Order this document by MC33199/D The MC33199D is a serial interface circuit used in diagnostic applications. It is the interface between the microcontroller and the special K and L Lines of the ISO diagnostic port. The MC33199D has been designed to meet the “Diagnosis System ISO 9141” specification. The device has a bi–directional bus K Line driver, fully protected against short circuits and over temperature. It also includes the L Line receiver, used during the wake up sequence in the ISO transmission. The MC33199 has a unique feature which allows transmission baud rate up to 200 k baud. • • • • • • • • • • ISO 9141 SERIAL LINK DRIVER SEMICONDUCTOR TECHNICAL DATA Electrically Compatible with Specification “Diagnosis System ISO 9141” Transmission Speed Up to 200 k Baud Internal Voltage Reference Generator for Line Comparator Thresholds TXD, RXD and LO Pins are 5.0 V CMOS Compatible High Current Capability of DIA Pin (K Line) Short Circuit Protection for the K Line Input Over Temperature Shutdown with Hysteresis 14 Large Operating Range of Driver Supply Voltage 1 Full Operating Temperature Range ESD Protected Pins D SUFFIX PLASTIC PACKAGE CASE 751A (SO–14) Simplified Application REF–OUT LO Reference Generator VCC 1 14 REF–OUT REF–IN–L 2 13 VS REF–IN–K 3 12 L LO 4 11 I1 RXD 5 10 Gnd TXD 6 9 DIA NC 7 8 NC Protection + C2 – L I1 Source REF–IN–L REF–IN–K RXD PIN CONNECTIONS VS VCC I1 VCC C1 – + DIA Thermal Shutdown TXD (Top View) Driver Gnd ORDERING INFORMATION Current Limit This device contains 94 active transistors. Device Operating Temperature Range Package MC33199D TA = – 40° to +125°C SO–14 Motorola, Inc. 1996 MOTOROLA ANALOG IC DEVICE DATA Rev 0 1 MC33199 MAXIMUM RATINGS (Note 1) Rating VS Supply Pin DC Voltage Range Transient Pulse (Note 2) VCC Supply DC Voltage Range Symbol Value VS Vpulse –0.5 to +40 –2.0 to +40 VCC –0.3 to +6.0 V –0.5 to +40 –2.0 –50 Int. Limit V V mA mA –0.3 to VCC + 0.3 V V DIA and L Pins (Note 2) DC Voltage Range Transient Pulse (Clamped by Internal Diode) DC Source Current DIA Low Level Sink Current – TXD DC Voltage Range – REF–IN DC Voltage Range VS < VCC VS > VCC – ESD Voltage Capability (Note 3) Unit V –0.3 to VCC –0.3 to VS ±2000 V(ESD) V NOTES: 1. The device is compatible with Specification: “Diagnosis System ISO 9141”. 2. See the test circuit (Figure 23). Transient test pulse according to ISO 76371 and DIN 40839; highest test levels. 3. Human Body Model; C = 100 pF, R = 1500 Ω. THERMAL RATINGS Rating Storage Temperature Operating Junction Temperature Thermal Resistance, Junction–to–Ambient Maximum Power Dissipation (@ TA = 105°C) Symbol Value Unit Tstg –55 to +150 °C TJ –40 to +150 °C RθJA 180 °C/W PD 250 mW ELECTRICAL CHARACTERISTICS (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.) Characteristic VCC PIN 1 VCC Supply Voltage Range VCC Supply Current (Note 1) Symbol Min Typ Max Unit VCC 4.5 – 5.5 V ICC 0.5 1.0 1.5 mA 2.0 2.0 – – VCC – 2.0 V VS – 1.0 V –5.0 – 5.0 – – 0.34 – 0.7 0.8 RRXD 1.5 2.0 2.5 kΩ VOL – 0.3 0.7 V REF–IN–L PIN 2 AND REF–IN–K PIN 3 REF–IN–L and REF–IN–K Input Voltage Range For 0 < VS < VCC For VCC < VS < 40 V REF–IN–L and REF–IN–K Inputs Currents Vinref IVIN V µA LO PIN 4 LO Open Collector Output Low Level Voltage @ Iout = 1.0 mA Low Level Voltage @ Iout = 4.0 mA VOL V RXD PIN 5 Pull–Up Resistor to VCC Low Level Voltage @ Iout = 1.0 mA NOTES: 1. Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT. 2. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating. 3. When an over temperature is detected, the DIA output is forced “off”. 4. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V. 5. At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3). 6. Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT. 2 MOTOROLA ANALOG IC DEVICE DATA MC33199 ELECTRICAL CHARACTERISTICS (continued) (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.) Characteristic Symbol Min Typ Max Unit High Level Input Voltage VIH 0.7 VCC 2.8 – V Low Level Input Voltage VIL – 2.0 0.3 VCC V Input Current @ 0 < VS < 40 V TXD at High Level TXD at Low Level IH IL –200 –600 – – 30 –100 Low Level Output Voltage @ I = 30 mA VOL 0 0.35 0.8 V Drive Current Limit ILim 40 – 120 mA High Level Input Threshold Voltage (REF–IN–K Connected to REF–OUT) VIH Vref min + 0.25 V Vref + 0.325 V Vref max + 0.4 V V Low Level Input Threshold Voltage (REF–IN–K Connected to REF–OUT) VIL Vref min – 0.2 V Vref – 0.125 V Vref max – 0.05 V V Input Hysteresis VHyst 300 450 600 mV Positive Clamp @ 5.0 mA VCl+ 37 40 44 V Negative Clamp @ – 5.0 mA VCl– –1.5 –0.6 –0.3 V Leakage Current (Note 2) ILeak 4.0 10 16 µA Over Temperature Shutdown (Note 3) TLim 155 – – °C High Level Input Threshold Voltage (REF–IN–L Connected to REF–OUT) VIH Vref min + 0.25 V Vref + 0.325 V Vref max + 0.4 V V Low Level Input Threshold Voltage (REF–IN–L Connected to REF–OUT) VIL Vref min – 0.2 V Vref – 0.125 V Vref max – 0.05 V V Input Hysteresis VHyst 300 450 600 mV Leakage Current (Note 4) ILeak 4.0 10 16 µA Positive Clamp @ 5.0 mA VCl+ 37 40 44 V Negative Clamp @ – 5.0 mA VCl– –1.5 –0.6 –0.3 V TXD PIN 6 µA DIA INPUT/OUTPUT PIN 9 L INPUT PIN 12 I1 PIN 11 Static Source Current I1s –4.0 –3.0 –2.0 mA VI1(sat) VS – 1.2 VS – 0.8 VS V I1d –120 –80 –40 mA VI1(dsat) VS – 2.7 VS – 0.85 VS V VS Supply Voltage Range VS 4.5 – 20 V VS Supply Current (Note 6) IS 0.5 1.3 2.0 mA Static Saturation Voltage (I1s = – 2.0 mA) Dynamic Source Current (Note 5) Dynamic Saturation Voltage (II1(sat) = – 40 mA) VS PIN 13 NOTES: 1. Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT. 2. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating. 3. When an over temperature is detected, the DIA output is forced “off”. 4. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V. 5. At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3). 6. Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT. MOTOROLA ANALOG IC DEVICE DATA 3 MC33199 ELECTRICAL CHARACTERISTICS (continued) (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.) Characteristic Symbol Min Typ Max 2.7 0.5 x VS 8.5 – – – 3.3 0.56 x VS 10.8 Unit REF–OUT PIN 14 Output Voltage 3.0 < VS < 5.6 V and IRO = ±10 µA 5.6 < VS < 18 V and IRO = ±10 µA 18 < VS < 40 V and IRO = ±10 µA Vref V Maximum Output Current Iout –50 – 50 µA Pull–Up Resistor to VCC RPU 3.0 8.0 12 kΩ NOTES: 1. Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT. 2. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating. 3. When an over temperature is detected, the DIA output is forced “off”. 4. 0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V. 5. At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3). 6. Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT. DYNAMIC CHARACTERISTICS (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise noted.) Characteristic Symbol Min Typ Max Unit Transmission Speed 1/t Bit 0 – 200 k Baud High or Low Bit Time µs t Bit 5.0 – – RXD Output Low to High Transition Delay Time High to Low Transition Delay Time tRDR tRDF – – – – 450 450 LO Output Low to High Transition Delay Time High to Low Transition Delay Time tLDR tLDF – – – – 2.0 2.0 DIA Output Low to High Transition Delay Time High to Low Transition Delay Time tDDR tDDF – – – – 650 650 tI1R tI1F – 1.5 – – 0.3 4.5 I1 Output (VS – I1 > 2.7 V) Rise Time Hold Time 4 ns µs ns µs MOTOROLA ANALOG IC DEVICE DATA MC33199 Figure 1. TXD to DIA AC Characteristic 5.0 V + 5.0 V +12 V TXD Input Signal tBit VCC Vbat I1 REF–OUT 0V REF–IN–L REF–IN–K Input Signal TXD tDDR Test Point tDDF 10 V DIA 1.0 nF Gnd DIA Output Signal 2.0 V Figure 2. DIA to TXD and L to LO AC Characteristics 12 V + 5.0 V +12 V DIA