence
The device then begins the unlock bypass mode. In order to program in this mode, a two cycle
unlock bypass program sequence is required. The first cycle has the unlock bypass program
command, A0h. It is followed by a second cycle which has the program address and data. To
program additional data, the same sequence must be followed.
The unlock bypass mode has two valid commands, the Unlock Bypass Program command and the
Unlock Bypass Reset command. The only way the system can exit the unlock bypass mode is by
issuing the unlock bypass reset command sequence. This sequence involves two cycles. The first
cycle contains the data, 90h. The second cycle contains the data 00h. Addresses are don’t care for
both cycles. The device then returns to reading array data.
Chip erase requires six bus cycles: two unlock write cycles; a setup command, two additional
unlock write cycles; and finally the Chip Erase command.
Chip Erase
Chip erase does not require logical 0s to be written prior to erasure. When the automated on-chip
erase algorithm is invoked with the Chip Erase command sequence, AS29LV160 automatically
programs and verifies the entire memory array for an all-zero pattern prior to erase. The 29LV160
returns to read mode upon completion of chip erase unless DQ5 is set high as a result of exceeding
time limit.
Sector erase requires six bus cycles: two unlock write cycles, a setup command, two additional
unlock write cycles, and finally the Sector Erase command. Identify the sector to be erased by
addressing any location in the sector. The address is latched on the falling edge of WE; the
command, 30h is latched on the rising edge of WE. The sector erase operation begins after a sector
erase time-out.
Sector Erase
To erase multiple sectors, write the Sector Erase command to each of the addresses of sectors to
erase after following the six bus cycle operation above. Timing between writes of additional sectors
must be less than the erase time-out period, or the AS29LV160 ignores the command and erasure
begins. During the time-out period any falling edge of WE resets the time-out. Any command
(other than Sector Erase or Erase Suspend) during time-out period resets the AS29LV160 to read
mode, and the device ignores the sector erase command string. Erase such ignored sectors by
restarting the Sector Erase command on the ignored sectors.
The entire array need not be written with 0s prior to erasure. AS29LV160 writes 0s to the entire
sector prior to electrical erase; writing of 0s affects only selected sectors, leaving non-selected
sectors unaffected. AS29LV160 requires no CPU control or timing signals during sector erase
operations.
Automatic sector erase begins after sector erase time-out from the last rising edge of WE from the
sector erase command stream and ends when the DATA polling (DQ7) is logical 1. DATA polling
address must be performed on addresses that fall within the sectors being erased. AS29LV160
returns to read mode after sector erase unless DQ5 is set high by exceeding the time limit.
Common Flash
Interface
8/30/01; V.0.9.5
In order to achieve long term system compatibility, certain information about the internal
configuration of the memory is provided which can be accessed in this mode. According to this
information, system software may be configured for both upward and downward compatibility
with Flash in a similar family. CFI mode can be entered by issuing CFI command either from read
or from autoselect mode. The system can read CFI information at the addresses given in the tables
below.
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Item
Description
Erase Suspend allows interruption of sector erase operations to read data from or program data to a
sector not being erased. Erase suspend applies only during sector erase operations, including the
time-out period. Writing an Erase Suspend command during sector erase time-out results in
immediate termination of the time-out period and suspension of erase operation.
AS29LV160 ignores any commands during erase suspend other than Read/Reset, Program or Erase
Resume commands. Writing the Erase Resume Command continues erase operations. Addresses are
Don’t Care when writing Erase Suspend or Erase Resume commands.
Erase Suspend
AS29LV160 takes 0.2–15 µs to suspend erase operations after receiving Erase Suspend command.
To determine completion of erase suspend, either check DQ6 after selecting an address of a sector
not being erased, or poll RY/BY. Check DQ2 in conjunction with DQ6 to determine if a sector is
being erased. AS29LV160 ignores redundant writes of Erase Suspend.
While in erase-suspend mode, AS29LV160 allows reading data (erase-suspend-read mode) from or
programming data (erase-suspend-program mode) to any sector not undergoing sector erase;
these operations are treated as standard read or standard programming mode. AS29LV160 defaults
to erase-suspend-read mode while an erase operation has been suspended.
Write the Resume command 30h to continue operation of sector erase. AS29LV160 ignores
redundant writes of the Resume command. AS29LV160 permits multiple suspend/resume
operations during sector erase.
