AT42QT1060-MMU - Atmel Corporation

Atmel AT42QT1060
Six-channel QTouch® Touch Sensor IC
DATASHEET
Features
 Configurations:

Can be configured as a combination of keys and input/output lines
 Number of QTouch® Keys:

Two to six
 Number of I/O Lines:

Seven, configurable for input or output, with PWM control for LED driving
 Technology:

Patented spread-spectrum charge-transfer (direct mode)
 Key Outline Sizes:












6 mm x 6 mm or larger (panel thickness dependent); widely different sizes and
shapes possible
Layers Required:
 One
Electrode Materials:
 Etched copper
 Silver
 Carbon
 Indium Tin Oxide (ITO)
Panel Materials:
 Plastic
 Glass
 Composites
 Painted surfaces (low particle density metallic paints possible)
Panel Thickness:
 Up to 10 mm glass (electrode size dependent)
 Up to 5 mm plastic (electrode size dependent)
Key Sensitivity:
 Individually settable via simple commands over serial interface
Interface:
 I2C-compatible slave mode (100 kHz). Discrete detection outputs
Moisture Tolerance:
 Increased moisture tolerance based on hardware design and firmware tuning
Signal Processing:
 Self-calibration
 auto drift compensation
 noise filtering
 Adjacent Key Suppression® (AKS®)
Applications:
 Mobile appliances
Power:
 1.8 V to 5.5 V
Package:
 28-pin 4 x 4 mm QFN RoHS compliant IC
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1.2
CHG
SDA
SCL
RST
Pinout Configuration
IO3
1.1
IO4
Pinout and Schematic
SNS0K
1.
SNS1K
1
28 27 26 25 24 23 22
21
IO2
SNS2K
2
20
IO1
VDD
3
19
IO0
VSS
4
18
VSS
IO5
5
17
VDD
IO6
6
16
VDD
SNS3K
7
SNS5
SNS4
SNS3
SNS2
SNS5K
15
10 11 12 13 14
SNS1
9
SNS0
8
SNS4K
QT1060
Pin Descriptions
Table 1-1.
Pin Allocation
Pin
Name
Type
Description
If Unused, Connect To...
1
SNS1K
I/O
To Cs capacitor and to key
Leave open
2
SNS2K
I/O
To Cs capacitor and to key
Leave open
3
VDD
P
Positive power pin
4
VSS
P
Ground power pin
5
IO5
I/O
I/O Port Pin 5
Leave open and set as output
6
IO6
I/O
I/O Port Pin 6
Leave open and set as output
7
SNS3K
I/O
To Cs capacitor and to key
Leave open
8
SNS4K
I/O
To Cs capacitor and to key
Leave open
9
SNS5K
I/O
To Cs capacitor and to key
Leave open
10
SNS0
I/O
To Cs Capacitor
Leave open
11
SNS1
I/O
To Cs Capacitor
Leave open
12
SNS2
I/O
To Cs Capacitor
Leave open
13
SNS3
I/O
To Cs Capacitor
Leave open
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Table 1-1.
I
OD
Pin Allocation (Continued)
Pin
Name
Type
Description
If Unused, Connect To...
14
SNS4
I/O
To Cs Capacitor
Leave open
15
SNS5
I/O
To Cs Capacitor
Leave open
16
VDD
P
Positive power pin
17
VDD
P
Positive power pin
18
VSS
P
Ground power pin
19
IO0
I/O
I/O Port Pin 0
Leave open and set as output
20
IO1
I/O
I/O Port Pin 1
Leave open and set as output
21
IO2
I/O
I/O Port Pin 2
Leave open and set as output
22
CHG
OD
Change line
Leave open
23
SDA
OD
I2C Data line
Resistor to Vdd or
Vss only in standalone mode
24
SCL
OD
I2C Clock Line
Resistor to Vdd or
Vdd only in standalone mode
25
RST
I
Reset, active low
Vdd
26
IO3
I/O
I/O Port Pin 3
Leave open and set as output
27
IO4
I/O
I/O Port Pin 4
Leave open and set as output
28
SNS0K
I/O
To Cs capacitor and to key
Leave open
O
P
Output only, push-pull
Ground or power
Input only
Open drain output
I/O
Input/output
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Schematic
Figure 1-1. Typical Circuit
Vunreg
VDD
100nF
Voltage Reg
Note: Bypass capacitor to be tightly wired between
Vdd and Vss. Follow recommendations from
regulator manufacturer for input and output
capacitors.
CB1
25
VDD
VDD
VDD
17 16 3
SNS5K
RST
SNS5
SNS4K
6
5
27
IO Port
pins
26
21
20
19
IO6
SNS4
IO5
SNS3K
Rs5
9
KEY 5
15
Cs5
Rs4
8
KEY 4
14
Cs4
Rs3
7
KEY 3
SNS3 13
IO4
SNS2K
IO3
Cs3
Rs2
2
KEY 2
SNS2 12
IO2
IO1
SNS1K
IO0
Cs2
1
SNS0K
Rs1
KEY 1
SNS1 11
Cs1
28
Rs0
KEY 0
SNS0 10
Cs0
Keep these parts
close to the IC
QT1060
VDD
Rchg
100k
Change
SDA
22
SCL
CHG
23
2
I C-compatible Data
24
I2C-compatible Clock in
18
VSS
Standalone Mode
VSS
1.3
23
VDD
4
Note: The central pad on the underside of the chip is a
Vss pin and should be connected to ground.
Note:
SDA
SCL
24
In some systems it may be desirable to connect RST to the master reset signal.
For component values in Figure 1-1 check the following sections:
•
Section 3.1 on page 11: Cs capacitors (Cs0 – Cs5)
•
Section 3.2 on page 11: Series resistors (Rs0 – Rs5)
•
Section 3.5 on page 12: Voltage levels
•
Section 4.4 on page 15: SDA, SCL pull-up resistors (not shown)
•
Section 3.3 on page 11: LED traces
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Suggested regulator manufacturers:
•
Torex (XC6215 series)
•
Seiko (S817 series)
•
BCDSemi (AP2121 series)
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2.
Overview
2.1
Introduction
The AT42QT1060 (QT1060) is a digital burst mode charge-transfer (QT™ ) capacitive sensor driver designed
specifically for mobile phone applications. The device can sense from two to six keys; up to four keys can be
disabled by not installing their respective sense capacitors (Cs). It also has up to seven configurable input/output
lines, with Pulse Width Modulation (PWM) for driving LEDs.
This device includes all signal processing functions necessary to provide stable sensing under a wide variety of
changing conditions, and the outputs are fully de-bounced. Only a few external parts are required for operation.
The QT1060 modulates its bursts in a spread-spectrum fashion in order to heavily suppress the effects of external
noise, and to suppress RF emissions.
2.2
Keys
The QT1060 can have a minimum of two keys and a maximum of six keys. These can be constructed in different
shapes and sizes. See “Features” on page 1 for the recommended dimensions.
Unused keys should be disabled by removing the corresponding Cs and Rs components and connecting the SNS
pins as shown in the If Unused column of Table on page 2. The unused keys are always pared from the burst
sequence in order to optimize speed. See Section 6. on page 25 about setting up the keys.
2.3
Standalone Mode
The QT1060 can operate in a standalone mode where an I 2 C-compatible interface is not required. To enter
standalone mode, connect SDA to Vss and SCL to Vdd before powering up the QT1060.
In standalone mode the default start-up values are used except for the I/O mask (Address 23). The I/O mask is
