ETC CY7C1340A

CY7C1340A/
GVT71128C32
128K x 32 Synchronous-Pipelined RAM
Features
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The
CY7C1340A/GVT71128C32
SRAM
integrates
131,072 × 32 SRAM cells with advanced synchronous
peripheral circuitry and a two-bit counter for internal burst
operation. All synchronous inputs are gated by registers
controlled by a positive-edge-triggered Clock Input (CLK). The
synchronous inputs include all addresses, all data inputs,
address-pipelining chip enable (CE), depth-expansion Chip
Enables (CE2 and CE2), Burst Control Inputs (ADSC, ADSP,
and ADV), Write Enables (BW1, BW2, BW3, BW4, and BWE),
and Global Write (GW).
Fast access times: 5, 6, and 7 ns
Fast clock speed: 100, 83, and 66 MHz
Provides high performance 3-1-1-1 access rate
Fast OE access times: 5, 6, and 7 ns
Optimal for performance (two-cycle chip deselect,
depth expansion without wait state)
Single +3.3V –5% and +10%power supply
Supports +2.5V I/O
5V tolerant inputs except I/Os
Clamp diodes to VSSQ at all outputs
Common data inputs and outputs
Byte Write Enable and Global Write control
Three chip enables for depth expansion and address
pipeline
Address, control, input, and output pipeline registers
Internally self-timed Write Cycle
Burst control pins (interleaved or linear burst
sequence)
Automatic power-down for portable applications
High-density, high-speed packages
Low-capacitive bus loading
High 30-pF output drive capability at rated access time
Asynchronous inputs include the Output Enable (OE) and
Burst Mode Control (MODE). The data outputs (Q), enabled
by OE, are also asynchronous.
Addresses and chip enables are registered with either
Address Status Processor (ADSP) or Address Status
Controller (ADSC) input pins. Subsequent burst addresses
can be internally generated as controlled by the Burst Advance
Pin (ADV).
Functional Description
Address, data inputs, and Write controls are registered on-chip
to initiate self-timed Write cycle. Write cycles can be one to
four bytes wide as controlled by the Write control inputs.
Individual byte Write allows individual byte to be written. BW1
controls DQ1–DQ8. BW2 controls DQ9–DQ16. BW3 controls
DQ17–DQ24. BW4 controls DQ25–DQ32. BW1, BW2, BW3,
and BW4 can be active only with BWE being LOW. GW being
LOW causes all bytes to be written. This device also incorporates pipelined enable circuit for easy depth expansion without
penalizing system performance.
The Cypress Synchronous Burst SRAM family employs
high-speed, low-power CMOS designs using advanced
triple-layer polysilicon, double-layer metal technology. Each
memory cell consists of four transistors and two high valued
resistors.
The CY7C1340A/GVT71128C32 operates from a +3.3V
power supply. All inputs and outputs are TTL-compatible. The
device is ideally suited for 486, Pentium®, 680 × 0, and
PowerPC™ systems and for systems that benefit from a wide
synchronous data bus.
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Selection Guide
Maximum Access Time
Maximum Operating Current
Maximum CMOS Standby Current
Cypress Semiconductor Corporation
Document #: 38-05153 Rev. *B
•
7C1340A-100
71128C36-5
7C1340A-83
71128C36-6
7C1340A-66
71128C36-7
Unit
5
6
7
ns
225
185
120
mA
2
2
2
mA
3901 North First Street
•
San Jose
•
CA 95134 • 408-943-2600
Revised January 19, 2003
CY7C1340A/
GVT71128C32
Functional Block Diagram[1]
BYTE 1 WRITE
BW1#
BWE#
D
Q
CLK
BYTE 2 WRITE
BW2#
D
Q
GW#
BYTE 3 WRITE
BW3#
D
Q
BYTE 4 WRITE
ENABLE
D
CE2
Q
D
Q
byte 2 write
byte 1 write
CE#
Q
byte 3 write
D
byte 4 write
BW4#
CE2#
OE#
Power Down Logic
Input
Register
A16-A2
Address
Register
ADSC#
CLR
ADV#
A1-A0
Binary
Counter
& Logic
OUTPUT
REGISTER
D
Q
Output Buffers
ADSP#
128K x 8 x 4
SRAM Array
ZZ
DQ1DQ32
MODE
Note:
1. The functional block diagram illustrates simplified device operation. See
Truth Table, pin descriptions, and timing diagrams for detailed information.
