Measurement System for Organic LED Materials C9920 Series Providing a variety of measurement needs from the development of organic LED materials to the development of flat panels. Hamamatsu Photonics provides a variety of solutions by combining low-light detection, spectroscopic measurement, optical measurement and image processing technologies. The Organic LED Measurement Device Series responds to a variety of needs in organic LED research and production fields, from materials development to device development. Line-up in our measurement device group for research in the organic LED field Absolute PL quantum yield spectrometer Picosecond fluorescence lifetime measurement system Measurement of the luminous efficiency of a organic LED material using photoluminescence (PL). Measurement of fluorescent and phosphorous lifetimes. C9920-02, -02G, -03, -03G External quantum efficiency measurement C9920-12 Measurement of luminous efficiency using current excitation of a organic LED device. Light distribution measurement system C9920-11 Measurement of brightness and emission angle distribution in a organic LED device. C11200 Time-resolved absorption spectrum analyzing system Flash photolysis system Measurement of transient absorption spectra in organic LED materials. The C9920 series, which is built around the Multichannel Detector, can make various measurements such as PL quantum yield and external quantum efficiency, as well as light distribution and brightness. Absolute PL quantum yield spectrometer C9920-02, -02G, -03, -03G The absolute quantum yield for light emissions is measured using a photoluminescence method. Excitation at various wavelengths is possible by means of xenon lamp and monochromator. The Absolute PL quantum yield spectrometer C9920-02, -02G, -03, -03G measures the absolute quantum yield for light emissions using a photoluminescence method (PL method in the following). The device is made up of an excitation light source that uses a stable xenon light source (monochromator), a nitrogen gas-flow capable integrating sphere and a PMA multichannel detector capable of simultaneously measuring multiple wavelengths that have been corrected for wavelength sensitivity. C9920-02G, -03G configuration example Power source for xenon light source Xe light source with fiber input optics for C9920(CW) L10092 Integration sphere adapter for PL excitation A10093 Monochromator (Motorized) A10080-02 Absolute quantum yield measurement of light emitting materials by PL method Measures total flux by incorporating an integration sphere. Measurements with ultra-high sensitivity and high signal-to-noise ratio For thin films, solutions and powder samples Temperature control Automatic control of excitation wavelength (C9920-02G, -03G) Various of analysis functions Data analyzer Fiber probe Light guide for PL measurement A10079-01 Standard Option Features Basic software for Quantum yield measurement U6039-05 Plug for PL/EL measurement A10612-01 Integrating sphere unit 3.3 inch A10094 Photonic multichannel analyzer PMA-12 Alignment tool for liquid measurement A10104-01 - Quantum yield measurement - Excitation wavelength dependability (C9920-02G, -03G) - Emission spectrum - PL excitation spectrum (C9920-02G, -03G) Sample holder for PL measurement A9924-01 Specifications Type number C9920-02 PL measurement wavelength range C9920-02G C9920-03 300 nm to 950 nm C9920-03G 400 nm to 1100 nm Monochromatic light source (150 W xenon light source) Excitation wavelength Bandwidth 250 nm to 800 nm 250 nm to 950 nm 375 nm to 800 nm 375 nm to 1000 nm 10 nm or less (FWHM) Approx. 2 nm to 5 nm (Varies with slit) 10 nm or less (FWHM) Approx. 2 nm to 5 nm (Varies with slit) Built-in mechanical shutter to cut off the excitation light Prevention of sample deterioration Excitation wavelength control Manual Automatic control Manual Automatic control Multichannel spectroscope Measurement wavelength range 200 nm to 950 nm 350 nm to 1100 nm < 2 nm < 2.5 nm Wavelength resolution Sample holder (Option) Thin film 16 mm×10 mm×1 mm Quartz substrate correspondence (not including a substrate) Powder Using Laboratory dish without caps (5 sets) A10095-01 or Laboratory dish with caps (5 sets) A10095-03 Solution Using Alignment tool for liquid measurement A10104-01 or Side-arm cell (3 sets) A10095-02 Temperature control RT* to +180 ˚C by using Sample holder for temperature control A9924-18 *RT : Room temperature External quantum efficiency measurement C9920-12 Highly precise measurement of emission efficiency does not depend on the emission angle distribution characteristics by using an integrating sphere. The External quantum efficiency measurement C9920-12 is a device for measuring the external quantum efficiency of a sample by exciting the LED device with current (voltage) and measuring the number of emitted photons. Measurements of emissions versus the current applied can be made, inclusive of elements related to the efficiency, such as absorption by the organic LED material layer and glass substrate, and reflective mirror efficiency. C9920-12 configuration example PMA-12 Photonic multichannel analyzer C10027-01 Halogen lamp