12/15/2010 PRODUCT RELIABILITY REPORT FOR DS1342, Rev A2 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Manager, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email: [email protected] ph: 972-371-3739 Rev B, 1/3/08 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Maxim products: DS1342, Rev A2 In addition, Maxim's continuous reliability monitor program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html. Device Description: A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms or their activation energies are unknown. All deratings will be done from the stress ambient temperature to the use ambient temperature. An exponential model will be used to determine the acceleration factor for failure mechanisms, which are voltage accelerated. AfV = exp(B*(Vs - Vu)) AfV = Acceleration factor due to Voltage Vs = Stress Voltage (e.g. 7.0 volts) Vu = Maximum Operating Voltage (e.g. 5.5 volts) B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.) The Constant, B, related to the failure mechanism is derived from either internal studies or industry accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are unknown. All deratings will be done from the stress voltage to the maximum operating voltage. Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by: Fr = X/(ts * AfV * AfT * N * 2) X = Chi-Sq statistical upper limit N = Life test sample size Rev B, 1/3/08 Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this device/process is: FAILURE RATE: MTTF (YRS): 13537 FITS: 8.4 DEVICE HOURS: 108660397 FAILS: 0 Only data from Operating Life or similar stresses are used for this calculation. The parameters used to calculate this failure rate are as follows: Cf: 60% Ea: 0.7 B: 0 Tu: 25 °C Vu: 5.5 Volts The reliability data follows. At the start of this data is the device information. The next section is the detailed reliability data for each stress. The reliability data section includes the latest data available and may contain some generic data. Bold Product Number denotes specific product data. Device Information: Process: Passivation: Die Size: Number of Transistors: Interconnect: Gate Oxide Thickness: SA E6H, 2P2M,HPVt,PF-Ring,TCZ,ALOCOS:GOI TEOS Oxide-Nitride Passivation 61.811024 x 75.19685 12187 Aluminum / 0.5% Copper 150 Å ESD HBM DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION ESD SENSITIVITY 0937 DS1341 WJ048116AB JESD22-A114 HBM 500 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 0937 DS1341 WJ048116AB JESD22-A114 HBM 1000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 0937 DS1341 WJ048116AB JESD22-A114 HBM 2000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 0937 DS1341 WJ048116AB JESD22-A114 HBM 4000 VOLTS 1 PUL'S 3 0 ESD SENSITIVITY 0937 DS1341 WJ048116AB JESD22-A114 HBM 8000 VOLTS 1 PUL'S 3 1 READPOIN QTY FAILS FA# No FA 1 Total: LATCH-UP DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION LATCH-UP I 0937 DS1341 WJ048116AB JESD78A, I-TEST 125C 6 0 LATCH-UP V 0937 DS1341 WJ048116AB JESD78A, V-SUPPLY TEST 125C 6 0 READPOIN Total: QTY FAILS FA# 0 OPERATING LIFE DESCRIPTION Rev B, 1/3/08 DATE CODE/PRODUCT/LOT CONDITION READPOIN QTY FAILS FA# HIGH TEMP OP LIFE 0925 DS21Q50 WK945230A 125C, 3.5 VOLTS 1000 HRS 77 0 HIGH TEMP OP LIFE 0947 DS1341 WD048116A 125C, 5.5 VOLTS 192 HRS 77 0 HIGH TEMP OP LIFE 1022 MAX34405 QD056611A 125C, 3.6 VOLTS 192 HRS 45 0 HIGH TEMP OP LIFE 1037 DS1340 WD157959A 125C, 5.5 VOLTS 192 HRS 77 0 Total: FAILURE RATE: Rev B, 1/3/08 MTTF (YRS): 13537 FITS: 8.4 DEVICE HOURS: 108660397 FAILS: 0 0