ETC IBM0116160BJ3-50

Discontinued (9/98 - last order; 3/99 last ship)
IBM01161601M x 1612/8, 5.0VMMDD35DSU-011010627. IBM0116160P1M x 1612/8, 3.3V, LP, SRMMDD35DSU-011010627. IBM0116160M 1M x 1612/8, 5.0V, LP, SRMMDD35DSU-011010627. IBM011616B1M x 1612/8, 3.3VMMDD35DSU-011010627.
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Features
• 1,048,576 word by 16 bit organization
• Single 3.3V ± 0.3V or 5.0V ± 0.5V power supply
• Standard Power (SP) and Low Power (LP)
• 4096 Refresh Cycles
- 64 ms Refresh Rate (SP version)
- 256 ms Refresh Rate (LP version)
• High Performance:
• Low Power Dissipation
- Active (max) - 50 mA / 45 mA
- Standby: TTL Inputs (max) - 2.0 mA
- Standby: CMOS Inputs (max)
- 1.0 mA (SP version)
- 0.1 mA (LP version)
- Self Refresh (LP version only)
- 200µA (3.3 Volt)
- 300µA (5.0 Volt)
• 2 CAS
-50
-60
Units
tRAC RAS Access Time
50
60
ns
tCAC CAS Access Time
13
15
ns
tAA Column Address Access Time
25
30
ns
tRC Cycle Time
95
110
ns
tPC Fast Page Mode Cycle Time
35
40
ns
• Fast Page Mode
• Read-Modify-Write
• RAS Only and CAS before RAS Refresh
• Hidden Refresh
• Package: TSOP-II 50/44 (400mil x 825mil)
SOJ 42/42 (400mil)
Description
The IBM0116160 is a dynamic RAM organized
1,048,576 words by 16 bits, which has a very low
“sleep mode” power consumption option. These
devices are fabricated in IBM’s advanced 0.5µm
CMOS silicon gate process technology. The circuit
and process have been carefully designed to pro-
vide high performance, low power dissipation, and
high reliability. The devices operate with a single
3.3V ± 0.3V or 5.0V ± 0.5V power supply. The 20
addresses required to access any bit of data are
multiplexed (12 are strobed with RAS, 8 are strobed
with CAS).
Pin Assignments (Top View)
Pin Description
50/44 TSOP
RAS
42/42 SOJ
VCC
IO0
IO1
IO2
IO3
VCC
IO4
IO5
IO6
IO7
NC
1
2
3
4
5
6
7
8
9
10
11
50
49
48
47
46
45
44
43
42
41
40
VSS
IO15
IO14
IO13
IO12
VSS
IO11
IO10
IO9
IO8
NC
NC
NC
WE
RAS
A11
A10
A0
A1
A2
A3
VCC
15
16
17
18
19
20
21
22
23
24
25
36
35
34
33
32
31
30
29
28
27
26
NC
LCAS
UCAS
OE
A9
A8
A7
A6
A5
A4
VSS
VCC
IO0
IO1
IO2
IO3
VCC
IO4
IO5
IO6
IO7
NC
NC
WE
RAS
A11
A10
A0
A1
A2
A3
VCC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
43G9618
SA14-4207-06
Revised 4/97
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
VSS
IO15
IO14
IO13
IO12
VSS
IO11
IO10
IO9
IO8
NC
LCAS
UCAS
OE
A9
A8
A7
A6
A5
A4
VSS
LCAS / UCAS
WE
Row Address Strobe
L/U Column Address Strobe
Read/Write Input
A0 - A11
Address Inputs
OE
Output Enable
I/O0 - I/O15
Data Input/Output
VCC
Power (+3.3V or +5.0V)
VSS
Ground
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 1 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Ordering Information
Part Number
SP / LP
Self Refresh Power Supply
Speed
Package
Notes
IBM0116160T3 -50
SP
No
5.0V
50ns
400mil TSOP-II 50/44
1
IBM0116160T3 -60
SP
No
5.0V
60ns
400mil TSOP-II 50/44
1
IBM0116160BT3 -50
SP
No
3.3V
50ns
400mil TSOP-II 50/44
1
IBM0116160BT3 -60
SP
No
3.3V
60ns
400mil TSOP-II 50/44
1
IBM0116160J3 -50
SP
No
5.0V
50ns
400mil SOJ 42/42
1
IBM0116160J3 -60
SP
No
5.0V
60ns
400mil SOJ 42/42
1
IBM0116160BJ3 -50
SP
No
3.3V
50ns
400mil SOJ 42/42
1
IBM0116160BJ3 -60
SP
No
3.3V
60ns
400mil SOJ 42/42
