Q2 - 1998

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 2, 1998
Rev 1
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/3/98
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
High Temp Op Life, 150ºC, 5.75V
High Temp Op Life, 125ºC, 5.75V
High Temp Steady State Life, 150ºC, 5.75V
High Temp Steady State Life, 125ºC, 5.75V
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Page 2 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/3/98
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
FR
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
MHS, France
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/3/98
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/3/98
RELIABILITY DATA SUMMARY
(Q298)
1
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress conditions.
Page 5 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/3/98
RELIABILITY DATA SUMMARY
(Q298)
Page 6 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
BICMOS-SM1
CY7B991-JC
DRET
165C/N/A
DCD
CHNL
M82027
9807 219800993
PSCB
BiCMOS TX
PLCC ALPHA-X
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
168
1000
76
76
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
DCD
CHNL
CY7B991-JC
M74070
9733 219708729
PSCB
BiCMOS TX
PLCC ALPHA-X
32
128
128
128
128
12
15
21
29
0
0 15 EOS
0
0
M80156
9746 219711890
PSCB
BiCMOS TX
PLCC ALPHA-X
32
128
128
13
16
0 3 EOS
0 2 THERMAL EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
DCD
CHNL
CY7B991-JC
M74066
9733 219708729
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
500
1000
2000
115
115
115
114
0
0
0
1 1 EOS/1 UNKNOWN
M80152
9746 219711890
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
500
1000
2000
114
113
112
99
0
1 1 EOS/1 UNKNOWN
0
0 13 EOS
M82006
9807 219800993
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
96
176
324
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7B991-JC
M82024
9807 219800993
PSCB
BiCMOS TX
PLCC ALPHA-X
32
168
71
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
DCD
CHNL
CY7B991-JC
M82028
9807 219800993
PSCB
BiCMOS TX
PLCC ALPHA-X
32
300
45
0
ENET
CY7B8392-JC
M74078
9716 519704354
TRANSCEIVER BiCMOS TX
PLCC INDNS-O
28
300
45
4 4 TOPSIDE CRACKS
M74091
9708 519701901
TRANSCEIVER BiCMOS TX
PLCC INDNS-O
28
300
46
0
Page 7 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
BICMOS-SM1
CY7B8392-JC
TC2
150C/-65C
DCD
ENET
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M80195
9752 519714771
TRANSCEIVER BiCMOS TX
PLCC INDNS-O
28
300
45
1 1 TOPSIDE CRACKS
M80196
9802 519800401
TRANSCEIVER BiCMOS TX
PLCC INDNS-O
28
300
45
1 1 TOPSIDE CRACKS
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P20
CY7C341-JC
HTOL
140C/5.75V
150C/5.75V
PLD
MPD
MAX
PROM
CY7C251-TMB
97497
97454
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9748 219712389
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
84
72
251
0
219712390
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
84
72
212
0
16K x 8
CMOS
TX
WCER PHIL-M
28
184
48
0
9746 349705494
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
PLD
MAX
CY7C341-JC
97497
619804184P REPROG.PAL
CMOS
TX
PLCC ALPHA-X
84
96
202
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
PROM
CY7C251-TMB
97454
9746 349705494
16K x 8
CMOS
TX
WCER PHIL-M
28
100
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
CY27C010-PC
DRET
165C/N/A
MPD
PROM
M82022
9747 619709651
128K x 8
CMOS
TX
PDIP KOREA-H
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
168
1000
84
