WINBOND W9864G2GH-6

W9864G2GH
512K X 4 BANKS X 32BITS SDRAM
Table of Contents1.
GENERAL DESCRIPTION ......................................................................................................... 3
2.
FEATURES ................................................................................................................................. 3
3.
AVAILABLE PART NUMBER...................................................................................................... 4
4.
PIN CONFIGURATION ............................................................................................................... 5
5.
PIN DESCRIPTION..................................................................................................................... 6
6.
BLOCK DIAGRAM ...................................................................................................................... 7
7.
FUNCTIONAL DESCRIPTION.................................................................................................... 8
8.
7.1
Power Up and Initialization ............................................................................................. 8
7.2
Programming Mode Register.......................................................................................... 8
7.3
Bank Activate Command ................................................................................................ 8
7.4
Read and Write Access Modes ...................................................................................... 8
7.5
Burst Read Command .................................................................................................... 9
7.6
Burst Command .............................................................................................................. 9
7.7
Read Interrupted by a Read ........................................................................................... 9
7.8
Read Interrupted by a Write............................................................................................ 9
7.9
Write Interrupted by a Write............................................................................................ 9
7.10
Write Interrupted by a Read............................................................................................ 9
7.11
Burst Stop Command ................................................................................................... 10
7.12
Addressing Sequence of Sequential Mode .................................................................. 10
7.13
Addressing Sequence of Interleave Mode.................................................................... 10
7.14
Auto-precharge Command ........................................................................................... 11
7.15
Precharge Command.................................................................................................... 11
7.16
Self Refresh Command ................................................................................................ 11
7.17
Power Down Mode ....................................................................................................... 12
7.18
No Operation Command............................................................................................... 12
7.19
Deselect Command ...................................................................................................... 12
7.20
Clock Suspend Mode.................................................................................................... 12
OPERATION MODE ................................................................................................................. 13
8.1
9.
Simplified Stated Diagram ............................................................................................ 14
ELECTRICAL CHARACTERISTICS......................................................................................... 15
9.1
Absolute Maximum Ratings .......................................................................................... 15
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10.
11.
12.
9.2
Recommended DC Operating Conditions .................................................................... 15
9.3
Capacitance .................................................................................................................. 16
9.4
DC Characteristics ........................................................................................................ 16
9.5
AC Characteristics and Operating Condition................................................................ 17
TIMING WAVEFORMS ............................................................................................................. 20
10.1
Command Input Timing ................................................................................................ 20
10.2
Read Timing.................................................................................................................. 21
10.3
Control Timing of Input Data......................................................................................... 22
10.4
Control Timing of Output Data ...................................................................................... 23
10.5
Mode Register Set Cycle .............................................................................................. 24
OPERATING TIMING EXAMPLE ............................................................................................. 25
11.1
Interleaved Bank Read (Burst Length = 4, CAS Latency = 3)...................................... 25
11.2
Interleaved Bank Read (Burst Length = 4, CAS Latency = 3, Auto-precharge)........... 26
11.3
Interleaved Bank Read (Burst Length = 8, CAS Latency = 3)...................................... 27
11.4
Interleaved Bank Read (Burst Length = 8, CAS Latency = 3, Auto-precharge)........... 28
11.5
Interleaved Bank Write (Burst Length = 8) ................................................................... 29
11.6
Interleaved Bank Write (Burst Length = 8, Auto-precharge) ........................................ 30
11.7
Page Mode Read (Burst Length = 4, CAS Latency = 3)............................................... 31
11.8
Page Mode Read/Write (Burst Length = 8, CAS Latency = 3) ..................................... 32
11.9
Auto-precharge Read (Burst Length = 4, CAS Latency = 3) ........................................ 33
11.10
Auto-precharge Write (Burst Length = 4) .................................................................... 34
11.11
Auto Refresh Cycle ..................................................................................................... 35
11.12
Self Refresh Cycle....................................................................................................... 36
11.13
Bust Read and Single Write (Burst Length = 4, CAS Latency = 3)............................. 37
11.14
Power Down Mode ...................................................................................................... 38
11.15
Auto-precharge Timing (Write Cycle).......................................................................... 39
11.16
Auto-precharge Timing (Read Cycle).......................................................................... 40
11.17
Timing Chart of Read to Write Cycle........................................................................... 41
11.18
Timing Chart of Write to Read Cycle........................................................................... 41
11.19
Timing Chart of Burst Stop Cycle (Burst Stop Command).......................................... 42
11.20
Timing Chart of Burst Stop Cycle (Precharge Command) .......................................... 42
11.21
CKE/DQM Input Timing (Write Cycle) ......................................................................... 43
11.22
CKE/DQM Input Timing (Read Cycle)......................................................................... 44
PACKAGE SPECIFICATION .................................................................................................... 45
12.1
13.
86L TSOP (II)-400 mil................................................................................................... 45
REVISION HISTORY ................................................................................................................ 46
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
512K X 4 BANKS X 32BITS SDRAM
1. GENERAL DESCRIPTION
W9864G2GH is a high-speed synchronous dynamic random access memory (SDRAM), organized as
512K words × 4 banks × 32 bits. Using pipelined architecture and 0.11 µm process technology,
W9864G2GH delivers a data bandwidth of up to 800M bytes per second. For different application,
W9864G2GH is sorted into the following speed grades:-5,-6/-6C/-6I,-7.The -5 parts can run up to
200MHz/CL3.The -6/-6C/-6I parts can run up to 166 MHz/CL3. And the grade of –6C with tCK=7.5nS
on CL=2, tIH=0.8nS on CL=2/3.And the -6I grade which is guaranteed to support -40°C ~ 85°C.The -7
parts can run up to 143 MHz/CL3.
Accesses to the SDRAM are burst oriented. Consecutive memory location in one page can be
accessed at a burst length of 1, 2, 4, 8 or full page when a bank and row is selected by an ACTIVE
command. Column addresses are automatically generated by the SDRAM internal counter in burst
operation. Random column read is also possible by providing its address at each clock cycle. The
multiple bank nature enables interleaving among internal banks to hide the precharging time.
By having a programmable Mode Register, the system can change burst length, latency cycle,
interleave or sequential burst to maximize its performance. W9864G2GH is ideal for main memory in
high performance applications.
2. FEATURES
•
3.3V± 0.3V for -5/-6/-6C/-6I grade power supply
2.7V～3.6V for -7 grade power supply
•
524,288 words × 4 banks × 32 bits organization
•
Self Refresh Current: Standard and Low Power
•
CAS Latency: 2 & 3
•
Burst Length: 1, 2, 4, 8 and full page
•
Sequential and Interleave Burst
•
Byte data controlled by DQM0-3
•
Auto-precharge and controlled precharge
•
Burst read, single write operation
•
4K refresh cycles/64 mS
•
Interface: LVTTL
•
Packaged in TSOP II 86-pin, 400 mil
•
W9864G2GH is using Lead free materials
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
3. AVAILABLE PART NUMBER
SPEED (CL=3)
SELF REFRESH
CURRENT (MAX.)