Document #: 38-05153 Rev. *B
Page 2 of 12
CY7C1340A/
GVT71128C32
Pin Configuration
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
A6
A7
CE
CE2
BW4
BW3
BW2
BW1
CE2
VCC
VSS
CLK
GW
BWE
OE
ADSC
ADSP
ADV
A8
A9
100-pin TQFP
Top View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
CY7C1340A
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
NC
DQ16
DQ15
VCCQ
VSSQ
DQ14
DQ13
DQ12
DQ11
VSSQ
VCCQ
DQ10
DQ9
VSS
NC
VCC
ZZ
DQ8
DQ7
VCCQ
VSSQ
DQ6
DQ5
DQ4
DQ3
VSSQ
VCCQ
DQ2
DQ1
NC
MODE
A5
A4
A3
A2
A1
A0
NC
NC
VSS
VCC
NC
NC
A10
A11
A12
A13
A14
A15
A16
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
NC
DQ17
DQ18
VCCQ
VSSQ
DQ19
DQ20
DQ21
DQ22
VSSQ
VCCQ
DQ23
DQ24
NC
VCC
NC
VSS
DQ25
DQ26
VCCQ
VSSQ
DQ27
DQ28
DQ29
DQ30
VSSQ
VCCQ
DQ31
DQ32
NC
Document #: 38-05153 Rev. *B
Page 3 of 12
CY7C1340A/
GVT71128C32
Pin Descriptions
Name
Type
Description
A0–A16
InputSynchronous
Addresses: These inputs are registered and must meet the set-up and hold times around
the rising edge of CLK. The burst counter generates internal addresses associated with
A0 and A1, during burst cycle and wait cycle.
BW1, BW2,
BW3, BW4
InputSynchronous
Byte Write: A byte Write is LOW for a Write cycle and HIGH for a Read cycle. BW1 controls
DQ1–DQ8. BW2 controls DQ9–DQ16. BW3 controls DQ17–DQ24. BW4 controls
DQ25–DQ32. Data I/O are high-impedance if either of these inputs are LOW, conditioned
by BWE being LOW.
BWE
InputSynchronous
Write Enable: This active LOW input gates byte Write operations and must meet the set-up
and hold times around the rising edge of CLK.
GW
InputSynchronous
Global Write: This active LOW input allows a full 32-bit Write to occur independent of the
BWE and BWn lines and must meet the set-up and hold times around the rising edge of
CLK.
CLK
InputSynchronous
Clock: This signal registers the addresses, data, chip enables, Write control and burst
control inputs on its rising edge. All synchronous inputs must meet set-up and hold times
around the clock’s rising edge.
CE
InputSynchronous
Chip Enable: This active LOW input is used to enable the device and to gate ADSP.
CE2
InputSynchronous
Chip Enable: This active LOW input is used to enable the device.
CE2
InputSynchronous
Chip Enable: This active HIGH input is used to enable the device.
OE
Input
Output Enable: This active LOW asynchronous input enables the data output drivers.
ADV
InputSynchronous
Address Advance: This active LOW input is used to control the internal burst counter.
A HIGH on this pin generates wait cycle (no address advance).
ADSP
InputSynchronous
Address Status Processor: This active LOW input, along with CE being LOW, causes a
new external address to be registered and a Read cycle is initiated using the new address.
ADSC
InputSynchronous
Address Status Controller: This active LOW input causes device to be de-selected or
selected along with new external address to be registered. A Read or Write cycle is initiated
depending upon Write control inputs.
MODE
InputStatic
Mode: This input selects the burst sequence. A LOW on this pin selects Linear Burst. A NC
or HIGH on this pin selects Interleaved Burst.
ZZ
InputAsynchronous
Snooze: This active HIGH input puts the device in low power consumption standby mode.
For normal operation, this input has to be either LOW or NC (No Connect).
