CYPRESS CY23FS08_06

CY23FS08
Failsafe™ 2.5V/ 3.3V Zero Delay Buffer
Features
Functional Description
• Internal DCXO for continuous glitch-free operation
• Zero input-output propagation delay
• 100ps typical output cycle-to-cycle jitter
• 110 ps typical Output-output skew
• 1 MHz–200 MHz reference input
• Supports industry standard input crystals
• 200 MHz (commercial), 166 MHz (industrial) outputs
• 5V-tolerant inputs
• Phase-locked loop (PLL) Bypass Mode
• Dual Reference Inputs
• 28-pin SSOP
• Split 2.5V or 3.3V output power supplies
• 3.3V core power supply
• Industrial temperature available
The CY23FS08 is a FailSafe™ Zero Delay Buffer with two
reference clock inputs and eight phase-aligned outputs. The
device provides an optimum solution for applications where
continuous operation is required in the event of a primary clock
failure.
Continuous, glitch-free operation is achieved by using a
DCXO, which serves as a redundant clock source in the event
of a reference clock failure by maintaining the last frequency
and phase information of the reference clock.
The unique feature of the CY23FS08 is that the DCXO is in
fact the primary clocking source, which is synchronized
(phase-aligned) to the external reference clock. When this
external clock is restored, the DCXO automatically resynchronizes to the external clock.
The frequency of the crystal, which will be connected to the
DCXO must be chosen to be an integer factor of the frequency
of the reference clock. This factor is set by four select lines:
S[4:1]. please see Table 1. The CY23FS08 has three split
power supplies; one for core, another for Bank A outputs and
the third for Bank B outputs. Each output power supply, except
VDDC can be connected to either 2.5V or 3.3V. VDDC is the
power supply pin for internal circuits and must be connected
to 3.3V.
Block Diagram
Pin Configuration
REF1
REFSEL
REF2
DCXO
VSSB
CLKB1
REF1
4
FailsafeTM
REF2
Block
PLL
4
CLKA[1:4]
CLKB2
CLKB[1:4]
S2
S3
FBK
VDDB
VSSB
CLKB3
Decoder
FAIL# /SAFE
S[4:1]
4
CLKB4
VDDB
VDDC
XIN
1
2
3
4
5
6
7
8
9
10
11
12
13
14
CY23FS08
XIN XOUT
28
27
26
25
24
23
22
21
20
19
18
17
16
15
REFSEL
FBK
VSSA
CLKA1
CLKA2
S1
S4
VDDA
VSSA
CLKA3
CLKA4
VDDA
FAIL#/SAFE
XOUT
28-pin SSOP
Cypress Semiconductor Corporation
Document #: 38-07518 Rev. *C
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised January 2, 2006
CY23FS08
Pin Definitions
Pin Number
Pin Name
Description
inputs[4]
1,2
REF1,REF2
5V-tolerant, reference clock
4,5,10,11
CLKB[1:4]
Bank B clock outputs.[1, 2]
25,24,19,18
CLKA[1:4]
Bank A clock outputs.[1, 2]
27
FBK
Feedback input to the PLL.[1, ]
23,6,7,22
S[1:4]
Frequency select pins/PLL and DCXO bypass.[3]
14
XIN
Reference crystal input.
15
XOUT
Reference crystal output.
16
FAIL#/SAFE
Valid reference indicator. A high level indicates a valid reference input.
13
VDDC
3.3V power supply for the internal circuitry.
8,12
VDDB
2.5V or 3.3V power supply for Bank B outputs.
3,9
VSSB
Ground.
17,21
VDDA
2.5V or 3.3V power supply for Bank A outputs.
20,26
VSSA
Ground.
28
REFSEL
Reference select. Selects the active reference clock from either REF1 or REF2.
REFSEL = 1, REF1 is selected, REFSEL = 0, REF2 is selected.
.
Table 1. Configuration Table
XTAL (MHz)
S[4:1]
REF(MHz)
OUT(MHz)
Max.
Min.
Max.
Min.
1000
8.33
30
16.67
60.00
8.33
30.00
÷2
0000
Max.
REF:OUT
ratio
Min.