1
IBM0116160MT3 -50
LP
Yes
5.0V
50ns
400mil TSOP-II 50/44
1
IBM0116160MT3 -60
LP
Yes
5.0V
60ns
400mil TSOP-II 50/44
1
IBM0116160PT3 -50
LP
Yes
3.3V
50ns
400mil TSOP-II 50/44
1
IBM0116160PT3 -60
LP
Yes
3.3V
60ns
400mil TSOP-II 50/44
1
IBM0116160MJ3 -50
LP
Yes
5.0V
50ns
400mil SOJ 42/42
1
IBM0116160MJ3 -60
LP
Yes
5.0V
60ns
400mil SOJ 42/42
1
IBM0116160PJ3 -50
LP
Yes
3.3V
50ns
400mil SOJ 42/42
1
IBM0116160PJ3 -60
LP
Yes
3.3V
60ns
400mil SOJ 42/42
1
1. SP = Standard Power version (IBM0116160 and IBM0116160B); LP = Low Power version (IBM0116160M and IBM00116160P)
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 2 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Block Diagram
Vss
Vcc
I/O0
I/O15
16
16
Data In Buffer
Data Out Buffer
(5.0 Volt version)
(to OCDs)
Regulator
VDD (internal)
OE
WE
&
16
UCAS
16
CAS Clock
OR
Generator
LCAS
8
A0
Column Address
Column Decoder and I/O Gate
Buffer (8)
16
8
A1
Sense Amplifiers
A2
A3
Refresh
A4
Controller
256 x 16
A5
A6
Refresh Counter
A7
A8
A9
12
Row Address
A10
Buffer (12)
A11
12
Row Decoder
(12)
Memory Array
4096
4096 x 256 x 16
12
RAS
RAS Clock
Generator
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 3 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Truth Table
Function
Row
Column
Address Address
RAS
LCAS
UCAS
WE
OE
Standby
H
H→X
H→X
X
X
X
X
High Impedance
Read: Word
L
L
L
H
L
Row
Col
Data Out
Read: Lower Byte
L
L
H
H
L
Row
Col
Lower Byte: Data Out
Upper Byte: High-Z
Read: Upper Byte
L
H
L
H
L
Row
Col
Lower Byte: High-Z
Upper Byte: Data Out
Write: Word
Early-Write
L
L
L
L
X
Row
Col
Data In
Write: Lower Byte
Early-Write
L
L
H
L
X
Row
Col
Lower Byte: Data In
Upper Byte: High-Z
Write: Upper Byte
Early-Write
L
H
L
L
X
Row
Col
Lower Byte: High-Z
Upper Byte: Data In
Read-Modify-Write
L
L
L
H→L
L→H
Row
Col
Data Out, Data In
1st Cycle
L
H→L
H→L
H
L
Row
Col
Data Out
2nd Cycle
L
H→L
H→L
H
L
N/A
Col
Data Out
1st Cycle
L
H→L
H→L
L
X
Row
Col
Data In
2nd Cycle
L
H→L
H→L
L
X
N/A
Col
Data In
1st Cycle
L
H→L
H→L
H→L
L→H
Row
Col
Data Out, Data In
2nd Cycle
L
H→L
H→L
H→L
L→H
N/A
Col
Data Out, Data In
L
H
H
X
X
Row
N/A
High Impedance
H→L
L
L
H
X
X
N/A
High Impedance
Read
L→H→L
L
L
H
L
Row
Col
Data Out
Write
L→H→L
L
L
L→H
X
Row
Col
Data In
H→L
L
L
H
X
X
X
High Impedance
Fast Page Mode
Read
Fast Page Mode
Write
Fast Page Mode
Read-Modify-Write
RAS-Only Refresh
CAS-Before-RAS Refresh
I/O0 - I/O15
Hidden Refresh
Self Refresh (LP version only)
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 4 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Absolute Maximum Ratings
Rating
Symbol
Parameter
Units
Notes
-1.0 to +7.0
V
1
3.3 Volt Device
5.0 Volt Device
-0.5 to +4.6
VCC
Power Supply Voltage
VIN
Input Voltage
-0.5 to min (VCC+0.5, 4.6)
-0.5 to min (VCC+0.5, 7.0)
V
1
VOUT
Output Voltage
-0.5 to min (VCC+0.5, 4.6)
-0.5 to min (VCC+0.5, 7.0)
V
1
TOPR
Operating Temperature
0 to +70
0 to +70
°C
1
TSTG
Storage Temperature
-55 to +150
-55 to +150
°C
1
PD
Power Dissipation
1.0
1.0
W
1
IOUT
Short Circuit Output Current
50
50
mA
1
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Recommended DC Operating Conditions (TA= 0 to 70˚C)
3.3 Volt Device
Symbol
5.0 Volt Device
Parameter
Min.
Typ.
Max.
Min.
Typ.
Max.
