Blackfin Embedded Processor ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data FEATURES PERIPHERALS Up to 400 MHz high-performance Blackfin processor Two 16-bit MACs, two 40-bit ALUs, four 8-bit video ALUs, 40-bit shifter RISC-like register and instruction model for ease of programming and compiler-friendly support Advanced debug, trace, and performance monitoring Accepts a range of supply voltages for internal and I/O operations. See Processor — Operating Conditions on Page 25 Internal 32M bit flash (available on ADSP-BF504F and ADSP-BF506F processors) Internal ADC (available on ADSP-BF506F processor) Off-chip voltage regulator interface 88-lead (12 mm × 12 mm) LFCSP package for ADSP-BF504 and ADSP-BF504F processors 120-lead (14 mm × 14 mm) LQFP package for ADSP-BF506F processor Two 32-bit up/down counters with rotary support Eight 32-bit timers/counters with PWM support Two three-phase 16-bit center-based PWM units Two dual-channel, full-duplex synchronous serial ports (SPORTs), supporting eight stereo I2S channels Two Serial Peripheral Interface (SPI) compatible ports Two UARTs with IrDA® support Parallel peripheral interface (PPI), supporting ITU-R 656 video data formats Removable storage interface (RSI) controller for MMC, SD, SDIO, and CE-ATA Internal ADC with 12 channels, 12 bits, and up to 2 MSPS ADC controller module (ACM), providing a glue-less interface between Blackfin processor and internal or external ADC Controller Area Network (CAN) controller Two-wire interface (TWI) controller 12 peripheral DMAs Two memory-to-memory DMA channels Event handler with 52 interrupt inputs 35 general-purpose I/Os (GPIOs), with programmable hysteresis Debug/JTAG interface On-chip PLL capable of frequency multiplication MEMORY 68K bytes of L1 SRAM (processor core-accessible) memory: (See Table 1 on Page 3 for L1 and L3 memory size details) External (interface-accessible) memory controller with glueless support for internal 32M bit flash and boot ROM Flexible booting options from internal flash and SPI memory or from host devices including SPI, PPI, and UART Memory management unit providing memory protection COUNTER1–0 WATCHDOG TIMER VOLTAGE REGULATOR INTERFACE JTAG TEST AND EMULATION B PERIPHERAL PWM 1–0 ACCESS BUS SPORT1–0 INTERRUPT CONTROLLER SPI1–0 PORT G UART1–0 L1 DATA MEMORY DMA CONTROLLER 16 DCB PPI DMA ACCESS BUS DEB 32M BIT FLASH PORT F PORT H L1 INSTRUCTION MEMORY EAB GPIO TIMER7–0 MEMORY PORT FLASH CONTROL RSI ACM ADC CAN BOOT ROM TWI Figure 1. Processor Block Diagram Blackfin and the Blackfin logo are registered trademarks of Analog Devices, Inc. Rev. PrC Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106 U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 © 2010 Analog Devices, Inc. All rights reserved. ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data TABLE OF CONTENTS Features ................................................................. 1 ADC and ACM Interface ....................................... 18 Memory ................................................................ 1 Internal ADC ..................................................... 19 Peripherals ............................................................. 1 ADC Application Hints ........................................ 20 Table Of Contents .................................................... 2 Related Documents .............................................. 20 Revision History ...................................................... 2 Signal Descriptions ................................................. 21 General Description ................................................. 3 Processor — Specifications ....................................... 25 Portable Low-Power Architecture ............................. 3 Processor — Operating Conditions .......................... 25 System Integration ................................................ 3 Processor — Electrical Characteristics ...................... 27 Processor Peripherals ............................................. 3 Processor — Absolute Maximum Ratings .................. 30 Blackfin Processor Core .......................................... 4 ESD Sensitivity ................................................... 30 Memory Architecture ............................................ 5 Package Information ............................................ 30 Flash Memory ...................................................... 9 Processor — Timing Specifications .......................... 31 DMA Controllers .................................................. 9 Processor — Output Drive Currents ........................ 49 Watchdog Timer .................................................. 9 Processor — Test Conditions ................................. 50 Timers ............................................................... 9 Processor — Environmental Conditions ................... 52 Up/Down Counters and Thumbwheel Interfaces ........ 10 Flash Program and Erase Times and Endurance Cycles .... 53 3-phase PWM Units ............................................ 10 Flash – Absolute Maximum Ratings ............................ 53 Serial Ports ........................................................ 10 ADC — Specifications ............................................. 54 Serial Peripheral Interface (SPI) Ports ...................... 11 ADC — Timing Specifications ................................ 56 UART Ports (UARTs) .......................................... 11 ADC — Absolute Maximum Ratings ........................ 57 Parallel Peripheral Interface (PPI) ........................... 11 ADC — Typical Performance Characteristics ............. 57 RSI Interface ...................................................... 12 ADC — Terminology ........................................... 60 Controller Area Network (CAN) Interface ................ 12 ADC — Theory of Operation ................................. 61 TWI Controller Interface ...................................... 13 ADC — Modes of Operation .................................. 67 Ports ................................................................ 13 ADC — Serial Interface ........................................ 70 Dynamic Power Management ................................ 13 120-Lead LQFP Lead assignment ............................... 72 ADSP-BF50x Voltage Regulation ............................ 15 88-Lead LFCSP Lead assignment ................................ 75 Clock Signals ..................................................... 15 Outline Dimensions ................................................ 78 Booting Modes ................................................... 16 Surface Mount Design .......................................... 79 Instruction Set Description ................................... 17 Ordering Guide ..................................................... 79 Development Tools ............................................. 17 Designing an Emulator-Compatible Processor Board (Target) ................................... 17 REVISION HISTORY Updated specifications (reference PCN 09_0173) in the Clock and Reset Timing section to accurately describe processor coldstartup/reset timing ..................................................31 1/10—Rev. PrB to Rev. PrC Numerous small corrections and additions to document. Major changes/additions include: Revised all timing diagrams for clarity/consistency in Processor — Timing Specifications .......................................... 31 Rev. PrC To view product/process change notifications (PCNs) related to this data sheet revision, please visit the processor's product page on the www.analog.com website and use the View PCN link. | Page 2 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F GENERAL DESCRIPTION The ADSP-BF50x processors are members of the Blackfin® family of products, incorporating the Analog Devices/Intel Micro Signal Architecture (MSA). Blackfin processors combine a dualMAC state-of-the-art signal processing engine, the advantages of a clean, orthogonal RISC-like microprocessor instruction set, and single-instruction, multiple-data (SIMD) multimedia capabilities into a single instruction-set architecture. The ADSP-BF50x processors are completely code compatible with other Blackfin processors. ADSP-BF50x processors offer performance up to 400 MHz and reduced static power consumption. Differences with respect to peripheral combinations are shown in Table 1. Table 1. Processor Comparison Memory (bytes) ADSPFeature BF504 Up/Down/Rotary Counters 2 Timer/Counters with PWM 8 3-Phase PWM Units 2 SPORTs 2 SPIs 2 UARTs 2 Parallel Peripheral Interface 1 Removable Storage Interface 1 CAN 1 TWI 1 Internal 32M Bit Flash – ADC Control Module (ACM) 1 Internal ADC – GPIOs 35 L1 Instruction SRAM 16K L1 Instruction SRAM/Cache 16K L1 Data SRAM 16K L1 Data SRAM/Cache 16K L1 Scratchpad 4K L3 Boot ROM 4K Maximum Speed Grade1 Maximum System Clock Speed Package Options 88-Lead LFCSP 1 ADSPADSPBF504F BF506F 2 2 8 8 2 2 2 2 2 2 2 2 1 1 1 1 1 1 1 1 1 1 1 1 – 1 35 35 16K 16K 16K 16K 16K 16K 16K 16K 4K 4K 4K 4K 400 MHz 100 MHz 88-Lead 120-Lead LFCSP LQFP Maximum speed grade is not available with every possible SCLK selection. By integrating a rich set of industry-leading system peripherals and memory, Blackfin processors are the platform of choice for next-generation applications that require RISC-like programmability, multimedia support, and leading-edge signal processing in one integrated package. Rev. PrC PORTABLE LOW-POWER ARCHITECTURE Blackfin processors provide world-class power management and performance. They are produced with a low-power and low-voltage design methodology and feature on-chip dynamic power management, which provides the ability to vary both the voltage and frequency of operation to significantly lower overall power consumption. This capability can result in a substantial reduction in power consumption, compared with just varying the frequency of operation. This allows longer battery life for portable appliances. SYSTEM INTEGRATION The ADSP-BF50x processors are highly integrated system-on-achip solutions for the next generation of embedded industrial, instrumentation, and power/motion control applications. By combining industry-standard interfaces with a high-performance signal processing core, cost-effective applications can be developed quickly, without the need for costly external components. The system peripherals include a watchdog timer; two 32-bit up/down counters with rotary support; eight 32-bit timers/counters with PWM support; six pairs of three-phase 16-bit center-based PWM units; two dual-channel, full-duplex synchronous serial ports (SPORTs); two serial peripheral interface (SPI) compatible ports; two UARTs with IrDA support; a parallel peripheral interface (PPI); a removable storage interface (RSI) controller; an internal ADC with 12 channels, 12 bits, up to 2 MSPS, and ACM controller; a controller area network (CAN) controller; a two-wire interface (TWI) controller; and an internal 32M bit flash. PROCESSOR PERIPHERALS The ADSP-BF50x processors contain a rich set of peripherals connected to the core via several high-bandwidth buses, providing flexibility in system configuration as well as excellent overall system performance (see the block diagram on Page 1). These Blackfin processors contain high-speed serial and parallel ports, an interrupt controller for flexible management of interrupts from the on-chip peripherals or external sources, and power management control functions to tailor the performance and power characteristics of the processor and system to many application scenarios. The SPORT, SPI, UART, PPI, and RSI peripherals are supported by a flexible DMA structure. There are also separate memory DMA channels dedicated to data transfers between the processor’s various memory spaces, including boot ROM and internal 32M bit synchronous burst flash. Multiple on-chip buses running at up to 100 MHz provide enough bandwidth to keep the processor core running along with activity on all of the on-chip and external peripherals. The ADSP-BF50x processors include an interface to an off-chip voltage regulator in support of the processor’s dynamic power management capability. | Page 3 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data BLACKFIN PROCESSOR CORE and 8-bit subtract/absolute value/accumulate (SAA) operations. Also provided are the compare/select and vector search instructions. As shown in Figure 2, the Blackfin processor core contains two 16-bit multipliers, two 40-bit accumulators, two 40-bit ALUs, four video ALUs, and a 40-bit shifter. The computation units process 8-, 16-, or 32-bit data from the register file. For certain instructions, two 16-bit ALU operations can be performed simultaneously on register pairs (a 16-bit high half and 16-bit low half of a compute register). If the second ALU is used, quad 16-bit operations are possible. The compute register file contains eight 32-bit registers. When performing compute operations on 16-bit operand data, the register file operates as 16 independent 16-bit registers. All operands for compute operations come from the multiported register file and instruction constant fields. The 40-bit shifter can perform shifts and rotates and is used to support normalization, field extract, and field deposit instructions. The program sequencer controls the flow of instruction execution, including instruction alignment and decoding. For program flow control, the sequencer supports PC relative and indirect conditional jumps (with static branch prediction), and subroutine calls. Hardware is provided to support zero-overhead looping. The architecture is fully interlocked, meaning that the programmer need not manage the pipeline when executing instructions with data dependencies. Each MAC can perform a 16-bit by 16-bit multiply in each cycle, accumulating the results into the 40-bit accumulators. Signed and unsigned formats, rounding, and saturation are supported. The ALUs perform a traditional set of arithmetic and logical operations on 16-bit or 32-bit data. In addition, many special instructions are included to accelerate various signal processing tasks. These include bit operations such as field extract and population count, modulo 232 multiply, divide primitives, saturation and rounding, and sign/exponent detection. The set of video instructions include byte alignment and packing operations, 16-bit and 8-bit adds with clipping, 8-bit average operations, The address arithmetic unit provides two addresses for simultaneous dual fetches from memory. It contains a multiported register file consisting of four sets of 32-bit index, modify, length, and base registers (for circular buffering), and eight additional 32-bit pointer registers (for C-style indexed stack manipulation). ADDRESS ARITHMETIC UNIT L3 B3 M3 I2 L2 B2 M2 I1 L1 B1 M1 I0 L0 B0 M0 SP FP P5 DAG1 P4 P3 DAG0 P2 32 32 P1 P0 TO MEMORY DA1 DA0 I3 32 PREG 32 RAB SD LD1 LD0 32 32 32 ASTAT 32 32 SEQUENCER R7.H R6.H R7.L R6.L R5.H R5.L R4.H R4.L R3.H R3.L R2.H R2.L R1.H R1.L R0.H R0.L 16 ALIGN 16 8 8 8 8 DECODE BARREL SHIFTER 40 40 40 A0 32 40 A1 32 DATA ARITHMETIC UNIT Figure 2. Blackfin Processor Core Rev. PrC | Page 4 of 80 | January 2010 LOOP BUFFER CONTROL UNIT Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F The architecture provides three modes of operation: user mode, supervisor mode, and emulation mode. User mode has restricted access to certain system resources, thus providing a protected software environment, while supervisor mode has unrestricted access to the system and core resources. The Blackfin processor instruction set has been optimized so that 16-bit opcodes represent the most frequently used instructions, resulting in excellent compiled code density. Complex DSP instructions are encoded into 32-bit opcodes, representing fully featured multifunction instructions. Blackfin processors support a limited multi-issue capability, where a 32-bit instruction can be issued in parallel with two 16-bit instructions, allowing the programmer to use many of the core resources in a single instruction cycle. The Blackfin processor assembly language uses an algebraic syntax for ease of coding and readability. The architecture has been optimized for use in conjunction with the C/C++ compiler, resulting in fast and efficient software implementations. The second core-accessible memory block is the L1 data memory, consisting of 32K bytes of SRAM, of which 16K bytes may be configured as cache. This memory block is accessed at full processor speed. The third memory block is 4K bytes of scratchpad SRAM which runs at the same speed as the L1 memories, but is only accessible as data SRAM and cannot be configured as cache memory. 0xFFFF FFFF CORE MEMORY MAPPED REGISTERS 0xFFE0 0000 SYSTEM MEMORY MAPPED REGISTERS 0xFFC0 0000 RESERVED 0xFFB0 1000 INTERNAL SCRATCHPAD RAM (4K BYTES) 0xFFB0 0000 RESERVED 0xFFA1 4000 RESERVED 0xFFA0 8000 L1 INSTRUCTION SRAM/CACHE (16K BYTES) 0xFFA0 4000 L1 INSTRUCTION BANK A SRAM (16K BYTES) 0xFFA0 0000 RESERVED 0xFF80 8000 L1 DATA BANK A SRAM/CACHE (16K BYTES) 0xFF80 4000 L1 DATA BANK A SRAM (16K BYTES) 0xFF80 0000 RESERVED 0xEF00 1000 BOOT ROM (4K BYTES) 0xEF00 0000 RESERVED 0x2040 0000 SYNC FLASH (32M BITS) * 0x2000 0000 MEMORY ARCHITECTURE RESERVED 0x0000 0000 The Blackfin processor views memory as a single unified 4G byte address space, using 32-bit addresses. All resources, including internal memory, external memory, and I/O control registers, occupy separate sections of this common address space. The memory portions of this address space are arranged in a hierarchical structure to provide a good cost/performance balance of some very fast, low-latency core-accessible memory as cache or SRAM, and larger, lower-cost and performance interface-accessible memory systems. See Figure 3. The core-accessible L1 memory system is the highest-performance memory available to the Blackfin processor. The interface-accessible memory system, accessed through the external bus interface unit (EBIU), provides access to the internal flash memory and boot ROM. The memory DMA controller provides high-bandwidth datamovement capability. It can perform block transfers of code or data between the internal memory and the external memory spaces. Internal (Core-Accessible) Memory The processor has three blocks of core-accessible memory, providing high-bandwidth access to the core. Rev. PrC INTERNAL (CORE-ACCESSIBLE) MEMORY MAP In addition, multiple L1 memory blocks are provided, offering a configurable mix of SRAM and cache. The memory management unit (MMU) provides memory protection for individual tasks that may be operating on the core and can protect system registers from unintended access. The first block is the L1 instruction memory, consisting of 32K bytes SRAM, of which 16K bytes can be configured as a four-way set-associative cache. This memory is accessed at full processor speed. EXTERNAL (INTERFACE-ACCESSIBLE) MEMORY MAP Blackfin processors support a modified Harvard architecture in combination with a hierarchical memory structure. Level 1 (L1) memories are those that typically operate at the full processor speed with little or no latency. At the L1 level, the instruction memory holds instructions only. The data memory holds data, and a dedicated scratchpad data memory stores stack and local variable information. * AVAILABLE ON PARTS WITH SYNC FLASH (F) Figure 3. Internal/External Memory Map External (Interface-Accessible) Memory External memory is accessed via the EBIU memory port. This 16-bit interface provides a glueless connection to the internal flash memory and boot ROM. Internal flash memory ships from the factory in an erased state except for block 0 of the parameter bank. Block 0 of the Flash memory parameter bank ships from the factory in an unknown state. An erase operation should be performed prior to programming this block. I/O Memory Space The processor does not define a separate I/O space. All resources are mapped through the flat 32-bit address space. Onchip I/O devices have their control registers mapped into memory-mapped registers (MMRs) at addresses near the top of the 4G byte address space. These are separated into two smaller blocks, one which contains the control MMRs for all core functions, and the other which contains the registers needed for setup and control of the on-chip peripherals outside of the core. The MMRs are accessible only in supervisor and emulation modes and appear as reserved space to on-chip peripherals. | Page 5 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Booting Table 2. Core Event Controller (CEC) The processor contains a small on-chip boot kernel, which configures the appropriate peripheral for booting. If the processor is configured to boot from boot ROM memory space, the processor starts executing from the on-chip boot ROM. For more information, see Booting Modes on Page 16. Event Handling The event controller on the processor handles all asynchronous and synchronous events to the processor. The processor provides event handling that supports both nesting and prioritization. Nesting allows multiple event service routines to be active simultaneously. Prioritization ensures that servicing of a higher-priority event takes precedence over servicing of a lower-priority event. The controller provides support for five different types of events: • Emulation – An emulation event causes the processor to enter emulation mode, allowing command and control of the processor via the JTAG interface. • Reset – This event resets the processor. • Nonmaskable Interrupt (NMI) – The NMI event can be generated either by the software watchdog timer, by the NMI input signal to the processor, or by software. The NMI event is frequently used as a power-down indicator to initiate an orderly shutdown of the system. • Exceptions – Events that occur synchronously to program flow (in other words, the exception is taken before the instruction is allowed to complete). Conditions such as data alignment violations and undefined instructions cause exceptions. • Interrupts – Events that occur asynchronously to program flow. They are caused by input signals, timers, and other peripherals, as well as by an explicit software instruction. Priority (0 is Highest) 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 EVT Entry EMU RST NMI EVX — IVHW IVTMR IVG7 IVG8 IVG9 IVG10 IVG11 IVG12 IVG13 IVG14 IVG15 System Interrupt Controller (SIC) The system interrupt controller provides the mapping and routing of events from the many peripheral interrupt sources to the prioritized general-purpose interrupt inputs of the CEC. Although the processor provides a default mapping, the user can alter the mappings and priorities of interrupt events by writing the appropriate values into the interrupt assignment registers (SIC_IARx). Table 3 describes the inputs into the SIC and the default mappings into the CEC. Each event type has an associated register to hold the return address and an associated return-from-event instruction. When an event is triggered, an interrupt service routine (ISR) must save the state of the processor to the supervisor stack. The processor event controller consists of two stages: the core event controller (CEC) and the system interrupt controller (SIC). The core event controller works with the system interrupt controller to prioritize and control all system events. Conceptually, interrupts from the peripherals enter into the SIC and are then routed directly into the general-purpose interrupts of the CEC. Core Event Controller (CEC) The CEC supports nine general-purpose interrupts (IVG15–7), in addition to the dedicated interrupt and exception events. Of these general-purpose interrupts, the two lowest-priority interrupts (IVG15–14) are recommended to be reserved for software interrupt handlers, leaving seven prioritized interrupt inputs to support the peripherals of the processor. Table 2 describes the inputs to the CEC, identifies their names in the event vector table (EVT), and lists their priorities. Rev. PrC Event Class Emulation/Test Control Reset Nonmaskable Interrupt Exception Reserved Hardware Error Core Timer General-Purpose Interrupt 7 General-Purpose Interrupt 8 General-Purpose Interrupt 9 General-Purpose Interrupt 10 General-Purpose Interrupt 11 General-Purpose Interrupt 12 General-Purpose Interrupt 13 General-Purpose Interrupt 14 General-Purpose Interrupt 15 | Page 6 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Table 3. System Interrupt Controller (SIC) Peripheral Interrupt Source General Purpose Interrupt (at Reset) Peripheral Interrupt ID Default Core Interrupt ID SIC Registers PLL Wakeup Interrupt IVG7 0 0 IAR0 IMASK0, ISR0, IWR0 DMA Error (generic) IVG7 1 0 IAR0 IMASK0, ISR0, IWR0 PPI Status IVG7 2 0 IAR0 IMASK0, ISR0, IWR0 SPORT0 Status IVG7 3 0 IAR0 IMASK0, ISR0, IWR0 SPORT1 Status IVG7 4 0 IAR0 IMASK0, ISR0, IWR0 UART0 Status IVG7 5 0 IAR0 IMASK0, ISR0, IWR0 UART1 Status IVG7 6 0 IAR0 IMASK0, ISR0, IWR0 SPI0 Status IVG7 7 0 IAR0 IMASK0, ISR0, IWR0 SPI1 Status IVG7 8 0 IAR1 