Using the HI5746EVAL1 Evaluation Board TM Application Note February 1999 AN9725.2 phase, Φ2 , the two bottom plates of the sampling capacitors are connected together and the holding capacitors are switched to the op-amp output nodes. The charge then redistributes between CS and CH completing one sampleand-hold cycle. The front end sample-and-hold output is a fully-differential, sampled-data representation of the analog input. The circuit not only performs the sample-and-hold function but will also convert a single-ended input to a fullydifferential output for the converter core. During the sampling phase, the VIN pins see only the on-resistance of a switch and CS. The relatively small values of these components result in a typical full power input bandwidth of 250MHz for the converter. Description The HI5746EVAL1 evaluation board for the HI5746 can be used to evaluate the performance of the HI5746 10-bit 40MSPS analog-to-digital converter (ADC). As shown in the Evaluation Board Functional Block Diagram, this evaluation board includes sample clock driver circuitry, reference voltage generators and single-ended to differential analog input drive circuitry. Buffered digital data outputs are conveniently provided for easy interfacing to a ribbon connector or logic probes. The evaluation board is provided with some prototyping area for the addition of user designed custom interfaces or circuits. HI5746 A/D Theory of Operation As illustrated in the HI5746 functional block diagram and the timing diagram in Figure 2, eight identical pipeline subconverter stages, each containing a two-bit flash converter and a two-bit multiplying digital-to-analog converter, follow the S/H circuit with the ninth stage being a two bit flash converter. Each converter stage in the pipeline will be sampling in one phase and amplifying in the other clock phase. Each individual subconverter clock signal is offset by 180 degrees from the previous stage clock signal resulting in alternate stages in the pipeline performing the same operation. The HI5746 is a 10-bit fully differential sampling pipeline A/D converter with digital error correction logic. Figure 1 depicts the circuit for the front end differential-in-differential-out sample-and-hold (S/H). The switches are controlled by an internal sampling clock which is a non-overlapping two phase signal, Φ1 and Φ2, derived from the master sampling clock. During the sampling phase, Φ1, the input signal is applied to the sampling capacitors, CS. At the same time the holding capacitors, CH, are discharged to analog ground. At the falling edge of Φ1 the input signal is sampled on the bottom plates of the sampling capacitors. In the next clock Evaluation Board Functional Block Diagram SAMPLE CLOCK INPUT +5VD 50Ω BIAS TEE CLK CLOCK OUT VAR GAIN 1.2V BANDGAP VOLTAGE REFERENCE VAR GAIN CLK +2.5V +2.0V CLK VREF + CLK VREF - G = +1 10 10 ANALOG INPUT VIN+ D0-D9 D Q G = -1 50Ω DIGITAL DATA OUT (D0 - D9) VINHI5746 DGND AGND +5VD +5VA 3-1 -5VA 1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Corporation. | Copyright © Intersil Corporation 2000 Application Note 9725 HI5746 Functional Block Diagram VDC CLOCK BIAS CLK VINVIN+ S/H STAGE 1 DFS 2-BIT FLASH 2-BIT DAC OE + ∑ DVCC2 X2 D9 (MSB) D8 D7 D6 DIGITAL DELAY AND DIGITAL ERROR CORRECTION STAGE 8 D5 D4 D3 2-BIT FLASH 2-BIT DAC D2 D1 + ∑ D0 (LSB) - X2 DGND2 STAGE 9 2-BIT FLASH AVCC 3-2 AGND DVCC1 DGND1 VREF + VREF - (OPTIONAL) Application Note 9725 Φ1 VIN+ Φ1 Φ1 Φ1 CH CS Φ2 VIN- identical two-bit subconverter stages with the corresponding output of the ninth stage flash converter