BB ADS7834PB

ADS
783
ADS7834
4
SBAS098A – JANUARY 1998 – REVISED SEPTEMBER 2003
12-Bit High-Speed, Low-Power Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
DESCRIPTION
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The ADS7834 is a 12-bit sampling analog-to-digital converter
(A/D) complete with sample/hold, internal 2.5V reference,
and synchronous serial interface. Typical power dissipation
is 11mW at a 500kHz throughput rate. The device can be
placed into a power-down mode that reduces dissipation to
just 2.5mW. The input range is zero to the reference voltage,
and the internal reference can be overdriven by an external
voltage.
Low power, small size, and high speed make the ADS7834
ideal for battery-operated systems such as wireless
communication devices, portable multi-channel data loggers,
and spectrum analyzers. The serial interface also provides
low-cost isolation for remote data acquisition. The ADS7834
is available in a plastic mini-DIP-8 or an MSOP-8 package
and is ensured over the –40°C to +85°C temperature range.
500kHz THROUGHPUT RATE
2.5V INTERNAL REFERENCE
LOW POWER: 11mW
SINGLE-SUPPLY +5V OPERATION
DIFFERENTIAL INPUT
SERIAL INTERFACE
12-BITS NO MISSING CODES
MINI-DIP-8 AND MSOP-8
0V TO VREF INPUT RANGE
APPLICATIONS
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BATTERY-OPERATED SYSTEMS
DIGITAL SIGNAL PROCESSING
HIGH-SPEED DATA ACQUISITION
WIRELESS COMMUNICATION SYSTEMS
CLK
SAR
CONV
+In
CDAC
Serial
Interface
–In
Comparator
S/H Amp
Internal
+2.5V Ref
Buffer
VREF
DATA
10kΩ ±30%
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
Copyright © 1998-2003, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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PACKAGE/ORDERING INFORMATION
PRODUCT
MAXIMUM
INTEGRAL
LINEARITY
ERROR
(LSB)
MAXIMUM
DIFFERENTIAL
LINEARITY
ERROR
(LSB)
±2
N/S(3)
MSOP-8
"
"
"
±1
±1
"
"
±2
±1
N/S(3)
±1
ADS7834E
ADS7834E
ADS7834EB
ADS7834EB
ADS7834P
ADS7834PB
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING(2)
ORDERING
NUMBER(3)
TRANSPORT
MEDIA, QUANTITY
DGK
–40°C to +85°C
C34
"
"
"
MSOP-8
DGK
–40°C to +85°C
C34
"
"
"
"
Plastic DIP-8
P
–40°C to +85°C
"
"
"
ADS7834P
ADS7834PB
ADS7834E/250
ADS7834E/2K5
ADS7834EB/250
ADS7834EB/2K5
ADS7834P
ADS7834PB
Tape and Reel, 250
Tape and Reel, 2500
Tape and Reel, 250
Tape and Reel, 2500
Rails
Rails
PACKAGEPACKAGE
LEAD
DESIGNATOR(1)
NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com. (2) Performance Grade information is marked on the
reel. (3) N/S = Not Specified, typical only. However, 12-Bits no missing codes is ensured over temperature.
ABSOLUTE MAXIMUM RATINGS(1)
+VCC to GND ............................................................................ –0.3V to 6V
Analog Inputs to GND .............................................. –0.3V to (VCC + 0.3V)
Digital Inputs to GND ............................................... –0.3V to (VCC + 0.3V)
Power Dissipation .......................................................................... 325mW
Maximum Junction Temperature ................................................... +150°C
Operating Temperature Range ......................................... –40°C to +85°C
Storage Temperature Range .......................................... –65°C to +150°C
Lead Temperature (soldering, 10s) ............................................... +300°C
NOTE: (1) Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability.
ELECTROSTATIC
DISCHARGE SENSITIVITY
Electrostatic discharge can cause damage ranging from
performance degradation to complete device failure. Texas
Instruments recommends that all integrated circuits be handled
and stored using appropriate ESD protection methods.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits
may be more susceptible to damage because very small
parametric changes could cause the device not to meet
published specifications.
PIN CONFIGURATION
Top View
VREF
1
+IN
2
8
+VCC
VREF
1
7
CLK
+IN
2
ADS7834
8
+VCC
7
CLK
ADS7834
–IN
3
6
DATA
–IN
3
6
DATA
GND
4
5
CONV
GND
4
5
CONV
Plastic Mini-DIP-8
MSOP-8
PIN ASSIGNMENTS
2
PIN
NAME
1
VREF
Reference Output. Decouple to ground with a 0.1µF ceramic capacitor and a 2.2µF tantalum capacitor.
DESCRIPTION
2
+IN
Noninverting Input.
3
–IN
Inverting Input. Connect to ground or to remote ground sense point.
