ETC HM5164805FLTT-6

HM5164805F Series
HM5165805F Series
64 M EDO DRAM (8-Mword × 8-bit)
8 k Refresh/4 k Refresh
E0098H10 (1st edition)
(Previous ADE-203-1057C (Z))
Jan. 31, 2001
Description
The HM5164805F Series, HM5165805F Series are 64M-bit dynamic RAMs organized as 8,388,608-word
× 8-bit. They have realized high performance and low power by employing CMOS process technology.
HM5164805F Series, HM5165805F Series offer Extended Data Out (EDO) Page Mode as a high speed
access mode. They have the package variation of standard 32-pin plastic SOJ and standard 32-pin plastic
TSOPII.
Features
• Single 3.3 V supply: 3.3 V ± 0.3 V
• Access time: 50 ns/60 ns (max)
• Power dissipation
 Active: 414 mW/378 mW (max) (HM5164805F Series)
: 486 mW/414 mW (max) (HM5165805F Series)
 Standby : 1.8 mW (max) (CMOS interface)
: 1.1 mW (max) (L-version)
• EDO page mode capability
• Refresh cycles
 RAS-only refresh
8192 cycles /64 ms (HM5164805F, HM5164805FL)
4096 cycles /64 ms (HM5165805F, HM5165805FL)
 CBR/Hidden refresh
4096 cycles /64 ms (HM5164805F, HM5164805FL, HM5165805F, HM5165805FL)
Elpida Memory, Inc. is a joint venture DRAM company of NEC Corporation and Hitachi, Ltd.
HM5164805F Series, HM5165805F Series
• 4 variations of refresh
 RAS-only refresh
 CAS-before-RAS refresh
 Hidden refresh
 Self refresh (L-version)
• Battery backup operation (L-version)
Ordering Information
Type No.
Access time
Package
HM5164805FJ-5
HM5164805FJ-6
50 ns
60 ns
400-mil 32-pin plastic SOJ
(CP-32DC)
HM5164805FLJ-5
HM5164805FLJ-6
50 ns
60 ns
HM5165805FJ-5
HM5165805FJ-6
50 ns
60 ns
HM5165805FLJ-5
HM5165805FLJ-6
50 ns
60 ns
HM5164805FTT-5
HM5164805FTT-6
50 ns
60 ns
HM5164805FLTT-5
HM5164805FLTT-6
50 ns
60 ns
HM5165805FTT-5
HM5165805FTT-6
50 ns
60 ns
HM5165805FLTT-5
HM5165805FLTT-6
50 ns
60 ns
Data Sheet E0098H10
2
400-mil 32-pin plastic TSOP II
(TTP-32DC)
HM5164805F Series, HM5165805F Series
Pin Arrangement (HM5164805F Series)
32-pin SOJ
32-pin TSOP
VCC
1
32
V SS
VCC
1
32
V SS
I/O0
2
31
I/O7
I/O0
2
31
I/O7
I/O1
3
30
I/O6
I/O1
3
30
I/O6
I/O2
4
29
I/O5
I/O2
4
29
I/O5
I/O3
5
28
I/O4
I/O3
5
28
I/O4
NC
6
27
V SS
NC
6
27
V SS
VCC
7
26
CAS
VCC
7
26
CAS
WE
8
25
OE
WE
8
25
OE
RAS
9
24
A12
RAS
9
24
A12
A0
10
23
A11
A0
10
23
A11
A1
11
22
A10
A1
11
22
A10
A2
12
21
A9
A2
12
21
A9
A3
13
20
A8
A3
13
20
A8
A4
14
19
A7
A4
14
19
A7
A5
15
18
A6
A5
15
18
A6
VCC
16
17
V SS
VCC
16
17
V SS
(Top view)
(Top view)
Pin Description
Pin name
Function
A0 to A12
Address input
— Row/Refresh address A0 to A12
— Column address
A0 to A9
I/O0 to I/O7
Data input/output
RAS
Row address strobe
CAS
Column address strobe
WE
Write enable
OE
Output enable
VCC
Power supply
VSS
Ground
NC
No connection
Data Sheet E0098H10
3
HM5164805F Series, HM5165805F Series
Pin Arrangement (HM5165805F Series)
32-pin SOJ
32-pin TSOP
VCC
1
32
VSS
VCC
1
32
VSS
I/O0
2
31
I/O7
I/O0
2
31
I/O7
I/O1
3
30
I/O6
I/O1
3
30
I/O6
I/O2
4
29
I/O5
I/O2
4
29
I/O5
I/O3
5
28
I/O4
I/O3
5
28
I/O4
NC
6
27
VSS
NC
6
27
VSS
VCC
7
26
CAS
VCC
7
26
CAS
WE
8
25
OE
WE
8
25
OE
RAS
9
24
NC
RAS
9
24
NC
A0
10
23
A11
A0
10
23
A11
A1
11
22
A10
A1
11
22
A10
A2
12
21
A9
A2
12
21
A9
A3
13
20
A8
A3
13
20
A8
A4
14
19
A7
A4
14
19
A7
A5
15
18
A6
A5
15
18
A6
VCC
16
17
V SS
VCC
16
17
V SS
(Top view)
(Top view)
Pin Description
Pin name
Function
A0 to A11
Address input
— Row/Refresh address A0 to A11
— Column address
A0 to A10
I/O0 to I/O7
Data input/output
RAS
Row address strobe
