Revised November 1999 74F38 Quad Two-Input NAND Buffer (Open Collector) General Description This device contains four independent gates, each of which performs the logic NAND function. The open-collector outputs require external pull-up resistors for proper logical operation. Ordering Code: Order Number Package Number Package Description 74F38SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F38SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F38PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbol Connection Diagram IEEE/IEC Unit Loading/Fan Out Pin Names U.L. Input IIH/IIL HIGH/LOW Output IOH/IOL Description An , Bn Inputs On Outputs 1.0/2.0 20 µA/−1.2 mA OC (Note 1) /106.6 OC (Note 1) /64 mA Note 1: OC = Open Collector Function Table Inputs A Output B O L L H L H H H L H H H L H = HIGH Voltage Level L = LOW Voltage Level © 1999 Fairchild Semiconductor Corporation DS009465 www.fairchildsemi.com 74F38 Quad Two-Input NAND Buffer (Open Collector) April 1988 74F38 Absolute Maximum Ratings(Note 2) Recommended Operating Conditions Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Free Air Ambient Temperature Junction Temperature under Bias −55°C to +150°C Supply Voltage 0°C to +70°C +4.5V to +5.5V −0.5V to +7.0V VCCPin Potential to Ground Pin Input Voltage (Note 3) −0.5V to +7.0V Input Current (Note 3) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 3: Either voltage limit or current limit is sufficient to protect inputs. Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Electrical Characteristics Symbol Parameter Min Typ Max VCC Conditions Input HIGH Voltage VIL Input LOW Voltage 0.8 V VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA 0.55 V Min IOL = 64 mA 5.0 µA Max VIN = 2.7V 7.0 µA Max VIN = 7.0V V 0.0 3.75 µA 0.0 −1.2 mA Max VIN = 0.5V VOL 2.0 Units VIH Output LOW V 10% VCC Voltage IIH Input HIGH Current IBVI Input HIGH Current Breakdown Test VID Input Leakage 4.75 Test IOD Output Leakage Circuit Current IIL Input LOW Current IOHC Open Collector, Output Recognized as a HIGH Signal Recognized as a LOW Signal IID = 1.9 µA All Other Pins Grounded VIOD = 150 mV All Other Pins Grounded 250 µA Min VOUT = VCC ICCH Power Supply Current 2.1 7.0 mA Max VO = HIGH ICCL Power Supply Current 26.0 30.0 mA Max VO = LOW OFF Leakage Test AC Electrical Characteristics Symbol Parameter TA = +25°C TA = 0°C to +70°C VCC = +5.0V VCC = +5.0V CL = 50 pF CL = 50 pF Min Typ Max Min Max tPLH Propagation Delay 6.5 9.7 12.5 6.5 13.0 tPHL An, Bn to On 1.5 2.1 5.0 1.5 5.5 www.fairchildsemi.com 2 Units ns 74F38 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 3 www.fairchildsemi.com 74F38 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D www.fairchildsemi.com 4 74F38 Quad Two-Input NAND Buffer (Open Collector) Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 5 www.fairchildsemi.com