REF:XTAL
ratio
Out:XTAL ratio
PLL and DCXO Bypass mode
2
1
1110
9.50
30
57.00
180.00
28.50
90.00
÷2
6
3
0101
8.50
30
6.80
24.00
1.70
6.00
÷4
4/5
1/5
1011
8.33
30
25.00
90.00
6.25
22.50
÷4
3
3/4
0011
8.33
30
2.78
10.00
2.78
10.00
x1
1/3
1/3
1001
8.33
30
8.33
30.00
8.33
30.00
x1
1
1
1111
8.00
25
32.00
100.00
32.00
100.00
x1
4
4
1100
8.00
25
64.00
200.00
64.00
200.00
x1
8
8
0001
8.33
30
1.04
3.75
2.08
7.50
x2
1/8
1/4
0110
8.33
30
4.17
15.00
8.33
30.00
x2
1/2
1
1101
8.33
30
16.67
60.00
33.33
120.00
x2
2
4
0100
8.33
30
4.17
15.00
16.67
60.00
x4
1/2
2
1010
8.33
30
12.50
45.00
50.00
180.00
x4
3/2
6
0010
8.33
30
1.39
5.00
11.11
40.00
x8
1/6
4/3
0111
8.33
30
6.25
22.50
50.00
180.00
x8
3/4
6
Notes:
1. For normal operation, connect either one of the eight clock outputs to the FBK input.
2. Weak pull-downs on all outputs.
3. Weak pull-ups on these inputs.
4. Weak pull-downs on these inputs.
Document #: 38-07518 Rev. *C
Page 2 of 12
CY23FS08
FailSafe Function
The CY23FS08 is targeted at clock distribution applications
that could or which currently require continued operation
should the main reference clock fail. Existing approaches to
this requirement have utilized multiple reference clocks with
either internal or external methods for switching between
references. The problem with this technique is that it leads to
interruptions (or glitches) when transitioning from one
reference to another, often requiring complex external circuitry
or software to maintain system stability. The technique implemented in this design completely eliminates any switching of
references to the PLL, greatly simplifying system design.
The CY23FS08 PLL is driven by the crystal oscillator, which is
phase-aligned to an external reference clock so that the output
of the device is effectively phase-aligned to reference via the
external feedback loop. This is accomplished by utilizing a
digitally controlled capacitor array to pull the crystal frequency
over an approximate range of ±300 ppm from its nominal
frequency.
In this mode, should the reference frequency fail (i.e., stop or
disappear), the DCXO maintains its last setting and a flag
signal (FAIL#/SAFE) is set to indicate failure of the reference
clock.
The CY23FS08 provides four select bits, S1 through S4 to
control the reference to crystal frequency ratio. The DCXO is
internally tuned to the phase and frequency of the external
reference only when the reference frequency divided by this
ratio is within the DCXO capture range. If the frequency is out
of range, a flag will be set on the FAIL#/SAFE pin notifying the
system that the selected reference is not valid. If the reference
moves in range, then the flag will be cleared, indicating to the
system that the selected reference is valid.
REF
O UT
F A IL # /S A F E
tF S H
tF S L
Figure 1. Fail#/Safe Timing for Input Reference Failing Catastrophically
t F S L (m a x )
= 2 ( tR E F x n )
+ 25ns
F
n = R E F = 4 ( in a b o v e e x a m p le )
F XTAL
t F S H ( m in ) =
12(
tR E F x n
)
+
25ns
Figure 2. Fail#/Safe Timing Formula
Table 2. FailSafe Timing Table
Parameter
Description
Conditions
tFSL
Fail#/Safe Assert Delay
Measured at 80% to 20%, Load = 15 pF
tFSH
Fail#/Safe Deassert Delay
Measured at 80% to 20%, Load = 15 pF
Document #: 38-07518 Rev. *C
Min.
See Figure 2
Max.