and L Input Signal tBit 2.0 K VCC Vbat REF–OUT REF–IN–L REF–IN–K TXD LO Test Points RXD 0V L tRDR/tLDR Input Signal tRDF/tLDF 4.5 V DIA RXD to LO Output Signal Gnd 0.4 V 2 x 30 pF Figure 3. Current Source I1 AC Characteristics Figure 4. Current Source I1 and DIA Discharge Current Test Schematic tBit 5.0 V TXD Signal tI1F 0V tI1H VCC Vbat REF–OUT 120 mA Typical I1 Waveform 40 mA 4.0 mA 2.0 mA Current Source I1 Maximum Limit Input Signal REF–IN–L REF–IN–K TXD LO RXD tI1R I1 Pulse Current + 5.0 V +12 V I1 DIA Discharge Current DIA Gnd 33 nF To Oscilloscope 10 Ω Current Source I1 Minimum Limit At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current increase to a higher value in order to charge the K Line capacitor (Cl < 4.0 nF) in a short time. MOTOROLA ANALOG IC DEVICE DATA 5 MC33199 Figure 5. Logic Diagram and Application Schematic Vbat VCC = 5.0 V REF–OUT Reference Generator VS Protection LO C2 L Line L + – REF–IN–L I1 Source REF–IN–K RPU TXD I1 VCC RXD C1 – + K Line DIA RXD Thermal Shutdown MCU TXD Driver Gnd Current Limit Service Tester or End of Line Manufacturer Programmation or Checking System Car Electronic Control Unit Figure 6. Typical Application with Several ECUs +Vbat RPU L Line MCU K Line MC33199 Service Tester or End of Line Manufacturer Programmation or Checking System ECU #1 Car ISO Diagnostic Connector MCU MC33199 ECU #2 Car Other ECUs 6 MOTOROLA ANALOG IC DEVICE DATA MC33199 Figure 7. ICC Supply Current versus Temperature Figure 8. IS Supply Current versus VS Supply Voltage 2.5 I S , SUPPLY CURRENT (mA) I CC , SUPPLY CURRENT (mA) 1.4 1.2 1.0 0.8 0.6 0.4 – 50 – 25 0 25 50 75 100 0.5 10 15 VS, SUPPLY VOLTAGE (V) Figure 9. IS Supply Current versus VS Supply Voltage Figure 10. VS Voltage versus IS Current 20 40 25 35 –40°C 20 VS , VOLTAGE (V) IS , SUPPLY CURRENT (mA) 125°C 1.0 TA, AMBIENT TEMPERATURE (°C) 25°C 15 10 125°C 0 5.0 10 15 20 25 30 VCC = 5.5 V VDIA = VL = VI1 = 20 V 125°C 25°C 30 –40°C 25 20 5.0 35 15 – 5.0 40 –1.0 3.0 7.0 11 VS, SUPPLY VOLTAGE (V) IS, CURRENT (mA) Figure 11. REF–OUT Voltage versus VS Supply Voltage Figure 12. REF–OUT Voltage versus REF–OUT Current 15 10 REF–OUT, OUTPUT VOLTAGE (V) 10 REF–OUT, OUTPUT VOLTAGE (V) –40°C 25°C 1.5 0 5.0 125 30 8.0 6.0 4.0 2.0 0 2.0 0 5.0 10 15 20 25 VS, VOLTAGE (V) MOTOROLA ANALOG IC DEVICE DATA 30 35 40 VS = 18 V 8.0 6.0 4.0 VS = 6.0 V 2.0 0 – 50 – 40 – 30 – 20 –10 0 10 20 30 40 50 REF–OUT, OUTPUT CURRENT (µA) 7 MC33199 Figure 13. L and DIA Hysteresis versus Ambient Temperature Figure 14. L and DIA Current versus L and DIA Voltage 12 460 440 420 – 25 0 25 50 75 –40°C 8.0 25°C 6.0 125°C 5.0 10 15 20 25 30 TA, AMBIENT TEMPERATURE (°C) VDIA, VL, DIA AND L VOLTAGE (V) Figure 15. DIA Saturation Voltage versus Temperature Figure 16. DIA Current Limit versus Temperature 35 40 100 125 70 IDIA = 40 mA 500 450 400 350 300 – 50 10 4.0 0 125 550 – 25 0 25 50 75 100 66 62 58 54 50 – 50 125 – 25 0 25 50 75 TA, AMBIENT TEMPERATURE (°C) TA, AMBIENT TEMPERATURE (°C) Figure 17. RXD Pull–Up Resistor versus Temperature Figure 18. TXD and LO Saturation Voltage versus Temperature 2.5 2.4 2.3 2.2 2.1 2.0 1.9 1.8 1.7 1.6 1.5 – 50 – 25 0 25 50 75 TA, AMBIENT TEMPERATURE (°C) 8 100 I DIA , DIA CURRENT LIMIT (mA) V DIA(sat) , DIA SATURATION VOLTAGE (mV) 400 – 50 RRXD , RXD PULL–UP RESISTOR (k Ω ) I DIA , I L, DIA AND L CURRENT (µ A) 480 100 125 V TXD(sat) , V LO(sat) , TXD AND V LO SATURATION (mV) V Hyst , L AND DIA HYSTERESIS (mV) 500 600 500 400 LO 300 RXD 200 100 0 – 50 – 25 0 25 50 75 100 125 TA, AMBIENT TEMPERATURE (°C) MOTOROLA ANALOG IC DEVICE DATA MC33199 Figure 19. I1 Saturation Voltage versus Temperature Figure 20. I1 Output DC Current versus Temperature 3.50 3.25 0.9 I1, DC CURRENT (mA) V I1(sat), I1 SATURATION VOLTAGE (V) 1.0 I = 40 mA 0.8 I = 2.0 mA 0.7 3.00 2.75 