CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1997 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft QA Engineering Department Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 STANDARD STRESS TEST DESCRIPTIONS TEST DESCRIPTION HTOL HTOL2 HTSSL HTSSL2 DRET DRET2 PCT HAST TC TC2 HTS TEV High Temp Op Life, 150ºC, 5.75V High Temp Op Life, 125ºC, 5.75V High Temp Steady State Life, 150ºC, 5.75V High Temp Steady State Life, 125ºC, 5.75V Data Retension Test, Data Bake 165ºC, Plastic Data Retension Test, Data Bake 250ºC, Hermetic Pressure Cooker Test, 121ºC, 100%RH, No Bias Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias Temp Cycle, 125ºC to -40ºC Temp Cycle, 150ºC to -65ºC High Temp Storage, 165ºC, No Bias Temperature Extreme Verification Page 2 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 WAFER FAB AREAS FAB # LOCATION CA TX MN FR San Jose, California Round Rock, Texas Bloomington, Minnesota MHS, France ASSEMBLY LOCATION ID COMPANY/LOCATION KOREA-A ASAT-B USA-C PHIL-D USA-E INDNS-F TAIWAN-G KOREA-H MALAY-J THLAND-K KOREA-L PHIL-M USA-N INDNS-O USA-P KOREA-Q PHIL-R USA-S TAIWAN-T MALAY-U USA-V USA-W ALPHA-X ALPHA-Y THLAND-Z Anam-Buchon/Korea Asat/Hongkong Cypress/USA Dynesem/Philippines Cypress-Minnesota/USA Astra/Indonesia ASE/Taiwan Hyundai/Korea ASE/Malaysia TMS/Thailand Anam-Seoul/Korea Anam/Philippines Express/USA Omedata/Indonesia Pantronix/USA Anam-Bupyong/Korea Cypress/Philippines ATM/USA OSE/Taiwan Unisem/Malaysia Aplus/USA Toshiba/USA Cypress Bangkok/Thailand Alphatech/Thailand Hana/Thailand Page 3 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 DESCRIPTION OF DATA TABLE COLUMN HEADINGS COLUMN HEADING DESCRIPTION OF COLUMN CONTENTS Division Test Test Condition Device ID Date Code Lot Number Function Description Technology Process Pkg Material Pkg Type Pkg Location # Pins Duration # Test # Failed Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See table on previous for detail Cypress part number Week in which specific lot was marked/sealed/molded. Manufacturing (assembly) lot number Generic product family at Cypress Brief description of device function Fabrication process technology. Generic fabrication process Generic packaging material Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package). Country Location + Initial of assembly house (see table on prvious page for detail). Pin cont of package in which device is assembled. Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours. Quantity of devices submitted to this stress/test. Quantity of devices failing at this specific readpoint. Failure analysis results from this test, if any. Page 4 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod Assembly Func- Descr ProWfr Pkg Assy No Dura Qty Qty line Test Test Condition Device Eval# D/C Lot No tion Description Technology cess Loc type Loc Pin tion Test Fail Fail Mode ----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------CPD HAST 140C/5.5V CY74FCT16827TPV 96475 4647440-SW FCT 10 BIT REG. SRAM/LOGIC-R3 CMOS MN SSOP MALAY-U 56 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V CY74FCT16827TPV 96475 4647440-SW FCT 10 BIT REG. SRAM/LOGIC-R3 CMOS MN SSOP MALAY-U 56 48 192 0 48 63 0 48 96 0 48 128 0 48 186 0 48 192 0 48 192 0 48 240 0 80 128 0 500 128 0 CY7C960-UMB 96512 9643 349612710 VME BUS Inter. SRAM/LOGIC-L27 CMOS MN TQFP USA-B 64 48 130 0 184 50 0 9704 349615989 VME BUS Inter. SRAM/LOGIC-L27 CMOS MN TQFP USA-B 64 48 130 0 48 130 0 500 80 0 9706 349700538 VME BUS Inter. SRAM/LOGIC-L27 CMOS MN TQFP USA-B 64 48 130 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS CY7C611A-NC M71041 9645 349613552 VME RISC CONTRL SRAM/LOGIC-L20 CMOS TX PQFP HK-B 160 336 80 0 1000 80 0 VIC068A-AC M71044 9650 349615349 VME VME INTERF. SRAM/LOGIC-C2AN CMOS MN TQFP HK-B 144 336 80 7 7 LIFTING BOND/S VIC068A-BC M64039 9636 349610885 VME VME