DQ1–
DQ32
Input/
Output
Data Inputs/Outputs: First Byte is DQ1–DQ8. Second Byte is DQ9–DQ16. Third Byte is
DQ17–DQ24. Fourth Byte is DQ25–DQ32. Input data must meet set-up and hold times
around the rising edge of CLK.
VCC
Supply
Power Supply: +3.3V –5% to +10%. Pin 14 does not have to be connected directly to VCC
as long as it is greater than VIH.
Ground: GND
VSS
Ground
VCCQ
I/O Supply
Output Buffer Supply: +3.3V –5% to +10%. For 2.5V I/O: 2.375V to VCC.
VSSQ
I/O Ground
Output Buffer Ground: GND
NC
-
No Connect: These signals are not internally connected.
Burst Address Table (MODE = NC/VCC)
First
Address
(external)
Second
Address
(internal)
Third
Address
(internal)
A...A00
A...A01
A...A01
A...A00
Burst Address Table (MODE = GND)
Fourth
Address
(internal)
First
Address
(external)
Second
Address
(internal)
Third
Address
(internal)
A...A10
A...A11
A...A11
A...A10
Fourth
Address
(internal)
A...A00
A...A01
A...A10
A...A11
A...A01
A...A10
A...A11
A...A00
A...A10
A...A11
A...A00
A...A01
A...A10
A...A11
A...A00
A...A01
A...A11
A...A10
A...A01
A...A00
A...A11
A...A00
A...A01
A...A10
Document #: 38-05153 Rev. *B
Page 4 of 12
CY7C1340A/
GVT71128C32
Truth Table[2, 3, 4, 5, 6, 7, 8]
Operation
Address
Used
CE
Deselected Cycle, Power Down
None
H
X
X
Deselected Cycle, Power Down
None
L
X
Deselected Cycle, Power Down
None
L
Deselected Cycle, Power Down
None
Deselected Cycle, Power Down
CE2 CE2 ADSP
ADSC
ADV
WRITE
OE
CLK
DQ
X
L
X
X
X
L–H
High-Z
L
L
X
X
X
X
L–H
High-Z
H
X
L
X
X
X
X
L–H
High-Z
L
X
L
H
L
X
X
X
L–H
High-Z
None
L
H
X
H
L
X
X
X
L–H
High-Z
Read Cycle, Begin Burst
External
L
L
H
L
X
X
X
L
L–H
Q
Read Cycle, Begin Burst
External
L
L
H
L
X
X
X
H
L–H
High-Z
Write Cycle, Begin Burst
External
L
L
H
H
L
X
L
X
L–H
D
Read Cycle, Begin Burst
External
L
L
H
H
L
X
H
L
L–H
Q
Read Cycle, Begin Burst
External
L
L
H
H
L
X
H
H
L–H
High-Z
Read Cycle, Continue Burst
Next
X
X
X
H
H
L
H
L
L–H
Q
Read Cycle, Continue Burst
Next
X
X
X
H
H
L
H
H
L–H
High-Z
Read Cycle, Continue Burst
Next
H
X
X
X
H
L
H
L
L–H
Q
Read Cycle, Continue Burst
Next
H
X
X
X
H
L
H
H
L–H
High-Z
Write Cycle, Continue Burst
Next
X
X
X
H
H
L
L
X
L–H
D
Write Cycle, Continue Burst
Next
H
X
X
X
H
L
L
X
L–H
D
Read Cycle, Suspend Burst
Current
X
X
X
H
H
H
H
L
L–H
Q
Read Cycle, Suspend Burst
Current
X
X
X
H
H
H
H
H
L–H
High-Z
Read Cycle, Suspend Burst
Current
H
X
X
X
H
H
H
L
L–H
Q
Read Cycle, Suspend Burst
Current
H
X
X
X
H
H
H
H
L–H
High-Z
Write Cycle, Suspend Burst
Current
X
X
X
H
H
H
L
X
L–H
D
Write Cycle, Suspend Burst
Current
H
X
X
X
H
H
L
X
L–H
D
Partial Truth Table for Read/Write
FUNCTION
Read
Read
Write one byte
Write all bytes
Write all bytes
GW
H
H
H
H
L
BWE
H
L
L
L
X
BW1
X
H
L
L
X
BW2
X
H
H
L
X
BW3
X
H
H
L
X
BW4
X
H
H
L
X
Notes:
2. X means “Don’t Care.” H means logic HIGH. L means logic LOW. Write = L means [BWE + BW1*BW2*BW3*BW4]*GW equals LOW. Write = H means
[BWE + BW1*BW2*BW3*BW4]*GW equals HIGH.