CAS
Column address strobe
WE
Write enable
OE
Output enable
VCC
Power supply
VSS
Ground
NC
No connection
Data Sheet E0098H10
4
HM5164805F Series, HM5165805F Series
Block Diagram (HM5164805F Series)
RAS
CAS
WE
OE
Timing and control
Column decoder
A0
Column
A1
to
•
•
•
8M array
address
8M array
buffers
A9
•
•
•
Row
address
buffers
A10
to
A12
Row decoder
8M array
8M array
8M array
I/O buffers
I/O0
to
I/O7
8M array
8M array
8M array
Data Sheet E0098H10
5
HM5164805F Series, HM5165805F Series
Block Diagram (HM5165805F Series)
RAS
CAS
WE
OE
Timing and control
Column decoder
A0
Column
A1
to
•
•
•
8M array
address
8M array
buffers
A10
•
•
•
Row
address
buffers
Row decoder
8M array
8M array
8M array
8M array
8M array
8M array
A11
Data Sheet E0098H10
6
I/O buffers
I/O0
to
I/O7
HM5164805F Series, HM5165805F Series
Operation Table
RAS
CAS
WE
OE
I/O 0 to I/O 7
Operation
H
×
×
×
High-Z
Standby
L
L
H
L
L
L
Dout
Read cycle
L*
2
×
Din
Early write cycle
2
H
Din
Delayed write cycle
L
L
L*
L
L
H to L
L to H
Dout/Din
Read-modify-write cycle
L
H
×
×
High-Z
RAS-only refresh cycle
H to L
L
H
×
High-Z
CAS-before-RAS refresh cycle or
Self refresh cycle (L-version)
L
L
H
H
High-Z
Read cycle (Output disabled)
Notes: 1. H: VIH (inactive), L: VIL (active), ×: VIH or VIL
2. t WCS ≥ 0 ns: Early write cycle
t WCS < 0 ns: Delayed write cycle
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Terminal voltage on any pin relative to V SS
VT
–0.5 to VCC + 0.5 (≤ 4.6 V (max))
V
Power supply voltage relative to V SS
VCC
–0.5 to +4.6
V
Short circuit output current
Iout
50
mA
Power dissipation
PT
1.0
W
Storage temperature
Tstg
–55 to +125
°C
DC Operating Conditions
Parameter
Symbol
Min
Typ
Max
Unit
Notes
Supply voltage
VCC
3.0
3.3
3.6
V
1, 2
VSS
0
0
0
V
2
Input high voltage
VIH
2.0
—
VCC + 0.3
V
1
Input low voltage
VIL
–0.3
—
0.8
V
1
Ambient temperature range
Ta
0
—
70
˚C
Notes: 1. All voltage referred to VSS .
2. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS
pins must be on the same level.
Data Sheet E0098H10
7
HM5164805F Series, HM5165805F Series
DC Characteristics (HM5164805F Series)
HM5164805F
-5
Parameter
-6
Symbol Min
Max
Min
Max
Unit
Test conditions
I CC1
—
115
—
105
mA
t RC = min
I CC2
—
2
—
2
mA
TTL interface
RAS, CAS = VIH
Dout = High-Z
—
0.5
—
0.5
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
I CC2
—
300
—
300
µA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
I CC3
—
115
—
105
mA
t RC = min
Standby current*
I CC5
—
5
—
5
mA
RAS = VIH, CAS = VIL
Dout = enable
CAS-before-RAS refresh
current
I CC6
—
115
—
105
mA
t RC = min
EDO page mode current*1, * 3
I CC7
—
110
—
100
mA
RAS = VIL , CAS cycle,
t HPC = tHPC min
Battery backup current*4
(Standby with CBR refresh)
(L-version)
I CC10
—
1.2
—
1.2
mA
CMOS interface
Dout = High-Z
CBR refresh: tRC = 15.6 µs
t RAS ≤ 0.3 µs
Self refresh mode current
(L-version)
I CC11
—
500
—
500
µA
CMOS interface
RAS, CAS ≤ 0.2 V
Dout = High-Z
Input leakage current
I LI
–5
5
–5
5
µA
0 V ≤ Vin ≤ VCC + 0.3 V
Output leakage current
I LO
–5
5
–5
5
µA
0 V ≤ Vout ≤ VCC
Dout = disable
Output high voltage
VOH
2.4
VCC
2.4
VCC
V
High Iout = –2 mA
Output low voltage
VOL
0
0.4
0
0.4
V
Low Iout = 2 mA
1,
Operating current* *
2
Standby current
Standby current
(L-version)
RAS-only refresh current*2
1
Notes: 1. I CC depends on output load condition when the device is selected. ICC max is specified at the
output open condition.