OPERATING
TEMPERATURE
W9864G2GH-5
200 MHz
2mA
0°C ~ 70°C
W9864G2GH-6/-6C
166 MHz
2mA
0°C ~ 70°C
W9864G2GH-6I
166 MHz
2mA
-40°C ~ 85°C
W9864G2GH-7
143 MHz
2mA
0°C ~ 70°C
PART NUMBER
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
4. PIN CONFIGURATION
VCC
1
86
Vss
DQ0
2
85
DQ15
VCCQ
3
84
VSSQ
DQ1
4
83
DQ14
DQ2
5
82
DQ13
VSSQ
6
81
VCCQ
DQ3
7
80
DQ12
DQ4
8
79
DQ11
VCCQ
9
78
VSSQ
DQ5
10
77
DQ10
DQ6
11
76
DQ9
VSSQ
12
75
VCCQ
DQ7
13
74
DQ8
NC
14
73
NC
VCC
15
72
VSS
DQM0
16
71
DQM1
WE
17
70
NC
CAS
18
69
NC
RAS
19
68
CLK
CS
20
67
CKE
NC
21
66
A9
BS0
22
65
A8
BS1
23
64
A7
A10/AP
24
63
A6
A0
25
62
A5
A1
26
61
A4
A2
27
60
A3
DQM2
28
59
DQM3
VCC
29
58
VSS
NC
30
57
NC
DQ16
31
56
DQ31
VSSQ
32
55
VCCQ
DQ17
33
54
DQ30
DQ18
34
53
DQ29
35
52
VSSQ
DQ19
36
51
DQ28
DQ20
37
50
DQ27
VSSQ
38
49
VCCQ
DQ21
39
48
DQ26
VCCQ
DQ22
40
47
DQ25
VCCQ
41
46
VSSQ
DQ23
42
45
DQ24
VCC
43
44
VSS
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
5. PIN DESCRIPTION
PIN NUMBER
PIN NAME
FUNCTION
DESCRIPTION
24, 25, 26, 27, 60, 61, 62,
63, 64, 65, 66
A0−A10
Address
Multiplexed pins for row and column address.
Row address: A0−A10. Column address: A0−A7.
A10 is sampled during a precharge command to
determine if all banks are to be precharged or
bank selected by BS0, BS1.
22, 23
BS0, BS1
Bank Select
Select bank to activate during row address latch
time, or bank to read/write during address latch
time.
2, 4, 5, 7, 8, 10, 11, 13, 31,
33, 34, 36, 37, 39, 40, 42,
45, 47, 48, 50, 51, 53, 54,
56, 74, 76, 77, 79, 80, 82,
83, 85
DQ0−DQ31
20
CS
Chip Select
19
RAS
Row Address
Strobe
18
CAS
Column Address
Referred to RAS
Strobe
17
WE
Write Enable
16, 28, 59, 71
Input/Output
DQM0−DQM3
Mask
The output buffer is placed at Hi-Z (with latency
of 2) when DQM is sampled high in read cycle.
In write cycle, sampling DQM high will block the
write operation with zero latency.
68
CLK
Clock Inputs
System clock used to sample inputs on the rising
edge of clock.
Data
Input/ Output
Multiplexed pins for data output and input.
Disable or enable the command decoder. When
command decoder is disabled, new command is
ignored and previous operation continues.
Command input. When sampled at the rising
edge of the clock RAS , CAS and WE define
the operation to be executed.
Referred to RAS
67
CKE
Clock Enable
CKE controls the clock activation and
deactivation. When CKE is low, Power Down
mode, Suspend mode, or Self Refresh mode is
entered.
1, 15, 29, 43
VCC
Power
Power for input buffers and logic circuit inside
DRAM.
44, 58, 72, 86
VSS
Ground
Ground for input buffers and logic circuit inside
DRAM.
3, 9, 35, 41, 49, 55, 75, 81
VCCQ
Power for I/O
Buffer
Separated power from VCC, to improve DQ
noise immunity.
6, 12, 32, 38, 46, 52, 78, 84
VSSQ
Ground for I/O
Buffer
Separated ground from VSS, to improve DQ
noise immunity.
14, 21, 30, 57, 69, 70, 73
NC
No Connection
No connection.(The NC pin must connect to
ground or floating.)
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
6. BLOCK DIAGRAM
CLK
CLOCK
BUFFER
CKE
CONTROL
CS
GENERATOR
DECODER
COLUMN DECODER
ROW DECODER
WE
A10
MODE
REGISTER
A0
CELL ARRAY
BANK #1
SENSE AMPLIFIER
SENSE AMPLIFIER
ADDRESS
BUFFER
DATA CONTROL
CIRCUIT
REFRESH
COUNTER
DQ
BUFFER
DQ0
DQ31
COLUMN
DQM0~3
COUNTER
COLUMN DECODER
ROW DECODER
A9
BS0
BS1
CELL ARRAY
BANK #0
COLUMN DECODER
ROW DECODER
CAS
SIGNAL
COMMAND
CELL ARRAY
BANK #2
COLUMN DECODER
ROW DECODER
RAS
SENSE AMPLIFIER
CELL ARRAY
BANK #3
SENSE AMPLIFIER
NOTE:
The cell array configuration is 2048 * 256 * 32
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7. FUNCTIONAL DESCRIPTION
7.1
Power Up and Initialization
The default power up state of the mode register is unspecified. The following power up and
initialization sequence need to be followed to guarantee the device being preconditioned to each user
specific needs.
During power up, all VCC and VCCQ pins must be ramp up simultaneously to the specified voltage when
the input signals are held in the “NOP” state. The power up voltage must not exceed VCC + 0.3V on
any of the input pins or VCC supplies. After power up, an initial pause of 200 µS is required followed by
a precharge of all banks using the precharge command. To prevent data contention on the DQ bus
during power up, it is required that the DQM and CKE pins be held high during the initial pause period.
Once all banks have been precharged, the Mode Register Set Command must be issued to initialize
the Mode Register. An additional eight Auto Refresh cycles (CBR) are also required before or after
programming the Mode Register to ensure proper subsequent operation.
7.2
Programming Mode Register
After initial power up, the Mode Register Set Command must be issued for proper device operation.
All banks must be in a precharged state and CKE must be high at least one cycle before the Mode
Register Set Command can be issued. The Mode Register Set Command is activated by the low
signals of RAS , CAS , CS and WE at the positive edge of the clock. The address input data
during this cycle defines the parameters to be set as shown in the Mode Register Operation table. A
new command may be issued following the mode register set command once a delay equal to tRSC has
elapsed. Please refer to the next page for Mode Register Set Cycle and Operation Table.
7.3
Bank Activate Command
The Bank Activate command must be applied before any Read or Write operation can be executed.
The operation is similar to RAS activate in EDO DRAM. The delay from when the Bank Activate
command is applied to when the first read or write operation can begin must not be less than the RAS
to CAS delay time (tRCD). Once a bank has been activated it must be precharged before another Bank
Activate command can be issued to the same bank. The minimum time interval between successive
Bank Activate commands to the same bank is determined by the RAS cycle time of the device (tRC).
The minimum time interval between interleaved Bank Activate commands (Bank A to Bank B and vice
versa) is the Bank to Bank delay time (tRRD). The maximum time that each bank can be held active is
specified as TRAS (max.).
7.4
Read and Write Access Modes
After a bank has been activated, a read or write cycle can be followed. This is accomplished by setting
RAS high and CAS low at the clock rising edge after minimum of tRCD delay. WE pin voltage level
defines whether the access cycle is a read operation ( WE high), or a write operation ( WE low). The
address inputs determine the starting column address. Reading or writing to a different row within an
activated bank requires the bank be precharged and a new Bank Activate command be issued. When
more than one bank is activated, interleaved bank Read or Write operations are possible. By using the
programmed burst length and alternating the access and precharge operations between multiple
banks, seamless data access operation among many different pages can be realized. Read or Write
Commands can also be issued to the same bank or between active banks on every clock cycle.
