AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 Reliability Report AEC-Q100-REV G Automotive Qualification for IXDD609SI, IXDI609SI, IXDN609SI VIS Foundry Process CU05UMS12010 Report Title: AEC-Q100-REV G Automotive Qualification for IXDD609SI, IXDI609SI, IXDN609SI VIS Foundry Process CU05UMS12010 Report Number: 2011-009 Date: 7/18/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 6 AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division IXD_609SI. The purpose of this qualification was to verify the AEC-Q100-REV G Automotive Qualification criteria. The IXD_609SI Gate Driver silicon is foundered at Vanguard International Semiconductor, Corp. (VIS) and assembled at Greatek in Taiwan. The VIS process is CU05UMS12010. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the AEC-Q100-REV G Automotive Qualification. Table 1: AEC-Q100-REV G Automotive Qualification Product IXD_609SI Reliability Tests Stress Test HTOL Applicable Specs Stress Conditions JESD22-A108 1000hrs, 150°C Number Sample Total of Lots Size (SS) SS 3 80 240 HAST JESD22A110-C 130°C, 85% 18.8PSI, 96hrs 3 80 240 Solderability Mil-Std-883, M1011 0 to 100°C, 10/10 dwells, 15 cycles 3 17 51 Temp Cycle JESD22-A104-C (T/C) -65 to 150°C, 10/10 dwells, 500 cycles 3 80 240 High Temp JESD22-A103C Storage 150°C, 1000hrs 3 50 150 Autoclave J-STD-020D.1, JESD22A102 T=121°C, RH=100%, t=96hrs unbiased 3 80 240 Latch Up AEC-Q100004 T=125°C, 35v, 100mA 3 8 24 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 6 AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 Stress Test Gate Leakage ELFR PTC ESD CDM ESD HBM Applicable Specs Stress Conditions RTN-0441T=RT D REV AEC-Q100T=150°C, t=48hrs 008-REV A With bias JESD22T=-40°C/+125°C, A105-C 1000 cycles t=45 min JESD221.5kΩ, 100pF A114-E JESD221.5kΩ, 100pF A114-E Number Sample Total of Lots Size (SS) SS 3 8 24 3 800 2400 3 80 240 3 50 150 3 50 150 Reliability Test Results: The stress tests and associated results for the AEC-Q100-REV G Automotive Qualification product IXD_609SI qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: AEC-Q100-Rev G Automotive Qualification Product IXD_609SI Reliability Test Results HTOL Readpoint / (Reject/ SS) 1000 hrs HAST 0/240 96 hrs Solderability 0/240 15 Cycles Temp Cycle 0/51 500 Cycles Stress Test 0/240 High Temp Storage 1000 hrs Autoclave 96 hrs 0/150 0/240 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 6 AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 Stress Test Latch-Up Gate Leakage ELFR Readpoint / (Reject/ SS) Trigger Pulse 0/24 Neg./Pos. Potential 0/24 48 hrs. 0/2400 PTC 1000 cycles 0/240 ESD Testing Results: As part of this qualification, the AEC-Q100-REV G Automotive Qualification the IXD_609SI product family was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. Charged Device Model (CDM) testing was subcontracted to Integra Technologies LLC in January 2012. The results are summarized in Table 3. Table3: AEC-Q100-REV G Automotive Qualification Product IXD_609SI ESD Characterization Results ESD Package ESD Test RC Highest Class Model Spec Network Passed CDM SOIC – 8L EP AEC- Q100- 1Ω meas 500V/all pinsC3B 011 750Vcorner resistor pins HBM SOIC – 8L EP JESD22, 2000V H2 1.5kΩ, A114-E 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 6 AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 FIT (Failure in Time) Rate on the AEC-Q100-REV G Automotive Qualification Product IXD_609SI: Table 4 summarizes the number of devices used for the AEC-Q100-REV G product IXD_609SI reliability stress with associated failures. Using the HTOL data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 150°C test temperature and 40°C use temperatures. Using the HAST data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 130°C test temperature and 40°C use temperatures. The calculated FITs from the reliability stress came out to be 15.01 for HTOL and 27.89 for HAST Table 4: AEC-Q100-REV G Automotive Qualification Product IXD_609SI FIT Rate Summary Qual# Stress # of # of Hours Act. Acc. Equivalent FIT Rate Devices Fails Tested Energy Factor Dev. Hours @ 60% CL 1 HTOL 240 0 1000 0.7 1 HAST 240 0 96 0.7 255.41 61,297,432 15.01 32,988,672 27.89 1.4318E +03 Conclusion: The qualification of the product IXD_609SI (kit#’s C00156, C00193, C00254) has been successfully completed and satisfies the requirements of the AEC-Q100-REV G Automotive Qualification criteria. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 5 of 6 AEC-Q100-REV G Automotive Qualification-IXDD609SI.IXDI609SI.IXDN609SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-009 APPROVAL: Prepared by: _Martha W. Brandt* ______________ 7/18/12_ Martha W. Brandt Quality Engineer Date Approved by: _Ronald P. Clark*_________________7/18/12_ Ronald P. Clark Director of Quality Date Approved by: _James Archibald*________________7/18/12_ James Archibald Date Director of Development Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 6 of 6