August 2003 Advance Information PulseC re AS80SSTVF16859 DDR 13-Bit to 26-Bit Registered Buffer Features Recommended Applications • • • • • Differential clock signals Meets SSTL_2 class II specifications on outputs Low voltage operation – VDD = 2.3 V to 2.7 V Available in 64-pin TSSOP and 56-pin VFQFN packages (MLF2) • Pin Configurations CLK CLKB D1 VREF R CLK Q1A D1 Q1B To 12 other channels 56 Q8A VDDQ Q9A Q10A Q11A Q12A Q13A VDDQ GND D13 D12 VDD VDDQ 43 D11 RESETB Q13A Q12A Q11A Q10A Q9A VDDQ GND Q8A Q7A Q6A Q5A Q4A Q3A Q2A GND Q1A Q13B 42 D10 VDDQ D9 Q12B D8 Q11B D7 RESETB Q10B Q9B GND Q8B CLKB Q7B CLK Q6B VDDQ VDD GND VREF VDDQ D6 Q5B D5 Q4B 29 D4 Q3B Q2B Q1B AS80SSTVF16859 Q7B 15 Q6B VDDQ Q5B Q4B Q3B Q2B Q1B VDDQ D1 D2 VDD VDDQ D3 28 Q7A 1 Q6A Q5A Q4A Q3A Q2A Q1A Q13B VDDQ Q12B Q11B Q10B Q9B Q8B 14 56-Pin VFQFN (MLF2) 8/6/03; v.0.10 Alliance Semiconductor 1 64 2 63 3 62 61 4 5 60 59 6 58 7 57 8 56 9 55 10 54 11 53 12 13 52 51 14 15 50 49 16 48 17 47 18 46 19 20 45 44 21 43 22 42 23 24 41 25 40 26 39 27 38 28 37 29 36 30 35 31 34 32 33 64-Pin TSSOP AS80SSTVF16859 Block Diagram • DDR memory modules: PC1600, PC2100, PC2700, AND PC3200 Provides complete DDR DIMM logic solution with PCV857 SSTL_2-compatible data registers VDDQ GND D13 D12 VDD VDDQ GND D11 D10 D9 GND D8 D7 RESETB GND CLKB CLK VDDQ VDD VREF D6 GND D5 D4 D3 GND VDDQ VDD D2 D1 GND VDDQ 6.10 mm body, 0.50 mm pitch P. 1 of 13 &RS\ULJKW$OOLDQFH6HPLFRQGXFWRU$OOULJKWVUHVHUYHG AS80SSTVF16859 Truth Table1 Inputs Q outputs RESETB CLK CLKB D Q L X or floating X or floating X or floating L H ↑ ↓ H H H ↑ ↓ L L H L or H L or H X Q 02 1 H = high signal level, L = low signal level, ↑ = transition low to high, ↓ = transition high to low, X = don’t care. 2 Output level before the indicated steady state input conditions were established. Description The 13-bit to 26-bit PC16859 is a universal bus driver designed for 2.3 V to 2.7 V VDD operation and SSTL_2 I/O levels, except for the LVCMOS RESETB input. Data flow from D to Q is controlled by the differential clock (CLK/CLKB) and a control signal (RESETB). The positive edge of CLK is used to trigger the data flow, and CLKB is used to maintain sufficient noise margins, whereas RESETB, an LVCMOS asynchronous signal, is intended for use only at power-up. PC16859 supports low-power standby operation. A logic level low at RESETB assures that all internal registers and outputs (Q) are reset to the logic low state, and that all input receivers, data (D), and clock (CLK/CLKB) are switched off. Note that RESETB must always be supported with LVCMOS levels at a valid logic state because VREF may not be stable during power-up. To ensure that outputs are at a defined logic state before a stable clock has been supplied, RESETB must be held at a logic low level during power-up. In the DDR DIMM application, RESETB is specified to be completely asynchronous with respect to CLK and CLKB, therefore, no timing relationship can be guaranteed between the two signals. When entering a low-power standby state, the register will be cleared and the outputs will be driven to a logic low level quickly relative to the time to disable the differential input receivers. This ensures there are no glitches on the output. When coming out of low power standby state, however, the register will become active quickly relative to the time to enable the differential input receivers. When the data inputs are at a logic level low and the clock is stable during the low-tohigh transition of RESETB until the input receivers are fully enabled, the design ensures that the outputs will remain at a logic low level. 