configured so that all the I/Os are outputs (I/O mask = 0x7F). This means that key detection is reported via the
respective I/Os.
2.4
I/O Lines
2.4.1
Overview
There is an input/output (I/O) port consisting of seven lines that can be individually programmed as inputs or outputs.
They can be either a digital type or PWM. The PWM level can be set to 256 possible values and is common to all
lines.
The I/O lines are normally initialized as inputs. However, if an I2C interface is not used and the SDA and SCL pins
are connected to Vss and Vdd respectively, then the I/O lines are initialized as outputs (see Section 2.3).
The outputs can also be linked to either the detection channels or the output register to allow the outputs to be either
user controlled or to indicate detection. These options can be set in the pin control masks (see Table on page 16).
Unused I/O lines should be disabled by connecting as shown in the If Unused column of Table 1-1 on page 2. See
Section 6. on page 25 about setting up the I/O lines.
2.4.2
I/O Mask
A 1 in any bit position of this mask sets the corresponding pin to an output. If a bit is 0, the pin is an input and the
function of the PWM, detect and active state masks will not matter for this pin. The level of the input pins is reflected
in the input Status register. Changes to the logic levels on the inputs cause the CHG line to be asserted.
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2.4.3
PWM Mask
A 1 in any bit position in this mask sets the corresponding pin to operate in PWM mode when its user output buffer is
active and configured as an output. A zero sets the pin in digital mode. The PWM value is set in the PWM register
that is writable via I2C communication.
2.4.4
Detection Mask
A 1 in any bit position in this mask sets the corresponding pin to be controlled by the status register. If the pin is
configured as an output, it is asserted automatically if there is a detection on the corresponding sensor channel. A
zero in any bit sets the pin to be controlled by the user output buffer, allowing the user to control the pins directly.
2.4.5
Active Level Mask
A 1 in any bit position in this mask sets the corresponding pin to be active high if configured as an output. A zero sets
the pin to be active low.
2.5
Acquisition/Low Power Modes (LP)
There are several different acquisition modes. These are controlled via the Low Power (LP) mode byte (see Section
5.12 on page 20) which can be written to via I2C communication.
LP mode controls the intervals between acquisition measurements. Longer intervals consume lower power but have
increased response time. During calibration and during the detect integrator (DI) period, the LP mode is temporarily
set to LP mode 1 for a faster response.
The QT1060 operation is based on a fixed cycle time of approximately 16 ms. The LP mode setting indicates how
many of these periods exist per measurement cycle. For example, if LP mode = 1, there is an acquisition every cycle
(16 ms). If LP mode = 3, there is an acquisition every 3 cycles (48 ms), and so on.
SLEEP mode (LP mode = 0) is available for minimum current drain. In this mode, the device is inactive, with the
device status being held as it was before going to sleep, and no measurements are carried out.
LP settings above mode 32 (512 ms) result in slower thermal drift compensation and should be avoided in
applications where fast thermal transients occur.
If LP mode = 255 the device operates in Free-run mode. In this mode the device will not enter LP mode between
measurements. The device continuously performs measurements one after another, resulting in the fastest
response time but the highest power consumption.
2.6
Adjacent Key Suppression (AKS) Technology
The device includes the Atmel-patented Adjacent Key Suppression technology, to allow the use of tightly spaced
keys on a keypad with no loss of selectability by the user.
There can be one AKS group, implemented so that only one key in the group may be reported as being touched at
any one time. A key with a higher delta signal dominates and pushes a key with a smaller delta out of detect. This
allows a user to slide a finger across multiple keys with only the dominant key reporting touch.
The keys which are members of the AKS group can be set via the AKS mask (see Section 5.15 on page 21). Keys
outside the group may be in detect simultaneously.
For maximum flexibility there is no automatic key recalibration timeout on key detection. The user should issue a
recalibration command if the key has been in detect for too long, for example for more than 30 seconds (see Figure
2.10).
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2.7
Change Line
The Change line (see CHG in Figure 1-1 on page 4) signals when there is a change in state in the Detection or Input
status bytes and is active low. It is cleared (allowed to float high) when the host reads the status bytes.
If the status bytes change back to their original state before the host has read the status bytes (for example, a touch
followed by a release), the CHG line will be held low. In this case, a read to any memory location will clear the CHG
line.
The CHG line is open-drain and should be connected via a 100k resistor to Vdd. It is necessary for minimum power
operation as it ensures that the QT1060 can sleep for as long as possible. Communications wake up the QT1060
from sleep causing a higher power consumption if the part is randomly polled.
The keys enabled by the key bit mask or a change in the Input port status cause a key change interrupt (see Table 51 on page 16). Create a guard channel by removing that key from the key mask and including it in the AKS mask.
Touching the guard channel does not cause an interrupt. The key and AKS masks are set by using the mask
commands (see Table 5-1).
2.8
Types of Reset
2.8.1
External Reset
An external reset logic line can be used if desired, fed into the RST pin. However, under most conditions it is
acceptable to tie RST to Vdd.
2.8.2
Soft Reset
The host can cause a device reset by writing a nonzero value to the reset byte. This soft reset triggers the internal
watchdog timer on a ~16 ms interval.