84
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
140C/5.75V
150C/5.75V
PLD
MPD
MAX
PROM
CY7C342B-HMB
97356
9731 219708281P REPROG.PAL
CMOS
TX
CERQ ALPHA-X
68
72
184
0
9810 219801652
REPROG.PAL
CMOS
TX
CERQ ALPHA-X
68
72
207
0 1 EOS
CY7C342B-RMB
97356
9734 219708941
REPROG.PAL
CMOS
TX
WPGA ALPHA-X
68
72
185
0
CY27H010-WMB
97458
9742 349705318
128K x 8
CMOS
TX
WCER PHIL-M
32
184
49
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
PROM
CY27C010-PC
M80168
9738 619707247
128K x 8
CMOS
TX
PDIP KOREA-H
32
96
500
1000
2000
118
118
118
118
0
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
PROM
CY27C010-PC
M80169
9738 619707247
128K x 8
CMOS
TX
PDIP KOREA-H
32
96
500
118
118
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
PROM
CY27C010-PC
M82023
9747 619709651
128K x 8
CMOS
TX
PDIP KOREA-H
32
300
48
0
CY27H010-WMB
97458
9742 349705318
128K x 8
CMOS
TX
WCER PHIL-M
32
100
47
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 10 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FLASH-FL28D
CY7C375I-AC
160
PCT
121C/100%RH
PLD
FLASH
M82041
9811 619802675
128 MCEL FL CMOS
TX
TQFP KOREA-Q
96
168
77
77
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
PLD
FLASH
CY7C375I-AC
M82043
9811 619802675
128 MCEL FL CMOS
TX
TQFP KOREA-Q
160
300
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-C2AN
VIC068A-BC
144
PCT
121C/100%RH
DCD
VME
M80164
9746 349705554
VME INTERF. CMOS
MN
PPGA PHIL-M
96
168
77
77
0
0 23 EXTERNAL CONTAMINATION
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
DCD
VME
VIC068A-BC
M80166
9746 349705554
VME INTERF. CMOS
MN
PPGA PHIL-M
144
300
47
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L1
CY7C9101-LMB
HTOL
150C/5.75V
DCD
VME
97459
9741 349705366
16-BITS SLI CMOS
TX
LCC
PHIL-M
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------68
184
49
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 13 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L20
CY7C611A-NC
160
PCT
121C/100%RH
DCD
VME
M80182
9731 349704147
RISC CONTRL CMOS
TX
PQFP HK-B
96
168
78
71
7 4 TOPSIDE CRACKS/3 POPCOR
7 7 LIFTING BOND
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 14 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L27
CY74FCT2574TQC
PCT
121C/100%RH
CPD
FCT
MR81076 9806 619801650
8 BIT REG.
CMOS
MN
SSOP CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------20
96
168
76
76
0
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 15 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L28
CY2310NZPVC
HAST
140C/3.63V
CPD
TTECH
98108
9811 349800519
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
128
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
CPD
TTECH
CY2310NZPVC
98108
9811 349800519
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
28
336
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CPD
TTECH
CY22751PVC
M82054
9804 619800214
CLOCK SYN.
CMOS
MN
SSOP CSPI-R
48
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
150C/-55C
CPD
TTECH
CY2310NZPVC
98108
9811 349800519
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
28
100
200
47
47
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
CPD
TTECH
CY2310NZPVC
98108
9811 349800519
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
28
300
47
0
349800520
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
28
300
47
0
349800521
SDRAM BUFF. CMOS
MN
SSOP PHIL-M
28
300
47
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 16 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L31