Sector Protect
8/30/01; V.0.9.5
When attempting to write to a protected sector, DATA polling and Toggle Bit 1 (DQ6) are activated
for about <1 µs. When attempting to erase a protected sector, DATA polling and
Toggle Bit 1 (DQ6) are activated for about <5 µs. In both cases, the device returns to read mode
without altering the specified sectors.
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&RPPRQ)ODVK0HPRU\,QWHUIDFH4XHU\,GHQWLILFDWLRQ6WULQJ
Addresses (Word Mode)
10h
11h
12h
13h
14h
15h
16h
17h
18h
19h
1Ah
Addresses (Byte Mode)
20h
22h
24h
26h
28h
2Ah
2Ch
2Eh
30h
32h
34h
Data
0051h
0052h
0059h
0002h
0000h
0040h
0000h
0000h
0000h
0000h
0000h
Description
Query unique ASCII string (QRY)
Primary OEM command set
Address for primary extended table
Alternate OEM command set (00h = does not exist)
Address for alternate OEM extended table (00h = does
not exist)
6\VWHP,QWHUIDFH6WULQJ
Addresses
(Word Mode)
1Bh
1Ch
1Dh
1Eh
1Fh
20h
21h
22h
23h
24h
25h
26h
Addresses
(Byte Mode)
36h
38h
3Ah
3Ch
3Eh
40h
42h
44h
46h
48h
4Ah
4Ch
Data
0027h
0036h
0000h
0000h
0004h
0000h
000Ah
0000h
0005h
0000h
0004h
0000h
Description
VccMin.(write/erase), D7-D4:volt, D3-D0: 100 millivolt
VccMax.(write/erase), D7-D4: volt, D3-D0: 100 millivolt
VppMin. Voltage (00h = no Vpp pin present)
VppMax. Voltage (00h = no Vpp in present)
Typical timeout per single byte/word write 2N us
Typical timeout for Min. size buffer write 2N us (00h = not supported)
Typical timeout per individual block erase 2N ms
Typical timeout for full chip erase 2N ms (00h = not supported)
Max. timeout for byte/word write 2N times typical
Max. timeout for buffer write 2N times typical
Max. timeout per individual block erase 2N times typical
Max. timeout for full chip erase 2N times typical (00h = not supported)
'HYLFH*HRPHWU\'HILQLWLRQ
Addresses
(Word Mode)
27h
28h
29h
2Ah
2Bh
2Ch
2Dh
2Eh
2Fh
30h
8/30/01; V.0.9.5
Addresses
(Byte Mode)
4Eh
50h
52h
54h
56h
58h
5Ah
5Ch
5Eh
60h
Data
0015h
0002h
0000h
0000h
0000h
0004h
0000h
0000h
0040h
0000h
Description
Device size =
2N
byte
Flash device interface description
Max. number of byte in multi-byte write = 2N (00h = not supported)
Number of erase block regions within device
Erase block region 1 information
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Addresses
(Word Mode)
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
3Bh
3Ch
Addresses
(Byte Mode)
62h
64h
66h
68h
6Ah
6Ch
6Eh
70h
72h
74h
76h
78h
Data
0001h
0000h
0020h
0000h
0000h
0000h
0080h
0000h
001Eh
0000h
0000h
0001h
Description
Erase block region 2 information
Erase block region 3 information
Erase block region 4 information
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Addresses
(Word Mode)
40h
41h
42h
43h
44h
45h
46h
47h
48h
49h
4Ah
4Bh
4Ch
8/30/01; V.0.9.5
Addresses
(Byte Mode)
80h
82h
84h
86h
88h
8Ah
8Ch
8Eh
90h
92h
94h
96h
98h
Data
0050h
0052h
0049h
0031h
0030h
0000h
0002h
0001h
0001h
0004h
0000h
0000h
0000h
Description
Query-unique ASCII string (PRI)
Major version number, ASCII
Minor version number, ASCII
Address sensitive unlock, 0 = required, 1 = not required
Erase suspend, 0 = not supported, 1 = to read only, 2 = to read and write
Sector protect, 0 = not supported, X = number of sectors in per group
Sector temporary unprotect, 00 = not supported, 01 = supported
Sector protect/unprotect scheme
Simultaneous operation, 00 = not supported, 01 = supported
Burst mode type, 00 = not supported , 01 = supported
Page mode type, 00 = not supported, 01 = 4 word page, 02 = 8 word page
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DATA polling (DQ7)
Only active during automated on-chip algorithms or sector erase time outs. DQ7 reflects
complement of data last written when read during the automated on-chip program algorithm (0
during erase algorithm); reflects true data when read after completion of an automated on-chip
program algorithm (1 after completion of erase agorithm).