before applying the eighteen bit result to the digital error correction logic. The digital error correction logic uses the supplementary bits to correct any error that may exist before generating the final ten bit digital data output of the converter. -+ VOUT+ +- VOUT- CS Φ1 Φ1 CH FIGURE 1. ANALOG INPUT SAMPLE-AND-HOLD The output of each of the eight identical two-bit subconverter stages is a two-bit digital word containing a supplementary bit to be used by the digital error correction logic. The output of each subconverter stage is input to a digital delay line which is controlled by the internal sampling clock. The function of the digital delay line is to time align the digital outputs of the eight Because of the pipeline nature of this converter, the digital data representing an analog input sample is output to the digital data bus on the 7th cycle of the clock after the analog sample is taken. This time delay is specified as the data latency. After the data latency time, the digital data representing each succeeding analog sample is output during the following clock cycle. The digital output data is synchronized to the external sampling clock by a double buffered latching technique. The output of the digital error correction circuit is available in two’s complement or offset binary format depending on the state of the Data Format Select (DFS) control input (see HI5746 Data Sheet Table 1, A/D Code Table). ANALOG INPUT CLOCK INPUT SN-1 HN-1 SN HN SN+1 HN+1 SN+2 SN+5 HN+5 SN+6 HN+6 SN+7 HN+7 SN+8 HN+8 INPUT S/H 1ST STAGE 2ND STAGE B1, N-1 B2, N-2 B1, N B2, N-1 B1, N+1 B1, N+4 B1, N+5 B2, N+4 B2, N 9TH STAGE B9, N-5 B9, N-4 B9, N-3 DATA OUTPUT DN-6 DN-5 DN-4 B9, N B2, N+5 B2, N+6 B9 N+2 B9, N+3 DN DN+1 DN+2 DN-1 1. SN: N-th sampling period. 2. HN: N-th holding period. 3. BM, N: M-th stage digital output corresponding to N-th sampled input. 4. DN: Final data output corresponding to N-th sampled input. FIGURE 2. HI5746 INTERNAL CIRCUIT TIMING 3-3 B1, N+7 B9, N+1 tLAT NOTES: B1, N+6 Application Note 9725 Layout and Power Supplies The HI5746EVAL1 evaluation board is a four layer board with a layout optimized for the best performance of the ADC. Included in the application note are electrical schematics of the evaluation board circuitry, a components layout, a components part list and views of the various board layers that make up the printed wiring board. The user should feel free to copy the layout in their application. Refer to the components layout and the evaluation board electrical schematics for the following discussions. The HI5746 A/D converter has separate analog and digital supply and ground pins to keep digital noise out of the analog signal path. The evaluation board provides separate low impedance analog and digital ground planes. Since the analog and digital ground planes of the evaluation board are connected together at a single point where the power supplies enter the board, DO NOT tie the grounds together back at the power supplies. between VREF - and analog ground. This allows the user the option of supplying only the +2.5V VREF+ voltage reference with the +2.0V VREF - being generated internally by the voltage division action of the input structure. The HI5746 is tested with VREF - equal to +2.0V and VREF+ equal to +2.5V yielding a fully differential analog input voltage range of ±0.5V. In order to minimize overall converter noise it is recommended that adequate high frequency decoupling be provided at both of the reference voltage input pins, VREF+ and VREF -. The VREF+ and VREF- reference voltage generation circuitry