CY74FCT163LD952 98074
HAST
140C/3.63V
CPD
FCT
9747 349705947
16 BIT REG. CMOS
MN
TSSO MALAY-U
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------56
128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
CPD
FCT
CY74FCT163LD952 98074
9747 349705947
16 BIT REG. CMOS
MN
TSSO MALAY-U
56
336
1000
48
48
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
150C/-55C
CPD
FCT
CY74FCT163LD952 98074
9747 349705947
16 BIT REG. CMOS
MN
TSSO MALAY-U
56
100
200
48
48
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
CPD
FCT
CY74FCT163LD952 98074
9747 349705947
16 BIT REG. CMOS
MN
TSSO MALAY-U
56
300
48
0
349705948
16 BIT REG. CMOS
MN
TSSO MALAY-U
56
300
48
0
349705949
16 BIT REG. CMOS
MN
TSSO MALAY-U
56
300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 17 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R21
HAST
140C/3.3V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C188-VC
MR82049 9529 349514426
32K x 9
CMOS
TX
SOJ
KOREA-L
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
128
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.65V
MPD
COMDTY CY7C188-VC
MR82048 9529 349514426
32K x 9
CMOS
TX
SOJ
KOREA-L
32
96
500
0
125C/5.75V
MPD
COMDTY CY7C185-VC
M80145
SML/64K
CMOS
TX
SOJ
CSPI-R
28
96
500
1000
2000
116
116
114
114
0
0
0 2 EOS
0
9745 619709631
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
COMDTY CY7C185-VC
M80146
9745 619709631
SML/64K
CMOS
TX
SOJ
CSPI-R
28
96
500
116
116
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C188-VC
MR82087 9529 349514426
32K x 9
CMOS
TX
SOJ
KOREA-L
32
96
168
80
80
0
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 18 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
130C/5.5V
DCD
SPCM
CY7C4245-AC
M82011
9745 619709392
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
128
76
0
140C/5.5
DCD
SPCM
CY7C136-JC
M82016
9704 349700386
2K x 8 DP
CMOS
MN
PLCC PHIL-M
52
128
80
0
MPD
COMDTY CY7C109-VC
MR82026 9802 519714897
128K x 8
CMOS
MN
SOJ
32
128
79
0
CY7C199-ZC
MR81069 9808 619802243
32K x 8
CMOS
MN
TSOP CSPI-R
28
128
76
1 1 TOPSIDE DAMAGE
INDNS-O
140C/5.5V
MPD
COMDTY CY7C1009-VC
MR82062 9807 619711668
256K x 4
CMOS
MN
SOJ
CSPI-R
32
128
45
2 2 LIFTING BONDS
140C/5.75V
MPD
COMDTY CY7C199-VC
MR82032 9806 619801593
32K x 8
CMOS
TX
SOJ
CSPI-R
28
128
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.65V
125C/5.75V
MPD
COMDTY CY7C1009-VC
MR82010 9803 619711085
256K x 4
CMOS
MN
SOJ
CSPI-R
32
96
487
0
CY7C109-VC
MR82001 9802 519714897
128K x 8
CMOS
MN
SOJ
INDNS-O
32
96
496
0
CY7C199-VC
MR82002 9806 619801593
32K x 8
CMOS
TX
SOJ
CSPI-R
28
96
489
0
CY7C199-ZI
MR82014 9808 619802112
32K x 8
CMOS
MN
TSOP CSPI-R
28
96
489
0
CY7C136-JC
M82007
9704 349700386
2K x 8 DP
CMOS
MN
PLCC PHIL-M
52
96
500
0
M80127
9741 619708282
256K x 4
CMOS
MN
SOJ
CSPI-R
32
96
500
1000
2000
117
117
116
116
0
0
0 1 EOS
0
M80135
9745 349705798
32K x 9
CMOS
MN
SOJ
PHIL-M
32
96
500
1000
2000
116
116
113
113
0
0
0
0
DCD
SPCM
MPD
COMDTY CY7C1009-VC
CY7C188-VC
Page 19 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R28
HTOL2
125C/5.75V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C199-VC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M80113
9746 619709733
32K x 8
CMOS
TX
SOJ
CSPI-R
28
96
500
1000
2000
117
117
117
117
0
0
0
0
M80181
9748 619710553
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
96
500
1000
2000
117
117
117
117
0
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
COMDTY CY7C1009-VC
M80128
