VISHAY HFA08SD60S-M3

VS-HFA08SD60S-M3
Vishay Semiconductors
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
FEATURES
2, 4
1
N/C
D-PAK (TO-252AA)
•
•
•
•
•
•
•
•
Ultrafast recovery time
Ultrasoft recovery
Very low IRRM
Very low Qrr
Guaranteed avalanche
Specified at operating conditions
Compliant to RoHS Directive 2002/95/EC
Halogen-free according to IEC 61249-2-21
definition
• Meets MSL level 1, per J-STD-020, LF maximum peak of
260 °C
3
Anode
PRODUCT SUMMARY
BENEFITS
Package
•
•
•
•
•
D-PAK (TO-252AA)
IF(AV)
8A
VR
600 V
VF at IF
1.7 V
trr typ.
18 ns
TJ max.
150 °C
Diode variation
Single die
Reduced RFI and EMI
Reduced power loss in diode and switching transistor
Higher frequency operation
Reduced snubbing
Reduced parts count
DESCRIPTION
These diodes are optimized to reduce losses and EMI/RFI in
high frequency power conditioning systems. The softness of
the recovery eliminates the need for a snubber in most
applications. These devices are ideally suited for
freewheeling, flyback, power converters, motor drives, and
other applications where high speed and reduced switching
losses are design requirements.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
Cathode to anode voltage
TEST CONDITIONS
VALUES
UNITS
600
V
VRRM
Maximum continuous forward current
IF
TC = 100 °C
Single pulse forward current
IFSM
Peak repetitive forward current
IFRM
Maximum power dissipation
PD
Operating junction and storage temperature range
8
60
A
24
TC = 100 °C
TJ, TStg
14
W
- 55 to + 150
°C
ELECTRICAL SPECIFICATIONS (TJ = 25 °C unless otherwise specified)
PARAMETER
Breakdown voltage,
blocking voltage
SYMBOL
VBR,
VR
TEST CONDITIONS
MIN.
TYP.
MAX.
600
-
-
-
1.4
1.7
-
1.7
2.1
IF = 8 A, TJ = 125 °C
-
1.4
1.7
VR = VR rated
-
0.3
5.0
TJ = 125 °C, VR = 0.8 x VR rated
-
100
500
-
10
25
pF
-
8.0
-
nH
IR = 100 μA
IF = 8 A
Forward voltage
VF
IF = 16 A
See fig. 1
Maximum reverse
leakage current
IR
Junction capacitance
CT
VR = 200 V
Series inductance
LS
Measured lead to lead 5 mm from package body
Document Number: 93474
Revision: 31-Mar-11
See fig. 3
UNITS
V
μA
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
VS-HFA08SD60S-M3
Vishay Semiconductors
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
DYNAMIC RECOVERY CHARACTERISTICS (TJ = 25 °C unless otherwise specified)
PARAMETER
SYMBOL
TEST CONDITIONS
IF = 1.0 A, dIF/dt = 200 A/μs, VR = 30 V
Reverse recovery time
Peak recovery current
trr
IRRM
MIN.
TYP.
MAX.
-
18
-
TJ = 25 °C
-
37
55
TJ = 125 °C
-
55
90
-
3.5
5.0
-
4.5
8.0
TJ = 25 °C
IF = 8 A
dIF/dt = 200 A/μs
VR = 200 V
TJ = 125 °C
ns
A
-
65
138
TJ = 125 °C
-
124
360
TJ = 25 °C
-
240
-
TJ = 125 °C
-
210
-
MIN.
TYP.
MAX.
UNITS
TJ, TStg
- 55
-
150
°C
Thermal resistance,
junction to case
RthJC
-
-
3.5
Thermal resistance,
junction to ambient
RthJA
-
-
80
-
2.0
-
g
-
0.07
-
oz.