4
GND
5
CONV
Convert Input. Controls the sample/hold mode, start of conversion, start of serial data transfer, type of serial transfer, and power
down mode. See the Digital Interface section for more information.
6
DATA
Serial Data Output. The 12-bit conversion result is serially transmitted most significant bit first with each bit valid on the rising edge
of CLK. By properly controlling the CONV input, it is possibly to have the data transmitted least significant bit first. See the Digital
Interface section for more information.
Ground.
7
CLK
Clock Input. Synchronizes the serial data transfer and determines conversion speed.
8
+VCC
Power Supply. Decouple to ground with a 0.1µF ceramic capacitor and a 10µF tantalum capacitor.
ADS7834
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SBAS098A
SPECIFICATIONS
At TA = –40°C to +85°C, +VCC = +5V, fSAMPLE = 500kHz, fCLK = 16 • fSAMPLE, internal reference, unless otherwise specified.
ADS7834P, E
PARAMETER
ANALOG INPUT
Full-Scale Input Span(1)
Absolute Input Range
CONDITIONS
MIN
+IN – (–IN)
+IN
–IN
0
–0.2
–0.2
Capacitance
Leakage Current
SYSTEM PERFORMANCE
Resolution
No Missing Codes
Integral Linearity Error
Differential Linearity Error
Offset Error
Gain Error(3)
Common-Mode Rejection
Noise
Power Supply Rejection
REFERENCE OUTPUT
Voltage
Source Current(5)
Drift
Line Regulation
REFERENCE INPUT
Range
Resistance(6)
DIGITAL INPUT/OUTPUT
Logic Family
Logic Levels:
VIH
VIL
VOH
VOL
Data Format
POWER SUPPLY REQUIREMENT
+VCC
Quiescent Current
Power Dissipation
TEMPERATURE RANGE
Specified Performance
MAX
MIN
VREF
VREF +0.2
+0.2
✻
✻
✻
TYP
±1
±0.8
±2
±12
±2
±5
±30
±50
✻
✻
✻
✻
✻
✻
✻
µs
µs
kHz
ns
ps
ns
✻
500
5
30
350
72
–78
70
78
350
68
72
2.475
–72
70
75
2.50
2.525
50
2.48
2.0
2.55
10
✻
✻
VCC +0.3
0.8
0.4
–40
dB
dB
dB
dB
kHz
2.52
✻
V
µA
ppm /°C
mV
✻
✻
V
kΩ
✻
✻
✻
✻
V
V
V
V
✻
V
mA
mA
mW
mW
✻
5.25
2.2
0.5
11
2.5
✻
✻
✻
✻
✻
Straight Binary
4.75
✻
–75
✻
CMOS
3.0
–0.3
3.5
✻
–82
72
82
✻
✻
✻
20
0.6
to Internal Reference Voltage
Specified Performance
fSAMPLE = 500kHz
Power-Down
fSAMPLE = 500kHz
Power-Down
±1
±1
✻
±15
±35
✻
✻
1.625
0.350
|IIH| ≤ +5µA
|IIL| ≤ +5µA
IOH = –500µA
IOL = 500µA
V
V
V
pF
µA
Bits
Bits
LSB(2)
LSB
LSB
LSB
LSB
dB
dB
µVrms
LSB
±0.5
±0.5
±1
±7
70
50
60
1.2
Worst Case ∆, +VCC = 5V ±5%
IOUT = 0
Static Load
IOUT = 0
4.75V ≤ VCC ≤ 5.25V
✻
✻
✻
✻
25°C
–40°C to +85°C
DC, 0.2Vp-p
1MHz, 0.2Vp-p
= 5Vp-p at 10kHz
= 5Vp-p at 10kHz
= 5Vp-p at 10kHz
= 5Vp-p at 10kHz
SNR > 68dB
UNITS
✻
12
12
VIN
VIN
VIN
VIN
MAX
✻
✻
25
1
SAMPLING DYNAMICS
Conversion Time
Acquisition Time
Throughput Rate
Aperture Delay
Aperture Jitter
Step Response
DYNAMIC CHARACTERISTICS
Signal-to-Noise Ratio
Total Harmonic Distortion(4)
Signal-to-(Noise+Distortion)
Spurious Free Dynamic Range
Usable Bandwidth
ADS7834PB, EB
TYP
✻
✻
✻
✻
✻
20
+85
✻
✻
✻
°C
✻ Specifications same as ADS7834P,E.
NOTES: (1) Ideal input span, does not include gain or offset error. (2) LSB means Least Significant Bit, with VREF equal to +2.5V, one LSB is 610µV. (3) Measured
relative to an ideal, full-scale input (+IN – (–IN)) of 2.499V. Thus, gain error includes the error of the internal voltage reference. (4) Calculated on the first nine
harmonics of the input frequency. (5) If the internal reference is required to source current to an external load, the reference voltage will change due to the internal
10kΩ resistor. (6) Can vary ±30%.