2. Address can be changed once or less while RAS = VIL.
3. Measured with one sequential address change per EDO cycle, tHPC .
4. VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V.
Data Sheet E0098H10
8
HM5164805F Series, HM5165805F Series
DC Characteristics (HM5165805F Series)
HM5165805F
-5
Parameter
-6
Symbol Min
Max
Min
Max
Unit
Test conditions
I CC1
—
135
—
115
mA
t RC = min
I CC2
—
2
—
2
mA
TTL interface
RAS, CAS = VIH
Dout = High-Z
—
0.5
—
0.5
mA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
I CC2
—
300
—
300
µA
CMOS interface
RAS, CAS ≥ VCC – 0.2 V
Dout = High-Z
I CC3
—
135
—
115
mA
t RC = min
Standby current*
I CC5
—
5
—
5
mA
RAS = VIH, CAS = VIL
Dout = enable
CAS-before-RAS refresh
current
I CC6
—
135
—
115
mA
t RC = min
EDO page mode current*1, * 3
I CC7
—
110
—
100
mA
RAS = VIL , CAS cycle,
t HPC = tHPC min
Battery backup current*4
(Standby with CBR refresh)
(L-version)
I CC10
—
1.2
—
1.2
mA
CMOS interface
Dout = High-Z
CBR refresh: tRC = 15.6 µs
t RAS ≤ 0.3 µs
Self refresh mode current
(L-version)
I CC11
—
500
—
500
µA
CMOS interface
RAS, CAS ≤ 0.2 V
Dout = High-Z
Input leakage current
I LI
–5
5
–5
5
µA
0 V ≤ Vin ≤ VCC + 0.3 V
Output leakage current
I LO
–5
5
–5
5
µA
0 V ≤ Vout ≤ VCC
Dout = disable
Output high voltage
VOH
2.4
VCC
2.4
VCC
V
High Iout = –2 mA
Output low voltage
VOL
0
0.4
0
0.4
V
Low Iout = 2 mA
1,
Operating current* *
2
Standby current
Standby current
(L-version)
RAS-only refresh current*2
1
Notes: 1. I CC depends on output load condition when the device is selected. ICC max is specified at the
output open condition.
2. Address can be changed once or less while RAS = VIL.
3. Measured with one sequential address change per EDO cycle, tHPC .
4. VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V.
Data Sheet E0098H10
9
HM5164805F Series, HM5165805F Series
Capacitance (Ta = 25˚C, VCC = 3.3 V ± 0.3 V)
Parameter
Symbol
Typ
Max
Unit
Notes
Input capacitance (Address)
CI1
—
5
pF
1
Input capacitance (Clocks)
CI2
—
7
pF
1
Output capacitance (Data-in, Data-out)
CI/O
—
7
pF
1, 2
Notes : 1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. RAS and CAS = VIH to disable Dout.
Data Sheet E0098H10
10
HM5164805F Series, HM5165805F Series
AC Characteristics (Ta = 0 to +70˚C, VCC = 3.3 V ± 0.3 V, VSS = 0 V) *1, *2, *19
Test Conditions
•
•
•
•
•
Input rise and fall time: 2 ns
Input pulse levels: V IL = 0 V, V IH = 3.0 V
Input timing reference levels: 0.8 V, 2.0 V
Output timing reference levels: 0.8 V, 2.0 V
Output load: 1 TTL gate + C L (100 pF) (Including scope and jig)
Read, Write, Read-Modify-Write and Refresh Cycles (Common parameters)
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
Random read or write cycle time
t RC
84
—
104
—
ns
RAS precharge time
t RP
30
—
40
—
ns
CAS precharge time
t CP
8
—
10
—
ns
RAS pulse width
t RAS
50
10000
60
10000
ns
CAS pulse width
t CAS
8
10000
10
10000
ns
Row address setup time
t ASR
0
—
0
—
ns
Row address hold time
t RAH
8
—
10
—
ns
Column address setup time
t ASC
0
—
0
—
ns
Column address hold time
t CAH
8
—
10
—
ns
RAS to CAS delay time
t RCD
12
37
14
45
ns
3
RAS to column address delay time
t RAD
10
25
12
30
ns
4
RAS hold time
t RSH
13
—
15
—
ns
CAS hold time
t CSH
38
—
40
—
ns
CAS to RAS precharge time
t CRP
5
—
5
—
ns
OE to Din delay time
t OED
13
—
15
—
ns
5
OE delay time from Din
t DZO
0
—
0
—
ns
6
CAS delay time from Din
t DZC
0
—
0
—
ns
6
Transition time (rise and fall)
tT
2
50
2
50
ns
7
Data Sheet E0098H10
11
HM5164805F Series, HM5165805F Series
Read Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