9741 619708282
256K x 4
CMOS
MN
SOJ
CSPI-R
32
96
500
117
113
0
0 4 EOS
CY7C188-VC
M80136
9745 349705798
32K x 9
CMOS
MN
SOJ
PHIL-M
32
96
500
115
115
0
0
CY7C199-VC
M80114
9746 619709733
32K x 8
CMOS
TX
SOJ
CSPI-R
28
96
500
117
117
0
0
M80180
9748 619710553
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
96
500
118
116
0
0 2 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
MPD
SPCM
CY7C136-JC
M82018
9704 349700386
2K x 8 DP
CMOS
MN
PLCC PHIL-M
52
96
168
80
80
0
0
CY7C4245-AC
M82013
9750 619710597
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
96
168
77
77
0
0
M83009
9746 619710040
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
168
77
0
MR82064 9807 619711668
256K x 4
CMOS
MN
SOJ
CSPI-R
32
96
168
76
76
0
0
M80185
9749 519713657
128K x 8
CMOS
MN
SOJ
INDNS-O
32
96
168
76
76
0
0
MR82028 9802 519714897
128K x 8
CMOS
MN
SOJ
INDNS-O
32
96
79
0
COMDTY CY7C1009-VC
CY7C109-VC
Page 20 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28
PCT
121C/100%RH
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C109-VC
MR82028 9802 519714897
128K x 8
CMOS
MN
SOJ
INDNS-O
32
168
79
0
CY7C199-VC
MR82034 9806 619801593
32K x 8
CMOS
TX
SOJ
CSPI-R
28
96
168
76
76
0
0
CY7C199-ZI
MR82082 9808 619802112
32K x 8
CMOS
MN
TSOP CSPI-R
28
168
73
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY7C109-VC
9812 519802968
128K x 8
CMOS
MN
SOJ
INDNS-O
32
300
48
0
519802969
128K x 8
CMOS
MN
SOJ
INDNS-O
32
300
48
0
519802970
128K x 8
CMOS
MN
SOJ
INDNS-O
32
300
48
0
MR82027 9802 519714897
128K x 8
CMOS
MN
SOJ
INDNS-O
32
300
46
0
CY7C188-VC
MR81012 9748 349705698
32K x 9
CMOS
MN
SOJ
PHIL-M
32
300
45
0
CY7C199-DMB
97458
9745 349705478
32K x 8
CMOS
MN
CERD PHIL-M
28
100
50
0
CY7C199-VC
MR82033 9806 619801593
32K x 8
CMOS
TX
SOJ
CSPI-R
28
300
45
0
CY7C199-ZC
MR81068 9808 619802243
32K x 8
CMOS
MN
TSOP CSPI-R
28
300
45
0
MR81071 9807 619801847
32K x 8
CMOS
MN
TSOP CSPI-R
28
300
45
0
MR81075 9803 619801783
32K x 8
CMOS
MN
TSOP CSPI-R
28
300
45
0
MR82081 9808 619802112
32K x 8
CMOS
MN
TSOP CSPI-R
28
300
45
1 1 TOPSIDE DAMAGE
CY7C199-ZI
98071
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R3
HAST
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
140C/
MPD
COMDTY CY62256V-ZC
M74093
9705 349700731
32K x 8
CMOS
CA
TSOP PHIL-M
28
128
71
0
140C/5.5V
MPD
COMDTY CY7C1021-ZSC
98109
9813 619802984
64K x16
CMOS
MN
TSOP CSPI-R
44
128
45
0
SYNC
M82049
9804 519800339
64K x 18
CMOS
MN
PLCC INDNS-O
52
128
80
0
CY7C1031-JC
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
COMDTY CY7C1021-ZSC
SYNC
CY7C1031-JC
98092
M80159
9747 619709892N 64K x16
CMOS
MN
TSOP KOREA-H
44
96
1000
0
9802 619711733N 64K x16
CMOS
MN
TSOP KOREA-H
44
96
1129
0
619711734N 64K x16
CMOS
MN
TSOP KOREA-H
44
96
1118
0
CMOS
MN
PLCC INDNS-O
52
96
500
1000
2000
116
116
113
113
9742 519710953
64K x 18
0
0
0 3 EOS
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
MPD
COMDTY CY7C1021-ZSC
98109
9813 619802984
64K x16
CMOS
MN
TSOP CSPI-R
44
336
1000
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
COMDTY CY7C199-VC
M80194
9802 619711953
256K
CMOS
MN
SOJ
SYNC
M80160
9742 519710953
64K x 18
CMOS
MN
PLCC INDNS-O
CY7C1031-JC
CSPI-R
28
96
500
116
116
0
0
52
96
500
116
116
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
SYNC
CY7C1031-JC
M82047
9804 519800339
Page 22 of 36
64K x 18
CMOS
MN
PLCC INDNS-O
52
96
168
80
80
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R3
T/S
150C/-55C
MPD
COMDTY CY7C1021-ZSC
98109
9813 619802984