Units
Notes
VCC
Supply Voltage
3.0
3.3
3.6
4.5
5.0
5.5
V
1
VIH
Input High Voltage
2.0
—
VCC + 0.5
2.4
—
VCC + 0.5
V
1, 2
VIL
Input Low Voltage
-0.5
—
0.8
-0.5
—
0.8
V
1, 2
1. All voltages referenced to VSS.
2. VIH may overshoot to VCC + 1.2V for pulse widths of ≤ 4.0ns with 3.3 Volt, or VCC + 2.0V for pulse widths of ≤ 4.0ns (or VCC + 1.0V
for ≤ 8.0ns) with 5.0 Volt. Additionally, VIL may undershoot to -2.0V for pulse widths ≤ 4.0ns with 3.3 Volt, or to -2.0V for pulse
widths ≤ 4.0ns (or -1.0V for ≤ 8.0ns) with 5.0 Volt. Pulse widths measured at 50% points with amplitude measured peak to DC reference.
Capacitance (TA= 25°C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)
Symbol
Parameter
Min.
Max.
Units
Notes
CI1
Input Capacitance (A0 - A11)
—
5
pF
1
CI2
Input Capacitance (RAS, LCAS, UCAS, WE, OE)
—
7
pF
1
CO
Output Capacitance (I/O0 - I/O15)
—
7
pF
1
1. Input capacitance measurements made with rise time shift method with CAS = VIH to disable output.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 5 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
DC Electrical Characteristics (TA= 0 to +70˚C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)
Symbol
Parameter
Min.
Max.
-50
—
50
-60
—
45
—
1
Units
Notes
mA
1, 2, 3
ICC1
Operating Current
Average Power Supply Operating Current
(RAS, CAS, Address Cycling: tRC = tRC min.)
ICC2
Standby Current (TTL)
Power Supply Standby Current
(RAS = CAS = VIH)
RAS Only Refresh Current
Average Power Supply Current, RAS Only Mode
(RAS Cycling, CAS = VIH: tRC = tRC min)
-50
—
50
ICC3
-60
—
45
Fast Page Mode Current
Average Power Supply Current
(RAS = VIL, CAS, Address Cycling: tPC = tPC min)
-50
—
25
ICC4
-60
—
25
Standby Current (CMOS)
Power Supply Standby Current
(RAS = CAS = VCC - 0.2V)
SP version
—
1
ICC5
LP version
—
0.1
CAS Before RAS Refresh Current
Average Power Supply Current, CAS Before RAS Mode
(RAS, CAS, Cycling: tRC = tRC min)
-50
—
50
ICC6
-60
—
45
3.3V
—
200
ICC7
Self Refresh Current, LP version only
Average Power Supply Current during Self Refresh
CBR cycle with RAS ≥ tRASS (min); CAS held low;
WE = VCC - 0.2V; Addresses and DIN = VCC - 0.2V or 0.2V.
5.0V
—
300
II(L)
Input Leakage Current
Input Leakage Current, any input
(0.0 ≤ VIN ≤ (VCC + 0.3V)), All Other Pins Not Under Test = 0V
-5
+5
µA
IO(L)
Output Leakage Current
(DOUT is disabled, 0.0 ≤ VOUT ≤ VCC)
-5
+5
µA
VOH
Output Level (TTL)
Output “H” Level Voltage
(IOUT = -2.0mA for 3.3V, or IOUT = -5mA for 5.0V)
2.4
VCC
V
VOL
Output Level (TTL)
Output “L” Level Voltage
(IOUT = +2.0mA for 3.3V, or IOUT = +4.2mA for 5.0V)
0.0
0.4
V
mA
mA
mA
1, 3
1, 2, 3
mA
mA
1, 3
µA
1. ICC1, ICC3, ICC4 and ICC6 depend on cycle rate.
2. ICC1 and ICC4 depend on output loading. Specified values are obtained with the output open.
3. Address can be changed once or less while RAS =VIL. In the case of ICC4, it can be changed once or less when CAS =VIH.
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 6 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
AC Characteristics (TA= 0 to +70˚C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)
1. An initial pause of 200µs is required after power-up followed by 8 RAS only refresh cycles before proper device operation is
achieved. In case of using the internal refresh counter, a minimum of 8 CAS before RAS refresh cycles instead of 8 RAS only
refresh cycles is required.
2. AC measurements assume tT=5ns.
3. VIH(min.) and VIL(max.) are reference levels for measuring timing of input signals. Also, transition times are measured between VIH
and VIL.
4. Valid column addresses are A0 through A7.
5. When both LCAS and UCAS go low at the same time, all 16 bits of data are read/written into the device. LCAS and UCAS cannot be
staggered within the same read/write cycle.
Read, Write, Read-Modify-Write and Refresh Cycles (Common Parameters)
-50
Symbol
-60
Parameter
Units
Min.
Max.