Access time from RAS
t RAC
—
50
—
60
ns
8, 9
Access time from CAS
t CAC
—
13
—
15
ns
9, 10, 17
Access time from address
t AA
—
25
—
30
ns
9, 11, 17
Access time from OE
t OEA
—
13
—
15
ns
9
Read command setup time
t RCS
0
—
0
—
ns
Read command hold time to CAS
t RCH
0
—
0
—
ns
Read command hold time from RAS
t RCHR
50
—
60
—
ns
Read command hold time to RAS
t RRH
0
—
0
—
ns
Column address to RAS lead time
t RAL
25
—
30
—
ns
Column address to CAS lead time
t CAL
15
—
18
—
ns
CAS to output in low-Z
t CLZ
0
—
0
—
ns
Output data hold time
t OH
3
—
3
—
ns
Output data hold time from OE
t OHO
3
—
3
—
ns
Output buffer turn-off time
t OFF
—
13
—
15
ns
13, 21
Output buffer turn-off to OE
t OEZ
—
13
—
15
ns
13
CAS to Din delay time
t CDD
13
—
15
—
ns
5
Output data hold time from RAS
t OHR
3
—
3
—
ns
21
Output buffer turn-off to RAS
t OFR
—
13
—
15
ns
13, 21
Output buffer turn-off to WE
t WEZ
—
13
—
15
ns
13
WE to Din delay time
t WED
13
—
15
—
ns
RAS to Din delay time
t RDD
13
—
15
—
ns
Data Sheet E0098H10
12
12
12
21
HM5164805F Series, HM5165805F Series
Write Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
Write command setup time
t WCS
0
—
0
—
ns
14
Write command hold time
t WCH
8
—
10
—
ns
Write command pulse width
t WP
8
—
10
—
ns
Write command to RAS lead time
t RWL
13
—
15
—
ns
Write command to CAS lead time
t CWL
8
—
10
—
ns
Data-in setup time
t DS
0
—
0
—
ns
15
Data-in hold time
t DH
8
—
10
—
ns
15
Notes
Read-Modify-Write Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Read-modify-write cycle time
t RWC
116
—
140
—
ns
RAS to WE delay time
t RWD
67
—
79
—
ns
14
CAS to WE delay time
t CWD
30
—
34
—
ns
14
Column address to WE delay time
t AWD
42
—
49
—
ns
14
OE hold time from WE
t OEH
13
—
15
—
ns
Refresh Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
CAS setup time (CBR refresh cycle)
t CSR
5
—
5
—
ns
CAS hold time (CBR refresh cycle)
t CHR
8
—
10
—
ns
WE setup time (CBR refresh cycle)
t WRP
0
—
0
—
ns
WE hold time (CBR refresh cycle)
t WRH
8
—
10
—
ns
RAS precharge to CAS hold time
t RPC
5
—
5
—
ns
Notes
Data Sheet E0098H10
13
HM5164805F Series, HM5165805F Series
EDO Page Mode Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
EDO page mode cycle time
t HPC
20
—
25
—
ns
20
EDO page mode RAS pulse width
t RASP
—
100000 —
100000 ns
16
Access time from CAS precharge
t CPA
—
28
—
35
ns
9, 17
RAS hold time from CAS precharge
t CPRH
28
—
35
—
ns
Output data hold time from CAS low
t DOH
3
—
3
—
ns
CAS hold time referred OE
t COL
8
—
10
—
ns
CAS to OE setup time
t COP
5
—
5
—
ns
Read command hold time from
CAS precharge
t RCHC
28
—
35
—
ns
Write pulse width during CAS precharge t WPE
8
—
10
—
ns
OE precharge time
8
—
10
—
ns
t OEP
9, 22
EDO Page Mode Read-Modify-Write Cycle
HM5164805F/HM5165805F
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
EDO page mode read-modify-write
cycle time
t HPRWC
57
—
68
—
ns
WE delay time from CAS precharge
t CPW
45
—
54
—
ns
Notes
14
Refresh (HM5164805F Series)
Parameter
Symbol
Max
Unit
Notes
Refresh period
t REF
64
ms
8192 cycles
Parameter
Symbol
Max
Unit
Notes
Refresh period
t REF
64
ms
4096 cycles
Refresh (HM5165805F Series)
Data Sheet E0098H10
14
HM5164805F Series, HM5165805F Series
Self Refresh Mode (L-version)
HM5164805FL/HM5165805FL
-5
-6
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
RAS pulse width (self refresh)
t RASS
100
—
100
—
µs
25
RAS precharge time (self refresh)
t RPS
90
—
110
—
ns
25
CAS hold time (self refresh)
t CHS
–50
—
–50
—
ns
Notes: 1. AC measurements assume t T = 2 ns.