C10027 PHOTONIC MULTI-CHANNEL ANALYZER SIGNAL INPUT Fiber probe Basic software for Emission efficiency measurement U6039-06 Integration sphere adapter for EL self absorption correction A10393 Integrating sphere unit 3.3 inch A10094 Data analyzer Light shield adapter for external quantum efficiency A9829 Sample holder for EL external QE measurement (pin type) A9924-04 Standard Option keithley's Source meter type 24xx Minimum current/voltage value, maximum current/voltage value, current/voltage value steps and the like can be set in window at the upper left of the display screen. Raw measurement data is displayed in the window at the lower left of the display screen. Sample monitoring measurements, data during a measurement and the like are displayed. Various graphs can be displayed in the figures on the right side of the display screen. Light distribution measurement system C9920-11 Measurements such as brightness for each emission angle, emission spectrum and color coordinates are possible using a rotating stage. The Light distribution measurement system C9920-11 is a device where the organic LED sample supplied with current (voltage) is placed on a rotating stage and the organic LED device emission brightness, spectrum and emission angle distribution are measured for each of the angle steps that has been set. C9920-11 configuration example Optics for OLED light distribution measurement A10119-01 Sample holder for EL brightness light distribution measurement(pin type) A9924-03 PMA-12 Photonic multichannel analyzer C10027-01 SIGNAL INPUT Fiber probe Automatic rotating stage for light distribution measurement A10120-01 Automatic rotating stage controller keithley's Source meter type 24xx DS102 C10027 PHOTONIC MULTI-CHANNEL ANALYZER Basic software for Emission efficiency measurement U6039-06 Data analyzer Standard Option Besides angle measurement range and the step for angle measurements, the minimum current/voltage value, maximum current/voltage value and step current/voltage value can be set in window at the upper left of the display screen. Raw measurement data is displayed in the window at the lower left of the display screen. Sample monitoring measurements, data during a measurement are displayed. Various graphs can be displayed in the figures on the right side of the display screen. The graphs specified with a polar plot showing light distribution, can be displayed at the top of the screen. Sample courtesy of Kido Laboratory, Yamagata University Providing a Variety of Solutions by Combining Low-Light Observation, Spectroscopic Measurement, Optical Measurement and Image Processing Technologies. Picosecond Fluorescence Lifetime Measurement System: C11200 Fluorescence and Phosphorescence Lifetime Measurements Picosecond to millisecond fluorescence and phosphorescence lifetime are measured with high dynamic range by combining a laser and a streak camera. The results of the measurements are observed as a two-dimensional image made up of a wavelength axis and time axis, so it is possible to visually grasp the lifetimes for each of the fluorescent and phosphorescent components. Measurement of Time-Resolved Emission Spectrum of Phosphorous Luminescent Materials ▲ Phosphorescence materials Ir(ppy)3: Fluorescence, phosphorescence and streak image of temporal resolution luminescent spectra of host CBP thin film at 4.5 K Data courtesy of Prof. Chihaya Adachi, Kyushu University Time-resolved Absorption Spectrum Analyzing System, Flash Photolysis System Transient Absorption Measurement Transient Absorption Spectrum of phosphorescence material Btp2Ir(acac) in acetonitrile Solution 0 0.15 1 0.15 2 400 nm 0.10 OD 3 0.10 4 0.05 OD Time (ms) The sample is irradiated with a laser, and the absorption of transient species is measured by monitoring the transient species produced using a high-output xenon lamp or other lamp. By using a streak camera or a gated multi-channel detector as the detector, time measurements in the picosecond to millisecond range are possible. This is useful for measurement of intersystem crossing and elucidation of triplet status that are important for phosphorescence materials and the elucidation of the light emission processes and deterioration processes for organic LED materials. 5 6 0.00 0.05 350 400 450 500 550 600 650 Wavelength (nm) 7 520 nm 8 0.00 9 0 2 4 Time(ms) 6 8 10 350 400 450 500 550 500 650 Data courtesy of Prof. Chihaya Adachi, Kyushu University Wavelength (nm) [Streak Camera Specifications] [Gated Multi-Channel Detector] Time-resolved Absorption Spectrum Analyzing System Flash Photolysis System Product and software package names noted in this documentation are trademarks or registered trademarks of their respective manufacturers. ●Subject to local technical requirements and regulations, availability of products included in this promotional material may vary. Please consult your local sales representative. ●Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications and external appearance are subject to change without notice. © 2015 HAMAMATSU PHOTONICS K.K. 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No. SSMS0014E09 JUL/2015 HPK Created in Japan