STMICROELECTRONICS W34NB20

STW34NB20
N-CHANNEL 200V - 0.062 Ω - 34A TO-247
PowerMESH™ MOSFET
Figure 1. Package
Table 1. General Features
Type
VDSS
RDS(on)
ID
STW34NB20
200 V
< 0.075 Ω
34 A
FEATURES SUMMARY
■ TYPICAL RDS(on) = 0.062 Ω
■
EXTREMELY HIGH dv/dt CAPABILITY
■
100% AVALANCHE TESTED
■
VERY LOW INTRINSIC CAPACITANCES
■
GATE CHARGE MINIMIZED
3
2
1
TO-247
DESCRIPTION
Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding performances. The new patent pending strip
layout coupled with the Company’s proprietary
edge termination structure, gives the lowest
RDS(on) per area, exceptional avalanche and dv/dt
capabilities and unrivalled gate charge and switching characteristics.
Figure 2. Internal Schematic Diagram
APPLICATIONS
■ SWITCH MODE POWER SUPPLIES (SMPS)
■
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SUPPLIES AND MOTOR DRIVE
■
HIGH CURRENT, HIGH SPEED SWITCHING
Table 2. Order Codes
Part Number
Marking
Package
Packaging
STW34NB20
W34NB20
TO-247
TUBE
REV. 2
April 2004
1/10
STW34NB20
Table 3. Absolute Maximum Ratings
Symbol
VDS
VDGR
VGS
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
200
V
Drain- gate Voltage (RGS = 20 kΩ)
200
V
Gate-source Voltage
± 30
V
ID
Drain Current (cont.) at TC = 25 °C
34
A
ID
Drain Current (cont.) at TC = 100 °C
21
A
Drain Current (pulsed)
136
A
Total Dissipation at TC = 25 °C
180
W
Derating Factor
1.44
W°/C
-65 to 150
°C
150
°C
Value
Unit
IDM
(1)
Ptot
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
Note: 1. Pulse width limited by safe operating area
Table 4. Thermal Data
Symbol
Parameter
Rthj-case
Thermal Resistance Junction-case
Max
0.69
°C/W
Rthj-amb
Thermal Resistance Junction-ambient
Max
30
°C/W
300
°C
Max Value
Unit
Tl
Maximum Lead Temperature For Soldering Purpose
Table 5. Avalanche Characteristics
Symbol
2/10
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max, δ < 1%)
34
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C; ID = IAR; VDD = 50 V)
650
mJ
STW34NB20
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise specified)
Table 6. Off
Symbol
Parameter
V(BR)DSS
Drain-source
Breakdown Voltage
ID = 250 µA VGS = 0
IDSS
Zero Gate Voltage
VDS = Max Rating
1
µA
Drain Current (VGS = 0)
VDS = Max Rating Tc = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ± 30 V
± 100
nA
IGSS
Test Conditions
Min.
Typ.
Max.
200
Unit
V
Table 7. On (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS; ID = 250 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V; ID = 17 A
Min.
Typ.
Max.
Unit
3
4
5
V
0.062
0.075
Ω
Min.
Typ.
Max.
Unit
8
17
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Table 8. Dynamic
Symbol
Parameter
Test Conditions
gfs (1)
Forward
Transconductance
VDS > ID(on) x RDS(on)max; ID = 17 A
Ciss
Input Capacitance
VDS = 25 V; f = 1 MHz; VGS = 0
Coss
Crss
S
2400
3300
pF
Output Capacitance
650
900
pF
Reverse Transfer
Capacitance
90
130
pF
Typ.
Max.
Unit
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Table 9. Switching On
Symbol
Parameter
Test Conditions
Min.
Turn-on Time
VDD = 100 V; ID = 17 A; RG = 4.7 Ω
30
40
ns
Rise Time
VGS = 10 V (see test circuit, Figure 16)
40
55
ns
Qg
Total Gate Charge
VDD = 160 V; ID = 34 A; VGS = 10 V
60
80
nC
Qgs
Gate-Source Charge
19
nC
Qgd
Gate-Drain Charge
29
nC
td(on)
tr
Table 10. Switching Off
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Off-voltage Rise Time
VDD = 160 V; ID = 34 A; RG = 4.7 Ω
17
23
ns
tf
Fall Time
VGS = 10 V (see test circuit, Figure 18)
18
24
ns
tc
Cross-over Time
35
47
ns
tr(Voff)
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STW34NB20
Table 11. Source Drain Diode
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain Current
34
A
ISDM (1)
Source-drain Current
(pulsed)
136
A
VSD (2)
Forward On Voltage
ISD = 34 A; VGS = 0
1.5
V
trr
Reverse Recovery Time
ISD = 34 A; di/dt = 100 A/µs
290
ns
Qrr
Reverse RecoveryCharge
VDD = 50 V; Tj = 150 °C
(see test circuit, Figure 18)
2.7
µC
IRRAM
Reverse RecoveryCharge
18.5
A
Note: 1. Pulse width limited by safe operating area
2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Figure 3. Safe Operating Area
Figure 4. Thermal Impedance
Figure 5. Output Characteristics
Figure 6. Transfer Characteristics
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STW34NB20
Figure 7. Transconductance
Figure 8. Static Drain-source On Resistance
Figure 9. Gate Charge vs Gate-source Voltage
Figure 10. Capacitance Variations
Figure 11. Normalized Gate Thresold Voltage
vs Temperature
Figure 12. Normalized On Resistance vs
Temperature
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STW34NB20
Figure 13. Source-drain Diode Forward
Characteristics
6/10
STW34NB20
Figure 14. Unclamped Inductive Load Test
Circuit
Figure 15. Unclamped Inductive Waveforms
Figure 16. Switching Times Test Circuits For
Resistive Load
Figure 17. Gate Charge Test Circuit
Figure 18. Test Circuit For Inductive Load
Switching And Diode Recovery Times
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STW34NB20
PACKAGE MECHANICAL
Table 12. TO-247 Mechanical Data
Symbol
millimeters
Min
Max
Min
A
4.85
5.15
0.19
0.20
A1
2.20
2.60
0.086
0.102
b
1.0
1.40
0.039
0.055
b1
2.0
2.40
0.079
0.094
b2
3.0
3.40
0.118
0.134
c
0.40
0.80
0.015
0.03
D
19.85
20.15
0.781
0.793
E
15.45
15.75
0.608
e
Typ
5.45
Typ
Max
0.620
0.214
L
14.20
14.80
0.560
0.582
L1
3.70
4.30
0.14
0.17
L2
18.50
0.728
ØP
3.55
3.65
0.140
0.143
ØR
4.50
5.50
0.177
0.216
S
5.50
Figure 19. TO-247 Package Dimensions
Note: Drawing is not to scale.
8/10
inches
0.216
STW34NB20
REVISION HISTORY
Table 13. Revision History
Date
Revision
Description of Changes
January-1998
1
First Issue
14-Apr-2004
2
Stylesheet update. No content change.
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STW34NB20
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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All other names are the property of their respective owners
© 2004 STMicroelectronics - All rights reserved
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