2. An initial pause of 200 µs is required after power up followed by a minimum of eight initialization
cycles (any combination of cycles containing RAS-only refresh or CAS-before-RAS refresh).
3. Operation with the tRCD (max) limit insures that tRAC (max) can be met, tRCD (max) is specified as a
reference point only; if t RCD is greater than the specified tRCD (max) limit, than the access time is
controlled exclusively by tCAC .
4. Operation with the tRAD (max) limit insures that tRAC (max) can be met, tRAD (max) is specified as a
reference point only; if t RAD is greater than the specified tRAD (max) limit, then access time is
controlled exclusively by tAA .
5. Either t OED or tCDD must be satisfied.
6. Either t DZO or tDZC must be satisfied.
7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition
times are measured between V IH (min) and VIL (max).
8. Assumes that t RCD ≤ tRCD (max) and tRAD ≤ tRAD (max). If tRCD or tRAD is greater than the maximum
recommended value shown in this table, t RAC exceeds the value shown.
9. Measured with a load circuit equivalent to 1 TTL loads and 100 pF.
10. Assumes that t RCD ≥ tRCD (max) and tRCD + tCAC (max) ≥ tRAD + tAA (max).
11. Assumes that t RAD ≥ tRAD (max) and tRCD + tCAC (max) ≤ tRAD + tAA (max).
12. Either t RCH or tRRH must be satisfied for a read cycles.
13. t OFF (max), tOEZ (max), tWEZ (max) and tOFR (max) define the time at which the outputs achieve the
open circuit condition and are not referred to output voltage levels.
14. t WCS , t RWD, t CWD, t AWD and t CPW are not restrictive operating parameters. They are included in the
data sheet as electrical characteristics only; if t WCS ≥ tWCS (min), the cycle is an early write cycle
and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if tRWD
≥ tRWD (min), tCWD ≥ tCWD (min), and tAWD ≥ tAWD (min), or tCWD ≥ tCWD (min), tAWD ≥ tAWD (min) and tCPW ≥
t CPW (min), the cycle is a read-modify-write and the data output will contain data read from the
selected cell; if neither of the above sets of conditions is satisfied, the condition of the data out
(at access time) is indeterminate.
15. t DS and t DH are referred to CAS leading edge in early write cycles and to WE leading edge in
delayed write or read-modify-write cycles.
16. t RASP defines RAS pulse width in EDO page mode cycles.
17. Access time is determined by the longest among t AA , t CAC and t CPA.
18. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data
to the device.
19. When output buffers are enabled once, sustain the low impedance state until valid data is
obtained. When output buffer is turned on and off within a very short time, generally it causes
large V CC/V SS line noise, which causes to degrade V IH min/VIL max level.
Data Sheet E0098H10
15
HM5164805F Series, HM5165805F Series
20. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode
read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle (EDO
page mode mix cycle (1), (2)), minimum value of CAS cycle (tCAS + tCP + 2 tT) becomes greater
than the specified t HPC (min) value. The value of CAS cycle time of mixed EDO page mode is
shown in EDO page mode mix cycle (1) and (2).
21. Data output turns off and becomes high impedance from later rising edge of RAS and CAS.
Hold time and turn off time are specified by the timing specifications of later rising edge of RAS
and CAS between t OHR and t OH and between tOFR and t OFF.
22. t DOH defines the time at which the output level go cross. V OL = 0.8 V, VOH = 2.0 V of output timing
reference level.
23. Before and after self refresh mode, execute CBR refresh to all refresh addresses in or within 64
ms period on the condition a and b below.
a. Enter self refresh mode within 15.6 µs after either burst refresh or distributed refresh at equal
interval to all refresh addresses are completed.
b. Start burst refresh or distributed refresh at equal interval to all refresh addresses within
15.6µs after exiting from self refresh mode.
24. In case of entering from RAS-only-refresh, it is necessary to execute CBR refresh before and
after self refresh mode according as note 23.
25 At t RASS > 100 µs, self refresh mode is activated, and not activated at tRASS < 10 µs. It is undefined
within the range of 10 µs ≤ tRASS ≤ 100 µs. For tRASS ≥ 10 µs, it is necessary to satisfy tRPS.
26. XXX: H or L (H: VIH (min) ≤ VIN ≤ VIH (max), L: VIL (min) ≤ VIN ≤ VIL (max))
///////: Invalid Dout
When the address, clock and input pins are not described on timing waveforms, their pins must
be applied VIH or VIL.