IMASK0, ISR0, IWR0 CAN Status IVG7 9 0 IAR1 IMASK0, ISR0, IWR0 RSI Mask 0 Interrupt IVG7 10 0 IAR1 IMASK0, ISR0, IWR0 – 11 – IAR1 IMASK0, ISR0, IWR0 CNT0 Interrupt IVG8 12 1 IAR1 IMASK0, ISR0, IWR0 CNT1 Interrupt IVG8 13 1 IAR1 IMASK0, ISR0, IWR0 DMA Channel 0 (PPI Rx/Tx) IVG9 14 2 IAR1 IMASK0, ISR0, IWR0 DMA Channel 1 (RSI Rx/Tx) IVG9 15 2 IAR1 IMASK0, ISR0, IWR0 Reserved DMA Channel 2 (SPORT0 Rx) IVG9 16 2 IAR2 IMASK0, ISR0, IWR0 DMA Channel 3 (SPORT0 Tx) IVG9 17 2 IAR2 IMASK0, ISR0, IWR0 DMA Channel 4 (SPORT1 Rx) IVG9 18 2 IAR2 IMASK0, ISR0, IWR0 DMA Channel 5 (SPORT1 Tx) IVG9 19 2 IAR2 IMASK0, ISR0, IWR0 DMA Channel 6 (SPI0 Rx/Tx) IVG10 20 3 IAR2 IMASK0, ISR0, IWR0 DMA Channel 7 (SPI1 Rx/Tx) IVG10 21 3 IAR2 IMASK0, ISR0, IWR0 DMA Channel 8 (UART0 Rx) IVG10 22 3 IAR2 IMASK0, ISR0, IWR0 DMA Channel 9 (UART0 Tx) IVG10 23 3 IAR2 IMASK0, ISR0, IWR0 DMA Channel 10 (UART1 Rx) IVG10 24 3 IAR3 IMASK0, ISR0, IWR0 DMA Channel 11 (UART1 Tx) IVG10 25 3 IAR3 IMASK0, ISR0, IWR0 CAN Receive IVG11 26 4 IAR3 IMASK0, ISR0, IWR0 CAN Transmit IVG11 27 4 IAR3 IMASK0, ISR0, IWR0 TWI IVG11 28 4 IAR3 IMASK0, ISR0, IWR0 Port F Interrupt A IVG11 29 4 IAR3 IMASK0, ISR0, IWR0 Port F Interrupt B IVG11 30 4 IAR3 IMASK0, ISR0, IWR0 – 31 – IAR3 IMASK0, ISR0, IWR0 Timer 0 IVG12 32 5 IAR4 IMASK1, ISR1, IWR1 Timer 1 IVG12 33 5 IAR4 IMASK1, ISR1, IWR1 Timer 2 IVG12 34 5 IAR4 IMASK1, ISR1, IWR1 Timer 3 IVG12 35 5 IAR4 IMASK1, ISR1, IWR1 Timer 4 IVG12 36 5 IAR4 IMASK1, ISR1, IWR1 Timer 5 IVG12 37 5 IAR4 IMASK1, ISR1, IWR1 Timer 6 IVG12 38 5 IAR4 IMASK1, ISR1, IWR1 Timer 7 IVG12 39 5 IAR4 IMASK1, ISR1, IWR1 Port G Interrupt A IVG12 40 5 IAR5 IMASK1, ISR1, IWR1 Reserved Rev. PrC | Page 7 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 3. System Interrupt Controller (SIC) (Continued) General Purpose Interrupt (at Reset) Peripheral Interrupt ID Default Core Interrupt ID Port G Interrupt B IVG12 41 5 IAR5 IMASK1, ISR1, IWR1 MDMA Stream 0 IVG13 42 6 IAR5 IMASK1, ISR1, IWR1 Peripheral Interrupt Source SIC Registers MDMA Stream 1 IVG13 43 6 IAR5 IMASK1, ISR1, IWR1 Software Watchdog Timer IVG13 44 6 IAR5 IMASK1, ISR1, IWR1 Port H Interrupt A IVG13 45 6 IAR5 IMASK1, ISR1, IWR1 Port H Interrupt B IVG13 46 6 IAR5 IMASK1, ISR1, IWR1 ACM Status Interrupt IVG7 47 0 IAR5 IMASK1, ISR1, IWR1 ACM Interrupt IVG10 48 3 IAR6 IMASK1, ISR1, IWR1 Reserved – 49 – IAR6 IMASK1, ISR1, IWR1 Reserved – 50 – IAR6 IMASK1, ISR1, IWR1 PWM0 Trip Interrupt IVG10 51 3 IAR6 IMASK1, ISR1, IWR1 PWM0 Sync Interrupt IVG10 52 3 IAR6 IMASK1, ISR1, IWR1 PWM1 Trip Interrupt IVG10 53 3 IAR6 IMASK1, ISR1, IWR1 PWM1 Sync Interrupt IVG10 54 3 IAR6 IMASK1, ISR1, IWR1 RSI Mask 1 Interrupt IVG10 55 3 IAR6 IMASK1, ISR1, IWR1 – 56 through 63 – – IMASK1, ISR1, IWR1 Reserved Event Control The processor provides a very flexible mechanism to control the processing of events. In the CEC, three registers are used to coordinate and control events. Each register is 16 bits wide. • CEC interrupt latch register (ILAT) – Indicates when events have been latched. The appropriate bit is set when the processor has latched the event and is cleared when the event has been accepted into the system. This register is updated automatically by the controller, but it may be written only when its corresponding IMASK bit is cleared. • CEC interrupt mask register (IMASK) – Controls the masking and unmasking of individual events. When a bit is set in the IMASK register, that event is unmasked and is processed by the CEC when asserted. A cleared bit in the IMASK register masks the event, preventing the processor from servicing the event even though the event may be latched in the ILAT register. This register may be read or written while in supervisor mode. (Note that general-purpose interrupts can be globally enabled and disabled with the STI and CLI instructions, respectively.) • CEC interrupt pending register (IPEND) – The IPEND register keeps track of all nested events. A set bit in the IPEND register indicates the event is currently active or nested at some level. This register is updated automatically by the controller but may be read while in supervisor mode. The SIC allows further control of event processing by providing three pairs of 32-bit interrupt control and status registers. Each register contains a bit, corresponding to each of the peripheral interrupt events shown in Table 3 on Page 7. Rev. PrC • SIC interrupt mask registers (SIC_IMASKx) – Control the masking and unmasking of each peripheral interrupt event. When a bit is set in these registers, the corresponding peripheral event is unmasked and is forwarded to the CEC when asserted. A cleared bit in these registers masks the corresponding peripheral event, preventing the event from propagating to the CEC. • SIC interrupt status registers (SIC_ISRx) – As multiple peripherals can be mapped to a single event, these registers allow the software to determine which peripheral event source triggered the interrupt. A set bit indicates that the peripheral is asserting the interrupt, and a cleared bit indicates that the peripheral is not asserting the event. • SIC interrupt wakeup enable registers (SIC_IWRx) – By enabling the corresponding bit in these registers, a peripheral can be configured to wake up the processor, should the core be idled or in sleep mode when the event is generated. For more information, see Dynamic Power Management on Page 13. Because multiple interrupt sources can map to a single generalpurpose interrupt, multiple pulse assertions can occur simultaneously, before or during interrupt processing for an interrupt event already detected on this interrupt input. The IPEND register contents are monitored by the SIC as the interrupt acknowledgement. The appropriate ILAT register bit is set when an interrupt rising edge is detected (detection requires two core clock cycles). The bit is cleared when the respective IPEND register bit is set. The IPEND bit indicates that the event has entered into the processor pipeline. At this point the CEC recognizes and queues the next rising edge event on the corresponding event input. The minimum latency from the rising edge transition of the | Page 8 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F general-purpose interrupt to the IPEND output asserted is three core clock cycles; however, the latency can be much higher, depending on the activity within and the state of the processor. FLASH MEMORY The ADSP-BF504F and ADSP-BF506F processors include an on-chip 32M bit (×16, multiple bank, burst) Flash memory. The features of this memory include: • Synchronous/asynchronous read The 2-D DMA capability supports arbitrary row and column sizes up to 64K elements by 64K elements, and arbitrary row and column step sizes up to ±32K elements. Furthermore, the column step size can be less than the row step size, allowing implementation of interleaved data streams. This feature is especially useful in video applications where data can be deinterleaved on the fly. Examples of DMA types supported by the processor DMA controller include: • Synchronous burst read mode: 50 MHz • A single, linear buffer that stops upon completion • Asynchronous/synchronous read mode • A circular, auto-refreshing buffer that interrupts on each full or fractionally full buffer • Random access times: 70 ns • 1-D or 2-D DMA using a linked list of descriptors • Synchronous burst read suspend • 2-D DMA using an array of descriptors, specifying only the base DMA address within a common page • Memory blocks • Multiple bank memory array: 4 Mbit banks In addition to the dedicated peripheral DMA channels, there are two memory DMA channels, which are provided for transfers between the various memories of the processor system with minimal processor intervention. Memory DMA transfers can be controlled by a very flexible descriptor-based methodology or by a standard register-based autobuffer mechanism. • Parameter blocks (top location) • Dual operations • Program erase in one bank while read in others • No delay between read and write operations • Block locking WATCHDOG TIMER • All blocks locked at power-up • Any combination of blocks can be locked or locked down • Security • 128-bit user programmable OTP cells • 64-bit unique device number • Common Flash interface (CFI) • 100 000 program/erase cycles per block Flash memory ships from the factory in an erased state except for block 0 of the parameter bank. Block 0 of the Flash memory parameter bank ships from the factory in an unknown state. An erase operation should be performed prior to programming this block. DMA CONTROLLERS The processor has multiple, independent DMA channels that support automated data transfers with minimal overhead for the processor core. DMA transfers can occur between the processor’s internal memories and any of its DMA-capable peripherals. Additionally, DMA transfers can be accomplished between any of the DMA-capable peripherals and external devices connected to the external memory interface. DMAcapable peripherals include the SPORTs, SPI ports, UARTs, RSI, and PPI. Each individual DMA-capable peripheral has at least one dedicated DMA channel. The processor DMA controller supports both one-dimensional (1-D) and two-dimensional (2-D) DMA transfers. DMA transfer initialization can be implemented from registers or from sets of parameters called descriptor blocks. Rev. PrC The processor includes a 32-bit timer that can be used to implement a software watchdog function. A software watchdog can improve system availability by forcing the processor to a known state through generation of a core and system reset, nonmaskable interrupt (NMI), or general-purpose interrupt, if the timer expires before being reset by software. The programmer initializes the count value of the timer, enables the appropriate interrupt, then enables the timer. Thereafter, the software must reload the counter before it counts to zero from the programmed value. This protects the system from remaining in an unknown state where software, which would normally reset the timer, has stopped running due to an external noise condition or software error. If configured to generate a reset, the watchdog timer resets both the core and the processor peripherals. After a reset, software can determine whether the watchdog was the source of the hardware reset by interrogating a status bit in the watchdog timer control register. The timer is clocked by the system clock (SCLK), at a maximum frequency of fSCLK. TIMERS There are nine general-purpose programmable timer units in the processors. Eight timers have an external pin that can be configured either as a pulse width modulator (PWM) or timer output, as an input to clock the timer, or as a mechanism for measuring pulse widths and periods of external events. These timers can be synchronized: to an external clock input to the several other associated PF pins, to an external clock input to the PPI_CLK input pin, or to the internal SCLK. | Page 9 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data The timer units can be used in conjunction with the two UARTs to measure the width of the pulses in the data stream to provide a software auto-baud detect function for the respective serial channels. The timers can generate interrupts to the processor core providing periodic events for synchronization, either to the system clock or to a count of external signals. In addition to the eight general-purpose programmable timers, a ninth timer is also provided. This extra timer is clocked by the internal processor clock and is typically used as a system tick clock for generation of operating system periodic interrupts. switching patterns for control of the electronically commutated motor (ECM) or brushless dc motor (BDCM). Software can enable a special mode for switched reluctance motors (SRM). The six PWM output signals (per PWM unit) consist of three high-side drive signals (PWMx_AH, PWMx_BH, and PWMx_CH) and three low-side drive signals (PWMx_AL, PWMx_BL, and PWMx_CL). The polarity of the generated PWM signal can be set with software, so that either active HI or active LO PWM patterns can be produced. Two 32-bit up/down counters are provided that can sense 2-bit quadrature or binary codes as typically emitted by industrial drives or manual thumbwheels. The counters can also operate in general-purpose up/down count modes. Then, count direction is either controlled by a level-sensitive input pin or by two edge detectors. The switching frequency of the generated PWM pattern is programmable using the 16-bit PWM_TM register. The PWM generator can operate in single update mode or double update mode. In single update mode, the duty cycle values are programmable only once per PWM period, so that the resultant PWM patterns are symmetrical about the midpoint of the PWM period. In the double update mode, a second updating of the PWM registers is implemented at the midpoint of the PWM period. In this mode, it is possible to produce asymmetrical PWM patterns that produce lower harmonic distortion in 3-phase PWM inverters. A third counter input can provide flexible zero marker support and can alternatively be used to input the push-button signal of thumb wheels. All three pins have a programmable debouncing circuit. Pulses synchronous to the switching frequency can be generated internally and output on the PWMx_SYNC pin. The PWM unit can also accept externally generated synchronization pulses through PWMx_SYNC. Internal signals forwarded to each timer unit enable these timers to measure the intervals between count events. Boundary registers enable auto-zero operation or simple system warning by interrupts when programmable count values are exceeded. Each PWM unit features a dedicated asynchronous shutdown pin, PWMx_TRIP, which (when brought low) instantaneously places all six PWM outputs in the OFF state. 3-PHASE PWM UNITS The processors incorporate two dual-channel synchronous serial ports (SPORT0 and SPORT1) for serial and multiprocessor communications. The SPORTs support the following features: UP/DOWN COUNTERS AND THUMBWHEEL INTERFACES The two/dual 3-phase PWM generation units each feature: • 16-bit center-based PWM generation unit SERIAL PORTS • Programmable PWM pulse width • I2S capable operation. • Single/double update modes • Bidirectional operation – Each SPORT has two sets of independent transmit and receive pins, enabling eight channels of I2S stereo audio. • Programmable dead time and switching frequency • Twos-complement implementation which permits smooth transition to full ON and full OFF states • Possibility to synchronize the PWM generation to either externally-generated or internally-generated synchronization pulses • Special provisions for BDCM operation (crossover and output enable functions) • Wide variety of special switched reluctance (SR) operating modes • Output polarity and clock gating control • Dedicated asynchronous PWM shutdown signal Each PWM block integrates a flexible and programmable 3-phase PWM waveform generator that can be programmed to generate the required switching patterns to drive a 3-phase voltage source inverter for ac induction motor (ACIM) or permanent magnet synchronous motor (PMSM) control. In addition, the PWM block contains special functions that considerably simplify the generation of the required PWM Rev. PrC • Buffered (8-deep) transmit and receive ports – Each port has a data register for transferring data words to and from other processor components and shift registers for shifting data in and out of the data registers. • Clocking – Each transmit and receive port can either use an external serial clock or generate its own, in frequencies ranging from (fSCLK/131,070) Hz to (fSCLK/2) Hz. • Word length – Each SPORT supports serial data words from 3 to 32 bits in length, transferred most-significant-bit first or least-significant-bit first. • Framing – Each transmit and receive port can run with or without frame sync signals for each data word. Frame sync signals can be generated internally or externally, active high or low, and with either of two pulse widths and early or late frame sync. | Page 10 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F • Companding in hardware – Each SPORT can perform A-law or μ-law companding according to ITU recommendation G.711. Companding can be selected on the transmit and/or receive channel of the SPORT without additional latencies. • DMA operations with single-cycle overhead – Each SPORT can automatically receive and transmit multiple buffers of memory data. The processor can link or chain sequences of DMA transfers between a SPORT and memory. • Interrupts – Each transmit and receive port generates an interrupt upon completing the transfer of a data word or after transferring an entire data buffer, or buffers, through DMA. • Multichannel capability – Each SPORT supports 128 channels out of a 1024-channel window and is compatible with the H.100, H.110, MVIP-90, and HMVIP standards. SERIAL PERIPHERAL INTERFACE (SPI) PORTS The ADSP-BF50x processors have two SPI-compatible ports that enable the processor to communicate with multiple SPIcompatible devices. The SPI interface uses three pins for transferring data: two data pins MOSI (Master Output-Slave Input) and MISO (Master Input-Slave Output) and a clock pin, serial clock (SCK). An SPI chip select input pin (SPIx_SS) lets other SPI devices select the processor, and three SPI chip select output pins (SPIx_SEL3–1) let the processor select other SPI devices. The SPI select pins are reconfigured general-purpose I/O pins. Using these pins, the SPI port provides a full-duplex, synchronous serial interface, which supports both master/slave modes and multimaster environments. The SPI port’s baud rate and clock phase/polarities are programmable, and it has an integrated DMA channel, configurable to support transmit or receive data streams. The SPI’s DMA channel can only service unidirectional accesses at any given time. The SPI port’s clock rate is calculated as: f SCLK SPI Clock Rate = -----------------------------------2 × SPI_BAUD Where the 16-bit SPI_BAUD register contains a value of 2 to 65,535. During transfers, the SPI port simultaneously transmits and receives by serially shifting data in and out on its two serial data lines. The serial clock line synchronizes the shifting and sampling of data on the two serial data lines. UART PORTS (UARTS) The ADSP-BF50x Blackfin processors provide two full-duplex universal asynchronous receiver/transmitter (UART) ports. Each UART port provides a simplified UART interface to other peripherals or hosts, enabling full-duplex, DMA-supported, asynchronous transfers of serial data. A UART port includes Rev. PrC support for five to eight data bits, one or two stop bits, and none, even, or odd parity. Each UART port supports two modes of operation: • PIO (programmed I/O). The processor sends or receives data by writing or reading I/O-mapped UART registers. The data is double-buffered on both transmit and receive. • DMA (direct memory access). The DMA controller transfers both transmit and receive data. This reduces the number and frequency of interrupts required to transfer data to and from memory. Each UART has two dedicated DMA channels, one for transmit and one for receive. These DMA channels have lower default priority than most DMA channels because of their relatively low service rates. Flexible interrupt timing options are available on the transmit side. Each UART port’s baud rate, serial data format, error code generation and status, and interrupts are programmable: • Supporting bit rates ranging from (fSCLK/1,048,576) to (fSCLK) bits per second. • Supporting data formats from 7 to 12 bits per frame. • Both transmit and receive operations can be configured to generate maskable interrupts to the processor. The UART port’s clock rate is calculated as f SCLK UART Clock Rate = -----------------------------------------------------------------------( 1 – EDBO ) 16 × UART_Divisor Where the 16-bit UART divisor comes from the UARTx_DLH register (most significant 8 bits) and UARTx_DLL register (least significant eight bits), and the EDBO is a bit in the UARTx_GCTL register. In conjunction with the general-purpose timer functions, autobaud detection is supported. The UARTs feature a pair of UAx_RTS (request to send) and UAx_CTS (clear to send) signals for hardware flow purposes. The transmitter hardware is automatically prevented from sending further data when the UAx_CTS input is de-asserted. The receiver can automatically de-assert its UAx_RTS output when the enhanced receive FIFO exceeds a certain high-water level. The capabilities of the UARTs are further extended with support for the Infrared Data Association (IrDA®) Serial Infrared Physical Layer Link Specification (SIR) protocol. PARALLEL PERIPHERAL INTERFACE (PPI) The processor provides a parallel peripheral interface (PPI) that can connect directly to parallel A/D and D/A converters, video encoders and decoders, and other general-purpose peripherals. The PPI consists of a dedicated input clock pin, up to three frame synchronization pins, and up to 16 data pins. The input clock supports parallel data rates up to half the system clock rate and the synchronization signals can be configured as either inputs or outputs. | Page 11 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data The PPI supports a variety of general-purpose and ITU-R 656 modes of operation. In general-purpose mode, the PPI provides half-duplex, bidirectional data transfer with up to 16 bits of data. Up to three frame synchronization signals are also provided. In ITU-R 656 mode, the PPI provides half-duplex bidirectional transfer of 8- or 10-bit video data. Additionally, on-chip decode of embedded start-of-line (SOL) and start-offield (SOF) preamble packets is supported. video (EAV) and start of active video (SAV) preamble symbols, or any data present during the vertical blanking intervals. In this mode, the control byte sequences are not stored to memory; they are filtered by the PPI. After synchronizing to the start of Field 1, the PPI ignores incoming samples until it sees an SAV code. The user specifies the number of active video lines per frame (in PPI_COUNT register). General-Purpose Mode Descriptions In this mode, the PPI only transfers vertical blanking interval (VBI) data. The general-purpose modes of the PPI are intended to suit a wide variety of data capture and transmission applications. Three distinct submodes are supported: • Input mode – Frame syncs and data are inputs into the PPI. • Frame capture mode – Frame syncs are outputs from the PPI, but data are inputs. • Output mode – Frame syncs and data are outputs from the PPI. Input Mode Input mode is intended for ADC applications, as well as video communication with hardware signaling. In its simplest form, PPI_FS1 is an external frame sync input that controls when to read data. The PPI_DELAY MMR allows for a delay (in PPI_CLK cycles) between reception of this frame sync and the initiation of data reads. The number of input data samples is user programmable and defined by the contents of the PPI_COUNT register. The PPI supports 8-bit and 10-bit through 16-bit data, programmable in the PPI_CONTROL register. Vertical Blanking Interval Mode Entire Field Mode In this mode, the entire incoming bit stream is read in through the PPI. This includes active video, control preamble sequences, and ancillary data that may be embedded in horizontal and vertical blanking intervals. Data transfer starts immediately after synchronization to Field 1. Data is transferred to or from the synchronous channels through eight DMA engines that work autonomously from the processor core. RSI INTERFACE The removable storage interface (RSI) controller acts as the host interface for multimedia cards (MMC), secure digital memory cards (SD), secure digital input/output cards (SDIO), and CEATA hard disk drives. The following list describes the main features of the RSI controller. • Support for a single MMC, SD memory, SDIO card or CEATA hard disk drive • Support for 1-bit and 4-bit SD modes • Support for 1-bit, 4-bit, and 8-bit MMC modes Frame Capture Mode • Support for 4-bit and 8-bit CE-ATA hard disk drives Frame capture mode allows the video source(s) to act as a slave (for frame capture for example). The ADSP-BF50x processors control when to read from the video source(s). PPI_FS1 is an HSYNC output and PPI_FS2 is a VSYNC output. • A ten-signal external interface with clock, command, and up to eight data lines Output Mode • Card interface clock generation from SCLK Output mode is used for transmitting video or other data with up to three output frame syncs. Typically, a single frame sync is appropriate for data converter applications, whereas two or three frame syncs could be used for sending video with hardware signaling. • SDIO interrupt and read wait features ITU-R 656 Mode Descriptions The ITU-R 656 modes of the PPI are intended to suit a wide variety of video capture, processing, and transmission applications. Three distinct submodes are supported: • Active video only mode • Vertical blanking only mode • Entire field mode Active Video Mode Active video only mode is used when only the active video portion of a field is of interest and not any of the blanking intervals. The PPI does not read in any data between the end of active Rev. PrC • Card detection using one of the data signals • CE-ATA command completion signal recognition and disable CONTROLLER AREA NETWORK (CAN) INTERFACE The ADSP-BF50x processors provide a CAN controller that is a communication controller implementing the Controller Area Network (CAN) V2.0B protocol. This protocol is an asynchronous communications protocol used in both industrial and automotive control systems. CAN is well suited for control applications due to its capability to communicate reliably over a network since the protocol incorporates CRC checking, message error tracking, and fault node confinement. The CAN controller is based on a 32-entry mailbox RAM and supports both the standard and extended identifier (ID) message formats specified in the CAN protocol specification, revision 2.0, part B. | Page 12 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Each mailbox consists of eight 16-bit data words. The data is divided into fields, which includes a message identifier, a time stamp, a byte count, up to 8 bytes of data, and several control bits. Each node monitors the messages being passed on the network. If the identifier in the transmitted message matches an identifier in one of its mailboxes, the module knows that the message was meant for it, passes the data into its appropriate mailbox, and signals the processor of message arrival with an interrupt. The CAN controller can wake up the processor from sleep mode upon generation of a wake-up event, such that the processor can be maintained in a low-power mode during idle conditions. Additionally, a CAN wake-up event can wake up the on-chip internal voltage regulator from the powered-down hibernate state. The electrical characteristics of each network connection are very stringent. Therefore, the CAN interface is typically divided into two parts: a controller and a transceiver. This allows a single controller to support different drivers and CAN networks. The ADSP-BF50x CAN module represents the controller part of the interface. This module’s network I/O is a single transmit output and a single receive input, which connect to a line transceiver. The CAN clock is derived from the processor system clock (SCLK) through a programmable divider and therefore does not require an additional crystal. TWI CONTROLLER INTERFACE The processors include a two-wire interface (TWI) module for providing a simple exchange method of control data between multiple devices. The TWI is compatible with the widely used I2C® bus standard. The TWI module offers the capabilities of simultaneous master and slave operation, support for both 7-bit addressing and multimedia data arbitration. The TWI interface utilizes two pins for transferring clock (SCL) and data (SDA) and supports the protocol at speeds up to 400K bits/sec. The TWI interface pins are compatible with 5 V logic levels. Additionally, the TWI module is fully compatible with serial camera control bus (SCCB) functionality for easier control of various CMOS camera sensor devices. PORTS Because of the rich set of peripherals, the processor groups the many peripheral signals to three ports—Port F, Port G, and Port H. Most of the associated pins are shared by multiple signals. The ports function as multiplexer controls. General-Purpose I/O (GPIO) The processor has 35 bidirectional, general-purpose I/O (GPIO) pins allocated across three separate GPIO modules—PORTFIO, PORTGIO, and PORTHIO, associated with Port F, Port G, and Port H, respectively. Each GPIO-capable pin shares functionality with other processor peripherals via a multiplexing scheme; however, the GPIO functionality is the default state of the device upon power-up. Neither GPIO output nor input drivers are Rev. PrC active by default. Each general-purpose port pin can be individually controlled by manipulation of the port control, status, and interrupt registers: • GPIO direction control register – Specifies the direction of each individual GPIO pin as input or output. • GPIO control and status registers – The processor employs a “write one to modify” mechanism that allows any combination of individual GPIO pins to be modified in a single instruction, without affecting the level of any other GPIO pins. Four control registers are provided. One register is written in order to set pin values, one register is written in order to clear pin values, one register is written in order to toggle pin values, and one register is written in order to specify a pin value. Reading the GPIO status register allows software to interrogate the sense of the pins. • GPIO interrupt mask registers – The two GPIO interrupt mask registers allow each individual GPIO pin to function as an interrupt to the processor. Similar to the two GPIO control registers that are used to set and clear individual pin values, one GPIO interrupt mask register sets bits to enable interrupt function, and the other GPIO interrupt mask register clears bits to disable interrupt function. GPIO pins defined as inputs can be configured to generate hardware interrupts, while output pins can be triggered by software interrupts. • GPIO interrupt sensitivity registers – The two GPIO interrupt sensitivity registers specify whether individual pins are level- or edge-sensitive and specify—if edge-sensitive— whether just the rising edge or both the rising and falling edges of the signal are significant. One register selects the type of sensitivity, and one register selects which edges are significant for edge-sensitivity. DYNAMIC POWER MANAGEMENT The processor provides five operating modes, each with a different performance/power profile. In addition, dynamic power management provides the control functions to dynamically alter the processor core supply voltage, further reducing power dissipation. When configured for a 0 volt core supply voltage, the processor enters the hibernate state. Control of clocking to each of the processor peripherals also reduces power consumption. See Table 4 for a summary of the power settings for each mode. Full-On Operating Mode—Maximum Performance In the full-on mode, the PLL is enabled and is not bypassed, providing capability for maximum operational frequency. This is the power-up default execution state in which maximum performance can be achieved. The processor core and all enabled peripherals run at full speed. Active Operating Mode—Moderate Dynamic Power Savings In the active mode, the PLL is enabled but bypassed. Because the PLL is bypassed, the processor’s core clock (CCLK) and system clock (SCLK) run at the input clock (CLKIN) frequency. DMA access is available to appropriately configured L1 memories. | Page 13 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data In the active mode, it is possible to disable the control input to the PLL by setting the PLL_OFF bit in the PLL control register. This register can be accessed with a user-callable routine in the on-chip ROM called bfrom_SysControl(). If disabled, the PLL control input must be re-enabled before transitioning to the full-on or sleep modes. Table 4. Power Settings Core PLL Clock Mode/State PLL Bypassed (CCLK) Full On Enabled No Enabled Active Enabled/ Yes Enabled Disabled Sleep Enabled — Disabled Deep Sleep Disabled — Disabled Hibernate Disabled — Disabled System Clock (SCLK) Enabled Enabled Core Power On On Enabled On Disabled On Disabled Off For more information about PLL controls, see the “Dynamic Power Management” chapter in the ADSP-BF50x Blackfin Processor Hardware Reference. Sleep Operating Mode—High Dynamic Power Savings The sleep mode reduces dynamic power dissipation by disabling the clock to the processor core (CCLK). The PLL and system clock (SCLK), however, continue to operate in this mode. Typically, an external event wakes up the processor. When in the sleep mode, asserting a wakeup enabled in the SIC_IWRx registers causes the processor to sense the value of the BYPASS bit in the PLL control register (PLL_CTL). If BYPASS is disabled, the processor transitions to the full on mode. If BYPASS is enabled, the processor transitions to the active mode. Writing 0 to the HIBERNATE bit causes EXT_WAKE to transition low, which can be used to signal an external voltage regulator to shut down. Since VDDEXT can still be supplied in this mode, all of the external pins three-state, unless otherwise specified. This allows other devices that may be connected to the processor to still have power applied without drawing unwanted current. The processor can be woken up by asserting the RESET pin. All hibernate wakeup events initiate the hardware reset sequence. Individual sources are enabled by the VR_CTL register. The EXT_WAKE signal indicates the occurrence of a wakeup event. As long as VDDEXT is applied, the VR_CTL register maintains its state during hibernation. All other internal registers and memories, however, lose their content in the hibernate state. Power Savings As shown in Table 5, the processor supports three different power domains, which maximizes flexibility while maintaining compliance with industry standards and conventions. By isolating the internal logic of the processor into its own power domain, separate from other I/O, the processor can take advantage of dynamic power management without affecting the other I/O devices. There are no sequencing requirements for the various power domains, but all domains must be powered according to the appropriate Processor — Specifications table for processor operating conditions; even if the feature/peripheral is not used. Table 5. Power Domains Power Domain All internal logic, except Memory Flash Memory All other I/O ADC digital supply1 (Logic, I/O) ADC analog supply1 DMA accesses to L1 memory are not supported in sleep mode. Deep Sleep Operating Mode—Maximum Dynamic Power Savings The deep sleep mode maximizes dynamic power savings by disabling the clocks to the processor core (CCLK) and to all synchronous peripherals (SCLK). Asynchronous peripherals may still be running but cannot access internal resources or external memory. This powered-down mode can only be exited by assertion of the reset pin (RESET). Assertion of RESET while in deep sleep mode causes the processor to transition to the full on mode. Hibernate State—Maximum Static Power Savings The hibernate state maximizes static power savings by disabling the voltage and clocks to the processor core (CCLK) and to all of the peripherals (SCLK). This setting sets the internal power supply voltage (VDDINT) to 0 V to provide the lowest static power dissipation. Any critical information stored internally (for example, memory contents, register contents, and other information) must be written to a non-volatile storage device prior to removing power if the processor state is to be preserved. Rev. PrC 1 Power Supply VDDINT VDDFLASH VDDEXT DVDD, VDRIVE AVDD On ADSP-BF506F processor only. The dynamic power management feature of the processor allows both the processor’s input voltage (VDDINT) and clock frequency (fCCLK) to be dynamically controlled. The power dissipated by a processor is largely a function of its clock frequency and the square of the operating voltage. For example, reducing the clock frequency by 25% results in a 25% reduction in dynamic power dissipation, while reducing the voltage by 25% reduces dynamic power dissipation by more than 40%. Further, these power savings are additive, in that if the clock frequency and supply voltage are both reduced, the power savings can be dramatic, as shown in the following equations. Power Savings Factor T RED f CCLKRED V DDINTRED 2 = -------------------------- × -------------------------------- × --------------- f CCLKNOM V DDINTNOM T NOM | Page 14 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F specified by the crystal manufacturer. The user should verify the customized values based on careful investigations on multiple devices over temperature range. % Power Savings = ( 1 – Power Savings Factor ) × 100% where the variables in the equations are: A third-overtone crystal can be used for frequencies above 25 MHz. The circuit is then modified to ensure crystal operation only at the third overtone, by adding a tuned inductor circuit as shown in Figure 4. A design procedure for third-overtone operation is discussed in detail in application note (EE-168) Using Third Overtone Crystals with the ADSP-218x DSP on the Analog Devices website (www.analog.com)—use site search on “EE-168.” fCCLKNOM is the nominal core clock frequency fCCLKRED is the reduced core clock frequency VDDINTNOM is the nominal internal supply voltage VDDINTRED is the reduced internal supply voltage TNOM is the duration running at fCCLKNOM TRED is the duration running at fCCLKRED ADSP-BF50X VOLTAGE REGULATION The ADSP-BF50x processors require an external voltage regulator to power the VDDINT domain. To reduce standby power consumption, the external voltage regulator can be signaled through EXT_WAKE to remove power from the processor core. This signal is high-true for power-up and may be connected directly to the low-true shut-down input of many common regulators. While in the hibernate state, all external supplies (VDDEXT, VDDFLASH) can still be applied, eliminating the need for external buffers. The external voltage regulator can be activated from this power down state by asserting the RESET pin, which then initiates a boot sequence. EXT_WAKE indicates a wakeup to the external voltage regulator. The power good (PG) input signal allows the processor to start only after the internal voltage has reached a chosen level. In this way, the startup time of the external regulator is detected after hibernation. For a complete description of the power good functionality, refer to the ADSP-BF50x Blackfin Processor Hardware Reference. The Blackfin core runs at a different clock rate than the on-chip peripherals. As shown in Figure 5, the core clock (CCLK) and system peripheral clock (SCLK) are derived from the input clock (CLKIN) signal. An on-chip PLL is capable of multiplying the CLKIN signal by a programmable multiplication factor (bounded by specified minimum and maximum VCO frequencies). The default multiplier is 6×, but it can be modified by a software instruction sequence. BLACKFIN CLKOUT (SCLK) CLKBUF TO PLL CIRCUITRY EN EN SELECT 560 ⍀ EXTCLK 330 ⍀* CLOCK SIGNALS 18 pF * The processor can be clocked by an external crystal, a sine wave input, or a buffered, shaped clock derived from an external clock oscillator. If an external clock is used, it should be a TTL-compatible signal and must not be halted, changed, or operated below the specified frequency during normal operation. This signal is connected to the processor’s CLKIN pin. When an external clock is used, the XTAL pin must be left unconnected. Alternatively, because the processor includes an on-chip oscillator circuit, an external crystal may be used. For fundamental frequency operation, use the circuit shown in Figure 4. A parallel-resonant, fundamental frequency, microprocessor-grade crystal is connected across the CLKIN and XTAL pins. The onchip resistance between CLKIN and the XTAL pin is in the 500 kΩ range. Further parallel resistors are typically not recommended. The two capacitors and the series resistor shown in Figure 4 fine tune phase and amplitude of the sine frequency. FOR OVERTONE OPERATION ONLY: 18 pF * NOTE: VALUES MARKED WITH * MUST BE CUSTOMIZED, DEPENDING ON THE CRYSTAL AND LAYOUT. PLEASE ANALYZE CAREFULLY. FOR FREQUENCIES ABOVE 33 MHz, THE SUGGESTED CAPACITOR VALUE OF 18 pF SHOULD BE TREATED AS A MAXIMUM, AND THE SUGGESTED RESISTOR VALUE SHOULD BE REDUCED TO 0 ⍀. Figure 4. External Crystal Connections On-the-fly frequency changes can be effected by simply writing to the PLL_DIV register. The maximum allowed CCLK and SCLK rates depend on the applied voltages VDDINT and VDDEXT; the VCO is always permitted to run up to the CCLK frequency specified by the part’s speed grade. The EXTCLK pin can be configured to output either the SCLK frequency or the input buffered CLKIN frequency, called CLKBUF. When configured to output SCLK (CLKOUT), the EXTCLK pin acts as a reference signal in many timing specifications. While active by default, it can be disabled using the EBIU_AMGCTL register. The capacitor and resistor values shown in Figure 4 are typical values only. The capacitor values are dependent upon the crystal manufacturers’ load capacitance recommendations and the PCB physical layout. The resistor value depends on the drive level Rev. PrC XTAL CLKIN | Page 15 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F “FINE” ADJUSTMENT REQUIRES PLL SEQUENCING PLL 0.5u to 64u CLKIN Preliminary Technical Data “COARSE” ADJUSTMENT ON-THE-FLY ÷ 1, 2, 4, 8 CCLK ÷ 1 to 15 SCLK VCO BOOTING MODES The processor has several mechanisms (listed in Table 8) for automatically loading internal and external memory after a reset. The boot mode is defined by the BMODE input pins dedicated to this purpose. There are two categories of boot modes. In master boot modes, the processor actively loads data from parallel or serial memories. In slave boot modes, the processor receives data from external host devices. Table 8. Booting Modes SCLK d CCLK BMODE2–0 000 001 010 011 100 101 110 111 Figure 5. Frequency Modification Methods All on-chip peripherals are clocked by the system clock (SCLK). The system clock frequency is programmable by means of the SSEL3–0 bits of the PLL_DIV register. The values programmed into the SSEL fields define a divide ratio between the PLL output (VCO) and the system clock. SCLK divider values are 1 through 15. Table 6 illustrates typical system clock ratios. Note that the divisor ratio must be chosen to limit the system clock frequency to its maximum of fSCLK. The SSEL value can be changed dynamically without any PLL lock latencies by writing the appropriate values to the PLL divisor register (PLL_DIV). Table 6. Example System Clock Ratios Signal Name SSEL3–0 0001 0110 1010 Divider Ratio VCO/SCLK 1:1 6:1 10:1 Example Frequency Ratios (MHz) VCO SCLK 50 50 300 50 400 40 The core clock (CCLK) frequency can also be dynamically changed by means of the CSEL1–0 bits of the PLL_DIV register. Supported CCLK divider ratios are 1, 2, 4, and 8, as shown in Table 7. This programmable core clock capability is useful for fast core frequency modifications. Table 7. Core Clock Ratios Signal Name CSEL1–0 00 01 10 11 Example Frequency Ratios (MHz) Divider Ratio VCO/CCLK VCO CCLK 1:1 300 300 2:1 300 150 4:1 400 100 8:1 200 25 The maximum CCLK frequency both depends on the part’s speed grade (see Page 79) and depends on the applied VDDINT voltage. See Table 14 for details. The maximal system clock rate (SCLK) depends on the applied VDDINT and VDDEXT voltages (see Table 16). Rev. PrC 1 Description Idle/No Boot Boot from internal parallel flash in async mode1 Boot from internal parallel flash in sync mode1 Boot through SPI0 master from SPI memory Boot through SPI0 slave from host device Boot through PPI from host Reserved Boot through UART0 slave from host device This boot mode supported on ADSP-BF504F and ADSP-BF506F processor only. The boot modes listed in Table 8 provide a number of mechanisms for automatically loading the processor’s internal and external memories after a reset. By default, all boot modes use the slowest meaningful configuration settings. Default settings can be altered via the initialization code feature at boot time. Some boot modes require a boot host wait (HWAIT) signal, which is a GPIO output signal that is driven and toggled by the boot kernel at boot time. If pulled high through an external pullup resistor, the HWAIT signal behaves active high and will be driven low when the processor is ready for data. Conversely, when pulled low, HWAIT is driven high when the processor is ready for data. When the boot sequence completes, the HWAIT pin can be used for other purposes. The BMODE pins of the reset configuration register, sampled during power-on resets and software-initiated resets, implement the modes shown in Table 8. • IDLE State / No Boot (BMODE = 0x0) — In this mode, the boot kernel transitions the processor into Idle state. The processor can then be controlled through JTAG for recovery, debug, or other functions. • Boot from stacked parallel flash in 16-bit asynchronous mode (BMODE = 0x1) — In this mode, the boot kernel starts booting from address 0x2000 0000. • Boot from stacked parallel flash in 16-bit synchronous mode (BMODE = 0x2) — In this mode, the boot kernel loads the first block header from address 0x2000 0000. Boot kernel operation from this point is TBD. • Boot from serial SPI memory, EEPROM or flash (BMODE = 0x3) — 8-, 16-, 24-, or 32-bit addressable devices are supported. The processor uses the PF13 GPIO pin to select a single SPI EEPROM/flash device (connected to the SPI0 interface) and submits a read command and successive address bytes (0x00) until a valid 8-, 16-, 24-, or | Page 16 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F 32-bit addressable device is detected. Pull-up resistors are required on the SPI0_SEL1 and MISO pins. By default, a value of 0x85 is written to the SPI_BAUD register. • Boot from SPI host device (BMODE = 0x4) — The processor operates in SPI slave mode and is configured to receive the bytes of the LDR file from an SPI host (master) agent. The HWAIT signal must be interrogated by the host before every transmitted byte. A pull-up resistor is required on the SPI0_SS input. A pull-down on the serial clock (SCK) may improve signal quality and booting robustness. • Boot from PPI host device (BMODE = 0x5) — The processor operates in PPI slave mode and is configured to receive the bytes of the LDR file from a PPI host (master) agent. • Boot from UART0 host on Port G (BMODE = 0x7) — Using an autobaud handshake sequence, a boot-stream formatted program is downloaded by the host. The host selects a bit rate within the UART clocking capabilities. When performing the autobaud detection, the UART expects an “@” (0x40) character (eight bits data, one start bit, one stop bit, no parity bit) on the UA0_RX pin to determine the bit rate. The UART then replies with an acknowledgement composed of 4 bytes (0xBF, the value of UART0_DLL, the value of UART0_DLH, then 0x00). The host can then download the boot stream. The processor deasserts the UA0_RTS output to hold off the host; UA0_CTS functionality is not enabled at boot time. For each of the boot modes, a 16-byte header is first read from an external memory device. The header specifies the number of bytes to be transferred and the memory destination address. Multiple memory blocks may be loaded by any boot sequence. Once all blocks are loaded, program execution commences from the address stored in the EVT1 register. The boot kernel differentiates between a regular hardware reset and a wakeup-from-hibernate event to speed up booting in the later case. Bits 6-4 in the system reset configuration (SYSCR) register can be used to bypass the pre-boot routine and/or boot kernel in case of a software reset. They can also be used to simulate a wakeup-from-hibernate boot in the software reset case. The boot process can be further customized by “initialization code.” This is a piece of code that is loaded and executed prior to the regular application boot. Typically, this is used to speed up booting by managing the PLL, clock frequencies, wait states, or serial bit rates. The boot ROM also features C-callable function that can be called by the user application at run time. This enables secondstage boot or boot management schemes to be implemented with ease. INSTRUCTION SET DESCRIPTION The Blackfin processor family assembly language instruction set employs an algebraic syntax designed for ease of coding and readability. The instructions have been specifically tuned to provide a flexible, densely encoded instruction set that compiles to a very small final memory size. The instruction set also provides fully featured multifunction instructions that allow the pro- Rev. PrC grammer to use many of the processor core resources in a single instruction. Coupled with many features more often seen on microcontrollers, this instruction set is very efficient when compiling C and C++ source code. In addition, the architecture supports both user (algorithm/application code) and supervisor (O/S kernel, device drivers, debuggers, ISRs) modes of operation, allowing multiple levels of access to core processor resources. The assembly language, which takes advantage of the processor’s unique architecture, offers the following advantages: • Seamlessly integrated DSP/MCU features are optimized for both 8-bit and 16-bit operations. • A multi-issue load/store modified-Harvard architecture, which supports two 16-bit MAC or four 8-bit ALU + two load/store + two pointer updates per