Unit
See Figure 2
ns
ns
Page 3 of 12
CY23FS08
Reference + 300 ppm
Reference
Reference - 300 ppm
Frequency
Reference Off
Output + 300 ppm
Output
Output - 300 ppm
Volt
Fail#/Safe
tFSH
tFSL
Time
Figure 3. FailSafe Timing Diagram: Input Reference Slowly Drifting Out of FailSafe Capture Range
Failsafe typical frequency settling time
OUTPUT FREQUENCY DELTA (ppm)
Initial valid Ref1 = 20 MHz +100 ppm,
then switching to REF2 = 20 MHz
150
100
50
0
0
0.45
1.3
2.5
SETTLING TIME (ms)
Figure 4. FailSafe Reference Switching Behavior
Document #: 38-07518 Rev. *C
Page 4 of 12
CY23FS08
Figure 5. FailSafe Effective Loop Bandwidth (min)
REF1
REF2
REFSEL
0 ms
0 d eg
-1 8 0 d e g
0 ms
1 .4 m s
Figure 6. Sample Timing of Muxing Between Two Reference Clocks 180°C Out of Phase and Resulting Output
Phase Offset Typical Settling Time (105 MHz)
Document #: 38-07518 Rev. *C
Page 5 of 12
CY23FS08
190 fs/cy
0
0 ms
190 fs/cycle = 0.125 mradian/cycle
1.4 ms
Figure 7. Resulting Output Dphase/Cycle Typical Rate of Change (105 MHz)
D u ty C y c le - t D C
V D D /2
V D D /2
V D D /2
V DD
0V
t1
t2
S le w R a te - t (S R )
80%
V DD
80%
20%
20%
0V
t S R (O )
t S R (O )
O u tp u t-O u tp u t S k e w - t S K (O )
V D D /2
V D D /2
t S K (O )
P a rt to P a rt S k e w - t S K (P P )
FBK,
P a rt 1
V D D /2
FBK,
P a rt 2
V D D /2
t S K (P P )
S ta tic P h a s e O ffs e t - t (φ )
REF
V D D /2
FBK
V D D /2
t (φ )
Document #: 38-07518 Rev. *C
Page 6 of 12
CY23FS08
XTAL Selection Criteria and Application Example
C0 is the XTAL shunt capacitance (3 pF–7 pF typ.).
Choosing the appropriate XTAL will ensure the FailSafe device
will be able to span an appropriate frequency of operation.
Also, the XTAL parameters will determine the holdover
frequency stability. Critical parameters are as follows. Our
recommendation is to choose:
C1 is the XTAL motional capacitance (10 fF–30 fF typ).
• Low C0/C1 ratio (240 or less) so that the XTAL has enough
range of pullability.
• Low temperature frequency variation
• Low manufacturing frequency tolerance
• Low aging.
Example:[5]
The capacitive load as “seen” by the XTAL is across its
terminals. It is named Clmin (for minimum value), and Clmax
(for maximum value).These are used for calculating the pull
range.
Please note that the Cl range “center” is approximately 20 pF,
but we may not want a XTAL calibrated to that load. This is
because the pullability is not linear, as represented in the
equation above. Plotting the pullability of the XTAL shows this
expected behavior as shown in Figure 8. In this example,
specifying a XTAL calibrated to 14 pF load provides a
balanced ppm pullability range around the nominal frequency.
Clmin = (12 pF IC input cap + 0 pF pulling cap+ 6 pF trace cap on board)/2 = 9 pF
Clmax = (12 pF IC input cap + 48 pF pulling cap+ 6 pF trace cap on board)/2 = 33 pF
Pull Range =(fClmin–fClmax)/fClmin = ((C1)/2)[(1/(C0+Clmin))–(1/(C0+Clmax))]
Pull Range in ppm
= ((C1)/2)[(1/(C0+Clmin))–(1/(C0+Clmax))] × 106
Pullability Range Vs. Cload
(Normalized to 14pF Cload)
Delta Freq. from nom
400.00
300.00
200.00
100.00
0.00
C0/C1 = 200
-100.00
C0/C1 = 300
C0/C1 = 400
-200.00
-300.00
-400.00
6
8 10 12 14 16 18 20 22 24 26 28 30 32 34
Cload (pF)
Figure 8. Frequency vs. Cload Behavior for Example XTAL
Note:
5. The above example shows the maximum range the FailSafe internal capacitor array is capable of (0 to 48.6 pF).Cypress recommends the min./max capacitor
array values be programmed to a narrower range such as 6 pF–30 pF, or 7.5 pF–27 pF. This ensures the XTAL operates between series resonance and
anti-resonance. Please contact Cypress for choosing these range settings.
Document #: 38-07518 Rev. *C
Page 7 of 12
CY23FS08
Table 3. Pullability Range from XTAL with Different C0/C1
Ratio
Calculating the capture range involves subtracting error
tolerances as follows:
Parameter ........................................................ f error (ppm)
C0/C1 Ratio
Cload(min.)
Cload(max.)
Pullability
Range
200
8.0
32.0
–385 333
Temperature stability ..........................................................30
300
8.0
32.0
–256 222
Aging ................................................................................... 3
400
8.0
32.0
–192 166
Board/trace variation ........................................................... 5
Calculated value of the pullability range for the XTAL with
C0/C1 ratio of 200, 300 and 400 are shown in Table 3. For this
calculation Cl(min) = 8pF and Cl(max)= 32pF has been used.
Using a XTAL that has a nominal frequency specified at load
capacitance of 14pF, almost symmetrical pullability range has
been obtained.