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7.5
Burst Read Command
The Burst Read command is initiated by applying logic low level to CS and CAS while holding
RAS and WE high at the rising edge of the clock. The address inputs determine the starting column
address for the burst. The Mode Register sets type of burst (sequential or interleave) and the burst
length (1, 2, 4, 8 and full page) during the Mode Register Set Up cycle. Table 2 and 3 in the next page
explain the address sequence of interleave mode and sequence mode.
7.6
Burst Command
The Burst Write command is initiated by applying logic low level to CS , CAS and WE while
holding RAS high at the rising edge of the clock. The address inputs determine the starting column
address. Data for the first burst write cycle must be applied on the DQ pins on the same clock cycle
that the Write Command is issued. The remaining data inputs must be supplied on each subsequent
rising clock edge until the burst length is completed. Data supplied to the DQ pins after burst finishes
will be ignored.
7.7
Read Interrupted by a Read
A Burst Read may be interrupted by another Read Command. When the previous burst is interrupted,
the remaining addresses are overridden by the new read address with the full burst length. The data
from the first Read Command continues to appear on the outputs until the CAS Latency from the
interrupting Read Command the is satisfied.
7.8
Read Interrupted by a Write
To interrupt a burst read with a Write Command, DQM may be needed to place the DQs (output
drivers) in a high impedance state to avoid data contention on the DQ bus. If a Read Command will
issue data on the first and second clocks cycles of the write operation, DQM is needed to insure the
DQs are tri-stated. After that point the Write Command will have control of the DQ bus and DQM
masking is no longer needed.
7.9
Write Interrupted by a Write
A burst write may be interrupted before completion of the burst by another Write Command. When the
previous burst is interrupted, the remaining addresses are overridden by the new address and data
will be written into the device until the programmed burst length is satisfied.
7.10 Write Interrupted by a Read
A Read Command will interrupt a burst write operation on the same clock cycle that the Read
Command is activated. The DQs must be in the high impedance state at least one cycle before the
new read data appears on the outputs to avoid data contention. When the Read Command is
activated, any residual data from the burst write cycle will be ignored.
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7.11 Burst Stop Command
A Burst Stop Command may be used to terminate the existing burst operation but leave the bank open
for future Read or Write Commands to the same page of the active bank, if the burst length is full
page. Use of the Burst Stop Command during other burst length operations is illegal. The Burst Stop
Command is defined by having RAS and CAS high with CS and WE low at the rising edge of
the clock. The data DQs go to a high impedance state after a delay, which is equal to the CAS
Latency in a burst read cycle, interrupted by Burst Stop.
7.12 Addressing Sequence of Sequential Mode
A column access is performed by increasing the address from the column address which is input to
the device. The disturb address is varied by the Burst Length as shown in Table 2.
Table 2 Address Sequence of Sequential Mode
DATA
ACCESS ADDRESS
BURST LENGTH
Data 0
n
BL = 2 (disturb address is A0)
Data 1
n+1
No address carry from A0 to A1
Data 2
n+2
BL = 4 (disturb addresses are A0 and A1)
Data 3
n+3
No address carry from A1 to A2
Data 4
n+4
Data 5
n+5
BL = 8 (disturb addresses are A0, A1 and A2)
Data 6
n+6
No address carry from A2 to A3
Data 7
n+7
7.13 Addressing Sequence of Interleave Mode
A column access is started in the input column address and is performed by inverting the address bit
in the sequence shown in Table 3.
Table 3 Address Sequence of Interleave Mode
DATA
ACCESS ADDRESS
BURST LENGTH
Data 0
A8 A7 A6 A5 A4 A3 A2 A1 A0
BL = 2
Data 1
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 2
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 3
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 4
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 5
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 6
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 7
A8 A7 A6 A5 A4 A3 A2 A1 A0
- 10 -
BL = 4
BL = 8
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7.14 Auto-precharge Command
If A10 is set to high when the Read or Write Command is issued, then the Auto-precharge function is
entered. During Auto-precharge, a Read Command will execute as normal with the exception that the
active bank will begin to precharge automatically before all burst read cycles have been completed.
Regardless of burst length, it will begin a certain number of clocks prior to the end of the scheduled
burst cycle. The number of clocks is determined by CAS Latency.
A Read or Write Command with Auto-precharge cannot be interrupted before the entire burst
operation is completed for the same bank. Therefore, use of a Read, Write, or Precharge Command is
prohibited during a read or write cycle with Auto-precharge. Once the precharge operation has started,
the bank cannot be reactivated until the Precharge time (tRP) has been satisfied. Issue of Autoprecharge command is illegal if the burst is set to full page length. If A10 is high when a Write
Command is issued, the Write with Auto-precharge function is initiated. The SDRAM automatically
enters the precharge operation two clocks delay from the last burst write cycle. This delay is referred
to as write tWR. The bank undergoing Auto-precharge cannot be reactivated until tWR and tRP are
satisfied. This is referred to as tDAL, Data-in to Active delay (tDAL = tWR + tRP). When using the Autoprecharge Command, the interval between the Bank Activate Command and the beginning of the
internal precharge operation must satisfy tRAS (min).
7.15 Precharge Command
The Precharge Command is used to precharge or close a bank that has been activated. The
Precharge Command is entered when CS , RAS and WE are low and CAS is high at the rising
edge of the clock. The Precharge Command can be used to precharge each bank separately or all
banks simultaneously. Three address bits, A10, BS0 and BS1 are used to define which bank(s) is to
be precharged when the command is issued. After the Precharge Command is issued, the precharged
bank must be reactivated before a new read or write access can be executed. The delay between the
Precharge Command and the Activate Command must be greater than or equal to the Precharge time
(tRP).
7.16 Self Refresh Command
The Self Refresh Command is defined by having CS , RAS , CAS and CKE held low with WE
high at the rising edge of the clock. All banks must be idle prior to issuing the Self Refresh Command.
Once the command is registered, CKE must be held low to keep the device in Self Refresh mode.
When the SDRAM has entered Self Refresh mode all of the external control signals, except CKE, are
disabled. The clock is internally disabled during Self Refresh Operation to save power. The device will
exit Self Refresh operation after CKE is returned high. A minimum delay time is required when the
device exits Self Refresh Operation and before the next command can be issued. This delay is equal
to the tAC cycle time plus the Self Refresh exit time.
If, during normal operation, AUTO REFRESH cycles are issued in bursts (as opposed to being evenly
distributed), a burst of 4,096 AUTO REFRESH cycles should be completed just prior to entering and
just after exiting the self refresh mode.
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7.17 Power Down Mode
The Power Down mode is initiated by holding CKE low. All of the receiver circuits except CKE are
gated off to reduce the power. The Power Down mode does not perform any refresh operations,
therefore the device can not remain in Power Down mode longer than the Refresh period (tREF) of the
device.
The Power Down mode is exited by bringing CKE high. When CKE goes high, a No Operation
Command is required on the next rising clock edge, depending on tCK. The input buffers need to be
enabled with CKE held high for a period equal to tCES (min.) + tCK (min.).
7.18 No Operation Command
The No Operation Command should be used in cases when the SDRAM is in a idle or a wait state to
prevent the SDRAM from registering any unwanted commands between operations. A No Operation
Command is registered when CS is low with RAS , CAS and WE held high at the rising edge of
the clock. A No Operation Command will not terminate a previous operation that is still executing, such
as a burst read or write cycle.
7.19 Deselect Command
The Deselect Command performs the same function as a No Operation Command. Deselect
Command occurs when CS is brought high, the RAS , CAS and WE signals become don’t cares.
