HD74ALVCH16721 3.3-V 20-bit Flip Flops with 3-state Outputs REJ03D0035-0400Z (Previous ADE-205-139B (Z)) Rev.4.00 Oct.02.2003 Description The HD74ALVCH16721’s twenty flip flops are edge triggered D-type flip flops with qualified clock storage. On the positive transition of the clock (CLK) input, the device provides true data at the Q outputs, provided that the clock enable (CLKEN) input is low. If CLKEN is high, no data is stored. A buffered output enable (OE) input can be used to place the twenty outputs in either a normal logic state (high or low level) or a high impedance state. In the high impedance state, the outputs neither load nor drive the bus lines significantly. The high impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components. The output enable (OE) input does not affect the internal operation of the flip flops. Old data can be retained or new data can be entered while the outputs are in the high impedance state. Active bus hold circuitry is provided to hold unused or floating data inputs at a valid logic level. Features • • • • • VCC = 2.3 V to 3.6 V Typical VOL ground bounce < 0.8 V (@VCC = 3.3 V, Ta = 25°C) Typical VOH undershoot > 2.0 V (@VCC = 3.3 V, Ta = 25°C) High output current ±24 mA (@VCC = 3.0 V) Bus hold on data inputs eliminates the need for external pullup / pulldown resistors Rev.4.00, Oct.02.2003, page 1 of 11 HD74ALVCH16721 Function Table Inputs Output Q OE CLKEN CLK D L H X X Q0 *1 L L ↑ H H L L ↑ L L L L L or H X Q0 *1 H X X X Z H : High level L : Low level X : Immaterial Z : High impedance ↑ : Low to high transition Note: 1. Output level before the indicated steady state input conditions were established. Rev.4.00, Oct.02.2003, page 2 of 11 HD74ALVCH16721 Pin Arrangement OE 1 56 CLK Q1 2 55 D1 Q2 3 54 D2 53 GND GND 4 Q3 5 52 D3 Q4 6 VCC 7 51 D4 Q5 8 49 D5 Q6 9 48 D6 Q7 10 47 D7 50 VCC GND 11 46 GND Q8 12 45 D8 Q9 13 44 D9 Q10 14 43 D10 Q11 15 42 D11 Q12 16 41 D12 Q13 17 40 D13 GND 18 39 GND Q14 19 38 D14 Q15 20 37 D15 Q16 21 36 D16 VCC 22 35 VCC Q17 23 34 D17 Q18 24 33 D18 GND 25 32 GND Q19 26 31 D19 Q20 27 30 D20 29 CLKEN NC 28 (Top view) Rev.4.00, Oct.02.2003, page 3 of 11 HD74ALVCH16721 Absolute Maximum Ratings Item Supply voltage Input voltage 1 Symbol Ratings Unit VCC –0.5 to 4.6 V Conditions VI –0.5 to 4.6 V Output voltage *1, 2 VO –0.5 to VCC +0.5 V Input clamp current IIK –50 mA VI < 0 Output clamp current IOK ±50 mA VO < 0 or VO > VCC Continuous output current IO ±50 mA VO = 0 to VCC VCC, GND current / pin ICC or IGND ±100 mA Maximum power dissipation *3 at Ta = 55°C (in still air) PT 1 W Storage temperature Tstg –65 to 150 °C TSSOP Notes: Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. 2. This value is limited to 4.6 V maximum. 3. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils. Recommended Operating Conditions Item Symbol Min Max Unit Supply voltage VCC 2.3 3.6 V Input voltage VI 0 VCC V Output voltage VO 0 VCC V High level output current IOH — –12 mA — –12 VCC = 2.7 V — –24 VCC = 3.0 V — 12 — 12 VCC = 2.7 V — 24 VCC = 3.0 V Low level output current IOL mA Input transition rise or fall rate ∆t / ∆v 0 10 ns / V Operating temperature Ta –40 85 °C Note: Unused control inputs must be held high or low to prevent them from floating. Rev.4.00, Oct.02.2003, page 4 of 11 Conditions VCC = 2.3 V VCC = 2.3 V HD74ALVCH16721 Logic Diagram OE CLK CLKEN D1 1 56 29 55 CE C1 1D To nineteen other channels Rev.4.00, Oct.02.2003, page 5 of 11 2 Q1 HD74ALVCH16721 Electrical Characteristics (Ta = –40 to 85°C) Item Symbol VCC (V) *1 Min Max Unit Input voltage VIH 2.3 to 2.7 1.7 — V 2.7 to 3.6 2.0 — 2.3 to 2.7 — 0.7 2.7 to 3.6 — 0.8 VIL Output voltage VOH Test Conditions IOH = –100 