2.50 0.6 0.5 –50 2.25 – 25 0 25 50 75 100 2.00 –50 125 25 50 75 100 Figure 21. I1 Output Pulse Current versus VS Supply Voltage Figure 22. I1 Pulse Current Width versus Temperature 125 4.4 90 t I1 , I1 PULSE WIDTH ( µ s) I1, OUTPUT CURRENT (mA) 0 TA, AMBIENT TEMPERATURE (°C) 100 125°C 80 25°C 70 60 – 40°C 50 40 5.0 – 25 TA, AMBIENT TEMPERATURE (°C) 7.5 10 12.5 15 17.5 4.2 4.0 3.8 3.6 3.4 –50 20 – 25 0 25 50 75 100 125 TA, AMBIENT TEMPERATURE (°C) VS, SUPPLY VOLTAGE (V) Figure 23. Transient Test Circuit Using Schaffner Generator +12 V D2 100 nF Vbat I1 D1 Schaffner Generator 2 x 1.0 nF L DIA Gnd 2 x 330 pF Test pulses are directly applied to VS and via a capacitor of 1.0 nF to DIA and L. The voltage VS is limited to – 2.0 V/40 V by the transient suppressor diode D1. Pulses can occur simultaneously or separately. MOTOROLA ANALOG IC DEVICE DATA 9 MC33199 INTRODUCTION The MC33199 is a serial interface circuit used in diagnostic applications. It is the interface between the microcontroller and the special K and L Lines of the ISO diagnostic port. The MC33199 has been designed to meet the “Diagnosis System ISO 9141” specification. This product description will detail the functionality of the device (see simplified application). The power supply and reference voltage generator will be discussed followed by the path functions between MCU, K and L Lines. A dedicated paragraph will discuss the special functionality of the I1 pin in it’s ability to accommodiate high baud rate transmissions. Power Supplies and Reference Voltage The device requires two power supplies to be used; a 5.0 V supply, VCC, which is normally connected to the MCU supply. The device VCC pin is capable of sinking typically 1.0 mA during normal operation. A Vbat supply voltage, VS, is normally tied to the car’s battery voltage. The Vbat pin can sustain up to 40 V dc. Care should be taken to provide any additional reverse battery and transient voltage protection in excess of 40 V. The voltage reference generator is supplied from both VCC and Vbat pins. The voltage reference generator provides a reference voltage for the K and L Line comparator thresholds. The reference voltage is dependant on the Vbat voltage; it is linear in relation to the Vbat voltage for all Vbat voltages between 5.6 V and 18 V. Below 5.6 V and over 18 V the reference voltage is clamped (see Figure 11). The REF–OUT pin connects the reference voltage out externally making it available for other application needs. The REF–OUT pin is capable of supplying a current of 50 µA (see Figure 12). Path Functions Between MCU, K and L Lines The path function from the MCU to the K Line uses a driver to interface directly with the MCU through the TXD pin. The TXD pin is CMOS compatible. This driver controls the On–Off conduction of the power transistor. When the power transistor is On, it pulls the DIA pin low. This pin is known as K Line in the ISO 9141 specification. The DIA pin structure is open collector and requires an external pull–up resistor for use. Having an open collector without an internal pull–up resistor allows several MC33199 to be connected to the K Line while using a single pull–up resistor for the system (see Figure 6). In order to protect the DIA pin against short circuits to Vbat, the MC33199 incorporates an internal current limit (see Figure 16) and thermal shutdown circuit. The current limit feature makes it possible for the device to drive a K Line bus having a large parasitic capacitor value (see Special Functionality of I1 pin below). The path from the DIA pin, or K Line, to the MCU is done through a comparator. The comparator threshold voltage is connected to REF–IN–K pin. It can be tied to the REF–OUT voltage if a Vbat dependant threshold is required in the application. The second input of this comparator is connected internally to DIA pin. The output of this comparator is available at the RXD output pin and normally connects to an MCU I/O port. RXD pin has a 2.0 kΩ internal pull–up resistor. 