7.20 Clock Suspend Mode
During normal access mode, CKE must be held high enabling the clock. When CKE is registered low
while at least one of the banks is active, Clock Suspend Mode is entered. The Clock Suspend mode
deactivates the internal clock and suspends any clocked operation that was currently being executed.
There is a one clock delay between the registration of CKE low and the time at which the SDRAM
operation suspends. While in Clock Suspend mode, the SDRAM ignores any new commands that are
issued. The Clock Suspend mode is exited by bringing CKE high. There is a one clock cycle delay
from when CKE returns high to when Clock Suspend mode is exited.
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Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
8. OPERATION MODE
Fully synchronous operations are performed to latch the commands at the positive edges of CLK.
Table 1 shows the truth table for the operation commands.
TABLE 1 TRUTH TABLE (NOTE (1), (2))
COMMAND
Device State CKEn-1
CKEn
DQM
BS0, 1
A10
A0-A9
CS
RAS
CAS
WE
Bank Active
Idle
H
x
x
v
v
V
L
L
H
H
Bank Precharge
Any
H
x
x
v
L
x
L
L
H
L
Precharge All
Any
H
x
x
x
H
x
L
L
H
L
Write
Active (3)
H
x
x
v
L
v
L
H
L
L
Write with Auto-precharge
Active (3)
H
x
x
v
H
v
L
H
L
L
Read
Active (3)
H
x
x
v
L
v
L
H
L
H
Read with Auto-precharge
Active (3)
H
x
x
v
H
v
L
H
L
H
Mode Register Set
Idle
H
x
x
v
v
v
L
L
L
L
No-Operation
Any
H
x
x
x
x
x
L
H
H
H
Active (4)
H
x
x
x
x
x
L
H
H
L
Burst Stop
Device Deselect
Any
H
x
x
x
x
x
H
x
x
x
Auto-Refresh
Idle
H
H
x
x
x
x
L
L
L
H
Self-Refresh Entry
Idle
H
L
x
x
x
x
L
L
L
H
Self Refresh Exit
Clock suspend Mode
Entry
idle
L
H
x
x
x
x
H
x
x
x
(S.R)
L
H
x
x
x
x
L
H
H
x
Active
H
L
x
x
x
x
x
x
x
x
Idle
H
L
x
x
x
x
H
x
x
X
Active (5)
H
L
x
x
x
x
L
H
H
H
Clock Suspend Mode Exit
Active
L
H
x
x
x
x
x
x
x
X
Power Down Mode Exit
L
H
x
x
x
x
H
x
x
X
(power
down)
L
H
x
x
x
x
L
H
H
H
Data write/Output Enable
Active
H
x
L
x
x
x
x
x
x
x
Data Write/Output Disable
Active
x
H
x
x
x
x
x
x
x
Power Down Mode Entry
Any
H
Notes:
(1) v = valid, x = Don’t care, L = Low Level, H = High Level
(2) CKEn signal is input leve l when commands are provided.
(3) These are state of bank designated by BS0, BS1 signals.
(4) Device state is full page burst operation.
(5) Power Down Mode can not be entered in the burst cycle.
When this command asserts in the burst cycle, device state is clock suspend mode.
- 13 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
8.1
Simplified Stated Diagram
Self
Refresh
LF
SE
Mode
Register
Set
MRS
it
ex
LF
E
S
REF
IDLE
CBR
Refresh
CK
E
CK
E
ACT
Power
Down
CKE
Writ
ew
Aut
o pr ith
ech
arg
e
BS
T
W
READ
Precharge
PRE
)
tion
ina
term
ge
har
rec
E(p
CKE
PR
WRITEA
POWER
ON
Read
Write
PR
E( p
rec
har
ge
term
inat
ion
)
CKE
d
WRITEA
SUSPEND
Read
WRITE
CKE
ea
R
CKE
T
BS
WRITE
SUSPEND
ith
dw
Rea arge
ch
p re
Write
Active
Power
Down
CKE
o
Aut
rit
e
ROW
ACTIVE
CKE
CKE
READA
CKE
CKE
READ
SUSPEND
READA
SUSPEND
Precharge
Automatic sequence
Manual input
MRS = Mode Register Set
REF = Refresh
ACT = Active
PRE = Precharge
WRITEA = Write with Auto-precharge
READA = Read with Auto-precharge
- 14 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
9. ELECTRICAL CHARACTERISTICS
9.1
Absolute Maximum Ratings
PARAMETER
SYMBOL
RATING
UNIT
NOTES
Input, Column Output Voltage
VIN, VOUT
-0.3~VCC+ 0.3V
V
1
Power Supply Voltage
VCC, VCCQ
-0.3~4.6V
V
1
Operating Temperature
TOPR
0 ~ 70
°C
1
Operating Temperature (-6I)
TOPR
-40 ~ 85
°C
1
Storage Temperature
TSTG
-55 ~ 150
°C
1
TSOLDER
260
°C
1
PD
1
W
1
IOUT
50
mA
1
Soldering Temperature (10s)
Power Dissipation
Short Circuit Output Current
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability
of the device.
9.2
Recommended DC Operating Conditions
(TA = 0 to 70°C for -5/-6/-6C/-7, TA = -40 to 85°C for -6I )
PARAMETER
SYM.
MIN.
TYP.
MAX.
UNIT
VCC
3.0
3.3
3.6
V
VCCQ
3.0
3.3
3.6
V
VCC
2.7
3.3
3.6
V
VCCQ
2.7
3.3
3.6
V
Input High Voltage
VIH
2
-
VCC +0.3
V
1
Input Low Voltage
VIL
-0.3
-
+0.8
V
2
Output logic high voltage
VOH
2.4V
-
-
V
IOH= -2mA
Output logic low voltage
VOL
-
-
0.4
V
IOL= 2mA
Input leakage current
II(L)
-10
-
10
µA
3
Output leakage current
Io(L)
-10
-
10
µA
4
Power Supply Voltage
Power Supply Voltage (for I/O Buffer)
Power Supply Voltage(-7)
Power Supply Voltage
(for I/O Buffer)(-7)
NOTES
Note: 1. VIH (max.) = VCC/VCCQ+1.2V for pulse width < 5 nS
2. VIL (min.) = VSS/VSSQ-1.2V for pulse width < 5 nS
3. Any input 0V<VIN<VCCQ.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
4. Output disabled, 0V ≤ VOUT ≤ VCCQ.
- 15 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
9.3
Capacitance
(VCC =3.3V±0.3V for -5/-6/-6C/-6I , VCC=2.7V-3.6V for -7, TA = 25 °C, f = 1 MHz)
PARAMETER
Input Capacitance
(A0 to A10, BS0, BS1, CS , RAS , CAS ,
WE
, DQM, CKE)
Input Capacitance (CLK)
Input/Output capacitance (DQ0−DQ31)
SYM.
MIN.
MAX.
UNIT
Ci
2.5
4
pf
CCLK
2.5
4
pf
Co
4
6.5
pf
Note: These parameters are periodically sampled and not 100% tested
9.4
DC Characteristics
(VCC = 3.3V±0.3V for -5/-6/-6C,VCC=2.7V-3.6V for -7 on TA = 0°~70°C, VCC = 3.3V±0.3V for 6I on TA = -40°~85°C. )
PARAMETER
-5
-6/6C/-6I
-7
MAX.
MAX.
MAX.
ICC1
110
100
90
3
ICC2
40
35
30
3
ICC2P
3
3
3
3
ICC2S
15
15
15
ICC2PS
3
3
3
ICC3
70
65
60
ICC3P
15
15
15
ICC4
150
140
130
3, 4
ICC5
170
150
140
3
ICC6
2
2
2
SYM.