64K x16
CMOS
MN
TSOP CSPI-R
44
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY7C1021-ZSC
CY7C199-VC
SYNC
CY7C1031-JC
98109
9813 619802984
64K x16
CMOS
MN
TSOP CSPI-R
44
300
45
0
619803206
64K x16
CMOS
MN
TSOP CSPI-R
44
300
45
0
619803207
64K x16
CMOS
MN
TSOP CSPI-R
44
300
45
0
MR81043 9802 619711953
256K
CMOS
MN
SOJ
CSPI-R
28
300
45
0
MR81044
256K
CMOS
MN
TSOP CSPI-R
28
300
45
0
64K x 18
CMOS
MN
PLCC INDNS-O
52
300
50
0
M82048
619716685
9804 519800339
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R31
CY7C1399-VC
HTOL2
125C/3.45V
MPD
SYNC
M80109
9744 619709194
32K x 8
CMOS
MN
SOJ
PHIL-M
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
96
500
1000
2000
117
117
114
114
0
0
0 3 EOS
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 24 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32
HAST
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
140C/5.5
MPD
COMDTY CY7C109-VC
MR82044 9807 519801541
128K x 8(5) CMOS
MN
SOJ
140C/5.5V
MPD
COMDTY CY62128-ZAC
98107
128K x 8
MN
STSO CSPI-R
9816 619802494
CMOS
INDNS-O
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
128
80
0
32
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
MPD
COMDTY CY62256V-NSC
98042
9806 519801279
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
519801280
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
519801295
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
519801296
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
519801310
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
519801311
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
513
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.65V
MPD
COMDTY CY7C109-VC
MR82004 9807 519801541
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
202
0
125C/5.75V
MPD
COMDTY CY62256-SNC
M80117
9744 519710283
32K x 8
CMOS
CA
NSOI INDNS-O
28
96
500
1000
2000
117
116
114
113
0
0
2 1 POLY DEFECT/1 SPEED DEG
0
M80131
9745 519712223
128K x 8(5) CMOS
MN
SOJ
32
96
500
1000
2000
117
117
117
117
0
0
0
0
CY7C109-VC
INDNS-O
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
MPD
COMDTY CY62128-ZAC
98107
9816 619802494
128K x 8
CMOS
MN
STSO CSPI-R
32
336
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32
HTSSL2 125C/3.63V
125C/5.5V
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MPD
COMDTY CY62256V-ZC
M80143
9749 619710170
32K x 8
CMOS
MN
TSOP CSPI-G
28
96
500
116
115
0
0
MPD
COMDTY CY62256-SNC
M80118
9744 519710283
32K x 8
CMOS
CA
NSOI INDNS-O
28
96
500
116
116
0 1 EOS
0
M80132
9745 519712223
128K x 8(5) CMOS
MN
SOJ
32
96
500
117
117
0
0
CY7C109-VC
INDNS-O
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62256V-ZC
CY7C109-VC
M80140
9749 619710170
MR82046 9807 519801541
32K x 8
CMOS
MN
TSOP CSPI-G
28
96
168
77
11
0
0
128K x 8(5) CMOS
MN
SOJ
32
96
168
77
77
0
0
INDNS-O
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
150C/-55C
MPD
COMDTY CY62128-ZAC
98107
9816 619802494
128K x 8
CMOS
MN
STSO CSPI-R
32
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY62128-ZAC
98107
-
619802568
128K x 8
CMOS
MN
STSO CSPI-R
32
300
45
0
9816 619802528
128K x 8
CMOS
MN
STSO CSPI-R
32
300
45
0
CY62256V-ZC
MR81048 9802 349706405
32K x 8
CMOS
MN
TSOP PHIL-M
28
300
40
0
CY7C109-VC
M80100
9806 519801045
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
M80199
9805 519800982
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 26 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32D
DRET
165C/N/A