INTERF. SRAM/LOGIC-C2AN CMOS MN PPGA PHIL-M 144 336 78 0 1000 78 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75V CY74FCT16827TPV 96475 4647440-SW FCT 10 BIT REG. SRAM/LOGIC-R3 CMOS MN SSOP MALAY-U 56 80 78 0 168 78 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CY7C611A-NC M71042 9645 349613552 VME RISC CONTRL SRAM/LOGIC-L20 CMOS TX PQFP HK-B 160 168 80 0 42 EXTERNAL CONTAMINATION ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C CY7C960-UMB 96512 9704 349615989 VME BUS Inter. SRAM/LOGIC-L27 CMOS MN TQFP USA-B 64 100 50 0 1000 50 0 -65C TO 150C CY2260PVC 97121 9706 619700255 TTECH CLOCK SYN. SRAM/LOGIC-L27 CMOS MN SOIC CSPI-R 28 300 50 0 300 50 0 1000 50 0 1000 50 0 CY74FCT16827TPV 96475 4647440-SW FCT 10 BIT REG. SRAM/LOGIC-R3 CMOS MN SSOP MALAY-U 56 300 45 0 SRAM/LOGIC-R3 CMOS MN SSOP MALAY-U 56 1000 45 0 CY7C611A-NC M71040 9645 349613552 VME RISC CONTRL SRAM/LOGIC-L20 CMOS TX PQFP HK-B 160 300 50 2 2 TOPSIDE CRACKS VIC068A-AC M71043 9650 349615349 VME VME INTERF. SRAM/LOGIC-C2AN CMOS MN TQFP HK-B 144 300 50 0 1000 49 0 VIC068A-BC M71039 9702 349615489 VME VME INTERF. SRAM/LOGIC-C2AN CMOS MN PPGA PHIL-M 144 300 50 0 1000 48 1 1 UNKNOWN ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 5 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod Assembly Func- Descr ProWfr Pkg Assy No Dura Qty Qty line Test Test Condition Device Eval# D/C Lot No tion Description Technology cess Loc type Loc Pin tion Test Fail Fail Mode ----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------DCD HAST 140C/5.5V CY7C136-JC M72026 9717 349701709 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 128 80 0 CY7C955-NC 97105 9649 349614873 CHNL TRANSCEIVER SRAM/LOGIC-L27 CMOS MN PQFP KOREA-Q 128 128 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V CY7C131-JC 97154 9711 349701602L SPCM 1K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 412 0 CY7C136-JC 97139 9705 349701602 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 342 0 9710 349700387 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 334 0 9711 349701448 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 334 0 97154 9712 349701709L SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 438 0 349701725L SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 432 0 CY7C146-JC 97154 9710 349701448L SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 48 208 0 CY7C433-DMB 97218 9619 219608526 SPCM 4Kx9 FIFO SRAM/LOGIC-R28 CMOS MN CERD ALPHA-X 28 48 1008 0 SRAM/LOGIC-R28 CMOS MN CERD ALPHA-X 28 80 210 0 500 210 0 184 49 0 CY7C457-JC 96302 9618 349605637 SPCM 2Kx18 FIFO SRAM/LOGIC-R28 CMOS MN PLCC KOREA-A 52 48 700 0 48 800 0 80 205 0 500 205 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.50V CY7C955-NC 97105 9705 349700256 CHNL TRANSCEIVER SRAM/LOGIC-L27 CMOS MN PQFP KOREA-Q 128 48 311 0 48 442 0 48 485 0 80 120 0 125C/6.5V CY7C955-NC 97105 9705 349700256 CHNL TRANSCEIVER SRAM/LOGIC-L27 CMOS MN PQFP KOREA-Q 128 500 120 0 2 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.50V CY7C955-NC 97105 9645 349613627 CHNL TRANSCEIVER SRAM/LOGIC-L27 CMOS MN PQFP KOREA-L 128 80 80 0 168 80 0 150C/5.75V CY7C433-DMB 97218 9619 219608526 SPCM 4Kx9 FIFO SRAM/LOGIC-R28 CMOS MN CERD ALPHA-X 28 80 138 0 28 168 138 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CY7C136-JC M72027 9717 349701709 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 96 80 0 168 80 0 CY7C4245-AC M72060 9703 349700347 SPCM 4Kx18 FIFO SRAM/LOGIC-R28 CMOS MN TQFP KOREA-Q 64 96 80 0 168 80 0 CY7C4265-JC M71011 9642 349612938 SPCM 16KX18 FIFO SRAM/LOGIC-R30 CMOS CA PLCC PHIL-M 68 96 80 0 168 80 8 8 TOPSIDE CRACKS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C CY7C433-DMB 97218 9619 219608526 SPCM 4Kx9 FIFO SRAM/LOGIC-R28 CMOS MN CERD ALPHA-X 28 1000 48 0 -65C TO 150C CY7C136-JC M72025 9717 349701709 SPCM 2K x 8 DP SRAM/LOGIC-R28 CMOS