on the evaluation board consists of a Intersil ICL8069 +1.2V bandgap voltage reference (D1) along with operational amplifiers (U3 and U4) both operating in a non-inverting variable gain configuration that is utilized to generate the reference voltages for the HI5746. The reference voltages, VREF+ and VREF-, are set at the factory to the proper voltage levels required by the HI5746. Variable resistor VR1 is used to adjust VREF+ to +2.5V and variable resistor VR2 is used to adjust VREF- to +2.0V. The analog and digital supplies are also kept separate on the evaluation board and should be driven by clean linear regulated supplies. The power supplies can be hooked up with external wires to the holes marked +5VAIN, +5VA1IN, 5VAIN, +5VDIN, +5VD1IN and +5VD2IN. +5VDIN, +5VD1IN and +5VD2IN are digital supplies and should be returned to DGND. +5VAIN, +5VA1IN and -5VAIN are the analog supplies and should be returned to AGND. Table 1 lists the operational supply voltages for the evaluation board. Single supply operation of the converter is possible but the overall performance of the converter may degrade. Operation of the converter with a single +2.5V VREF+ reference voltage can be demonstrated by simply removing R20 from the VREF- generation circuit. This opens the path between the VREF- operational amplifier (U4) output and the VREF- input of the HI5746 while still providing decoupling at the converter VREF- voltage reference input pin. TABLE 1. EVALUATION BOARD POWER SUPPLIES In order to ensure rated performance of the HI5746, the duty cycle of the sample clock should be held at 50%. It must also have low phase noise and operate at standard TTL logic levels. POWER SUPPLY +5VAIN NOMINAL VALUE 5.0V ±5% +5VA1iN -5VAIN 5.0V ±5% -5.0V ±5% +5VDIN 5.0V ±5% +5VD1IN 5.0V ±5% +5VD2IN 5.0V ±5% / 3.0V ±10% CURRENT (TYP) FUNCTION(S) SUPPLIED 121mA Analog Input and Reference Voltage Generator Op Amps, Bandgap Reference 30mA A/D AVCC 120mA Analog Input and Reference Voltage Generator Op Amps, Bandgap Reference 5mA Sample Clock Generator, D0-D9 D-FF 13mA A/D DVCC1 3mA A/D DVCC2 Reference Voltage Generator Circuit The HI5746 is designed to accept two external reference voltage sources at the VREF input pins. Typical operation of the converter requires VREF+ to be set at +2.5V and VREF - to be set at 2.0V. However, it should be noted that the input structure of the VREF+ and VREF - input pins consists of a resistive voltage divider with one resistor of the divider (nominally 500Ω) connected between VREF+ and VREF - and the other resistor of the divider (nominally 2000Ω) connected 3-4 Sample Clock Driver It can be difficult to find a low phase noise generator that will provide a 40MHz squarewave at TTL logic levels. Consequently, the HI5746EVAL1 evaluation board is designed with a logic inverter (U7) acting as a voltage comparator to generate the sampling clock for the HI5746 when a sinewave (< ±1.5V) is applied to the CLK input of the evaluation board. The sample clock sinewave is AC coupled into the input of the inverter and a discrete bias tee is used to bias the sinewave around the trigger level of the inverter’s input. A potentiometer (VR3) varies the DC bias voltage added to the sinewave input allowing the user to adjust the duty cycle of the sampling clock to obtain the best performance from the ADC and to evaluate the effects of sample clock duty cycle on the performance of the converter. The trigger level for the sample clock input to the HI5746 converter is approximately 1.5V. Therefore, the duty cycle of the sampling clock should be measured around