MUX8532 5962-0923201

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Added "Recommended power supply turn on sequence: -VEE, VREF,
followed by +VEE " to footnote 1 of the table I. Corrected footnote 3 on
sheet 3. -sld
10-04-26
Charles F. Saffle
B
Updated drawing to reflect the latest requirements of MIL-PRF-38534.
-sld
15-12-01
Charles F. Saffle
REV
SHEET
REV
B
B
B
SHEET
15
16
17
REV STATUS
REV
B
B
B
B
B
B
B
B
B
B
B
B
B
B
OF SHEETS
SHEET
1
2
3
4
5
6
7
8
9
10
11
12
13
14
PMIC N/A
PREPARED BY
Steve Duncan
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
CHECKED BY
Greg Cecil
APPROVED BY
Charles F. Saffle
DRAWING APPROVAL DATE
10-02-03
REVISION LEVEL
B
http://www.landandmaritime.dla.mil/
MICROCIRCUIT, HYBRID, LINEAR, DUAL 16
CHANNEL, ANALOG MULTIPLEXER
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
1 OF
5962-09232
17
5962-E070-16
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962



Federal
stock class
designator
\



RHA
designator
(see 1.2.1)
09232
01



Device
type
(see 1.2.2)
/
K



Device
class
designator
(see 1.2.3)
X



Case
outline
(see 1.2.4)
C



Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices meet the MIL-PRF-38534 specified RHA levels
and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
MUX8532
02
MUX8533
Circuit function
Dual 16 channel analog multiplexer, high impedance analog
input
Dual 16 channel analog multiplexer, high impedance analog
input with ESD protection
1.2.3 Device class designator. This device class designator is a single letter identifying the product assurance level. All
levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and
E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
Device performance documentation
K
Highest reliability class available. This level is intended for use in space
applications.
H
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
G
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).
E
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
D
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09232
A
REVISION LEVEL
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SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
See figure 1
56
Ceramic quad flat pack
X
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Positive supply voltage between +VEE and GND .......................
Negative supply voltage between -VEE and GND.......................
VREF to GND...............................................................................
Digital input overvoltage range:
VEN (pins 13 and 44) ...............................................................
VA (pins 14, 15, 16, and 17)....................................................
VB (Pins 40,41,42, and 43) .....................................................
Analog input overvoltage range:
Device type 01........................................................................
Device type 02........................................................................
Power dissipation (PD), TC = -55°C to +125°C ...........................
Thermal resistance junction-to-case (θJC) ..................................
Storage temperature ..................................................................
Lead temperature (soldering, 10 seconds) ................................
+20 V dc
-20 V dc
+7.5 V dc
(< VREF + .5)V, (> GND - .5)V
(< VREF + .5)V, (> GND - .5)V
(< VREF + .5)V, (> GND - .5)V
-30 V dc ≤ VIN ≤ +30 V dc
-18 V dc ≤ VIN ≤ +18 V dc
40 mW
10°C/W 2/
-65°C to +150°C
+300°C
1.4 Recommended operating conditions.
Positive supply voltage (+VEE) 3/ ...............................................
Negative supply voltage (-VEE) 3/...............................................
VREF 3/........................................................................................
Logic low level voltage (VAL) ......................................................
Logic high level voltage (VAH) ....................................................
Case operating temperature range (TC).....................................
+15 V dc
-15 V dc
+5 V dc
+0.8 V dc
+4.0 V dc
-55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
________
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Based on the maximum power dissipation spread over the multiplexer die.
3/ Recommended power supply turn on sequence: -VEE, VREF, followed by +VEE.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09232
A
REVISION LEVEL
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SHEET
3
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.
3.2.4 Switching waveform(s). The switching waveform(s) shall be as specified on figure 4.