Toggle bit 1 (DQ6)
Active during automated on-chip algorithms or sector erase time outs. DQ6 toggles when CE or OE
toggles, or an Erase Resume command is invoked. DQ6 is valid after the rising edge of the fourth
pulse of WE during programming; after the rising edge of the sixth WE pulse during chip erase;
after the last rising edge of the sector erase WE pulse for sector erase. For protected sectors,
DQ6 toggles for <1 µs during program mode writes, and <5 µs during erase (if all selected sectors
are protected).
Exceeding time limit
(DQ5)
Indicates unsuccessful completion of program/erase operation (DQ5 = 1). DATA polling remains
active. If DQ5 = 1 during chip erase, all or some sectors are defective; during byte programming or
sector erase, the sector is defective (in this case, reset the device and execute a program or erase
command sequence to continue working with functional sectors). Attempting to program 0 to 1
will set DQ5 = 1.
Sector erase timer
(DQ3)
Checks whether sector erase timer window is open. If DQ3 = 1, erase is in progress; no commands
will be accepted. If DQ3 = 0, the device will accept sector erase commands. Check DQ3 before and
after each Sector Erase command to verify that the command was accepted.
Toggle bit 2 (DQ2)
During sector erase, DQ2 toggles with OE or CE only during an attempt to read a sector being
erased. During chip erase, DQ2 toggles with OE or CE for all addresses. If DQ5 = 1, DQ2 toggles
only at sector addresses where failure occurred, and will not toggle at other sector addresses. Use
DQ2 in conjunction with DQ6 to determine whether device is in auto erase or erase suspend mode.
Ready/Busy
RY/BY indicates whether an automated on-chip algorithm is in progress (RY/BY = low) or
completed (RY/BY = high). The device does not accept Program/Erase commands when
RY/BY = low. RY/BY= high when device is in erase suspend mode. RY/BY = high when device
exceeds time limit, indicating that a program or erase operation has failed. RY/BY is an open drain
output, enabling multiple RY/BY pins to be tied in parallel with a pull up resistor to VCC.
:ULWHRSHUDWLRQVWDWXV
Standard mode
Erase suspend mode
Exceeded time limits
Status
DQ7
DQ6
DQ5
DQ3
DQ2
RY/BY
Auto programming
DQ7
Toggle
0
N/A
No toggle
0
0
Program/erase in auto erase
0
Toggle
0
1
Toggle†
Read erasing sector
1
No toggle
0
N/A
Toggle
1
Data
Data
Data
Data
Data
1
Read non-erasing sector
Program in erase suspend
DQ7
Toggle
0
N/A
Toggle
Auto programming (byte)
DQ7
Toggle
1
N/A
No toggle
†
Program/erase in auto erase
0
Toggle
1
N/A
Toggle
Program in erase suspend
(non-erase suspended sector)
DQ7
Toggle
1
N/A
No toggle
DQ2 toggles when an erase-suspended sector is read repeatedly.
DQ6 toggles when any address is read repeatedly.
DQ2 = 1 if byte address being programmed is read during erase-suspend
program mode.
8/30/01; V.0.9.5
†
0
1
1
1
†DQ2 toggles when the read address applied points to a sector which is
undergoing erase, suspended erase, or a failure to erase.
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Temporary sector
unprotect mode
No
START
START
PLSCNT = 1
PLSCNT = 1
RESET# = VID
RESET# = VID
Wait 1 µs
Wait 1 µs
Protect all sectors:
The shaded portion of
the sector protct
algorithm must be
initiated for all
unprotected sectors
before calling the
sector unprotect
First Write
Cycle=60h?
Yes
Set up sector
address
Sector protect:
write 60h to sector
address with
A6=0, A1=1,
A0=0
No
All sectors
protected?