8/6/03, v.0.10 Alliance Semiconductor P. 2 of 13 AS80SSTVF16859 Pin Configuration (64-Pin TSSOP) Pin number 1, 2, 3, 4, 5, 8, 9, 10, 11, 12, 13, 14, 16, 17, 19, 20, 21, 22, 23, 24, 25, 28, 29, 30, 31, 32 7, 15, 26, 34, 39, 43, 50, 54, 58, 63 Pin name Type Q(13:1) Output GND PWR 6, 18, 27, 33, 38, 47, 59, 64 VDDQ PWR 35, 36, 40, 41, 42, 44, 52, 53, 55, 56, 57, 61, 62 48 49 37, 46, 60 51 D(13:1) CLK CLKB VDD RESETB Input Input Input PWR Input 45 VREF Input Pin number 1, 2, 3, 4, 5, 6, 7, 8, 10, 11, 12, 13, 14, 15, 16, 18, 19, 20, 21, 22, 50, 51, 52, 53, 54, 56 37, 48 Pin name Type Q(13:1) Output GND PWR 9, 17, 23, 27, 34, 44, 49, 55 VDDQ PWR 24, 25, 28, 29, 30, 31, 39, 40, 41, 42, 43, 46, 47 35 36 26, 33, 45 38 D(13:1) CLK CLKB VDD RESETB Input Input Input PWR Input 32 VREF Input – Center pad PWR Description Data output Ground Output supply voltage, 2.5 V nominal Data input Positive master clock input Negative master clock input Core supply voltage, 2.5 V nominal Reset (active low) Input reference voltage, 1.25 V nominal Pin Configuration (56-Pin MLF2) 8/6/03, v.0.10 Alliance Semiconductor Description Data output Ground Output supply voltage, 2.5 V nominal Data input Positive master clock input Negative master clock input Core supply voltage, 2.5 V nominal Reset (active low) Input reference voltage, 1.25 V nominal Ground (VFQFN package only) P. 3 of 13 AS80SSTVF16859 Absolute Maximum Ratings Storage temperature - 65° C to +150° C Supply voltage -0.5 to 3.6 V 1 Input voltage Output -0.5 to VDD + 0.5 voltage1,2 -0.5 to VDD + 0.5 Input clamp current ± 50 mA Output clamp current ± 50 mA Continuous output current ± 50 mA VDD, VDDQ, or GND current/pin Package thermal impedance ± 100 mA 3 55° C/W 1 The input and output negative voltage ratings may be excluded if the input and output clamp ratings are observed. 2 This current will flow only when the output is in the high state level V0 > VDDQ. 3 The package thermal impedance is calculated in accordance with JESD 51. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only, and functional operation of the device at these or any other conditions above those listed in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability. Recommended Operating Conditions - DDRI / DDR333 (PC1600, PC2100, PC2700) Guaranteed by design. Not 100% tested in production. Parameter VDD Description Min Typ Max Units Supply voltage 2.3 2.5 2.7 V VDDQ I/O supply voltage 2.3 2.5 2.7 V VREF Reference voltage 1.15 1.25 1.35 V VTT Termination voltage VREF - 0.04 VREF VREF + 0.04 V VDD V VI Input voltage VIH(DC) DC input high voltage VIH(AC) AC input high voltage VIL(DC) DC input low voltage VIL(AC) AC input low voltage VIH Input