UNIT
NOTES
Operating Current
tCK = min., tRC = min.
Active precharge command
cycling without burst operation
1 Bank Operation
Standby Current
tCK = min., CS = VIH
VIH/L = VIH (min.)/VIL (max.)
Bank: Inactive State
CKE = VIH
CKE = VIL
(Power Down mode)
Standby Current
CLK = VIL, CS = VIH
VIH/L=VIH (min.)/VIL (max.)
Bank: Inactive State
No Operating Current
tCK = min., CS = VIH (min.)
Bank: Active State (4 Banks)
CKE = VIH
CKE = VIL
(Power Down mode)
CKE = VIH
CKE = VIL
(Power Down mode)
mA
Burst Operating Current
(tCK = min.)
Read/Write command cycling
Auto Refresh Current
(tCK = min.)
Auto refresh command cycling
Self Refresh Current
Self refresh mode
(CKE = 0.2V)
- 16 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
9.5
AC Characteristics and Operating Condition
(VCC = 3.3V±0.3V for -5/-6/-6C,VCC=2.7V-3.6V for -7 on TA = 0°~70°C, VCC = 3.3V±0.3V for 6I on TA = -40°~85°C.)
(Notes: 5, 6.)
PARAMETER
Ref/Active to
Ref/Active Command
Period
SYM
-5
MIN.
-6/-6I
MAX.
MIN.
-6C
MAX.
MAX.
55
tRAS
40
Active to Read/Write
tRCD
Command Delay Time
15
18
18
20
Read/Write(a) to
Read/ Write(b)
Command Period
tCCD
1
1
1
1
tRP
15
18
18
20
tRRD
10
12
12
14
tWR
2
2
2
2
Precharge to Active(b)
Command Period
Active(a) to Active(b)
Command Period
Write Recovery Time
CL* = 2
10000
0
42
60
MIN.
tRC
Active to precharge
Command Period
60
MIN.
-7
100000
42
MAX.
UNIT
NOTES
65
100000
45
100000
nS
tCK
nS
tCK
CL* = 3
CLK Cycle Time
CL* = 2
tCK
CL* = 3
10
1000
10
1000
7.5
1000
10
1000
5
1000
6
1000
6
1000
7
1000
CLK High Level
tCH
2
2
2
2
9
CLK Low Level
tCL
2
2
2
2
9
Access Time from
CLK CL* = 2
tAC
CL* = 3
－
6
5.5
6
4.5
5
5
5.5
11
Output Data Hold
Time
tOH
2
Output Data High
Impedance Time
tHZ
2
Output Data Low
Impedance Time
tLZ
0
Power Down Mode
Entry Time
tSB
0
5
0
6
0
6
0
7
Transition Time of
CLK (Rise and Fall)
tT
0.5
1
0.5
1
0.5
1
0.5
1
Data-in-Set-up Time
tDS
1.5
1.5
1.5
1.5
10
Data-in Hold Time
tDH
1
1
0.8
1
10
Address Set-up Time
tAS
1.5
1.5
1.5
1.5
10
Address Hold Time
tAH
1
1
0.8
1
10
2
5
2
2
6
0
2
2
6
0
2
11
7
0
8
nS
11
7
CKE Set-up Time
tCKS
1.5
1.5
1.5
1.5
10
CKE Hold Time
tCKH
1
1
0.8
1
10
1.5
1.5
1.5
1.5
10
1
1
0.8
1
10
Command Set-up Time tCMS
Command Hold Time
tCMH
- 17 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
AC Characteristics and Operating Condition, continued
PARAMETER
SYM
-5
MIN.
-6/-6I
MAX.
MIN.
64
MAX.
-6C
MIN.
-7
MAX.
64
MIN.
64
MAX.
UNIT
Refresh Time
tREF
64
Mode Register Set
Cycle Time
tRSC
10
12
12
14
nS
Exit self refresh to
Active command
tXSR
70
72
72
75
nS
NOTES
mS
Notes:
1.Operation exceeds “Absolute Maximum Ratings” may cause permanent damage to the devices.
2. All voltages are referenced to VSS
3. These parameters depend on the cycle rate and listed values are measured at a cycle rate with the
minimum values of tCK and tRC.
4. These parameters depend on the output loading conditions. Specified values are obtained with
output open.
5. Power up sequence please refer to "Functional Description" section described before.
6. AC Testing Conditions
PARAMETER
CONDITIONS
Output Reference Level
1.4V
Output Load
See diagram below
Input Signal Levels (VIH/VIL)
2.4V/0.4V
Transition Time (tT: tr/tf) of Input Signal
1/1 nS
Input Reference Level
1.4V
1.4 V
50 ohms
output
Z = 50 ohms
30pF
AC TEST LOAD
- 18 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
7. Transition times are measured between VIH and VIL.
8. tHZ defines the time at which the outputs achieve the open circuit condition and is not referenced to
output level.
9. These parameters account for the number of clock cycles and depend on the operating frequency
of the clock, as follows the number of clock cycles = specified value of timing/ clock period (count
fractions as whole number)
(1)tCH is the pulse width of CLK measured from the positive edge to the negative edge referenced to VIH (min.).
tCL is the pulse width of CLK measured from the negative edge to the positive edge referenced to VIL (max.).
(2)A.C Latency Characteristics
CKE to clock disable (CKE Latency)
1
DQM to output to HI-Z (Read DQM Latency)
2
DQM to output to HI-Z (Write DQM Latency)
0
Write command to input data (Write Data Latency)
0
CS to Command input ( CS Latency)
0
Precharge to DQ Hi-Z Lead time
Precharge to Last Valid data out
Bust Stop Command to DQ Hi-Z Lead time
Bust Stop Command to Last Valid Data out
Read with Auto-precharge Command to Active/Ref Command
Write with Auto-precharge Command to Active/Ref Command
CL = 2
2
CL = 3
3
CL = 2
1
CL = 3
2
CL = 2
2
CL = 3
3
CL = 2
1
CL = 3
2
CL = 2
BL + tRP
CL = 3
BL + tRP
CL = 2
(BL+1) + tRP
CL = 3
(BL+1) + tRP
tCK
tCK + nS
10. Assumed input rise and fall time (tT ) = 1nS.
If tr & tf is longer than 1nS, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]nS should be added to the parameter
( The tT maximum can’t be more than 10nS for low frequency application. )