Yes
Sector unprotect:
write 60h to sector
address with
A6=1, A1=1,
A0=0
Verify sector
protect; write 40h
to sector address
with A6=0,
A1=1, A0=0
PLSCNT=25?
Wait 15 ms
Set up first
sector address
Read from sector
address with A6=0,
A1=1, A0=0
No
No
Verify sector
unprotect; write 40h
to sector address
with A6=1,
A1=1, A0=0
Increment
PLSCNT
Read from sector
address with A6=1,
A1=1, A0=0
Data=01h?
No
Yes
Set up next
sector address
Yes
Device failed
Protect
another
sector?
Temporary sector
unprotect mode
Yes
Wait 150 µs
Increment
PLSCNT
No
First Write
Cycle=60h?
Yes
PLSCNT
=1000?
No
Remove VID
from RESET#
No
Data=00h?
Yes
Yes
Device failed
Write reset
command
Last sector
verified?
No
Yes
Remove VID
from RESET#
Sector protect
complete
Write reset
command
Sector unprotect
complete
8/30/01; V.0.9.5
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START
START
Write erase command sequence
(see below)
Write program command sequence
(see below)
DATA polling or toggle bit
successfully completed
DATA polling or toggle bit
successfully completed
Erase complete
Increment
address
Last
address?
Individual sector/multiple sector
Chip erase command sequence
×16 mode (address/data):
NO
YES
erase command sequence
×16 mode (address/data):
555h/AAh
555h/AAh
2AAh/55h
2AAh/55h
555h/80h
555h/80h
555h/AAh
555h/AAh
2AAh/55h
2AAh/55h
555h/10h
Sector address/30h
Programming completed
Program command sequence
×16 mode (address/data):
555h/AAh
2AAh/55h
555h/A0h
Sector address/30h
Program address/program data
Sector address/30h
optional sector erase commands
† The system software should check the status of DQ3 prior to and following each
subsequent sector erase command to ensure command completion. The device may
not have accepted the command if DQ3 is high on second status check.
8/30/01; V.0.9.5
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Unlock bypass command sequence
x16 mode (address/data)
START
555h/AAh
Write unlock
bypass command
(3 cycles)
2AAh/55h
555h/20h
Write unlock
bypass program command
(2 cycles)
Unlock bypass program
command sequence
x16 mode (address/data)
DATA polling or
toggle bit
successfully completed
xxxh/A0h
Increment
address
Last
address?
program address/
program data
NO
Unlock bypass reset
command sequence
x16 mode (address/data)
YES
xxxh/90h
Write unlock
bypass reset command
(2 cycles)
xxxh/00h
Programming completed
8/30/01; V.0.9.5
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Read byte (DQ0–DQ7)
Address = VA†
DQ7
=
data
?
YES DONE
NO
DQ5
=
1
?
NO
YES
Read byte (DQ0–DQ7)
Address = VA
DQ7
=
data‡
?
YES†
DONE
NO†
FAIL
† VA = Byte address for programming. VA = any of the sector addresses within the sector being erased during Sector Erase. VA = valid address
equals any non-protected sector group address during Chip Erase.
‡ DQ7 rechecked even if DQ5 = 1 because DQ5 and DQ7 may not change simultaneously.
8/30/01; V.0.9.5
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Read byte (DQ0–DQ7)
Address = don’t care
DQ6
=
toggle
?
NO
DONE
YES
NO
DQ5
=
1
?
YES
Read byte (DQ0–DQ7)
Address = don’t care
DQ6
=
toggle†
?
NO
DONE
YES
FAIL
†DQ6 rechecked even if DQ5 = 1 because DQ6 may stop toggling when DQ5 changes to 1.