cycle. • All registers, I/O, and memory are mapped into a unified 4G byte memory space, providing a simplified programming model. • Microcontroller features, such as arbitrary bit and bit-field manipulation, insertion, and extraction; integer operations on 8-, 16-, and 32-bit data-types; and separate user and supervisor stack pointers. • Code density enhancements, which include intermixing of 16-bit and 32-bit instructions (no mode switching, no code segregation). Frequently used instructions are encoded in 16 bits. DEVELOPMENT TOOLS The processor is supported with a complete set of CROSSCORE® software and hardware development tools, including Analog Devices emulators and VisualDSP++® development environment. The same emulator hardware that supports other Blackfin processors also fully emulates the ADSP-BF50x processors. EZ-KIT Lite® Evaluation Board For evaluation of ADSP-BF50x processors, use the EZ-KIT Lite boards soon to be available from Analog Devices. When these evaluation kits are available, order using part number ADZS-BF506-EZLITE. The boards come with on-chip emulation capabilities and is equipped to enable software development. Multiple daughter cards will be available. DESIGNING AN EMULATOR-COMPATIBLE PROCESSOR BOARD (TARGET) The Analog Devices family of emulators are tools that every system developer needs in order to test and debug hardware and software systems. Analog Devices has supplied an IEEE 1149.1 JTAG Test Access Port (TAP) on each JTAG processor. The emulator uses the TAP to access the internal features of the processor, allowing the developer to load code, set breakpoints, observe variables, observe memory, and examine registers. The processor must be halted to send data and commands, but once an operation has been completed by the emulator, the processor system is set running at full speed with no impact on system timing. | Page 17 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data To use these emulators, the target board must include a header that connects the processor’s JTAG port to the emulator. For details on target board design issues including mechanical layout, single processor connections, multiprocessor scan chains, signal buffering, signal termination, and emulator pod logic, see (EE-68) Analog Devices JTAG Emulation Technical Reference on the Analog Devices website (www.analog.com)— use site search on “EE-68.” This document is updated regularly to keep pace with improvements to emulator support. The ADC is integrated into the ADSP-BF506F product. Figure 7 shows how to connect the internal ADC to the ACM and to one of the two SPORTs on the ADSP-BF506F processor. ADSP-BF506F DRxSEC SPORTx DRxPRI RCLKx RFSx ADC AND ACM INTERFACE This section describes the ADC and ACM interface. System designers should also consult the ADSP-BF50x Blackfin Processor Hardware Reference for additional information. ACLK ACM ACM_A[2:0] ACM_SGLDIFF The ADC control module (ACM) provides an interface that synchronizes the controls between the processor and the internal analog-to-digital converter (ADC) module. The ACM is available on the ADSP-BF504, ADSP-BF504F, and ADSP-BF506F processors, and the ADC is available on the ADSP-BF506F processor only. The analog-to-digital conversions are initiated by the processor, based on external or internal events. ACM_RANGE RANGE SGL/DIFF A[2:0] ADC CS (INTERNAL) ADSCLK DOUTA DOUTB The ACM allows for flexible scheduling of sampling instants and provides precise sampling signals to the ADC. The ACM synchronizes the ADC conversion process; generating the ADC controls, the ADC conversion start signal, and other signals. The actual data acquisition from the ADC is done by the SPORT peripherals. The serial interface on the ADC allows the part to be directly connected to the ADSP-BF504, ADSP-BF504F, and ADSP-BF506F processors using serial interface protocols. Figure 6 shows how to connect an external ADC to the ACM and one of the two SPORTs on the ADSP-BF504 or ADSP-BF504F processors. ADSP-BF504/ADSP-BF504F SPORTx DRxSEC DRxPRI RCLKx RFSx ACLK CS ACM_A[2:0] ACM_SGLDIFF ACM_RANGE Figure 7. ADC (Internal), ACM, and SPORT Connections The ADSP-BF504, ADSP-BF504F, and ADSP-BF506F processors interface directly to the ADC without any glue logic required. The availability of secondary receive registers on the serial ports of the Blackfin processors means only one serial port is necessary to read from both DOUT pins simultaneously. Figure 7 (ADC (Internal), ACM, and SPORT Connections) shows both DOUTA and DOUTB of the ADC connected to one of the processor’s serial ports. The SPORTx Receive Configuration 1 register and SPORTx Receive Configuration 2 register should be set up as outlined in Table 9 (The SPORTx Receive Configuration 1 Register (SPORTx_RCR1)) and Table 10 (The SPORTx Receive Configuration 2 Register (SPORTx_RCR2)). Table 9. The SPORTx Receive Configuration 1 Register (SPORTx_RCR1) Setting RCKFE = 1 LRFS = 1 RFSR = 1 IRFS = 0 RLSBIT = 0 RDTYPE = 00 IRCLK = 0 RSPEN = 1 TFSR = RFSR = 1 SPORT SELECT MUX ACM RANGE SGL/DIFF A[2:0] ADC (EXTERNAL) CS SPORT SELECT MUX CS ADSCLK DOUTA DOUTB Figure 6. ADC (External), ACM, and SPORT Connections Rev. PrC | Page 18 of 80 | January 2010 Description Sample data with rising edge of RSCLK Active low frame signal Frame every word External RFS used Receive MSB first Zero fill External receive clock Receive enabled Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F NOTE: The SPORT must be enabled with the following settings: external clock, external frame sync, and active low frame sync. Table 10. The SPORTx Receive Configuration 2 Register (SPORTx_RCR2) Setting RXSE = 1 SLEN = 1111 Description Secondary side enabled 16-bit data-word (or may be set to 1101 for 14-bit data-word) To implement the power-down modes, SLEN should be set to 1001 to issue an 8-bit SCLK burst. A Blackfin driver for the ADC is available to download at www.analog.com. INTERNAL ADC REF SELECT The internal ADC is a dual, 12-bit, high speed, low power, successive approximation ADC that operates from a single 2.7 V to 5.25 V power supply and features throughput rates up to 2 MSPS. The device contains two ADCs, each preceded by a 3-channel multiplexer, and a low noise, wide bandwidth trackand-hold amplifier that can handle input frequencies in excess of 30 MHz. Figure 8 shows the functional block diagram of the internal ADC. The ADC features include: • Dual 12-bit, 3-channel ADC • Throughput rate: up to 2 MSPS REF BUF MUX T/H AVDD DVDD ADC VA1 VA2 VA3 VA4 12-BIT SUCCESSIVE APPROXIMATION ADC OUTPUT DRIVERS VA5 CONTROL LOGIC VB1 VB2 VB4 DOUTA ADSCLK CS RANGE SGL/DIFF A0 A1 A2 VA6 VB3 An ADC is integrated into the ADSP-BF506F product. All ADC signals are connected out to package pins to enable maximum interconnect flexibility in mixed signal applications. DCAPA VDRIVE MUX T/H VB5 12-BIT SUCCESSIVE APPROXIMATION ADC OUTPUT DRIVERS DOUTB VB6 BUF AGND AGND AGND DCAPB DGND DGND Figure 8. ADC (Internal) Functional Block Diagram The internal ADC uses advanced design techniques to achieve very low power dissipation at high throughput rates. The part also offers flexible power/ throughput rate management when operating in normal mode as the quiescent current consumption is so low. The analog input range for the part can be selected to be a 0 V to VREF (or 2 × VREF) range, with either straight binary or twos complement output coding. The internal ADC has an on-chip 2.5 V reference that can be overdriven when an external reference is preferred. • Specified for DVDD and AVDD of 2.7 V to 5.25 V • Pin-configurable analog inputs • 12-channel single-ended inputs Additional highlights of the internal ADC include: or • 6-channel fully differential inputs or • 6-channel pseudo differential inputs • Accurate on-chip voltage reference: 2.5 V • Dual conversion with read 437.5 ns, 32 MHz ADSCLK • High speed serial interface • High Throughput with Low Power Consumption • SPI®-/QSPITM-/MICROWIRETM-/DSP-compatible • The internal ADC offers both a standard 0 V to VREF input range and a 2 × VREF input range. • Low power shutdown mode The conversion process and data acquisition use standard control inputs allowing easy interfacing to microprocessors or DSPs. The input signal is sampled on the falling edge of CS; conversion is also initiated at this point. The conversion time is determined by the ADSCLK frequency. There are no pipelined delays associated with the part. Rev. PrC • Two Complete ADC Functions Allow Simultaneous Sampling and Conversion of Two Channels — Each ADC has three fully/pseudo differential pairs, or six single-ended channels, as programmed. The conversion result of both channels is simultaneously available on separate data lines, or in succession on one data line if only one serial connection is available. • No Pipeline Delay — The part features two standard successive approximation ADCs with accurate control of the sampling instant via a CS input and once off conversion control. | Page 19 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data ADC APPLICATION HINTS The following sections provide application hints for using the ADC. Grounding and Layout Considerations The analog and digital supplies to the ADC are independent and separately pinned out to minimize coupling between the analog and digital sections of the device. The printed circuit board (PCB) that houses the ADC should be designed so that the analog and digital sections are separated and confined to certain areas of the board. This design facilitates the use of ground planes that can be easily separated. To provide optimum shielding for ground planes, a minimum etch technique is generally best. All AGND pins should be sunk in the AGND plane. Digital and analog ground planes should be joined in only one place. If the ADC is in a system where multiple devices require an AGND to DGND connection, the connection should still be made at one point only, a star ground point that should be established as close as possible to the ground pins on the ADC. Avoid running digital lines under the device as this couples noise onto the die. Avoid running digital lines in the area of the AGND pad as this couples noise onto the ADC die and into the AGND plane. The power supply lines to the ADC should use as large a trace as possible to provide low impedance paths and reduce the effects of glitches on the power supply line. To avoid radiating noise to other sections of the board, fast switching signals, such as clocks, should be shielded with digital ground, and clock signals should never run near the analog inputs. Avoid crossover of digital and analog signals. To reduce the effects of feed through within the board, traces on opposite sides of the board should run at right angles to each other. Good decoupling is also important. All analog supplies should be decoupled with 10 μF tantalum capacitors in parallel with 0.1 μF capacitors to GND. To achieve the best results from these decoupling components, they must be placed as close as possible to the device, ideally right up against the device. The 0.1 μF capacitors should have low effective series resistance (ESR) and effective series inductance (ESI), such as the common ceramic types or surface-mount types. These low ESR and ESI capacitors provide a low impedance path to ground at high frequencies to handle transient currents due to internal logic switching. RELATED DOCUMENTS The following publications that describe the ADSP-BF50x processors (and related processors) can be ordered from any Analog Devices sales office or accessed electronically on our website: • Getting Started With Blackfin Processors • ADSP-BF50x Blackfin Processor Hardware Reference (volumes 1 and 2) • Blackfin Processor Programming Reference • ADSP-BF50x Blackfin Processor Anomaly List Rev. PrC | Page 20 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F SIGNAL DESCRIPTIONS Signal definitions for the ADSP-BF50x processors are listed in Table 11. All pins for the ADC (ADSP-BF506F processor only) are listed in Table 12. hibernate, all signals are three-stated with the following exceptions: EXT_WAKE is driven low and XTAL is driven to a solid logic level. In order to maintain maximum function and reduce package size and pin count, some pins have multiple, multiplexed functions. In cases where pin function is reconfigurable, the default state is shown in plain text, while the alternate functions are shown in italics. During and immediately after reset, all I/O pins have their input buffers disabled until enabled by user software with the exception of the pins that need pull-ups or pull-downs, as noted in Table 11. During and immediately after reset, all processor signals (not ADC signals) are three-stated with the following exceptions: EXT_WAKE is driven high and XTAL is driven in conjunction with CLKIN to create a crystal oscillator circuit. During Adding a parallel termination to CLKOUT may prove useful in further enhancing signal integrity. Be sure to verify overshoot/undershoot and signal integrity specifications on actual hardware. Table 11. Processor — Signal Descriptions Signal Name Port F: GPIO and Multiplexed Peripherals PF0/TSCLK0/UA0_RX/TMR6/CUD0 PF1/RSCLK0/UA0_TX/TMR5/CDG0 PF2/DT0PRI/PWM0_BH/PPI_D8/CZM0 PF3/TFS0/PWM0_BL/PPI_D9/CDG0 PF4/RFS0/PWM0_CH/PPI_D10/TACLK0 PF5/DR0PRI/PWM0_CL/PPI_D11/TACLK1 PF6/UA1_TX/PWM0_TRIP/PPI_D12 PF7/UA1_RX/PWM0_SYNC/PPI_D13/TACI3 PF8/UA1_RTS/DT0SEC/PPI_D7 PF9/UA1_CTS/DR0SEC/PPI_D6/CZM0 PF10/SPI0_SCK/TMR2/PPI_D5 PF11/SPI0_MISO/PWM0_TRIP/PPI_D4/TACLK2 PF12/SPI0_MOSI/PWM0_SYNC/PPI_D3 PF13/SPI0_SEL1/TMR3/PPI_D2/SPI0_SS PF14/SPI0_SEL2/PWM0_AH/PPI_D1 PF15/SPI0_SEL3/PWM0_AL/PPI_D0 Port G: GPIO and Multiplexed Peripherals PG0/SPI1_SEL3/TMRCLK/PPI_CLK/UA1_RX/TACI4 PG1/SPI1_SEL2/PPI_FS3/CAN_RX/TACI5 PG2/SPI1_SEL1/TMR4/CAN_TX/SPI1_SS PG3/HWAIT/SPI1_SCK/DT1SEC/UA1_TX PG4/SPI1_MOSI/DR1SEC/PWM1_SYNC/TACLK6 PG5/SPI1_MISO/TMR7/PWM1_TRIP PG6/ACM_SGLDIFF/SD_D3/PWM1_AH PG7/ACM_RANGE/SD_D2/PWM1_AL PG8/DR1SEC/SD_D1/PWM1_BH PG9/DR1PRI/SD_D0/PWM1_BL PG10/RFS1/SD_CMD/PWM1_CH/TACI6 PG11/RSCLK1/SD_CLK/PWM1_CL/TACLK7 PG12/UA0_RX/SD_D4/PPI_D15/TACI2 PG13/UA0_TX/SD_D5/PPI_D14/CZM1 Type Function Driver Type I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O GPIO/SPORT0 TX Serial CLK/UART0 RX/Timer6/Count Up Dir 0 GPIO/SPORT0 RX Serial CLK/UART0 TX/Timer5/Count Down Dir 0 GPIO/SPORT0 TX Pri Data/PWM0 Drive B Hi/PPI Data 8/Counter Zero Marker 0 GPIO/SPORT0 TX Frame Sync/PWM0 Drive B Lo/PPI Data 9/Count Down Dir 0 GPIO/SPORT0 RX Frame Sync/PWM0 Drive C Hi/PPI Data 10/Alt Timer CLK 0 GPIO/SPORT0 Pri RX Data/PWM0 Drive C Lo/PPI Data 11/Alt Timer CLK 1 GPIO/UART1 TX/PWM0 TRIP/PPI Data 12 GPIO/UART1 RX/PWM0 SYNC/PPI Data 13/Alt Capture In 3 GPIO/UART1 RTS/SPORT0 TX Sec Data/PPI Data 7 GPIO/UART1 CTS/SPORT0 Sec RX Data/PPI Data 6/Counter Zero Marker 0 GPIO/SPI0 SCK/Timer2/PPI Data 5 GPIO/SPI0 MISO/PWM0 TRIP/PPI Data 4/Alt Timer CLK 2 GPIO/SPI0 MOSI/PWM0 SYNC/PPI Data 3 GPIO/SPI0 Slave Select 1/Timer3/PPI Data 2/SPI0 Slave Select In GPIO/SPI0 Slave Select 2/PWM0 AH/PPI Data 1 GPIO/SPI0 Slave Select 3/PWM0 AL/PPI Data 0 TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O I/O GPIO/SPI1 Slave Select 3/Timer CLK/PPI Clock/UART1 RX/Alt Capture In 4 GPIO/SPI1 Slave Select 2/PPI FS3/CAN RX/Alt Capture In 5 GPIO/SPI1 Slave Select 1/Timer4/CAN TX/SPI1 Slave Select In GPIO/HWAIT/SPI1 SCK/SPORT1 TX Sec Data/UART1 TX GPIO/SPI1 MOSI/SPORT1 Sec RX Data/PWM1 SYNC/Alt Timer CLK 6 GPIO/SPI1 MISO/Timer7/PWM1 TRIP GPIO/ADC CM SGL DIFF/SD Data 3/PWM1 Drive A Hi GPIO/ADC CM RANGE/SD Data 2/PWM1 Drive A Lo GPIO/SPORT1 Sec RX Data/SD Data 1/PWM1 Drive B Hi GPIO/SPORT1 Pri RX Data/SD Data 0/PWM1 Drive B Lo GPIO/SPORT1 RX Frame Sync/SD CMD/PWM1 Drive C Hi/Alt Capture In 6 GPIO/SPORT1 RX Serial CLK/SD CLK/PWM1 Drive C Lo/Alt Timer CLK 7 GPIO/UART0 RX/SD Data 4/PPI Data 15/Alt Capture In 2 GPIO/UART0 TX/SD Data 5/PPI Data 14/Counter Zero Marker 1 TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Rev. PrC | Page 21 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 11. Processor — Signal Descriptions (Continued) Signal Name PG14/UA0_RTS/SD_D6/TMR0/PPI_FS1/CUD1 PG15/UA0_CTS/SD_D7/TMR1/PPI_FS2/CDG1 Port H: GPIO and Multiplexed Peripherals PH0/ACM_A2/DT1PRI/SPI0_SEL3/WAKEUP PH1/ACM_A1/TFS1/SPI1_SEL3/TACLK3 PH2/ACM_A0/TSCLK1/SPI1_SEL2/TACI7 TWI (Two-Wire Interface) Port SCL SDA JTAG Port TCK TDO TDI TMS TRST Type Function I/O GPIO/UART0 RTS/SD Data 6/Timer0/PPI FS1/Count Up Dir 1 I/O GPIO/UART0 CTS/SD Data 7/Timer1/PPI FS2/Count Down Dir 1 I/O GPIO/ADC CM A2/SPORT1 TX Pri Data/SPI0 Slave Select 3/Wake-up Input I/O GPIO/ADC CM A1/SPORT1 TX Frame Sync/SPI1 Slave Select 3/Alt Timer CLK 3 I/O GPIO/ADC CM A0/SPORT1 TX Serial CLK/SPI1 Slave Select 2/Alt Capture In 7 I/O 5V I/O 5V EMU Clock CLKIN XTAL EXTCLK Mode Controls RESET NMI O JTAG CLK JTAG Serial Data Out JTAG Serial Data In JTAG Mode Select JTAG Reset (This signal should be pulled low if the JTAG port is not used.) Emulation Output I O O CLK/Crystal In Crystal Output Clock Output I I BMODE2–0 ADSP-BF50x Voltage Regulation I/F EXT_WAKE PG Power Supplies I Reset Nonmaskable Interrupt (This signal should be pulled high when not used.) Boot Mode Strap 2-0 VDDEXT VDDINT VDDFLASH GND I O I I I TWI Serial Clock (This signal is an open-drain output and requires a pull-up resistor. Consult version 2.1 of the I2C specification for the proper resistor value.) TWI Serial Data (This signal is an open-drain output and requires a pull-up resistor. Consult version 2.1 of the I2C specification for the proper resistor value.) O I P P P G Wake up Indication Power Good ALL SUPPLIES MUST BE POWERED See Processor — Operating Conditions on Page 25. I/O Power Supply Internal Power Supply Flash Memory Power Supply Ground for All Supplies Rev. PrC | Page 22 of 80 | January 2010 Driver Type TBD TBD TBD TBD TBD TBD TBD C C B C Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Table 12. ADC — Signal Descriptions (ADSP-BF506F Processor Only) Signal Name DGND REF SELECT AVDD DCAPA, DCAPB (VREF) AGND VA1 to VA6 VB1 to VB6 RANGE SGL/DIFF A0 to A2 CS ADSCLK Type Function G Digital Ground. This is the ground reference point for all digital circuitry on the internal ADC. Both DGND pins should connect to the DGND plane of a system. The DGND and AGND voltages should ideally be at the same potential and must not be more than 0.3 V apart, even on a transient basis. I Internal/External Reference Selection. Logic input. If this pin is tied to DGND, the on-chip 2.5 V reference is used as the reference source for both ADC A and ADC B. In addition, Pin DCAPA and Pin DCAPB must be tied to decoupling capacitors. If the REF SELECT pin is tied to a logic high, an external reference can be supplied to the internal ADC through the DCAPA and/or DCAPB pins. P Analog Supply Voltage, 2.7 V to 5.25 V. This is the only supply voltage for all analog circuitry on the internal ADC. The AVDD and DVDD voltages should ideally be at the same potential and must not be more than 0.3 V apart, even on a transient basis. This supply should be decoupled to AGND. I Decoupling Capacitor Pins. Decoupling capacitors (470 nF recommended) are connected to these pins to decouple the reference buffer for each respective ADC. Provided the output is buffered, the on-chip reference can be taken from these pins and applied externally to the rest of a system. The range of the external reference is dependent on the analog input range selected. G Analog Ground. Ground reference point for all analog circuitry on the internal ADC. All analog input signals and any external reference signal should be referred to this AGND voltage. All three of these AGND pins should connect to the AGND plane of a system. The AGND and DGND voltages ideally should be at the same potential and must not be more than 0.3 V apart, even on a transient basis. I Analog Inputs of ADC A. These may be programmed as six single-ended channels or three true differential analog input channel pairs. See Table 51 (Analog Input Type and Channel Selection). I Analog Inputs of ADC B. These may be programmed as six single-ended channels or three true differential analog input channel pairs. See Table 51 (Analog Input Type and Channel Selection). I Analog Input Range Selection. Logic input. The polarity on this pin determines the input range of the analog input channels. If this pin is tied to a logic low, the analog input range is 0 V to VREF. If this pin is tied to a logic high when CS goes low, the analog input range is 2 × VREF. For details, see Table 51 (Analog Input Type and Channel Selection). I Logic Input. This pin selects whether the analog inputs are configured as differential pairs or single ended. A logic low selects differential operation while a logic high selects single-ended operation. For details, see Table 51 (Analog Input Type and Channel Selection). I Multiplexer Select. Logic inputs. These inputs are used to select the pair of channels to be simultaneously converted, such as Channel 1 of both ADC A and ADC B, Channel 2 of both ADC A and ADC B, and so on. The pair of channels selected may be two single-ended channels or two differential pairs. The logic states of these pins need to be set up prior to the acquisition time and subsequent falling edge of CS to correctly set up the multiplexer for that conversion. For further details, see Table 51 (Analog Input Type and Channel Selection). I Chip Select. Active low logic input. This input provides the dual function of initiating conversions on the internal ADC and framing the serial data transfer. When connecting CS to a processor signal that is three-stated during reset and/or hibernate, adding a pull-up resistor may prove useful to avoid random ADC operation. I Serial Clock. Logic input. A serial clock input provides the ADSCLK for accessing the data from the internal ADC. This clock is also used as the clock source for the conversion process. Rev. PrC | Page 23 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 12. ADC — Signal Descriptions (ADSP-BF506F Processor Only) (Continued) Signal Name DOUTA, DOUTB VDRIVE DVDD Type Function O Serial Data Outputs. The data output is supplied to each pin as a serial data stream. The bits are clocked out on the falling edge of the ADSCLK input and 14 ADSCLKs are required to access the data. The data simultaneously appears on both pins from the simultaneous conversions of both ADCs. The data stream consists of two leading zeros followed by the 12 bits of conversion data. The data is provided MSB first. If CS is held low for 16 ADSCLK cycles rather than 14, then two trailing zeros will appear after the 12 bits of data. If CS is held low for a further 16 ADSCLK cycles on either DOUTA or DOUTB, the data from the other ADC follows on the DOUT pin. This allows data from a simultaneous conversion on both ADCs to be gathered in serial format on either DOUTA or DOUTB using only one serial port. For more information, see the ADC — Serial Interface section. P Logic Power Supply Input. The voltage supplied at this pin determines at what voltage the digital I/O interface operates. This pin should be decoupled to DGND. The voltage at this pin may be different than that at AVDD and DVDD but should never exceed either by more than 0.3 V. P Digital Supply Voltage, 2.7 V to 5.25 V. This is the supply voltage for all digital circuitry on the internal ADC. The DVDD and AVDD voltages should ideally be at the same potential and must not be more than 0.3 V apart even on a transient basis. This supply should be decoupled to DGND. Rev. PrC | Page 24 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F PROCESSOR — SPECIFICATIONS Specifications are subject to change without notice. PROCESSOR — OPERATING CONDITIONS Parameter VDDINT1 Internal Supply Voltage VDDEXT2 External Supply Voltage 2 VDDEXT External Supply Voltage VDDFLASH2,3 Flash Memory Supply Voltage VIH High Level Input Voltage4, 5 VIH High Level Input Voltage4, 5 VIH High Level Input Voltage4, 5 VIHTWI High Level Input Voltage6 VIL Low Level Input Voltage4, 5 Low Level Input Voltage4, 5 VIL VIL Low Level Input Voltage4, 5 VILTWI Low Level Input Voltage6 TJ Junction Temperature TJ Junction Temperature Conditions ADSP-BF504 ADSP-BF504F, ADSP-BF506F VDDEXT = 1.90 V VDDEXT = 2.75 V VDDEXT = 3.6 V VDDEXT = 1.90 V/2.75 V/3.6 V VDDEXT = 1.7 V VDDEXT = 2.25 V VDDEXT = 3.0 V VDDEXT = minimum 88-Lead LFCSP @ TAMBIENT = –40°C to +85°C 120-Lead LQFP @ TAMBIENT = –40°C to +85°C Min TBD 1.7 2.7 1.7 1.1 1.7 2.0 0.7 × VBUSTWI7, 8 –0.3 –0.3 –0.3 –0.3 –40 –40 Nominal TBD 1.8/2.5/3.3 3.3 1.8 Max TBD 3.6 3.6 2.0 3.6 3.6 3.6 VBUSTWI7, 8 0.6 0.7 0.8 0.3 × VBUSTWI8 +105 +105 Unit V V V V V V V V V V V V °C °C The expected nominal value is 1.4 V ±5%, and initial customer designs should design with a programmable regulator that can be adjusted from 0.95 V to 1.5 V in 50 mV steps. Must remain powered (even if the associated function is not used). 3 For ADSP-BF504, VDDFLASH pins should be connected to GND. 4 Bidirectional pins (PF15–0, PG15–0, PH2–0) and input pins (TCK, TDI, TMS, TRST, CLKIN, RESET, NMI, and BMODE3–0) of the ADSP-BF50x processors are 3.3 V tolerant (always accept up to 3.6 V maximum VIH). Voltage compliance (on outputs, VOH) is limited by the VDDEXT supply voltage. 