MN PLCC PHIL-M 52 300 47 0 CY7C4265-JC M71009 9642 349612938 SPCM 16KX18 FIFO SRAM/LOGIC-R30 CMOS CA PLCC PHIL-M 68 300 50 1 1 TOPSIDE CRACKS 1000 49 0 CY7C955-NC 97105 9649 349614873 CHNL TRANSCEIVER SRAM/LOGIC-L27 CMOS MN PQFP KOREA-Q 128 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 6 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod line Test Test Condition ----- ------ ---------------MPD HAST 130C/3.3V 140C/3.6V No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------100 128 80 0 28 128 50 0 28 128 47 0 140C/5.5V 28 128 50 0 28 128 90 0 256 90 0 CY62256V-ZC M71028 9648 349614698 COMDTY 32K x 8 SRAM/LOGIC-R3 CMOS CA TSOP PHIL-M 28 128 25 1 1 UNKNOWN 128 29 0 24 EOS CY7C1009-VC 97172 619702133 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 32 128 45 0 M72038 9710 349701371 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ TAIWN-G 32 128 78 0 CY7C1020-VC 97044 9712 619701268 COMDTY 32K x16 SRAM/LOGIC-R3 CMOS MN SOJ TAIWN-G 44 128 48 0 CY7C109-VC 96302 9626 349608918 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ KOREA-L 32 128 48 0 CY7C109-ZC M71025 9640 349612511 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN TSOP KOREA-L 32 128 11 0 1 EOS 128 69 0 2 EOS CY7C1335-AC 97227 619702650 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 128 43 0 619702652 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 128 44 0 CY7C199-15VC M71067 9640 219613420 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ ALPHA-X 28 128 80 0 CY7C199-SI M71037 9652 219616036 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOIC ALPHA-X 28 128 80 2 2 METAL/POLY SHORTS CY7C199-VC 96302 9617 219606653 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ ALPHA-X 28 128 46 0 M71061 9704 619700148 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ PHIL-M 28 128 6 1 1 TOP SIDE DEFECT 128 72 25 25 TOP SIDE DEFECT M72005 9716 619702338 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ PHIL-M 28 128 80 0 CY7C199-ZC 97098 9707 349700963 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN TSOP PHIL-M 28 128 43 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.80V CY62256V-VC 97132 9706 519701211 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 540 0 500 540 0 150C/3.90V CY62256V-VC 97132 9704 519700560 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 522 0 500 522 0 1000 522 0 2000 522 0 150C/4.60V CY7C1399-VC 96423 9650 219615780 SYNCHR 32K x 8 SRAM/LOGIC-R31 CMOS MN SOJ ALPHA-X 28 80 125 0 500 125 0 150C/5.75V CY62256-SNC 97095 9710 519702461D COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 500 255 0 519702512 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 500 255 0 97162 9711 519702761D COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 48 1144 0 519702921D COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 48 1186 0 9712 519702974D COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 48 1217 0 CY62256-VC 97132 9705 519701274 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 540 0 500 540 1 1 UNKNOWN CY7C1020-VC 97044 9712 619701268 COMDTY 32K x16 SRAM/LOGIC-R3 CMOS MN SOJ TAIWN-G 44 80 118 0 500 118 0 CY7C109-VC 96302 9626 349608918 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ KOREA-L 32 48 506 0 80 120 0 500 120 0 97251 9723 519705986D COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 48 761 0 519706004D COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 48 775 0 519706010D COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 48 786 0 9724 519706278D COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 48 765 0 Device --------------CY7C1335-AC CY62256V-VC CY7C1399-VC CY62256-VC CY62256V-VC Eval# -----M72041 97132 96423 97132 97132 D/C ---9710 9706 9650 9705 9704 Assembly Lot No ---------619701129 519701211 219615780 519701274 519700560 Function ----SYNCHR COMDTY SYNCHR COMDTY COMDTY Descr