Data Sheet E0098H10
16
HM5164805F Series, HM5165805F Series
Timing Waveforms*26
Read Cycle
tRC
tRAS
tRP
RAS
tCSH
tCRP
tRCD
tT
tRSH
tCAS
CAS
tRAD
tASR
Address
tRAH
tRAL
tCAL
tASC
tCAH
Column
Row
tRRH
tRCHR
tRCS
tRCH
WE
tDZC
tCDD
tWED
tRDD
High-Z
;
Din
tDZO
tOEA
tOED
OE
tOEZ
tOHO
tOFF
tOH
tOFR
tOHR
tCAC
tAA
tRAC
tCLZ
tWEZ
Dout
Dout
Data Sheet E0098H10
17
HM5164805F Series, HM5165805F Series
Early Write Cycle
tRC
tRAS
tRP
RAS
tCSH
tCRP
tRCD
tRSH
tCAS
tT
CAS
tASR
Address
tRAH
Row
tASC
tCAH
Column
tWCS
tWCH
WE
tDS
Din
tDH
Din
High-Z*
Dout
* t WCS
Data Sheet E0098H10
18
t WCS (min)
HM5164805F Series, HM5165805F Series
Delayed Write Cycle*18
tRC
tRAS
tRP
RAS
tCSH
tCRP
tRCD
tRSH
tCAS
tT
CAS
tASR
Address
tRAH
tASC
Row
tCAH
Column
tCWL
tRWL
tWP
tRCS
WE
tDS
tDZC
High-Z
Din
;
Din
tDH
tOED
tDZO
tOEH
tOEP
OE
tOEZ
tCLZ
High-Z
Dout
Invalid Dout
Data Sheet E0098H10
19
HM5164805F Series, HM5165805F Series
Read-Modify-Write Cycle*18
tRWC
tRAS
tRP
RAS
tT
tRCD
tCAS
tCRP
CAS
tRAD
tASR
Address
tASC
tRAH
Row
tCAH
Column
tCWL
tCWD
tRCS
tRWL
tWP
tAWD
tRWD
WE
tDZC
tDS
High-Z
Din
;
Din
tDH
tOED
tDZO
tOEH
tOEA
tOEP
OE
tCAC
tAA
tOEZ
tRAC
tOHO
Dout
Dout
tCLZ
Data Sheet E0098H10
20
High-Z
HM5164805F Series, HM5165805F Series
RAS-Only Refresh Cycle
tRC
tRAS
tRP
RAS
tT
tRPC
tCRP
tCRP
CAS
tASR
tRAH
Row
Address
tOFR
tOFF
High-Z
;
Dout
Data Sheet E0098H10
21
HM5164805F Series, HM5165805F Series
CAS-Before-RAS Refresh Cycle
tRC
tRP
tRC
tRP
tRAS
tRAS
tRP
RAS
tT
tRPC
tCP
tRPC
tCSR
tCHR
tWRP
tWRH
tCP
tCRP
tCSR
tCHR
CAS
tWRP
WE
Address
tOFR
tOFF
High-Z
;
Dout
Data Sheet E0098H10
22
tWRH
HM5164805F Series, HM5165805F Series
Hidden Refresh Cycle
tRC
tRAS
tRP
tRC
tRAS
tRC
tRP
tRAS
tRP
RAS
tT
tRSH
tCHR
tCRP
tRCD
CAS
tRAD
tASR
Address
tRAH
tRAL
tASC
Row
tCAH
Column
tRRH
tRCS
tRCH
WE
tWED
tDZC
tCDD
tRDD
High-Z
Din
tDZO
tOED
tOEA
OE
tCAC
tAA
tRAC
tOFF
;
tCLZ
tOEZ
tWEZ
tOHO
tOH
Dout
Dout
tOFR
tOHR
Data Sheet E0098H10
23
HM5164805F Series, HM5165805F Series
EDO Page Mode Read Cycle (1)
t RP
t HPC
t RASP
RAS
tT
t CSH
t CP
t HPC
t CAS
CAS
t HPC
t CPRH
t CP
t
t CRP
RSH
t CAS
t RCHR
t RCS
t CP
tCAS
tCAS
t RCHC
t RCH t RCS
t RRH
t RCH
WE
tASR
Address
tRAH tASC
Row
tCAH
Column 1
t WPE
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t CAL
t CAL
t RAL
t CAH
tASC
t WED
Column 4
t CAL
t CAL
tRDD
tCDD
tDZC
High-Z
Din
tCOL
tDZO
tCOP
t OEP
tOED
tOEP
OE
tAA
tCAC
tCPA
tAA
tCAC
tOEZ
tOHO
tAA
tOEZ
;
tCAC
tAA
tOFR
tOHR
tOEZ
tCPA
tCPA
tOEA
tWEZ
tOEA
tRAC
Dout
tDOH
Dout 1
Dout 2
Data Sheet E0098H10
24
Dout 2
tOHO
Dout 3
tCAC
tOHO
tOFF
tOH
tOEA
Dout 4
HM5164805F Series, HM5165805F Series
EDO Page Mode Read Cycle (2)
t RP
t RASP
RAS
tT
t CSH
t CP
t HPC
t CAS
CAS
tHPC
t CP
t HPC
t CP
t CAS
t CAS
t CRP
tRSH
tCAS
t RCHC
t RRH
t RCH
t RCS
WE
tASR
Address
tRAH tASC
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
t CAL
t RAL
t CAH
tASC
Column 3
t CAL