10 The path from the L Line, used during a wake–up sequence of the transmission, to the MCU is done through a second comparator. The comparator threshold voltage is connected to REF–IN–L pin. The REF–IN–K pin can be tied to the REF–OUT voltage if a Vbat dependant threshold is required in the application. The second input of this comparator is internally connected to L pin. The output of this comparator is available on LO output pin, which is also an open collector structure. The LO pin is normally connected to an MCU I/O port. The DIA and L pins can sustain up to 40 V dc. Care should be taken to protect these pins from reverse battery and transient voltages exceeding 40 V. The DIA and L pins both have internal pull–down current sources of typically 7.5 µA (see Figure 14). The L Line exhibits a 10 µA pull–down current. The DIA pin has the same behavior when it is in “off” state, that is when TXD is at logic high level. Special Functionality of I1 Pin The MC33199 has a unique feature which accommodates transmission baud rates of up to 200 k baud. In practice, the K Line can be several meters long and have a large parasitic capacitance value. Large parasitic capacitance values will slow down the low to high transition of the K Line and limit the baud rate transmission. For the K Line to go from low to high level, the parasitic capacitor must first be charged, and can only be charged through the pull–up resistor. A low pull–up resistor value would result in fast charge time of the capacitor but also large output currents to be supplied causing a high power dissipation in the driver. To avoid this problem, the MC33199 incorporates a dynamic current source which is temporarily activated at the low to high transition of the TXD pin when the DIA pin or K Line switches from a low to high level (see Figures 3 and 4). This current source is available at the I1 pin. The I1 pin has a typical current capability of 80 mA. It is activated for 4.0 µs (see Figures 21 and 22) and is automatically disabled after this time. During this time it will charge the K Line parasitic capacitor. This extra current will quickly increase the K Line voltage up to Vbat, resulting in a reduced rise time of the K Line. With this feature, the MC33199 ensures baud rate transmission of up to 200 k baud. During high to low transitions of the K Line, the parasitic capacitor of the line will be discharged by the output transistor of the DIA pin. In this case, the total current may exceed the internal current limitation of the DIA pin. If so, the current limit circuit will activate, limiting the discharge current to typically 60 mA (see Figures 4 and 16). If a high baud rate is necessary, the I1 pin should be connected to the DIA as shown in the typical application circuit shown in Figure 5. The I1 pin can be left open, if the I1 functionality and high baud rate are not required for the application. MOTOROLA ANALOG IC DEVICE DATA MC33199 PIN DESCRIPTION Pin 1: VCC Power Supply pin; typically 5.0 V and requiring less than 1.5 mA. Pin 2: REF–IN–L Input reference for C2 comparator. This input can be connected directly to REF–OUT with or without a resistor network or to an external reference. Pin 3: REF–IN–K Input reference for C1 comparator. This input can be connected directly to REF–OUT with or without a resistor network or to an external reference. Pin 4: LO Output of C2 comparator and normally connected to a microcontroller I/O. If L input > (REF–IN–L + Hyst/2); output LO is in high state. If L< (REF–IN–L – Hyst/2); output LO is in low state and the output transistor