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1049-VC
M80107
9747 619709647
512K x 8
CMOS
MN
SOJ
KOREA-L
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------36
168
1000
78
78
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/
MPD
COMDTY CY7C1049-VC
98148
9816 619804072
512K x 8
CMOS
MN
SOJ
CSPI-R
36
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
COMDTY CY7C109-DMB
98021
9745 219711624
128K x 8
CMOS
MN
CERD ALPHA-X
32
48
80
500
1007
120
120
1 1 UNKNOWN
0
0
CY7C109-LMB
98021
9734 219708960
128K x 8
CMOS
MN
LCC
ALPHA-X
32
48
184
522
48
0
0
9803 219800288
128K x 8
CMOS
MN
LCC
ALPHA-X
32
48
1024
0
219800289
128K x 8
CMOS
MN
LCC
ALPHA-X
32
48
80
500
479
115
115
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
MPD
COMDTY CY7C1049-VC
98148
9816 619804072
512K x 8
CMOS
MN
SOJ
CSPI-R
36
336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.50V
MPD
COMDTY CY7C109-LMB
98021
9734 219708960
128K x 8
CMOS
MN
LCC
ALPHA-X
32
80
168
78
78
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
150C/-55C
MPD
COMDTY CY7C1049-VC
98148
9816 619804072
512K x 8
CMOS
MN
SOJ
CSPI-R
36
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY7C1049-VC
98148
9816 619804072
Page 27 of 36
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
300
45
45
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R32D
TC2
150C/-65C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1049-VC
98148
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9816 619804129
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
44
0
9817 619804088
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
45
0
CY7C109-DMB
98021
9745 219711624
128K x 8
CMOS
MN
CERD ALPHA-X
32
100
100
20
23
0
0
CY7C109-LMB
98021
9803 219800289
128K x 8
CMOS
MN
LCC
32
100
83
0
ALPHA-X
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 28 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R33
CY7C1329-AC
100
HAST
140C/3.63V
MPD
SYNC
98075
9743 619708021
64K x 32
CMOS
MN
TQFP CSPI-R
128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/N/A
MPD
SYNC
CY7C1329-AC
98075
9743 619708050
64K x 32
CMOS
MN
TQFP CSPI-R
100
336
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
SYNC
CY7C1329-AC
98075
9740 619708099
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
48
0
9743 619708021
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
48
0
619708050
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 29 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42
HAST
140C/3.63V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C62127V-ZSI
97506
9810 619802140L 1 MEG SRAM
CMOS
MN
TSOP KOREA-H
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
MPD
COMDTY CY7C62127V-ZSI
97506
9810 619802140L 1 MEG SRAM
CMOS
MN
TSOP KOREA-H
44
80
500
120
120
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY7C62127V-ZSI
97506
CY7C62127V-ZSIB 97506
9810 619802140L 1 MEG SRAM
CMOS
MN
TSOP KOREA-H
44
300
48
0
9810 619802141
CMOS
MN
TSOP KOREA-H
44
300
48
0
1 MEG SRAM
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 30 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42D
HAST
140C/3.63V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
DCD
SPCM
CY7C4285V-JC
97483
9807 219801126
64Kx18 FIFO CMOS
MN
PLCC ALPHA-X
68
128
45
0
MPD
SYNC
CY7C1334-AC
98075
9809 619801906
64K x 32
CMOS
MN
TQFP CSPI-R
100
128
43
0 1 EOS
140C/3/63
MPD
COMDTY CY7C1041V33-VC
98043
9813 619802985
256K X 16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
140C/5.5V
MPD