ADS7834
SBAS098A
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3
TYPICAL PERFORMANCE CURVES
At TA = +25°C, VCC = +5V, fSAMPLE = 500kHz, fCLK = 16 • fSAMPLE, and internal +2.5V reference, unless otherwise specified.
OFFSET VOLTAGE vs TEMPERATURE
0.5
0
0.4
–1
Delta from +25°C (LSB)
Delta from +25°C (LSB)
FULL-SCALE ERROR vs TEMPERATURE
1
–2
–3
–4
–5
–6
0.3
0.2
0.1
0
–0.1
–0.2
–7
–8
–0.3
–40
–20
0
20
40
60
80
100
–40
–20
0
Temperature (°C)
2.3
460
2.2
450
440
430
420
410
2.1
100
2.0
1.9
1.8
–20
0
20
40
60
80
fSAMPLE = 125kHz
1.6
–40
100
–20
0
20
40
60
100
80
Temperature (°C)
INTEGRAL LINEARITY and DIFFERENTIAL LINEARITY
vs SAMPLE RATE
SUPPLY CURRENT vs SAMPLE RATE
2.4
Delta from fSAMPLE = 500kHz (LSB)
0.06
2.3
Supply Current (mA)
80
fSAMPLE = 500kHz
Temperature (°C)
2.2
2.1
2.0
1.9
1.8
0.04
0.02
Change in Integral
Linearity (LSB)
0
–0.02
–0.04
Change in Differential
Linearity (LSB)
–0.06
–0.08
–0.1
200
300
400
500
100
600
200
300
400
500
600
Sample Rate (kHz)
Sample Rate (kHz)
4
60
1.7
400
1.7
100
40
SUPPLY CURRENT vs TEMPERATURE
470
Supply Current (mA)
Power-down Supply Current (µA)
POWER-DOWN SUPPLY CURRENT
vs TEMPERATURE
390
–40
20
Temperature (°C)
ADS7834
www.ti.com
SBAS098A
TYPICAL PERFORMANCE CURVES (Cont.)
At TA = +25°C, VCC = +5V, fSAMPLE = 500kHz, fCLK = 16 • fSAMPLE, and internal +2.5V reference, unless otherwise specified.
OFFSET VOLTAGE vs EXTERNAL
REFERENCE VOLTAGE
0.300
0.2
0.200
0.1
Delta from VREF = 2.5V (mV)
Delta from VREF = 2.5V (mV)
FULL-SCALE ERROR
vs EXTERNAL REFERENCE VOLTAGE
0.100
0.000
–0.100
–0.200
–0.300
–0.400
–0.500
0
–0.1
–0.2
–0.3
–0.4
–0.5
–0.6
–0.7
–0.600
–0.8
2.0
2.1
2.2
2.3
2.4
2.5
2.0
2.2
External Reference Voltage (V)
PEAK-TO-PEAK NOISE
vs EXTERNAL REFERENCE VOLTAGE
30
Power Supply Rejection (mV/V)
0.85
Peak-to-Peak Noise (LSB)
2.55
POWER SUPPLY REJECTION
vs POWER SUPPLY RIPPLE FREQUENCY
0.90
0.80
0.75
0/70
0.65
0.60
0.55
0.50
25
20
15
10
5
0
2
2.1
2.2
2.3
2.4
2.5
1
10
100
10k
1k
100k
1M
Power Supply Ripple Frequency (Hz)
External Reference Voltage (V)
FREQUENCY SPECTRUM
(4096 Point FFT; fIN = 9.77kHz, –0.2dB)
FREQUENCY SPECTRUM
(4096 Point FFT; fIN = 977Hz, –0.2dB)
0
0
–20
–20
Amplitude (dB)
Amplitude (dB)
2.4
External Reference Voltage (V)
–40
–60
–80
–100
–40
–60
–80
–100
–120
–120
0
50
100
150
200
0
250
Frequency (kHz)
100
150
200
250
Frequency (kHz)
ADS7834
SBAS098A
50
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5
TYPICAL PERFORMANCE CURVES (Cont.)
At TA = +25°C, VCC = +5V, fSAMPLE = 500kHz, fCLK = 16 • fSAMPLE, and internal +2.5V reference, unless otherwise specified.
SIGNAL-TO-NOISE RATIO and
SIGNAL-TO-(NOISE+DISTORTION)
vs INPUT FREQUENCY
FREQUENCY SPECTRUM
(4096 Point FFT; fIN = 99.7kHz, –0.2dB)
76
0.00
SNR and SINAD (dB)
Amplitude (dB)
SNR
74
–20
–40
–60
–80
–100
72
70
SINAD
68
66
64
62
60
–120
0
50
100
150
200
1
250
10
–95
90
–90
85
–85
SFDR
75
–80
–75
THD✻
–70
65
–65
60
–60
✻ First
nine harmonics
of an input frequency
55
–55
50
1
10
100
–50
1000
SNR and SINAD Delta from +25°C (dB)
95
70
0.3
fIN = 10kHz, –0.2dB)
0.2
0.1
0.