the 1.5V trigger level at the HI5746 sample clock input pin. The sinewave to logic level comparator drives a series of additional inverters that provides isolation between the four sample clocks used on the evaluation board. One clock is used to drive the converter sample clock input pin, a second clock is used to drive the digital output data (D0-D9) D-type Application Note 9725 flip-flop and the last two provide CLK and CLK at the data output connector, P2. The clock/data relationship at the P2 output connector is as follows. CLK has rising edges aligned with data transitions and CLK has rising edges mid-bit. The data corresponding to a particular analog input sample will be available at the digital outputs of the HI5746 after the data latency (7 cycles) plus the HI5746 digital data output delay. The sample clock and digital output data signals are buffered and made available through two connectors contained on the evaluation board. The line buffering allows for driving long leads or analyzer inputs. These drivers are not necessary for the digital output data if the load presented to the converter does not exceed the data sheet CMOS drive limits and a load capacitance of 10pF. P1 allows the evaluation board to be interfaced to the DSP evaluation boards available from Intersil and should be installed on the far side (layer 4) of the evaluation board for proper signal routing to the DSP evaluation boards. The digital output data and sample clock can also be accessed by clipping the test leads of a logic analyzer or data acquisition system onto the I/O pins of connector P2. The A/D converters OE control input pin allows the digital output data bus of the converter to be switched to a threestate high impedance mode. This feature enables the testing and debugging of systems which are utilizing one or more converters. This three-state control signal is not intended for use as an enable/disable function on a common data bus and could result in possible bus contention issues. The A/D converters OE control input pin is controlled by the installation or removal of a shunt, JP1, contained on the evaluation board. Installation of JP1 forces the OE control input pin low for normal operation while removal of JP1 allows the digital output data bus of the converter to be switched to a three-state high impedance mode. see Figure 4. The performance of the ADC does not change significantly with the value of the analog input common mode voltage. A DC voltage source, VDC, equal to 3.2V (typical), is made available to the user to help simplify circuit design when using an AC coupled differential input. This low output impedance voltage source is not designed to be a reference but makes an excellent DC bias source and stays well within the analog input common mode voltage range over temperature. VIN+ VIN HI5746 VDC -VIN VIN - FIGURE 3. AC COUPLED DIFFERENTIAL INPUT The HI5746EVAL1 evaluation board accepts a single-ended analog input and converts it to a differential signal for driving the VIN + and VIN - analog inputs of the converter. The single-ended to differential conversion is accomplished through the use of two operational amplifiers (U1 and U2). U1 is configured as a unity gain amplifier and U2 is configured as an inverting amplifier with a gain of minus one. +5V VIN+ 0.5VP-P VIN+ VIN+ 0.25V < VDC < 4.75V VIN0.5VP-P The fully differential analog input of the HI5746 A/D can be configured in various ways depending on the signal source and the required level of performance. +5V VIN0.5VP-P Analog Input VINVDC = 4.75V VDC = 0.25V 0V 0V FIGURE 