5 Parameter value applies to all input and bidirectional pins, except SDA and SCL. 6 Parameter applies to SDA and SCL. 7 The VIHTWI min and max value vary with the selection in the TWI_DT field of the NONGPIO_DRIVE register. See VBUSTWI min and max values in Table 13. 8 SDA and SCL are pulled up to VBUSTWI. See Table 13. 1 2 Table 13 shows settings for TWI_DT in the NONGPIO_DRIVE register. Set this register prior to using the TWI port. Table 13. TWI_DT Field Selections and VDDEXT/VBUSTWI TWI_DT 000 (default) 001 010 011 100 101 110 111 (reserved) VDDEXT Nominal 3.3 1.8 2.5 1.8 3.3 1.8 2.5 – VBUSTWI Minimum 2.97 1.7 2.97 2.97 4.5 2.25 2.25 – Rev. PrC VBUSTWI Nominal 3.3 1.8 3.3 3.3 5 2.5 2.5 – | Page 25 of 80 | January 2010 VBUSTWI Maximum 3.63 1.98 3.63 3.63 5.5 2.75 2.75 – Unit V V V V V V V – ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data ADSP-BF50x Clock Related Operating Conditions Table 14 describes the core clock timing requirements for the ADSP-BF50x processors. Take care in selecting MSEL, SSEL, and CSEL ratios so as not to exceed the maximum core clock and system clock (see Table 16). Table 15 describes phaselocked loop operating conditions. Table 14. Core Clock (CCLK) Requirements—ADSP-BF50x Processors—All Speed Grades1 Parameter fCCLK fCCLK fCCLK fCCLK fCCLK 1 Core Clock Frequency (VDDINT =tbd V Minimum) Core Clock Frequency (VDDINT =tbd V Minimum) Core Clock Frequency (VDDINT = tbd V Minimum) Core Clock Frequency (VDDINT = tbd V Minimum) Core Clock Frequency (VDDINT = tbd V Minimum) Maximum 400 TBD TBD TBD TBD Unit MHz MHz MHz MHz MHz Maximum Speed Grade1 Unit MHz See the Ordering Guide on Page 79. Table 15. Phase-Locked Loop Operating Conditions Parameter fVCO 1 Voltage Controlled Oscillator (VCO) Frequency Minimum 72 See the Ordering Guide on Page 79. Table 16. Maximum SCLK Conditions for ADSP-BF50x Processors Parameter fSCLK fSCLK CLKOUT/SCLK Frequency (VDDINT ≥ tbd V) CLKOUT/SCLK Frequency (VDDINT < tbd V) Rev. PrC | Page 26 of 80 | January 2010 VDDEXT = 1.8 V/2.5 V/3.3 V Nominal Unit 100 MHz TBD MHz Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F PROCESSOR — ELECTRICAL CHARACTERISTICS Parameter Test Conditions Min 1.35 Typical Max Unit VOH High Level Output Voltage VDDEXT = 1.7 V, IOH = –0.5 mA VOH High Level Output Voltage VDDEXT = 2.25 V, IOH = –0.5 mA 2.0 V VOH High Level Output Voltage VDDEXT = 3.0 V, IOH = –0.5 mA V VOL Low Level Output Voltage VDDEXT = 1.7 V/2.25 V/3.0 V, IOL = 2.0 mA 0.4 V VOLTWI Low Level Output Voltage VDDEXT = 1.7 V/2.25 V/3.0 V, IOL = 2.0 mA TBD V V IIH High Level Input Current1 VDDEXT =3.6 V, VIN = 3.6 V 10.0 μA 1 V 2.4 IIL Low Level Input Current VDDEXT =3.6 V, VIN = 0 V 10.0 μA IIHP High Level Input Current JTAG2 VDDEXT = 3.6 V, VIN = 3.6 V 75.0 μA IOZH Three-State Leakage Current3 VDDEXT = 3.6 V, VIN = 3.6 V 10.0 μA 4 VDDEXT =3.0 V, VIN = 5.5 V 10.0 μA VDDEXT = 3.6 V, VIN = 0 V 10.0 μA IOZHTWI Three-State Leakage Current IOZL Three-State Leakage Current3 5 fIN = 1 MHz, TAMBIENT = 25°C, VIN = 2.5 V TBD VDDINT Current in Deep Sleep Mode VDDINT = TBD V, fCCLK = 0 MHz, fSCLK = 0 MHz, TJ = 25°C, ASF = 0.00 TBD mA IDDSLEEP VDDINT Current in Sleep Mode VDDINT = TBD V, fSCLK = 25 MHz, TJ = 25°C TBD mA IDD-IDLE VDDINT Current in Idle VDDINT = TBD V, fCCLK = 50 MHz, TJ = 25°C, ASF = TBD TBD mA IDD-TYP VDDINT Current VDDINT = TBD V, fCCLK = 400 MHz, TJ = 25°C, ASF = 1.00 TBD mA IDDHIBERNATE8 Hibernate State Current VDDEXT = 3.30 V, VDDFLASH =1.8 V, TJ = 25°C, CLKIN = 0 MHz (VDDINT = 0 V) TBD μA IDDSLEEP9 VDDINIT Current in Sleep Mode fCCLK = 0 MHz, fSCLK > 0 MHz mA10 Table 18 + (TBD × VDDINT × fSCLK) IDDDEEPSLEEP9 VDDINT Current in Deep Sleep Mode fCCLK = 0 MHz, fSCLK = 0 MHz Table 18 VDDINT Current fCCLK > 0 MHz, fSCLK ≥ 0 MHz mA Table 18 + (Table 19 × ASF) + (TBD × VDDINT × fSCLK) CIN Input Capacitance IDDDEEPSLEEP7 IDDINT 9 IDDFLASH1 TBD 6 pF mA Flash Memory Supply Current 1 — Asynchronous Read (5 MHz NORCLK11) 10 20 mA 4 Word Flash Memory Supply Current 1 — Synchronous Read (50 MHz NORCLK11) 8 Word 18 20 mA 20 22 mA 16 Word 25 27 mA Continuous 28 30 mA IDDFLASH2 Flash Memory Supply Current 2 — Reset/Powerdown 15 50 μA IDDFLASH3 Flash Memory Supply Current 3 — Standby 15 50 μA Rev. PrC | Page 27 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Parameter Test Conditions Min Typical Max Unit IDDFLASH4 Flash Memory Supply Current 4 — Automatic Standby 15 50 μA IDDFLASH5 Flash Memory Supply Current 5 — Program 15 40 mA Flash Memory Supply Current 5 — Erase 15 40 mA Program/Erase in one bank, asynchronous read in another bank 25 60 mA Program/Erase in one bank, synchronous read in another bank 43 70 mA 15 50 μA IDDFLASH6 IDDFLASH7 Flash Memory Supply Current 6 — Dual Operations Flash Memory Supply Current 7 — Program/Erase Suspended (Standby) 1 Applies to input pins. Applies to JTAG input pins (TCK, TDI, TMS, TRST). 3 Applies to three-statable pins. 4 Applies to bidirectional pins SCL and SDA. 5 Applies to all signal pins. 6 Guaranteed, but not tested. 7 See the ADSP-BF50x Blackfin Processor Hardware Reference Manual for definition of sleep, deep sleep, and hibernate operating modes. 8 Applies to VDDEXT supply only. Clock inputs are tied high or low. 9 Guaranteed maximum specifications. 10 Unit for VDDINT is V (Volts). Unit for fSCLK is MHz. Example: TBD V, TBD MHz would be TBD x TBD x TBD = TBD mA adder. 11 See the ADSP-BF50x Blackfin Processor Hardware Reference Manual for definition of NORCLK. 2 Rev. PrC | Page 28 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Total Power Dissipation The ASF is combined with the CCLK Frequency and VDDINT dependent data in Table 19 to calculate this part. The second part is due to transistor switching in the system clock (SCLK) domain, which is included in the IDDINT specification equation. Total power dissipation has two components: 1. Static, including leakage current 2. Dynamic, due to transistor switching characteristics Many operating conditions can also affect power dissipation, including temperature, voltage, operating frequency, and processor activity. Processor — Electrical Characteristics on Page 27 shows the current dissipation for internal circuitry (VDDINT). IDDDEEPSLEEP specifies static power dissipation as a function of voltage (VDDINT) and temperature (see Table 18), and IDDINT specifies the total power specification for the listed test conditions, including the dynamic component as a function of voltage (VDDINT) and frequency (Table 19). There are two parts to the dynamic component. The first part is due to transistor switching in the core clock (CCLK) domain. This part is subject to an Activity Scaling Factor (ASF) which represents application code running on the processor core and L1 memories (Table 17). Table 17. Activity Scaling Factors (ASF)1 IDDINT Power Vector IDD-PEAK IDD-HIGH IDD-TYP IDD-APP IDD-NOP IDD-IDLE 1 Activity Scaling Factor (ASF) TBD TBD TBD TBD TBD TBD See Estimating Power for ASDP-BF534/BF536/BF537 Blackfin Processors (EE-297). The power vector information also applies to the ADSP-BF50x processors. Table 18. Preliminary ADSP-BF50x Static Current — IDD-DEEPSLEEP (mA) 1 TJ (°C) –40 –20 0 25 40 55 70 85 100 105 1 TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD Voltage (VDDINT)1 TBD V TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD V TBD TBD TBD TBD Valid temperature and voltage ranges are model-specific. See Processor — Operating Conditions on Page 25. Table 19. Preliminary ADSP-BF50x Dynamic Current in CCLK Domain (mA, with ASF = 1.0)1 fCCLK (MHz)2 400 300 200 100 1 2 TBD V TBD TBD TBD TBD TBD V TBD TBD TBD TBD TBD V TBD TBD TBD TBD Voltage (VDDINT)2 TBD V TBD V TBD TBD TBD TBD TBD TBD TBD TBD TBD V TBD TBD TBD TBD The values are not guaranteed as standalone maximum specifications. They must be combined with static current per the equations of Processor — Electrical Characteristics on Page 27. Valid frequency and voltage ranges are model-specific. See Processor — Operating Conditions on Page 25. Rev. PrC | Page 29 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data PROCESSOR — ABSOLUTE MAXIMUM RATINGS PACKAGE INFORMATION Stresses greater than those listed in Table 20 may cause permanent damage to the device. These are stress ratings only. Functional operation of the device at these or any other conditions greater than those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The information presented in Figure 9 and Table 22 provides details about the package branding for the ADSP-BF50x processors. For a complete listing of product availability, see Ordering Guide on Page 79. a ADSP-BF50x Table 20. tppZccc Parameter Internal Supply Voltage (VDDINT) External (I/O) Supply Voltage (VDDEXT) Input Voltage1, 2 Input Voltage1, 2, 3 Output Voltage Swing Storage Temperature Range Junction Temperature While Biased Rating –0.3 V to +1.5 V –0.3 V to +3.8 V –0.5 V to +3.6 V –0.5 V to +5.5 V –0.5 V to VDDEXT +0.5 V –65°C to +150°C +110°C vvvvvv.x n.n #yyww country_of_origin B Figure 9. Product Information on Package Table 22. Package Brand Information Brand Key ADSP-BF50x t pp Z ccc vvvvvv.x n.n # yyww 1 Applies to 100% transient duty cycle. For other duty cycles see Table 21. Applies only when VDDEXT is within specifications. When VDDEXT is outside specifications, the range is VDDEXT ± 0.2 Volts. 3 Applies to pins SCL and SDA. 2 Table 21. Maximum Duty Cycle for Input Transient Voltage1 VIN Min (V) –0.50 –0.70 –0.80 –0.90 –1.00 1 VIN Max (V) +3.80 +4.00 +4.10 +4.20 +4.30 Maximum Duty Cycle 100 % 40% 25% 15% 10% 1 See product names in the Ordering Guide on Page 79. Applies to all signal pins with the exception of CLKIN, XTAL, EXT_WAKE. ESD SENSITIVITY ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although this product features patented or proprietary circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality. Rev. PrC Field Description Product Name1 Temperature Range Package Type RoHS Compliant Designation See Ordering Guide Assembly Lot Code Silicon Revision RoHS Compliance Designator Date Code | Page 30 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F PROCESSOR — TIMING SPECIFICATIONS Clock and Reset Timing Table 23 and Figure 10 describe clock and reset operations. Per the CCLK and SCLK timing specifications in Table 14 to Table 16, combinations of CLKIN and clock multipliers must not select core/peripheral clocks in excess of the processor’s speed grade. Table 23. Clock and Reset Timing Parameter Timing Requirements CLKIN Frequency1, 2, 3, 4 fCKIN tCKINL CLKIN Low Pulse1 tCKINH CLKIN High Pulse1 tWRST RESET Asserted Pulse Width Low5 Switching Characteristic tBUFDLAY CLKIN to CLKBUF Delay Min Max Unit 12 10 10 11 × tCKIN 50 MHz ns ns ns 10 ns 1 Applies to PLL bypass mode and PLL non bypass mode. 2 Combinations of the CLKIN frequency and the PLL clock multiplier must not exceed the allowed fVCO, fCCLK, and fSCLK settings discussed in Table 14 on Page 26 through Table 16 on Page 26. 3 The tCKIN period (see Figure 10) equals 1/fCKIN. 4 If the DF bit in the PLL_CTL register is set, the minimum fCKIN specification is 24 MHz. 5 Applies after power-up sequence is complete. See Table 24 and Figure 11 for power-up reset timing. tCKIN CLKIN tCKINL tBUFDLAY tCKINH CLKBUF tWRST RESET Figure 10. Clock and Reset Timing Rev. PrC | Page 31 of 80 | January 2010 tBUFDLAY ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 24. Power-Up Reset Timing Parameter Min Max Unit Timing Requirements tRST_IN_PWR RESET Deasserted after the VDDINT, VDDEXT, VDDFLASH, and CLKIN Pins are Stable and Within Specification tRST_IN_PWR RESET V ,V DDINT CLKIN ,V DDFLASH DDEXT Figure 11. Power-Up Reset Timing Rev. PrC | Page 32 of 80 | January 2010 3500 × tCKIN ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Parallel Peripheral Interface Timing Table 25 and Figure 12 on Page 33, Figure 18 on Page 39, and Figure 20 on Page 40 describe parallel peripheral interface operations. Table 25. Parallel Peripheral Interface Timing Min Parameter Timing Requirements tPCLKW PPI_CLK Width1 tPCLK PPI_CLK Period1 Timing Requirements - GP Input and Frame Capture Modes tSFSPE External Frame Sync Setup Before PPI_CLK (Nonsampling Edge for Rx, Sampling Edge for Tx) tHFSPE External Frame Sync Hold After PPI_CLK tSDRPE Receive Data Setup Before PPI_CLK tHDRPE Receive Data Hold After PPI_CLK Switching Characteristics - GP Output and Frame Capture Modes tDFSPE Internal Frame Sync Delay After PPI_CLK tHOFSPE Internal Frame Sync Hold After PPI_CLK tDDTPE Transmit Data Delay After PPI_CLK tHDTPE Transmit Data Hold After PPI_CLK 1 VDDEXT = 1.8 V Max Min 6.4 20 ns ns 6.7 6.7 ns 1.0 3.5 1.5 1.0 3.5 1.5 ns ns ns 8.8 1.7 1.7 9.8 8.8 1.8 1.8 PPI_CLK frequency cannot exceed fSCLK/2 DATA1 IS SAMPLED PPI_CLK POLC = 0 tPCLKW PPI_CLK POLC = 1 tSFSPE tHFSPE POLS = 1 PPI_FS1 POLS = 0 POLS = 1 PPI_FS2 POLS = 0 tSDRPE tHDRPE PPI_DATA Figure 12. PPI GP Rx Mode with External Frame Sync Timing Rev. PrC Unit 6.4 20 9.8 DATA0 IS SAMPLED VDDEXT = 2.5/3.3 V Max | Page 33 of 80 | January 2010 tPCLK ns ns ns ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data DATA DRIVING/ FRAME SYNC SAMPLING EDGE DATA DRIVING/ FRAME SYNC SAMPLING EDGE PPI_CLK POLC = 0 tPCLKW PPI_CLK POLC = 1 tSFSPE tHFSPE POLS = 1 PPI_FS1 POLS = 0 POLS = 1 PPI_FS2 POLS = 0 tDDTPE tHDTPE PPI_DATA Figure 13. PPI GP Tx Mode with External Frame Sync Timing FRAME SYNC IS DRIVEN OUT DATA0 IS SAMPLED PPI_CLK POLC = 0 tPCLKW tPCLK PPI_CLK POLC = 1 tHOFSPE tDFSPE POLS = 1 PPI_FS1 POLS = 0 POLS = 1 PPI_FS2 POLS = 0 tSDRPE tHDRPE PPI_DATA Figure 14. PPI GP Rx Mode with Internal Frame Sync Timing Rev. PrC | Page 34 of 80 | January 2010 tPCLK Preliminary Technical Data FRAME SYNC IS DRIVEN OUT ADSP-BF504/F,ADSP-BF506F DATA0 IS DRIVEN OUT PPI_CLK POLC = 0 tPCLKW PPI_CLK POLC = 1 tHOFSPE tDFSPE POLS = 1 PPI_FS1 POLS = 0 POLS = 1 PPI_FS2 POLS = 0 tDDTPE tHDTPE DATA0 PPI_DATA Figure 15. PPI GP Tx Mode with Internal Frame Sync Timing Rev. PrC | Page 35 of 80 | January 2010 tPCLK ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data RSI Controller Timing Table 26 and Figure 16 describe RSI Controller Timing. Table 27 and Figure 17 describe RSI controller (high speed) timing. Table 26. RSI Controller Timing Parameter Timing Requirements Input Setup Time tISU Input Hold Time tIH Switching Characteristics Clock Frequency Data Transfer Mode fPP1 Clock Frequency Identification Mode fOD tWL Clock Low Time Clock High Time tWH Clock Rise Time tTLH tTHL Clock Fall Time Output Delay Time During Data Transfer Mode tODLY Output Delay Time During Identification Mode tODLY 1 2 Min Max 5.6 2 ns ns 0 1002 15 15 25 400 10 10 14 50 tPP = 1/fPP Specification can be 0 kHz, which means to stop the clock. The given minimum frequency range is for cases where a continuous clock is required. tPP SD_CLK VOH (MIN) tTHL tISU tTLH tWL tIH tWH INPUT tODLY OUTPUT NOTES: 1 INPUT INCLUDES SD_Dx AND SD_CMD SIGNALS. 2 OUTPUT INCLUDES SD_Dx AND SD_CMD SIGNALS. Figure 16. RSI Controller Timing Rev. PrC | Page 36 of 80 | January 2010 Unit VOL (MAX) MHz kHz ns ns ns ns ns ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Table 27. RSI Controller Timing (High Speed Mode) Parameter Timing Requirements Input Setup Time tISU Input Hold Time tIH Switching Characteristics Clock Frequency Data Transfer Mode fPP1 Clock Low Time tWL Clock High Time tWH tTLH Clock Rise Time Clock Fall Time tTHL Output Delay Time During Data Transfer Mode tODLY tOH Output Hold Time 1 Min Max 5.6 2 ns ns 0 9.5 9.5 50 3 3 TBD 2.5 tPP = 1/fPP tPP SD_CLK VOH (MIN) tTHL tISU tTLH tWL tIH tWH INPUT tODLY OUTPUT NOTES: 1 INPUT INCLUDES SD_Dx AND SD_CMD SIGNALS. 2 OUTPUT INCLUDES SD_Dx AND SD_CMD SIGNALS. Figure 17. RSI Controller Timing (High-Speed Mode) Rev. PrC | Page 37 of 80 | January 2010 Unit tOH VOL (MAX) MHz ns ns ns ns ns ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Serial Ports Table 28 through Table 31 on Page 40 and Figure 18 on Page 39 through Figure 20 on Page 40 describe serial port operations. Table 28. Serial Ports—External Clock Parameter Timing Requirements tSFSE TFSx/RFSx Setup Before TSCLKx/RSCLKx1 tHFSE TFSx/RFSx Hold After TSCLKx/RSCLKx1 tSDRE Receive Data Setup Before RSCLKx1,2 Receive Data Hold After RSCLKx1,2 tHDRE tSCLKEW TSCLKx/RSCLKx Width tSCLKE TSCLKx/RSCLKx Period Switching Characteristics tDFSE TFSx/RFSx Delay After TSCLKx/RSCLKx (Internally Generated TFSx/RFSx)3 tHOFSE TFSx/RFSx Hold After TSCLKx/RSCLKx (Internally Generated TFSx/RFSx)3 tDDTE Transmit Data Delay After TSCLKx3 tHDTE Transmit Data Hold After TSCLKx3 Min VDDEXT = 1.8 V Max 3.0 3.0 3.0 3.6 5.4 18.0 VDDEXT = 2.5/3.3 V Min Max Unit 3.0 3.0 3.0 3.6 5.4 18.0 ns ns ns ns ns ns 12.5 0.0 12.0 0.0 12.5 0.0 ns ns 12.0 0.0 ns ns 1 Referenced to sample edge. When SPORT is used in conjunction with the ACM, refer to the timing requirements in Table 39 (ACM Timing). 3 Referenced to drive edge. 2 Table 29. Serial Ports—Internal Clock Parameter Timing Requirements tSFSI TFSx/RFSx Setup Before TSCLKx/RSCLKx1 tHFSI TFSx/RFSx Hold After TSCLKx/RSCLKx1 Receive Data Setup Before RSCLKx1,2 tSDRI tHDRI Receive Data Hold After RSCLKx1,2 Switching Characteristics tSCLKIW TSCLKx/RSCLKx Width tSCLKI TSCLKx/RSCLKx Period tDFSI TFSx/RFSx Delay After TSCLKx/RSCLKx (Internally Generated TFSx/RFSx)3 tHOFSI TFSx/RFSx Hold After TSCLKx/RSCLKx (Internally Generated TFSx/RFSx)3 tDDTI Transmit Data Delay After TSCLKx3 tHDTI Transmit Data Hold After TSCLKx3 Min VDDEXT = 1.8 V Max VDDEXT = 2.5/3.3 V Max Unit 12.4 –1.5 12.4 –1.5 11.3 –1.5 11.3 –1.5 ns ns ns ns 5.4 18.0 5.4 18.0 ns ns ns 3.0 –4.0 3.0 –4.0 3.0 –1.8 1 Referenced to sample edge. When SPORT is used in conjunction with the ACM, refer to the timing requirements in Table 39 (ACM Timing). 3 Referenced to drive edge. 2 Rev. PrC Min | Page 38 of 80 | January 2010 ns 3.0 –1.8 ns ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F DATA RECEIVE—INTERNAL CLOCK DATA RECEIVE—EXTERNAL CLOCK DRIVE EDGE DRIVE EDGE SAMPLE EDGE SAMPLE EDGE tSCLKE tSCLKEW tSCLKIW RSCLKx RSCLKx tDFSE tDFSI tHOFSI tHFSI tSFSI RFSx tSFSE tHOFSE tHFSE RFSx tSDRE tHDRI tSDRI DRx tHDRE DRx NOTE: EITHER THE RISING EDGE OR FALLING EDGE OF RSCLKx OR TSCLKx CAN BE USED AS THE ACTIVE SAMPLING EDGE. DATA TRANSMIT—INTERNAL CLOCK DRIVE EDGE DATA TRANSMIT—EXTERNAL CLOCK DRIVE EDGE SAMPLE EDGE tSCLKIW SAMPLE EDGE t SCLKEW TSCLKx tSCLKE TSCLKx tDFSI tHOFSI tDFSE tSFSI tHOFSE tHFSI TFSx tSFSE tHFSE TFSx tDDTE tDDTI tHDTI tHDTE DTx DTx NOTE: EITHER THE RISING EDGE OR FALLING EDGE OF RSCLKx OR TSCLKx CAN BE USED AS THE ACTIVE SAMPLING EDGE. Figure 18. Serial Ports Table 30. Serial Ports—Enable and Three-State Min Parameter Switching Characteristics tDTENE Data Enable Delay from External TSCLKx1 tDDTTE Data Disable Delay from External TSCLKx1 tDTENI Data Enable Delay from Internal TSCLKx1 tDDTTI Data Disable Delay from Internal TSCLKx1 1 VDDEXT=1.8 V Max 0.0 –2.0 DRIVE TSCLKx tDTENE/I tDDTTE/I DTx Figure 19. Serial Ports — Enable and Three-State | Page 39 of 80 | January 2010 10.0 –2.0 3.0 DRIVE VDDEXT=2.5/3.3 V Max 0.0 10.0 Referenced to drive edge. Rev. PrC Min 3.0 Unit ns ns ns ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 31. Serial Ports — External Late Frame Sync Min Parameter Switching Characteristics tDDTLFSE Data Delay from Late External TFSx or External RFSx in Multi-channel Mode With MFD = 01, 2 tDTENLFSE Data Enable from External RFSx in Multi-channel Mode With 0.0 MFD = 01, 2 1 2 VDDEXT=1.8 V Max 11.2 EXTERNAL RFSx IN MULTI-CHANNEL MODE WITH MCE = 1 SAMPLE DRIVE RSCLKx tSFSE/I tHOFSE/I RFSx tDDTLFSE tDTENLFSE 1ST BIT DTx LATE EXTERNAL TFSx SAMPLE DRIVE DRIVE TSCLKx tSFSE/I tHOFSE/I TFSx tDDTLFSE 1ST BIT DTx Figure 20. Serial Ports — External Late Frame Sync Rev. PrC | Page 40 of 80 | January 2010 VDDEXT=2.5/3.3 V Max 10.0 0.0 When in multi-channel mode, TFSx enable and TFSx valid follow tDTENLFSE and tDDTLFSE. If external RFSx/TFSx setup to RSCLKx/TSCLKx > tSCLKE/2 then tDDTTE/I and tDTENE/I apply, otherwise tDDTLFSE and tDTENLFSE apply. DRIVE Min Unit ns ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Serial Peripheral Interface (SPI) Port—Master Timing Table 32 and Figure 21 describe SPI port master operations. Table 32. Serial Peripheral Interface (SPI) Port—Master Timing Parameter Timing Requirements tSSPIDM Data Input Valid to SCK Edge (Data Input Setup) SCK Sampling Edge to Data Input Invalid tHSPIDM Switching Characteristics tSDSCIM SPISELx low to First SCK Edge tSPICHM Serial Clock High Period tSPICLM Serial Clock Low Period tSPICLK Serial Clock Period Last SCK Edge to SPISELx High tHDSM tSPITDM Sequential Transfer Delay tDDSPIDM SCK Edge to Data Out Valid (Data Out Delay) tHDSPIDM SCK Edge to Data Out Invalid (Data Out Hold) Min VDDEXT = 1.8 V Max Min VDDEXT = 2.5/3.3 V Max 12.0 –1.5 11.6 –1.5 ns ns 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 4 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 4 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 ns ns ns ns ns ns ns ns 6 6 –1.0 –1.0 SPISELx (OUTPUT) tSDSCIM tSPICHM tSPICLM tSPICLM tSPICHM tSPICLK tHDSM SCK (CPOL = 0) (OUTPUT) SCK (CPOL = 1) (OUTPUT) tHDSPIDM MOSI (OUTPUT) tDDSPIDM LSB MSB tSSPIDM CPHA = 1 tHSPIDM MSB VALID MISO (INPUT) LSB VALID tHDSPIDM MOSI (OUTPUT) CPHA = 0 MISO (INPUT) tDDSPIDM MSB tSSPIDM LSB tHSPIDM MSB VALID LSB VALID Figure 21. Serial Peripheral Interface (SPI) Port—Master Timing Rev. PrC Unit | Page 41 of 80 | January 2010 tSPITDM ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Serial Peripheral Interface (SPI) Port—Slave Timing Table 33 and Figure 22 describe SPI port slave operations. Table 33. Serial Peripheral Interface (SPI) Port—Slave Timing Parameter Timing Requirements tSPICHS Serial Clock High Period Serial Clock Low Period tSPICLS tSPICLK Serial Clock Period tHDS Last SCK Edge to SPISS Not Asserted tSPITDS Sequential Transfer Delay tSDSCI SPISS Assertion to First SCK Edge tSSPID Data Input Valid to SCK Edge (Data Input Setup) SCK Sampling Edge to Data Input Invalid tHSPID Switching Characteristics tDSOE SPISS Assertion to Data Out Active tDSDHI SPISS Deassertion to Data High Impedance tDDSPID SCK Edge to Data Out Valid (Data Out Delay) tHDSPID SCK Edge to Data Out Invalid (Data Out Hold) Min VDDEXT = 1.8 V Max Min 2 × tSCLK –1.5 2 × tSCLK –1.5 4 × tSCLK 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 1.6 1.6 0 0 VDDEXT = 2.5/3.3 V Max 2 × tSCLK –1.5 2 × tSCLK –1.5 4 × tSCLK 2 × tSCLK –1.5 2 × tSCLK –1.5 2 × tSCLK –1.5 1.6 1.6 12.0 8.5 10 0 0 0 ns ns ns ns ns ns ns ns 12.0 8.5 10 0 SPISS (INPUT) tSPICHS tSPICLS tSPICLK tHDS SCKx (CPOL = 0) (INPUT) tSPICLS tSDSCI tSPICHS SCKx (CPOL = 1) (INPUT) tDSOE tDDSPID MISOx (OUTPUT) tSSPID MOSIx (INPUT) tDSDHI LSB tHSPID MSB VALID tDSOE LSB VALID tHDSPID tDDSPID tDSDHI MSB LSB CPHA = 0 MOSIx (INPUT) tDDSPID MSB CPHA = 1 MISOx (OUTPUT) tHDSPID tHSPID tSSPID MSB VALID LSB VALID Figure 22. Serial Peripheral Interface (SPI) Port—Slave Timing Rev. PrC | Page 42 of 80 | January 2010 Unit tSPITDS ns ns ns ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Universal Asynchronous Receiver-Transmitter (UART) Ports—Receive and Transmit Timing The UART ports receive and transmit operations are described in the ADSP-BF50x Hardware Reference Manual. General-Purpose Port Timing Table 34 and Figure 23 describe general-purpose port operations. Table 34. General-Purpose Port Timing Min Parameter Timing Requirement tWFI General-Purpose Port Pin Input Pulse Width tSCLK + 1 Switching Characteristic tGPOD General-Purpose Port Pin Output Delay from CLKOUT High 0 VDDEXT = 1.8 V Max CLKOUT tGPOD GPIO OUTPUT tWFI GPIO INPUT Figure 23. General-Purpose Port Timing Rev. PrC | Page 43 of 80 | January 2010 Min VDDEXT = 2.5/3.3 V Max tSCLK + 1 9.66 0 Unit ns 9.66 ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Timer Cycle Timing Table 35 and Figure 24 describe timer expired operations. The input signal is asynchronous in “width capture mode” and “external clock mode” and has an absolute maximum input frequency of (fSCLK/2) MHz. Table 35. Timer Cycle Timing Min Parameter Timing Requirements tWL Timer Pulse Width Input Low (Measured In SCLK Cycles)1 tWH Timer Pulse Width Input High (Measured In SCLK Cycles)1 tTIS Timer Input Setup Time Before CLKOUT Low2 tTIH Timer Input Hold Time After CLKOUT Low2 Switching Characteristics tHTO Timer Pulse Width Output (Measured In SCLK Cycles) tTOD Timer Output Update Delay After CLKOUT High VDDEXT = 1.8 V Max Min VDDEXT = 2.5/3.3 V Max Unit 1 × tSCLK 1 × tSCLK ns 1 × tSCLK 1 × tSCLK ns 5 –2 5 –2 ns ns 1 × tSCLK (232–1)tSCLK 8.1 1 1 × tSCLK (232–1)tSCLK ns 8.1 ns The minimum pulse widths apply for TMRx signals in width capture and external clock modes. They also apply to the PG0 or PPI_CLK signals in PWM output mode. 2 Either a valid setup and hold time or a valid pulse width is sufficient. There is no need to resynchronize programmable flag inputs. CLKOUT tTOD TMRx OUTPUT tTIS tTIH TMRx INPUT tWH,tWL Figure 24. Timer Cycle Timing Rev. PrC | Page 44 of 80 | January 2010 tHTO Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Timer Clock Timing Table 36 and Figure 25 describe timer clock timing. Table 36. Timer Clock Timing Min Parameter Switching Characteristic tTODP Timer Output Update Delay After PPI_CLK High VDDEXT = 1.8 V Max Min VDDEXT = 2.5/3.3 V Max 12.0 12.0 Unit ns PPI_CLK tTODP TMRx OUTPUT Figure 25. Timer Clock Timing Up/Down Counter/Rotary Encoder Timing Table 37. Up/Down Counter/Rotary Encoder Timing Parameter Timing Requirements tWCOUNT Up/Down Counter/Rotary Encoder Input Pulse Width tCIS Counter Input Setup Time Before CLKOUT High1 tCIH Counter Input Hold Time After CLKOUT High1 1 Min VDDEXT = 1.8 V Max tSCLK + 1 5.5 4.0 Either a valid setup and hold time or a valid pulse width is sufficient. There is no need to resynchronize counter inputs. CLKOUT tCIS tCIH CUD/CDG/CZM tWCOUNT Figure 26. Up/Down Counter/Rotary Encoder Timing Rev. PrC | Page 45 of 80 | January 2010 Min VDDEXT = 2.5/3.3 V Max tSCLK + 1 4.0 4.0 Unit ns ns ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Pulse Width Modulator (PWM) Timing Table 38 and Figure 27 describe PWM operations. Table 38. PWM Timing VDDEXT = 1.8 V Parameter Min Max VDDEXT = 2.5/3.3 V Min Max Unit Timing Requirements tES External Sync Pulse Width 2 × tSCLK + 1 2 × tSCLK + 1 ns Switching Characteristics tDODIS Output1 Inactive (OFF) After Trip Input 1 TBD 2 tDOE Output Delay After External Sync tOD Output1 Delay After Falling Edge of CLKOUT 1 2 3 × tSCLK + tOD 5 × tSCLK + tOD 3 × tSCLK + tOD TBD TBD ns 5 × tSCLK + tOD ns TBD ns PWM outputs are: PWMx_AH, PWMx_AL, PWMx_BH, PWMx_BL, PWMx_CH, and PWMx_CL. When the external sync signal is synchronous to the peripheral clock, it takes 3 cycles for the output to appear. When the external sync signal is asynchronous to the peripheral clock, it takes 5 cycles for the output to appear. CLKOUT PWMx_SYNC (AS INPUT) tES tOD tDOE OUTPUT tDODIS PWMx_TRIP Figure 27. PWM Timing Rev. PrC | Page 46 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F ADC Controller Module (ACM) Timing Table 39 and Figure 28 describe ACM operations. f SCLK f ACLK = -------------------------------------------------------( 2 × ACMCKDIV ) + 2 Note that the ACM clock (ACLK) frequency in MHz is set by the following equation (in which ACMCKDIV ranges from 0 to 255). 