PD - 9.1613A IRF7413A PRELIMINARY HEXFET® Power MOSFET Generation V Technology l Ultra Low On-Resistance l N-Channel Mosfet l Surface Mount l Available in Tape & Reel l Dynamic dv/dt Rating l Fast Switching Description l A A D S 1 8 S 2 7 D S 3 6 D G 4 5 D VDSS = 30V RDS(on) = 0.0135Ω T op V iew Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The SO-8 has been modified through a customized leadframe for enhanced thermal characteristics and multiple-die capability making it ideal in a variety of power applications. With these improvements, multiple devices can be used in an application with dramatically reduced board space. The package is designed for vapor phase, infra red, or wave soldering techniques. Power dissipation of greater than 0.8W is possible in a typical PCB mount application. S O -8 Absolute Maximum Ratings Parameter ID @ TA = 25°C ID @ TA = 70°C IDM PD @TA = 25°C VGS EAS dv/dt TJ,TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Peak Diode Recovery dv/dt Junction and Storage Temperature Range Max. Units 12 8.4 58 2.5 0.02 ± 20 260 5.0 -55 to + 150 A W mW/°C V mJ V/ns °C Thermal Resistance Ratings Parameter RθJA Maximum Junction-to-Ambient Typ. Max. Units ––– 50 °C/W 8/25/97 IRF7413A Electrical Characteristics @ TJ = 25°C (unless otherwise specified) ∆V(BR)DSS/∆TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current V(BR)DSS IGSS Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. 30 ––– ––– ––– 1.0 10 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. Max. Units Conditions ––– ––– V VGS = 0V, ID = 250µA 0.034 ––– V/°C Reference to 25°C, ID = 1mA ––– 0.0135 VGS = 10V, ID = 6.6A Ω ––– 0.020 VGS = 4.5V, ID = 3.3A ––– ––– V VDS = VGS , ID = 250µA ––– ––– S VDS = 10V, ID = 3.7A ––– 1.0 VDS = 24V, VGS = 0V µA ––– 25 VDS = 24V, VGS = 0V, TJ = 125°C ––– -100 VGS = -20V nA ––– 100 VGS = 20V 52 79 ID = 7.3A 6.1 9.2 nC VDS = 24V 16 23 VGS = 10 V, See Fig. 6 and 9 8.6 ––– VDD = 15V 50 ––– ID = 7.3A ns 52 ––– RG = 6.2Ω 46 ––– RD = 2.0Ω, See Fig. 10 1800 ––– VGS = 0V 680 ––– pF VDS = 25V 240 ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD t rr Q rr Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Min. Typ. Max. Units ––– ––– 3.1 ––– ––– 58 ––– ––– ––– ––– 74 200 1.0 110 300 A V ns nC Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25°C, IS = 6.6A, VGS = 0V TJ = 25°C, IF = 7.3A di/dt = 100A/µs Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25°C, L =9.8mH RG = 25Ω, IAS =7.3A. (See Figure 12) ISD ≤ 7.3A, di/dt ≤ 100A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C Pulse width ≤ 300µs; duty cycle ≤ 2%. Use IRF7413 data and test conditions Surface mounted on FR-4 board, t ≤ 10sec. D G S IRF7413A 100 100 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOT TOM 3. 0V VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 3.0V TOP I D , Dra in-to -S o u rce Cu rre n t (A) I D , Dra in-to -S o u rce Cu rre n t (A ) T OP 10 3 .0 V 20 µs P U LSE W IDTH TJ = 25 °C A 1 0.1 1 3 .0V 10 20 µs P U LSE W IDTH TJ = 15 0°C A 1 0.1 10 1 V D S , D rain-to-S ource V oltage (V ) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 2.0 R D S (o n ) , D ra in -to -S o u rc e O n R e si sta n ce (N o rm a li ze d ) I D , D r ain- to-S ourc e C urre nt (A ) 100 TJ = 1 50 °C TJ = 2 5 ° C 10 VD S = 1 0 V 2 0 µ s PU L SE W ID TH 1 3.0 3.5 4.0 V G S , Ga te-to-S o urce V oltage (V ) Fig 3. Typical Transfer Characteristics 10 V D S, D rain-to-S ource Voltage (V) 4.5 A I D = 7.3A 1.5 1.0 0.5 V G S = 10 V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 T J , Junction T emperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature IRF7413A V GS C is s C rs s C i ss C os s C , C a p a c ita n c e (p F ) 2800 = = = = 20 0V , f = 1MH z C gs + C g d , Cds SH OR TED Cgd C ds + C gd 16 2400 C os s 2000 12 1600 1200 C rss 800 I D = 7 .3 A V DS = 2 4V V DS = 1 5V V G S , G a te -to -S o u rc