COMDTY CY7C1020V33-VC
98131
9813 619802649
32K x16
CMOS
MN
SOJ
CSPI-R
44
128
44
0
619802650
32K x16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.63V
150C/3.8V
MPD
DCD
COMDTY CY7C1021V33-VC
SPCM
97416
9809 619801835
64K x16
CMOS
MN
SOJ
CY7C1021V33-ZSC 97416
9810 619801885
64K x16
CMOS
MN
CY7C4285V-JC
9807 219801126
64Kx18 FIFO CMOS
MN
97483
CSPI-R
44
48
80
500
1550
119
119
0
0
0
TSOP KOREA-H
44
48
50
0
PLCC ALPHA-X
68
48
80
500
405
405
405
0 1 EOS
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.8V
MPD
COMDTY CY7C1020V33-ZSC 97517
9811 619802538/ 32K x16
CMOS
MN
TSOP KOREA-H
44
96
168
1500
261
0
0
125C/5.75V
MPD
COMDTY CY7C1020V33-VC
9813 619802649
32K x16
CMOS
MN
SOJ
CSPI-R
44
80
500
116
116
0
0
619802650
32K x16
CMOS
MN
SOJ
CSPI-R
44
80
500
116
116
0
0
98131
Page 31 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R42D
HTS
165C/N/A
MPD
COMDTY CY7C1020V33-VC
CY7C1041V33-VC
98131
98043
9813 619802649
32K x16
CMOS
MN
SOJ
CSPI-R
44
336
38
0
619802650
32K x16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
619802651
32K x16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
256K X 16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
9813 619802985
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/3.63V
DCD
SPCM
CY7C4285V-JC
97483
9807 219801126
64Kx18 FIFO CMOS
MN
PLCC ALPHA-X
68
80
168
76
76
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021V33-BAC MR82013 9803 619710085
64K x16
CMOS
MN
SBGA TAIWN-G
48
96
168
61
60
0
0
MR82106 9816 619804057
64K x16
CMOS
MN
SBGA TAIWN-G
48
96
168
80
80
0
0
97396
512K x 8
CMOS
MN
SOJ
36
168
50
0
CY7C1049V33-VC
9802 619711944
KOREA-L
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
125C/-55C
MPD
COMDTY CY7C1041V33-VC
98043
9813 619802985
256K X 16
CMOS
MN
SOJ
CPSI-R
CSPI-R
44
44
200
100
45
45
0
0
150C/-55C
MPD
SYNC
98075
9807 619801352
64K x 32
CMOS
MN
TQFP CSPI-R
100
100
200
48
47
0
0
CY7C1334-AC
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
125C/-40C
MPD
SYNC
CY7C1334-AC
98075
9809 619801906
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 32 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42D
CY7C4285V-JC
TC2
150C/-65C
DCD
SPCM
MPD
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
97483
9807 219801126
64Kx18 FIFO CMOS
MN
PLCC ALPHA-X
68
300
45
0
COMDTY CY7C1019V33-VC
97416
9811 519801735
128K x 8
CMOS
MN
SOJ
INDNS-O
44
300
46
0
CY7C1020V33-VC
98131
9813 619802649
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
619802650
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
619802651
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
9811 619802538/ 32K x16
CMOS
MN
TSOP KOREA-H
44
300
48
0
CY7C1020V33-ZSC 97517
CY7C1021V33-BAC MR82007 9803 619710085
64K x16
CMOS
MN
SBGA TAIWN-G
48
300
45
0
MR82107 9816 619804057
64K x16
CMOS
MN
SBGA TAIWN-G
48
300
50
0
97416
9809 619801835
64K x16
CMOS
MN
SOJ
44
300
300
48
50
0
0
CY7C1021V33-ZSC MR82051 9816 619803608
64K x16
CMOS
MN
TSOP KOREA-H
44
300
55
0
CY7C1041V33-VC
9813 619802893
256K X 16
CMOS
MN
SLJ
CSPI-R
44
300
48
0
619802985
256K X 16
CMOS
MN
SOJ
CSPI-R
44
300
48
0
619803035
256K X 16
CMOS
MN
SOJ
CSPI-R
44
300
48
0
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
45
0
CY7C1021V33-VC
SYNC
CY7C1334-AC
98043
98075
9809 619801906
CSPI-R
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 33 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST
140C/5.5V
140C/5.75V
MPD
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1049-VC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
