PHILIPS HEF4000BP

INTEGRATED CIRCUITS
DATA SHEET
For a complete data sheet, please also download:
• The IC04 LOCMOS HE4000B Logic
Family Specifications HEF, HEC
• The IC04 LOCMOS HE4000B Logic
Package Outlines/Information HEF, HEC
HEF4000B
gates
Dual 3-input NOR gate and inverter
Product specification
File under Integrated Circuits, IC04
January 1995
Philips Semiconductors
Product specification
HEF4000B
gates
Dual 3-input NOR gate and inverter
DESCRIPTION
The HEF4000B provides the positive dual 3-input NOR
function. A single stage inverting function with standard
output performance is also accomplished. The outputs are
fully buffered for highest noise immunity and pattern
insensitivity of output impedance.
Fig.2 Pinning diagram.
HEF4000BP(N):
14-lead DIL; plastic
(SOT27-1)
HEF4000BD(F):
14-lead DIL; ceramic (cerdip)
HEF4000BT(D):
14-lead SO; plastic
(SOT73)
(SOT108-1)
( ): Package Designator North America
Fig.1 Functional diagram.
FAMILY DATA, IDD LIMITS category GATES
See Family Specifications
Fig.3 Logic diagram.
January 1995
2
Philips Semiconductors
Product specification
HEF4000B
gates
Dual 3-input NOR gate and inverter
DC CHARACTERISTICS
For the single inverter stage (I7/O3):
see Family Specifications for input voltages HIGH and LOW (unbuffered stages only).
AC CHARACTERISTICS
VSS = 0 V; Tamb = 25 °C; CL = 50 pF; input transition times ≤ 20 ns
VDD
V
Propagation delays
5
I1 to I6 → O1,O2
10
SYMBOL
tPHL; tPLH
15
5
I7 → O3
10
(unbuffered output)
15
Output transition times
HIGH to LOW
LOW to HIGH
Dynamic power
dissipation per
package (P)
tPHL; tPLH
5
TYP.
MAX.
TYPICAL EXTRAPOLATION
FORMULA
70
140
ns
43 ns + (0,55 ns/pF) CL
35
70
ns
24 ns + (0,23 ns/pF) CL
30
55
ns
22 ns + (0,16 ns/pF) CL
45
90
ns
18 ns + (0,55 ns/pF) CL
25
50
ns
14 ns + (0,23 ns/pF) CL
20
40
ns
12 ns + (0,16 ns/pF) CL
10 ns + (1,0 ns/pF) CL
60
120
ns
30
60
ns
9 ns + (0,42 ns/pF) CL
15
20
40
ns
6 ns + (0,28 ns/pF) CL
5
60
120
ns
10
tTHL
10 ns + (1,0 ns/pF) CL
30
60
ns
9 ns + (0,42 ns/pF) CL
15
20
40
ns
6 ns + (0,28 ns/pF) CL
VDD
V
TYPICAL FORMULA FOR P (µW)
10
tTLH
5
1 000 fi + ∑ (foCL) × VDD2
where
10
7 700 fi + ∑ (foCL) × VDD
2
fi = input freq. (MHz)
15
28 700 fi + ∑ (foCL) × VDD
2
fo = output freq. (MHz)
CL = load capacitance (pF)
∑ (foCL) = sum of outputs
VDD = supply voltage (V)
January 1995
3
Philips Semiconductors
Product specification
HEF4000B
gates
Dual 3-input NOR gate and inverter
APPLICATION INFORMATION
The following information (Figs 4 to 7) is only for the single
inverter stage (I7/O3).
Fig.4
Fig.5
Voltage gain (VO/VI) as a function of supply
voltage.
Supply current as a function of supply
voltage.
This is also an example of an analogue amplifier using the
single inverter stage (I7/O3) of the HEF4000B.
Fig.6
Test set-up for measuring graphs of Figs 4
and 5.
January 1995
4
Philips Semiconductors
Product specification
HEF4000B
gates
Dual 3-input NOR gate and inverter
Fig.7 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph Fig.8).
A: average
B: average + 2 s,
C: average − 2 s, in where ‘s’ is the observed standard deviation.
Fig.8 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.
January 1995
5