1 t ACLK = -------------f ACLK Table 39. ACM Timing VDDEXT = 1.8 V Min Parameter Max VDDEXT = 2.5/3.3 V Min Max Units Timing Requirements tSDR SPORT DRxPRI/DRxSEC Setup Before ACLK 7 7 ns tHDR SPORT DRxPRI/DRxSEC Hold After ACLK 0 0 ns Switching Characteristics tDO ACM Controls (ACM_A[2:0], ACM_RANGE, ACM_SGLDIFF) Delay After Falling Edge of CLKOUT 8.4 8.4 ns tDACLK ACLK Delay After Falling Edge of CLKOUT 8.4 8.4 ns tDCS CS Active Edge Delay After Falling Edge of CLKOUT 5.3 ns tDCSACLK The Delay Between the Active Edge of CS and the First Edge of ACLK 5.3 tACLK tACLK CLKOUT tDCS CS tDACLK tDCSACLK ACLK tDO ACM CONTROLS tSDR tHDR DRxPRI/ DRxSEC Figure 28. ACM Timing Rev. PrC | Page 47 of 80 | January 2010 ns ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data JTAG Test And Emulation Port Timing Table 40 and Figure 29 describe JTAG port operations. Table 40. JTAG Port Timing Min Parameter Timing Requirements tTCK TCK Period TDI, TMS Setup Before TCK High tSTAP tHTAP TDI, TMS Hold After TCK High tSSYS System Inputs Setup Before TCK High1 tHSYS System Inputs Hold After TCK High1 tTRSTW TRST Pulse Width2 (measured in TCK cycles) Switching Characteristics tDTDO TDO Delay from TCK Low tDSYS System Outputs Delay After TCK Low3 VDDEXT = 1.8 V Max 20 4 4 4 5 4 System Inputs = SCL, SDA, PF15–0, PG15–0, PH2–0, NMI, BMODE3–0, RESET, PG. 50 MHz Maximum 3 System Outputs = EXTCLK, SCL, SDA, PF15–0, PG15–0, PH2–0. 2 tTCK TCK tSTAP tHTAP TMS TDI tDTDO TDO tSSYS tHSYS SYSTEM INPUTS tDSYS SYSTEM OUTPUTS Figure 29. JTAG Port Timing Rev. PrC | Page 48 of 80 | January 2010 VDDEXT = 2.5/3.3 V Max 20 4 4 4 5 4 10 12.6 1 Min Unit ns ns ns ns ns TCK 10 12 ns ns Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F PROCESSOR — OUTPUT DRIVE CURRENTS DA TA TB D DA TA TB D Figure 30 through Figure 44 show typical current-voltage characteristics for the output drivers of the ADSP-BF50x processors. Figure 34. Driver Type B Current (2.5V VDDEXT) DA TA TB D DA TA TB D Figure 30. Driver Type A Current (3.3V VDDEXT) Figure 35. Driver Type B Current (1.8V VDDEXT) DA TA TB D DA TA TB D Figure 31. Driver Type A Current (2.5V VDDEXT) Figure 36. Driver Type C Current (3.3V VDDEXT) Figure 32. Driver Type A Current (1.8V VDDEXT) DA TA TB D The curves represent the current drive capability of the output drivers. See Table 11 on Page 21 for information about which driver type corresponds to a particular pin. DA TA TB D Figure 37. Drive Type C Current (2.5V VDDEXT) Figure 33. Driver Type B Current (3.3V VDDEXT) Rev. PrC | Page 49 of 80 | January 2010 Preliminary Technical Data DA TA DA TA TB D TB D ADSP-BF504/F,ADSP-BF506F Figure 42. Driver Type E Current (3.3V VDDEXT) DA TA DA TA TB TB D D Figure 38. Driver Type C Current (1.8V VDDEXT) Figure 43. Driver Type E Current (2.5V VDDEXT) DA TA DA TA TB D TB D Figure 39. Driver Type D Current (3.3V VDDEXT) Figure 40. Driver Type D Current (2.5V VDDEXT) Figure 44. Driver Type E Current (1.8V VDDEXT) PROCESSOR — TEST CONDITIONS DA TA TB D All timing parameters appearing in this data sheet were measured under the conditions described in this section. Figure 45 shows the measurement point for AC measurements (except output enable/disable). The measurement point VMEAS is VDDEXT/2 for VDDEXT (nominal) = 1.8 V/2.5 V/3.3 V. INPUT OR OUTPUT VMEAS Figure 41. Driver Type D Current (1.8V VDDEXT) Figure 45. Voltage Reference Levels for AC Measurements (Except Output Enable/Disable) Rev. PrC | Page 50 of 80 | January 2010 VMEAS Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Output Enable Time Measurement Output pins are considered to be enabled when they have made a transition from a high impedance state to the point when they start driving. The output enable time tENA is the interval from the point when a reference signal reaches a high or low voltage level to the point when the output starts driving as shown on the right side of Figure 46. REFERENCE SIGNAL tDIS_MEASURED tDIS tENA_MEASURED VOL (MEASURED) VOH (MEASURED) ⴚ ⌬V VOH(MEASURED) VTRIP(HIGH) VOL (MEASURED) + ⌬V VTRIP(LOW) VOL (MEASURED) tDECAY OUTPUT STOPS DRIVING Example System Hold Time Calculation To determine the data output hold time in a particular system, first calculate tDECAY using the equation given above. Choose ΔV to be the difference between the processor’s output voltage and the input threshold for the device requiring the hold time. CL is the total bus capacitance (per data line), and IL is the total leakage or three-state current (per data line). The hold time will be tDECAY plus the various output disable times as specified in the Processor — Timing Specifications on Page 31. Capacitive Loading tENA VOH (MEASURED) The time tDIS_MEASURED is the interval from when the reference signal switches, to when the output voltage decays ΔV from the measured output high or output low voltage. tTRIP OUTPUT STARTS DRIVING Output delays and holds are based on standard capacitive loads of an average of 6 pF on all pins (see Figure 47). VLOAD is equal to (VDDEXT) /2. The graphs of Figure 48 through Figure 55 show how output rise time varies with capacitance. The delay and hold specifications given should be derated by a factor derived from these figures. The graphs in these figures may not be linear outside the ranges shown. HIGH IMPEDANCE STATE TESTER PIN ELECTRONICS Figure 46. Output Enable/Disable 50: VLOAD The time tENA_MEASURED is the interval, from when the reference signal switches, to when the output voltage reaches VTRIP(high) or VTRIP(low). For VDDEXT (nominal) = 1.8V, VTRIP (high) is 1.05V, and VTRIP (low) is 0.75V. For VDDEXT (nominal) = 2.5V, VTRIP (high) is 1.5V and VTRIP (low) is 1.0V. For VDDEXT (nominal) = 3.3V, VTRIP (high) is 1.9V, and VTRIP (low) is 1.4V. Time tTRIP is the interval from when the output starts driving to when the output reaches the VTRIP(high) or VTRIP(low) trip voltage. T1 45: DUT OUTPUT 70: ZO = 50:(impedance) TD = 4.04 r 1.18 ns 50: 0.5pF 4pF 2pF 400: Time tENA is calculated as shown in the equation: t ENA = t ENA_MEASURED – t TRIP If multiple pins are enabled, the measurement value is that of the first pin to start driving. Output Disable Time Measurement Output pins are considered to be disabled when they stop driving, go into a high impedance state, and start to decay from their output high or low voltage. The output disable time tDIS is the difference between tDIS_MEASURED and tDECAY as shown on the left side of Figure 46. t DIS = t DIS_MEASURED – t DECAY The time for the voltage on the bus to decay by ΔV is dependent on the capacitive load CL and the load current IL. This decay time can be approximated by the equation: t DECAY = ( C L ΔV ) ⁄ I L NOTES: THE WORST CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD), IS FOR LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS. ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES. Figure 47. Equivalent Device Loading for AC Measurements (Includes All Fixtures) T TA A D Figure 48. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver A at VDDEXT = Min The time tDECAY is calculated with test loads CL and IL, and with ΔV equal to 0.25 V for VDDEXT (nominal) = 2.5 V/3.3 V and 0.15 V for VDDEXT (nominal) = 1.8V. Rev. PrC BD | Page 51 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data TCASE = Case temperature (°C) measured by customer at top center of package. D TB A T DA ΨJT = From Table 41 and Table 42. Figure 49. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver A at VDDEXT = Max PD = Power dissipation (see Total Power Dissipation on Page 29 for the method to calculate PD). Table 41. Thermal Characteristics (88-Lead LFCSP) D TB A T DA Figure 50. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver B at VDDEXT = Min D TB A T DA Figure 51. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver B at VDDEXT = Max Parameter θJA θJMA θJMA θJB θJC ΨJT ΨJT ΨJT Condition 0 linear m/s air flow 1 linear m/s air flow 2 linear m/s air flow 0 linear m/s air flow 1 linear m/s air flow 2 linear m/s air flow Typical 26.2 23.7 22.9 16.0 9.8 0.21 0.36 0.43 Unit °C/W °C/W °C/W °C/W °C/W °C/W °C/W °C/W Table 42. Thermal Characteristics (120-Lead LQFP) D TB A T DA Figure 52. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver C at VDDEXT = Min D TB A T DA Figure 53. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver C at VDDEXT = Max D TB A T DA Parameter θJA θJMA θJMA θJB θJC ΨJT ΨJT ΨJT Condition 0 linear m/s air flow 1 linear m/s air flow 2 linear m/s air flow 0 linear m/s air flow 1 linear m/s air flow 2 linear m/s air flow Typical 26.9 24.2 23.3 16.4 12.7 0.50 0.77 1.02 Unit °C/W °C/W °C/W °C/W °C/W °C/W °C/W °C/W Values of θJA are provided for package comparison and printed circuit board design considerations. θJA can be used for a first order approximation of TJ by the equation: T J = T A + ( θ JA × P D ) Figure 54. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver D at VDDEXT = Min where: TA = Ambient temperature (°C) D TB A T DA Values of θJC are provided for package comparison and printed circuit board design considerations when an external heat sink is required. Figure 55. Typical Rise and Fall Times (10%–90%) versus Load Capacitance for Driver D at VDDEXT = Max Values of θJB are provided for package comparison and printed circuit board design considerations. PROCESSOR — ENVIRONMENTAL CONDITIONS To determine the junction temperature on the application printed circuit board use: In Table 41 and Table 42, airflow measurements comply with JEDEC standards JESD51-2 and JESD51-6, and the junction-toboard measurement complies with JESD51-8. The junction-tocase measurement complies with MIL-STD-883 (Method 1012.1). All measurements use a 2S2P JEDEC test board. T J = T CASE + ( Ψ JT × P D ) where: TJ = Junction temperature (°C). Rev. PrC | Page 52 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F FLASH PROGRAM AND ERASE TIMES AND ENDURANCE CYCLES The program and erase times and the number of program/ erase cycles per block are shown in Table 43. Exact erase times may change depending on the memory array condition. The best case is when all the bits in the block or bank are at ‘0’ (pre pro- grammed). The worst case is when all the bits in the block or bank are at ‘1’ (not pre programmed). Usually, the system overhead is negligible with respect to the erase time. Table 43. Program/Erase Times and Endurance Cycles Parameter Condition Typ Erase Parameter Block (4K word)1 Main Block (32K word) Pre Programmed Not Pre Programmed Word Parameter Block (4K word) Main Block (32K word) Program Erase Main Blocks Parameter Blocks 0.3 Program2 Suspend Latency Program/Erase Cycles (per Block) 1 2 0.8 1 12 40 300 5 5 Typ after 100 k W/E cycles 1 3 12 The difference between pre programmed and not pre programmed is not significant (< 30 ms). Values are liable to change with the external system-level overhead (command sequence and Status Register polling execution). FLASH – ABSOLUTE MAXIMUM RATINGS Table 44 shows the ADC absolute maximum ratings. Table 44. Flash Absolute Maximum Ratings Parameter Junction Temperature While Biased Rating See Table 20 on Page 30 Storage Temperature Range –65°C to +150°C Flash Memory Supply Voltage (VDDFLASH) –0.2 V to +2.45 V Rev. PrC | Page 53 of 80 | January 2010 Max Unit 2.5 s 4 4 100 s s μs ms ms μs μs Cycles Cycles 10 20 100,000 100,000 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data ADC — SPECIFICATIONS ADC — OPERATING CONDITIONS Parameter VDD1 (AVDD, DVDD, VDRIVE) Conditions fADSCLK = 24 MHz, fS up to 1.5 MSPS, internal or external reference = 2.5 V ± 1% unless otherwise noted VDD (AVDD, DVDD, VDRIVE) fADSCLK = 32 MHz, fS up to 2.0 MSPS, internal or external reference = 2.5 V ± 1% unless otherwise noted TJ Junction Temperature 120-Lead LQFP @ TAMBIENT = –40°C to +85°C 1 Min 2.7 Nominal Max 3.6 Unit V 4.75 (AVDD, DVDD) 2.7 (VDRIVE) 5.25 (AVDD, DVDD) 5.25 (VDRIVE) V V –40 +105 °C Throughout this datasheet, VDD refers to both AVDD and DVDD. Table 45. Operating Conditions (Analog, Voltage Reference, and Logic I/O) Parameter ANALOG INPUT1 Single-Ended Input Range Pseudo Differential Input Range: VIN+ – VIN–2 Fully Differential Input Range: VIN+ and VIN– DC Leakage Current Input Capacitance4 INTERNAL VOLTAGE REFERENCE (OUTPUT)5 Reference Output Voltage Long-Term Stability Output Voltage Hysteresis6 DCAPA, DCAPB Output Impedance Reference Temperature Coefficient VREF Noise EXTERNAL VOLTAGE REFERENCE (INPUT)5 Reference Input Voltage Range7 DC Leakage Current7 Input Capacitance DIGITAL LOGIC INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current, IIN Input Capacitance, CIN4 Specification Unit Test Conditions/Comments 0 V to VREF 0 V to 2 × VREF 0 to VREF 2 × VREF VCM ± VREF/2 VCM ± VREF ±1 45 10 V V V V V V μA max pF typ pF typ RANGE= low RANGE = high RANGE = low RANGE = high VCM = common-mode voltage3 = VREF/2, RANGE = low VCM = VREF, RANGE = high VA1 to VA6, VB1 to VB6 When in track When in hold 2.5 ± 0.2% 150 50 10 20 20 V @ 25°C, AVDD = 2.7 V to 5.25 V ppm typ For 1000 hours ppm typ Ω typ ppm/°C max 10ppm/°C typ μV rms typ 0.1/AVDD ±2 25 V min/V max See ADC — Typical Performance Characteristics μA max External reference applied to Pin DCAPA/Pin DCAPB pF typ 2.8 0.4 ±15 5 V min V max nA typ pF typ Rev. PrC VIN = 0 V or VDRIVE | Page 54 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Table 45. Operating Conditions (Analog, Voltage Reference, and Logic I/O) (Continued) Parameter DIGITAL LOGIC OUTPUTS Output High Voltage, VOH Output Low Voltage, VOL Floating State Leakage Current Floating State Output Capacitance4 Output Coding8 Specification Unit Test Conditions/Comments VDRIVE – 0.2 0.4 ±1 7 Straight (natural) binary Twos complement V min V max μA max pF typ no DC load (IOH = 0 mA) no DC load (IOL = 0 mA) VIN = 0V or VDRIVE SGL/DIFF = 1 SGL/DIFF = 0; SGL/DIFF = 1 1 VIN– or VIN+ must remain within GND/VDD. VIN– = 0V for specified performance. For full input range on VIN– pin, see Figure 80 and Figure 81. 3 For full common-mode range, see Figure 76 and Figure 77. 4 Sample tested during initial release to ensure compliance. 5 Relates to Pin DCAPA or Pin DCAPB. 6 See ADC — Terminology on Page 60. 7 External voltage reference applied to Pins DCAPA, Pin DCAPB (VREF) 8 See Table 50 and Table 51. 2 Table 46. Operating Conditions (ADC Performance/Accuracy) Parameter DYNAMIC PERFORMANCE Specification Unit Test Conditions/Comments Signal-to-Noise Ratio (SNR) 71 69 dB min dB min fIN = 50 kHz sine wave; differential mode fIN = 50 kHz sine wave; single-ended and pseudo differential modes fIN = 50 kHz sine wave; differential mode Signal-to-(Noise + Distortion) Ratio (SINAD)1 70 dB min 68 dB min Total Harmonic Distortion (THD)1 –77 –73 dB max dB max Spurious-Free Dynamic Range (SFDR)1 Intermodulation Distortion (IMD)1 Second-Order Terms Third-Order Terms Channel-to-Channel Isolation SAMPLE AND HOLD Aperture Delay2 Aperture Jitter2 Aperture Delay Matching2 Full Power Bandwidth –75 dB max –88 –88 –88 dB typ dB typ dB typ 11 50 200 33/26 3.5/3 ns max ps typ ps max MHz typ MHz typ Rev. PrC fIN = 50 kHz sine wave; single-ended and pseudo differential modes fIN = 50 kHz sine wave; differential mode fIN = 50 kHz sine wave; single-ended and pseudo differential modes fIN = 50 kHz sine wave fa = 30 kHz, fb = 50 kHz @ 3 dB, AVDD, DVDD = 5 V/AVDD, DVDD = 3 V @ 0.1 dB, AVDD, DVDD = 5 V/AVDD, DVDD = 3 V | Page 55 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 46. Operating Conditions (ADC Performance/Accuracy) (Continued) Parameter DC ACCURACY Resolution Integral Nonlinearity (INL)1 Differential Nonlinearity (DNL)1, 3 Straight Natural Binary Output Coding Offset Error1 Offset Error Match1 Gain Error1 Gain Error Match1 Twos Complement Output Coding Positive Gain Error1 Positive Gain Error Match1 Zero Code Error1 Zero Code Error Match1 Negative Gain Error1 Negative Gain Error Match1 CONVERSION RATE Conversion Time Track-and-Hold Acquisition Time2 Throughput Rate Specification Unit Test Conditions/Comments 12 ±1 ±1.5 Bits LSB max LSB max ±0.99 –0.99/+1.5 LSB max LSB max TBD TBD TBD TBD LSB max LSB typ LSB max LSB typ TBD TBD TBD LSB max LSB typ LSB max TBD TBD TBD LSB typ LSB max LSB typ 14 90 110 2 ADSCLK cycles 437.5 ns with ADSCLK = 32 MHz ns max Full-scale step input; AVDD, DVDD = 5 V ns max Full-scale step input; AVDD, DVDD = 3 V MSPS max ±0.7 LSB typ; differential mode ±0.9 LSB typ; single-ended and pseudo differential modes Differential mode Single-ended and pseudo differential modes 1 See ADC — Terminology on Page 60. Sample tested during initial release to ensure compliance. 3 Guaranteed no missed codes to 12 bits. 2 Table 47. Operating Conditions (Power1) Parameter POWER SUPPLY REQUIREMENTS VDD VDRIVE IDD Normal Mode (Static) Operational fS = 2 MSPS fS = 1.5 MSPS Partial Power-Down Mode Full Power-Down Mode (VDD) POWER DISSIPATION Normal Mode (Operational) Partial Power-Down (Static) Full Power-Down (Static) 1 Specification Unit Test Conditions/Comments 2.7/5.25 2.7/5.25 V min/V max V min/V max 2.3 mA max 6.4 4 500 2.8 mA max mA max μA max μA max VDD = 5.25 V; 5.7 mA typ VDD = 3.6 V; 3.4 mA typ Static 33.6 2.625 14.7 mW max mW max μW max VDD = 5.25 V VDD = 5.25 V VDD = 5.25 V Digital Logic Inputs = 0 V or VDRIVE VDD = 5.25 V In this table, VDD refers to both AVDD and DVDD. Rev. PrC | Page 56 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F ADC — TIMING SPECIFICATIONS Table 48. Serial Data Interface1 Parameter fADSCLK2 tCONVERT tQUIET t2 t3 t4 3 t5 t6 t7 t8 t9 t10 Limit at TMIN, TMAX 4/32 14 × tADSCLK 437.5 583.3 30 20/30 15 27/36 0.45 tADSCLK 0.45 tADSCLK 5/10 15 30 5/35 Unit MHz min/max ns max ns max ns max ns min ns min ns max ns max ns min ns min ns min ns max ns min ns min/max Description/Conditions tADSCLK = 1/fADSCLK fADSCLK = 32 MHz, fSAMPLE = 2 MSPS; AVDD, DVDD = 5 V fADSCLK = 24 MHz, fSAMPLE = 1.5 MSPS; AVDD, DVDD = 3 V Minimum time between end of serial read and next falling edge of CS CS to ADSCLK setup time; VDRIVE = 5 V/3 V Delay from CS until DOUTA and DOUTB are three-state disabled Data access time after ADSCLK falling edge, VDRIVE = 5 V/3 V ADSCLK low pulse width ADSCLK high pulse width ADSCLK to data valid hold time, VDRIVE = 5 V/3 V CS rising edge to DOUTA, DOUTB, high impedance CS rising edge to falling edge pulse width ADSCLK falling edge to DOUTA, DOUTB, high impedance 1 See also Figure 93 on Page 71 and Figure 94 on Page 71. Minimum ADSCLK for specified performance; with slower ADSCLK frequencies, performance specifications apply typically. 3 The time required for the output to cross 0.4 V or 2.4 V. 2 ADC — ABSOLUTE MAXIMUM RATINGS Stresses above those listed in Table 49 may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 49. Absolute Maximum Ratings Parameter AVDD, DVDD to AGND DVDD to DGND VDRIVE to DGND VDRIVE to AGND AVDD to DVDD AGND to DGND Analog Input Voltage to AGND Digital Input Voltage to DGND Digital Output Voltage to GND VREF to AGND Input Current to Any ADC Pin Except Supplies1 Storage Temperature Range Junction Temperature Under Bias 1 Rating –0.3 V to +7 V –0.3 V to +7 V –0.3 V to DVDD –0.3 V to AVDD –0.3 V to +0.3 V –0.3 V to +0.3 V –0.3 V to AVDD + 0.3 V –0.3 V to +7 V –0.3 V to VDRIVE + 0.3 V –0.3 V to AVDD + 0.3 V ±10 mA –65°C to +150°C +110°C Transient currents of up to 100 mA will not cause latch up. Rev. PrC | Page 57 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data ADC — TYPICAL PERFORMANCE CHARACTERISTICS 4096 POINT FFT VDD = 5V, VDRIVE = 3V FSAMPLE = 2MSPS FIN = 52kHz SINAD = 71.4dB THD = –84.42dB DIFFERENTIAL MODE –10 TA = 25°C, unless otherwise noted. –30 –60 INTERNAL REFERENCE (dB) –50 –70 –70 PSRR (dB) –80 EXTERNAL REFERENCE –90 –90 –110 –100 –110 –120 200 100 200 300 400 500 600 700 FREQUENCY (kHz) 800 900 1000 Figure 59. FFT 100mV p-p SINE WAVE ON AVDD NO DECOUPLING SINGLE-ENDED MODE 0 0 1.0 400 600 800 1000 1200 1400 1600 1800 2000 SUPPLY RIPPLE FREQUENCY (kHz) VDD = 5V, VDRIVE = 3V DIFFERENTIAL MODE 0.8 0.6 Figure 56. PSRR vs. Supply Ripple Frequency Without Supply Decoupling –50 DNL ERROR (LSB) 0.4 VDD = 5V –55 –60 ISOLATION (dB) –65 0.2 0 –0.2 –0.4 –70 –0.6 –75 –0.8 –80 –1.0 –85 0 500 –90 1000 1500 2000 2500 CODE 3000 3500 4000 Figure 60. Typical DNL –95 –100 0 100 200 300 400 500 600 700 NOISE FREQUENCY (kHz) 800 900 1.0 1000 VDD = 5V, VDRIVE = 3V DIFFERENTIAL MODE 0.8 0.6 Figure 57. Channel-to-Channel Isolation 74 VDD = 5V DIFFERENTIAL MODE INL ERROR (LSB) 0.4 RANGE = 0 TO VREF 72 VDD = 3V DIFFERENTIAL MODE SINAD (dB) 70 0.2 0 –0.2 –0.4 –0.6 68 –0.8 66 –1.0 0 64 1000 1500 2000 2500 CODE Figure 61. Typical INL 62 60 500 0 500 1000 1500 2000 INPUT FREQUENCY (kHz) 2500 3000 Figure 58. SINAD vs. Analog Input Frequency for Various Supply Voltages Rev. PrC | Page 58 of 80 | January 2010 3000 3500 4000 Preliminary Technical Data 1.0 10000 VDD = 3V/5V DIFFERENTIAL MODE 0.8 9000 POSITIVE DNL 0.4 POSITIVE INL 0.2 0 –0.2 NEGATIVE INL –0.4 –0.6 7000 6000 5000 4000 3000 1000 0 0.5 1.0 1.5 2.0 0 2046 2.5 2047 2048 Figure 62. Linearity Error vs. VREF 2050 Figure 65. Histogram of Codes for 10k Samples in Differential Mode 12.0 10000 11.5 9000 11.0 INTERNAL REFERENCE SINGLE-ENDED MODE 9984 CODES 8000 NO. OF OCCURRENCES VDD = 5V SINGLE-ENDED MODE 10.5 10.0 VDD = 3V SINGLE-ENDED MODE 9.5 9.0 VDD = 3V DIFFERENTIAL MODE 8.5 VDD = 5V DIFFERENTIAL MODE 8.0 7000 6000 5000 4000 3000 2000 7.5 7.0 2049 CODE VREF (V) EFFECTIVE NUMBER OF BITS DIFFERENTIAL MODE 10000 CODES 2000 NEGATIVE DNL –0.8 –1.0 INTERNAL REFERENCE 8000 NO. OF OCCURRENCES 0.6 LINEARITY ERROR (LSB) ADSP-BF504/F,ADSP-BF506F 1000 0 0.5 1.0 1.5 2.0 2.5 3.0 VREF (V) 3.5 4.0 4.5 0 2046 5.0 5 CODES 2047 11 CODES 2048 2049 2050 CODE Figure 66. Histogram of Codes for 10k Samples in Single-Ended Mode Figure 63. Effective Number of Bits vs. VREF 2.5010 –60 DIFFERENTIAL MODE VDD = 3V/5V –65 2.5005 –70 2.5000 VREF (V) CMRR (dB) –75 2.4995 2.4990 –80 –85 –90 2.4985 2.4980 –95 0 20 40 60 80 100 120 140 CURRENT LOAD (PA) 160 180 Figure 64. VREF vs. Reference Output Current Drive Rev. PrC 200 –100 0 200 400 600 800 RIPPLE FREQUENCY (kHz) 1000 Figure 67. CMRR vs. Common-Mode Ripple Frequency | Page 59 of 80 | January 2010 1200 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data ADC — TERMINOLOGY Differential Nonlinearity (DNL) Differential nonlinearity is the difference between the measured and the ideal 1 LSB change between any two adjacent codes in the ADC. Integral Nonlinearity (INL) Integral nonlinearity is the maximum deviation from a straight line passing through the endpoints of the ADC transfer function. The endpoints of the transfer function are zero scale with a single (1) LSB point below the first code transition, and full scale with a 1 LSB point above the last code transition. Offset Error Offset error applies to straight binary output coding. It is the deviation of the first code transition (00 . . . 000) to (00 . . . 