8/30/01; V.0.9.5
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Parameter
9&& ±9
Symbol Test conditions
Min
Max
Unit
-
±1
µA
35
µA
Input load current
ILI
VIN = VSS to VCC, VCC = VCC MAX
A9 Input load current
ILIT
VCC = VCC MAX, A9 = 10V
Output leakage current
ILO
VOUT = VSS to VCC, VCC = VCC MAX
-
±1
µA
Active current, read @ 5MHz
ICC1
CE = VIL, OE = VIH
-
20
mA
Active current, program/erase
ICC2
CE = VIL, OE = VIH
-
30
mA
Automatic sleep mode1
ICC3
CE = VIL, OE = VIH;
VIL= 0.3V, VIH = VCC - 0.3V
-
5
µA
Standby current
ISB
CE = VCC - 0.3V, RESET = VCC - .3V
-
5
µA
Deep power down current3
IPD
RESET = 0.3V
-
5
µA
Input low voltage
VIL
-0.5
0.8
V
Input high voltage
VIH
0.7×VCC
VCC + 0.3
V
Output low voltage
VOL
IOL = 4.0mA, VCC = VCC MIN
-
0.45
V
Output high voltage
VOH
IOH = -2.0 mA, VCC = VCC MIN
0.85×VCC
-
V
Low VCC lock out voltage
VLKO
1.5
-
V
Input HV select voltage
VID
9
11
V
1 Automatic sleep mode enables the deep power down mode when addresses are stable for 150 ns. Typical sleep mode current is 200 nA.
8/30/01; V.0.9.5
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-70
-80
-90
-120
JEDEC
Symbol
Std
Symbol Parameter
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tAVAV
tRC
Read cycle time
70
-
80
-
90
-
120
-
ns
tAVQV
tACC
Address to output delay
-
70
-
80
-
90
-
120
ns
tELQV
tCE
Chip enable to output
-
70
-
80
-
90
-
120
ns
tGLQV
tOE
Output enable to output
-
30
-
30
-
35
-
50
ns
tOES
Output enable setup time
0
-
0
-
0
-
0
-
ns
tEHQZ
tDF
Chip enable to output High Z
-
25
-
25
-
30
-
30
ns
tGHQZ
tDF
Output enable to output High Z
-
25
-
25
-
30
-
30
ns
tAXQX
tOH
Output hold time from addresses,
first occurrence of CE or OE
0
-
0
-
0
-
0
-
ns
tPHQV
Output enable hold time: Read
10
-
10
-
10
-
10
-
ns
tOEH
Output enable hold time:
Toggle and data polling
10
-
10
-
10
-
10
-
ns
tRH
RESET high to output delay
-
50
-
50
-
50
-
50
ns
tREADY
RESET pin low to read mode
-
10
-
10
-
10
-
10
µs
tRP
RESET pulse
500
-
500
-
500
-
500
-
ns
5HDGZDYHIRUP
tRC
Addresses stable
Addresses
tACC
CE
tDF
tOE
tOES
OE
tOEH
WE
tCE
Outputs
High Z
tOH
Output valid
High Z
tRH
RESET
8/30/01; V.0.9.5
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-70
-80
-90
-120
JEDEC
Symbol
Std
Symbol
Parameter
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tAVAV
tWC
Write cycle time
70
-
80
-
90
-
120
-
ns
tAVWL
tAS
Address setup time
0
-
0
-
0
-
0
-
ns
tWLAX
tAH
Address hold time
45
-
45
-
45
-
50
-
ns
tDVWH
tDS
Data setup time
35
-
35
-
45
-
50
-
ns
tWHDX
tDH
Data hold time
0
-
0
-
0
-
0
-
ns
tGHWL
tGHWL
Read recover time before write
0
-
0
-
0
-
0
-
ns
tELWL
tCS
CE setup time
0
-
0
-
0
-
0
-
ns
tWHEH
tCH
CE hold time
0
-
0
-
0
-
0
-
ns
tWLWH
tWP
Write pulse width
35
-
35
-
35
-
50
-
ns
tWHWL
tWPH
Write pulse width high
30
-
30
-
30
-
30
-
ns
:ULWHZDYHIRUP
:(FRQWUROOHG
3rd bus cycle
Addresses
tWC
tAS
555h
Program address
DATA polling
Program address
tAH
tCH
CE
tGHWL; tOES
OE
tWP
WE
tCS
tWHWH1 or 2
tWPH
tDH
DATA
8/30/01; V.0.9.5
A0h
tDS
Program
data
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DQ7
DOUT
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-70
-80
-90
-120
