INTERSIL CA3081

CA3081, CA3082
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General Purpose High Current NPN
Transistor Arrays
480.6
• CA3081 - Common Emitter Array
The CA3081 and CA3082 are capable of directly driving
seven segment displays, and light emitting diode (LED)
displays. These types are also well suited for a variety of
other drive applications, including relay control and thyristor
firing.
• CA3082 - Common Collector Array
• Directly Drive Seven Segment Incandescent Displays and
Light Emitting Diode (LED) Display
• 7 Transistors Permit a Wide Range of Applications in
Either a Common Emitter (CA3081) or Common Collector
(CA3082) Configuration
• High IC . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA (Max)
• Low VCESAT (at 50mA) . . . . . . . . . . . . . . . . . . 0.4V (Typ)
Applications
Part Number Information
TEMP.
RANGE ( oC)
File Number
Features
CA3081 and CA3082 consist of seven high current (to
100mA) silicon NPN transistors on a common monolithic
substrate. The CA3081 is connected in a common emitter
configuration and the CA3082 is connected in a common
collector configuration.
PART NUMBER
(BRAND)
May 2001
PACKAGE
PKG.
NO.
CA3081
-55 to 125
16 Ld PDIP
E16.3
CA3081F
-55 to 125
16 Ld CERDIP
F16.3
CA3081M
(3081)
-55 to 125
16 Ld SOIC
M16.15
CA3082
-55 to 125
16 Ld PDIP
E16.3
CA3082M
(3082)
-55 to 125
16 Ld SOIC
M16.15
CA3082M96
(3082)
-55 to 125
16 Ld SOIC Tape
and Reel
M16.15
• Drivers for
- Incandescent Display Devices
- LED Displays
• Relay Control
• Thyristor Firing
Pinouts
CA3081
COMMON EMITTER CONFIGURATION
(PDIP, CERDIP, SOIC)
TOP VIEW
CA3082
COMMON COLLECTOR CONFIGURATION
(PDIP, SOIC)
TOP VIEW
1
16
1
16
2
15
2
15
3
14
3
14
4
13
4
13
SUBSTRATE 5
12
SUBSTRATE 5
12
6
11
6
11
7
10
7
10
8
9
8
9
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
CA3081, CA3082
Absolute Maximum Ratings TA = 25oC
Thermal Information
Collector-to-Emitter Voltage (V CEO) . . . . . . . . . . . . . . . . . . . . . .16V
Collector-to-Base Voltage (VCBO) . . . . . . . . . . . . . . . . . . . . . . . 20V
Collector-to-Substrate Voltage (V CIO , Note 1) . . . . . . . . . . . . . 20V
Emitter-to-Base Voltage (VEBO) . . . . . . . . . . . . . . . . . . . . . . . . . 5V
Collector Current (IC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA
Base Current (IB) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20mA
Thermal Resistance (Typical, Note 2)
θJA ( oC/W)
θJC (oC/W)
CERDIP Package. . . . . . . . . . . . . . . . .
115
45
PDIP Package . . . . . . . . . . . . . . . . . . .
100
N/A
SOIC Package . . . . . . . . . . . . . . . . . . .
190
N/A
Maximum Power Dissipation (Any One Transistor) . . . . . . . 500mW
Maximum Junction Temperature (Ceramic Package). . . . . . . . . 175oC
Maximum Junction Temperature (Plastic Package) . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range. . . . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. The collector of each transistor of the CA3081 and CA3082 is isolated from the substrate by an integral diode. The substrate must be connected
to a voltage which is more negative than any collector voltage in order to maintain isolation between transistors and provide normal transistor
action. To avoid undesired coupling between transistors, the substrate terminal (5) should be maintained at either DC or signal (AC) ground. A
suitable bypass capacitor can be used to establish a signal ground.
2. θJA is measured with the component mounted on an evaluation PC board in free air.