Description ----------32K x 32 32K x 8 32K x 8 32K x 8 32K x 8 Technology ---------------SRAM/LOGIC-R33 SRAM/LOGIC-R32 SRAM/LOGIC-R31 SRAM/LOGIC-R32 SRAM/LOGIC-R32 Page 7 of 12 Process -----CMOS CMOS CMOS CMOS CMOS Wfr Loc --MN MN MN MN MN Pkg type ---TQFP SOJ SOJ SOJ SOJ Assy Loc ------TAIWAN-G INDNS-O ALPHA-X INDNS-O INDNS-O CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod line Test Test Condition Device Eval# D/C ----- ------ ---------------- --------------- ------ ---MPD HTOL 150C/5.75V CY7C185-VC 97236 9646 9719 9720 97237 9646 9715 9719 9720 CY7C199-VC 96302 9617 Assembly Lot No ---------219614640 619702794N 619702545N 219614640 619701704 619702794N 619702545N 219606653 Function ----COMDTY COMDTY COMDTY COMDTY COMDTY COMDTY COMDTY COMDTY Descr Description ----------SML/64K SML/64K SML/64K SML/64K SML/64K SML/64K SML/64K 32K x 8 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 48 1508 0 28 48 1581 0 28 48 1515 0 28 48 1508 0 28 48 1180 0 28 48 1581 0 28 48 1515 0 28 48 513 0 80 116 0 500 116 0 97126 619700447 COMDTY 256K SRAM/LOGIC-R3 CMOS MN SOJ CSPI-R 28 500 167 0 500 167 0 9709 619700447L COMDTY 256K SRAM/LOGIC-R3 CMOS MN SOJ CSPI-R 28 80 15 0 80 15 0 80 103 0 80 103 0 500 15 0 500 15 0 500 103 0 500 103 0 97204 9716 619701965N COMDTY 256K SRAM/LOGIC-R3 CMOS MN SOJ CSPI-R 28 48 504 0 CY7C199-ZC 97204 9714 349701876L COMDTY 256K SRAM/LOGIC-R3 CMOS MN TSOP PHIL-M 28 48 467 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V CY7C109-VC M71070 9703 519700412 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 96 120 0 500 120 0 1000 120 0 2000 118 0 29 EOS CY7C199-15VC M64048 9639 619600540 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 28 96 120 0 500 120 0 1000 120 0 2000 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS CY62256V-VC 97132 9704 519700560 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 336 48 0 1000 48 0 CY7C1335-AC 97227 619702650 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.60V CY7C1399-VC 96423 9650 219615780 SYNCHR 32K x 8 SRAM/LOGIC-R31 CMOS MN SOJ ALPHA-X 28 80 77 0 168 77 0 150C/3.63V CY62256V-VC 97132 9706 519701211 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 162 0 168 162 0 150C/3.90V CY62256V-VC 97132 9704 519700560 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 168 152 0 150C/5.50 CY62256-VC 97132 9705 519701274 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 168 162 0 150C/5.50V CY62256-VC 97132 9705 519701274 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 162 0 150C/5.75V CY62256-SNC 97095 9710 519702461D COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 168 155 0 519702512 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 168 155 1 1 UNKNOWN CY62256V-VC 97132 9704 519700560 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 80 152 0 CY7C1020-VC 97044 9712 619701268 COMDTY 32K x16 SRAM/LOGIC-R3 CMOS MN SOJ TAIWN-G 44 80 78 0 168 78 0 Technology ---------------SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 SRAM/LOGIC-R28 Page 8 of 12 Process -----CMOS CMOS CMOS CMOS CMOS CMOS CMOS CMOS Wfr Loc --MN MN MN MN MN MN MN MN Pkg type ---SOJ SOJ SOJ SOJ SOJ SOJ SOJ SOJ Assy Loc ------ALPHA-X CSPI-R CSPI-R ALPHA-X CSPI-R CSPI-R CSPI-R ALPHA-X CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod Assembly Func- Descr ProWfr Pkg Assy No Dura Qty Qty line Test Test Condition Device Eval# D/C Lot No tion Description Technology cess Loc type Loc Pin tion Test Fail Fail Mode ----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MPD HTSSL2 125C/5.75V CY7C109-VC M71071 9703 519700412 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 96 120 0 500 120 0 1000 120 0 2000 120 0 CY7C199-VC M71059 9704 619700148 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ PHIL-M 28 96 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL -30C/6.5V CY62256-VC 97132 9705 519701274 