JEDEC
Symbol
Std
Symbol
Parameter
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tAVAV
tWC
Write cycle time
70
-
80
-
90
-
120
-
ns
tAVEL
tAS
Address setup time
0
-
0
-
0
-
0
-
ns
tELAX
tAH
Address hold time
45
-
45
-
45
-
50
-
ns
tDVEH
tDS
Data setup time
35
-
35
-
45
-
50
-
ns
tEHDX
tDH
Data hold time
0
-
0
-
0
-
0
-
ns
tGHEL
tGHEL
Read recover time before write
0
-
0
-
0
-
0
-
ns
tWLEL
tWS
WE setup time
0
-
0
-
0
-
0
-
ns
tEHWH
tWH
WE hold time
0
-
0
-
0
-
0
-
ns
tELEH
tCP
CE pulse width
35
-
35
-
35
-
50
-
ns
tEHEL
tCPH
CE pulse width high
30
-
30
-
30
-
30
-
ns
:ULWHZDYHIRUP
&(FRQWUROOHG
DATA polling
Addresses
555h
Program address
tWC
tAS
Program address
tAH
WE
tGHEL, tOES
OE
tCP
tWHWH1 or 2
CE
tCPH
tDH
DATA
A0h
Program
data
DQ7
DOUT
tDS
8/30/01; V.0.9.5
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JEDEC
Symbol
Std Symbol
Parameter
Min
Max
Unit
tVIDR
VID rise and fall time
500
-
ns
tRSP
RESET setup time for temporary sector
unprotect
4
-
µs
7HPSRUDU\VHFWRUXQSURWHFWZDYHIRUP
12V
0 or 3V
RESET
tVIDR
tVIDR
Program/erase command sequence
CE
0 or 3V
WE
tRSP
RY/BY
$&SDUDPHWHUV²5(6(7
-70/80/90/120
JEDEC
Symbol
Std Symbol
Parameter
Min
Max
Unit
tRP
RESET pulse
500
-
ns
tRH
RESET High time before Read
50
-
ns
tREADY
RESET Low to Read mode
-
20
µs
5(6(7ZDYHIRUP
RESET
tRP
RY/BY
tREADY
tRP
tRH
DQ
status
status
valid data
valid data
(UDVHZDYHIRUP
Addresses
îPRGH
tWC
555h
tAS
2AAh
555h
555h
2AAh
Sector address
tAH
CE
tGHWL
OE
tWP
tWC
WE
tWPH
tCS
AAh
Data
tDH
55h
80h
AAh
55h
10h for Chip Erase
30h
tDS
8/30/01; V.0.9.5
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JEDEC
Symbol
Std Symbol
-
Parameter
Min
Max
Unit
tVCS
VCC setup time
50
-
µs
-
tRB
Recovery time from RY/BY
0
-
ns
-
tBUSY
Program/erase valid to RY/BY delay
90
-
ns
5<%<ZDYHIRUP
CE
Rising edge of last WE signal
WE
RY/BY
tri-stated open-drain
tBUSY
Program/erase
operation
tRB
VCC
tVCS
'$7$SROOLQJZDYHIRUP
tCH
CE
tDF
tOE
OE
tOEH
WE
tCE
tOH
DQ7
Input DQ7
Output DQ7
Output
High Z
tWHWH1 or 2
7RJJOHELWZDYHIRUP
CE
tOEH
WE
OE
DQ6
tOE
tDH
8/30/01; V.0.9.5
toggle
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toggle
no toggle
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-70/80/90/120
JEDEC
Symbol
Std Symbol
Parameter
-
tELFL/tELFH
-
Min
Max
Unit
CE to BYTE switching Low or High
-
10
ns
tFLQZ
BYTE switching Low to output High-Z
-
30
ns
tFHQZ
BYTE switching High to output Active
80
-
ns
%<7(UHDGZDYHIRUP
CE
OE
BYTE
Word
to
Byte
tELFL
DQ15/A-1
tELFH
BYTE
Byte
to
Word
DQ0-DQ14
Data output
DQ0-DQ14
DQ0-DQ7
Data output
DQ15 output
tFLQZ
DQ0-DQ14
DQ0-DQ7
Data output
DQ15/A-1
Address input
Address input
DQ0-DQ14
Data output
DQ15 output
tFHQV
%<7(ZULWHZDYHIRUP
CE
falling edge of last WE signal
WE
BYTE
See Erase/Program operations table for tAS and tAH specifications.
tSET
(tAS)
tHOLD (tAH)
6HFWRUSURWHFWXQSURWHFW
RESET#
VID
VIH
SA, A6,
A1, A0
Don’t care
Valid*
Don’t care
Valid*
Don’t care
Valid*
Don’t care
Verify
40h
Don’t care
Status
Sector protect/unprotect
60h
DATA
CE#
1 µs
60h
Sector protect: 100 µs
Sector unprotect: 10 ms
WE#
OE#
* For sector protect, A6=0, A1=1, A0=0. For sector unprotect, A6=1, A1=1, A0=0.