e V o lta g e (V ) 3200 8 4 400 0 0 A 1 10 FO R TES T C IR CU IT SEE FIG U R E 9 100 0 10 V D S , Drain-to-Source V oltage (V) 30 40 50 A 60 Q G , Total Gate Charge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 100 OPERATION IN THIS AREA LIMITED BY RDS(on) TJ = 25°C I D , Drain Current (A) I S D , R e v e rse D ra in C u rre n t (A ) 20 TJ = 15 0°C 100 10 VG S = 0 V 1 0.4 1.2 2.0 2.8 V S D , Source-to-D rain V oltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 3.6 100us 10 1ms TA = 25 ° C TJ = 150 ° C Single Pulse 1 0.1 10ms 1 10 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area 100 IRF7413A VGS 10V QGS RD VDS QG QGD D.U.T. RG + - VDD VG 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Charge Fig 9a. Basic Gate Charge Waveform Fig 10a. Switching Time Test Circuit Current Regulator Same Type as D.U.T. VDS 50KΩ 12V 90% .2µF .3µF + V - DS D.U.T. 10% VGS VGS 3mA td(on) IG tr t d(off) tf ID Current Sampling Resistors Fig 9b. Gate Charge Test Circuit Fig 10b. Switching Time Waveforms Thermal Response (Z thJA ) 100 D = 0.50 10 0.20 0.10 0.05 PDM 0.02 1 0.01 t1 t2 SINGLE PULSE (THERMAL RESPONSE) 0.1 0.0001 0.001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJA + TA 0.01 0.1 1 10 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient 100 IRF7413A 15 V L VDS RG D .U .T IA S 2 0V D R IV E R + V - DD 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit V (BR )D SS tp A EAS , Single Pulse Avalanche Energy (mJ) 600 TOP 500 BOTTOM ID 3.3A 6.0A 7.3A 400 300 200 100 0 25 50 75 100 125 150 o Starting T J, Junction Temperature ( C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms IRF7413A Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG Driver Gate Drive Period P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test D= - VDD P.W. Period VGS=10V D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 13. For N-Channel HEXFETS ISD * IRF7413A Package Outline SO8 Outline Dimensions are shown in millimeters (inches) INCHES DIM D -B- 5 8 7 5 6 5 H E -A- 1 2 3 e 6X 0.25 (.010) 4 M A M A -C- 0.10 (.004) B 8X 0.25 (.010) L 8X A1 6 C 8X MAX 1.35 1.75 A1 .0040 .0098 0.10 0.25 B .014 .018 0.36 0.46 C .0075 .0098 0.19 0.25 D .189 .196 4.80 4.98 E .150 .157 3.81 3.99 .050 BASIC 1.27 BASIC .025 BASIC 0.635 BASIC H .2284 .2440 5.80 K .011 .019 0.28 0.48 L 0.16 .050 0.41 1.27 8° 0° 8° 0° 6.20 RECOMMENDED FOOTPRINT NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M-1982. 2. CONTROLLING DIMENSION : INCH. 3. DIMENSIONS ARE SHOWN IN MILLIMETERS (INCHES). 4. OUTLINE CONFORMS TO JEDEC OUTLINE MS-012AA. 5 DIMENSION DOES NOT INCLUDE MOLD PROTRUSIONS 6 MIN .0688 θ M C A S B S MILLIMETERS .0532 e1 θ MAX A e K x 45° e1 MIN 0.72 (.028 ) 8X 6.46 ( .255 ) 1.78 (.070) 8X MOLD PROTRUSIONS NOT TO EXCEED 0.25 (.006). DIMENSIONS IS THE LENGTH OF LEAD FOR SOLDERING TO A SUBSTRATE.. 1.27 ( .050 ) 3X Part Marking Information SO8 EXAM PLE : THIS IS AN IR F7101 312 INTERNATIONAL RECTIFIER LOGO DATE C ODE (YW W ) Y = LAST DIGIT O F THE YEAR W W = W EEK XXXX F7 101 TOP PART N UM BER W AFER LOT C ODE (LAST 4 DIGITS) BOTTOM IRF7413A Tape & Reel Information SO8 Dimensions are shown in millimeters (inches) 2.05 (.080) 1.95 (.077) T ERM INAT ION NUMB ER 1 1.85 ( .072) 4.10 (.161 ) 1.65 ( .065) 3.90 (.154 ) 1.60 ( .062) 1.50 ( .059) 0.3 5 (.013) 0.2 5 (.010) 5.55 ( .218) 5.45 ( .215) 1 F EE D DIRECT IO N 5.30 (.208) 5.10 (.201) 12.30 (.484) 11.70 (.461) 2.60 ( .102) 1.50 ( .059) 8.10 (.318) 7.90 (.311) 2.20 ( .086) 2.00 ( .079) 6.50 (.255) 6.30 (.248) 13.2 0 (.519) 12.8 0 (.504) 15.40 ( .607) 11.90 ( .469) 2 50.00 (1.969) M IN. 330.00 (13.000) M AX. NO T ES : 1 CO NF O RMS T O EIA- 481-1 2 INC LU DES F LANG E DIST O RT IO N @ O UT E R E DGE 3 DIM ENS IO NS ME ASURE D @ HUB 18.40 (.724) MAX 3 14.40 ( .566) 12.40 ( .448) 3 4 CO NT RO LLING DIM ENSIO N : M ET RIC WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 8/97