3. BW1 enables Write to DQ1–DQ8. BW2 enables Write to DQ9–DQ16. BW3 enables Write to DQ17–DQ24. BW4 enables Write to DQ25–DQ32.
4. All inputs except OE must meet set-up and hold times around the rising edge (LOW–HIGH) of CLK.
5. Suspending burst generates Wait cycle.
6. For a Write operation following a Read operation, OE must be HIGH before the input data required set-up time plus High-Z time for OE and staying HIGH
throughout the input data hold time.
7. This device contains circuitry that will ensure the outputs will be in High-Z during power-up.
8. ADSP LOW along with chip being selected always initiates a Read cycle at the L–H edge of CLK. A Write cycle can be performed by setting Write LOW for the
CLK L–H edge of the subsequent wait cycle. Refer to Write timing diagram for clarification.
Document #: 38-05153 Rev. *B
Page 5 of 12
CY7C1340A/
GVT71128C32
Power Dissipation.......................................................... 1.0W
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Short Circuit Output Current ........................................ 50 mA
Operating Range
Voltage on VCC Supply Relative to VSS ......... –0.5V to +4.6V
VIN ...........................................................–0.5V to VCC+0.5V
Range
Storage Temperature (plastic) .................... –55°C to +150°C
Ambient
Temperature[9]
VDD[10,11]
0°C to +70°C
3.3V −5% / +10%
Commercial
Junction Temperature ............................................... +150°C
Industrial
–40°C to +85°C
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
[12, 13]
VIHD
Input HIGH (Logic 1) Voltage
VIH
Min.
Max.
Unit
Data Inputs (DQxx)
2.0
VCCQ + 0.3
V
All Other Inputs
2.0
4.6
V
–0.3
0.8
V
–2
2
µA
2
µA
[12, 13]
VIl
Input LOW (Logic 0) Voltage
ILI
Input Leakage Current[14]
0V < VIN < VCC
ILO
Output Leakage Current
Output(s) disabled, 0V < VOUT < VCC
–2
VOH
Output HIGH Voltage[12, 15]
IOH = –4.0 mA
2.4
VOL
Output LOW Voltage
VCC
Supply Voltage[12]
[12, 15]
IOL = 8.0 mA
0.4
V
3.6
V
3.1
3.6
V
2.375
VCC
3.1
[12]
VCCQ
I/O Supply Voltage (3.3V I/O)
VCCQ
I/O Supply Voltage (2.5V I/O)[12]
Parameter
V
Description
Conditions
Typ.
-5
-6
-7
Unit
ICC
Power Supply
Current:
Operating[16, 17, 18]
Device selected; all inputs < VILor > VIH;
cycle time > tKC min.; VCC = Max.;
outputs open
80
225
185
120
mA
ISB2
CMOS Standby[17, 18]
Device deselected; VCC = Max.;
all inputs < VSS + 0.2 or >VCC – 0.2;
all inputs static; CLK frequency = 0
0.2
2
2
2
mA
ISB3
TTL Standby[17, 18]
Device deselected; all inputs < VIL
or > VIH; all inputs static;
VCC = Max.; CLK frequency = 0
8
18
18
18
mA
ISB4
Clock Running[17, 18]
Device deselected;
all inputs < VIL or > VIH; VCC = Max.;
CLK cycle time > tKC min.
12
30
25
20
mA
Capacitance[19]
Parameter
Description
CI
Input Capacitance
CO
Input/Output Capacitance (DQ)
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 3.3V
Typ.
Max.
Unit
3
4
pF
6
7
pF
Notes:
9. TA is the case temperature
10. Please refer to waveform (d).
11. Power Supply ramp-up should be monotonic.
12. All voltages referenced to VSS (GND).
13. Overshoot: VIH ≤ +6.0V for t ≤ tKC /2.
Undershoot: VIL ≤ –2.0V for t ≤ tKC /2.