001) from the ideal (AGND + 1 LSB). Offset Error Match Offset error match is the difference in offset error across all 12 channels. Gain Error Gain error applies to straight binary output coding. It is the deviation of the last code transition (111 . . . 110) to (111 . . . 111) from the ideal (VREF 1 LSB) after the offset error is adjusted out. Gain error does not include reference error. Negative Gain Error Match This is the difference in negative gain error across all 12 channels. Track-and-Hold Acquisition Time The track-and-hold amplifier returns to track mode after the end of conversion. Track-and-hold acquisition time is the time required for the output of the track-and-hold amplifier to reach its final value, within ±1/2 LSB, after the end of conversion. Signal-to-(Noise + Distortion) Ratio (SINAD) This ratio is the measured ratio of signal-to-(noise + distortion) at the output of the ADC. The signal is the rms amplitude of the fundamental. Noise is the sum of all nonfundamental signals up to half the sampling frequency (fS/2), excluding dc. The ratio is dependent on the number of quantization levels in the digitalization process; the more levels, the smaller the quantization noise. The theoretical signal-to(noise + distortion) ratio for an ideal N-bit converter with a sine wave input is given by Signal-to-(Noise + Distortion) = (6.02N + 1.76) dB Therefore, for a 12-bit converter, theoretical SINAD is 74 dB. Total Harmonic Distortion (THD) Total harmonic distortion is the ratio of the rms sum of harmonics to the fundamental. For the ADC, it is defined as Gain Error Match Gain error match is the difference in gain error across all 12 channels. Positive Gain Error This applies when using twos complement output coding with, for example, the 2 × VREF input range as –VREF to +VREF biased about the VREF point. It is the deviation of the last code transition (011…110) to (011…111) from the ideal (+VREF 1 LSB) after the zero code error is adjusted out. Positive Gain Error Match This is the difference in positive gain error across all 12 channels. Zero Code Error Zero code error applies when using twos complement output coding with, for example, the 2 × VREF input range as –VREF to +VREF biased about the VREF point. It is the deviation of the mid-scale transition (all 0s to all 1s) from the ideal VIN voltage (VREF). Zero Code Error Match Zero code error match refers to the difference in zero code error across all 12 channels. Negative Gain Error This applies when using twos complement output coding option, in particular the 2 × VREF input range as –VREF to +VREF biased about the VREF point. It is the deviation of the first code transition (100…000) to (100…001) from the ideal (that is, –VREF + 1 LSB) after the zero code error is adjusted out. Rev. PrC THD(dB) = 20 log V22 + V32 + V4 2 + V52 + V62 V1 where: V1 is the rms amplitude of the fundamental. V2, V3, V4, V5, and V6 are the rms amplitudes of the second through the sixth harmonics. Effective Number of Bits (ENOB) This is a figure of merit which characterizes the dynamic performance of the ADC at a specified input frequency and sampling rate. ENOB is expressed in bits. For a full scale sinusoidal input, ENOB is defined as: ENOB = (SINAD – 1.76)/6.02. Peak Harmonic or Spurious Noise (SFDR) Peak harmonic, or spurious noise, is defined as the ratio of the rms value of the next largest component in the ADC output spectrum (up to fS/2, excluding dc) to the rms value of the fundamental. Normally, the value of this specification is determined by the largest harmonic in the spectrum, but for ADCs where the harmonics are buried in the noise floor, it is a noise peak. Channel-to-Channel Isolation Channel-to-channel isolation is a measure of the level of crosstalk between channels. It is measured by applying a fullscale (2 × VREF when VDD = 5 V, VREF when VDD = 3 V), 10 kHz sine wave signal to all un-selected input channels and | Page 60 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F determining how much that signal is attenuated in the selected channel with a 50 kHz signal (0 V to VREF). The result obtained is the worst-case across all 12 channels for the ADC. Intermodulation Distortion (IMD) With inputs consisting of sine waves at two frequencies, fa and fb, any active device with non-linearities create distortion products at sum, and difference frequencies of mfa ± nfb where m, n = 0, 1, 2, 3, and so on. Intermodulation distortion terms are those for which neither m nor n are equal to zero. For example, the second-order terms include (fa + fb) and (fa fb), while the third-order terms include (2fa + fb), (2fa fb), (fa + 2fb), and (fa 2fb). The ADC is tested using the CCIF standard where two input frequencies near the top end of the input bandwidth are used. In this case, the second-order terms are usually distanced in frequency from the original sine waves, while the third-order terms are usually at a frequency close to the input frequencies. As a result, the second-order and third-order terms are specified separately. The calculation of the inter-modulation distortion is as per the THD specification, where it is the ratio of the rms sum of the individual distortion products to the rms amplitude of the sum of the fundamentals expressed in dBs. Common-Mode Rejection Ratio (CMRR) CMRR is defined as the ratio of the power in the ADC output at full-scale frequency, f, to the power of a 100 mV p-p sine wave applied to the common-mode voltage of VIN+ and VIN of frequency fS as CMRR (dB) = 10 log(Pf/PfS) where: Pf is the power at frequency f in the ADC output. where: VREF (25°C) is VREF at 25°C. VREF (T_HYS) is the maximum change of VREF at T_HYS+ or T_HYS. ADC — THEORY OF OPERATION The following sections describe the ADC theory of operation. Circuit Information The ADC is a fast, micro-power, dual, 12-bit, single-supply, ADC that operates from a 2.7 V to a 5.25 V supply. When operated from a 5 V supply, the ADC is capable of throughput rates of up to 2 MSPS when provided with a 32 MHz clock, and a throughput rate of up to 1.5 MSPS at 3 V. The ADC contains two on-chip, differential track-and-hold amplifiers, two successive approximation ADCs, and a serial interface with two separate data output pins. The serial clock input accesses data from the part but also provides the clock source for each successive approximation ADC. The analog input range for the part can be selected to be a 0 V to VREF input or a 2 × VREF input, configured with either singleended or differential analog inputs. The ADC has an on-chip 2.5 V reference that can be overdriven when an external reference is preferred. If the internal reference is to be used elsewhere in a system, then the output needs to buffered first. The ADC also features power-down options to allow power saving between conversions. The power-down feature is implemented via the standard serial interface, as described in the ADC — Modes of Operation section. Converter Operation PfS is the power at frequency fS in the ADC output. Power Supply Rejection Ratio (PSRR) Variations in power supply affect the full-scale transition but not the converter’s linearity. PSRR is the maximum change in the full-scale transition point due to a change in power supply voltage from the nominal value (see Figure 56 (PSRR vs. Supply Ripple Frequency Without Supply Decoupling). Thermal Hysteresis Thermal hysteresis is defined as the absolute maximum change of reference output voltage after the device is cycled through temperature from either The ADC has two successive approximation ADCs, each based around two capacitive DACs. Figure 68 (ADC Acquisition Phase) and Figure 69 (ADC Conversion Phase) show simplified schematics of one of these ADCs in acquisition and conversion phase, respectively. The ADC is comprised of control logic, a SAR, and two capacitive DACs. In Figure 68 (ADC Acquisition Phase) (the acquisition phase), SW3 is closed, SW1 and SW2 are in Position A, the comparator is held in a balanced condition, and the sampling capacitor arrays acquire the differential signal on the input. T_HYS+ = +25°C to TMAX to +25°C or CAPACITIVE DAC T_HYS = +25°C to TMIN to +25°C VHYS ( ppm) = CS B It is expressed in ppm by VIN+ VREF (25°C) − VREF (T _ HYS) × 10 6 VREF (25°C) VIN– A SW1 A SW2 CS COMPARATOR CONTROL LOGIC SW3 B VREF CAPACITIVE DAC Figure 68. ADC Acquisition Phase Rev. PrC | Page 61 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data When the ADC starts a conversion (see Figure 69 (ADC Conversion Phase)), SW3 opens and SW1 and SW2 move to Position B, causing the comparator to become unbalanced. Both inputs are disconnected once the conversion begins. The control logic and the charge redistribution DACs are used to add and subtract fixed amounts of charge from the sampling capacitor arrays to bring the comparator back into a balanced condition. When the comparator is rebalanced, the conversion is complete. The control logic generates the ADC output code. The output impedances of the sources driving the VIN+ and VIN– pins must be matched; otherwise, the two inputs will have different settling times, resulting in errors. CAPACITIVE DAC VIN– COMPARATOR CS B VIN+ A SW1 A SW2 B VREF For ac applications, removing high frequency components from the analog input signal is recommended by the use of an RC low-pass filter on the relevant analog input pins with optimum values of 47 Ω and 10 pF. In applications where harmonic distortion and signal-to-noise ratio are critical, the analog input should be driven from a low impedance source. Large source impedances significantly affect the ac performance of the ADC and may necessitate the use of an input buffer amplifier. The choice of the op amp is a function of the particular application. When no amplifier is used to drive the analog input, the source impedance should be limited to low values. The maximum source impedance depends on the amount of THD that can be tolerated. CONTROL LOGIC SW3 CS The C1 capacitors in Figure 70 (Equivalent Analog Input Circuit, Conversion Phase—Switches Open, Track Phase— Switches Closed) are typically 4 pF and can primarily be attributed to pin capacitance. The resistors are lumped components made up of the on resistance of the switches. The value of these resistors is typically about 100 Ω. The C2 capacitors are the ADC’s sampling capacitors with a capacitance of 45 pF typically. CAPACITIVE DAC Figure 69. ADC Conversion Phase Analog Input Structure Figure 70 (Equivalent Analog Input Circuit, Conversion Phase—Switches Open, Track Phase—Switches Closed) shows the equivalent circuit of the analog input structure of the ADC in differential/pseudo differential mode. In single-ended mode, VIN is internally tied to AGND. The four diodes provide ESD protection for the analog inputs. Care must be taken to ensure that the analog input signals never exceed the supply rails by more than 300 mV. This causes these diodes to become forward-biased and starts conducting into the substrate. These diodes can conduct up to 10 mA without causing irreversible damage to the part. The THD increases as the source impedance increases and performance degrades. Figure 71 (THD vs. Analog Input Frequency for Various Source Impedances, Single-Ended Mode shows a graph of the THD vs. the analog input signal frequency for different source impedances in single-ended mode, while Figure 72 (THD vs. Analog Input Frequency for Various Source Impedances, Differential Mode) shows the THD vs. the analog input signal frequency for different source impedances in differential mode. Figure 73 (THD vs. Analog Input Frequency for Various Supply Voltages) shows a graph of the THD vs. the analog input frequency for various supplies while sampling at 2 MSPS. In this case, the source impedance is 47 Ω. –50 FSAMPLE = 1.5MSPS VDD = 3V –55 RANGE = 0V TO VREF RSOURCE = 300 –60 VDD R1 C2 VIN+ C1 THD (dB) –65 D D VDD D VIN– C1 RSOURCE = 0 –70 RSOURCE = 100 –75 RSOURCE = 47 –80 RSOURCE = 10 –85 R1 C2 –90 D Figure 70. Equivalent Analog Input Circuit, Conversion Phase—Switches Open, Track Phase—Switches Closed Rev. PrC 0 100 200 300 400 INPUT FREQUENCY (kHz) 500 600 Figure 71. THD vs. Analog Input Frequency for Various Source Impedances, Single-Ended Mode | Page 62 of 80 | January 2010 Preliminary Technical Data –60 FSAMPLE = 1.5MSPS VDD = 3V RANGE = 0V TO VREF –65 RSOURCE = 0 THD (dB) –70 ADSP-BF504/F,ADSP-BF506F +2.5V RSOURCE = 300 R +1.25V 0V VIN VA1 3R –1.25V RSOURCE = 100 ADC1 VREF R VB6 (DCAPA/DCAPB) –75 0.47μF –80 RSOURCE = 47 –85 1ADDITIONAL PINS OMITTED FOR CLARITY. RSOURCE = 10 –90 0 100 200 300 400 500 600 700 INPUT FREQUENCY (kHz) 800 900 1000 Figure 74. Single-Ended Mode Connection Diagram Differential Mode Figure 72. THD vs. Analog Input Frequency for Various Source Impedances, Differential Mode The ADC can have a total of six differential analog input pairs. Differential signals have some benefits over single-ended signals, including noise immunity based on the device’s commonmode rejection and improvements in distortion performance. Figure 75 (Differential Input Definition) defines the fully differential analog input of the ADC. –50 FSAMPLE = 1.5MSPS/2MSPS VDD = 3V/5V –55 RANGE = 0 TO VREF VDD = 3V SINGLE-ENDED MODE –60 –65 THD (dB) 0V R VREF p-p –70 VDD = 3V DIFFERENTIAL MODE COMMON MODE VOLTAGE –75 VIN+ ADC1 VREF p-p VIN– –80 –85 –90 VDD = 5V SINGLE-ENDED MODE 0 100 200 1ADDITIONAL VDD = 5V DIFFERENTIAL MODE 300 400 500 600 700 INPUT FREQUENCY (kHz) PINS OMITTED FOR CLARITY. Figure 75. Differential Input Definition 800 900 1000 Figure 73. THD vs. Analog Input Frequency for Various Supply Voltages Analog Inputs The ADC has a total of 12 analog inputs. Each on-board ADC has six analog inputs that can be configured as six single-ended channels, three pseudo differential channels, or three fully differential channels. These may be selected as described in the Analog Input Selection section. Single-Ended Mode The ADC can have a total of 12 single-ended analog input channels. In applications where the signal source has high impedance, it is recommended to buffer the analog input before applying it to the ADC. The analog input range can be programmed to be either 0 to VREF or 0 to 2 × VREF. If the analog input signal to be sampled is bipolar, the internal reference of the ADC can be used to externally bias up this signal to make it correctly formatted for the ADC. Figure 74 shows a typical connection diagram when operating the ADC in single-ended mode. Rev. PrC The amplitude of the differential signal is the difference between the signals applied to the VIN+ and VIN– pins in each differential pair (VIN+ VIN–). VIN+ and VIN– should be simultaneously driven by two signals each of amplitude VREF (or 2 × VREF, depending on the range chosen) that are 180° out of phase. The amplitude of the differential signal is, therefore (assuming the 0 to VREF range is selected) –VREF to +VREF peak-to-peak (2 × VREF), regardless of the common mode (CM). The common mode is the average of the two signals (VIN+ + VIN–)/2 and is, therefore, the voltage on which the two inputs are centered. This results in the span of each input being CM ± VREF/2. This voltage has to be set up externally and its range varies with the reference value, VREF. As the value of VREF increases, the common-mode range decreases. When driving the inputs with an amplifier, the actual common-mode range is determined by the amplifier’s output voltage swing. Figure 76 (Input Common-Mode Range vs. VREF (0 to VREF Range, VDD = 5 V)) and Figure 77 (Input Common-Mode Range vs. VREF (2 × VREF Range, VDD = 5 V)) show how the common-mode range typically varies with VREF for a 5 V power | Page 63 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data supply using the 0 to VREF range or 2 × VREF range, respectively. The common mode must be in this range to guarantee the functionality of the ADC. When a conversion takes place, the common mode is rejected, resulting in a virtually noise free signal of amplitude –VREF to +VREF corresponding to the digital codes of 0 to 4096. If the 2 × VREF range is used, then the input signal amplitude extends from – 2 VREF to +2 VREF after conversion. 3.5 TA = 25°C COMMON-MODE RANGE (V) 2.5 2.0 1.5 1.0 0.5 0 0.5 1.0 1.5 2.0 2.5 3.0 VREF (V) 3.5 4.0 4.5 5.0 Figure 76. Input Common-Mode Range vs. VREF (0 to VREF Range, VDD = 5 V) 5.0 An op amp pair can be used to directly couple a differential signal to one of the analog input pairs of the ADC. The circuit configurations illustrated in Figure 78 (Dual Op Amp Circuit to Convert a Single-Ended Unipolar Signal into a Differential Signal) and Figure 79 (Dual Op Amp Circuit to Convert a SingleEnded Bipolar Signal into a Differential Unipolar Signal) show how a dual op amp can be used to convert a single-ended signal into a differential signal for both a bipolar and unipolar input signal, respectively. The voltage applied to Point A sets up the common-mode voltage. In both diagrams, it is connected in some way to the reference, but any value in the common-mode range can be input here to set up the common mode. The AD8022 is a suitable dual op amp that can be used in this configuration to provide differential drive to the ADC. 3.0 0 Using an Op Amp Pair TA = 25°C Take care when choosing the op amp; the selection depends on the required power supply and system performance objectives. The driver circuits in Figure 78 (Dual Op Amp Circuit to Convert a Single-Ended Unipolar Signal into a Differential Signal) and Figure 79 (Dual Op Amp Circuit to Convert a Single-Ended Bipolar Signal into a Differential Unipolar Signal) are optimized for dc coupling applications requiring best distortion performance. The circuit configuration shown in Figure 78 (Dual Op Amp Circuit to Convert a Single-Ended Unipolar Signal into a Differential Signal) converts a unipolar, single-ended signal into a differential signal. 4.5 2 × VREF p–p COMMON-MODE RANGE (V) 4.0 3.5 VREF 3.0 GND 220 440 V+ 220 220 2.0 V+ 1.5 A 1.0 0.5 0 0.5 1.0 1.5 2.0 VIN+ ADC1 V– 2.5 0 27 3.75V 2.5V 1.25V V– 27 10k 3.75V 2.5V 1.25V VREF VIN– (DCAPA/DCAPB) 0.47μF 2.5 VREF (V) 1ADDITIONAL PINS OMITTED FOR CLARITY. Figure 77. Input Common-Mode Range vs. VREF (2 × VREF Range, VDD = 5 V) Figure 78. Dual Op Amp Circuit to Convert a Single-Ended Unipolar Signal into a Differential Signal Driving Differential Inputs Differential operation requires that VIN+ and VIN– be simultaneously driven with two equal signals that are 180° out of phase. The common mode must be set up externally. The commonmode range is determined by VREF, the power supply, and the particular amplifier used to drive the analog inputs. Differential modes of operation with either an ac or dc input provide the best THD performance over a wide frequency range. Because not all applications have a signal preconditioned for differential operation, there is often a need to perform single-ended-to-differential conversion. Rev. PrC The differential op amp driver circuit shown in Figure 79 (Dual Op Amp Circuit to Convert a Single-Ended Bipolar Signal into a Differential Unipolar Signal) is configured to convert and level shift a single-ended, ground-referenced (bipolar) signal to a differential signal centered at the VREF level of the ADC. Pseudo Differential Mode The ADC can have a total of six pseudo differential pairs. In this mode, VIN+ is connected to the signal source that must have an amplitude of VREF (or 2 × VREF, depending on the range chosen) | Page 64 of 80 | January 2010 Preliminary Technical Data 2 × VREF p–p 440 GND 3.75V 220 V+ ADSP-BF504/F,ADSP-BF506F 2.5 2.5V 1.25V 27 VIN+ ADC 1 TA = 25°C 2.0 V– 220 220 V+ A V– 1.5 3.75V 2.5V VREF 1.25V 27 VIN– (DCAPA/DCAPB) VIN– (V) 220k 1.0 0.5 10k 0.47μF 20k 0 1ADDITIONAL PINS OMITTED FOR CLARITY. –0.5 0 Figure 79. Dual Op Amp Circuit to Convert a Single-Ended Bipolar Signal into a Differential Unipolar Signal to make use of the full dynamic range of the part. A dc input is applied to the VIN– pin. The voltage applied to this input provides an offset from ground or a pseudo ground for the VIN+ input. The benefit of pseudo differential inputs is that they separate the analog input signal ground from the ADC’s ground allowing dc common-mode voltages to be cancelled. 0.5 1.0 1.5 2.0 2.5 3.0 VREF (V) 3.5 4.0 4.5 5.0 Figure 81. VIN– Input Voltage Range vs. VREF in Pseudo Differential Mode with VDD = 5 V VREF p–p The typical voltage range for the VIN– pin, while in pseudo differential mode, is shown in Figure 80 (VIN– Input Voltage Range vs. VREF in Pseudo Differential Mode with VDD = 3 V) and Figure 81 (VIN– Input Voltage Range vs. VREF in Pseudo Differential Mode with VDD = 5 V). Figure 82 (Pseudo Differential Mode Connection Diagram) shows a connection diagram for pseudo differential mode. VIN+ DC INPUT VOLTAGE ADC1 VIN– VREF (DCAPA/DCAPB) 0.47μF 1ADDITIONAL PINS OMITTED FOR CLARITY. Figure 82. Pseudo Differential Mode Connection Diagram 1.0 TA = 25°C Analog Input Selection 0.8 VIN– (V) 0.6 0.4 0.2 0 –0.2 –0.4 0 0.5 1.0 1.5 VREF (V) 2.0 2.5 Figure 80. VIN- Input Voltage Range vs. VREF in Pseudo Differential Mode with VDD = 3 V 3.0 The analog inputs of the ADC can be configured as singleended or true differential via the SGL/DIFF logic pin, as shown in Figure 83 (Selecting Differential or Single-Ended Configuration). If this pin is tied to a logic low, the analog input channels to each on-chip ADC are set up as three true differential pairs. If this pin is at logic high, the analog input channels to each onchip ADC are set up as six single-ended analog inputs. The required logic level on this pin needs to be established prior to the acquisition time and remain unchanged during the conversion time until the track-and-hold has returned to track. The track-and-hold returns to track on the 13th rising edge of ADSCLK after the CS falling edge (see Figure 93 (Serial Interface Timing Diagram)). If the level on this pin is changed, it will be recognized by the ADC; therefore, it is necessary to keep the same logic level during acquisition and conversion to avoid corrupting the conversion in progress. For example, in Figure 83 (Selecting Differential or SingleEnded Configuration) the SGL/DIFF pin is set at logic high for the duration of both the acquisition and conversion times so the analog inputs are configured as single ended for that conversion (Sampling Point A). The logic level of the SGL/DIFF changed to low after the track-and-hold returned to track and prior to the Rev. PrC | Page 65 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data required acquisition time for the next sampling instant at Point B; therefore, the analog inputs are configured as differential for that conversion. A 1 The analog input range of the ADC can be selected as 0 V to VREF or 0 V to 2 × VREF via the RANGE pin. This selection is made in a similar fashion to that of the SGL/DIFF pin by setting the logic state of the RANGE pin a time tacq prior to the falling edge of CS. Subsequent to this, the logic level on this pin can be altered after the third falling edge of ADSCLK. If this pin is tied to a logic low, the analog input range selected is 0 V to VREF. If this pin is tied to a logic high, the analog input range selected is 0 V to 2 × VREF. B tACQ CS 14 1 acquisition time would start again from this point. The selected input channels are decoded as shown in Table 51 (Analog Input Type and Channel Selection). 14 ADSCLK SGL/DIFF Figure 83. Selecting Differential or Single-Ended Configuration The channels used for simultaneous conversions are selected via the multiplexer address input pins, A0 to A2. The logic states of these pins also need to be established prior to the acquisition time; however, they may change during the conversion time provided the mode is not changed. If the mode is changed from fully differential to pseudo differential, for example, then the Output Coding The ADC output coding is set to either twos complement or straight binary, depending on which analog input configuration is selected for a conversion. Table 50 (ADC Output Coding) shows which output coding scheme is used for each possible analog input configuration. Table 50. ADC Output Coding SGL/DIFF 0 0 1 1 0 0 (Differential Input) (Differential Input) (Single-Ended Input) (Single-Ended Input) (Pseudo-Differential Input) (Pseudo-Differential Input) RANGE 0 1 0 1 0 1 (0 V to VREF) (0 V to 2 × VREF) (0 V to VREF) (0 V to2 × VREF) (0 V to VREF) (0 V to 2 × VREF) Output Coding Twos complement Twos complement Straight binary Twos complement Straight binary Twos complement Table 51. Analog Input Type and Channel Selection SGL/DIFF 1 1 1 1 1 1 0 0 0 0 0 0 A2 0 0 0 0 1 1 0 0 0 0 1 1 A1 0 0 1 1 0 0 0 0 1 1 0 0 A0 0 1 0 1 0 1 0 1 0 1 0 1 ADC A VIN+ VA1 VA2 VA3 VA4 VA5 VA6 VA1 VA1 VA3 VA3 VA5 VA5 VIN– AGND AGND AGND AGND AGND AGND VA2 VA2 VA4 VA4 VA6 VA6 ADC B VIN+ VB1 VB2 VB3 VB4 VB5 VB6 VB1 VB1 VB3 VB3 VB5 VB5 VIN– AGND AGND AGND AGND AGND AGND VB2 VB2 VB4 VB4 VB6 VB6 Comment Single ended Single ended Single ended Single ended Single ended Single ended Fully differential Pseudo differential Fully differential Pseudo differential Fully differential Pseudo differential Transfer Functions The designed code transitions occur at successive integer LSB values (1 LSB, 2 LSB, and so on). In single-ended mode, the LSB size is VREF/4096 when the 0 V to VREF range is used, and the LSB size is 2 × VREF/4096 when the 0 V to 2 × VREF range is used. In differential mode, the LSB size is 2 × VREF /4096 when the 0 V to VREF range is used, and the LSB size is 4 × VREF/4096 when the 0 V to 2 × VREF range is used. The ideal transfer characteristic for Rev. PrC the ADC when straight binary coding is output is shown in Figure 84 (Straight Binary Transfer Characteristic), and the ideal transfer characteristic for the ADC when twos complement coding is output is shown in Figure 85 (Twos Complement Transfer Characteristic with VREF ± VREF Input Range) (this is shown with the 2 × VREF range). | Page 66 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F agement options. These options can be chosen to optimize the power dissipation/throughput rate ratio for differing application requirements. 