After ~16 ms the device resets and wakes again.

After a further 30 ms initialization period the device begins responding to its I2C slave address.

After another ~80 ms the device asserts the CHG line to indicate it is ready for touch sensing.
The device NACKs any attempts to communicate with it during the first 30 ms of its initialization period.
After CHG goes low, the device calibrates the sensing channels. When complete, the CHG pin is set low once again.
2.9
Moisture Tolerance
The presence of water (condensation, sweat, spilt water, and so on) on a sensor can alter the signal values
measured and thereby affect the performance of any capacitive device. The moisture tolerance of QTouch devices
can be improved by designing the hardware and fine-tuning the firmware following the recommendations in the
application note Atmel AVR3002: Moisture Tolerant QTouch Design (www.atmel.com/Images/doc42017.pdf).
2.10
Calibration
The command byte can force a recalibration at any time by writing a nonzero value to the calibration byte. This can
be useful to clear out a stuck key condition after a prolonged period of uninterrupted detection.
When the device recalibrates, it also autosenses which keys are enabled by examining the burst length of each
electrode. If the burst length is either too short (if there is a missing or open Cs capacitor) or too long (a Cs capacitor
is shorted), the key is ignored until the next calibration.
The count of the number of currently enabled keys is found in the status response byte. This number can change
after a CAL command; for example, if a Cs capacitor is intermittent.
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2.11
Guard Channel
The device has a guard channel option, which allows any key, or combination of keys, to be configured as a guard
channel to help prevent false detection. Guard channel keys should be more sensitive than the other keys (physically
bigger or larger Cs), subject to burst length limitations (see Section 2.12.3).
With guard channel enabled, the designated key(s) is connected to a sensor pad which detects the presence of
touch and overrides any output from the other keys using the chip AKS feature. The guard channel option is enabled
by an I2C command.
To enable a guard channel the relevant key should be removed from the key mask (see Table 5-1 on page 16). In
addition, the guard channel needs to be included within the AKS mask with the other keys for the guard function to
operate. Note that a detection on the guard channel does not cause a change request.
With the guard channel not enabled, all the keys work normally.
Figure 2-1. Guard Channel Example
Guard channel
2.12
Signal Processing
2.12.1 Detect Threshold
The device detects a touch when the signal has crossed a threshold level and remained there for a specified number
of counts (see Section 5.11 on page 19). This can be altered on a key-by-key basis using the key threshold I2C
commands.
2.12.2 Detect Integrator
The device features a fast detection integrator counter (DI filter), which acts to filter out noise at the small expense of
slower response time. The DI filter requires a programmable number of consecutive samples confirmed in detection
before the key is declared to be touched. There is also a fast DI on the end of the detection (see Section 5.20 on
page 23). The fast DI will not be applied at the start of a detection if a detection on any other channel has already
been declared.
2.12.3 Burst Length Limitations
In a balanced system common signals are regarded as thermal shifts and are removed by the relative referencing
drifting, if enabled. This means that the burst lengths must be similar. This can be checked by reading the reference
values (Address 52 – 63) and making sure that they are similar. The absolute maximum difference is that the
maximum value of reference is less than three times the minimum value amongst all the channels. It is
recommended having the burst lengths (references) as close together as possible, through better routing and layout.
For example, if the keys have references of 250, 230, 220, 240, 200 and 210, this is acceptable. If the keys have
references of 250, 230, 220, 240, 200 and 710, the efficiency of the relative referencing drifting will be affected. The
last key’s (710) layout should be changed or relative referencing be disabled. The closer the references are in value,
the better the relative referencing drifting performs.
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If only normal drifting is enabled, the burst lengths can have bigger variations.
The normal operating limit of burst lengths is between 16 and 1536 counts. A value out of these limits causes the
respective key to be disabled and not measured until a calibration. Signal value for an out-of-limit key is zero.
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3.
Wiring and Parts
3.1
Cs Sample Capacitors
Cs0 – Cs5 are the charge sensing sample capacitors; normally they are identical in nominal value. The optimal Cs
values depend on the thickness of the panel and its dielectric constant. Thicker panels require larger values of Cs.
Typical values are 2.2 nF to 10 nF.
The value of Cs should be chosen so that a light touch on a key produces a reduction of ~10 – 20 in the key signal
value (see Section 5.22 on page 23). The chosen Cs value should never be so large that the key signals exceed
~1000, as reported by the chip in the debug data.
The Cs capacitors must be X7R or PPS film type, for stability. For consistent sensitivity, they should have a
10% tolerance. A 20% tolerance may cause small differences in sensitivity from key to key and unit to unit. If a
channel is not used, the Cs capacitor may be omitted.
3.2
Rs Resistors
Series resistors Rs (Rs0 – Rs5) are inline with the electrode connections and should be used to limit electrostatic
discharge (ESD) currents and to suppress radio frequency (RF) interference. They should be approximately 4.7 k
to 20 k each.
Although these resistors may be omitted, the device may become susceptible to external noise or radio frequency
interference (RFI). For details of how to select these resistors see the Application Note QTAN0002, Secrets of a
Successful QTouch Design, downloadable from the Touch Technology area of the Atmel website, www.atmel.com.
3.3
LED Traces and Other Switching Signals
Digital switching signals near the sense lines induce transients into the acquired signals, deteriorating the SNR
performance of the device. Such signals should be routed away from the sensing traces and electrodes, or the
design should be such that these lines are not switched during the course of signal acquisition (bursts).
LED terminals which are multiplexed or switched into a floating state, and which are within, or physically very near, a
key (even if on another nearby PCB) should be bypassed to either Vss or Vdd with at least a 10 nF capacitor. This is
to suppress capacitive coupling effects which can induce false signal shifts. The bypass capacitor does not need to
be next to the LED, in fact it can be quite distant. The bypass capacitor is noncritical and can be of any type.
LED terminals which are constantly connected to Vss or Vdd do not need further bypassing.
3.4
PCB Cleanliness
Modern no-clean flux is generally compatible with capacitive sensing circuits.
CAUTION: If a PCB is reworked to correct soldering faults relating to the device, or to
any associated traces or components, be sure that you fully understand the nature of the
flux used during the rework process. Leakage currents from hygroscopic ionic residues
can stop capacitive sensors from functioning. If you have any doubts, a thorough
cleaning after rework may be the only safe option.
If a PCB is reworked in any way, clean it thoroughly to remove all traces of the flux residue around the capacitive
sensor components. Dry it thoroughly before any further testing is conducted.
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3.5
Power Supply
See Section 7.2 on page 26 for the power supply range. If the power supply fluctuates slowly with temperature, the
device tracks and compensates for these changes automatically with only minor changes in sensitivity. If the supply
voltage drifts or shifts quickly, the drift compensation mechanism is not able to keep up, causing sensitivity
anomalies or false detections.
The usual power supply considerations with QT parts apply to the device. The power should be clean and come from
a separate regulator if possible. However, this device is designed to minimize the effects of unstable power, and
except in extreme conditions should not require a separate Low Dropout (LDO) regulator.
See underneath Figure 1-1 on page 4 for suggested regulator manufacturers.
Caution: A regulator IC shared with other logic can result in erratic operation and is not
advised.
A single ceramic 0.1 µF bypass capacitor, with short traces, should be placed very close
to the power pins of the IC. Failure to do so can result in device oscillation, high current
consumption, erratic operation, and so on.
It is assumed that a larger bypass capacitor (~1 µF) is somewhere else in the power circuit; for example, near the
regulator.
To assist with transient regulator stability problems, the QT1060 waits 500 µs any time it wakes up from a sleep state
(that is, in SLEEP and LP modes) before acquiring, to allow Vdd to fully stabilize.
3.6
Bus Specification
Table 3-1.
I2C Bus Specification
Parameter
Unit
Address space
7-bit
Maximum bus speed (SCL)
100 kHz
Hold time START condition
4 µs minimum
Setup time for STOP condition
4 µs minimum
Bus free time between a STOP and START condition
4.7 µs minimum
Rise times on SDA and SCL
1 µs maximum
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4.
I2C Communications
4.1
I2C Protocol
4.1.1
Protocol
The I2C protocol is based around access to an address table (see Table 5-1 on page 16) and supports multibyte
reads and writes. The maximum clock rate is 100 kHz.
4.1.2
Signals
The I2C interface requires two signals to operate:

SDA - Serial Data

SCL - Serial Clock
A third line, CHG, is used to signal when the device has seen a change in the status byte:

4.1.3
CHG: Open-drain, active low when any capacitive key in the key mask has changed state or any input line has
changed state since the last I2C read. After reading the two status bytes, this pin floats (high) again if it is
pulled up with an external resistor. If the status bytes change back to their original state before the host has
read the status bytes (for example, a touch followed by a release), the CHG line will be held low. In this case,
a read to any memory location will clear the CHG line.
Clock Stretching
The device has an internal monitor that resets its I2C hardware if either I2C-compatible line is held low, without the
other line changing, for more than about 14 ms. It is important that no other device on the bus clock stretches for
14 ms, otherwise the monitor will reset the I2C hardware and transfers with the chip may be corrupted.
If the device is configured to run in stand-alone mode, the monitor will be turned off.
4.2
I2C Address
There is one preset I2C address of 0x12. This is not changeable.
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4.3
Data Read/Write
4.3.1
Writing Data to the Device
The sequence of events required to write data to the device is shown next
Host to Device
S
SLA+W
A
MemAddress
Device Tx to Host
Data
A
P
A
.
Table 4-1.
Description of Write Data Bits
Key
Description
S
Start condition
SLA+W
Slave address plus write bit
A
Acknowledge bit
MemAddress
Target memory address within device
Data
Data to be written
P
Stop condition
1.
The host initiates the transfer by sending the START condition
2.
The host follows this by sending the slave address of the device together with the WRITE bit.
3.
The device sends an ACK.
4.
The host then sends the memory address within the device it wishes to write to.
5.
The device sends an ACK.
6.
The host transmits one or more data bytes; each is acknowledged by the device.
7.
If the host sends more than one data byte, they are written to consecutive memory addresses.
8.
The device automatically increments the target memory address after writing each data byte.
9.
After writing the last data byte, the host should send the STOP condition.
Note: the host should not try to write beyond address 255 because this is the limit of the device’s internal memory
address.
4.3.2
Reading Data From the Device
The sequence of events required to read data from the device is shown next.
Host to Device
S
SLA+W
A
Data 1
A
Device Tx to Host
MemAddress A P
Data 2
S
A
SLA+R
A
Data n
A
P
1.
The host initiates the transfer by sending the START condition
2.
The host follows this by sending the slave address of the device together with the WRITE bit.
3.
The device sends an ACK.
4.
The host then sends the memory address within the device it wishes to read from.
5.
The device sends an ACK.
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6.
The host must then send a STOP and a START condition followed by the slave address again but this time
accompanied by the READ bit.
7.
The device returns an ACK, followed by a data byte.
8.
The host must return either an ACK or NACK.
9.
4.4
1.
If the host returns an ACK, the device subsequently transmits the data byte from the next address. Each
time a data byte is transmitted, the device automatically increments the internal address. The device
continues to return data bytes until the host responds with a NACK.
2.
If the host returns a NACK, it should then terminate the transfer by issuing the STOP condition.
The device resets the internal address to the location indicated by the memory address sent to it previously.
Therefore, there is no need to send the memory address again when reading from the same location.
SDA, SCL
The I2C bus transmits data and clock with SDA and SCL respectively. They are open-drain; that is I2C master and
slave devices can only drive these lines low or leave them open. The termination resistors (not shown) pull the line
up to Vdd if no I2C-compatible device is pulling it down.
The termination resistors commonly range from 1 k to 10 k and should be chosen so that the rise times on SDA
and SCL meet the I2C specifications (1 µs maximum).
Standalone mode: if I2C-compatible communications are not required, then standalone mode can be enabled by
connecting SDA to Vss and SCL to Vdd. See Section 2.3 on page 6 for more information.
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5.
Setups
5.1
Introduction
The device calibrates and processes signals using a number of algorithms specifically designed to provide for high
survivability in the face of adverse environmental challenges. User-defined Setups are employed to alter these
algorithms to suit each application. These Setups are loaded into the device over the I2C serial interfaces.
Table 5-1.
Internal Register Address Allocation
Address
Use
R/W
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Major ID (= 3)
Bit 2
Bit 1
Bit 0
0
Chip ID
R
Minor ID (= 1)
1
Version
R
Device version number
2
Minor version
R
Minor version number
3
Reserved
4
Detection status
R