SNR
–0.1
–0.2
–0.3
SINAD
–0.4
–0.5
–40
–20
0
20
40
60
80
100
Temperature (°C)
Input Frequency (kHz)
6
1000
SIGNAL-TO-NOISE and
SIGNAL-TO-(NOISE+DISTORTION)
vs TEMPERATURE
THD (dB)
SFDR (dB)
SPURIOUS FREE DYNAMIC RANGE
and TOTAL HARMONIC DISTORTION
vs INPUT FREQUENCY
80
100
Input Frequency (kHz)
Frequency (kHz)
ADS7834
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SBAS098A
THEORY OF OPERATION
are common to both inputs. Thus, the –IN input is best used
to sense a remote ground point near the source of the +IN
signal. If the source driving the +IN signal is nearby, the
–IN should be connected directly to ground.
The ADS7834 is a high-speed. successive approximation
register (SAR) analog-to-digital converter (A/D) with an
internal 2.5V bandgap reference. The architecture is based
on capacitive redistribution which inherently includes a
sample/hold function. The converter is fabricated on a 0.6µ
CMOS process. See Figure 1 for the basic operating circuit
for the ADS7834.
The input current into the analog input depends on input
voltage and sample rate. Essentially, the current into the
device must charge the internal hold capacitor (typically
20pF) during the sample period. After this capacitance has
been fully charged, there is no further input current. The
source of the analog input voltage must be able to charge the
input capacitance to a 12-bit settling level within the sample
period—which can be as little as 350ns in some operating
modes. While the converter is in the hold mode or after the
sampling capacitor has been fully charged, the input impedance of the analog input is greater than 1GΩ.
The ADS7834 requires an external clock to run the conversion process. This clock can vary between 200kHz (12.5kHz
throughput) and 8MHz (500kHz throughput). The duty cycle
of the clock is unimportant as long as the minimum HIGH
and LOW times are at least 50ns and the clock period is at
least 125ns. The minimum clock frequency is set by the
leakage on the capacitors internal to the ADS7834.
Care must be taken regarding the input voltage on the +IN
and –IN pins. To maintain the linearity of the converter, the
+IN input should remain within the range of GND – 200mV
to VREF + 200mV. The –IN input should not drop below
GND – 200mV or exceed GND + 200mV. Outside of these
ranges, the converter’s linearity may not meet specifications.
The analog input is provided to two input pins: +IN and –IN.
When a conversion is initiated, the differential input on these
pins is sampled on the internal capacitor array. While a
conversion is in progress, both inputs are disconnected from
any internal function.
The range of the analog input is set by the voltage on the
VREF pin. With the internal 2.5V reference, the input range
is 0V to 2.5V. An external reference voltage can be placed
on VREF, overdriving the internal voltage. The range for the
external voltage is 2.0V to 2.55V, giving an input voltage
range of 2.0V to 2.55V.
REFERENCE
The reference voltage on the VREF pin directly sets the fullscale range of the analog input. The ADS7834 can operate
with a reference in the range of 2.0V to 2.55V, for a fullscale range of 2.0V to 2.55V.
The digital result of the conversion is provided in a serial
manner, synchronous to the CLK input. The result is provided most significant bit first and represents the result of
the conversion currently in progress—there is no pipeline
delay. By properly controlling the CONV and CLK inputs,
it is possible to obtain the digital result least significant bit
first.
The voltage at the VREF pin is internally buffered and this
buffer drives the capacitor DAC portion of the converter.
This is important because the buffer greatly reduces the
dynamic load placed on the reference source. However, the
voltage at VREF will still contain some noise and glitches
from the SAR conversion process. These can be reduced by
carefully bypassing the VREF pin to ground as outlined in the
sections that follow.
ANALOG INPUT
The +IN and –IN input pins allow for a differential input
signal to be captured on the internal hold capacitor when the
converter enters the hold mode. The voltage range on the
–IN input is limited to –0.2V to 0.2V. Because of this, the
differential input can be used to reject only small signals that
INTERNAL REFERENCE
The ADS7834 contains an onboard 2.5V reference, resulting
in a 0V to 2.5V input range on the analog input. The
specification table gives the various specifications for the
+5V
2.2µF
+
ADS7834
0.1µF
0V to 2.5V
Analog Input
0.1µF
+
1
VREF
+VCC
8
2
+IN
CLK
7
Serial Clock
3
–IN
DATA
6
Serial Data
4
GND
CONV
5
Convert Start
10µF
from
Microcontroller
or DSP
FIGURE 1. Basic Operation of the ADS7834.