3.2.5 Block diagram. The block diagram shall be as specified on figure 5.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime - VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime - VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09232
A
REVISION LEVEL
B
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Supply
currents
Address input
currents
Enable input
current
Symbol
Group A
subgroups
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Device
types
Limits
Unit
Min
Max
+IEE
VEN(0-15) = VEN(16-31) = VA(0-3) = VB(0-3) = 0
1,2,3
All
0
1
mA
-IEE
VEN(0-15) = VEN(16-31) = VA(0-3) = VB(0-3) = 0
1,2,3
All
-1
0
mA
+ISBY
VEN(0-15) = VEN(16-31) = 4 V, VA(0-3) = VB(0-3) = 0
3/
1,2,3
All
0
1
mA
-ISBY
VEN(0-15) = VEN(16-31) = 4 V, VA(0-3) = VB(0-3) = 0
3/
1,2,3
All
-1
0
mA
IAL(0-3)A
VA = 0 V
1,2,3
All
-1
1
µA
IAH(0-3)A
VA = 5 V
1,2,3
All
-1
1
µA
IAL(0-3)B
VB = 0 V
1,2,3
All
-1
1
µA
IAH(0-3)B
VB = 5 V
1,2,3
All
-1
1
µA
IENL(0-15)
VEN(0-15) = 0 V
1,2,3
All
-1
1
µA
IENH(0-15)
VEN(0-15) = 5 V
1,2,3
All
-1
1
µA
IENL(16-31)
VEN(16-31) = 0 V
1,2,3
All
-1
1
µA
IENH(16-31)
VEN(16-31) = 5 V
1,2,3
All
-1
1
µA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
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REVISION LEVEL
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5
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Positive input
leakage current
(CH0-CH31)
+ISOFFOUTPUT(ALL)
Negative input
leakage current
(CH0-CH31)
-ISOFFOUTPUT(ALL)
Positive output
leakage current
outputs (pins 12
and 45)
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
types
Limits
Unit
Min
Max
01
-200
+200
02
-100
+1000
01
-200
+200
02
-100
+1000
VIN = +10 V, VEN = 4 V, output
and all unused inputs = -10 V
4/ 5/
1,2,3
VIN = -10 V, VEN = 4 V, output
and all unused inputs = +10 V
4/ 5/
1,2,3
+IDOFFOUTPUT(ALL)
VOUT = +10 V, VEN = 4 V, output
and all unused inputs = -10 V
5/ 6/
1,2,3
All
-100
+100
nA
Negative output
leakage current
outputs (pins 12
and 45)
-IDOFFOUTPUT(ALL)
VOUT = -10 V, VEN = 4 V, output
and all unused inputs = +10 V
5/ 6/
1,2,3
All
-100
+100
nA
Input clamped
voltage
(CH0-CH31)
+VCLMP
VEN = 4 V, all unused inputs
are open 5/
1
02
18.0
23.0
V
2
18.0
23.5
3
17.5
22.5
-23.0
-18.0
2
-23.5
-18.0
3
-22.5
-17.5
-VCLMP
1
VEN = 4 V, all unused inputs
are open 5/
02
nA
nA
V
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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SIZE
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A
REVISION LEVEL
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6
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Switch ON
resistance outputs
(pins 12 and 45) 8/
Switching tests
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
types
Limits
Unit
Min
Max
RDS(ON)(0-31)A
VIN = +15 V, VEN = 0.8 V,
IOUT = -1 mA 4/ 5/ 7/
1,2,3
All
200
1000
Ω
RDS(ON)(0-31)B
VIN = +5 V, VEN = 0.8 V,
IOUT = -1 mA 4/ 5/ 7/
1,2,3
All
200
1500
Ω
RDS(ON)(0-31)C
VIN = -5 V, VEN = 0.8 V,
IOUT = +1 mA 4/ 5/ 7/
1,2,3
All
200
2500
Ω
tAHL
RL = 10 kΩ, CL = 50 pF,
See figure 4
9,10,11
All
10
1000
ns
tALH
RL = 10 kΩ, CL = 50 pF,
See figure 4
9,10,11
All
10
1000
ns
tONEN
RL = 1 kΩ, CL = 50 pF,
See figure 4
9,10,11
All
10
1000
ns
tOFFEN
RL = 1 kΩ, CL = 50 pF,
See figure 4
9,10,11
All
10
1000
ns
1/ +VEE = +15 V dc, -VEE = -15 V dc, and VREF = +5 V dc, unless otherwise specified. Recommended power supply turn on
sequence: -VEE, VREF, followed by +VEE.
2/ Measure inputs sequentially. Ground all unused inputs.
3/ If not tested, shall be guaranteed to the limits specified in table I.
4/ VIN is the applied input voltage to the input channels (CH0-CH31).
5/ VEN is the applied input voltage to the enable lines EN(0-15) and EN(16-31).
6/ VOUT is the applied input voltage to the output lines OUTPUT1(0-15) and OUTPUT2 (16-31).
7/ Negative current is the current flowing out of each of the pins. Positive current is the current flowing into each of the
pins.
8/ The device types 01 and 02 cannot be operated with analog inputs from -15 V to -5 V.
STANDARD
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Case outline X.
FIGURE 1. Case outline(s).
STANDARD
MICROCIRCUIT DRAWING
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Case outline X - Continued.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
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DSCC FORM 2234
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9
Case outline X - Continued.
Inches
Symbol
Min
Millimeters
Max
A
Min
Max
.190
4.83
A1
.139
.170
3.53
4.32
A2
.005
.011
0.13
0.28
b
.0135
.0195
0.34
0.50
c
.005
.008
0.13
0.20
D/E
.790
.810
20.07
20.57
D1
.645
.655
16.38
16.64
e
.050 BSC
1.27 BSC
F
.200 TYP
5.08 TYP
