MOTOROLA SN74LS174N

SN54/74LS174
HEX D FLIP-FLOP
The LSTTL / MSI SN54 / 74LS174 is a high speed Hex D Flip-Flop. The
device is used primarily as a 6-bit edge-triggered storage register. The
information on the D inputs is transferred to storage during the LOW to HIGH
clock transition. The device has a Master Reset to simultaneously clear all
flip-flops. The LS174 is fabricated with the Schottky barrier diode process for
high speed and is completely compatible with all Motorola TTL families.
•
•
•
•
HEX D FLIP-FLOP
LOW POWER SCHOTTKY
Edge-Triggered D-Type Inputs
Buffered-Positive Edge-Triggered Clock
Asynchronous Common Reset
Input Clamp Diodes Limit High Speed Termination Effects
J SUFFIX
CERAMIC
CASE 620-09
CONNECTION DIAGRAM DIP (TOP VIEW)
Q5
15
VCC
16
D5
14
D4
13
Q4
12
D3
11
Q3
10
CP
16
9
1
NOTE:
The Flatpak version
has the same pinouts
(Connection Diagram) as
the Dual In-Line Package.
N SUFFIX
PLASTIC
CASE 648-08
16
1
MR
2
Q0
3
D0
4
D1
5
Q1
6
D2
8
GND
7
Q2
1
PIN NAMES
D SUFFIX
SOIC
CASE 751B-03
LOADING (Note a)
16
HIGH
D0 – D5
CP
MR
Q0 – Q5
Data Inputs
Clock (Active HIGH Going Edge) Input
Master Reset (Active LOW) Input
Outputs (Note b)
LOW
1
0.25 U.L.
0.25 U.L.
0.25 U.L.
5 (2.5) U.L.
0.5 U.L.
0.5 U.L.
0.5 U.L.
10 U.L.
ORDERING INFORMATION
SN54LSXXXJ
SN74LSXXXN
SN74LSXXXD
NOTES:
a. 1 TTL Unit Load (U.L.) = 40 µA HIGH/1.6 mA LOW.
b. The Output LOW drive factor is 2.5 U.L. for Military (54) and 5 U.L. for Commercial (74)
b. Temperature Ranges.
Ceramic
Plastic
SOIC
LOGIC SYMBOL
LOGIC DIAGRAM
3 4 6 11 13 14
MR CP D5
1
9
D4
14
D3
13
D2
D1
6
11
D0
4
3
9
1
D Q
D Q
D Q
D Q
D Q
D Q
CP
CD
CP
CD
CP
CD
CP
CD
CP
CD
CP
CD
D0 D1 D2 D3 D4 D5
CP
MR
Q0 Q1 Q2 Q3 Q4 Q5
2 5 7 10 12 15
15
VCC = PIN 16
GND = PIN 8
Q5
12
Q4
10
Q3
7
5
2
Q2
Q1
Q0
= PIN NUMBERS
FAST AND LS TTL DATA
5-1
VCC = PIN 16
GND = PIN 8
SN54/74LS174
FUNCTIONAL DESCRIPTION
A LOW input to the Master Reset (MR) will force all outputs
LOW independent of Clock or Data inputs. The LS174 is
useful for applications where the true output only is required
and the Clock and Master Reset are common to all storage
elements.
The LS174 consists of six edge-triggered D flip-flops with
individual D inputs and Q outputs. The Clock (CP) and Master
Reset (MR) are common to all flip-flops.
Each D input’s state is transferred to the corresponding flipflop’s output following the LOW to HIGH Clock (CP) transition.
TRUTH TABLE
Inputs (t = n, MR = H)
Outputs (t = n+1) Note 1
D
Q
H
L
H
L
Note 1: t = n + 1 indicates conditions after next clock.
GUARANTEED OPERATING RANGES
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
54
74
4.5
4.75
5.0
5.0
5.5
5.25
V
TA
Operating Ambient Temperature Range
54
74
– 55
0
25
25
125
70
°C
IOH
Output Current — High
54, 74
– 0.4
mA
IOL
Output Current — Low
54
74
4.0
8.0
mA
DC CHARACTERISTICS OVER OPERATING TEMPERATURE RANGE (unless otherwise specified)
Limits
Symbol
Min
Parameter
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VIK
Input Clamp Diode Voltage
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
IIH
Input HIGH Current
IIL
Input LOW Current
IOS
Short Circuit Current (Note 1)
ICC
Power Supply Current
Typ
Max
Unit
2.0
54
V
V
Guaranteed Input LOW Voltage for
All Inputs
V
VCC = MIN, IIN = – 18 mA
0.7
74
0.8
– 0.65
– 1.5
Test Conditions
Guaranteed Input HIGH Voltage for
All Inputs
54
2.5
3.5
V
74
2.7
3.5
V
VCC = MIN, IOH = MAX, VIN = VIH
or VIL per Truth Table
VCC = VCC MIN,
VIN = VIL or VIH
per Truth Table
54, 74
0.25
0.4
V
IOL = 4.0 mA
74
0.35
0.5
V
IOL = 8.0 mA
20
µA
VCC = MAX, VIN = 2.7 V
0.1
mA
VCC = MAX, VIN = 7.0 V
– 0.4
mA
VCC = MAX, VIN = 0.4 V
– 100
mA
VCC = MAX
26
mA
VCC = MAX
– 20
Note 1: Not more than one output should be shorted at a time, nor for more than 1 second.
FAST AND LS TTL DATA
5-2
SN54/74LS174
AC CHARACTERISTICS (TA = 25°C)
Limits
Symbol
Parameter
Min
Typ
30
40
Unit
Max
fMAX
Maximum Input Clock Frequency
tPHL
Propagation Delay, MR to Output
23
35
ns
tPLH
tPHL
Propagation Delay, Clock to Output
20
21
30
30
ns
Max
Unit
Test Conditions
MHz
VCC = 5.0 V
CL = 15 pF
AC SETUP REQUIREMENTS (TA = 25°C)
Limits
Symbol
Parameter
Min
Typ
tW
Clock or MR Pulse Width
20
ns
ts
Data Setup Time
20
ns
th
Data Hold Time
5.0
ns
trec
Recovery Time
25
ns
Test Conditions
VCC = 5.0 V
AC WAVEFORMS
1/fmax
tw
1.3 V
CP
1.3 V
ts(H)
D
*
1.3 V
Q
t
th(H)s(L)
1.3 V
tPLH
1.3 V
MR
th(L)
1.3 V
1.3 V
tW
1.3 V
trec
1.3 V
tPHL
1.3 V
CP
Q
tPHL
1.3 V
1.3 V
*The shaded areas indicate when the input is permitted to
*change for predictable output performance.
Figure 1. Clock to Output Delays, Clock Pulse Width,
Frequency, Setup and Hold Times Data to Clock
Figure 2. Master Reset to Output Delay, Master Reset
Pulse Width, and Master Reset Recovery Time
DEFINITIONS OF TERMS
SETUP TIME (ts) — is defined as the minimum time required
for the correct logic level to be present at the logic input prior to
the clock transition from LOW to HIGH in order to be recognized and transferred to the outputs.
nition. A negative HOLD TIME indicates that the correct logic
level may be released prior to the clock transition from LOW to
HIGH and still be recognized.
RECOVERY TIME (trec) — is defined as the minimum time
required between the end of the reset pulse and the clock
transition from LOW to HIGH in order to recognize and transfer
HIGH Data to the Q outputs.
HOLD TIME (th) — is defined as the minimum time following
the clock transition from LOW to HIGH that the logic level must
be maintained at the input in order to ensure continued recog-
FAST AND LS TTL DATA
5-3