ADS7834
SBAS098A
www.ti.com
7
internal reference. This reference can be used to supply a
small amount of source current to an external load, but the
load should be static. Due to the internal 10kΩ resistor, a
dynamic load will cause variations in the reference voltage,
and will dramatically affect the conversion result. Note that
even a static load will reduce the internal reference voltage
seen at the buffer input. The amount of reduction depends on
the load and the actual value of the internal “10kΩ” resistor.
The value of this resistor can vary by ±30%.
The VREF pin should be bypassed with a 0.1µF capacitor
placed as close as possible to the ADS7834 package. In
addition, a 2.2µF tantalum capacitor should be used in
parallel with the ceramic capacitor. Placement of this capacitor, while not critical to performance, should be placed
as close to the package as possible.
tCKP
tCKH
CLK
tCKDS
FIGURE 2. Serial Data and Clock Timing.
SYMBOL
While the external reference will not source significant
current into the VREF pin, it does have to drive the series
10kΩ resistor that is terminated into the 2.5V internal
reference (the exact value of the resistor will vary up to
±30% from part to part). In addition, the VREF pin should
still be bypassed to ground with at least a 0.1µF ceramic
capacitor (placed as close to the ADS7834 as possible). The
reference will have to be stable with this capacitive load.
Depending on the particular reference and A/D conversion
speed, additional bypass capacitance may be required, such
as the 2.2µF tantalum capacitor shown in Figure 1.
DIGITAL INTERFACE
Figure 2 shows the serial data timing and Figure 3 shows the
basic conversion timing for the ADS7834. The specific
timing numbers are listed in Table I. There are several
important items in Figure 3 which give the converter additional capabilities over typical 8-pin converters. First, the
transition from sample mode to hold mode is synchronous to
the falling edge of CONV and is not dependent on CLK.
Second, the CLK input is not required to be continuous
during the sample mode. After the conversion is complete,
the CLK may be kept LOW or HIGH.
8
tCKDH
DATA
EXTERNAL REFERENCE
The internal reference is connected to the VREF pin and to the
internal buffer via a 10kΩ series resistor. Thus, the reference
voltage can easily be overdriven by an external reference
voltage. The voltage range for the external voltage is 2.0V
to 2.55V, corresponding to an analog input range of 2.0V to
2.55V.
Reasons for choosing an external reference over the internal
reference vary, but there are two main reasons. One is to
achieve a given input range. For example, a 2.048V reference provides for a 0V to 2.048V input range—or 500µV
per LSB. The other is to provide greater stability over
temperature. (The internal reference is typically 20ppm/°C
which translates into a full-scale drift of roughly 1 output
code for every 12°C. This does not take into account other
sources of full-scale drift). If greater stability over temperature is needed, then an external reference with lower temperature drift will be required.
tCKL
DESCRIPTION
MIN
TYP
MAX
UNITS
tACQ
Acquisition Time
350
ns
tCONV
Conversion Time
1.625
µs
tCKP
Clock Period
125
tCKL
Clock LOW
50
5000
ns
ns
tCKH
Clock HIGH
50
tCKDH
Clock Falling to Current Data
Bit No Longer Valid
5
tCKDS
Clock Falling to Next Data Valid
tCVL
CONV LOW
40
ns
tCVH
CONV HIGH
40
ns
tCKCH
CONV Hold after Clock Falls(1)
10
ns
tCKCS
CONV Setup to Clock Falling(1)
10
tCKDE
Clock Falling to DATA Enabled
20
50
ns
tCKDD
Clock Falling to DATA
High Impedance
70
100
ns
ns
15
30
ns
50
ns
ns
tCKSP
Clock Falling to Sample Mode
5
tCKPD
Clock Falling to Power-Down Mode
50
ns
tCVHD
CONV Falling to Hold Mode
(Aperture Delay)
5
ns
ns
tCVSP
CONV Rising to Sample Mode
5
tCVPU
CONV Rising to Full Power-up
50
tCVDD
CONV Changing State to DATA
High Impedance
70
tCVPD
CONV Changing State to
Power-Down Mode
50
tDRP
CONV Falling to Start of CLK
(for hold droop < 0.1 LSB)
ns
ns
100
ns
ns
5
µs
Note: (1) This timing is not required under some situations. See text for more information.
TABLE I. Timing Specifications (TA = –40°C to +85°C,
CLOAD = 30pF).