111...111 ADC CODE 111...110 Normal Mode This mode is intended for applications needing fastest throughput rates because the user does not have to worry about any power-up times with the ADC remaining fully powered at all times. Figure 86 (Normal Mode Operation) shows the general diagram of the operation of the ADC in this mode. 111...000 1LSB = VREF/4096 011...111 000...010 000...001 000...000 VREF – 1LSB 0V 1LSB CS ANALOG INPUT 1 NOTE 1. VREF IS EITHER VREF OR 2 × VREF. DOUTA DOUTB Figure 84. Straight Binary Transfer Characteristic 011...111 011...110 ADC CODE 14 LEADING ZEROS + CONVERSION RESULT Figure 86. Normal Mode Operation 1LSB = 2 u VREF/4096 000...001 000...000 111...111 100...010 100...001 100...000 –VREF + 1LSB VREF – 1LSB 10 ADSCLK +VREF – 1 LSB ANALOG INPUT Figure 85. Twos Complement Transfer Characteristic with VREF ± VREF Input Range Serial Interface Voltage Drive The ADC also has a VDRIVE feature to control the voltage at which the serial interface operates. VDRIVE allows the ADC to easily interface to both 3 V and 5 V processors. For example, if the ADC was operated with a AVDD/DVDD of 5 V, the VDRIVE pin could be powered from a 3 V supply, best ADC performance low voltage digital processors. Therefore, the ADC could be used with the 2 × VREF input range, with a AVDD/DVDD of 5 V while still being able to serial interface to 3 V digital I/O parts. ADC — MODES OF OPERATION The mode of operation of the ADC is selected by controlling the (logic) state of the CS signal during a conversion. There are three possible modes of operation: normal mode, partial powerdown mode, and full power-down mode. After a conversion is initiated, the point at which CS is pulled high determines which power-down mode, if any, the device enters. Similarly, if already in a power-down mode, CS can control whether the device returns to normal operation or remains in power-down. These modes of operation are designed to provide flexible power man- Rev. PrC The conversion is initiated on the falling edge of CS, as described in the ADC — Serial Interface section. To ensure that the part remains fully powered up at all times, CS must remain low until at least 10 ADSCLK falling edges have elapsed after the falling edge of CS. If CS is brought high any time after the 10th ADSCLK falling edge but before the 14th ADSCLK falling edge, the part remains powered up, but the conversion is terminated and DOUTA and DOUTB go back into three-state. Fourteen serial clock cycles are required to complete the conversion and access the conversion result. The DOUT line does not return to threestate after 14 ADSCLK cycles have elapsed, but instead does so when CS is brought high again. If CS is left low for another 2 ADSCLK cycles (for example, if only a 16 ADSCLK burst is available), two trailing zeros are clocked out after the data. If CS is left low for a further 14 (or16) ADSCLK cycles, the result from the other ADC on board is also accessed on the same DOUT line, as shown in Figure 94 (Reading Data from Both ADCs on One DOUT Line with 32 ADSCLKs). See the ADC — Serial Interface section. Once 32 ADSCLK cycles have elapsed, the DOUT line returns to three-state on the 32nd ADSCLK falling edge. If CS is brought high prior to this, the DOUT line returns to three-state at that point. Therefore, CS may idle low after 32 ADSCLK cycles until it is brought high again sometime prior to the next conversion (effectively idling CS low), if so desired, because the bus still returns to three-state upon completion of the dual result read. Once a data transfer is complete and DOUTA and DOUTB have returned to three-state, another conversion can be initiated after the quiet time, tQUIET, has elapsed by bringing CS low again (assuming the required acquisition time is allowed). Partial Power-Down Mode This mode is intended for use in applications where slower throughput rates are required. Either the ADC is powered down between each conversion, or a series of conversions may be performed at a high throughput rate, and the ADC is then powered | Page 67 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data down for a relatively long duration between these bursts of several conversions. When the ADC is in partial power-down, all analog circuitry is powered down except for the on-chip reference and reference buffer. again on the rising edge of CS. If the ADC is already in partial power-down mode and CS is brought high between the second and 10th falling edges of ADSCLK, the device enters full powerdown mode. To enter partial power-down mode, the conversion process must be interrupted by bringing CS high anywhere after the second falling edge of ADSCLK and before the 10th falling edge of ADSCLK, as shown in Figure 87 (Entering Partial Power-Down Mode). Once CS is brought high in this window of ADSCLKs, the part enters partial power-down, the conversion that was initiated by the falling edge of CS is terminated, and DOUTA and DOUTB go back into three-state. If CS is brought high before the second ADSCLK falling edge, the part remains in normal mode and does not power down. This avoids accidental power-down due to glitches on the CS line. Full Power-Down Mode This mode is intended for use in applications where throughput rates slower than those in the partial power-down mode are required, as power-up from a full power-down takes substantially longer than that from partial power-down. This mode is more suited to applications where a series of conversions performed at a relatively high throughput rate are followed by a long period of inactivity and thus power-down. When the ADC is in full power-down, all analog circuitry is powered down. Full power-down is entered in a similar way as partial power-down, except the timing sequence shown in Figure 87 (Entering Partial Power-Down Mode) must be executed twice. The conversion process must be interrupted in a similar fashion by bringing CS high anywhere after the second falling edge of ADSCLK and before the 10th falling edge of ADSCLK. The device enters partial power-down at this point. To reach full power-down, the next conversion cycle must be interrupted in the same way, as shown in Figure 89 (Entering Full Power-Down Mode). Once CS is brought high in this window of ADSCLKs, the part completely powers down. CS 1 2 10 14 ADSCLK DOUTA DOUTB THREE-STATE Figure 87. Entering Partial Power-Down Mode Note that it is not necessary to complete the 14 ADSCLKs once CS is brought high to enter a power-down mode. To exit this mode of operation and power up the ADC again, a dummy conversion is performed. On the falling edge of CS, the device begins to power up and continues to power up as long as CS is held low until after the falling edge of the 10th ADSCLK. The device is fully powered up after approximately 1 μs has elapsed, and valid data results from the next conversion, as shown in Figure 88 (Exiting Partial Power-Down Mode). If CS is brought high before the second falling edge of ADSCLK, the ADC again goes into partial power-down. This avoids accidental power-up due to glitches on the CS line. Although the device may begin to power up on the falling edge of CS, it powers down THE PART BEGINS TO POWER UP. To exit full power-down and power up the ADC, a dummy conversion is performed, as when powering up from partial powerdown. On the falling edge of CS, the device begins to power up and continues to power up, as long as CS is held low until after the falling edge of the 10th ADSCLK. The required power-up time must elapse before a conversion can be initiated, as shown in Figure 90 (Exiting Full Power-Down Mode). See the PowerUp Times section for the power-up times associated with the ADC. THE PART IS FULLY POWERED UP; SEE POWER-UP TIMES SECTION. tPOWER-UP1 CS ADSCLK DOUTA DOUTB 1 10 14 INVALID DATA 14 VALID DATA Figure 88. Exiting Partial Power-Down Mode Rev. PrC 1 | Page 68 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F THE PART ENTERS PARTIAL POWER DOWN. THE PART BEGINS TO POWER UP. THE PART ENTERS FULL POWER DOWN. CS ADSCLK 1 2 DOUTA DOUTB 10 14 1 2 THREE-STATE INVALID DATA 10 INVALID DATA 14 THREE-STATE Figure 89. Entering Full Power-Down Mode THE PART BEGINS TO POWER UP. THE PART IS FULLY POWERED UP, SEE POWER-UP TIMES SECTION. tPOWER-UP2 CS ADSCLK DOUTA DOUTB 14 10 1 14 1 INVALID DATA VALID DATA Figure 90. Exiting Full Power-Down Mode Power-Up Times As described in detail, the ADC has two power-down modes, partial power-down and full power-down. This section deals with the power-up time required when coming out of either of these modes. It should be noted that the power-up times, as explained in this section, apply with the recommended capacitors in place on the DCAPA and DCAPB pins. To power up from full power-down, approximately 1.5 ms should be allowed from the falling edge of CS, shown as tPOWER-UP2 in Figure 90 (Exiting Full Power-Down Mode). Powering up from partial power-down requires much less time. The power-up time from partial power-down is typically 1 μs; however, if using the internal reference, then the ADC must be in partial power-down for at least 67 μs in order for this power-up time to apply. When power supplies are first applied to the ADC, the ADC may power up in either of the power-down modes or normal mode. Because of this, it is best to allow a dummy cycle to elapse to ensure the part is fully powered up before attempting a valid conversion. Likewise, if it is intended to keep the part in the partial power-down mode immediately after the supplies are applied, then two dummy cycles must be initiated. The first dummy cycle must hold CS low until after the 10th ADSCLK falling edge (see Figure 86 (Normal Mode Operation)); in the second cycle, CS must be brought high before the 10th ADSCLK edge but after the second ADSCLK falling edge (see Figure 87 (Entering Partial Power-Down Mode)). Alternatively, if it is intended to place the part in full power-down mode when the supplies are applied, then three dummy cycles must be initiated. Rev. PrC The first dummy cycle must hold CS low until after the 10th ADSCLK falling edge (see Figure 86 (Normal Mode Operation)); the second and third dummy cycles place the part in full power-down (see Figure 89 (Entering Full Power-Down Mode)). Once supplies are applied to the ADC, enough time must be allowed for any external reference to power up and charge the various reference buffer decoupling capacitors to their final values. Power vs. Throughput Rate The power consumption of the ADC varies with the throughput rate. When using very slow throughput rates and as fast an ADSCLK frequency as possible, the various power-down options can be used to make significant power savings. However, the ADC quiescent current is low enough that even without using the power-down options, there is a noticeable variation in power consumption with sampling rate. This is true whether a fixed ADSCLK value is used or if it is scaled with the sampling rate. Figure 91 (Power vs. Throughput in Normal Mode with VDD = 3 V) and Figure 92 (Power vs. Throughput in Normal Mode with VDD = 5 V) show plots of power vs. the throughput rate when operating in normal mode for a fixed | Page 69 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data maximum ADSCLK frequency and an ADSCLK frequency that scales with the sampling rate with VDD = 3 V and VDD = 5 V, respectively. In all cases, the internal reference was used. 10.0 Likewise, if CS is held low for a further 14 (or 16) ADSCLK cycles on DOUTB, the data from Conversion A is output on DOUTB. TA = 25°C 9.5 This is illustrated in Figure 94 (Reading Data from Both ADCs on One DOUT Line with 32 ADSCLKs) where the case for DOUTA is shown. In this case, the DOUT line in use goes back into three-state on the 32nd ADSCLK falling edge or the rising edge of CS, whichever occurs first. 9.0 POWER (mW) 8.5 VARIABLE ADSCLK 8.0 7.5 7.0 24MHz ADSCLK 6.5 6.0 5.5 5.0 0 200 400 600 800 1000 THROUGHPUT (kSPS) 1200 1400 Figure 91. Power vs. Throughput in Normal Mode with VDD = 3 V 30 TA = 25°C 28 26 POWER (mW) 24 VARIABLE ADSCLK 22 20 32MHz ADSCLK 18 16 14 12 10 0 200 400 not brought high but is instead held low for a further 14 (or 16) ADSCLK cycles on DOUTA, the data from Conversion B is output on DOUTA (followed by two trailing zeros). 600 800 1000 1200 1400 1600 1800 2000 THROUGHPUT (kSPS) A minimum of 14 serial clock cycles are required to perform the conversion process and to access data from one conversion on either data line of the ADC. CS going low provides the leading zero to be read in by the microcontroller or DSP. The remaining data is then clocked out by subsequent ADSCLK falling edges, beginning with a second leading zero. Thus, the first falling clock edge on the serial clock has the leading zero provided and also clocks out the second leading zero. The 12-bit result then follows with the final bit in the data transfer valid on the 14th falling edge, having being clocked out on the previous (13th) falling edge. In applications with a slower ADSCLK, it may be possible to read in data on each ADSCLK rising edge depending on the ADSCLK frequency. The first rising edge of ADSCLK after the CS falling edge would have the second leading zero provided, and the 13th rising ADSCLK edge would have DB0 provided. Note that with fast ADSCLK values, and thus short ADSCLK periods, in order to allow adequately for t2, an ADSCLK rising edge may occur before the first ADSCLK falling edge. This rising edge of ADSCLK may be ignored for the purposes of the timing descriptions in this section. If a falling edge of ADSCLK is coincident with the falling edge of CS, then this falling edge of ADSCLK is not acknowledged by the ADC, and the next falling edge of ADSCLK will be the first registered after the falling edge of CS. Figure 92. Power vs. Throughput in Normal Mode with VDD = 5 V ADC — SERIAL INTERFACE Figure 93 (Serial Interface Timing Diagram) shows the detailed timing diagram for serial interfacing to the ADC. The serial clock provides the conversion clock and controls the transfer of information from the ADC during conversion. The CS signal initiates the data transfer and conversion process. The falling edge of CS puts the track-and-hold into hold mode, at which point the analog input is sampled and the bus is taken out of three-state. The conversion is also initiated at this point and requires a minimum of 14 ADSCLKs to complete. Once 13 ADSCLK falling edges have elapsed, the track-and-hold goes back into track on the next ADSCLK rising edge, as shown in Figure 93 (Serial Interface Timing Diagram) at Point B. If a 16 ADSCLK transfer is used, then two trailing zeros appear after the final LSB. On the rising edge of CS, the conversion is terminated and DOUTA and DOUTB go back into three-state. If CS is Rev. PrC | Page 70 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F CS t9 t2 ADSCLK t6 1 3 2 5 t3 DOUTA 0 DB11 0 DOUTB THREESTATE 2 LEADING ZEROS B 4 t4 DB10 13 t5 t7 DB9 DB2 DB8 tQUIET t8 DB1 DB0 THREE-STATE Figure 93. Serial Interface Timing Diagram CS t6 t2 ADSCLK 3 2 1 t3 DOUTA 4 5 t4 0 ZERO DB11A THREESTATE 2 LEADING ZEROS DB10A t5 DB9A 14 16 15 17 32 t10 t7 ZERO ZERO ZERO ZERO DB11B 2 TRAILING ZEROS 2 LEADING ZEROS Figure 94. Reading Data from Both ADCs on One DOUT Line with 32 ADSCLKs Rev. PrC | Page 71 of 80 | January 2010 ZERO ZERO 2 TRAILING ZEROS THREESTATE ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data 120-LEAD LQFP LEAD ASSIGNMENT Table 52 lists the LQFP leads by signal mnemonic. Table 53 on Page 73 lists the LQFP leads by lead number. Table 52. 120-Lead LQFP Lead Assignment (Alphabetically by Signal) Signal A0 A1 A2 AGND AGND AGND AGND AGND AGND AVDD BMODE0 BMODE1 BMODE2 CLKIN CS DCAPA DCAPB DGND DGND DOUTA DOUTB DVDD EMU EXT_WAKE EXTCLK GND GND GND GND NC No. 100 98 97 73 78 79 82 93 99 76 58 57 56 110 101 77 94 74 104 105 103 107 68 70 120 13 17 108 109 60 Signal NC NMI PF0 PF1 PF2 PF3 PF4 PF5 PF6 PF7 PF8 PF9 PF10 PF11 PF12 PF13 PF14 PF15 PG PG0 PG1 PG2 PG3 PG4 PG5 PG6 PG7 PG8 PG9 PG10 No. 72 11 118 119 2 4 3 5 7 8 9 10 14 16 18 19 21 22 71 27 28 29 31 32 38 39 40 43 44 45 Signal No. VB5 88 VB6 87 VDDEXT 1 VDDEXT 6 VDDEXT 15 20 VDDEXT VDDEXT 23 VDDEXT 26 VDDEXT 30 VDDEXT 41 VDDEXT 51 59 VDDEXT VDDEXT 62 VDDEXT 64 VDDEXT 66 VDDEXT 67 VDDEXT 112 116 VDDEXT VDDFLASH 25 VDDFLASH 63 VDDFLASH 69 VDDINT 24 VDDINT 42 VDDINT 52 VDDINT 53 VDDINT 61 VDDINT 65 VDDINT 117 VDRIVE 106 XTAL 111 GND 121* AGND 122** * Pin no. 121 is the GND supply (see Figure 95 and Figure 96) for the processor (4.6mm × 6.17mm); this pad must connect to GND. ** Pin no. 122 is the AGND supply (see Figure 95 and Figure 96) for the ADC (2.81mm × 2.81mm); this pad must connect to AGND. Rev. PrC Signal PG11 PG12 PG13 PG14 PG15 PH0 PH1 PH2 RANGE REF_SELECT RESET SCL ADSCLK SDA SGL/DIFF TCK TDI TDO TMS TRST VA1 VA2 VA3 VA4 VA5 VA6 VB1 VB2 VB3 VB4 No. 46 47 48 49 50 113 115 114 95 75 12 55 102 54 96 34 33 36 35 37 80 81 83 84 85 86 92 91 90 89 | Page 72 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Table 53. 120-Lead LQFP Lead Assignment (Numerically by Lead Number) No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Signal VDDEXT PF2 PF4 PF3 PF5 VDDEXT PF6 PF7 PF8 PF9 NMI RESET GND PF10 VDDEXT PF11 GND PF12 PF13 VDDEXT PF14 PF15 VDDEXT VDDINT VDDFLASH VDDEXT PG0 PG1 PG2 VDDEXT No. 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 Signal PG3 PG4 TDI TCK TMS TDO TRST PG5 PG6 PG7 VDDEXT VDDINT PG8 PG9 PG10 PG11 PG12 PG13 PG14 PG15 VDDEXT VDDINT VDDINT SDA SCL BMODE2 BMODE1 BMODE0 VDDEXT NC No. Signal 91 VB2 92 VB1 93 AGND 94 DCAPB 95 RANGE 96 SGL/DIFF 97 A2 98 A1 99 AGND 100 A0 101 CS 102 ADSCLK 103 DOUTB 104 DGND 105 DOUTA 106 VDRIVE 107 DVDD 108 GND 109 GND 110 CLKIN 111 XTAL 112 VDDEXT 113 PH0 114 PH2 115 PH1 116 VDDEXT 117 VDDINT 118 PF0 119 PF1 120 EXTCLK 121* GND 122** AGND * Pin no. 121 is the GND supply (see Figure 95 and Figure 96) for the processor (4.6mm × 6.17mm); this pad must connect to GND. ** Pin no. 122 is the AGND supply (see Figure 95 and Figure 96) for the ADC (2.81mm × 2.81mm); this pad must connect to AGND. Rev. PrC No. 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 Signal VDDINT VDDEXT VDDFLASH VDDEXT VDDINT VDDEXT VDDEXT EMU VDDFLASH EXT_WAKE PG NC AGND DGND REF_SELECT AVDD DCAPA AGND AGND VA1 VA2 AGND VA3 VA4 VA5 VA6 VB6 VB5 VB4 VB3 | Page 73 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Figure 95 shows the top view of the 120-lead LQFP package lead configuration. Figure 96 shows the bottom view of the 120-lead LQFP package lead configuration. PIN 120 PIN 91 PIN 1 PIN 90 PIN 1 INDICATOR ADSP-BF50X 120-LEAD LQFP TOP VIEW PIN 30 PIN 61 PIN 31 PIN 60 Figure 95. 120-Lead LQFP Package Lead Configuration (Top View) PIN 31 PIN 60 PIN 30 PIN 61 GND PAD (PIN 121) ADSP-BF50X 120-LEAD LQFP BOTTOM VIEW AGND PAD (PIN 122) PIN 1 PIN 90 PIN 120 PIN 91 Figure 96. 120-Lead LQFP Package Lead Configuration (Bottom View) Rev. PrC | Page 74 of 80 | January 2010 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F 88-LEAD LFCSP LEAD ASSIGNMENT Table 54 lists the LFCSP leads by signal mnemonic. Table 55 on Page 76 lists the LFCSP by lead number. Table 54. 88-Lead LFCSP Lead Assignment (Alphabetically by Signal) Signal BMODE0 BMODE1 BMODE2 CLKIN EMU EXT_WAKE EXTCLK GND GND GND NC NC NC NC NC NC NC NMI PF0 PF1 PF2 PF3 Lead No. 51 50 49 68 60 62 78 3 7 67 45 46 47 48 64 65 66 1 76 77 80 81 Signal PF4 PF5 PF6 PF7 PF8 PF9 PF10 PF11 PF12 PF13 PF14 PF15 PG PG0 PG1 PG2 PG3 PG4 PG5 PG6 PG7 PG8 Lead No. 82 83 85 86 87 88 4 6 8 9 11 12 63 17 18 19 21 22 28 29 30 33 Signal PG9 PG10 PG11 PG12 PG13 PG14 PG15 PH0 PH1 PH2 RESET SCL SDA TCK TDI TDO TMS TRST VDDEXT VDDEXT VDDEXT VDDEXT Lead No. 34 35 36 37 38 39 40 71 72 73 2 44 43 24 23 27 25 26 5 10 13 16 * Pin no. 89 is the GND supply (see Figure 98) for the processor; this pad must connect to GND. Rev. PrC | Page 75 of 80 | January 2010 Signal VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDEXT VDDFLASH VDDFLASH VDDFLASH VDDINT VDDINT VDDINT VDDINT VDDINT VDDINT XTAL GND Lead No. 20 31 41 52 54 56 58 59 70 74 79 84 15 55 61 14 32 42 53 57 75 69 89* ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data Table 55. 88-Lead LFCSP Lead Assignment (Numerically by Lead Number) Lead No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 Signal NMI RESET GND PF10 VDDEXT PF11 GND PF12 PF13 VDDEXT PF14 PF15 VDDEXT VDDINT VDDFLASH VDDEXT PG0 PG1 PG2 VDDEXT PG3 PG4 Lead No. 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 Signal TDI TCK TMS TRST TDO PG5 PG6 PG7 VDDEXT VDDINT PG8 PG9 PG10 PG11 PG12 PG13 PG14 PG15 VDDEXT VDDINT SDA SCL Lead No. 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 Signal NC NC NC NC BMODE2 BMODE1 BMODE0 VDDEXT VDDINT VDDEXT VDDFLASH VDDEXT VDDINT VDDEXT VDDEXT EMU VDDFLASH EXT_WAKE PG NC NC NC * Pin no. 89 is the GND supply (see Figure 98) for the processor; this pad must connect to GND. Rev. PrC | Page 76 of 80 | January 2010 Lead No. 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89* Signal GND CLKIN XTAL VDDEXT PH0 PH1 PH2 VDDEXT VDDINT PF0 PF1 EXTCLK VDDEXT PF2 PF3 PF4 PF5 VDDEXT PF6 PF7 PF8 PF9 GND Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F Figure 97 shows the top view of the LFCSP pin configuration. Figure 98 shows the bottom view of the LFCSP lead configuration. PIN 88 PIN 67 PIN 1 PIN 66 PIN 1 INDICATOR ADSP-BF50X 88-LEAD LFCSP TOP VIEW PIN 22 PIN 45 PIN 23 PIN 44 Figure 97. 88-Lead LFCSP Lead Configuration (Top View) PIN 67 PIN 88 PIN 66 PIN 1 ADSP-BF50X 88-LEAD LFCSP BOTTOM VIEW GND PAD (PIN 89) PIN 1 INDICATOR PIN 45 PIN 22 PIN 46 PIN 23 Figure 98. 88-Lead LFCSP Lead Configuration (Bottom View) Rev. PrC | Page 77 of 80 | January 2010 ADSP-BF504/F,ADSP-BF506F Preliminary Technical Data OUTLINE DIMENSIONS Dimensions in Figure 99 (for the 120-lead LQFP) and in Figure 100 (for the 88-lead LFCSP) are shown in millimeters. 16.20 16.00 SQ 15.80 14.10 14.00 SQ 13.90 91 120 1 1.60 MAX 0.75 0.60 0.45 0.23 0.18 0.13 PIN 1 1.00 REF VIEW A 12° 1.45 1.40 1.35 0.15 0.10 0.05 90 SEATING PLANE 0.20 0.15 0.09 7° 0° 0.40 BSC LEAD PITCH TOP VIEW (PINS DOWN) 30 61 31 0.08 MAX COPLANARITY 60 4.60 REF VIEW A 0.77 REF 1.53 31 60 61 30 6.17 REF 1.915 EXPOSED PAD EXPOSED PAD FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. 90 1 91 120 BOTTOM VIEW (PINS UP) COMPLIANT TO JEDEC STANDARDS MS-026-BEE-HD Figure 99. 120-Lead LQFP (SQ-120-2) Rev. PrC 2.945 REF SQ | Page 78 of 80 | January 2010 2.81 REF SQ Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F 12.10 12.00 SQ 11.90 0.60 MAX 0.60 MAX 88 67 66 PIN 1 INDICATOR 1 PIN 1 INDICATOR 11.85 11.75 SQ 11.65 0.50 BSC 0.50 0.40 0.30 45 44 SEATING PLANE 22 10.50 REF 0.70 0.65 0.60 12° MAX 23 BOTTOM VIEW TOP VIEW 0.85 0.80 0.75 6.70 REF SQ EXPOSED PAD 0.30 0.23 0.18 0.045 0.025 0.005 FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. 0.138~0.194 REF COMPLIANT TO JEDEC STANDARDS MO-220-VRRD. Figure 100. 88-Lead LFCSP (BC-CP-1) SURFACE MOUNT DESIGN Table 56 is provided as an aide to PCB design. For industrystandard design recommendations, refer to IPC-7351, Generic Requirements for Surface Mount Design and Land Pattern Standard. Table 56. Surface Mount Design Supplement Package 120-Lead LQFP 88-Lead LFCSP Ball Attach Type Solder Mask Defined Solder Mask Defined Solder Mask Opening TBD mm diameter TBD mm diameter Lead Pad Size TBD mm diameter TBD mm diameter ORDERING GUIDE Table 57. ADSP-BF50x Processors1 Model ADSPBF504BCPZ-ENG ADSPBF504FBCPZ-ENG ADSPBF506FBSWZ-ENG 1 2 Temperature Range2 –40ºC to +85ºC –40ºC to +85ºC –40ºC to +85ºC Processor Instruction Rate (Max) 400 MHz 400 MHz 400 MHz Package Description 88-Lead LFCSP 88-Lead LFCSP 120-Lead LQFP For feature comparison between ADSP-BF504, ADSP-BF504F, and ADSP-BF506F processors, see the Processor Comparison in Table 1 on Page 3. Referenced temperature is ambient temperature. Rev. PrC | Page 79 of 80 | January 2010 Package Option BC-CP-1 BC-CP-1 SQ-120-2 Preliminary Technical Data ADSP-BF504/F,ADSP-BF506F ©2010 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. PR08560-0-1/10(PrC) Rev. PrC | Page 80 of 80 | January 2010