is “on”. This pin is an open collector structure and requires a pull–up resistor to be connected to VCC. Output drive capability of this output is 5.0 mA. Pin 5: RXD Receive output normally connected to a microcontroller I/O. If DIA input > (REF–IN–L + Hyst/2); output LO is in high state. If DIA < (REF–IN–L – Hyst/2); output LO is in low state and the output transistor is “on”. This pin has an internal pull–up resistor (typically 2.0 kΩ) connected to VCC. Drive capability of this output is 5.0 mA. Pin 6: TXD Tr a n s m i s s i o n i n p u t n o r m a l l y c o n n e c t e d t o a microcontroller I/O. This pin controls the DIA output. If TXD is high, the output DIA transistor is in the “off” state. If TXD is low, the DIA output transistor is “on”. Pin 9: DIA Input/Output Diagnosis Bus line pin. This pin is an open collector structure and is protected against overcurrent and MOTOROLA ANALOG IC DEVICE DATA circuit shorts to Vbat and VS. Whenever the open collector transistor turns “on” (TXD low), the Bus line is pulled to ground and the DIA pin current is internally limited to nominal value of 60 mA. The internal power transistor incorporates a thermal shutdown circuit which forces the DIA output “off” in the event of an over temperature condition. The DIA pin is also the C1 comparator input. It is protected against both positive and negative overvoltages by an internal 40 V zener diode. This pin exhibits a constant input current of 7.5 µA. Pin 10: Gnd Ground reference for the entire device. Pin 11: I1 Bus source current pin. It is normally tied to DIA pin and to the Bus line. The current source I1 delivers a nominal current of 3.0 mA at static “High” or “Low” levels of TXD. Only during “Low” to “High” transitions, does this current increase to a higher value so as to charge the key line capacitor (Cl < 4.0 nF) in a short time (see Figures 3 and 4). Pin 12: L Input for C2 comparator. This pin is protected against both positive and negative overvoltage by a 40 V zener diode. This L Line is a second independent input. It can be used for wake up sequence in ISO diagnosis or as an additional input bus line. This pin exhibits a constant input current of 7.5 µA. Pin 13: VS 12 V typical, or Vbat supply pin for the device. This pin is protected against overvoltage transients. Pin 14: REF–OUT Internal reference voltage generator output pin. Its value depends on VS (Vbat) values. This output can be directly connected to REF–IN–L and REF–IN–K, or through a resistor network. Maximum current capability is 50 µA. 11 MC33199 OUTLINE DIMENSIONS D SUFFIX PLASTIC PACKAGE CASE 751A–03 (SO–14) ISSUE F –A– 14 8 –B– 1 P 7 PL 0.25 (0.010) 7 G M M K M T B S M F –T– D 14 PL 0.25 (0.010) B R X 45 _ C SEATING PLANE NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. A S J DIM A B C D F G J K M P R MILLIMETERS MIN MAX 8.55 8.75 3.80 4.00 1.35 1.75 0.35 0.49 0.40 1.25 1.27 BSC 0.19 0.25 0.10 0.25 0_ 7_ 5.80 6.20 0.25 0.50 INCHES MIN MAX 0.337 0.344 0.150 0.157 0.054 0.068 0.014 0.019 0.016 0.049 0.050 BSC 0.008 0.009 0.004 0.009 0_ 7_ 0.228 0.244 0.010 0.019 Motorola reserves the right to make changes without further notice to any products herein. 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How to reach us: USA / EUROPE / Locations Not Listed: Motorola Literature Distribution; P.O. Box 20912; Phoenix, Arizona 85036. 1–800–441–2447 or 602–303–5454 JAPAN: Nippon Motorola Ltd.; Tatsumi–SPD–JLDC, 6F Seibu–Butsuryu–Center, 3–14–2 Tatsumi Koto–Ku, Tokyo 135, Japan. 03–81–3521–8315 MFAX: [email protected] – TOUCHTONE 602–244–6609 INTERNET: http://Design–NET.com ASIA/PACIFIC: Motorola Semiconductors H.K. Ltd.; 8B Tai Ping Industrial Park, 51 Ting Kok Road, Tai Po, N.T., Hong Kong. 852–26629298 12 ◊ MOTOROLA ANALOG IC DEVICE DATA *MC33199/D* MC33199/D