11. If clock rising time (tT) is longer than 1nS, (tT/2-0.5)nS should be added to the parameter.
- 19 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10. TIMING WAVEFORMS
10.1 Command Input Timing
tCL
tCK
CLK
tCH
VIH
VIL
tT
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
tAS
tAH
tCMH
tT
tCMS
CS
RAS
CAS
WE
A0-A10
BS0, 1
tCKS
tCKH
tCKS
tCKH
tCKS
tCKH
CKE
- 20 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10.2
Read Timing
Read CAS Latency
CLK
CS
RAS
CAS
WE
A0-A10
BS0, 1
tAC
tAC
tLZ
tHZ
tOH
tOH
Valid
Data-Out
Valid
Data-Out
DQ
Read Command
Burst Length
- 21 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10.3
Control Timing of Input Data
(Word Mask)
CLK
tCMH
tCMS
tCMH
tCMS
DQM0
tCMH
tCMS
tDH
tDS
tCMH
tCMS
DQM1
tDS
tDH
tDS
Valid
Data-in
DQ0 -DQ7
tDS
tDH
Valid
Data-in
tDS
Valid
Data-in
DQ8-DQ15
tDS
tDH
tDS
tDH
tDS
tDH
tDS
tDH
tDS
tDH
tDS
tDH
tDS
tDS
tDH
tDH
Valid
Data-in
tDS
Valid
Data-in
Valid
Data-in
tDH
Valid
Data-in
Valid
Data-in
Valid
Data-in
Valid
Data-in
DQ24-DQ31
tDS
Valid
Data-in
Valid
Data-in
DQ16 -DQ23
tDH
tDH
Valid
Data-in
tDH
tDS
Valid
Data-in
tDS
Valid
Data-in
tDH
tDH
Valid
Data-in
tDS
Valid
Data-in
tDH
Valid
Data-in
*DQM2,3="L"
(Clock Mask)
CLK
tCKH
tCKS
tDH
tDS
tCKH
tCKS
CKE
tDS
Valid
Data-in
DQ0 -DQ7
tDS
tDS
Valid
Data-in
DQ8 -DQ15
tDS
tDH
tDS
tDH
Valid
Data-in
tDS
tDS
tDH
tDS
tDS
tDH
tDH
tDS
tDH
tDS
tDH
tDS
tDH
Valid
Data-in
- 22 -
tDH
Valid
Data-in
tDS
Valid
Data-in
Valid
Data-in
tDH
Valid
Data-in
Valid
Data-in
Valid
Data-in
tDS
tDH
Valid
Data-in
Valid
Data-in
Valid
Data-in
DQ16 -DQ23
DQ24 -DQ31
tDH
tDH
Valid
Data-in
tDH
Valid
Data-in
tDS
tDH
Valid
Data-in
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10.4
Control Timing of Output Data
(Output Enable)
CLK
tCMH
tCMS
tCMH
tCMS
tCMH
tCMS
DQM0
tCMS
tCMH
DQM1
tAC
tAC
tOH
tOH
tHZ
tOH
Valid
Data-Out
DQ0 -DQ7
tAC
tAC
tOH
tOH
Valid
Data-Out
DQ8 -DQ15
tAC
tAC
tOH
tOH
tHZ
Valid
Data-Out
DQ16 -DQ23
tAC
tAC
tOH
tOH
tHZ
tOH
Valid
Data-Out
tAC
tOH
Valid
Data-Out
tAC
tAC
Valid
Data-Out
tOH
Valid
Data-Out
DQ24 -DQ31
OPEN
tLZ
Valid
Data-Out
tAC
tLZ
Valid
Data-Out
tOH
Valid
Data-Out
tHZ
tOH
Valid
Data-Out
tAC
tOH
OPEN
Valid
Data-Out
tAC
tOH
tAC
tLZ
tAC
tOH
Valid
Data-Out
Valid
Data-Out
*DQM2,3="L"
(Clock Mask)
CLK
tCKH
tCKS
tCKH
tCKS
CKE
tAC
tOH
tOH
Valid
Data-Out
DQ0 -DQ7
tAC
tOH
tOH
tAC
tAC
tOH
tOH
tOH
tOH
tOH
Valid
Data-Out
tAC
Valid
Data-Out
- 23 -
tAC
Valid
Data-Out
tOH
Valid
Data-Out
tAC
Valid
Data-Out
tAC
tAC
Valid
Data-Out
DQ16 -DQ23
tAC
Valid
Data-Out
tOH
tAC
Valid
Data-Out
tAC
Valid
Data-Out
tOH
tOH
Valid
Data-Out
tOH
DQ8 -DQ15
DQ24 -DQ31
tAC
tAC
tOH
tAC
tOH
tAC
Valid
Data-Out
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
10.5
Mode Register Set Cycle
tRSC
CLK
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
CS
RAS
CAS
WE
tAS
A0-A10
BS0,1
tAH
Register
set data
A0
A1
Burst Length
A2
A3
Addressing Mode
A4
A5
CAS Latency
A2
0
0
0
0
1
1
1
1
"0"
(Test Mode)
A8
"0"
Reserved
WriteA0
Mode
A0
A9
A10
"0"
A0
BS0
"0"
BS1
"0"
Reserved
A0
0
1
0
1
0
1
0
1
A0
A3
A0
0
A0
1
A6
A0
A7
A0
A0
A1
A0
0
A0
0
A0
1
A0
1
A0
0
A0
0
A0
1
A0
1
A6
0
0
0
0
1
A0
A5
A0
0
A0
0
A0
1
A0
1
A0
0
A0
A9
A0
0
A0
1
- 24 -
next
command
BurstA0
Length
A0
A0
Sequential
Interleave
1
A0
1
A0
2
A0
2
A0
A0
4
4
A0
A0
8
8
A0
Reserved
A0
Reserved
FullA0
Page
Addressing
A0 Mode
A0
Sequential
Interleave
A0
A4
0
1
0
1
0
CAS A0
Latency
A0
Reserved
Reserved
A0
2
A0
3
Reserved
Single Write Mode
Burst read and
A0 Burst write
A0 single write
Burst read and
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11. OPERATING TIMING EXAMPLE
11.1 Interleaved Bank Read (Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
1
0
2
3
4
6
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
tRC
tRC
RAS
tRAS
tRC
tRP
tRAS
tRAS
tRP
tRP
tRAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RBb
CAw
tRCD
RAc
CBx
RBb
RBd
RAc
CAy
RAe
RBd
CBz
RAe
DQM
CKE
aw0
tRRD
Bank #0 Active
Bank #1
tAC
tAC
tAC
DQ
aw1
aw2
aw3
bx0
Precharge
Active
bx2
bx3
Active
cy1
cy2
cy3
tRRD
Precharge
Read
Precharge
Read
tAC
cy0
tRRD
tRRD
Read
bx1
Active
Active
Read
Bank #2
Idle
Bank #3
- 25 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.2
Interleaved Bank Read (Burst Length = 4, CAS Latency = 3, Auto-precharge)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
11
10
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
tRC
tRC
tRC
RAS
tRAS
tRP
tRAS
tRP
tRAS
tRP
tRAS
CAS
WE
BS0
BS1
tRCD
tRCD
tRCD
A10
RAa
RBb
A0-A9
RAa
CAw RBb
tRCD
CBx
RAe
RBd
RAc
CAy
RAc
CBz
RBd
RAe
DQM
CKE
tAC
DQ
tRRD
Active
Bank #0
Bank #1
Bank #2
tAC
tAC
aw0
aw1
aw2
aw3
bx0
bx1
tAC
cy0
cy1
Read
AP*
cy2
cy3
dz0
tRRD
Read
Active
AP*
Active
bx3
tRRD
tRRD
Read
bx2
AP*
Active
Active
Read
Idle
Bank #3
* AP is the internal precharge start timing
- 26 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.3
Interleaved Bank Read (Burst Length = 8, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
RAS
tRAS
tRP
tRAS
tRP
tRAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RAc
RBb
CAx
RBb
CBy
RAc
CAz
DQM
CKE
tAC
DQ
tAC
ax0
ax1
tRRD
Bank #0
Active
Bank #2
ax3
ax4
ax5
ax6
by0
by1
by4
by5
by6
by7
CZ0
tRRD
Read
Precharge
Bank #1
ax2
tAC
Precharge
Active
Read
Active
Read
Precharge
Idle
Bank #3
- 27 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.4
Interleaved Bank Read (Burst Length = 8, CAS Latency = 3, Auto-precharge)
(CLK = 100 MHz)
0
1
2
3
4
6
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
tRC
CS
RAS
tRAS
tRP
tRAS
CAS
WE
BS0
BS1
tRCD
A10
A0-A9
RAc
RBb
RAa
RAa
tRCD
tRCD
CAx
RBb
RAc
CBy
CAz
DQM
CKE
tCAC
tCAC
DQ
ax0
ax1
ax2