14. MODE pin has an internal pull-up and ZZ pin has an internal pull-down. These two pins exhibit an input leakage current of ±30 µA.
15. AC I/O curves are available upon request.
16. ICC is given with no output current. ICC increases with greater output loading and faster cycle times.
17. “Device Deselected” means the device is in power-down mode as defined in the truth table. “Device Selected” means the device is active.
18. Typical values are measured at 3.3V, 25°C, and 8.5-ns cycle time.
19. This parameter is sampled.
Document #: 38-05153 Rev. *B
Page 6 of 12
CY7C1340A/
GVT71128C32
Capacitance Derating[20]
Parameter
Description
∆ tKQ
Typ.
Clock to Output Valid
Max.
Unit
0.016
ns / pF
Thermal Resistance
Description
Test Conditions
Symbol
TQFP Typ.
Unit
ΘJA
20
°C/W
ΘJC
1
°C/W
Thermal Resistance (Junction to Ambient) Still air, soldered on a 4.25 × 1.125 inch,
four-layer PCB
Thermal Resistance (Junction to Case)
AC Test Loads and Waveforms—3.3V I/O[21]
317Ω
DQ
3.3V
DQ
50Ω
5 pF
30 pF
351Ω
90%
10%
90%
10%
Z0 = 50Ω
tPU = 200us
ALL INPUT PULSES
3.0V
0V
Vddtyp
V ddm in
For proper RESET
bring Vdd down to 0V
≤ 1.5 ns
≤ 1.5 ns
= 1.5V
Vt
(b)
(a)
(c)
(d)
AC Test Loads and Waveforms—2.5V I/O
DQ
ALL INPUT PULSES
2.5V
Z0 = 50Ω
50Ω
90%
10%
90%
10%
0V
≤ 1.8 ns
≤ 18 ns
Vt = 1.25V
(c)
(a)
Switching Characteristics Over the Operating Range[22]
-5
100 MHz
Parameter
Description
Min.
Max.
-6
83 MHz
Min.
Max.
-7
66 MHz
Min.
Max.
Unit
Clock
tKC
Clock Cycle Time
10
12
15
ns
tKH
Clock HIGH Time
4
4
5
ns
tKL
Clock LOW Time
4
4
5
ns
Notes:
20. Capacitance derating applies to capacitance different from the load capacitance shown in AC Test Loads for 3.3V or 2.5V I/O.
21. Overshoot: VIH(AC) <VDD + 1.5V for t <tTCYC/2; undershoot: VIL(AC) < 0.5V for t <tTCYC/2; power-up: VIH < 2.6V and VDD <2.4V and VDDQ < 1.4V for
t<200 ms.
22. Test conditions as specified with the output loading as shown in part (a) of AC Test Loads unless otherwise noted.
Document #: 38-05153 Rev. *B
Page 7 of 12
CY7C1340A/
GVT71128C32
Switching Characteristics Over the Operating Range[22]
-5
100 MHz
Parameter
Description
Min.
-6
83 MHz
Max.
Min.
-7
66 MHz
Max.
Min.
Max.
Unit
7
ns
Output Times
tKQ
Clock to Output Valid
tKQX
Clock to Output Invalid
5
[23, 24]
tKQLZ
Clock to Output in Low-Z
tKQHZ
Clock to Output in High-Z[23, 24]
2
3
tOEQ
OE to Output Valid
tOELZ
OE to Output in Low-Z[23, 24]
tOEHZ
[23, 24]
2
3
ns
3
5
[25]
OE to Output in High-Z
6
2
ns
5
5
6
0
0
6
ns
7
ns
0
4
ns
5
6
ns
Set-up Times
tS
Address, Controls, and Data In[26]
2.5
2.5
2.5
ns
Address, Controls, and Data In[26]
0.5
0.5
0.5
ns
Hold Times
tH
Switching Waveforms
Read Timing[27]
tKC
tKL
CLK
tKH
tS
ADSP#
tH
ADSC#
tS
ADDRESS
BW1#, BW2#,
BW3#, BW4#,
BWE#, GW#
A1
A2
tH
tS
CE#
tS
ADV#
tH
OE#
tKQ
DQ
tKQLZ
tOELZ
Q(A1)
SINGLE READ
tOEQ
tKQ
Q(A2)
Q(A2+1)
Q(A2+2)
Q(A2+3)
Q(A2)
Q(A2+1)
BURST READ
Notes:
23. Output loading is specified with CL = 5 pF as in part (b) of AC Test Loads.
24. At any given temperature and voltage condition, tKQHZ is less than tKQLZ and tOEHZ is less than tOELZ.
25. OE is a “Don’t Care” when a byte Write enable is sampled LOW.
26. This is a synchronous device. All synchronous inputs must meet specified set-up and hold time, except for “don’t care” as defined in the truth table.
27. CE active in this timing diagram means that all chip enables CE, CE2, and CE2 are active.
Document #: 38-05153 Rev. *B
Page 8 of 12
CY7C1340A/
GVT71128C32
Switching Waveforms (continued)
Write Timing[27]
CLK
tS
ADSP#
tH
ADSC#
tS
A1
ADDRESS
A2
A3
tH
BW1#, BW2#,
BW3#, BW4#,
BWE#
GW#
CE#
tS
ADV#
tH
OE#
tKQX
DQ
Q
tOEHZ
D(A1)
SINGLE WRITE
Document #: 38-05153 Rev. *B
D(A2)
D(A2+1)
D(A2+1)
D(A2+2)
BURST WRITE
D(A2+3)
D(A3)
D(A3+1)
D(A3+2)
BURST WRITE
Page 9 of 12
CY7C1340A/
GVT71128C32
Switching Waveforms (continued)
Read/Write Timing[27]
CLK
tS
ADSP#
tH
ADSC#
tS
ADDRESS
A1
A2
BW1#, BW2#,
BW3#, BW4#,
BWE#, GW#
A3
A4
A5
tH
CE#
ADV#
OE#
DQ
Q(A1)
Q(A2)
Single Reads
D(A3)
Single Write
Q(A4)
Q(A4+1)
Q(A4+2)
D(A5)
Burst Read
D(A5+1)
Burst Write
Ordering Information
Speed
(MHz)
Ordering Code
Package
Name
Package Type
Operating
Range
Commercial
100
CY7C1340A-100AC/
GVT71128C32T-5
A101
100-lead 14 × 20 × 1.4 mm Thin Quad Flat Pack
83
CY7C1340A-83AC/
GVT71128C32T-6
A101
100-lead 14 × 20 × 1.4 mm Thin Quad Flat Pack
66
CY7C1340AF-66AC/
GVT71128C32T-7
A101
100-lead 14 × 20 × 1.4 mm Thin Quad Flat Pack
66
CY7C1340AF-66AI/
GVT71128C32T-7I
A101
100-lead 14 × 20 × 1.4 mm Thin Quad Flat Pack
83
CY7C1340A-83AI/
GVT71128C32T-6I
A101
100-lead 14 × 20 × 1.4 mm Thin Quad Flat Pack
Document #: 38-05153 Rev. *B
Industrial
Page 10 of 12
CY7C1340A/
GVT71128C32
Package Diagrams
100-pin Thin Plastic Quad Flatpack (14 × 20 × 1.4 mm) A101
51-85050-A
Pentium is a registered trademark of Intel Corporation. PowerPC is a trademark of IBM Corporation. All products and company
names mentioned in this document are the trademarks of their respective holders.
Document #: 38-05153 Rev. *B
Page 11 of 12
© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
CY7C1340A/
GVT71128C32
Document Title: CY7C1340A/GVT71128C32 128K × 32 Synchronous-Pipelined RAM
Document Number: 38-05153
REV.
ECN NO.
Issue
Date
Orig. of
Change
Description of Change
**
109897
09/22/01
SZV
Change from Spec number: 38-01003 to 38-05153
*A
111530
02/06/02
GLC
Add industrial temp to data sheet
*B
123139
01/19/03
RBI
Add power up requirements to operating conditions information.
Document #: 38-05153 Rev. *B
Page 12 of 12