The asynchronous nature of CONV to CLK raises some
interesting possibilities, but also some design considerations. Figure 3 shows that CONV has timing restraints in
relation to CLK (tCKCH and tCKCS). However, if these times
are violated (which could happen if CONV is completely
asynchronous to CLK), the converter will perform a conversion correctly, but the exact timing of the conversion is
indeterminate. Since the setup and hold time between CONV
and CLK has been violated in this example, the start of
conversion could vary by one clock cycle. (Note that the
start of conversion can be detected by using a pull-up
resistor on DATA. When DATA drops out of high-impedance and goes LOW, the conversion has started and that
clock cycle is the first of the conversion.)
In addition if CONV is completely asynchronous to CLK
and CLK is continuous, then there is the possibility that
CLK will transition just prior to CONV going LOW. If this
ADS7834
www.ti.com
SBAS098A
Figure 4 shows the typical method for placing the A/D into
the power-down mode. If CONV is kept LOW during the
conversion and is LOW at the start of the 13 clock cycle,
then the device enters the power-down mode. It remains in
this mode until the rising edge of CONV. Note that CONV
must be HIGH for at least tACQ in order to sample the signal
properly as well as to power-up the internal nodes.
occurs faster than the 10ns indicated by tCKCH, then there is
a chance that some digital feedthrough may be coupled onto
the hold capacitor. This could cause a small offset error for
that particular conversion.
Thus, there are two basic ways to operate the ADS7834.
CONV can be synchronous to CLK and CLK can be continuous. This would be the typical situation when interfacing
the converter to a digital signal processor. The second
method involves having CONV asynchronous to CLK and
gating the operation of CLK (a non-continuous clock). This
method would be more typical of an SPI-like interface on a
microcontroller. This method would also allow CONV to be
generated by a trigger circuit and to initiate (after some
delay) the start of CLK. These two methods are covered
under DSP Interfacing and SPI Interfacing.
There are two different methods for clocking the ADS7834.
The first involves scaling the CLK input in relation to the
conversion rate. For example, an 8MHz input clock and the
timing shown in Figure 3 results in a 500kHz conversion
rate. Likewise, a 1.6MHz clock would result in a 100kHz
conversion rate. The second method involves keeping the
clock input as close to the maximum clock rate as possible
and starting conversions as needed. This timing is similar to
that shown in Figure 4. As an example, a 50kHz conversion
rate would require 160 clock periods per conversion instead
of the 16 clock periods used at 500kHz.
POWER-DOWN TIMING
The conversion timing shown in Figure 3 does not result in
the ADS7834 going into the power-down mode. If the
conversion rate of the device is high (approaching 500kHz),
then there is very little power that can be saved by using the
power-down mode. However, since the power-down mode
incurs no conversion penalty (the very first conversion is
valid), at lower sample rates, significant power can be saved
by allowing the device to go into power-down mode between conversions.
The main distinction between the two is the amount of time
that the ADS7834 remains in power-down. In the first mode,
the converter only remains in power-down for a small
number of clock periods (depending on how many clock
periods there are per each conversion). As the conversion
rate scales, the converter always spends the same percentage
of time in power-down. Since less power is drawn by the
digital logic, there is a small decrease in power consumption, but it is very slight. This effect can be seen in the
typical performance curve “Supply Current vs Sample Rate.”
tCVL
tCVCK
CONV
tCKCS
tCKCH
CLK
14
15
16
1
2
3
4
11
12
13
14
15
16
1
(1)
tCKDE
D11
(MSB)
DATA
tCKDD
D10
D9
D2
D1
D0
(LSB)
tACQ
tCVHD
SAMPLE/HOLD
MODE
tCKSP
HOLD
SAMPLE
SAMPLE
HOLD
(2)
tCONV
INTERNAL
CONVERSION
STATE
IDLE
CONVERSION IN PROGRESS
IDLE(3)
NOTES: (1) Clock periods 14 and 15 are shown for clarity, but are not required for proper operation of the ADS7834, provided that the
minimum tACQ time is met. The CLK input may remain HIGH or LOW during this period. (2) The transition from sample mode to hold
mode occurs on the falling edge of CONV. This transition is not dependent on CLK. (3) The device remains fully powered when
operated as shown. If the sample time is longer than 3 clock periods, power consumption can be reduced by allowing the device to
enter a power-down mode. See the power-down timing for more information.
FIGURE 3. Basic Conversion Timing.
ADS7834
SBAS098A
www.ti.com
9
CONV
1
CLK
2
D11
(MSB)
DATA
3
12
D10
D1
13
D0
(LSB)
tACQ
tCVSP
SAMPLE/HOLD
SAMPLE
MODE
HOLD
SAMPLE
HOLD
(3)
INTERNAL
CONVERSION
STATE
IDLE
POWER MODE
CONVERSION IN PROGRESS
IDLE
tCKPD
tCVPU
FULL POWER
LOW POWER
(1)
FULL POWER
(2)
NOTES: (1) The low power mode (“power-down”) is entered when CONV remains LOW during the conversion and is still LOW at the
start of the 13th clock cycle. (2) The low power mode is exited when CONV goes HIGH. (3) When in power-down, the transition from
hold mode to sample mode is initiated by CONV going HIGH.