Min.
Max.
Notes
tRC
Random Read or Write Cycle Time
95
—
110
—
ns
tRP
RAS Precharge Time
30
—
40
—
ns
tCP
CAS Precharge Time
10
—
10
—
ns
tRAS
RAS Pulse Width
50
10K
60
10K
ns
tCAS
CAS Pulse Width
13
10K
15
10K
ns
tASR
Row Address Setup Time
0
—
0
—
ns
tRAH
Row Address Hold Time
10
—
10
—
ns
tASC
Column Address Setup Time
0
—
0
—
ns
tCAH
Column Address Hold Time
10
—
10
—
ns
tRCD
RAS to CAS Delay Time
20
37
20
45
ns
1
tRAD
RAS to Column Address Delay Time
15
25
15
30
ns
2
tRSH
RAS Hold Time
13
—
15
—
ns
tCSH
CAS Hold Time
50
—
60
—
ns
tCRP
CAS to RAS Precharge Time
5
—
5
—
ns
tDZO
OE Delay Time from DIN
0
—
0
—
ns
3
tDZC
CAS Delay Time from DIN
0
—
0
—
ns
3
Transition Time (Rise and Fall)
3
50
3
50
ns
4
tT
1. Operation within the tRCD(max.) limit ensures that tRAC(max.) can be met. tRCD(max.) is specified as a reference point only. If tRCD
is greater than the specified tRCD(max.) limit, then access time is controlled by tCAC.
2. Operation within the tRAD(max.) limit ensures that tRAC(max.) can be met. tRAD(max.) is specified as a reference point only. If tRAD is
greater than the specified tRAD(max.) limit, then access time is controlled by tAA.
3. Either tDZC or tDZO must be satisfied.
4. AC measurements assume tT=5ns.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 7 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Write Cycle
-50
Symbol
-60
Parameter
Min.
Max.
Min.
Max.
Units
Notes
1
tWCS
Write Command Set Up Time
0
—
0
—
ns
tWCH
Write Command Hold Time
10
—
15
—
ns
tWP
Write Command Pulse Width
10
—
15
—
ns
tRWL
Write Command to RAS Lead Time
13
—
15
—
ns
tCWL
Write Command to CAS Lead Time
13
—
15
—
ns
tOED
OE to DIN Delay Time
13
—
15
—
ns
2
tDS
DIN Setup Time
0
—
0
—
ns
3
tDH
DIN Hold Time
10
—
12
—
ns
3
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only. If tWCS ≥ tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)
through the entire cycle. If tRWD ≥ tRWD (min), tCWD ≥ tCWD (min), tAWD ≥ tAWD (min), and tCPW ≥ tCPW (min)(Fast Page Mode), the
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of conditions are satisfied, the condition of the data out (at access time) is indeterminate.
2. Either tCDD or tOED must be satisfied.
3. These parameters are referenced to LCAS or UCAS leading edge in early write cycles and to WE leading edge in Read-ModifyWrite cycles.
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 8 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Read Cycle
-50
Symbol
-60
Parameter
Min.
Max.
Min.
Max.
Units
Notes
tRAC
Access Time from RAS
—
50
—
60
ns
1, 2, 3
tCAC
Access Time from CAS
—
13
—
15
ns
1, 3
tAA
Access Time from Address
—
25
—
30
ns
2, 3
tOEA
Access Time from OE
—
13
—
15
ns
3
tRCS
Read Command Setup Time
0
—
0
—
ns
tRCH
Read Command Hold Time to CAS
0
—
0
—
ns
4
tRRH
Read Command Hold Time to RAS
0
—
0
—
ns
4
tRAL
Column Address to RAS Lead Time
25
—
30
—
ns
tCAL
Column Address to CAS Lead Time
25
—
30
—
ns
tCLZ
CAS to Output in Low-Z
0
—
0
—
ns
tOH
Output Data Hold Time
3
—
3
—
ns
tOHO
Output Data Hold from OE
3
—
3
—
ns
tOFF
Output Buffer Turn-Off Delay
—
13
—
15
ns
5
tOEZ
Output Buffer Turn-Off Delay from OE
—
13
—
15
ns
5
tCDD
CAS to DIN Delay Time
13
—
15
—
ns
6
3
1. Operation within the tRCD(max.) limit ensures that tRAC(max.) can be met. tRCD(max.) is specified as a reference point only. If tRCD
is greater than the specified tRCD(max.) limit, then access time is controlled by tCAC.
2. Operation within the tRAD(max.) limit ensures that tRAC(max.) can be met. tRAD(max.) is specified as a reference point only. If tRAD is
greater than the specified tRAD(max.) limit, then access time is controlled by tAA.
3. Measured with the specified current load and 100pF.
4. Either tRCH or tRRH must be satisfied for a read cycle.
5. tOFF (max) and tOEZ (max) define the time at which the output achieves the open circuit condition and are not referenced to output
voltage levels.