J
.035 TYP
0.89 TYP
L
2.490
2.510
L1
63.25
63.75
2.580
65.53
L2
1.700
1.740
43.18
44.20
L3
2.090
2.110
53.09
53.59
L4
.650 TYP
16.51 TYP
N
56
56
S1
.030 TYP
0.76 TYP
S2
.015 TYP
0.38 TYP
NOTES:
1. Pin 1 is indicated by an ESD triangle on top of the package and by an index on the bottom of the package.
2. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
3. N equals 56, the total number of leads on the package.
4. Pin numbers are for reference only.
FIGURE 1. Case outline(s) - Continued.
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Device types
01 and 02
Case outline
Terminal
number
Terminal symbol
X
Terminal
number
Terminal symbol
1
CH0
29
CH31
2
CH1
30
CH30
3
CH2
31
CH29
4
CH3
32
CH28
5
CH4
33
CH27
6
CH5
34
CH26
7
GND
35
GND
8
GND
36
GND
9
CH6
37
CH25
10
CH7
38
CH24
11
CASE GND
39
VREF
12
OUTPUT1 (0-15)
40
B3
13
EN (0 − 15)
41
B2
14
A0
42
B1
15
A1
43
B0
16
A2
44
EN (16 − 31)
17
A3
45
OUTPUT2 (16-31)
18
+VEE
46
-VEE
19
CH15
47
CH16
20
CH14
48
CH17
21
GND
49
GND
22
GND
50
GND
23
CH13
51
CH18
24
CH12
52
CH19
25
CH11
53
CH20
26
CH10
54
CH21
27
CH9
55
CH22
28
CH8
56
CH23
NOTE:
1. Package lid is internally connected to circuit ground (Pins 7, 8, 11, 21, 22, 35, 36, 49, and 50).
FIGURE 2. Terminal connections.
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Truth table (CH0 - CH15)
A3
X
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
A2
X
L
L
L
L
H
H
H
H
L
L
L
L
H
H
H
H
A1
X
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
A0
X
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
EN (0-15)
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
"ON" Channel OUTPUT1 1/
None
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
CH8
CH9
CH10
CH11
CH12
CH13
CH14
CH15
Truth table (CH16 - CH31)
B3
X
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
B2
X
L
L
L
L
H
H
H
H
L
L
L
L
H
H
H
H
B1
X
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
B0
X
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
EN (16-31)
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
"ON" Channel OUTPUT2 2/
None
CH16
CH17
CH18
CH19
CH20
CH21
CH22
CH23
CH24
CH25
CH26
CH27
CH28
CH29
CH30
CH31
1/ Between (CH0 - CH15) and OUTPUT1 (0 - 15).
2/ Between (CH16 - CH31) and OUTPUT2 (16 - 31).
FIGURE 3. Truth table.
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NOTE: f = 10 kHz, duty cycle = 50%.
FIGURE 4. Switching test waveform(s).
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FIGURE 5. Block Diagram.
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FIGURE 5. Block diagram - Continued.
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TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
1, 9
Final electrical parameters
1*, 2, 3, 9, 10, 11
Group A test requirements
1, 2, 3, 9, 10, 11
Group C end-point electrical
parameters
1, 2, 3, 9, 10, 11
End-point electrical parameters
for radiation hardness
assurance (RHA) devices
Not applicable
* PDA applies to subgroup 1.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime - VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in test method 1015 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09232
A
REVISION LEVEL
B
SHEET
16
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime - VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in test method 1005 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534.
6.4 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and this list
will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices
(FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108.
6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-1081.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors, listed in MIL-HDBK103 and QML-38534, have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have
agreed to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09232
A
REVISION LEVEL
B
SHEET
17
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 15-12-01
Approved sources of supply for SMD 5962-09232 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
1/
2/
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-0923201KXC
88379
MUX8532-201-1S
5962-0923202KXC
88379
MUX8533-201-1S
The lead finish shown for each PIN representing a hermetic package is the most readily available from the
manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its
availability.
Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the
performance requirements of this drawing.
Vendor CAGE
number
88379
Vendor name
and address
Aeroflex Plainview Incorporated,
(Aeroflex Microelectronics Solutions)
35 South Service Road
Plainview, NY 11803-4193
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.