Next, it is important to calculate the pullability range including
error tolerances. This would be the capture range of the input
reference frequency that the FailSafe device and XTAL combination would reliably span.
Document #: 38-07518 Rev. *C
Manufacturing frequency tolerance ...................................15
Total ....................................................................................53
Example: Capture Range for XTAL with C0/C1 Ratio of 200
Negative Capture Range= –385 ppm + 53 ppm = –332 ppm
Positive Capture Range = 333 ppm – 53 ppm = +280 ppm
It is important to note that the XTAL with lower C0/C1 ratio has
wider pullability/capture range as compared to the higher
C0/C1 ratio. This will help the user in selecting the appropriate
XTAL for use in the FailSafe application.
Page 8 of 12
CY23FS08
Absolute Maximum Conditions
Parameter
Description
Condition
Min.
Max.
Unit
VDD
Supply Voltage
–0.5
4.6
V
VIN
Input Voltage
Relative to VSS
–0.5
VDD+0.5
VDC
TS
Temperature, Storage
Non Functional
–65
+150
°C
TA
Temperature, Operating Ambient
Commercial Grade
0
70
°C
85
°C
TJ
Temperature, Junction
Functional
125
°C
ESDHBM
ESD Protection (Human Body Model)
MIL-STD-883, Method 3015
ØJC
Dissipation, Junction to Case
Mil-Spec 883E Method 1012.1
36.17
°C/W
ØJA
Dissipation, Junction to Ambient
JEDEC (JESD 51)
100.6
°C/W
UL–94
Flammability Rating
At 1/8 in.
MSL
Moisture Sensitivity Level
Industrial Grade
–40
2000
V
V–0
1
Multiple Supplies: The voltage on any input or I/O pin cannot exceed the power pin during power-up. Power supply sequencing is NOT required.
Recommended Pullable Crystal Specifications[6]
Parameter
Name
Comments
Min.
Typ.
Max.
Unit
Parallel resonance, fundamental mode,
AT cut
8.00
–
30.00
MHz
FNOM
Nominal crystal frequency
CLNOM
Nominal load capacitance
–
14
–
pF
R1
Equivalent series resistance (ESR)
Fundamental mode
–
–
25
Ω
R3/R1
Ratio of third overtone mode ESR to
fundamental mode ESR
Ratio used because typical R1 values
are much less than the maximum spec
3
–
–
DL
Crystal drive level
No external series resistor assumed
–
0.5
2
mW
F3SEPLI
Third overtone separation from 3*FNOM High side
300
–
–
ppm
F3SEPLO
Third overtone separation from 3*FNOM Low side
–
–
–150
ppm
C0
Crystal shunt capacitance
–
–
7
pF
C0/C1
Ratio of shunt to motional capacitance
180
–
250
C1
Crystal motional capacitance
14.4
18
21.6
fF
Table 4. Operating Conditions for FailSafe Commercial/Industrial Temperature Devices
Parameter
Description
Min. Max. Unit
VDDC
3.3V Supply Voltage
3.135 3.465
V
VDDA,
VDDB
2.5V Supply Voltage Range
2.375 2.625
V
3.3V Supply Voltage Range
3.135 3.465
V
TA
Ambient Operating Temperature, Commercial
Ambient Operating Temperature, Industrial
CL
0
70
°C
–40
85
°C
Output Load Capacitance (Fout < 100 MHz)
30
pF
Output Load Capacitance (Fout > 100 MHz)
15
pF
CIN
Input Capacitance (except XIN)
CXIN
Crystal Input Capacitance (all internal caps off)
TPU
Power-up time for all VDDs to reach minimum specified voltage (power ramps must be monotonic) 0.05
10
7
pF
13
pF
500
ms
Note:
6. Ecliptek ECX-5788-13.500M, ECX-5807-19.440M, ECX-5872-19.53125M, ECX-5806-18.432M, ECX-5808-27.000M, ECX-5884-17.664M,
ECX-5883-16.384M,ECX-5882-19.200M,ECX-5880-24.576M meet these specifications.
Document #: 38-07518 Rev. *C
Page 9 of 12
CY23FS08
Table 5. Electrical Characteristics for FailSafe Commercial/Industrial Temperature Devices
Parameter
Description
Test Conditions
Min.
Typ.
Max.