6. Either tCDD or tOED must be satisfied.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 9 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Read-Modify-Write Cycle
-50
Symbol
-60
Parameter
Units
Min.
Max.
Min.
Max.
Notes
tRWC
Read-Modify-Write Cycle Time
128
—
150
—
ns
tRWD
RAS to WE Delay Time
68
—
80
—
ns
1
tCWD
CAS to WE Delay Time
31
—
35
—
ns
1
tAWD
Column Address to WE Delay Time
43
—
50
—
ns
1
tOEH
OE Command Hold Time
13
—
15
—
ns
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only. If tWCS ≥ tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)
through the entire cycle. If tRWD ≥ tRWD (min), tCWD ≥ tCWD (min), tAWD ≥ tAWD (min), and tCPW ≥ tCPW (min)(Fast Page Mode), the
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of conditions are satisfied, the condition of the data out (at access time) is indeterminate.
Fast Page Mode Cycle
-50
Symbol
-60
Parameter
Units
Min.
Max.
Min.
Max.
Fast Page Mode Cycle Time
35
—
40
—
ns
tRASP
Fast Page Mode RAS Pulse Width
50
200K
60
200K
ns
tCPA
Access Time from CAS Precharge
—
28
—
35
ns
tCPRH
RAS Hold Time from CAS Precharge
30
—
35
—
ns
tPC
Notes
1
1. Measured with the specified current load and 100pF.
Fast Page Mode Read-Modify-Write Cycle
-50
Symbol
-60
Parameter
Units
Min.
Max.
Min.
Max.
tPRWC
Fast Page Mode Read-Modify-Write
Cycle Time
71
—
80
—
ns
tCPW
WE Delay Time from CAS Precharge
48
—
55
—
ns
Notes
1
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only. If tWCS ≥ tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)
through the entire cycle. If tRWD ≥ tRWD (min), tCWD ≥ tCWD (min), tAWD ≥ tAWD (min), and tCPW ≥ tCPW (min)(Fast Page Mode), the
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of conditions are satisfied, the condition of the data out (at access time) is indeterminate.
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 10 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Refresh Cycle
-50
Symbol
-60
Parameter
Units
Min.
Max.
Min.
Max.
tCSR
CAS Setup Time
(CAS before RAS Refresh Cycle)
5
—
5
—
ns
tCHR
CAS Hold Time
(CAS before RAS Refresh Cycle)
10
—
10
—
ns
tWRP
WE Setup Time
(CAS before RAS Refresh Cycle)
10
—
10
—
ns
tWRH
WE Hold Time
(CAS before RAS Cycle)
10
—
10
—
ns
tRPC
RAS Precharge to CAS Hold Time
5
—
5
—
ns
Notes
Self Refresh Cycle - Low Power Version Only
-50
Symbol
-60
Parameter
Min.
Max.
Min.
Max.
Units
Notes
tRASS
RAS Pulse Width
During Self Refresh Cycle
100
—
100
—
µs
1
tRPS
RAS Precharge Time
During Self Refresh Cycle
89
—
104
—
ns
1
tCHS
CAS Hold Time From RAS Rising
During Self Refresh Cycle
-50
—
-50
—
ns
1, 2
tCHD
CAS Hold Time From RAS Falling
During Self Refresh Cycle
350
—
350
—
µs
1, 2
1. When using Self Refresh mode, the following refresh operations must be performed to ensure proper DRAM operation:
If row addresses are being refreshed in an EVENLY DISTRIBUTED manner over the refresh interval using CBR refresh cycles,
then only one CBR cycle must be performed immediately after exit from Self Refresh.
If row addresses are being refreshed in any other manner (ROR- Distributed/Burst; or CBR-Burst) over the refresh interval, then a
full set of row refreshes must be performed immediately before entry to and immediately after exit from Self Refresh.
2. If tRASS > tCHD (min) then tCHD applies. If tRASS ≤ tCHD (min) then tCHS applies.
Refresh
-50
Symbol
Min.
tREF
-60
Parameter
Max.
Min.
Units
Notes
ms
1
Max.
