FAIRCHILD NDB508AE

May 1994
NDP508A / NDP508AE / NDP508B / NDP508BE
NDB508A / NDB508AE / NDB508B / NDB508BE
N-Channel Enhancement Mode Field Effect Transistor
General Description
Features
These N-channel enhancement mode power field
effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process has been especially
tailored to minimize on-state resistance, provide
superior switching performance, and withstand high
energy pulses in the avalanche and commutation
modes. These devices are particularly suited for low
voltage applications such as automotive, DC/DC
converters, PWM motor controls, and other battery
powered circuits where fast switching, low in-line
power loss, and resistance to transients are needed.
19 and 17A, 80V. RDS(ON) = 0.08 and 0.10Ω.
Critical DC electrical parameters specified at
elevated temperature.
Rugged internal source-drain diode can eliminate
the need for an external Zener diode transient
suppressor.
175°C maximum junction temperature rating.
High density cell design (3 million/in²) for extremely
low RDS(ON).
TO-220 and TO-263 (D2PAK) package for both
through hole and surface mount applications.
_____________________________________________________________________
D
G
S
Absolute Maximum Ratings
TC = 25°C unless otherwise noted
NDP508A NDP508AE
NDB508A NDB508AE
Symbol Parameter
NDP508B NDP508BE
NDB508B NDB508BE
Units
VDSS
Drain-Source Voltage
80
V
VDGR
Drain-Gate Voltage (RGS < 1 MΩ)
80
V
VGSS
Gate-Source Voltage - Continuous
±20
V
- Nonrepetitive (tP < 50 µs)
±40
V
ID
Drain Current - Continuous
- Pulsed
PD
19
17
A
57
51
A
Total Power Dissipation @ TC = 25°C
75
W
Derate above 25°C
0.5
W/°C
-65 to 175
°C
275
°C
TJ,TSTG
Operating and Storage Temperature Range
TL
Maximum lead temperature for soldering
purposes, 1/8" from case for 5 seconds
© 1997 Fairchild Semiconductor Corporation
NDP508.SAM
Electrical Characteristics (T
Symbol
Parameter
C
= 25°C unless otherwise noted)
Conditions
Type
Min
Typ
Max
Units
55
mJ
19
A
DRAIN-SOURCE AVALANCHE RATINGS (Note 1)
EAS
Single Pulse Drain-Source
Avalanche Energy
VDD = 25 V, ID = 19 A
IAR
Maximum Drain-Source Avalanche Current
NDP508AE
NDP508BE
NDB508AE
NDB508BE
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown
Voltage
VGS = 0 V, ID = 250 µA
ALL
IDSS
Zero Gate Voltage Drain
Current
VDS = 80 V,
VGS = 0 V
ALL
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
IGSSR
Gate - Body Leakage, Reverse
80
V
250
µA
1
mA
ALL
100
nA
VGS = -20 V, VDS = 0 V
ALL
-100
nA
VDS = VGS,
ID = 250 µA
ALL
TJ = 125°C
ON CHARACTERISTICS (Note 2)
VGS(th)
RDS(ON)
Gate Threshold Voltage
Static Drain-Source
On-Resistance
VGS = 10 V,
ID = 9.5 A
VGS = 10 V,
ID = 8.5 A
ID(on)
gFS
On-State Drain Current
Forward Transconductance
TJ = 125°C
2
2.9
4
V
1.4
2.3
3.6
V
0.057
0.08
Ω
0.097
0.16
Ω
0.1
Ω
0.2
Ω
NDP508A
NDP508AE
NDB508A
TJ = 125°C NDB508AE
NDP508B
NDP508BE
NDB508B
TJ = 125°C NDB508BE
VGS = 10 V, VDS = 10 V
NDP508A
NDP508AE
NDB508A
NDB508AE
19
A
NDP508B
NDP508BE
NDB508B
NDB508BE
17
A
VDS = 10 V, ID = 9.5 A
ALL
6
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
ALL
750
900
pF
ALL
200
250
pF
ALL
60
90
pF
9.6
S
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
NDP508.SAM
Electrical Characteristics (T
Symbol
Parameter
C
= 25°C unless otherwise noted)
Conditions
Type
Min
Typ
Max
Units
SWITCHING CHARACTERISTICS (Note 2)
tD(ON)
Turn - On Delay Time
tr
Turn - On Rise Time
tD(OFF)
VDD = 40 V, ID = 19 A,
VGS = 10 V, RGEN = 15 Ω
ALL
8.5
20
nS
ALL
66
110
nS
Turn - Off Delay Time
ALL
31
50
nS
tf
Turn - Off Fall Time
ALL
48
80
nS
Qg
Total Gate Charge
ALL
23.5
34
nC
Qgs
Gate-Source Charge
ALL
4.5
nC
Qgd
Gate-Drain Charge
ALL
11.8
nC
VDS = 64 V,
ID = 19 A, VGS = 10 V
DRAIN-SOURCE DIODE CHARACTERISTICS
IS
ISM
VSD
Maximum Continuos Drain-Source Diode Forward Current
Maximum Pulsed Drain-Source Diode Forward Current
Drain-Source Diode Forward
Voltage
VGS = 0 V,
IS = 9.5 A
trr
Reverse Recovery Time
Irr
Reverse Recovery Current
VGS = 0 V, IS = 19 A,
dIS/dt = 100 A/µs
(Note 2)
NDP508A
NDP508AE
NDB508A
NDB508AE
19
A
NDP508B
NDP508BE
NDB508B
NDB508BE
17
A
NDP508A
NDP508AE
NDB508A
NDB508AE
57
A
NDP508B
NDP508BE
NDB508B
NDB508BE
51
A
ALL
0.87
1.3
V
0.79
1.2
V
ALL
78
110
ns
ALL
5.2
75
A
TJ = 125°C
THERMAL CHARACTERISTICS
RθJC
Thermal Resistance, Junction-to-Case
ALL
2
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
ALL
62.5
°C/W
Notes:
1. NDP508A/508B and NDB508A/508B are not rated for operation in avalanche mode.
2. Pulse Test: Pulse Width < 300 µs, Duty Cycle < 2.0%.
NDP508.SAM
Typical Electrical Characteristics
50
10
40
8.0
R DS(on) , NORMALIZED
I D , DRAIN-SOURCE CURRENT (A)
12
7.0
30
20
6.0
10
5.0
DRAIN-SOURCE ON-RESISTANCE
2
V GS = 20V
0
0
1
2
3
4
V DS , DRAIN-SOURCE VOLTAGE (V)
5
10
12
1.2
20
1
0.8
10
20
30
40
I D , DRAIN CURRENT (A)
50
60
Figure 2. On-Resistance Variation with
Gate Voltage and Drain Current.
2.5
V G S = 10V
R DS(on), NORMALIZED
2
1.5
1
0.5
-50
-25
0
25
50
75
100
125
TJ , JUNCTION TEMPERATURE (°C)
150
DRAIN-SOURCE ON-RESISTANCE
I D = 9.5A
R DS(ON) , NORMALIZED
8.0
1.4
0
2.5
DRAIN-SOURCE ON-RESISTANCE
7.0
1.6
0.6
6
Figure 1. On-Region Characteristics.
V
= 10V
GS
TJ = 125°C
2
1.5
25°C
1
-55°C
0.5
175
0
10
20
30
40
50
ID , DRAIN CURRENT (A)
Figure 3. On-Resistance Variation
with Temperature.
Figure 4. On-Resistance Variation with
Drain Current and Temperature.
1.2
25
TJ = -55°C
V DS = 10V
125
Vth , NORMALIZED
15
10
5
0
2
3
4
V
GS
5
6
7
, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
8
GATE-SOURCE THRESHOLD VOLTAGE (V)
20
I D, DRAIN CURRENT (A)
V GS = 6V
1.8
V DS = V
1.1
GS
I D = 250 µA
1
0.9
0.8
0.7
0.6
-50
-25
0
25
50
75
100
125
T J , JUNCTION TEMPERATURE (°C)
150
175
Figure 6. Gate Threshold Variation
with Temperature.
NDP508.SAM
Typical Electrical Characteristics (continued)
50
30
I D = 250µA
I S , REVERSE DRAIN CURRENT (A)
BV DSS , NORMALIZED
DRAIN-SOURCE BREAKDOWN VOLTAGE (V)
1.15
1.1
1.05
1
0.95
0.9
-50
-25
0
TJ
25
50
75
100
125
, JUNCTION TEMPERATURE (°C)
150
25°C
-55°C
1
0.1
0.4
0.6
0.8
1
1.2
VSD , BODY DIODE FORWARD VOLTAGE (V)
20
V GS , GATE-SOURCE VOLTAGE (V)
C iss
1000
500
C oss
200
100
f = 1 MHz
VGS = 0V
C rss
V DS = 12V
I D = 19A
24
64
15
10
5
0
1
2
3
5
10
20
VDS , DRAIN TO SOURCE VOLTAGE (V)
50
Figure 9. Capacitance Characteristics.
0
10
t on
t d(on)
V OUT
R GEN
tf
90%
Output, Vout
10%
10%
90%
DUT
G
Input, Vin
S
Figure 11. Switching Test Circuit.
40
t d(off)
90%
D
30
t off
tr
RL
V IN
20
Q g , GATE CHARGE (nC)
Figure 10. Gate Charge Characteristics.
VDD
VGS
1.4
Figure 8. Body Diode Forward Voltage
Variation with Current and
Temperature.
1600
CAPACITANCE (pF)
TJ = 125°C
5
0.01
0.2
175
Figure 7. Breakdown Voltage
Variation with Temperature.
40
VGS = 0V
10
Inverted
50%
50%
10%
Pulse Width
Figure 12. Switching Waveforms.
NDP508.SAM
Typical Electrical Characteristics (continued)
T J = -55°C
VGS = 10V
12
L
tp
t p is adjusted to reach
the desired peak inductive
current, I L .
tp
125°C
9
+
VDD
25°C
6
3
BV DSS
IL
VDS = 10V
VDD
g
FS
, TRANSCONDUCTANCE (SIEMENS)
15
0
0
4
8
12
ID , DRAIN CURRENT (A)
16
20
Figure 13. Transconductance Variation
with Drain Current and Temperature.
Figure 14. Unclamped Inductive Load
Circuit and Waveforms.
100
50
D
I , DRAIN CURRENT (A)
RD
O
S(
N)
Lim
it
10
10
20
1m
10
10
5
s
s
ms
DC
VGS = 20V
2
0µ
µs
SINGLE PULSE
T C = 25°C
1
0.5
1
2
3
5
10
20
30
V GS , DRAIN-SOURCE VOLTAGE (V))
50
100
Figure 15. Maximum Safe Operating Area.
TRANSIENT THERMAL RESISTANCE
r(t), NORMALIZED EFFECTIVE
1
D = 0.5
0.5
0.3
R θJC (t) = r(t) * RθJC
R
= 2.0 °C/W
θJC
0.2
0.2
0.1
0.1
P(pk)
0.05
0.05
0.03
0.02
t1
t2
0.01
TJ - T C = P * RθJC (t)
Duty Cycle, D = t 1 /t2
Single Pulse
0.02
0.01
0.01
0.1
1
10
100
1000
t1 ,TIME (m s)
Figure 16. Transient Thermal Response Curve.
NDP508.SAM