Reverse recovery charge
Rate of fall of recovery current
Qrr
dI(rec)M/dt
TJ = 25 °C
UNITS
nC
A/μs
THERMAL - MECHANICAL SPECIFICATIONS
PARAMETER
Maximum junction
and storage temperature range
SYMBOL
TEST CONDITIONS
°C/W
Typical socket mount
Weight
Marking device
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2
Case style D-PAK
HFA08SD60S
For technical questions within your region, please contact one of the following:
Document Number: 93474
[email protected], [email protected], [email protected]
Revision: 31-Mar-11
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
VS-HFA08SD60S-M3
100
Vishay Semiconductors
1000
TJ = 150 °C
10
TJ = 150 °C
TJ = 125 °C
TJ = 25 °C
1
0.1
0.4
100
IR - Reverse Current (µA)
IF - Instantaneous Forward Current (A)
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
TJ = 125 °C
10
1
0.1
TJ = 25 °C
0.01
0.001
0.8
1.6
2.4
3.2
0
4.0
100
200
300
400
500
600
VF - Forward Voltage Drop (V)
VR - Reverse Voltage (V)
Fig. 1 - Typical Forward Voltage Drop Characteristics
Fig. 2 - Typical Values of Reverse Current vs.
Reverse Voltage
CT - Junction Capacitance (pF)
100
TJ = 25 °C
10
1
1
10
100
1000
VR - Reverse Voltage (V)
Fig. 3 - Typical Junction Capacitance vs. Reverse Voltage
ZthJC - Thermal Response
10
1
PDM
0.1
Single pulse
(thermal resistance)
0.01
0.00001
t1
D = 0.50
D = 0.20
D = 0.10
D = 0.05
D = 0.02
D = 0.01
0.0001
t2
Notes:
1. Duty factor D = t1/t2
2. Peak TJ = PDM x ZthJC + TC
0.001
0.01
0.1
1
t1 - Rectangular Pulse Duration (s)
Fig. 4 - Maximum Thermal Impedance ZthJC Characteristics
Document Number: 93474
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
VS-HFA08SD60S-M3
Vishay Semiconductors
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
80
500
IF = 16 A
IF = 8 A
IF = 4 A
70
400
Qrr (nC)
trr (ns)
60
VR = 200 V
TJ = 125 °C
TJ = 25 °C
50
40
IF = 16 A
IF = 8 A
IF = 4 A
300
200
30
20
100
VR = 200 V
TJ = 125 °C
TJ = 25 °C
10
100
0
100
1000
dIF/dt (A/µs)
Fig. 5 - Typical Reverse Recovery Time vs. dIF/dt
Fig. 7 - Typical Stored Charge vs. dIF/dt
20
10 000
VR = 200 V
TJ = 125 °C
TJ = 25 °C
IF = 16 A
IF = 8 A
IF = 4 A
dI(rec)M/dt (A/µs)
15
IRR (A)
1000
dIF/dt (A/µs)
10
1000
IF = 16 A
IF = 8 A
IF = 4 A
5
VR = 200 V
TJ = 125 °C
TJ = 25 °C
0
100
1000
100
100
1000
dIF/dt (A/µs)
dIF/dt (A/µs)
Fig. 6 - Typical Recovery Current vs. dIF/dt
Fig. 8 - Typical dI(rec)M/dt vs. dIF/dt
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For technical questions within your region, please contact one of the following:
Document Number: 93474
[email protected], [email protected], [email protected]
Revision: 31-Mar-11
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
VS-HFA08SD60S-M3
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
Vishay Semiconductors
VR = 200 V
0.01 Ω
L = 70 μH
D.U.T.
dIF/dt
adjust
D
IRFP250
G
S
Fig. 9 - Reverse Recovery Parameter Test Circuit
(3)
trr
IF
ta
tb
0
Qrr
(2)
IRRM
(4)
0.5 IRRM
dI(rec)M/dt (5)
0.75 IRRM
(1) dIF/dt
(1) dIF/dt - rate of change of current
through zero crossing
(2) IRRM - peak reverse recovery current
(3) trr - reverse recovery time measured
from zero crossing point of negative
going IF to point where a line passing
through 0.75 IRRM and 0.50 IRRM
extrapolated to zero current.