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 500 52 0 500 52 0 1000 52 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CY62256V-ZC M71029 9648 349614698 COMDTY 32K x 8 SRAM/LOGIC-R3 CMOS CA TSOP PHIL-M 28 168 79 10 10 TOPSIDE CRACKS CY7C109-VC M71074 9703 519700412 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ INDNS-O 32 96 78 0 168 78 0 8 EXTERNAL CONT. 288 70 0 CY7C186-ZC M72030 9713 619701453 COMDTY SML/64K SRAM/LOGIC-R21 CMOS TX TSOP KOREA-Q 32 96 78 0 168 78 0 CY7C199-VC M72033 9715 219703386 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ ALPHA-X 28 96 77 0 168 77 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C CY7C1009-VC 97172 619702133 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 32 100 45 0 200 45 0 CY7C1335-AC 97227 619702650 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 100 45 0 200 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CY62256-NSC M71063 9647 519614048 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN NSOI INDNS-O 28 300 50 0 1000 50 0 CY62256-VC 97132 9705 519701274 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 300 48 0 1000 48 0 CY62256V-VC 97132 9704 519700560 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 300 88 0 1000 88 0 9706 519701211 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS MN SOJ INDNS-O 28 300 46 0 1000 46 0 CY7C1009-VC 97172 619702133 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 32 300 45 0 619702134 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 32 300 45 0 619702191 COMDTY 256K x 4 SRAM/LOGIC-R28 CMOS MN SOJ CSPI-R 32 300 45 0 CY7C1020-VC 97044 9712 619701268 COMDTY 32K x16 SRAM/LOGIC-R3 CMOS MN SOJ TAIWN-G 44 300 48 0 CY7C109-VC 96302 9626 349608918 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN SOJ KOREA-L 32 300 48 0 CY7C109-ZC M71024 9640 349612511 COMDTY 128K x 8 SRAM/LOGIC-R28 CMOS MN TSOP KOREA-L 32 300 50 0 CY7C1335-AC 97227 619702650 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 300 45 0 619702651 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 300 38 0 619702652 SYNCHR 32K x 32 SRAM/LOGIC-R33 CMOS MN TQFP CSPI-R 100 300 28 0 CY7C1399-VC 96423 9650 219615780 SYNCHR 32K x 8 SRAM/LOGIC-R31 CMOS MN SOJ ALPHA-X 28 300 47 0 1000 47 0 M71086 9701 619601664 SYNCHR 32K x 8 SRAM/LOGIC-R31 CMOS CA SOJ CSPI-R 28 300 48 0 CY7C186-ZC M71088 9651 349615740 COMDTY SML/64K SRAM/LOGIC-R21 CMOS TX TSOP KOREA-Q 32 300 97 0 CY7C199-VC 96302 9617 219606653 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ ALPHA-X 28 300 48 0 Page 9 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod line Test Test Condition Device Eval# ----- ------ ---------------- --------------- -----MPD TC2 -65C TO 150C CY7C199-VC 96302 M72004 Dura Qty Qty tion Test Fail Fail Mode ---- ----- ---- ------------------------1000 48 0 300 50 0 1000 50 0 CY7C199-ZC 97098 9707 349700963 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN TSOP PHIL-M 28 300 47 0 300 48 0 300 48 0 1000 47 0 1000 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV 0 READ POINT CY62256-SNC M72079 9721 519705680 COMDTY 32K x 8 SRAM/LOGIC-R32 CMOS CA NSOI INDNS-O 28 -5 120 0 25 120 0 85 120 0 CY7C1031-JC M72019 9718 519704043 SYNCHR 64K x 18 SRAM/LOGIC-R3 CMOS MN PLCC INDNS-O 52 -5 118 0 25 118 0 85 116 0 CY7C1399-ZI M72051 9704 349700156 SYNCHR 32K x 8 SRAM/LOGIC-R31 CMOS CA TSOP PHIL-M 28 -5 114 0 25 114 0 85 114 0 CY7C199-VC M72001 9716 619702338 COMDTY 32K x 8 SRAM/LOGIC-R28 CMOS MN SOJ PHIL-M 28 -5 120 0 25 120 0 85 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------D/C ---9617 9716 Assembly Lot No ---------219606653 619702338 Function ----COMDTY COMDTY Descr Description ----------32K x 8 32K x 8 Technology ---------------SRAM/LOGIC-R28 SRAM/LOGIC-R28 Page 10 of 12 Process -----CMOS CMOS Wfr Loc --MN MN Pkg type ---SOJ SOJ Assy Loc ------ALPHA-X PHIL-M No Pin --28 