high voltage level VIL Input low voltage level VICR 0 Data inputs RESETB VID Common mode input range CLK. CLKB Differential input voltage VIX Cross-point voltage of differential clock pair IOH VREF + 0.15 V VREF + 0.31 V VREF - 0.15 V VREF - 0.31 V 1.7 0.97 V 0.7 V 1.53 V 0.36 (VDDQ/2) - 0.2 V (VDDQ/2) + 0.2 V High-level output current -20 mA IOL Low-level output current 20 mA TA Operating free-air temperature 70 °C 8/6/03, v.0.10 0 Alliance Semiconductor P. 4 of 13 AS80SSTVF16859 Recommended Operation Conditions - DDRI-400 (PC3200) Guarenteed by design, not 100% tested in production. Parameter Min Typ Max Units Supply Voltage 2.5 2.6 2.7 V VDDQ I/O supply voltage 2.5 2.6 2.7 V VREF Reference voltage 1.25 1.3 1.35 V VTT Termination voltage VREF - 0.04 VREF VREF + 0.04 V VDDQ V VDD VI Description Input voltage VIH(DC) DC input high voltage VIH(AC) AC input high voltage VIL(DC) DC input low voltage VIL(AC) AC input low voltage VIH Input high voltage level VIL Input low voltage level 0 VREF + 0.15 Data Inputs RESETB V VREF + 0.31 V VREF - 0.15 V VREF - 0.31 V 1.7 V 0.7 V 1.53 V VICR Common mode input range VID Differential input voltage VIX Cross-point voltage of differential clock pair IOH High-level output current -16 mA IOL Low-level output current 16 mA TA Operating free-air temperature 70 °C 8/6/03, v.0.10 CLK, CLKB 0.97 0.36 (VDDQ/2) - 0.2 0 Alliance Semiconductor V (VDDQ/2) + 0.2 V P. 5 of 13 AS80SSTVF16859 DC Electrical Characteristics - DDRI / DDR333 (PC1600, PC2100, PC2700) TA = 0° C to 70° C, VDD = 2.5 ± 0.2 V, and VDDQ = 2.5 ± 0.2 V (unless otherwise stated) Guaranteed by design. Not 100% tested in production.. Symbol Parameters VIK VOH VOL II IDD All inputs Test conditions VDD Min Typ Max Units -1.2 V II = -18 mA 2.3 V IOH = -100 µA 2.3 V to 2.7 V VDD 0.2 V IOH = -16 mA 2.3 V 1.95 V IOL = 100 µA 2.3 V to 2.7 V 0.2 V IOL = 16 mA 2.3 V 0.35 V VI = VDD or GND 2.7 V ±5 µA Standby (static) RESETB = GND 2.7 V 0.01 µA Operating (static) VI = VIH(AC) or VIL(AC), RESETB = VDD 2.7 V 25 mA Dynamic operating (clock only) RESETB = VDD, VI = VIH(AC) or VIL(AC), CLK and CLKB switching 50% duty cycle 2.7 V IDDD Dynamic operating (per each data input) RESETB = VDD, VI = VIH(AC) or VIL(AC), CLK and CLKB = switching 50% duty cycle 30 µA/ clock MHz 10 µΑ/ clock MHz/ data input IO = 0 2.7 V One data input switching at half clock frequency, 50% duty cycle rOH Output high IOH = -20 mA 2.3 V to 2.7 V 7 20 Ω rOL Output low IOL = 20 mA 2.3 V to 2.7 V 7 20 Ω rO(D) |rOH - rOL| each separate bit IO = 20 mA, TA = 25° C 2.5 V 4 Ω VI = VREF ± 310 mV, VICR = 1.25 V, VI(PP) = 360 mV 2.5 V 2.5 3.5 pF 2.5 V 2.5 3.5 pF 2.5V 2.5 3.5 pF Data inputs Ci CLK and CLKB RESETB 8/6/03, v.0.10 VI = VDD or GND Alliance Semiconductor P. 6 of 13 AS80SSTVF16859 DC Electrical Characteristics - DDRI-400 (PC3200) TA = 0° C to 70° C, VDD = 2.6 ± 0.1 V, and VDDQ = 2.6 ± 0.1 V (unless otherwise stated) Guaranteed by design. Not 100% tested in production.. Symbol Parameters VIK VOH VOL II IDD All inputs Test conditions VDD Min Typ Max Units -1.2 V II = -18 mA 2.5 V IOH = -100 µA 2.5 V to 2.7 V VDD 0.2 V IOH = -8 mA 2.5 V 1.95 V IOL = 100 µA 2.5 