4. DIFFERENTIAL ANALOG INPUT COMMON MODE VOLTAGE RANGE Differential Analog Input Configuration HI5746 Performance Characterization For the AC coupled differential input (Figure 3) assume the difference between VREF+, typically 2.5V, and VREF-, typically 2.0V, is 0.5V. Fullscale is achieved when the VIN and -VIN input signals are 0.5VP-P, with -VIN being 180 degrees out of phase with VIN. The converter will be at positive fullscale when the VIN+ input is at VDC + 0.25V and the VIN- input is at VDC 0.25V (VIN+ - VIN- = +0.5V). Conversely, the converter will be at negative fullscale when the VIN+ input is equal to VDC 0.25V and VIN- is at VDC + 0.25V (VIN+ - VIN- = -0.5V). Dynamic testing is used to evaluate the HI5746 performance. Among these tests are Signal-to-Noise and Distortion Ratio (SINAD), Signal-to-Noise Ratio (SNR), Total Harmonic Distortion (THD), Spurious Free Dynamic Range (SFDR) and InterModulation Distortion (IMD). Since the HI5746 is powered by a single +5V analog supply, the analog input is limited to be between ground and +5V. For the differential input connection this implies the analog input common mode voltage can range from 0.25V to 4.75V, 3-5 Figure 5 shows the test system used to perform dynamic testing on high-speed ADC’s at Intersil. The clock (CLK) and analog input (AIN) signals are sourced from low phase noise HP8662A synthesized signal generators that are phase locked to each other to ensure coherence. The output of the signal generator driving the ADC analog input is bandpass filtered to improve the harmonic distortion of the analog input signal. The comparator on the evaluation board will convert the sine wave CLK input signal to a square wave to drive the Application Note 9725 sample clock input of the HI5746. The ADC data is captured by a logic analyzer and then transferred over the GPIB bus to the PC. The PC has the required software to perform the Fast Fourier Transform (FFT) and do the data analysis. Coherent testing is recommended in order to avoid the inaccuracies of windowing. The sampling frequency and analog input frequency have the following relationship: fI/fS = M/N, where fI is the frequency of the input analog sinusoid, fS is the sampling frequency, N is the number of samples, and M is the number of cycles over which the samples are taken. By making M an integer and odd number (1, 3, 5, ...) the samples are assured of being nonrepetitive. Refer to the HI5746 data sheet for a complete list of test definitions and the results that can be expected using the evaluation board with the test setup shown. Evaluating the part with a reconstruction DAC is only suggested when doing bandwidth or video testing. Video Testing Figure 6 shows how a test system can be configured to do video testing of the HI5746 with the DAC reconstruction board and the HI5746EVAL1 evaluation board. The appropriate test waveform is generated by a video source such as the TSG100 or TEK1001 from Tektronix and applied HP8662A to the converter. The digitized video is converted back to analog by the reconstruction DAC for evaluation by a video analyzer, TEK VM700. Since the HI5746 is a 10-bit A/D, install jumpers JP1 and JP2 on the DAC reconstruction board to tie the DAC two LSB’s high. Install JP3 so that the video out of the reconstruction board will have negative going sync. JP5-9 on the DAC reconstruction board are utilized to establish the correct clock/data timing relationship into the DAC. Set up the HI5746EVAL1 evaluation board for video testing by following the procedures outlined previously in the HI5746EVAL1 evaluation