SP version
—
64
—
64
LP version
—
256
—
256
Refresh Period
1. 4096 cycles.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 11 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Read Cycle
tRC
tRP
tRAS
VIH
RAS
VIL
tCSH
tRCD
tCRP
tRSH
UCAS VIH
LCAS
VIL
tCAS
tRAD
tRAL
tCAL
tASR
tASC
tRAH
tCAH
VIH
Address
Row
Column
VIL
tRCH
tRCS
tRRH
VIH
WE
VIL
tAA
VIH
tOEA
OE
VIL
tDZC
tDZO
VIH
DIN
tCDD
tOED
Hi-Z
VIL
tCAC
tCLZ
tOFF
tOEZ
VOH
DOUT
Valid Data Out
Hi-Z
VOL
tRAC
: “H”: or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 12 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Hi-Z
tOH
tOHO
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Write Cycle (Early Write)
tRC
tRAS
tRP
VIH
RAS
VIL
tCSH
tRCD
tRSH
V
UCAS IH
LCAS V
IL
tCRP
tCAS
tRAD
tASR
tASC
tRAH
tCAH
VIH
Address
Row
Column
VIL
tWCS
VIH
tWCH
tWP
WE
VIL
VIH
OE
VIL
tDS
tDH
VIH
DIN
Valid Data In
VIL
VOH
DOUT
Hi-Z
VOL
: “H” or “L”
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 13 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Write Cycle (Delayed Write)
tRC
tRAS
tRP
VIH
RAS
VIL
tCSH
tRCD
tCRP
tRSH
V
UCAS IH
LCAS V
IL
tCAS
tRAD
tASR
tASC
tRAH
tCAH
VIH
Address
Row
Column
VIL
tCWL
tRCS
VIH
tWP
WE
VIL
tRWL
VIH
OE
tOEH
VIL
tOED
tDZO
tDS
tDZC
VIH
DIN
tDH
Valid Data In
Hi-Z
VIL
tOEZ
tCLZ
tOEA
VOH
DOUT
VOL
Hi-Z
: “H” or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 14 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Hi-Z *
* tOEH greater than or equal to tCWL
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Read-Modify-Write Cycle
tRWC
tRP
tRAS
VIH
RAS
VIL
tCSH
tRCD
UCAS
LCAS
tRSH
VIH
tCRP
tCAS
tRAD
VIL
tASC
tASR
tRAH
tCAH
VIH
Row
Address
Column
VIL
tCWD
tRWL
tAWD
tCWL
tRWD
tWP
VIH
WE
tAA
VIL
tRCS
tOEH
VIH
OE
tOEA
VIL
tDZC
tDS
tDH
tDZO
VIH
DIN
Hi-Z
VIL
DIN
tCAC
tCLZ
tOED
tOEZ
VOH
DOUT
Hi-Z
Hi-Z
DOUT
VOL
*
tRAC
tOHO
: “H” or “L”
* tOEH greater than or equal to tCWL
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 15 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Fast Page Mode Read Cycle
tRASP
tRP
VIH
tCPRH
RAS
VIL
tPC
tRCD
UCAS
LCAS
tCP
tCP
VIH
tRSH
tCAS
tCAS
tCRP
tCAS
VIL
tCSH
tASR tRAH
tASC
tCAL
tRAL
tASC
tCAH
tCAH
tASC tCAH
VIH
Address
Row
Column 1
Column 2
Column n
VIL
tRAD
tRCS
t RCS
tRCH
tRCS
tRCH
tRCH
VIH
WE
VIL
tRRH
tAA
tAA
tAA
tCPA
tOEA
tCPA
tOEA
VIH
tOEA
OE
VIL
tOHO
tOH
tOHO
tOH
tDZC
tDZC
tDZO
tDZO
tDZC
tDZO
tOED
tOHO
tOH
tCDD
tOED
tOED
VIH
DIN
VIL
tCAC
tCAC
tRAC
tCLZ
VOH
DOUT
DOUT 1
VOL
tOFF
tOEZ
tOEZ
tCLZ
tCAC
tOFF
tOFF
tOEZ
tCLZ
DOUT 2
DOUT N
: “H” or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 16 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Fast Page Mode Write Cycle
tRASP
tRP
VIH
RAS
VIL
tPC
tCP
tRCD
tRSH
tCP
V
UCAS IH
LCAS V
IL
tCRP
tCAS
tCAS
tCSH
tASR tRAH
tASC
tCAH
tCAH
tASC
tASC
tCAH
VIH
Address
Row
Column 1
Column 2
Column n
tCWL
tCWL
VIL
tRAD
tCWL
tRWL
tWCH
tWCS
tWCH
tWCS
VIH
tWCH
tWCS
tWP
tWP
WE
tWP
VIL
VIH
OE
VIL
tDS
tDH
tDS
tDH
tDS
tDH
VIH
DIN
DIN 1
VIL
DIN 2
DIN N
VOH
DOUT
Hi-Z
VOL
: “H” or “L”
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 17 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Fast Page Mode Read-Modify-Write Cycle