Unit
0.3xVDD
V
50
µA
VIL
Input Low Voltage
VIH
Input High Voltage
CMOS Levels, 70% of VDD
IIL
Input Low Current
VIN = VSS (100k pull-up only)
IIH
Input High Current
VIN = VDD (100k pull-down only)
IOL
Output Low Current
VOL = 0.5V, VDD = 2.5V
18
mA
VOL = 0.5V, VDD = 3.3V
20
mA
IOH
Output High Current
VOH = VDD – 0.5V, VDD = 2.5V
18
mA
VOH = VDD – 0.5V, VDD = 3.3V
20
IDDQ
Quiescent Current
All Inputs grounded, PLL and DCXO in
bypass mode, Reference Input = 0
CMOS Levels, 30% of VDD
0.7xVDD
V
50
µA
mA
250
µA
Table 6. Switching Characteristics for FailSafe Commercial/Industrial Temperature Devices
Parameter[8]
Min.
Typ.
Max.
Unit
fREF
Reference Frequency
Description
Commercial Grade
Test Conditions
1.04
–
200
MHz
Industrial Grade
1.04
–
166.7
MHz
fOUT
Output Frequency
15-pF Load, Commercial Grade
1.70
–
200
MHz
15-pF Load, Industrial Grade
1.70
–
166.7
MHz
fXIN
DCXO Frequency
8.0
–
30
MHz
tDC
Duty Cycle
Measured at VDD/2
47
–
53
%
tSR(I)
Input Slew Rate
Measured on REF1 Input, 30% to 70% of VDD
0.5
–
4.0
V/ns
tSR(O)
Output Slew Rate
Measured from 20% to 80% of VDD = 3.3V, 15 pF Load
0.8
–
4.0
V/ns
Measured from 20% to 80% of VDD =2.5V, 15 pF Load
0.4
–
3.0
V/ns
tSK(O)
Output to Output Skew All outputs equally loaded, measured at VDD/2
–
110
200
ps
tSK(IB)
Intrabank Skew
All outputs equally loaded, measured at VDD/2
–
–
75
ps
tSK(PP)
Part to Part Skew
Measured at VDD/2
–
–
500
ps
t(φ)[7]
Static Phase Offset
Measured at VDD/2
–
–
250
ps
tD(φ)[7]
Dynamic Phase Offset
Measured at VDD/2
–
150
200
ps
tJ(CC)
Cycle-to-Cycle Jitter
Load = 15 pF, fOUT ≥ 6.25 MHz
–
100
200
ps
–
18
35
psRMS
tLOCK
Lock Time
At room temperature with 18.432-MHz Crystal
–
70
–
ms
Ordering Information
Part Number
Package Type
Product Flow
CY23FS08OI
28-pin SSOP
Industrial, –40°C to 85°C
CY23FS08OIT
28-pin SSOP – Tape and Reel
Industrial, –40°C to 85°C
CY23FS08OC
28-pin SSOP
Commercial, 0°C to 70°C
CY23FS08OCT
28-pin SSOP – Tape and Reel
Commercial, 0°C to 70°C
28-pin SSOP
Industrial, –40°C to 85°C
Lead-free
CY23FS08OXI
CY23FS08OXIT
28-pin SSOP – Tape and Reel
Industrial, –40°C to 85°C
CY23FS08OXC
28-pin SSOP
Commercial, 0°C to 70°C
CY23FS08OXCT
28-pin SSOP – Tape and Reel
Commercial, 0°C to 70°C
Notes:
7. The t(φ) reference feedback input delay is guaranteed for a maximum 4:1 input edge ratio between the two signals as long as tSR(I) is maintained.
8. Parameters guaranteed by design and characterization, not 100% tested in production.
9. Includes typical board trace capacitance of 6–7pF each XIN, XOUT.
Document #: 38-07518 Rev. *C
Page 10 of 12
CY23FS08
Package Drawing and Dimensions
28-Lead (5.3 mm) Shrunk Small Outline Package O28
51-85079-*C
FailSafe is a trademark of Cypress Semiconductor. All product and company names mentioned in this document are the trademarks
of their respective holders.
Document #: 38-07518 Rev. *C
Page 11 of 12
© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
CY23FS08
Document History Page
Document Title: CY23FS08 Failsafe™ 2.5V/ 3.3V Zero Delay Buffer
Document #: 38-07518 Rev. *C
Issue
Date
REV.
ECN NO.
**
123699
04/23/03
*A
224067
See ECN
Orig. of
Change
RGL
Description of Change
New Data Sheet
RGL/ZJX Changed the XTAL Specifications table.
*B
276749
See ECN
RGL
Removed (TLOCK) Lock Time Specification.
*C
417645
See ECN
RGL
Added Lead-free devices
Added typical nos. on jitters
Document #: 38-07518 Rev. *C
Page 12 of 12