tRRD
Bank #0
Active
Bank #2
Bank #3
Idle
ax4
ax5
ax6
ax7
by0
by1
by4
by5
by6
CZ0
tRRD
AP*
Read
Active
Bank #1
ax3
tCAC
Active
Read
Read
AP*
* AP is the internal precharge start timing
- 28 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.5
Interleaved Bank Write (Burst Length = 8)
(CLK = 100 MHz)
1
0
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
RAS
tRAS
tRP
tRAS
CAS
tRCD
tRCD
tRCD
WE
BS0
BS1
A10
RAa
A0-A9
RAa
RBb
CAx
RAc
RBb
CBy
RAc
CAz
DQM
CKE
DQ
ax0
ax1
ax4
ax5
ax6
ax7
by0
tRRD
Bank #0
Active
Bank #2
Bank #3
by2
by3
by4
by5
by6
by7
CZ0
CZ1
CZ2
tRRD
Precharge
Write
Active
Bank #1
by1
Write
Active
Write
Precharge
Idle
- 29 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.6
Interleaved Bank Write (Burst Length = 8, Auto-precharge)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
RAS
tRP
tRAS
tRAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RBb
CAx
RAb
CBy
RBb
CAz
RAc
DQM
CKE
DQ
ax0
ax1
ax4
ax5
ax6
ax7
by0
by1
tRRD
Bank #0 Active
by3
by4
by5
by6
by7
CZ0
CZ1
CZ2
tRRD
AP*
Write
Active
Bank #1
by2
Write
Active
Write
AP*
Bank #2
Idle
Bank #3
* AP is the internal precharge start timing
- 30 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.7
Page Mode Read (Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
tCCD
tCCD
tCCD
CS
tRAS
tRAS
RAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
tRCD
RBb
RBb
CAI
CBx
CAy
CAm
CBz
DQM
CKE
tAC
DQ
tAC
tAC
a0
a1
a2
a3
bx0
Ay0
bx1
tAC
Ay1
Ay2
tAC
am0
am1
am2
bz0
bz1
bz2
bz3
tRRD
Bank #0 Active
Bank #2
Bank #3
Read
Active
Bank #1
Read
Read
Read
Precharge
Read
AP*
Idle
* AP is the internal precharge start timing
- 31 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.8
Page Mode Read/Write (Burst Length = 8, CAS Latency = 3)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRAS
tRP
RAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
CAx
CAy
DQM
CKE
tAC
DQ
tWR
ax0
Q Q
Bank #0
Active
ax1
ax2
Q
Q
ax3
Q
ax5
ax4
Q
D
Read
ay1
ay0
D
Write
D
ay2
ay4
ay3
D
D
Precharge
Bank #1
Bank #2
Bank #3
Idle
- 32 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.9
Auto-precharge Read (Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
CLK
0
1
2
3
4
6
5
7
8
9
11
10
12
13
14
15
16
17
18
19
20
21
22
23
CS
tRC
RAS
tRAS
tRP
tRAS
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9
RAa
tRCD
RAb
CAw
RAb
CAx
DQM
CKE
tAC
DQ
Bank #0
tAC
aw0
Active
Read
aw1
AP*
aw2
aw3
bx0
Active
Read
bx1
bx2
bx3
AP*
Bank #1
Bank #2
Bank #3
Idle
* AP is the internal precharge start timing
- 33 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.10
Auto-precharge Write (Burst Length = 4)
(CLK = 100 MHz)
CLK
0
1
2
3
5
4
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CS
tRC
tRC
RAS
tRP
tRAS
tRAS
tRP
CAS
WE
BS0
BS1
tRCD
tRCD
A10
RAa
A0-A9
RAa
RAc
RAb
CAw
RAb
CAx
RAc
DQM
CKE
aw0
DQ
Bank #0
Active
Write
aw1
aw2
bx0
aw3
AP*
Active
Write
bx1
bx2
bx3
AP*
Active
Bank #1
Bank #2
Bank #3
Idle
* AP is the internal precharge start
- 34 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.11
Auto Refresh Cycle
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
tRP
tRC
tRC
CS
RAS
CAS
WE
BS0,1
A10
A0-A9
DQM
CKE
DQ
All Banks
Prechage
Auto
Refresh
Auto Refresh (Arbitrary Cycle)
- 35 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.12
Self Refresh Cycle
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRP
RAS
CAS
WE
BS0,1
A10
A0-A9
DQM
tCKS
tCKS
tSB
CKE
tCKS
DQ
tXSR
Self Refresh Cycle
All Banks
Precharge
Self Refresh
Entry
No Operation / Command Inhibit
Self Refresh
Exit
- 36 -
Arbitrary Cycle
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.13
Bust Read and Single Write (Burst Length = 4, CAS Latency = 3)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
RAS
CAS
tRCD
WE
BS0
BS1
A10
RBa
A0-A9
RBa
CBv
CBw
CBx
CBy
CBz
DQM
CKE
tAC
tAC
DQ
av0
Q
Bank #0 Active
Bank #1
Bank #2
Idle
Bank #3
av1
Q
av2
av3
aw0
ax0
ay0
az0
az1
az2
az3
Q
Q
D
D
D
Q
Q
Q
Q
Read
Single Write Read
- 37 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.14
Power Down Mode
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
RAS
CAS
WE
BS
A10
RAa
A0-A9
RAa
RAa
CAa
RAa
CAx
DQM
tSB
tSB
CKE
tCKS
tCKS
ax0
Active
tCKS
tCKS
DQ
ax1
ax2
NOP Read
ax3
Precharge
NOPActive
Precharge Standby
Active Standby
Power Down mode
Power Down mode
Note: The PowerDown Mode is entered by asserting CKE "low".
All Input/Output buffers (except CKE buffers) are turned off in the Power Down mode.
When CKE goes high, command input must be No operation at next CLK rising edge.
Violating refresh requirements during power-down may result in a loss of data.
- 38 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.15 Auto-precharge Timing (Write Cycle)
0
1
2
3
4
5
6
7
8
9
10
11
12
CLK
(1) CAS Latency = 2
(a) burst length = 1
Command
Write
AP
tWR
DQ
Act
tRP
D0
(b) burst length = 2
Command
Write
AP
Act
tWR
DQ
D0
tRP
D1
(c) burst length = 4
Command
AP
Write
DQ
D0
D1
D2
Act
tRP
tWR
D3
(d) burst length = 8
Command
Write
AP
tWR
DQ
D0
D1
D2
D3
D4
D5
D6
Act
tRP
D7
(2) CAS Latency = 3
(a) burst length = 1
Command
Write
AP
Act
tWR
DQ
(b) burst length = 2
Command
tRP
D0
Write
AP
Act
tWR
DQ
D0
tRP
D1
(c) burst length = 4
Command
Write
AP
Act
tWR
DQ
D0
D1
D2
tRP
D3
(d) burst length = 8
Command
Write
AP
tWR
DQ
D0
D1
D2
D3
D4
D5
D6
Act
tRP
D7
Note )
Write
represents the Write with Auto precharge command.
AP
represents the start of internal precharing.
Act
represents the Bank Active command.
When the /auto precharge command is asserted,the period from Bank Activate
command to the start of intermal precgarging must be at least tRAS (min).
