SFS9926 SemiWell Semiconductor Dual N-Channel MOSFET Features ■ ■ ■ ■ ■ Symbol Low RDS(on) (0.030Ω )@VGS=4.5V D2 5 4 G2 Low RDS(on) (0.043Ω )@VGS=2.5V D2 6 3 S2 Gate Charge (Typical 14nC) Improved dv/dt Capability Maximum Junction Temperature Range (150°C) Available in Tape and Reel D1 7 2 G1 D1 8 1 S1 General Description 8-SOIC This Power MOSFET is produced using SemiWell’s advanced planar stripe, DMOS technology. This latest technology has been especially designed to minimize on-state resistance, have a low gate charge with superior switching performance, and rugged avalanche characteristics. This Power MOSFET is well suited for Battery protection circuit, Load switch and other power management application. D1 D1 D2 D2 S1 G S 2 G1 2 Absolute Maximum Ratings Symbol VDSS ID Parameter Value Units Drain to Source Voltage 20 V Continuous Drain Current(@TA = 25°C) 6.5 A 30 A IDM Drain Current Pulsed VGS Gate to Source Voltage ±12 V Total Power Dissipation Single Operation (TA=25°C) 2.0 W Total Power Dissipation Single Operation (TA=70°C) 1.28 W - 55 ~ 150 °C 300 °C PD TSTG, TJ TL (Note 1) Operating Junction Temperature & Storage Temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds. Thermal Characteristics Symbol RθJA Value Parameter Thermal Resistance, Junction-to-Ambient (Note 4) Min. Typ. Max. - - 62.5 December, 2002. Rev. 0. Units °C/W 1/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS9926 Electrical Characteristics Symbol ( TJ = 25 °C unless otherwise noted ) Parameter Test Conditions Min Typ Max Units 20 - - V - mV/°C Off Characteristics BVDSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250uA Δ BVDSS/ Δ TJ Breakdown Voltage Temperature coefficient ID = 250uA, referenced to 25 °C - 24 IDSS Drain-Source Leakage Current VDS = 16V, VGS = 0V - - Gate-Source Leakage, Forward VGS = 12V, VDS = 0V Gate-Source Leakage, Reverse VGS = -12V, VDS = 0V - IGSS 1 uA 100 nA - -100 nA On Characteristics VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250uA 0.5 - 1.5 V RDS(ON) Static Drain-Source On-state Resistance VGS = 4.5 V, ID = 6.5A VGS = 2.5 V, ID = 5.4A - 0.025 0.036 0.030 0.043 Ω - 645 - - 350 - - 115 - Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VGS =0 V, VDS =10V, f = 1MHz pF Dynamic Characteristics td(on) tr td(off) tf Turn-on Delay Time VDD =10V, ID =1A, RG =50 Ω VGS =4.5V Rise Time Turn-off Delay Time (Note 2,3) Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge(Miller Charge) - 9 28 - 45 100 - 95 200 - 60 130 ns - 14 18 - 2.5 - - 5 - Min. Typ. Max. Unit. - - 1.3 A - - 1.2 V VDS =10V, VGS =4.5V, ID =4.5A (Note 2,3) nC Source-Drain Diode Ratings and Characteristics Symbol IS VSD Parameter Test Conditions Maximum Continuous Diode Forward Current Diode Forward Voltage IS =1.3A, VGS =0V (Note 2) ※ NOTES 1. Repeativity rating : pulse width limited by junction temperature 2. Pulse Test : Pulse Width ≤ 300us, Duty Cycle ≤ 2% 3. Essentially independent of operating temperature. 4. Surface mounted on 1 inch2 Cu board. 