AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Reliability Report AEC-Q100-REV G Automotive Qualification for IXDD604SI, IXDF604SI, IXDI604SI, IXDN604SI VIS Foundry Process CU05UMS12010 Report Title: AEC-Q100-REV G Automotive Qualification for IXDD604SI, IXDF604SI, IXDI604SI, IXDN604SI VIS Foundry Process CU05UMS12010 Report Number: 2011-008B Date: 5/31/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 6 AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division IXD_604SI. The Reliability data presented here were collected by ROOD Microtec in Nodlingen, Germany. The purpose of this qualification was to verify the AEC-Q100-REV G Automotive Qualification criteria. The IXD_604SI Gate Driver silicon is foundered at Vanguard International Semiconductor, Corp. (VIS) and assembled at Greatek in Taiwan The VIS process is CU05UMS12010. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the AEC-Q100-REV G Automotive Qualification. Table 1: AEC-Q100-REV G Automotive Qualification Product IXD_604SI Reliability Tests Stress Test HTOL Applicable Specs Stress Conditions JESD22-A108 1000hrs, 150°C Number Sample Total of Lots Size (SS) SS 6 80 480 HAST JESD22A110-C 130°C, 85% 18.8PSI, 96hrs 3 77 231 Solderability Mil-Std-883, M1011 0 to 100°C, 10/10 dwells, 15 cycles 2 15 30 Temp Cycle JESD22-A104-C (T/C) -65 to 150°C, 10/10 dwells, 500 cycles 3 77 231 High Temp JESD22-A103C Storage 150°C, 1000hrs 3 45 135 Autoclave J-STD-020D.1, JESD22A102 T=121°C, RH=100%, t=96hrs unbiased 6 80 480 Latch Up AEC-Q100004 T=125°C, 35v, 100mA 1 8 8 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 6 AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Stress Test Wirebond Pull Wirebond Shear Gate Leakage ELFR PTC ESD CDM ESD HBM Applicable Specs Stress Number Sample Total Conditions of Lots Size (SS) SS AEC-Q100Examine 30 bonds 2 15 30 008-REV A From a min of 5 pcs AEC-Q100Examine 30 bonds 2 15 30 008-REV A From a min of 5 pcs RTN-0441T=RT 1 8 8 D REV AEC-Q1003 800 2400 T=150°C, t=48hrs 008-REV A With bias JESD221 48 48 T=-40°C/+125°C, A105-C 1000 cycles t=45 min JESD223 50 150 1.5kΩ, 100pF A114-E JESD221 38 38 1.5kΩ, 100pF A114-E Reliability Test Results: The stress tests and associated results for the AEC-Q100-REV G Automotive Qualification product IXD_604SI qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: AEC-Q100-Rev G Automotive Qualification Product IXD_604SI Reliability Test Results Stress Test HTOL Readpoint / (Reject/ SS) 1000 hrs 0/480 HAST 96 hrs 0/231 Solderability 15 Cycles 0/30 Temp Cycle 500 Cycles 0/231 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 6 AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Stress Test High Temp Storage Readpoint / (Reject/ SS) 1000 hrs 0/135 Autoclave 96 hrs 0/480 Latch-Up Trigger Pulse 0/8 Wirebond Pull 30 Bonds Tested 0/30 Wirebond Shear 30 Bonds Tested 0/30 Gate Leakage Neg./Pos. Potential 0/8 ELFR 48 hrs. 0/2400 PTC 1000 cycles 0/48 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 6 AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B ESD Testing Results: As part of this qualification, the AEC-Q100-REV G Automotive Qualification the IXD_604SI product family was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. Charged Device Model (CDM) testing was subcontracted to Integra Technologies LLC in January 2012. The results are summarized in Table 3. Table3: AEC-Q100-REV G Automotive Qualification Product IXD_604SI ESD Characterization Results ESD Package ESD Test RC Highest Class Model Spec Network Passed CDM SOIC – 8L EP AEC- Q100- 1Ω meas 500V/all pinsC3B 011 750Vcorner resistor pins HBM SOIC – 8L EP JESD22, 2000V H2 1.5kΩ, A114-E 100pF FIT (Failure in Time) Rate on the AEC-Q100-REV G Automotive Qualification Product IXD_604SI: Table 4 summarizes the number of devices used for the AEC-Q100-REV G product IXD_604SI reliability stress with associated failures. Using the HTOL data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 150°C test temperature and 40°C use temperatures. Using the HAST data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 130°C test temperature and 40°C use temperatures. The calculated FITs from the reliability stress came out to be 7.50 for HTOL and 28.98 for HAST Table 4: AEC-Q100-REV G Automotive Qualification Product IXD_604SI FIT Rate Summary Qual# Stress # of # of Hours Act. Acc. Equivalent FIT Rate Devices Fails Tested Energy Factor Dev. Hours @ 60% CL 1 HTOL 480 0 1000 0.7 1 HAST 231 0 96 0.7 255.41 122,594,864 7.50 31,751,277 1.4318E +03 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 5 of 6 28.98 AEC-Q100-REV G Automotive Qualification-IXDD604SI.IXDF604SI.IXDI604SI.IXDN604SI VIS Foundry Process CU05UMS12010 Qualification No: 2011-008B Conclusion: The qualification of the product IXD_604SI has been completed according to AEC-Q100REV G Automotive Qualification criteria. APPROVAL: Prepared by: _ Martha W. Brandt* Martha W. Brandt Quality Engineer Approved by: _Ronald P. Clark*_ Ronald P. Clark Director of Quality 5/31/12 Date 5/31/12 Date Approved by: _James Archibald* 5/31/12 James Archibald Date Director of Development Engineering *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 6 of 6