98248
9805 619800740
512K x 8
CMOS
MN
SOJ
KOREA-L
36
128
47
0
CY7C1049-VCB
98086
9813 619803319
512K x 8
CMOS
MN
SOJ
KOREA-L
36
128
50
0
CY7C109-VC
98064
9745 519712560
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
46
0
9746 519712898
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
256
46
46
0
0
9751 519714390
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
46
0
9811 519802689/ 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
46
0
COMDTY CY7C109-VC
98085
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
COMDTY CY7C1049-VC
CY7C1049-VCB
CY7C109-VC
98248
9805 619800740
512K x 8
CMOS
MN
SOJ
KOREA-L
36
80
500
385
385
0
0
98086
9813 619803319
512K x 8
CMOS
MN
SOJ
KOREA-L
36
48
48
48
80
80
200
500
440
490
756
55
324
378
377
0
0
0
0
1 1 PARTICLE
0
1 1 PARTICLE
98248
9807 619801747
512K x 8
CMOS
MN
SOJ
KOREA-L
36
80
500
400
400
0
0
98064
9751 519714390
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
80
500
1000
528
527
527
0
0
0
9803 519800651L 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
80
500
529
529
0
0
9811 519802689/ 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
48
48
48
80
500
498
1494
1664
385
383
98085
Page 34 of 36
0
2 1 PARTICLE/1 OTHERS
2 1 PARTICLE/1 OTHERS
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R42HD HTS
165C/N/A
MPD
COMDTY CY7C109-VC
98064
9745 519712560
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
336
1000
46
46
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.5V
MPD
COMDTY CY7C1049-VC
CY7C1049-VCB
CY7C109-VC
98248
9805 619800740
512K x 8
CMOS
MN
SOJ
KOREA-L
36
80
168
79
79
0 1 EOS
0
98086
9813 619803319
512K x 8
CMOS
MN
SOJ
KOREA-L
36
80
168
80
80
0
0
98248
9807 619801747
512K x 8
CMOS
MN
SOJ
KOREA-L
36
80
168
80
80
0
0
98064
9745 519712560
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
80
168
78
78
0
0
9751 519714390
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
80
168
78
78
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/6.50V
MPD
COMDTY CY7C109-VC
98064
9745 519712560
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
500
1000
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021-VC
98115
9819 619804711
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
168
50
50
0
0
CY7C1049-VCB
98086
9813 619803319
512K x 8
CMOS
MN
SOJ
KOREA-L
36
168
48
0
CY7C109-VC
98085
9811 519802689/ 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
168
46
46
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
150C/-65C
MPD
COMDTY CY7C1021-VC
98115
9819 619804711
64K x16
CMOS
MN
SOJ
CSPI-R
44
300
50
0
CY7C1049-VC
98248
9805 619800740
512K x 8
CMOS
MN
SOJ
KOREA-L
36
300
47
0
Page 35 of 36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1998
Issued: 12/03/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R42HD TC2
150C/-65C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1049-VCB
CY7C109-VC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
98086
9813 619803319
512K x 8
CMOS
MN
SOJ
KOREA-L
36
300
48
0
98248
9807 619801747
512K x 8
CMOS
MN
SOJ
KOREA-L
36
300
48
0
9812 619802812L 512K x 8
98064
98085
CMOS
MN
SOJ
KOREA-L
36
300
47
0
9745 519712560
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
46
0
9746 519712898
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
46
0
9751 519714390
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
46
0
9811 519802689/ 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 36 of 36