2/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS9926 Fig 2. Transfer Characteristics Fig 1. On-State Characteristics VGS 4.5 V 4.0 V 3.5 V 3.0 V 2.5 V Bottom : 2.0 V 1 10 1 10 ID, Drain Current [A] ID, Drain Current [A] Top : o 125 C 0 10 o 25 C o -55 C ※ Notes : 1. 250µ s Pulse Test 2. TC = 25℃ 0 10 -1 10 ※ Notes : 1. VDS = 5V 2. 250µ s Pulse Test -1 10 0 10 2 VGS, Gate-Source Voltage [V] VDS, Drain-Source Voltage [V] Fig 4. On State Current vs. Allowable Case Temperature Fig 3. On Resistance Variation vs. Drain Current and Gate Voltage 0.08 0.06 IDR, Reverse Drain Current [A] RDS(ON), Drain-Source On-Resistance [Ω ] 0.07 VGS = 2.5V 0.05 0.04 VGS = 4.5V 0.03 0.02 0.01 0.00 1 10 150℃ ※ Notes : 1. VGS = 0V 2. 250µ s Pulse Test ※ Note : TJ = 25℃ 0 0 5 10 15 20 10 25 0.2 0.4 0.8 1.0 1.2 1.4 Fig 6. Gate Charge Characteristics Fig 5. Capacitance Characteristics 1500 5 1000 VGS, Gate-Source Voltage [V] Ciss=Cgs+Cgd(Cds=shorted) Coss=Cds+Cgd Crss=Cgd 1250 Capacitance [pF] 0.6 VSD, Source-Drain voltage [V] ID, Drain Current [A] ※ Notes : 1. VGS = 0V 2. f=1MHz 750 Ciss 500 Coss 250 Crss 0 25℃ 0 5 VDS = 10V 4 VDS = 16V 3 2 1 ※ Note : ID = 6.5A 10 15 VDS, Drain-Source Voltage [V] 20 25 0 0 3 6 9 12 15 18 QG, Total Gate Charge [nC] 3/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS9926 Fig 8. On-Resistance Variation vs. Junction Temperature Fig 7. Breakdown Voltage Variation vs. Junction Temperature 2.5 RDS(ON), (Normalized) Drain-Source On-Resistance BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 ※ Notes : 1. VGS = 0 V 2. ID = 250 µ A 0.9 0.8 -100 -50 0 50 100 150 2.0 1.5 1.0 0.5 0.0 -100 200 ※ Notes : 1. VGS = 4.5 V 2. ID = 6.5 A -50 0 50 TJ, Junction Temperature [ C] TJ, Junction Temperature [ C] Zθ JANormalized, Thermal Response Fig 9. Normalized Transient Thermal Response Curve 10 0 D = 0 .5 0 .2 10 0 .1 -1 ※ N o te s : 1 . Z θ J A( t) = 6 2 .5 ℃ /W 2 . D u ty F a c to r , D = t 1 /t 2 3 . T J M - T A = P D M * Z θ J A( t) 0 .0 5 0 .0 2 s in g le p u ls e 10 -2 10 -4 10 -3 100 o o 10 -2 10 -1 10 0 t 1 , S q u a r e W a v e P u ls e D u ra tio n [s e c ] 4/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. 10 1 150 200 SFS9926 Fig. 10. Gate Charge Test Circuit & Waveforms 50KΩ 12V VGS Same Type as DUT Qg 200nF V 4.5V 300nF VDS VGS Qgs Qgd DUT 1mA Charge Fig 11. Switching Time Test Circuit & Waveforms VDS RL VDS 90% VDD ( 0.5 rated V DS ) 4.5V V Pulse Generator RG DUT Vin 10% tr td(on) t on td(off) tf t off 5/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS9926 8-SOIC Package Dimension mm Dim. Min. Inch Typ. Max. Min. Typ. Max. A 1.35 1.55 1.75 0.053 0.061 0.069 B 0.1 0.175 0.25 0.004 0.007 0.010 C 0.38 0.445 0.510 0.015 0.018 0.020 D 0.19 0.22 0.25 0.007 0.009 0.010 E 4.8 4.9 5 0.189 0.193 0.197 F 3.8 3.9 4 0.150 0.154 0.157 G 1.27 BSC H 5.8 6 6.2 0.228 0.236 0.244 I 0.5 0.715 0.93 0.020 0.028 0.037 J 0’ 4’ 8’ 0’ 4’ 8’ K 0.250 0.375 0.05 0.010 0.015 0.020 0.254(Gap plane) F E A G C B 0.1 H K × 45° D J I 6/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.