Calibrating
Res
Key5
Key4
Key3
Key2
Key1
Key0
5
Input port status
R
Res
Input 6
Input 5
Input 4
Input 3
Input 2
Input 1
Input 0
Res
DRIFT
Reserved
6 – 11
Reserved
Reserved
12
Calibrate
R/W
Writing a nonzero value forces a calibration
13
Reset
R/W
Writing a nonzero value forces a reset
14
Drift Option
R/W
Res
15
Positive
Recalibration Delay
R/W
MSB
LSB
16
NTHR key 0
R/W
MSB
LSB
17
NTHR key 1
R/W
MSB
LSB
18
NTHR key 2
R/W
MSB
LSB
19
NTHR key 3
R/W
MSB
LSB
20
NTHR key 4
R/W
MSB
LSB
21
NTHR key 5
R/W
MSB
LSB
22
LP mode
R/W
MSB
LSB
23
I/O mask
R/W
MSB
IO6
IO5
IO4
IO3
IO2
IO1
IO0
24
Key mask
R/W
CAL
Res
Key 5
Key 4
Key 3
Key 2
Key 1
Key 0
25
AKS mask
R/W
Res
Res
Key 5
Key 4
Key 3
Key 2
Key 1
Key 0
26
PWM mask
R/W
Res
IO6
IO5
IO4
IO3
IO2
IO1
IO0
27
Detection mask
R/W
Res
IO6
IO5
IO4
IO3
IO2
IO1
IO0
28
Active level mask
R/W
Res
IO6
IO5
IO4
IO3
IO2
IO1
IO0
29
User output buffer
R/W
Res
IO6
IO5
IO4
IO3
IO2
IO1
IO0
30
DI
R/W
MSB
LSB
31
PWM level
R/W
MSB
LSB
Res
Res
Res
Res
Res
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Table 5-1.
Address
Internal Register Address Allocation (Continued)
Use
R/W
32 – 39
Reserved
40 – 51
Key 0 – 5 Signal
R
52 – 63
Key 0 – 5 Reference
R
Note:
5.2
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
b2
b1
Bit 1
Bit 0
Reserved
Res = Reserved; only write zero to these bits.
Address 0: Chip ID
Table 5-2.
Address
Chip ID
b7
0
b6
b5
b4
b3
MAJOR ID
b0
MINOR ID
MAJOR ID: Reads back as 3
MINOR ID: Reads back as 1
5.3
Address 1: Device Version Number
Table 5-3.
Address
Device Version Number
b7
b6
b5
1
b4
b3
b2
b1
b0
b2
b1
b0
DEVICE VERSION NUMBER
DEVICE VERSION NUMBER: this is the 8-bit firmware version number (0x03).
5.4
Address 2: Minor Version Number
Table 5-4.
Address
2
Minor Version Number
b7
b6
b5
b4
b3
MINOR VERSION NUMBER
MINOR VERSION NUMBER: this is the 8-bit minor firmware revision number (0x00).
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5.5
Address 4: Detection Status
Table 5-5.
Detection Status
Address
b7
b6
b5
b4
b3
b2
b1
b0
4
CAL
Reserved
KEY5
KEY4
KEY3
KEY2
KEY1
KEY0
CAL: a 1 indicates that the QT1060 is currently calibrating.
KEY0 – 5: bits 0 to 5 indicate which keys are in detection, if any; touched keys report as 1, untouched or disabled
keys report as 0.
5.6
Address 5: Input Port Status
Table 5-6.
Input Port Status
Address
b7
b6
b5
b4
b3
b2
b1
b0
5
Reserved
INPUT 6
INPUT 5
INPUT 4
INPUT 3
INPUT 2
INPUT 1
INPUT 0
INPUT 0 – 6: these bits indicate the state of the I/O lines that are configured as inputs; 1 indicating logic 1 on the
input, 0 indicating logic 0. The bits corresponding to any keys configured as outputs read as 0.
5.7
Address 12: Calibrate
Table 5-7.
Address
Calibrate
b7
b6
12
b5
b4
b3
b2
b1
b0
Writing a nonzero value forces a calibration
Writing any nonzero value into this address triggers the device to start a calibration cycle. The CAL flag in the status
register is set when begun and cleared when the calibration has finished.
5.8
Address 13: Reset
Table 5-8.
Address
13
Reset
b7
b6
b5
b4
b3
b2
b1
b0
Writing a nonzero value forces a reset
Writing any nonzero value to this address triggers the device to reset.
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5.9
Address 14: Drift Option
Table 5-9.
Address
Drift Option
b7
b6
b5
14
b4
b3
b2
b1
Reserved
b0
DRIFT
DRIFT: there are two types of drift option: normal and relative referencing.
If DRIFT = 0, relative referencing and normal drift are enabled.
If DRIFT = 1, only normal drift is enabled.
Relative referencing compensates for fast signal drifts that are common to all keys. This mode is suitable if the keys
are placed close to each other and have closely matched burst lengths (see Section 2.12.3 on page 9). Normal
drifting is also carried out but at a slower rate compared to the relative referencing drift rate.
Default: 1 (relative referencing Off)
5.10
Address 15: Positive Recalibration Delay
Table 5-10. Positive Recalibration Delay
Address
b7
b6
15
b5
b4
b3
b2
b1
b0
POSITIVE RECALIBRATION DELAY
POSITIVE RECALIBRATION DELAY: If any key is found to have a significant drop in capacitance, that is, an “away
from touch” signal, then this is deemed to be an error condition. If this condition persists for more than the Positive
Recalibration Delay (PRD) period, then an automatic recalibration is carried out on all keys.
The condition that the error is triggered on depends on the drift compensation mode. If relative referencing drifting is
enabled (DRIFT = 0), then an “away from touch” delta of more than four counts triggers the error. If only normal
mode drifting is enabled (DRIFT = 1), then an “away from touch” delta of more than 75% of the NTHR triggers the
error.
In LP mode the Positive Recalibration Delay is the PRD value multiplied by 16 ms cycle time; in Free Run Mode the
Positive Recalibration delay is the PRD value multiplied by the minimum cycle time (~7 ms, but depends on Cs and
design).
Default: 40 (40 × 16 ms = 640 ms; default LP is 32 ms)
5.11
Address 16 – 21: NTHR Keys 0 – 5
Table 5-11. NTHR Keys 0 – 5
Address
b7
16 – 21
MSB
b6
b5
b4
b3
b2
b1
b0
LSB
NTHR Keys 0 – 5: these 8-bit values set the threshold value for each key to register a detection.