t WED
Column 4
t CAL
tRDD
t CAL
tDZC
tCDD
High-Z
Din
tCOL
tDZO
tCOP
t OEP
tOED
tOEP
OE
tOEA
tCPA
tAA
tCAC
tCPA
tAA
tCAC
tOEZ
tAA
;
tCAC
tAA
tOFR
tOHR
tOEZ
tCPA
tDOH
tRAC
Dout
tOHO
tOEA
tOEZ
tDOH
tOHO
Dout 1
Dout 2
Dout 2
Dout 3
tCAC
tOHO
tOFF
tOH
tOEA
Dout 4
Data Sheet E0098H10
25
HM5164805F Series, HM5165805F Series
EDO Page Mode Early Write Cycle
tRP
tRASP
RAS
tT
tCSH
tHPC
tCAS
tRCD
tCP
tRSH
tCAS
tCP
tCAS
tCRP
CAS
tASR
Address
Row
tRAH
tASC
tCAH
Column 1
tWCS
tWCH
tASC
tCAH
Column 2
tWCS
tWCH
tASC
tCAH
Column N
tWCS
tWCH
WE
tDS
Din
Dout
tDH
Din 1
tDS
tDH
Din 2
tDS
tDH
Din N
High-Z*
* t WCS
Data Sheet E0098H10
26
t WCS (min)
HM5164805F Series, HM5165805F Series
EDO Page Mode Delayed Write Cycle*18
tRASP
tRP
RAS
tT
tCP
tRCD
tCRP
tCP
tCSH
tHPC
tCAS
tCAS
tRSH
tCAS
CAS
tRAD
tASR
tASC
tCAH
tASC
tCAH
Column 1
Column 2
tRAH
Address
Row
tASC
tCAH
tCWL
Column N
tCWL
tCWL
tRWL
tRCS
tRCS
tRCS
WE
tWP
tDZC tDS
tWP
tDZC tDS
tWP
tDZC tDS
tDH
tDH
Din
1
Din
tDZO tOED
tDH
Din
2
tDZO
tOED
tOEP
tOEH
tDZO
tOED
tOEP
tOEH
;
tOEP
tOEH
Din
N
OE
tCLZ
tCLZ
tOEZ
tCLZ
tOEZ
tOEZ
Dout
Invalid Dout
Invalid Dout
High-Z
Invalid Dout
Data Sheet E0098H10
27
HM5164805F Series, HM5165805F Series
EDO Page Mode Read-Modify-Write Cycle*18
t RASP
t RP
RAS
tT
t HPRWC
t CP
t RCD
t RSH
t CP
t CAS
t CAS
t CRP
t CAS
CAS
t RAD
t ASR
Address
t ASC
t RAH
Row
t ASC
t CAH
t CAH
Column 1
t ASC
t CAH
Column 2
t RWD
t CWL
t AWD
t CPW
t CWL
t CPW
t AWD
t RCS
t CWD
Column N
t CWL
t AWD
t RCS
t CWD
t RWL
t CWD
WE
t RCS
t WP
t
t DZC DS
t WP
t
t DZC DS
t WP
t
t DZC DS
t DH
t DH
Din
1
Din
t DZO
t OED
t OEP
t OEH
t DH
Din
2
t OED
t DZO
t OEP
t OEH
Din
N
t OED
t DZO
t OEP
t OEH
OE
t OHO
t OHO
;
;
t OHO
t OEA
t CAC
t OEA
t CAC
t AA
t OEA
t CAC
t AA
t CPA
t RAC
t OEZ
t CLZ
t AA
t CPA
t OEZ
t CLZ
t OEZ
t CLZ
High-Z
Dout
Dout 1
Dout 2
Data Sheet E0098H10
28
Dout N
HM5164805F Series, HM5165805F Series
EDO Page Mode Mix Cycle (1)*20
t RP
t RASP
RAS
tT
t CAS
CAS
t CRP
t CP
t CP
t CP
t CAS
tCAS
t CSH
tCAS
tCWL
tRSH
t RCD
t WCS
t WCH
tCPW
tAWD
WE
t ASC
tRAH
tASR
Address
Row
tCAH
Column 1
t RRH
t RCH
t RCS
t RCS
t ASC t CAH
tASC t CAH
Column 2
Column 3
tWP
tASC
t RAL
t CAH
Column 4
t CAL
t DS
Din
Din 1
tRDD
tCDD
t CAL
t DH
t DH
t DS
High-Z
Din 3
;
tOED
tOEP
tWED
OE
tCPA
tAA
tCAC
Dout
tOFR
tWEZ
tCPA
tCPA
tAA
tOEA
t DOH
Dout 2
t OEZ
tCAC t OHO
Dout 3
tAA
tOEZ
tCAC
tOHO
tOEA
tOFF
tOH
Dout 4
Data Sheet E0098H10
29
HM5164805F Series, HM5165805F Series
EDO Page Mode Mix Cycle (2) *20
t RP
t RASP
RAS
tT
t CSH
t CAS
CAS
t RCD
t CAS
tCAS
t RCHR
t RCS
t RCH
tWCS t WCH
Address
tCAS
tCWL
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t RRH
t RCH
tWP
tCPW
t ASC
tRAH
tRSH
t RCS
t RCS
WE
tASR
t CRP
t CP
t CP
t CP
t RAL
t CAH
tASC
Column 4
t CAL
t CAL
t DS
t DS
High-Z
Din
t DH
tRDD
tCDD
t DH
Din 2
Din 3
t OEP
t OEP
tOED
tOED
tCOP
tWED
tCOL
OE
t OEA
tAA
tOEA
tCAC
tOEZ
