SN74AS1805 HEX 2-INPUT NOR DRIVER SDAS043C – AUGUST 1984 – REVISED JANUARY 1995 • • DW OR N PACKAGE (TOP VIEW) High Capacitive-Drive Capability Typical Delay Time of 2.6 ns (CL = 50 pF) and Typical Power Dissipation of Less Than 12 mW Per Gate Center VCC and GND Configuration Provides Minimum Lead Inductance in High-Current Switching Applications Package Options Include Plastic Small-Outline (DW) Packages and Standard Plastic (N) 300-mil DIPs • • description 5B 6Y 6A 6B 1 20 2 19 3 18 4 17 VCC 1A 1B 1Y 2A 2B 5 16 6 15 7 14 8 13 9 12 10 11 5A 5Y 4B 4A 4Y GND 3Y 3B 3A 2Y This device contains six independent 2-input NOR drivers. It performs the Boolean functions Y = A + B or Y = A • B in positive logic. The center-pin configuration reduces lead inductance when compared to the ′AS805B. This reduced lead inductance minimizes noise generated onto either the VCC or GND bus. This reduction is significant in high-current switching applications. The SN74AS1805 is characterized for operation from 0°C to 70°C. FUNCTION TABLE (each driver) INPUTS B OUTPUT Y H X L X H L L L H A logic symbol† 1A 1B 2A 2B 3A 3B 4A 4B 5A 5B 6A 6B 6 7 logic diagram (positive logic) ≥1 9 8 1Y 1B 11 10 2Y 14 3Y 16 4Y 20 1 4A 4B 19 5Y 3 4 3A 3B 17 18 2A 2B 12 13 1A 2 5A 5B 6Y 6A 6B 6 7 8 1Y 9 10 11 2Y 12 13 14 3Y 17 18 20 1 3 4 16 19 2 4Y 5Y 6Y † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Copyright 1995, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 SN74AS1805 HEX 2-INPUT NOR DRIVER SDAS043C – AUGUST 1984 – REVISED JANUARY 1995 absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions VCC VIH Supply voltage VIL IOH Low-level input voltage IOL TA High-level input voltage MIN NOM MAX 4.5 5 5.5 2 UNIT V V 0.8 V High-level output current – 48 mA Low-level output current 48 mA 70 °C Operating free-air temperature 0 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER VIK TEST CONDITIONS MIN VCC = 4.5 V, VCC = 4.5 V to 5.5 V, II = –18 mA IOH = – 2 mA VCC = 4 4.5 5V IOH = – 3 mA IOH = – 48 mA VOL II VCC = 4.5 V, VCC = 5.5 V, IOL = 48 mA VI = 7 V IIH IIL IO§ VCC = 5.5 V, VCC = 5.5 V, VI = 2.7 V VI = 0.4 V VCC = 5.5 V, VCC = 5.5 V, VO = 2.25 V VI = 0 VOH ICCH ICCL TYP‡ VCC – 2 2.4 MAX UNIT –1.2 V V 3.2 2 0.35 – 50 0.5 V 0.1 mA 20 µA – 0.5 mA – 200 mA 10 mA 6.5 VCC = 5.5 V, VI = 4.5 V 20 32 mA ‡ All typical values are at VCC = 5 V, TA = 25°C. § The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS. switching characteristics (see Figure 1) PARAMETER FROM (INPUT) TO (OUTPUT) tPLH tPHL A or B Y VCC = 4.5 V to 5.5 V, CL = 50 pF, RL = 500 Ω, TA = MIN to MAX¶ MIN MAX 1 4.3 1 4.3 ¶ For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions. 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 UNIT ns SN74AS1805 HEX 2-INPUT NOR DRIVER SDAS043C – AUGUST 1984 – REVISED JANUARY 1995 PARAMETER MEASUREMENT INFORMATION SERIES 54ALS/74ALS AND 54AS/74AS DEVICES 7V RL = R1 = R2 VCC S1 RL R1 Test Point From Output Under Test CL (see Note A) From Output Under Test RL Test Point From Output Under Test CL (see Note A) CL (see Note A) LOAD CIRCUIT FOR BI-STATE TOTEM-POLE OUTPUTS LOAD CIRCUIT FOR OPEN-COLLECTOR OUTPUTS 3.5 V Timing Input Test Point LOAD CIRCUIT FOR 3-STATE OUTPUTS 3.5 V High-Level Pulse 1.3 V R2 1.3 V 1.3 V 0.3 V 0.3 V Data Input tw th tsu 3.5 V 1.3 V 3.5 V Low-Level Pulse 1.3 V 0.3 V 1.3 V 0.3 V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES VOLTAGE WAVEFORMS PULSE DURATIONS 3.5 V Output Control (low-level enabling) 1.3 V 1.3 V 0.3 V tPZL Waveform 1 S1 Closed (see Note B) tPLZ [3.5 V 1.3 V tPHZ tPZH Waveform 2 S1 Open (see Note B) 1.3 V VOL 0.3 V VOH 1.3 V 0.3 V [0 V 3.5 V 1.3 V Input 1.3 V 0.3 V tPHL tPLH VOH In-Phase Output 1.3 V 1.3 V VOL tPLH tPHL VOH Out-of-Phase Output (see Note C) 1.3 V 1.3 V VOL VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. When measuring propagation delay items of 3-state outputs, switch S1 is open. D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%. E. The outputs are measured one at a time with one transition per measurement. Figure 1. Load Circuits and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER’S RISK. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright 1998, Texas Instruments Incorporated