Default: 10 counts
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5.12
Address 22: LP Mode
Table 5-12. LP Mode
Address
b7
22
MSB
b6
b5
b4
b3
b2
b1
b0
LSB
LP Mode: this 8-bit value determines the number of 16 ms intervals between key measurements. Longer intervals
between measurements yield lower power consumption at the expense of slower response to touch.
LP7 – 0
Mode
0
SLEEP
1
16 ms
2
32 ms
3
48 ms
4
64 ms
...
...
254
4.064 s
255
Free-run
A value of zero causes the device to enter SLEEP mode where no measurements are performed.
A value of 255 causes the device to enter Free-run mode where measurements are continuously performed without
entering a low power mode between measurements. This provides the fastest response time but also the highest
power consumption.
Default: 2 (32 ms between key acquisitions)
5.13
Address 23: I/O Mask
Table 5-13. I/O Mask
Address
b7
b6
b5
b4
b3
b2
b1
b0
23
Reserved
IO6
IO5
IO4
IO3
IO2
IO1
IO0
IO0 – IO6: these bits control the direction of the I/O pins. A 1 sets the pin as an output, a 0 as an input. See Section
5.24 on page 24 for I/O register precedence and example usage.
Default: 0 (all I/Os are set as inputs, when using the I2C-compatible mode)
(all I/Os are set as outputs (0x7F), when using the standalone mode)
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5.14
Address 24: Key Mask
Table 5-14. Key Mask
Address
b7
b6
b5
b4
b3
b2
b1
b0
24
CAL
Reserved
KEY5
KEY4
KEY3
KEY2
KEY1
KEY0
CAL: this bit controls whether the CAL bit causes a CHG transition.
KEY0 – 5 (Key Mask): these bits control whether a change in the corresponding bit in the detection status register
generates a transition on the CHG line. A 1 allows the status bit to cause a CHG request, a 0 stops the
corresponding bit from causing a CHG request.
Default: 0xBF (all bits create a CHG request)
5.15
Address 25: AKS Mask
Table 5-15. AKS Mask
Address
25
b7
b6
Reserved Reserved
b5
b4
b3
b2
b1
b0
KEY5
KEY4
KEY3
KEY2
KEY1
KEY0
KEY0 – 5 (AKS Mask): these bits control which keys are included in the AKS group. A 1 means the corresponding
key is included in the AKS group and may only go into detect when it has the largest signal change of any key in the
group. A 0 means that it is excluded and can go into detect whenever its threshold is passed.
Default: 0x00 (no keys are within the AKS group)
5.16
Address 26: PWM Mask
Table 5-16. PWM Mask
Address
b7
b6
b5
b4
b3
b2
b1
b0
26
Reserved
I/O6
I/O5
I/O4
I/O3
I/O2
I/O1
I/O0
I/O0 – 6 (PWM Mask): these bits control which I/Os that are configured as outputs, and its user output buffer
activated, will output a PWM signal. A 1 means the output generates a PWM signal, a 0 means the output generates
a logic level. The active level of the output (both logical and PWM) is determined by the Active level mask. See
Section 5.24 on page 24 for I/O register precedence and example usage.
Default: 0x00 (PWM is off on all I/Os)
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5.17
Address 27: Detection Mask
Table 5-17. Detection Mask
Address
b7
b6
b5
b4
b3
b2
b1
b0
27
Reserved
I/O6
I/O5
I/O4
I/O3
I/O2
I/O1
I/O0
I/O0 – 6 (Detection Mask): these bits control which I/Os that are configured as outputs will be controlled by their
corresponding capacitive key. A 1 means the output n generates an active output when key n is detecting a touch. A
0 means that the output is controlled by the output buffer. See Section 5.24 on page 24 for I/O register precedence
and example usage.
Default: 0x3F (all I/Os are controlled by key status)
5.18
Address 28: Active Level Mask
Table 5-18. Active Level Mask
Address
b7
b6
b5
b4
b3
b2
b1
b0
28
Reserved
I/O6
I/O5
I/O4
I/O3
I/O2
I/O1
I/O0
I/O0 – 6 (Active Level Mask): these bits control the active logic level for the I/Os that are configured as outputs. A 1
means the output generates an active high output, a 0 means that the output is active low. See Section 5.24 for I/O
register precedence and example usage.
Default: 0 (all I/Os are active low output)
5.19
Address 29: User Output Buffer
Table 5-19. User Output Buffer
Address
b7
b6
b5
b4
b3
b2
b1
b0
29
Reserved
I/O6
I/O5
I/O4
I/O3
I/O2
I/O1
I/O0
I/O0 – 6 (User Output Buffer): these bits control the output level for the I/Os that are configured as outputs. A 1
means the output generates an active output, a 0 means that the output is inactive. See Section 5.24 on page 24 for
I/O register precedence and example usage.
Default: 0 (all I/Os inactive)
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5.20
Address 30: Detection Integrator
Table 5-20. Detection Integrator
Address
b7
30
MSB
b6
b5
b4
b3
b2
b1
DETECTION INTEGRATOR
b0
LSB
DETECTION INTEGRATOR: this 8-bit value controls the number of consecutive measurements that must be
confirmed as having passed the key threshold before that key is registered as being in detect. A value of zero should
not be used.
Default: 3
5.21
Address 31: PWM Level
Table 5-21. PWM Level
Address
b7
31
MSB
b6
b5
b4
b3
b2
b1
PWM LEVEL
b0
LSB
PWM LEVEL: this 8-bit value controls the duty cycle of the PWM output signal. Valid values are between 0...255.
There is a constant level band at either end of the range, so:

A value of 0...10 gives a 100% low output

A value of 250...255 gives a 100% high output
Default: 128 (50:50 duty cycle)
5.22
Address 40 – 51: Key Signal
Table 5-22. Key Signal
Address
b7
b6
b5
b4
b3
b2
40
LSB OF KEY SIGNAL FOR KEY 0
41
MSB OF KEY SIGNAL FOR KEY 0
42 – 51
LSB/MSB OF KEY SIGNAL FOR KEYS 1 – 5
b1
b0
KEY SIGNAL: addresses 40 – 51 allow key signals to be read for each key, starting with key 0. There are two bytes
of data for each key. These are the key’s 16-bit key signals which are accessed as two 8-bit bytes, stored LSB first.
These addresses are read-only.
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5.23
Address 52 – 63: Reference Data
Table 5-23. Reference Data
Address
b7
b6
b5
b4
b3
b2
b1
52
LSB OF REFERENCE DATA FOR KEY 0
53
MSB OF REFERENCE DATA FOR KEY 0
54 – 63
LSB/MSB OF REFERENCE DATA FOR KEYS 1 – 5
b0
REFERENCE DATA: addresses 52 – 63 allow reference data to be read for each key, starting with key 0. There are
two bytes of data for each key. These are the key’s 16-bit reference data which is accessed as two 8-bit bytes, stored
LSB first. These addresses are read-only.
5.24
Mask Precedence
Table 5-24 gives the order of priority for the settings in the mask inputs/outputs. The settings in the left-most column
have the highest priority, those in the second-left have the next priority, and so on. If two or more settings are
incompatible then the setting in the left-hand column overrides the other. The right-most column, I/O Function,
specifies the expected result.
Table 5-24. Input/Output Mask Precedence
Note:
I/O Mask
(bit n)
Detection
Mask (bit n)
PWM Mask
(bit n)
Active Level
Mask (bit n)
User Reg
(bit n)
QTouch Key
(channel n)
I/O Function
(I/O n)
0
X
X
X
X
X
Digital Input
1
0
0
0
0
X
Output - Vdd
1
0
0
0
1
X
Output - 0 V
1
0
0
1
0
X
Output - 0 V
1
0
0
1
1
X
Output - Vdd
1
0
1
0
0
X
Output - Vdd
1
0
1
0
1
X
PWM Output
1
0
1
1
0
X
Output - 0 V
1
0
1
1
1
X
PWM Output
1
1
0
0
X
Untouched
Output - Vdd
1
1
0
0
X
Touched
Output - 0 V
1
1
0
1
X
Untouched
Output - 0 V
1
1
0
1
X
Touched
Output - Vdd
1
1
1
0
X
Untouched
Output - Vdd
1
1
1
0
X
Touched
PWM Output
1
1
1
1
X
Untouched
Output - 0 V
1
1
1
1
X
Touched
PWM Output
X = don’t care (can be a 1 or a 0)
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6.
Setting Up Procedures
To Set Up Keys
To Set Up I/O Lines
Set the number of keys required by
leaving the SNS pins unconnected in
unused keys.
Determine the direction of the I/O
lines. If any lines are unused, set
them to be outputs and leave them
unconnected.
[Address 23: I/O Mask]
Determine whether a change in the
corresponding bit in the detection
status register generates a transition
on the CHG line.
[Address 24: Key Mask]
Determine which I/Os that are
configured as outputs will be
controlled by their corresponding
capacitive key.
[Address 27: Detection Mask]
Determine which keys are in the AKS
group.
[Address 25: AKS Mask]
Determine the duty cycle of the PWM
output signal.
[Address 31: PWM Level]
Determine the number of
measurements that must be
confirmed as having passed the key
threshold before that key is registered
as being in detect.
Determine which I/Os that are
configured as outputs will output a
PWM signal.
[Address 30: Detection Integrator]
[Address 26: PWM Mask]
Tune the sensitivity of the keys by
adjusting the value of the sampling
capacitor, Cs and the negative
threshold (NTHR)
[Address 16 – 21: NTHR]
Determine the active logic level for the
I/Os that are configured as outputs.
[Address 28: Active Level Mask]
Determine the output level for the I/Os
that are configured as outputs.
[Address 29: User Output Buffer]
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7.
Specifications
7.1
Absolute Maximum Specifications
Vdd
–0.5 to +6 V
Max continuous pin current, any control or drive pin
±10 mA
Short circuit duration to ground, any pin
infinite
Short circuit duration to Vdd, any pin
infinite
Voltage forced onto any pin
–0.6 V to (Vdd + 0.6) V
CAUTION: Stresses beyond those listed under Absolute Maximum Specifications may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or other conditions beyond
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
specification conditions for extended periods may affect device reliability.
7.2
Recommended Operating Conditions
Operating temp
–40oC to +85oC
Storage temp
–55oC to +125oC
Vdd
+1.8 V to 5.5 V
Supply ripple+noise
±25 mV
Cx load capacitance per key
2 – 20 pF
7.3
DC Specifications
Vdd = 3.3 V, Cs = 10 nF, load = 5 pF, 32 ms default sleep, Ta = recommended range, unless otherwise noted
Parameter
Description
Minimum
Typical
Maximum
Units
Notes
Vil
Low input logic level
–
–
0.2 × Vdd
V
Vih
High input logic level
0.6 × Vdd
–
–
V
Vol
Low output voltage
–
–
0.5
V
4 mA sink
Voh
High output voltage
Vdd – 0.7 V
–
–
V
1 mA source
Iil
Input leakage current
–
–
±1
µA
Ar
Acquisition resolution
–
8
–
bits
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7.4
Current Consumption
Cs = 10nF, Cx = 5 pF, Rs = 10k
Idd (µA) at Vdd =
LP Mode
5V
3.3 V
1.8 V
0 (SLEEP)
2.48
1.8
1.1
1 (16 ms)
1745
1135
403
2 (32 ms)
1615
1065
373
4 (64 ms)
1545
1030
360
8 (128 ms)
1510
1010
351
16 (256 ms)
1500
1000
348
32 (512 ms)
1485
995
346
64 (1024 ms)
1475
992
345
7.5
Timing Specifications
Parameter
Description
Minimum
Typical
Maximum
Units
Notes
DI setting × 16 ms
–
LP mode +
(DI setting × 16 ms)
ms
Under host control
TR
Response time
FQT
Sample frequency
162
180
198
kHz
Modulated spreadspectrum (chirp)
TD
Power-up delay to
operate/calibration
time
–
<230
–
ms
Can be longer if
burst is very long.
FI2C
I2C clock rate
–
–
100
kHz
–
Fm
Burst modulation,
–
±8
–
%
–
Reset pulse width
5
–
–
µs
–
Clock stretch
–
25
40
µs
–