board application note on the video input configuration and single-ended DC coupled analog inputs. Input the video signal to the HI5746EVAL1 evaluation board through the SMA connector marked VIDEO. Note that all cables carrying video should be 75Ω. Finally, mate the DAC reconstruction board P1 connector to the HI5746EVAL1 evaluation board P2 connector. Correct alignment between the two boards will have P1 pin 34 of the DAC reconstruction board plugged into P2 pin 25 of the HI5746EVAL1 evaluation board. See Application Note AN9419 “Using the DAC Reconstruct Board” for additional applications information. HP8662A REF VIDEO SIGNAL SOURCE CLOCK GEN BANDPASS FILTER CLK CLK RFIN COMPARATOR COMPARATOR VIN HI5746 CLK DIGITAL DATA OUTPUT VIN HI5746 CLK DIGITAL DATA OUTPUT HI5746EVAL1 EVALUATION BOARD VIDEO HI5746EVAL1 EVALUATION BOARD 10 (P2) 10 12-BIT DAC RECONSTRUCT BOARD (DACRECON-EV) DAS9200 12-BIT DAC VIDEO GPIB PC OSCILLOSCOPE FIGURE 5. HIGH-SPEED A/D TEST SYSTEM 3-6 TEK VM700 FIGURE 6. VIDEO TEST SETUP Application Note 9725 Pin Descriptions PIN NO. NAME DESCRIPTION 1 DVCC1 Digital Supply (+5.0V) 2 DGND1 Digital Ground 3 DVCC1 Digital Supply (+5.0V) 4 DGND1 Digital Ground 5 AVCC Analog Supply (+5.0V) 6 AGND Analog Ground 7 VREF+ +2.5V Positive Reference Voltage Input 8 VREF - +2.0V Negative Reference Voltage Input (Optional) 9 VIN+ Positive Analog Input 10 VIN- Negative Analog Input 11 VDC DC Bias Voltage Output 12 AGND Analog Ground 13 AVCC Analog Supply (+5.0V) 14 OE Digital Output Enable Control Input 15 DFS Data Format Select Input 16 D9 Data Bit 9 Output (MSB) 17 D8 Data Bit 8 Output 18 D7 Data Bit 7 Output 19 D6 Data Bit 6 Output 20 D5 Data Bit 5 Output 21 DGND2 22 CLK 23 DVCC2 24 D4 Data Bit 4 Output 25 D3 Data Bit 3 Output 26 D2 Data Bit 2 Output 27 D1 Data Bit 1 Output 28 D0 Data Bit 0 Output (LSB) Digital Ground Sample Clock Input Digital Output Supply (+3.0V or +5.0V) 3-7 Application Note 9725 FIGURE 7. HI5746EVAL1 EVALUATION BOARD PARTS LAYOUT (NEAR SIDE) FIGURE 8. HI5746EVAL1 EVALUATION BOARD COMPONENT NEAR SIDE (LAYER 1) 3-8 Application Note 9725 FIGURE 9. HI5746EVAL1 EVALUATION BOARD GROUND PLANE LAYER (LAYER 2) FIGURE 10. HI5746EVAL1 EVALUATION BOARD POWER PLANE LAYER (LAYER 3) 3-9 Application Note 9725 FIGURE 11. HI5746EVAL1 EVALUATION BOARD COMPONENT FAR SIDE (LAYER 4) FIGURE 12. HI5746EVAL1 EVALUATION BOARD PARTS LAYOUT (FAR SIDE) 3-10 +5VL C34 + 4.7µF C35 0.1µF E13 JP3 C32 0.1µF U5 1 +5VD1 2 + C25 4.7µF 3 5 6 7 VREF+ 8 VREF- 9 VIN+ 10 VIN- 11 VDC 12 13 +5VA1 + 14 + D0 DGND1 D1 DVCC1 D2 DGND1 D3 AVCC D4 AGND DVCC2 VREF+ VREF- HI5746 CLK DGND2 VIN+ D5 VIN- D6 VDC D7 AGND D8 AVCC D9 OE DFS 28 U6 27 1 26 2 25 3 24 4 23 5 22 6 CLK1 21 7 20 8 19 9 18 10 17 11 16 12 VCC OE D0 Q0 D1 Q1 D2 Q2 D3 Q3 D4 D5 D6 D7 D8 D9 GND Q4 Q5 Q6 Q7 Q8 Q9 CP 24 P2 D0 1 D1 3 2 6 20 D2 5 D3 7 19 D4 9 10 18 D5 11 12 17 D6 13 14 16 D7 15 16 15 D8 17 18 14 D9 19 20 21 22 23 24 23 22 21 4 8 13 15 CLK2 CLK4 R16 R15 C28 4.7µF C29 0.1µF C30 C31 4.7µF 0.1µF 4.99K 4.99K JP1 +5VD JP1-3 U5-6 C25-35 R15-17 FB7 E13-14 P1 CLK3 JP2 Application Note 9725 4 C26 C27 0.1µF 0.1µF DVCC1 FCT821A 3-11 C33 + 4.7µF D0 - D9, CLK4 (CLK) TO P1 E14 +5VD2 R17 4.99K HI5746EVAL1 Evaluation Board Schematic Diagrams FB7 +5VD Application Note 9725 HI5746EVAL1 Evaluation Board Schematic Diagrams (Continued) +5VA + 1 J1 C1 0.1µF C3 4.7µF 7 3 VIN NC + 8 C2 0.01µF R1 56.2 6 V+ V2 C6 0.1µF V+ - VIN+ R22 10 U1 V5 OPA642U 4 -5VA C4 0.01µF R6 100 C5 + 4.7µF VDC R2 22.1 R9 A/R R8 0 C61 1000pF R5 499 +5VA R7 100 + C7 C8 0.01µF 0.1µF 1 7 2 NC - R3 499 + C10 C9 0.01µF 4.7µF V+ V+ V- 3 R4 0 OR 