For Equipment Design at TA = 25oC
Electrical Specifications
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
V(BR)CBO
IC = 500µA, IE = 0
20
60
-
V
Collector-to-Substrate Breakdown Voltage
V(BR)CIO
IC = 500µA, IB = 0
20
60
-
V
Collector-to-Emitter Breakdown Voltage
V(BR)CEO
IC = 1mA, IB = 0
16
24
-
V
Emitter-to-Base Breakdown Voltage
V(BR)EBO
IC = 500µA
5.0
6.9
-
V
DC Forward Current Transfer Ratio
hFE
VCE = 0.5V, IC = 30mA
30
68
-
-
VCE = 0.8V, IC = 50mA
40
70
-
-
IC = 30mA, IB = 1mA
-
0.87
1.2
V
CA3081, CA3082
IC = 30mA, IB = 1mA
-
0.27
0.5
V
CA3081 (Figure 5)
IC = 50mA, IB = 5mA
-
0.4
0.7
V
Collector-to-Base Breakdown Voltage
Base-to-Emitter Saturation Voltage (Figure 4)
VBESAT
Collector-to-Emitter Saturation Voltage
V CESAT
IC = 50mA, IB = 5mA
-
0.4
0.8
V
Collector Cutoff Current
ICEO
VCE = 10V, IB = 0
-
-
10
µA
Collector Cutoff Current
ICBO
VCB = 10V, IE = 0
-
-
1.0
µA
CA3082 (Figure 5)
Typical Read - Out Driver Applications
VP
0V
V+
1/7 CA3082
(COMMON COLLECTOR)
R (NOTE)
LIGHT EMITTING DIODE (LED)
40736R
V+
1 SEGMENT OF INCANDESCENT DISPLAY
(DR2000 SERIES OR EQUIVALENT)
FROM
DECODER
1/7 CA3081
(COMMON EMITTER)
NOTE:
The Resistance for R is determined by the relationship:
V P – V BE – VF ( LED )
R = ------------------------------------------------------I ( LED )
R = 0 for V P = V BE + V F ( LED )
Where: VP = Input Pulse Voltage
VF = Forward Voltage Drop Across the Diode
FIGURE 1. SCHEMATIC DIAGRAM SHOWING ONE
TRANSISTOR OF THE CA3081 DRIVING ONE
SEGMENT OF AN INCANDESCENT DISPLAY
2
FIGURE 2. SCHEMATIC DIAGRAM SHOWING ONE
TRANSISTOR OF THE CA3082 DRIVING A LIGHT
EMITTING DIODE (LED)
CA3081, CA3082
Typical Performance Curves
1.0
100
VCE = 3V
80
BASE-TO-EMITTER
SATURATION VOLTAGE (V)
DC FORWARD CURRENT
TRANSFER RATIO (hFE)
90
TA = 25oC
TA = 70oC
70
TA = 0 oC
60
50
40
0.1
0.9
0.8
0.7
0.6
1
10
COLLECTOR CURRENT (mA)
100
FIGURE 3. DC FORWARD CURRENT TRANSFER RATIO vs
COLLECTOR CURRENT
1
10
COLLECTOR CURRENT (mA)
100
FIGURE 4. BASE-TO-EMITTER SATURATION VOLTAGE vs
COLLECTOR CURRENT
1.2
1
COLLECTOR-TO-EMITTER
SATURATION VOLTAGE (V)
hFE = 10
TA = 25oC
COLLECTOR-TO-EMITTER
SATURATION VOLTAGE (V)
TA = 25 oC
hFE = 10
0.8
0.6
MAXIMUM
0.4
0.2
TYPICAL
hFE = 10
TA = 70oC
1
0.8
MAXIMUM
0.6
0.4
0.2
TYPICAL
0
0
1
10
COLLECTOR CURRENT (mA)
FIGURE 5. COLLECTOR-TO-EMITTER SATURATION
VOLTAGE vs COLLECTOR CURRENT
3
100
1
10
COLLECTOR CURRENT (mA)
FIGURE 6. COLLECTOR-TO-EMITTER SATURATION
VOLTAGE vs COLLECTOR CURRENT
100
CA3081, CA3082
Dual-In-Line Plastic Packages (PDIP)
E16.3 (JEDEC MS-001-BB ISSUE D)
N
16 LEAD DUAL-IN-LINE PLASTIC PACKAGE
E1
INDEX
AREA
1 2 3
INCHES
N/2
-B-
-AE
D
BASE
PLANE
-C-
A2
SEATING
PLANE
A
L
D1
e
B1
D1
A1
eC
B
0.010 (0.25) M C A B S
MILLIMETERS
SYMBOL
MIN
MAX
MIN
MAX
NOTES
A
-
0.210
-
5.33
4
A1
0.015
-
0.39
-
4
A2
0.115
0.195
2.93
4.95
-
B
0.014
0.022
0.356
0.558
-
C
L
B1
0.045
0.070
1.15
1.77
8, 10
eA
C
0.008
0.014
C
D
0.735
0.775
D1
0.005
-
0.13
-
5
E
0.300
0.325
7.62
8.25
6
E1
0.240
0.280
6.10
7.11
5
eB
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and
Metric dimensions, the inch dimensions control.
e
0.100 BSC
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
eA
0.300 BSC
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication No. 95.
eB
-
4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3.