FIGURE 4. Power-down Timing.
tCVH
CONV
tCKCH
1
CLK
2
3
12
13
14
23
24
D10
D11
(MSB)
tCKCS
D11
(MSB)
DATA
D10
D0
(LSB)
D1
D1
tCVDD
(1)
SAMPLE/HOLD
SAMPLE
MODE
INTERNAL
CONVERSION
STATE
IDLE
LOW...
(2)
HOLD
CONVERSION IN PROGRESS
IDLE
tCVPD
POWER MODE
FULL POWER
LOW POWER
(3)
NOTES: (1) The serial data can be transmitted LSB first by pulling CONV LOW during the 13th clock cycle. (2) After the MSB has been
transmitted, the DATA output pin will remain LOW until CONV goes HIGH. (3) When CONV is taken LOW to initiate the LSB first transfer,
the converter enters the power-down mode.
FIGURE 5. Serial Data “LSB-First” Timing.
In contrast, the second method (clocking at a fixed rate)
means that each conversion takes X clock cycles. As the
time between conversions get longer, the converter remains
in power-down an increasing percentage of time. This reduces
10
total power consumption by a considerable amount. For
example, a 50kHz conversion rate results in roughly
1/10 of the power (minus the reference) that is used at a
500kHz conversion rate.
ADS7834
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SBAS098A
Table II offers a look at the two different modes of operation
and the difference in power consumption.
fSAMPLE
POWER WITH
CLK = 16 • fSAMPLE
POWER WITH
CLK = 8MHz
500kHz
11mW
11mW
250kHz
10mW
7mW
100kHz
9mW
4mW
the conversion will terminate immediately, before all 12 bits
have been decided. This can be a very useful feature when
a resolution of 12 bits is not needed. An example would be
when the converter is being used to monitor an input voltage
until some condition is met. At that time, the full resolution
of the converter would then be used. Short-cycling the
conversion can result in a faster conversion rate or lower
power dissipation.
There are several very important items shown in Figure 6.
The conversion currently in progress is terminated when
CONV is taken HIGH during the conversion and then taken
LOW prior to tCKCH before the start of the 13th clock cycle.
Note that if CONV goes LOW during the 13th clock cycle,
then the LSB-first mode will be entered (Figure 5). Also,
when CONV goes LOW, the DATA output immediately
transitions to high impedance. If the output bit that is present
during that clock period is needed, CONV must not go LOW
until the bit has been properly latched into the receiving
logic.
TABLE II. Power Consumption versus CLK Input.
LSB FIRST DATA TIMING
Figure 5 shows a method to transmit the digital result in a
least-significant bit (LSB) format. This mode is entered
when CONV is pulled HIGH during the conversion (before
the end of the 12th clock) and then pulled LOW during the
13th clock (when D0, the LSB, is being transmitted). The
next 11 clocks then repeat the serial data, but in an LSB first
format. The converter enters the power-down mode during
the 13th clock and resumes normal operation when CONV
goes HIGH.
DATA FORMAT
The ADS7834 output data is in straight binary format as
shown in Figure 7. This figure shows the ideal output code
for the given input voltage and does not include the effects
of offset, gain, or noise.
SHORT-CYCLE TIMING
The conversion currently in progress can be “short-cycled”
with the technique shown in Figure 6. This term means that
tCVL
(1)
CONV
tCVH
1
CLK
2
3
4
5
6
7
tCVDD
D11
(MSB)
DATA
SAMPLE/HOLD
MODE
INTERNAL
CONVERSION
STATE
D10
D9
D8
SAMPLE
IDLE
D6
D7
HOLD
CONVERSION IN PROGRESS
IDLE
tCVPD
POWER MODE
FULL POWER
LOW POWER
NOTE: (1) The conversion currently in progress can be stopped by pulling CONV LOW during the conversion. This must occur at
least tCKCS prior to the start of the 13th clock cycle. The DATA output pin will tri-state and the device will enter the power-down
mode when CONV is pulled LOW.
FIGURE 6. Short-cycle Timing.
ADS7834
SBAS098A
www.ti.com
11
microcontrollers form various manufacturers. CONV would
be tied to a general purpose I/O pin (SPI) or to a PCX pin
(QSPI), CLK would be tied to the serial clock, and DATA
would be tied to the serial input data pin such as MISO
(master in slave out).
FS = Full-Scale Voltage = VREF
1 LSB = FS/4096
1 LSB
11...111
Note the time tDRP shown in Figure 9. This represents the
maximum amount of time between CONV going LOW and
the start of the conversion clock. Since CONV going LOW
places the sample and hold in the hold mode and because the
hold capacitor loses charge over time, there is a requirement
that time tDRP be met as well as the maximum clock period
(tCKP).