tCPA
tAA
tCAC
tRAC
tOEZ
t OHO
t OHO
Dout
Dout 1
Data Sheet E0098H10
30
tOFR
tWEZ
tCPA
Dout 3
tAA
tCAC
tOEZ
tOEA
tOFF
tOH
tOHO
Dout 4
HM5164805F Series, HM5165805F Series
Self Refresh Cycle (L-version)* 23, 24, 25
tRASS
tRP
tRPS
RAS
tT
;
;
tRPC
tCP
tCRP
tCHS
tCSR
CAS
tWRP
tWRH
WE
;
tOFR
tOFF
Dout
High-Z
Data Sheet E0098H10
31
HM5164805F Series, HM5165805F Series
Package Dimensions
HM5164805FJ/ FLJ Series
HM5165805FJ/ FLJ Series (CP-32DC)
Unit: mm
3.50 ± 0.26
1.165 Max
*0.43 ± 0.10
0.41 ± 0.08
1.27
2.55 ± 0.12
16
0.74
0.90 ± 0.26
1
11.18 ± 0.13
17
10.16 ± 0.13
32
20.95
21.38 Max
9.40 ± 0.25
0.10
*Dimension including the plating thickness
Base material dimension
Data Sheet E0098H10
32
Hitachi Code
JEDEC
EIAJ
Weight (reference value)
CP-32DC
—
Conforms
1.2 g
HM5164805F Series, HM5165805F Series
HM5164805FTT/FLTT Series
HM5165805FTT/FLTT Series (TTP-32DC)
Unit: mm
20.95
21.35 Max
17
10.16
32
1.27
0.21
M
0.80
11.76 ± 0.20
*0.145 ± 0.05
0.125 ± 0.04
1.20 Max
1.15 Max
0.10
*Dimension including the plating thickness
Base material dimension
0° – 5° 0.50 ± 0.10
Hitachi Code
JEDEC
EIAJ
Weight (reference value)
0.68
*0.42 ± 0.08
0.40 ± 0.06
16
0.13 ± 0.05
1
TTP-32DC
Conforms
—
0.51 g
Data Sheet E0098H10
33
HM5164805F Series, HM5165805F Series
Cautions
1. Elpida Memory, Inc. neither warrants nor grants licenses of any rights of Elpida Memory, Inc.’s or any
third party’s patent, copyright, trademark, or other intellectual property rights for information contained
in this document. Elpida Memory, Inc. bears no responsibility for problems that may arise with third
party’s rights, including intellectual property rights, in connection with use of the information contained
in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability.
However, contact Elpida Memory, Inc. before using the product in an application that demands
especially high quality and reliability or where its failure or malfunction may directly threaten human
life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control,
transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Elpida Memory,
Inc. particularly for maximum rating, operating supply voltage range, heat radiation characteristics,
installation conditions and other characteristics. Elpida Memory, Inc. bears no responsibility for failure
or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider
normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic
measures such as fail-safes, so that the equipment incorporating Elpida Memory, Inc. product does not
cause bodily injury, fire or other consequential damage due to operation of the Elpida Memory, Inc.
product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Elpida Memory, Inc..
7. Contact Elpida Memory, Inc. for any questions regarding this document or Elpida Memory, Inc.
semiconductor products.
Data Sheet E0098H10
34