L
0.115
N
5. D, D1, and E1 dimensions do not include mold flash or protrusions.
Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and eA are measured with the leads constrained to be perpendicular to datum -C- .
7. eB and eC are measured at the lead tips with the leads unconstrained.
eC must be zero or greater.
8. B1 maximum dimensions do not include dambar protrusions. Dambar
protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
4
16
0.204
0.355
18.66
19.68
2.54 BSC
7.62 BSC
0.430
-
0.150
2.93
16
5
6
10.92
7
3.81
4
9
Rev. 0 12/93
CA3081, CA3082
Small Outline Plastic Packages (SOIC)
M16.15 (JEDEC MS-012-AC ISSUE C)
N
INDEX
AREA
0.25(0.010) M
H
16 LEAD NARROW BODY SMALL OUTLINE PLASTIC
PACKAGE
B M
E
INCHES
-B-
1
2
SYMBOL
3
L
SEATING PLANE
-A-
h x 45o
A
D
-C-
e
µα
A1
B
0.25(0.010) M
0.10(0.004)
C A M
B S
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above
the seating plane, shall not exceed a maximum value of 0.61mm
(0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are
not necessarily exact.
5
MILLIMETERS
MIN
MAX
NOTES
A
0.0532
0.0688
1.35
1.75
-
0.0040
0.0098
0.10
0.25
-
B
0.013
0.020
0.33
0.51
9
C
0.0075
0.0098
0.19
0.25
-
D
0.3859
0.3937
9.80
10.00
3
E
0.1497
0.1574
3.80
4.00
4
0.050 BSC
1.27 BSC
-
H
0.2284
0.2440
5.80
6.20
-
h
0.0099
0.0196
0.25
0.50
5
L
0.016
0.050
0.40
1.27
6
N
NOTES:
MAX
A1
e
C
MIN
α
16
0o
16
8o
0o
7
8o
Rev. 0 12/93
CA3081, CA3082
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)
F16.3 MIL-STD-1835 GDIP1-T16 (D-2, CONFIGURATION A)
16 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE
LEAD FINISH
c1
-D-
-A-
BASE
METAL
E
M
-Bbbb S
C A-B S
-C-
S1
0.200
-
5.08
-
0.026
0.36
0.66
2
b1
0.014
0.023
0.36
0.58
3
b2
0.045
0.065
1.14
1.65
-
b3
0.023
0.045
0.58
1.14
4
c
0.008
0.018
0.20
0.46
2
c1
0.008
0.015
0.20
0.38
3
D
-
0.840
-
21.34
5
E
0.220
0.310
5.59
7.87
5
eA
ccc M C A - B S
e
eA/2
c
aaa M C A - B S D S
D S
NOTES
-
b2
b
MAX
0.014
α
A A
MIN
b
A
L
MILLIMETERS
MAX
A
Q
SEATING
PLANE
MIN
M
(b)
D
BASE
PLANE
SYMBOL
b1
SECTION A-A
D S
INCHES
(c)
NOTES:
1. Index area: A notch or a pin one identification mark shall be located adjacent to pin one and shall be located within the shaded
area shown. The manufacturer’s identification shall not be used
as a pin one identification mark.
e
0.100 BSC
2.54 BSC
-
eA
0.300 BSC
7.62 BSC
-
eA/2
0.150 BSC
3.81 BSC
-
L
0.125
0.200
3.18
5.08
-
Q
0.015
0.060
0.38
1.52
6
S1
0.005
-
0.13
-
7
105o
90o
105o
-
2. The maximum limits of lead dimensions b and c or M shall be
measured at the centroid of the finished lead surfaces, when
solder dip or tin plate lead finish is applied.
α
90o
aaa
-
0.015
-
0.38
-
3. Dimensions b1 and c1 apply to lead base metal only. Dimension
M applies to lead plating and finish thickness.
bbb
-
0.030
-
0.76
-
ccc
-
0.010
-
0.25
-
M
-
0.0015
-
0.038
2, 3
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a
partial lead paddle. For this configuration dimension b3 replaces
dimension b2.
5. This dimension allows for off-center lid, meniscus, and glass
overrun.
6. Dimension Q shall be measured from the seating plane to the
base plane.
7. Measure dimension S1 at all four corners.
8. N is the maximum number of terminal positions.
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
10. Controlling dimension: INCH.
6
N
16
16
8
Rev. 0 4/94