Reliability Report

AOS Semiconductor
Product Reliability Report
AOD2916,
rev A
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
www.aosmd.com
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This AOS product reliability report summarizes the qualification result for AOD2916. Accelerated
environmental tests are performed on a specific sample size, and then followed by electrical test
at end point. Review of final electrical test result confirms that AOD2916 passes AOS quality and
reliability requirements.
Table of Contents:
I.
II.
III.
IV.
Product Description
Package and Die information
Environmental Stress Test Summary and Result
Reliability Evaluation
I. Product Description:
The AOD2916 uses trench MOSFET technology that is uniquely optimized to provide the most
efficient high frequency switching performance. Both conduction and switching power losses are
minimized due to an extremely low combination of RDS(ON), Ciss and Coss.
This device is ideal for boost converters and synchronous rectifiers for consumer, telecom,
industrial power supplies and LED backlighting.
-RoHS Compliant
-Halogen-Free
Details refer to the datasheet.
II. Die / Package Information:
AOD2916
Standard sub-micron
100V N channel MOSFET
Package Type
TO252
Lead Frame
Bare Cu
Die Attach
Soft solder
Bonding
Al & Au wire
Mold Material
Epoxy resin with silica filler
Moisture Level
Up to Level 1 *
Note * based on info provided by assembler and mold compound supplier
Process
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III. Result of Reliability Stress for AOD2916
Test Item
Test Condition
Time
Point
MSL
Precondition
168hr 85°
c
/85%RH +3 cycle
reflow@260°
c
Temp = 150°
c,
Vgs=100% of
Vgsmax
-
9 lots
1496pcs
0
JESD22A113
168hrs
500 hrs
1000 hrs
1 lot
308pcs
0
JESD22A108
Temp = 150°
c,
Vds=80% of
Vdsmax
168hrs
500 hrs
1000 hrs
0
JESD22A108
495pcs
0
JESD22A110
0
JESD22A102
0
JESD22A104
HTGB
HTRB
Lot
Attribution
Total
Sample size
3 lots
(Note A*)
Reference
Standard
77 pcs / lot
1 lot
308pcs
3 lots
(Note A*)
77 pcs / lot
HAST
130 °
c , 85%RH,
33.3 psi, Vgs =
100% of Vgs max
100 hrs
9 lots
Pressure Pot
121°
c , 29.7psi,
RH=100%
96 hrs
(Note A*)
5 lots
55 pcs / lot
385pcs
(Note A*)
77 pcs / lot
-65°
c to 150°
c,
air to air,
250 / 500
cycles
Temperature
Cycle
Number
of
Failures
8 lots
616pcs
(Note A*)
77 pcs / lot
Note A: The reliability data presents total of available generic data up to the published date.
IV. Reliability Evaluation
FIT rate (per billion): 7
MTTF = 15704 years
The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in
sample size of the selected product (AOD2916). Failure Rate Determination is based on JEDEC
Standard JESD 85. FIT means one failure per billion hours.
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9
Failure Rate = Chi x 10 / [2 (N) (H) (Af)]
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= 1.83 x 10 / [2x (2x77x168+6x77x1000) x258] = 7
9
MTTF = 10 / FIT = 1.38 x 108hrs = 15704 years
Chi² = Chi Squared Distribution, determined by the number of failures and confidence interval
N = Total Number of units from HTRB and HTGB tests
H = Duration of HTRB/HTGB testing
Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)
Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)]
Acceleration Factor ratio list:
Af
55 deg C
70 deg C
85 deg C
100 deg C
115 deg C
130 deg C
150 deg C
258
87
32
13
5.64
2.59
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Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16
Tj u =The use junction temperature in degree (Kelvin), K = C+273.16
k = Boltzmann’s constant, 8.617164 X 10-5eV / K
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