AEC-Q100-REV G Automotive QualificationIXDD604SIA.IXDF604SIA.IXDI604SIA.IXDN604SIA VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Reliability Report AEC-Q100-REV G Automotive Qualification for IXDD604SIA, IXDF604SIA, IXDI604SIA, IXDN604SIA VIS Foundry Process CU05UMS12010 Report Title: AEC-Q100-REV G Automotive Qualification for IXDD604SIA, IXDF604SIA, IXDI604SIA, IXDN604SIA VIS Foundry Process CU05UMS12010 Report Number: 2011-008C Date: 7/22/11 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 5 AEC-Q100-REV G Automotive QualificationIXDD604SIA.IXDF604SIA.IXDI604SIA.IXDN604SIA VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Introduction: This report summarizes the Reliability data of Clare’s IXD_604SIA. The Reliability data presented here were collected by ROOD Microtec in Nodlingen, Germany. The purpose of this qualification was to verify the AEC-Q100-REV G Automotive Qualification criteria. The IXD_604SIA Gate Driver silicon is foundered at Vanguard International Semiconductor, Corp. (VIS) and assembled at Greatek in Taiwan. The VIS process is CU05UMS12010. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the AEC-Q100-REV G Automotive Qualification. Table 1: AEC-Q100-REV G Automotive Qualification Product IXD_604SIA Reliability Tests Stress Test Applicable Specs Stress Conditions HTOL JESD22A108 1000hrs, 150°C 6 80 480 HAST JESD22A110-C 130°C, 85% 18.8PSI, 96hrs 6 80 480 Solderability Mil-Std-883, 0 to 100°C, 10/10 M1011 dwells, 15 cycles 1 17 17 3 80 240 2 48 96 T=121°C, RH=100%, t=96hrs unbiased 6 80 480 T=125°C, 35v, 100mA 1 8 8 Temp Cycle JESD22(T/C) A104-C High Temp JESD22Storage A103C Autoclave Latch Up J-STD020D.1, JESD22A102 AEC-Q100004 Number Sample Total of Lots Size (SS) SS -65 to 150°C, 10/10 dwells, 500 cycles 150°C, 1000hrs IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 5 AEC-Q100-REV G Automotive QualificationIXDD604SIA.IXDF604SIA.IXDI604SIA.IXDN604SIA VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Stress Test Gate Leakage ELFR PTC ESD HBM Applicable Specs RTN-0441D REV AEC-Q100008-REV A JESD22A105-C JESD22A114-E Stress Conditions T=RT T=150°C, t=48hrs With bias T=-40°C/+125°C, 1000 cycles t=45 min 1.5kΩ, 100pF Number Sample Total of Lots Size (SS) SS 1 8 8 3 800 2400 1 48 48 1 38 38 Reliability Test Results: The stress tests and associated results for the AEC-Q100-REV G Automotive Qualification product IXD_604SIA qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: AEC-Q100-Rev G Automotive Qualification Product IXD_604SIA Reliability Test Results Stress Test HTOL Readpoint / (Reject/ SS) 1000 hrs 0/480 HAST 96 hrs 0/480 Solderability 15 Cycles 0/17 Temp Cycle 500 Cycles 0/240 High Temp Storage Autoclave 1000 hrs 0/96 96 hrs 0/480 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 5 AEC-Q100-REV G Automotive QualificationIXDD604SIA.IXDF604SIA.IXDI604SIA.IXDN604SIA VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Stress Test Latch-Up Gate Leakage ELFR Readpoint / (Reject/ SS) Trigger Pulse 0/8 Neg./Pos. Potential 0/8 48 hrs. 0/2400 PTC 1000 cycles 0/48 ESD Testing Results: As part of this qualification, the AEC-Q100-REV G Automotive Qualification product IXD_604SIA was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. Charged Device Model (CDM) testing was subcontracted to Integra Technologies LLC in January 2012. The results are summarized in Table 3. Table3: AEC-Q100-REV G Automotive Qualification Product IXD_604SIA ESD Characterization Results ESD Package ESD Test RC Highest Class Model Spec Network Passed CDM SOIC – 8L EP AEC- Q100- 1Ω meas 500V/all pinsC3B 011 750Vcorner resistor pins HBM SOIC – 8L JESD22, 2000V H2 1.5kΩ, A114-E 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 5 AEC-Q100-REV G Automotive QualificationIXDD604SIA.IXDF604SIA.IXDI604SIA.IXDN604SIA VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B FIT (Failure in Time) Rate on the AEC-Q100-REV G Automotive Qualification Product IXD_604SIA: Table 4 summarizes the number of devices used for the AEC-Q100-REV G product IXD_604SIA reliability stress with associated failures. Using the HTOL data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy according to Clare’s procedure P-04-25-WW for 150°C test temperature and 40°C use temperatures. Using the HAST data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 130°C test temperature and 40°C use temperatures. The calculated FITs from the reliability stress came out to be 7.50 for HTOL and 13.94 for HAST Table 4: AEC-Q100-REV G Automotive Qualification Product IXD_604SIA FIT Rate Summary Qual# Stress # of # of Hours Act. Acc. Equivalent FIT Rate Devices Fails Tested Energy Factor Dev. Hours @ 60% CL 1 HTOL 480 0 1000 0.7 1 HAST 480 0 96 0.7 255.41 122,594,864 7.50 65,976,679 13.94 1.4318E +03 Conclusion: The qualification of the product IXD_604SIA has been completed according to AEC-Q100REV G Automotive Qualification criteria. IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 5 of 5