(4) Qrr - area under curve defined by trr
and IRRM
Qrr =
trr x IRRM
2
(5) dI(rec)M/dt - peak rate of change of
current during tb portion of trr
Fig. 10 - Reverse Recovery Waveform and Definitions
Document Number: 93474
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
VS-HFA08SD60S-M3
HEXFRED® Ultrafast Soft Recovery Diode, 8 A
Vishay Semiconductors
ORDERING INFORMATION TABLE
Device code
VS-
HF
A
08
SD
60
S
TR
-M3
1
2
3
4
5
6
7
8
9
1
-
Vishay Semiconductors product
2
-
HEXFRED® family
3
-
Electron irradiated
4
-
Current rating (08 = 8 A)
5
-
D-PAK
6
-
Voltage rating (60 = 600 V)
7
-
S = D-PAK
8
-
TR = Tape and reel
R = Tape and reel (right oriented)
L = Tape and reel (left oriented)
9
-
Environmental digit:
-M3 = Halogen-free, RoHS compliant and terminations lead (Pb)-free
ORDERING INFORMATION (Example)
PREFERRED P/N
VS-HFA08SD60S-M3
QUANTITY PER T/R
MINIMUM ORDER QUANTITY
PACKAGING DESCRIPTION
75
3000
Antistatic plastic tube
VS-HFA08SD60STR-M3
2000
2000
13" diameter reel
VS-HFA08SD60SL-M3
3000
3000
13" diameter reel
VS-HFA08SD60SR-M3
3000
3000
13" diameter reel
LINKS TO RELATED DOCUMENTS
Dimensions
www.vishay.com/doc?95016
Part marking information
www.vishay.com/doc?95176
Packaging information
www.vishay.com/doc?95033
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For technical questions within your region, please contact one of the following:
Document Number: 93474
[email protected], [email protected], [email protected]
Revision: 31-Mar-11
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Outline Dimensions
Vishay High Power Products
D-PAK (TO-252AA)
DIMENSIONS in millimeters and inches
(5)
A
E
b3
Pad layout
C
A
(3)
0.010 M C A B
c2
A
L3 (3)
Ø1
4
Ø2
4
B
Seating
plane
H
D (5)
1
2
0.245
MIN.
(6.23)
D1
L4
3
3
(2) L5
2
b
1
A
c
b2
0.06
MIN.
(1.524)
0.010 M C A B
2x e
0.093 (2.38)
0.085 (2.18)
(L1)
Detail “C”
Rotated 90 °CW
Scale: 20:1
H (7)
Lead tip
C
Gauge
plane
L2
MILLIMETERS
MIN.
0.488 (12.40)
0.409 (10.40)
0.089
MIN.
(2.28)
Detail “C”
SYMBOL
0.265
MIN.
(6.74)
E1
INCHES
MAX.
MIN.
MAX.
C Seating
plane
C
Ø
L
NOTES
A1
SYMBOL
MILLIMETERS
MIN.
MAX.
MAX.
A
2.18
2.39
0.086
0.094
e
A1
-
0.13
-
0.005
H
9.40
10.41
0.370
0.410
b
0.64
0.89
0.025
0.035
L
1.40
1.78
0.055
0.070
b2
0.76
1.14
0.030
0.045
L1
3
2.29 BSC
INCHES
MIN.
2.74 BSC
L2
0.51 BSC
NOTES
0.090 BSC
0.108 REF.
b3
4.95
5.46
0.195
0.215
c
0.46
0.61
0.018
0.024
L3
0.89
1.27
0.035
0.020 BSC
0.050
c2
0.46
0.89
0.018
0.035
L4
-
1.02
-
0.040
D
5.97
6.22
0.235
0.245
5
L5
1.14
1.52
0.045
0.060
D1
5.21
-
0.205
-
3
Ø
0°
10°
0°
10°
E
6.35
6.73
0.250
0.265
5
Ø1
0°
15°
0°
15°
E1
4.32
-
0.170
-
3
Ø2
25°
35°
25°
35°
3
2
Notes
(1)
Dimensioning and tolerancing as per ASME Y14.5M-1994
(2)
Lead dimension uncontrolled in L5
(3)
Dimension D1, E1, L3 and b3 establish a minimum mounting surface for thermal pad
(4)
Section C - C dimension apply to the flat section of the lead between 0.13 and 0.25 mm (0.005 and 0.10") from the lead tip
(5)
Dimension D, and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005") per side. These dimensions are measured at
the outermost extremes of the plastic body
(6)
Dimension b1 and c1 applied to base metal only
(7)
Datum A and B to be determined at datum plane H
(8)
Outline conforms to JEDEC outline TO-252AA
Document Number: 95016
Revision: 04-Nov-08
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For technical questions concerning module products, contact: [email protected]
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Disclaimer
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RELIABILITY, FUNCTION OR DESIGN OR OTHERWISE.
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provided in datasheets and/or specifications may vary in different applications and performance may vary over time. All
operating parameters, including typical parameters, must be validated for each customer application by the customer’s
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including but not limited to the warranty expressed therein.
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Document Number: 91000
Revision: 11-Mar-11
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