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod line Test Test Condition Device Eval# D/C ----- ------ ---------------- --------------- ------ ---NMD DRET 165C/NO BIAS CY27H512-JC M71020 9651 Assembly Lot No ---------219615860 Function ----PROM Descr Description Technology ----------- ---------------64K x 8 FAMOS-P26 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 168 46 0 1000 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST 140C/5.5V CY27C010-PC M71022 9702 349616299 PROM 128K x 8 FAMOS-P26 CMOS TX PDIP KOREA-H 32 128 32 0 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.75V CY27H512-JC M71016 9651 219615860 PROM 64K x 8 FAMOS-P26 CMOS TX PLCC ALPHA-X 32 96 118 0 500 118 0 1000 118 0 2000 118 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CY27C010-PC M72013 9707 349700791 PROM 128K x 8 FAMOS-P26 CMOS TX PDIP KOREA-H 32 96 78 0 168 78 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C CY27C512-WC M71012 9643 219614017 PROM 64K x 8 FAMOS-P26 CMOS TX WCER ALPHA-X 28 100 50 0 CY27H010-WC M71013 9652 219616133 PROM 128K x 8 FAMOS-P26 CMOS TX WCER ALPHA-X 32 100 50 0 1000 50 0 -65C TO 150C CY27C010-PC M72014 9707 349700791 PROM 128K x 8 FAMOS-P26 CMOS TX PDIP KOREA-H 32 300 48 0 1000 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV 0 READ POINT CY27C010-PC M72008 9707 349700791 PROM 128K x 8 FAMOS-P26 CMOS TX PDIP KOREA-H 32 -5 119 0 25 119 0 85 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 11 of 12 Process -----CMOS Wfr Loc --TX Pkg type ---PLCC Assy Loc ------ALPHA-X CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 Issued: 7/15/97 Cypress Semiconductor Corporation Quarterly Reliability report Quarter 2, 1997 Prod Assembly Func- Descr ProWfr Pkg Assy No Dura Qty Qty line Test Test Condition Device Eval# D/C Lot No tion Description Technology cess Loc type Loc Pin tion Test Fail Fail Mode ----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------PPD DRET2 250C/NO BIAS CY7C374I-YMB 97127 9712 219702728 FLASH 128 MCEL FL FLASH-FL28D CMOS TX CLCC ALPHA-X 84 96 81 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST 140C/5.5V CY7C374I-JC 97127 9707 219701614 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC ALPHA-X 84 128 23 0 128 25 0 CY7C384A-JC 96302 9628 219610501 FPGA 2K GATE FAMOS-VL26D CMOS TX PLCC ALPHA-X 84 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V CY7C344-WMB 97239 9719 219704467 MAX REPROG.PAL FAMOS-P20 CMOS TX WCER ALPHA-X 28 81 168 0 9720 219704725 MAX REPROG.PAL FAMOS-P20 CMOS TX WCER ALPHA-X 28 81 158 0 9721 219705133 MAX REPROG.PAL FAMOS-P20 CMOS TX WCER ALPHA-X 28 81 172 0 CY7C372I-YMB 96472 9704 219700639 FLASH 64-MCEL FL FLASH-FL28D CMOS TX CLCC ALPHA-X 44 184 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.50V CY7C374I-JC 97127 9707 219701614 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC ALPHA-X 84 48 79 0 80 79 0 500 79 0 9712 219702747 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC ALPHA-X 84 12 495 0 48 494 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CY7C374I-JC M71079 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC KOREA-A 84 96 77 1 1 UNKNOWN 168 76 0 288 76 0 1 EOS CY7C375I-AC M71089 9706 349701025 FLASH 128 MCEL FL FLASH-FL28D CMOS TX TQFP TAIWAN-G 160 168 78 0 9 EXTERNAL CONTAMINATION ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CY7C374I-JC M71080 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC KOREA-A 84 300 47 0 1000 47 0 CY7C375U-AC M71091 9652 349615541 FLASH 128 MCEL FL FLASH-FL28D CMOS TX TQFP KOREA-Q 160 300 47 0 1000 47 0 CY7C384A-JC 96302 9628 219610501 FPGA 2K GATE FAMOS-VL26D CMOS TX PLCC ALPHA-X 84 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV 0 READ POINT CY7C374I-JC M72044 9715 219703283 FLASH 128 MCEL FL FLASH-FL28D CMOS TX PLCC ALPHA-X 84 -5 118 0 25 118 0 85 118 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 12 of 12