V to 2.7 V 0.2 V IOL = 8 mA 2.5 V 0.35 V VI = VDD or GND 2.7 V ±5 µA Standby (static) RESETB = GND 2.7 V 0.01 µA Operating (static) VI = VIH(AC) or VIL(AC), RESETB = VDD 2.7 V 25 mA Dynamic operating (clock only) RESETB = VDD, VI = VIH(AC) or VIL(AC), CLK and CLKB switching 50% duty cycle 2.7 V IDDD Dynamic operating (per each data input) RESETB = VDD, VI = VIH(AC) or VIL(AC), CLK and CLKB = switching 50% duty cycle 30 µA/ clock MHz 10 µΑ/ clock MHz/ data input IO = 0 2.7 V One data input switching at half clock frequency, 50% duty cycle rOH Output high IOH = -16 mA 2.5 V to 2.7 V 7 20 Ω rOL Output low IOL = 16 mA 2.5 V to 2.7 V 7 20 Ω rO(D) |rOH - rOL| each separate bit IO = 20 mA, TA = 25° C 2.6 V 4 Ω VI = VREF ± 310 mV, VICR = 1.25 V, VI(PP) = 360 mV 2.6 V 2.5 3.5 pF 2.6 V 2.5 3.5 pF 2.6V 2.5 3.5 pF Data inputs Ci CLK and CLKB RESETB 8/6/03, v.0.10 VI = VDD or GND Alliance Semiconductor P. 7 of 13 AS80SSTVF16859 Timing Requirements (Over recommended operating free-air temperature range, unless otherwise noted.) Guaranteed by design. Not 100% tested in production * This parameter is not necessarily production tested.. VDDQ = 2.5V±0.2V Symbol fCLOCK tW tACT* tINACT* tS th Parameters Min Max Clock frequency Min Differential inputs active time Differential inputs inactive Setup time, slow slew rate 4,5 rate3,5 Hold time, slow slew 2.5 rate4,5 MHz ns 22 time2 Setup time, fast slew rate3,5 270 2.5 1 Units Max 200 Pulse duration, CK, CKLB high or low Hold time, fast slew VDDQ = 2.6V±0.1V 22 22 ns 22 ns Data before CLK↑, CLKB↓ 0.75 0.4 ns 0.9 0.6 ns Data after CLK↑, CLKB↓ 0.75 0.4 ns 0.9 0.6 ns 1 Data inputs must be low a minimum time of tACT max, after RESETB is taken high 2 Data and clock inputs must be held at valid levels (not floating) a minimum time of tINACT max, after RESETB is taken low 3 For data signal input slew rate > 1 V/ns 4 For data signal input slew rte > 0.5 V/ns and < 1 V/ns 5 CLK, CLKB signals iput slew rates are > 1 V/ns Switching Characteristics - DDRI / DDR333 (PC1600, PC2100, PC2700) (Over recommended operating free-air temperature range unless otherwise noted.) VDD = 2.5 V ± 0.2 V Symbol From (input) To (output) fmax tPD Min Typ Max Units 200 – – MHz CLK, CLKB (TSSOP) Q 1.1 2.8 ns CLK, CLKB (VFQFN[MLF2]) Q 1.1 2.8 ns RESETB Q – 5.0 ns tphl – Switching Characteristics - DDRI-400 (PC3200) (Over recommended operating free-air temperature range unless otherwise noted.) VDD = 2.6 V ± 0.1 V Symbol From (input) To (output) fmax tPD Min Typ Max 210 MHz Q tPDSS CLK, CLKB (VFQFN[MLF2]) Simultaneous switching Q 2.48 ns tphl RESETB Q 3.5 ns 8/6/03, v.0.10 1.1 Units Alliance Semiconductor 2.2 ns P. 8 of 13 AS80SSTVF16859 Parameter Measurement Information (VDD = 2.5 V ± 0.2 V) VTT RL = 50 Ω From output under test Test point CL = 30 pF1 Load circuit 1 CL includes probe and jig capacitance. Voltage and Current Waveforms In the following waveforms, note that all input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Zo = 50 Ω, input slew rate = 1 V/ns ± 20% (unless otherwise specified). The outputs are measured one at a time with one transition per measurement. VTT = VREF = VDDQ/2. VIH = VREF + 310 mV (AC voltage levels) for differential inputs. VIH = VDD for LVCMOS input. VIL = VREF - 310 mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS input. tPLH and tPHL are the same as tpd. Input active and inactive times LVCMOS RESETB VDD/2 Input IDD VDD VDD/2 0V tinact 1 tact IDDH 90% 10% 1 IDDL IDD tested with clock and data inputs held at VDD or GND, and IO = 0 mA. Pulse duration tw VREF Input VREF VIH VIL Setup and hold times VI(pp) VICR Timing input ts Input 8/6/03, v.0.10 VREF th VREF Alliance Semiconductor VIH VIL P. 9 of 13 AS80SSTVF16859 Propagation delay times VI(pp) VICR Timing input Output VICR tPLH tPHL VTT VTT LVCMOS RESETB Input VOH VOL VIH VDD/2 VIL tPHL Output VOH VTT VOL HIGH-TO-LOW SLEW-RATE MEASUREMENT LOW-TO-HIGH SLEW RATE MEASUREMENT VOH dt_r dV_r 80% VOH Output 80% 20% Output 20% VOL dV_f VOL dt_f Output slew rates over recommended operating free-air temperature range (unless otherwise noted) VCC= 2.5 V + 0.2V * VCC = 2.6 V + 0.1 V * Parameter From To Min Max Min Max Unit dV/dt_r 20% 80% 1 4 1 4 V/ns dV/dt_f 80% 20% 1 4 1 4 V/ns 1 V/ns dV/dt_∆ ∗∗ 20% or 80% 80% or 20% 1 *For this test condition, VDDQ is always equal to VDD **Difference between dV/dt_r (rising edge rate) and dV/dt_f (falling edge rate) 8/6/03, v.0.10 Alliance Semiconductor P. 10 of 13 AS80SSTVF16859 Package Dimensions (64- Pin TSSOP) Millimeters c N L E1 E Index area Symbol Min Max Min Max A – 1.20 – 0.047 A1 0.05 0.15 0.002 0.006 A2 0.80 1.05 0.32 0.041 b 0.17 0.27 0,007 0.011 c 0.09 0.20 0.0035 0.008 D E 12 D α A2 e b A1 6.10 mm (240 mil) body, 0.50 mm (0.020 mil) pitch TSSOP E1 e A Seating plane L aaa C N See variations below 8.10 basic 6.00 6.20 0.50 basic 0.45 0.75 0.319 basic 0.236 0.244 0.020 basic 0.018 0.030 See variations below α 0° 8° 0° 8° aaa – 0.10 – 0.004 Variations: D (mm) 8/6/03, v.0.10 Inches D (inch) N Min Max Min Max 64 16.90 17.10 0.665 0.673 Alliance Semiconductor P. 11 of 13 AS80SSTVF16859 Package Dimensions (56-Pin MLF2) 0.25 C A D Common dimensions A D/2 A2 A1 A3 D1 D1/2 0.25 C B 0.18 Dia. E1 E E1/2 E/2 Typ Max 0.85 1.00 0.01 0.05 A2 0.65 0.80 A3 0.20 BSC D 8.00 BSC D1 7.75 BSC E 8.00 BSC E1 7.75 BSC A1 θ Seating plane P R Top view D2 D2/2 Pin ID 4x P 0.35 (Ne - 1) X e E2 0.00 12 0.24 0.42 0.60 0.13 0.17 0.23 Pitch variation D Side view 0.25 C A B 4x P Min A θ 0.20 C B 0.20 C A Symbol e 0.50 BSC N 56 Nd 14 Ne 14 L 0.30 0.40 0.50 b 0.18 0.23 0.30 Q 0.00 0.20 0.45 D2 4.35 4.50 4.65 E2 5.05 5.20 5.35 E2/2 L e (Nd - 1) X e Bottom view b A1 Terminal tip For odd terminal/side 8/6/03, v.0.10 For even terminal/side Alliance Semiconductor Cross section P. 12 of 13 AS80SSTVF16859 Ordering Information Ordering Number Marking Package AS80SSTVF16859-64TT AS80SSTVF16859T 64-Pin TSSOP, Tube AS80SSTVF16859-64TR AS80SSTVF16859T 64-Pin TSSOP, Tape & Reel AS80SSTVF16859-56KT AS80SSTVF16859K 56-pin MLF2, Tube AS80SSTVF16859-56KR AS80SSTVF16859K 56-pin MLF2, Tape & Reel 8/6/03; v.0.10 Alliance Semiconductor Qty per Reel Temperature 0°C to 70°C 2500 0°C to 70°C 0°C to 70°C 2500 0°C to 70°C P. 13 of 13 © Copyright Alliance Semiconductor Corporation. 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