- 39 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.16
Auto-precharge Timing (Read Cycle)
0
1
Read
AP
2
3
4
5
6
7
8
9
10
11
(1) CAS Latency=2
( a ) burst length = 1
Command
DQ
Act
tRP
Q0
( b ) burst length = 2
Command
Read
AP
Q0
DQ
Act
tRP
Q1
( c ) burst length = 4
Command
Read
AP
Act
tRP
DQ
Q0
Q1
Q2
Q3
( d ) burst length = 8
Command
Read
AP
Q0
DQ
Q1
Q2
Q3
Q4
Q5
Q6
Act
tRP
Q7
(2) CAS Latency=3
( a ) burst length = 1
Command
Read
AP
Q0
DQ
( b ) burst length = 2
Command
Read
AP
Command
Act
tRP
Q0
DQ
( c ) burst length = 4
Act
tRP
Read
Q1
AP
Act
tRP
Q0
DQ
( d ) burst length = 8
Command
Q1
Q2
Q3
Read
AP
Q0
DQ
Q1
Q2
Q3
Q4
Q5
Act
tRP
Q6
Q7
Note:
Read
AP
Act
represents the Read with Auto precharge command.
represents the start of internal precharging.
represents the Bank Activate command.
When the Auto precharge command is asserted, the period from Bank Activate command to
the start of internal precgarging must be at least tRAS (min).
- 40 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.17
Timing Chart of Read to Write Cycle
In the case of Burst Length = 4
1
0
2
3
4
5
6
D1
D2
D3
D0
D1
D2
D1
D2
D3
D1
D2
7
8
9
10
9
10
11
(1) CAS Latency=2
Read
( a ) Command
Write
DQM
DQ
D0
Read
( b ) Command
Write
DQM
DQ
(2) CAS Latency=3
Read
( a ) Command
D3
Write
DQM
D0
DQ
Read
( b ) Command
Write
DQM
D0
DQ
D3
Note: The Output data must be masked by DQM to avoid I/O conflict.
11.18 Timing Chart of Write to Read Cycle
In the case of Burst Length=4
0
1
2
3
4
5
6
7
8
Q0
Q1
Q2
Q3
Q0
Q1
Q2
Q3
Q0
Q1
Q2
Q3
Q0
Q1
Q2
11
(1) CAS Latency=2
( a ) Command
Write Read
DQM
DQ
( b ) Command
D0
Read
Write
DQM
DQ
(2) CAS Latency=3
( a ) Command
D0
D1
Write Read
DQM
DQ
( b ) Command
D0
Write
Read
DQM
DQ
D0
D1
- 41 -
Q3
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.19
Timing Chart of Burst Stop Cycle (Burst Stop Command)
0
1
2
3
4
5
6
7
8
9
10
11
(1) Read cycle
( a ) CAS latency =2
Command
Read
BST
Q0
DQ
Q1
Q2
Q0
Q1
Q4
Q3
( b )CAS latency = 3
Command
Read
BST
DQ
Q2
Q3
Q4
(2) Write cycle
Command
DQ
Write
Q0
BST
Q1
Q2
Note:
Q3
BST
Q4
represents the Burst stop command
11.20 Timing Chart of Burst Stop Cycle (Precharge Command)
0
1
2
3
4
5
6
7
8
9
10
11
(1) Read cycle
(a) CAS latency =2
Command
Read
PRCG
DQ
(b) CAS latency =3
Command
Q0
Q1
Q2
Read
Q3
Q4
PRCG
DQ
Q0
Q1
Q2
Q3
Q4
(2) Write cycle
(a) CAS latency =2
Command
PRCG
Write
tWR
DQM
DQ
(b) CAS latency =3
Command
Q0
Q1
Q2
Q3
Q4
PRCG
Write
tWR
DQM
DQ
Q0
Q1
Q2
Q3
Q4
- 42 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.21
CKE/DQM Input Timing (Write Cycle)
CLK cycle No.
1
2
3
D1
D2
D3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
D5
DQM MASK
D6
CKE MASK
(1)
CLK cycle No.
1
2
3
D1
D2
D3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
DQM MASK
D5
D6
5
6
7
D4
D5
D6
CKE MASK
(2)
CLK cycle No.
1
2
3
D1
D2
D3
4
External
CLK
Internal
CKE
DQM
DQ
CKE MASK
(3)
- 43 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
11.22
CKE/DQM Input Timing (Read Cycle)
CLK cycle No.
1
2
3
4
Q1
Q2
Q3
Q4
6
5
7
External
CLK
Internal
CKE
DQM
DQ
Q6
Open
Open
(1)
CLK cycle No.
1
2
3
Q1
Q2
Q3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
Q6
Q4
Open
(2)
CLK cycle No.
1
2
Q1
Q2
3
4
5
6
7
Q4
Q5
Q6
External
CLK
Internal
CKE
DQM
DQ
Q3
(3)
- 44 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
12. PACKAGE SPECIFICATION
12.1 86L TSOP (II)-400 mil
86
44
HE
E
1
43
e
b
C
D
q
A2
ZD
A1
Y
A
L
L1
SEATING PLANE
Controlling Dimension: Millimeters
DIMENSION
(MM)
SYM.
MIN.
NOM.
A
A1
A2
b
0.05
DIMENSION
(INCH)
MAX.
MIN.
1.20
0.15
0.002
0.27
0.21
0.007
0.005
1.00
NOM.
MAX.
0.047
0.006
0.039
c
0.17
0.12
D
22.12
22.22
22.62
0.871
0.875
0.905
E
10.06
10.16
10.26
0.396
0.400
0.404
HE
11.56
11.76
11.96
0.455
0.463
0.471
e
L
L1
0.50
0.40
0.50
0.008
0.020
0.60
0.016
0.80
0.020
0.024
0.032
0.004
0.10
Y
ZD
0.011
0.024
0.61
- 45 -
Publication Release Date:Aug. 13, 2007
Revision A09
W9864G2GH
13. REVISION HISTORY
VERSION
DATE
PAGE
DESCRIPTION
A01
Jul. 05, 2006
All
A02
Aug. 03, 2006
3,14,15,16
A03
Aug. 07, /2006
15,16
A04
Oct. 03, 2006
16
Add tXSR timing specification.
A05
Nov. 13, 2006
3,13,14
Modify tIH=0.8nS in –6C grade
A06
Jan. 11, 2007
16,18
A07
Apr. 10, 2007
3,14,15,16
A08
Jul. 19, 2007
14
A09
Aug. 13, 2007
18,19
Create new datasheet
Add –6C grade
Modify ICC1, ICC4 , ICC5 & Transition Time of CLK
Modify AC Characteristics Notes 10 and add Notes 11
(tT)
Add -6I for TA = -40°~85°C
Add output leakage current Io(L) specification.
Revise transient time tT AC test condition and calculate
formula for compensation consideration in Notes 6, 10
of AC Characteristics and Operating Condition
Important Notice
Winbond products are not designed, intended, authorized or warranted for use as components
in systems or equipment intended for surgical implantation, atomic energy control
instruments, airplane or spaceship instruments, transportation instruments, traffic signal
instruments, combustion control instruments, or for other applications intended to support or
sustain life. Further more, Winbond products are not intended for applications wherein failure
of Winbond products could result or lead to a situation wherein personal injury, death or
severe property or environmental damage could occur.
Winbond customers using or selling these products for use in such applications do so at their
own risk and agree to fully indemnify Winbond for any damages resulting from such improper
use or sales.
- 46 -
Publication Release Date:Aug. 13, 2007
Revision A09