249 8 V- 6 U2 5 OPA642U 4 -5VA C11 0.01µF C12 + 4.7µF J1 U1-2 C1-13, 61 R1-9, 22, 23 3-12 R23 10 VINC13 0.1µF Application Note 9725 HI5746EVAL1 Evaluation Board Schematic Diagrams (Continued) +5VA +5VA + C59 0.01µF C14 4.7µF + R10 4.99K 1 7 1.2V 3 8 + C16 4.7µF 4 C18 4.7µF NC + 8 C17 0.01µF 6 V+ V- D1 ICL8069CCBA 2 - R19 0 V+ U3 V- C55 0.01µF 5 + VREF+ C56 4.7µF OPA642U 4 C15 C60 0.01µF 0.01µF 2.5V -5VA C19 0.01µF C20 + 4.7µF R11 499 R12 249 VR1 1.0K 1(CCW) 2 VREF+ 3(CW) VREF+ +5VA + 1 C22 4.7µF 7 3 D1 U3-4 C14-24, 55-60 R10-14, 19, 20 VR1-2 NC + 8 C21 0.01µF V+ 6 V+ V2 - U4 V5 OPA642U 4 -5VA C23 0.01µF R13 499 R14 249 VR2 1.0K C24 + 4.7µF 1(CCW) 2 VREF- 3(CW) VREF- 3-13 R20 0 2.0V VREF- C57 0.01µF + C58 4.7µF Application Note 9725 HI5746EVAL1 Evaluation Board Schematic Diagrams (Continued) +5VD + C41 4.7µF C36 0.1µF J2 C42 0.1µF U7 C37 0.1µF AC04 13 U7 1 12 14 2 CLK1 (CLK) CLK IN R18 56.2 7 L1 1.5µH +5VD + VR3 1.0K U7 9 1(CCW) 2 8 C39 0.1µF U7 11 C40 0.1µF R21 100 10 TP1 TP2 DGND TEST POINT TP3 CLK3 (CLK) AC04 U7 3 AGND TEST POINT CLK2 (CLK) AC04 3(CW) C38 4.7µF AC04 4 AC04 TP4 U7 5 6 CLK4 AC04 E1 E2 E7 (CLK) E8 FB1 +5VAIN FB4 +5VA + AGND E3 C43 C44 4.7µF 0.1µF +5VDIN (ANALOG INPUT AND REFERENCE DGND VOLTAGE GENERATOR OP-AMPS, BANDGAP REFERENCE) E4 + E9 E10 FB2 +5VA1IN + AGND E5 FB5 +5VA1 (A/D AVCC) +5VD1IN + DGND C45 C46 4.7µF 0.1µF AGND AND DGND TIE TOGETHER AT A SINGLE POINT WHERE THE POWER SUPPLIES ENTER THE PWB E6 E11 AGND + C47 C48 4.7µF 0.1µF +5VD1 (A/D DVCC1) FB6 -5VA +5VD2IN (ANALOG INPUT AND REFERENCE DGND VOLTAGE GENERATOR OP-AMPS, BANDGAP REFERENCE) J2 U7 C36-54 R18,21 VR3 FB1-6 E1-12 L1 3-14 C51 C52 4.7µF 0.1µF E12 FB3 -5VAIN C49 C50 4.7µF 0.1µF +5VD (SAMPLE CLOCK GENERATOR, D F-F VIA LPF) + C54 C53 4.7µF 0.1µF +5VD2 (+5V/+3V) (A/D DVCC2) Application Note 9725 HI5746EVAL1 Evaluation Board Schematic Diagrams (Continued) P1C D1 D2 D4 D6 D8 CLK4 (CLK) D0 - D9, CLK4 (CLK) 3-15 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15 C16 C17 C18 C19 C20 C21 C22 C23 C24 C25 C26 C27 C28 C29 C30 C31 C32 P1A D0 D3 D5 D7 D9 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 A14 A15 A16 A17 A18 A19 A20 A21 A22 A23 A24 A25 A26 A27 A28 A29 A30 A31 A32 Application Note 9725 HI5746EVAL1 Evaluation Board Parts List REFERENCE DESIGNATOR QTY R1, 18 2 56.2Ω, 1/8W 805 CHIP, 1% R9 1 A/RΩ, 1/8W 805 CHIP, 1% R2 1 22.1Ω, 1/8W 805 CHIP, 1% R3, 5, 11, 13 4 499Ω, 1/8W 805 CHIP, 1% R4, 12, 14 3 249Ω, 1/8W 805 CHIP, 1% R8, 19, 20 3 0.0Ω, 1/4W 805 CHIP, 1% R6, 7, 21 3 100Ω, 1/8W 805 CHIP, 1% R10, 15, 16, 17 4 4.99kΩ, 1/8W 805 CHIP, 1% R22, 23 2 10Ω, 1/16W 402 CHIP, 1% VR1, 2, 3 3 1kΩ TRIM POT C3, 5, 10, 12, 14, 16, 18, 20, 22, 24, 25, 28, 30, 33, 34, 38, 41, 43, 45, 47, 49, 51, 53, 56, 58 25 4.7µF CHIP TANT CAP, 10WVDC, 20%, EIA CASE A C1, 6, 7, 13, 26, 27, 29, 31, 32, 35, 36, 37, 39, 40, 42, 44, 46, 48, 50, 52, 54 21 0.1µF CER CAP, 50WVDC, 10%, 805 CASE, Y5V DIELECTRIC C61 1 1000pF CER CAP, 50WVDC, 10%, 805 CASE, X7R DIELECTRIC C2, 4, 8, 9, 11, 15, 17, 19, 21, 23, 55, 57, 59, 60 14 0.01µF CER CAP, 50WVDC, 10%, 805 CASE, X7R DIELECTRIC FB1-7 7 10µH FERRITE BEAD L1 1 1.5µH CHIP INDUCTOR, 1210 CASE J1,2 2 SMA STRAIGHT JACK PCB MOUNT - 4 RUBBER FEET - DESCRIPTION DUT CLAMP JP1, 2, 3 3 1x2 HEADER JPH1, 2, 3 3 1x2 HEADER JUMPER P2 1 2x12 HEADER P1 1 64-PIN EUROCARD RT ANGLE AGND, DGND 4 TEST POINT D1 1 INTERSIL ICL8069CCBA LOW VOLTAGE BANDGAP REFERENCE U5 1 INTERSIL HI5746KCB 10-BIT 40MHz A/D CONVERTER U1, 2, 3, 4 4 OP-AMP U6 1 10-BIT D-TYPE FLIP-FLOP U7 1 HEX INVERTER All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site www.intersil.com 3-16