tRP
tRASP
VIH
RAS
VIL
tPRWC
tRCD
tCP
VIH
UCAS
LCAS VIL
tCP
tCAS
tCAS
tCSH
tASR
tRAH
tASC
tCAS
tCWL
tCAH
tCWL
tASC
tCRP
tRSH
tCWL
tCAH
tASC
tRWL
tCAH
VIH
Address
VIL
Row
Column 1
Column 2
tRWD
tAWD
tRCS
tCPW
tAWD
tRCS
tCWD
Column n
tRCS
tCWD
tWP
tCPW
tAWD
tCWD
tWP
tWP
VIH
WE
tCAC
VIL
tCAC
tAA
tCAC
tAA
tAA
tRAD
tCPA
tCPA
VIH
OE
tOEH
tOEH
VIL
tOEA
tOEA
tDH
tDS
tDS
tDS
t DZO
tOEA
tDH
tDH
tDZC
tOEH
tOED
tOED
tOED
VIH
DIN
DIN 1
VIL
tCLZ
tOEZ
tOHO
DIN 2
tOEZ
tOHO
tCLZ
tOEZ
tOHO
tCLZ
VOH
DOUT
DIN N
Hi-Z *
VOL
tRAC
DOUT 1
: “H” or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 18 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
DOUT 2
DOUT N
* tOEH greater than or equal to tCWL
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
RAS Only Refresh Cycle
tRC
tRP
tRAS
VIH
RAS
VIL
tRPC
UCAS
LCAS
tCRP
VIH
VIL
tASR
tRAH
VIH
Address
Row
VIL
VOH
Hi-Z
DOUT
VOL
: “H” or “L”
NOTE: WE, OE and DIN are “H” or “L”
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 19 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
CAS Before RAS Refresh Cycle
t RC
tRAS
tRP
VIH
RAS
VIL
t RPC
tRPC
tCSR
tCSR
tCP
UCAS
LCAS
t CHR
VIH
VIL
tWRH
tWRH
tWRP
tWRP
VIH
WE
VIL
VIH
OE
VIL
tOED
tCDD
VOH
DIN
Hi-Z
VOL
tOEZ
tOFF
DOUT
VOH
Hi-Z
VOL
: “H” or “L”
NOTE: Address is “H” or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 20 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Hidden Refresh Cycle (Read)
tRC
tRC
tRP
tRP
tRAS
tRAS
VIH
RAS
VIL
tRCD
tRSH
tCRP
tCHR
V
UCAS IH
LCAS V
IL
tRAL
tRAD
tASR
tWRH
tWRP
tASC
tRAH
tCAH
VIH
Address
Row
Column
VIL
tRRH
tRCS
VIH
WE
VIL
tAA
VIH
tOEA
OE
VIL
tDZC
tDZO
VIH
DIN
tCDD
tOED
Hi-Z
VIL
tCAC
tOFF
tCLZ
tOEZ
VOH
DOUT
Valid Data Out
Hi-Z
VOL
Hi-Z
tRAC
: “H” or “L”
43G9618
SA14-4207-06
Revised 4/97
tOH
tOHO
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 21 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Hidden Refresh Cycle (Write)
tRC
tRC
tRP
tRP
tRAS
tRAS
VIH
RAS
VIL
t RSH
tRCD
tCHR
tCRP
VIH
UCAS
LCAS VIL
tASR
tASC
tRAH
tCAH
VIH
Address
Row
Column
VIL
t WRP
tWCS
VIH
tWRH
tWCH
tWP
WE
VIL
VIH
OE
VIL
t DS
tDH
VIH
DIN
Valid Data
VIL
VOH
DOUT
Hi-Z
VOL
: “H” or “L”
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 22 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Self Refresh Cycle (Sleep Mode) - Low Power version only
tRASS
tRPS
VIH
RAS
VIL
tRPC
tCHS
tCSR
tCP
tCHD
tCRP
UCAS VIH
LCAS V
IL
tWRH
tWRP
VIH
WE
VIL
tOFF
DOUT
VOH
Hi-Z
VOL
: “H” or “L”
NOTES:
1. Address and OE are “H” or “L”
2. Once RAS (min) is provided and RAS remains low, the DRAM
will be in Self Refresh, commonly known as “Sleep Mode.”
3. If tRASS > tCHD (min) then tCHD applies.
If tRASS ≤ tCHD (min) then tCHS applies.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 23 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
PACKAGE DIMENSIONS (400mil; 50/44 lead; Thin Small Outline Package)
20.95 ± 0.10
11.76 ± 0.20
10.16 ± 0.10
Detail A
+0.075
0.125 -0.005
Lead #1
Seating Plane
0.10
0.80 Basic
0.35
+ 0.10
- 0.05
0.875 REF
1.20 Max
Detail A
1.00 ± 0.05
+0.10
0.05 -0.00
0.25 Basic
Gage Plane
0.5 ± 0.1
NOTE: All dimensions are in millimeters; Package diagrams are not drawn to scale.