8/30/01; V.0.9.5
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Test Condition
-70, -80
-90, -120
Output Load
Unit
1 TTL gate
Output Load Capacitance CL (including jig capacitance)
30
100
pF
5
ns
0.0-3.0
V
Input timing measurement reference levels
1.5
V
Output timing measurement reference levels
1.5
V
Input Rise and Fall Times
Input Pulse Levels
(UDVHDQGSURJUDPPLQJSHUIRUPDQFH
Limits
Parameter
Min
Typical
Max
Unit
-
1.0
15
sec
Byte
-
10
300
µs
Word
-
15
360
µs
-
7.2
27
sec
-
100,000
-
cycles
Sector erase and verify-1 time (excludes 00h programming
prior to erase)
Programming time
Chip programming time
1
Erase/program cycles
1 Erase/program cycle test is not verified on each shipped unit.
/DWFKXSWROHUDQFH
Parameter
Min
Max
Unit
Input voltage with respect to VSS on A9, OE, and RESET pin
-1.0
+12.0
V
Input voltage with respect to VSS on all DQ, address, and control pins
-0.5
VCC+0.5
V
Current
-100
+100
mA
Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time.
8/30/01; V.0.9.5
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Parameter
Symbol
Min
Max
Unit
Vcc
+2.7
+3.6
V
VSS
0
0
V
VIH
1.9
VCC + 0.3
V
VIL
–0.5
0.8
V
Supply voltage
Input voltage
$EVROXWHPD[LPXPUDWLQJV
Parameter
Symbol
Min
Max
Unit
Input voltage (Input or DQ pin)
VIN
–0.5
VCC+ 0.5
V
Input voltage (A9 pin, OE, RESET)
VIN
–0.5
+12.5
V
Power supply voltage
VCC
-0.5
+4.0
V
Operating temperature
TOPR
–55
+125
°C
Storage temperature (plastic)
TSTG
–65
+150
°C
150
mA
Short circuit output current
IOUT
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of
the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
7623SLQFDSDFLWDQFH
Symbol
CIN
COUT
CIN2
Parameter
Input capacitance
Output capacitance
Control pin capacitance
Test setup
VIN = 0
VOUT = 0
VIN = 0
Typ
6
8.5
8
Max
7.5
12
10
Unit
pF
pF
pF
Test setup
VIN = 0
VOUT = 0
VIN = 0
Typ
6
8.5
8
Max
7.5
12
10
Unit
pF
pF
pF
62SLQFDSDFLWDQFHDYDLODELOLW\7%'
Symbol
CIN
COUT
CIN2
Parameter
Input capacitance
Output capacitance
Control pin capacitance
'DWDUHWHQWLRQ
Parameter
Minimum pattern data retention time
8/30/01; V.0.9.5
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Temp.(°C)
Min
Unit
150°
10
years
125°
20
years
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L
pin 1
A
A1
pin 48
pin 24
D
Min
Max
–
1.27
0.05
0.15
0.95
1.05
0.17
0.27
0.15 nominal
18.20
18.60
0.50 nominal
11.90
12.10
19.80
20.20
0.50
0.70
0°
5°
A
A1
A2
b
c
D
e
E
Hd
L
α
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pin 25
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44-pin SO
e He
SO
1
2
3
4
5
6
7
8
0–10°
9 10 11 12 13 14 15 16 17 18 19 20 21 22
d
A2
A
A1
l
Min (mm)
Max (mm)
A
–
3.1
A1
0.05
–
A2
2.5
2.9
b
0.25
0.45
c
0.09
0.25
d
28.0
28.4
e
12.4
12.8
E
He
b
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1.27 (typical)
16.05 (typical)
0.73
1.3
P. 29 of 29
© Copyright Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document.
The data contained herein represents Alliance’s best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under
development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate
as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or
implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as
express agreed to in Alliance’s Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance’s Terms and Conditions of Sale. The purchase of
products from Alliance does not convey a license under any patent rights, copyrights, mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products
for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use.