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7.6
Mechanical Dimensions
Note:
The central pad on the underside of the QFN chip should be connected to ground. Do not run any tracks
underneath the body of the chip, only ground.
*
Z
$
%*$*$x
F
#"
*$x
F
^
`
G\Q
YGG
Z
$
V
+
G\Y?
=\zE
"##"*$x
!"#$% #&'*+-;<
=>?<@E
F
GG
GJG
GG
F
GGG
GG
GGQ
V
GX
G
GX
GGY$;
ZJQ
\GG
\GQ
ZQ
\G
\Q
$
ZJQ
\GG
\GQ
$
\Q
ZQ
\G
G\Q
+
GZQ
G\G
G\Q
^
GGG
_
GG
`
GG
_
_
{-{\z\zG^{+
&G\Q{
\z\$z
{#&^$&
^#&|<;!+
=|;!E
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7.7
Marking
There are two possible types of chip marking.
28
Pin 1 ID
1
Abbreviation of Part
number;
AT42QT1060-MMU
LTCODE
Chip Traceability
Code
1060
AT
Program week code number 1-52 where:
A = 1, B = 2...Z = 26
then using the underscore
A = 27...Z = 52
28
Pin 1 ID
1
Part number;
AT42QT1060-MMU
Chip
Traceability
Code
AT42
QT1060
-MMU
LTCODE
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7.8
Part Number
Part Number
Description
AT42QT1060-MMU
28-pin 4 x 4 mm QFN RoHS compliant IC
The part number comprises:
AT = Atmel
42 = Touch Business Unit
QT = Charge-transfer technology
1060 = (1) Keys (06) number of channels (0) variant number
MMU = Package identifier
7.9
Moisture Sensitivity Level (MSL)
MSL Rating
Peak Body Temperature
Specifications
MSL1
260oC
IPC/JEDEC J-STD-020
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Appendix A. I2C Basics
A.1
Interface Bus
The device communicates with the host over an I2C bus. The following sections give an overview of the bus; more
detailed information is available from www.i2C-bus.org. Devices are connected to the I2C bus as shown in Figure A1. Both bus lines are connected to Vdd via pull-up resistors. The bus drivers of all I2C devices must be open-drain
type. This implements a wired AND function that allows any and all devices to drive the bus, one at a time. A low
level on the bus is generated when a device outputs a zero.
Figure A-1.
I2C Interface Bus
Vdd
Device 1
Device 2
Device 3
Device n
R1
R2
SDA
SCL
A.2
Transferring Data Bits
Each data bit transferred on the bus is accompanied by a pulse on the clock line. The level of the data line must be
stable when the clock line is high; the only exception to this rule is for generating START and STOP conditions.
Figure A-2.
Data Transfer
SDA
SCL
Data Stable
Data Stable
Data Change
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A.3
START and STOP Conditions
The host initiates and terminates a data transmission. The transmission is initiated when the host issues a START
condition on the bus, and is terminated when the host issues a STOP condition. Between the START and STOP
conditions, the bus is considered busy. As shown in Figure A-3, START and STOP conditions are signaled by
changing the level of the SDA line when the SCL line is high.
Figure A-3.
START and STOP Conditions
SDA
SCL
START
A.4
STOP
Address Byte Format
All address bytes are 9 bits long, consisting of 7 address bits, one READ/WRITE control bit and an acknowledge bit.
If the READ/WRITE bit is set, a read operation is performed, otherwise a write operation is performed. When the
device recognizes that it is being addressed, it will acknowledge by pulling SDA low in the ninth SCL (ACK) cycle. An
address byte consisting of a slave address and a READ or a WRITE bit is called SLA+R or SLA+W, respectively.
The most significant bit of the address byte is transmitted first. The address sent by the host must be consistent with
that selected with the option jumpers.
Figure A-4.
Address Byte Format
Addr MSB
Addr LSB
R/W
ACK
7
8
9
SDA
SCL
START
1
2
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A.5
Data Byte Format
All data bytes are 9 bits long, consisting of 8 data bits and an acknowledge bit. During a data transfer, the host
generates the clock and the START and STOP conditions, while the receiver is responsible for acknowledging the
reception. An acknowledge (ACK) is signaled by the receiver pulling the SDA line low during the ninth SCL cycle. If
the receiver leaves the SDA line high, a NACK is signaled.
Figure A-5.
Data Byte Format
Data MSB
Data LSB
ACK
8
9
Aggregate
SDA
SDA from
Transmitter
SDA from
Receiver
SCL from
Master
1
2
7
Data Byte
SLA+R/W
A.6
Stop or Next
Data Byte
Combining Address and Data Bytes into a Transmission
A transmission consists of a START condition, an SLA+R/W, one or more data bytes and a STOP condition. The
wired ANDing of the SCL line is used to implement handshaking between the host and the device. The device
extends the SCL low period by pulling the SCL line low whenever it needs extra time for processing between the
data transmissions.
Note: Each write or read cycle must end with a stop condition. The device may not respond correctly if a cycle is
terminated by a new start condition.
Figure A-6 shows a typical data transmission. Note that several data bytes can be transmitted between the
SLA+R/W and the STOP.
Figure A-6.
Byte Transmission
Addr MSB
Addr LSB
R/W
ACK
7
8
9
Data MSB
Data LSB
ACK
8
9
SDA
SCL
1
START
1
2
SLA+RW
2
7
Data Byte
STOP
A.7
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Revision History
Revision Number
History
Revision A – September 2008

Initial Release for code revision 3.0
Revision B – October 2008

Minor amendments to burst length limitations
Revision C – November 2008

Minor amendments to improve clarity
Revision D – December 2008

Chip ID updated
Revision E – February 2009

Additional information on I2C interface added
Revision F – November 2012

Updated PWM information and clock stretch timing added
Revision G – May 2013

Applied new template
Revision H – April 2015

Updated MSL value from 3 to 1
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