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 24 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160 IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
PACKAGE DIMENSIONS (400mil; 42/42 lead; Small Outline J-Lead)
27.305 ± 0.127
9.398 Basic
11.176 ± 0.127
10.16 ± 0.127
3.505 ± 0.254
2.083 min
0.76 min
+0.097
0.203 -0.025
Lead #1 I.D.
Lead #1
Seating Plane
0.10
1.27 Basic
+0.088
0.42 -0.039
+0.123
0.69 -0.03
NOTE: All dimensions are in millimeters; Package diagrams are not drawn to scale.
43G9618
SA14-4207-06
Revised 4/97
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 25 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
Discontinued (9/98 - last order; 3/99 last ship)
IBM0116160
IBM0116160M
IBM0116160B IBM0116160P
1M x 16 12/8 DRAM
Revision Log
Revision
11/93
09/06/94
Contents Of Modification
Initial Release
Combine the 3.3 Volt and the 5.0 Volt specifications
1. Iout changed to +2.0 mA and -2.0 mA in DC Electrical Characteristics table.
2. Packaging diagrams modified to clarify lead thickness and standoff height.
3. tRPC min changed from 0 to 5ns.
4. tCHR min changed from 20 to 10ns.
5. Currents in DC Electrical Characteristics table revised.
6. Test Modes and Test Circuit Diagram removed.
7. Rename tODD to tOED.
11/15/95
8. tOED, tCDD, tOEZ, and tOFF min changed from 20 to 15ns, for the 70ns part.
9. tRRH min changed from 5 to 0ns for all speed sorts.
10. tOEH min changed from 20 to 15ns for the 70ns part.
11. tCSR min changed from 10 to 5ns for all speed sorts.
12. tCAHmin changed from 15 to 10ns on 60 and 70ns parts.
13. tOFF max changed from 20 to 15ns for 70ns parts.
14. 400mil 42/42 SOJ package option added
1. The Low Power and Standard Power Specifications were combined. ES# 43G9174 and ES# 43G9618 were
combined into ES# 43G9618.
2. Added Die Rev E part numbers.
3. tDH was reduced from 15ns to 12ns for the -60 speed sort.
12/10/95
4. tCHD was added to the Self Refresh Cycle with a value of 350µs for all speed sorts.
5. The Self Refresh timing was changed to allow CAS to go high tCHD after RAS falls entering a Self Refresh.
6. The CBR timing diagram was changed to allow CAS to remain low for back-to-back CBR cycles.
7. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “L” to ” H”.
1. ICC2 was changed from 2mA to 1mA.
2. II(L) and IO(L) were altered from +/- 10uA to +/- 5uA.
09/01/96
3. tT was initially at a max of 30ns. It has been modified to 50ns for all speed sorts.
4. tCPA was decreased from 30ns to 28ns for the -50 speed sort.
5. tRASP max of 125K was raised to 200K for all speed sorts.
6. tRP was changed from 35ns to 30ns for the -50 speed sort.
1. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “H” to “L→H”.
2. tOED was moved from the Common Parameters table to the Write Cycle Parameters Table.
3. tODD in the CAS before RAS timing diagram was renamed tOED.
4. The -70 speed sort and timings were removed.
03/19/97
5. Icc1, Icc3, Icc6 for the -50 speed sort were reduced from 85mA to 50mA.
6. Icc4 for the -50 speed sort was reduced from 75mA to 25mA.
7. Icc1, Icc3, Icc6 for the -60 speed sort were reduced from 75mA to 45mA.
8. Icc4 for the -60 speed sort was reduced from 65mA to 25mA.
04/23/97
1. Icc5 was changed from 200µA to 100µA for the Low Power Die Rev F Parts.
©IBM Corporation. All rights reserved.
Use is further subject to the provisions at the end of this document.
Page 26 of 27
Powered by ICminer.com Electronic-Library Service CopyRight 2003
43G9618
SA14-4207-06
Revised 4/97
Discontinued (9/98 - last order; 3/99 last ship)

 International Business Machines Corp.1997
Printed in the United States of America
All rights reserved
IBM and the IBM logo are registered trademarks of the IBM Corporation.
This document may contain preliminary information and is subject to change by IBM without notice. IBM assumes no responsibility or
liability for any use of the information contained herein. Nothing in this document shall operate as an express or implied license or
indemnity under the intellectual property rights of IBM or third parties. The products described in this document are not intended for
use in implantation or other direct life support applications where malfunction may result in direct physical harm or injury to persons.
NO WARRANTIES OF ANY KIND, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY
OR FITNESS FOR A PARTICULAR PURPOSE, ARE OFFERED IN THIS DOCUMENT.
For more information contact your IBM Microelectronics sales representative or
visit us on World Wide Web at http://www.chips.ibm.com
IBM Microelectronics manufacturing is ISO 9000 compliant.
SA14-4207-06
Powered by ICminer.com Electronic-Library Service CopyRight 2003