µA Min to Max VCC–0.2 — 2.3 2.0 — IOH = –6 mA, VIH = 1.7 V 2.3 1.7 — IOH = –12 mA, VIH = 1.7 V 2.7 2.2 — IOH = –12 mA, VIH = 2.0 V 3.0 2.4 — IOH = –12 mA, VIH = 2.0 V 3.0 2.0 — IOH = –24 mA, VIH = 2.0 V Min to Max — 0.2 IOL = 100 µA 2.3 — 0.4 IOL = 6 mA, VIL = 0.7 V 2.3 — 0.7 IOL = 12 mA, VIL = 0.7 V 2.7 — 0.4 IOL = 12 mA, VIL = 0.8 V 3.0 — 0.55 IOL = 24 mA, VIL = 0.8 V IIN 3.6 — ±5 IIN (hold) 2.3 45 — VIN = 0.7 V 2.3 –45 — VIN = 1.7 V 3.0 75 — VIN = 0.8 V 3.0 –75 — VIN = 2.0 V 3.6 — ±500 VIN = 0 to 3.6 V IOZ 3.6 — ±10 µA VOUT = VCC or GND Quiescent supply current ICC 3.6 — 40 µA VIN = VCC or GND 3.0 to 3.6 — 750 µA VIN = one input at (VCC–0.6) V, other inputs at VCC or GND VOL Input current Off state output current *2 ∆ICC V µA VIN = VCC or GND Notes: 1. For conditions shown as Min or Max, use the appropriate values under recommended operating conditions. 2. For I/O ports, the parameter IOZ includes the input leakage current. Rev.4.00, Oct.02.2003, page 6 of 11 HD74ALVCH16721 Switching Characteristics (Ta = –40 to 85°C) Item Symbol VCC (V) Min Typ Max Unit Maximum clock frequency fmax 2.5±0.2 150 — — MHz 2.7 150 — — 3.3±0.3 150 — — 2.5±0.2 1.0 — 5.6 2.7 1.0 — 5.1 3.3±0.3 1.0 — 4.3 2.5±0.2 1.0 — 6.1 2.7 1.0 — 5.8 3.3±0.3 1.0 — 4.8 2.5±0.2 1.0 — 5.5 2.7 1.0 — 4.7 3.3±0.3 1.0 — 4.4 2.5±0.2 4.0 — — 2.7 3.6 — — 3.3±0.3 3.1 — — 2.5±0.2 3.4 — — 2.7 3.1 — — 3.3±0.3 2.7 — — 2.5±0.2 0 — — 2.7 0 — — 3.3±0.3 0 — — 2.5±0.2 0 — — 2.7 0 — — 3.3±0.3 0 — — 2.5±0.2 3.3 — — 2.7 3.3 — — 3.3±0.3 3.3 — — Propagation delay time Output enable time Output disable time Setup time Hold time Pulse width tPLH tPHL tZH tZL tHZ tLZ tsu th tw FROM (Input) TO (Output) ns CLK Q ns OE Q ns OE Q ns Data before CLK↑ CLKEN before CLK↑ ns CLKEN after CLK↑ ns Input capacitance CIN 3.3 — 3.5 — pF Output capacitance CO 3.3 — 7.0 — pF Rev.4.00, Oct.02.2003, page 7 of 11 Data after CLK↑ HD74ALVCH16721 • Test Circuit See under table 500 Ω S1 OPEN GND *1 C L = 50 pF 500 Ω Load Circuit for Outputs Symbol Vcc=2.5±0.2 V t PLH / t PHL OPEN t su / t h / t w t ZH/ t HZ t ZL / t LZ Vcc = 2.7 V, 3.3±0.3 V OPEN GND GND 4.6 V 6.0 V Note: 1. C L includes probe and jig capacitance. Rev.4.00, Oct.02.2003, page 8 of 11 HD74ALVCH16721 • Waveforms – 1 tr tf VIH 90 % Vref 90 % Input Vref 10 % 10 % GND t PHL t PLH VOH Output Vref Vref VOL • Waveforms – 2 tr VIH 90 % Vref Timing Input 10 % tsu GND th VIH Data Input Vref Vref GND tw VIH Input Vref Vref GND Rev.4.00, Oct.02.2003, page 9 of 11 HD74ALVCH16721 • Waveforms – 3 Output Control tf tr 90 % Vref VIH 90 % Vref 10 % t ZL 10 % GND t LZ ≈VOH1 Vref Waveform - A t ZH Waveform - B VOL + 0.3 V t HZ VOH – 0.3 V Vref VOL VOH ≈VOL1 TEST VIH Vref VOH1 VOL1 Vcc=2.5±0.2V Vcc=2.7V, 3.3±0.3V 2.3 V 2.7 V 1.2 V 2.3 V 1.5 V 3.0 V GND GND Notes: 1. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Zo = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. 2. Waveform – A is for an output with internal conditions such that the output is low except when disabled by the output control. 3. Waveform – B is for an output with internal conditions such that the output is high except when disabled by the output control. 4. The output are measured one at a time with one transition per measurement. Rev.4.00, Oct.02.2003, page 10 of 11 HD74ALVCH16721 Package Dimensions As of January, 2003 14.0 14.2 Max 56 Unit: mm 6.10 29 1 *0.19 ± 0.05 0.50 28 0.08 M 1.0 8.10 ± 0.20 0.65 Max *Ni/Pd/Au plating Rev.4.00, Oct.02.2003, page 11 of 11 0.10 ± 0.05 0.10 *0.15 ± 0.05 1.20 Max 0˚ – 8˚ 0.50 ± 0.1 Package Code JEDEC JEITA Mass (reference value) TTP-56DAV — — 0.23 g Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. 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