Output Code
11...110
11...101
00...010
00...001
00...000
LAYOUT
2.499V(1)
0V
Input
Voltage(2)
(V)
For optimum performance, care should be taken with the
physical layout of the ADS7834 circuitry. This is particularly true if the CLK input is approaching the maximum
input rate.
NOTES: (1) For external reference, value is VREF – 1 LSB. (2) Voltage
at converter input: +IN – (–IN).
FIGURE 7. Ideal Input Voltages and Output Codes.
DSP INTERFACING
Figure 8 shows a timing diagram that might be used with a
typical digital signal processor such as a TI DSP. For the
buffered serial port (BSP) on the TMS320C54X family,
CONV would tied to BFSX, CLK would be tied to BCLKX,
and DATA would be tied to BDR.
SPI/QSPI INTERFACING
Figure 9 shows the timing diagram for a typical serial
peripheral interface (SPI) or queued serial peripheral interface (QSPI). Such interfaces are found on a number of
The basic SAR architecture is sensitive to glitches or sudden
changes on the power supply, reference, ground connections, and digital inputs that occur just prior to latching the
output of the analog comparator. Thus, during any single
conversion for an n-bit SAR converter, there are n “windows” in which large external transient voltages can easily
affect the conversion result. Such glitches might originate
from switching power supplies, nearby digital logic, and
high power devices. The degree of error in the digital output
depends on the reference voltage, layout, and the exact
timing of the external event. The error can change if the
external event changes in time with respect to the CLK
input.
CONV
CLK
15
16
1
2
D11
(MSB)
DATA
3
D10
12
D1
13
14
15
D0
(LSB)
16
1
2
D11
(MSB)
3
4
D10
D9
2
3
FIGURE 8. Typical DSP Interface Timing.
tDRP
tACQ
CONV
CLK
DATA
1
2
3
D11
(MSB)
4
D10
13
D1
14
D0
(LSB)
15
16
1
D11
(MSB)
FIGURE 9. Typical SPI/QSPI Interface Timing.
12
ADS7834
www.ti.com
SBAS098A
With this in mind, power to the ADS7834 should be clean
and well bypassed. A 0.1µF ceramic bypass capacitor should
be placed as close to the device as possible. In addition, a
1µF to 10µF capacitor is recommended. If needed, an even
larger capacitor and a 5Ω or 10Ω series resistor my be used
to lowpass filter a noisy supply.
The ADS7834 draws very little current from an external
reference on average as the reference voltage is internally
buffered. However, glitches from the conversion process
appear at the VREF input and the reference source must be
able to handle this. Whether the reference is internal or
external, the VREF pin should be bypassed with a 0.1µF
capacitor. An additional larger capacitor may also be used,
if desired. If the reference voltage is external and originates
from an op-amp, make sure that it can drive the bypass
capacitor or capacitors without oscillation.
The GND pin should be connected to a clean ground point.
In many cases, this will be the “analog” ground. Avoid
connections which are too near the grounding point of a
microcontroller or digital signal processor. If needed, run a
ground trace directly from the converter to the power supply
entry point. The ideal layout will include an analog ground
plane dedicated to the converter and associated analog
circuitry.
ADS7834
SBAS098A
www.ti.com
13
PACKAGE OPTION ADDENDUM
www.ti.com
24-Jan-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package Qty
Drawing
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Top-Side Markings
(3)
(4)
ADS7834E/250
ACTIVE
VSSOP
DGK
8
250
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834E/250G4
ACTIVE
VSSOP
DGK
8
250
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834E/2K5
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834E/2K5G4
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834EB/250
ACTIVE
VSSOP
DGK
8
250
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834EB/250G4
ACTIVE
VSSOP
DGK
8
250
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834EB/2K5
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834EB/2K5G4
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS CU NIPDAUAG Level-2-260C-1 YEAR
& no Sb/Br)
-40 to 85
C34
ADS7834P
OBSOLETE
PDIP
P
8
TBD
Call TI
Call TI
ADS7834PB
OBSOLETE
PDIP
P
8
TBD
Call TI
Call TI
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
24-Jan-2013
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Only one of markings shown within the brackets will appear on the physical device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
ADS7834E/250
VSSOP
DGK
8
ADS7834EB/250
VSSOP
DGK
ADS7834EB/2K5
VSSOP
DGK
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
250
180.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
8
250
180.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
8
2500
330.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ADS7834E/250
VSSOP
DGK
8
250
210.0
185.0
35.0
ADS7834EB/250
VSSOP
DGK
8
250
210.0
185.0
35.0
ADS7834EB/2K5
VSSOP
DGK
8
2500
367.0
367.0
35.0
Pack Materials-Page 2
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