NSC 100325D

100325
Low Power Hex ECL-to-TTL Translator
General Description
Features
The 100325 is a hex translator for converting F100K logic
levels to TTL logic levels. Differential inputs allow each circuit
to be used as an inverting, non-inverting or differential receiver. An internal reference voltage generator provides VBB
for single-ended operation, or for use in Schmitt trigger applications. All inputs have 50 kΩ pull-down resistors. When the
inputs are either unconnected or at the same potential the
outputs will go low.
When used in single-ended operation the apparent input
threshold of the true inputs is 20 mV to 40 mV higher (positive) than the threshold of the complementary inputs. The
VEE and VTTL power may be applied in either order.
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Logic Diagram
Pin/function compatible with 100125
Meets 100125 AC specifications
50% power reduction of the 100125
Differential inputs with built in offset
Standard FAST ® outputs
2000V ESD protection
−4.2V to −5.7V operating range
Available to Microcircuit Drawing
(SMD) 5962-9153101
Pin Names
Description
D0–D5
Data Inputs
D0–D5
Inverting Data Inputs
Q0–Q5
Data Outputs
DS100314-4
FAST ® is a registered trademark of Fairchild Semiconductor.
© 1998 National Semiconductor Corporation
DS100314
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100325 Low Power Hex ECL-to-TTL Translator
August 1998
Connection Diagrams
Truth Table
Inputs
24-Pin DIP
DS100314-1
Dn
L
H
L
H
L
H
DS100314-2
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2
Qn
L
L
L
H
H
L
Open
Open
L
VEE
VEE
L
L
VBB
L
H
VBB
H
VBB
L
H
VBB
H
L
H = HIGH Voltage Level
L = LOW Voltage Level
24-Pin Quad Cerpak
Outputs
Dn
Absolute Maximum Ratings (Note 1)
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Current Applied to Output
in LOW State (Max)
ESD (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired.
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
VEE Pin Potential to Ground Pin
VTTL Pin Potential to Ground Pin
Input Voltage (DC)
−65˚C to +150˚C
−0.5V to VCC
twice the rated IOL (mA)
≥2000V
Recommended Operating
Conditions
+175˚C
−7.0V to +0.5V
−0.5V to +6.0V
VEE to +0.5V
Case Temperature (TC)
Military
Supply Voltage (VEE)
−55˚C to +125˚C
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C, CL = 50 pF, VTTL = +4.5V to +5.5V
Symbol
VBB
Parameter
Output Reference Voltage
Min
Max
−1380
−1260
−1396
−1260
−1165
−870
Units
TC
0˚C to +125˚C
IVBB = −2.1 mA
mV
VIH
Input HIGH Voltage
−55˚C
mV
Conditions
−55˚C to +125˚C
Notes
IVBB = −3 µA, VEE = −4.2V
VEE = −5.7V
Guaranteed HIGH Signal for All Inputs
(with One Input Tied to VBB)
VIL
Input LOW Voltage
−1830
−1475
mV
−55˚C to +125˚C
Guaranteed LOW Signal for All Inputs
(with One Input Tied to VBB)
VOH
Output HIGH Voltage
2.5
mV
0˚C to +125˚C
2.4
VOL
Output LOW Voltage
VDIFF
Input Voltage Differential
150
VCM
Common Mode Voltage
−2000
IIH
Input HIGH Current
IOS
Input LOW Current
0.50
Output Short Circuit
−150
−55˚C to +125˚C
IOL = 20 mA
mV
−55˚C to +125˚C
Required for Full Output Swing
−500
mV
−55˚C to +125˚C
350
µA
0˚C to +125˚C
−60
−55˚C
µA
−55˚C to +125˚C
mA
−55˚C to +125˚C
Current
ICEX
VIN = VIH
VIN = VIH
(Max),
D0–D5 = VIL
VIN = VIL
D0–D5 = VBB ,
(Min)
(Min),
D0–D5 = VBB
VOUT = GND
ITTL
VEE Power Supply Current
VTTL Power Supply Current
−35
(Notes 3,
4, 5)
(Notes 3,
4, 5)
(Notes 3,
4, 5)
(Notes 3,
4, 5)
(Notes 3,
4, 5)
250
µA
−55˚C to +125˚C
VOUT = 5.5V
(Notes 3,
4, 5)
−12
mA
−55˚C to +125˚C
D0–D5 = VBB
(Notes 3,
4, 5)
−55˚C to +125˚C
D0–D5 = VBB
(Notes 3,
4, 5)
Leakage Current
IEE
(Notes 3,
4, 5, 6)
(Notes 3,
4, 5, 6)
Test One Output at a Time
Output HIGH
(Notes 3,
4, 5, 6)
(Max)
or VIL (Min)
mV
500
IIL
IOH = −2.0 mA
−55˚C
0.5
(Notes 3,
4, 5)
IVBB = −3 mA
65
mA
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, + 25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
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AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = GND, VTTL = +4.5V to +5.5V
Symbol
Parameter
tPLH
Propagation Delay
tPHL
Data to Output
TC = −55˚C
TC = +25˚C
TC = +125˚C
Min
Max
Min
Max
Min
Max
1.50
5.00
1.60
4.70
1.70
5.70
Units
ns
Conditions
CL = 50 pF
Figures 1, 3
Notes
(Notes 7,
8, 9)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Switching Waveform
DS100314-6
FIGURE 1. Propagation Delay
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Test Circuits
DS100314-5
Notes:
VCC = 0V, VEE = −4.5V, VTTL = +5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC, VEE and VTTL
All unused outputs are loaded with 500Ω to GND
CL = Fixture and stray capacitance = 15 pF
FIGURE 2. AC Test Circuit for 15 pF Loading
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Test Circuits
(Continued)
DS100314-8
Notes:
VCC = 0V, VEE = −4.5V, VTTL = +5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC, VEE and VTTL
All unused outputs are loaded with 500Ω to GND
CL = Fixture and stray capacitance = 50 pF
FIGURE 3. AC Test Circuit for 50 pF Loading
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Physical Dimensions
inches (millimeters) unless otherwise noted
24 Lead Ceramic Dual-In-Line Package (0.400" Wide) (D)
NS Package Number J24E
24 Lead Quad Cerpak (F)
NS Package Number W24B
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100325 Low Power Hex ECL-to-TTL Translator
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ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
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