2/20/2013 PRODUCT RELIABILITY REPORT FOR MAX17042 Maxim Integrated 14460 Maxim Dr. Dallas, TX 75244 Approved by: Don Lipps Manager, Reliability Engineering Conclusion: The following qualification successfully meets the quality and reliability standards required of all Maxim Integrated products: MAX17042 In addition, Maxim Integrated's continuous reliability monitor program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor program can be viewed at http://www.maximintegrated.com/qa/reliability/monitor. Device Description: A description of this device can be found in the product data sheet. You can find the product data sheet at http://www.maximintegrated.com/search/parts.mvp. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms or their activation energies are unknown. All deratings will be done from the stress ambient temperature to the use ambient temperature. An exponential model will be used to determine the acceleration factor for failure mechanisms, which are voltage accelerated. AfV = exp(B*(Vs - Vu)) AfV = Acceleration factor due to Voltage Vs = Stress Voltage (e.g. 7.0 volts) Vu = Maximum Operating Voltage (e.g. 5.5 volts) B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.) The Constant, B, related to the failure mechanism is derived from either internal studies or industry accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are unknown. All deratings will be done from the stress voltage to the maximum operating voltage. Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by: Fr = X/(ts * AfV * AfT * N * 2) X = Chi-Sq statistical upper limit N = Life test sample size Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this device/process is: FAILURE RATE: MTTF (YRS): 3768 FITS: 30.3 DEVICE HOURS: 30241710 FAILS: 0 Only data from Operating Life or similar stresses are used for this calculation. The parameters used to calculate this failure rate are as follows: Cf: 60% Ea: 0.7 B: 0 Tu: 25 °C Vu: 5.5 Volts The reliability data follows. At the start of this data is the device information. The next section is the detailed reliability data for each stress. The reliability data section includes the latest data available and may contain some generic data. Bold Product Number denotes specific product data. Device Information: Process: Passivation: Die Size: Number of Transistors: Interconnect: Gate Oxide Thickness: Maxim X3 & SA Fabs S18C 3V & 5V CMOS, 4 metals SiN / SiO2 59 x 59 150045 Aluminum / 0.5% Copper 140Å ESD CDM DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION ESD SENSITIVITY 1051 MAX17042 XJ111300AC JESD22-C101 CDM 250 VOLTS 3 PUL'S 5 0 ESD SENSITIVITY 1051 MAX17042 XJ111300AC JESD22-C101 CDM 500 VOLTS 3 PUL'S 5 0 ESD SENSITIVITY 1051 MAX17042 XJ111300AC JESD22-C101 CDM 750 VOLTS 3 PUL'S 5 0 READPOIN QTY FAILS FA# 0 Total: ESD HBM DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 500 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 1000 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 1500 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 2000 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 2500 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 3000 VOLTS 1 PUL'S 5 0 READPOIN QTY FAILS FA# ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 3500 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A114 HBM 4000 VOLTS 1 PUL'S 5 0 0 Total: ESD MM DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A115 MM 50 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A115 MM 100 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A115 MM 150 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A115 MM 200 VOLTS 1 PUL'S 5 0 ESD SENSITIVITY 1247 MAX17042 ZX384937AL JESD22-A115 MM 250 VOLTS 1 PUL'S 5 0 READPOIN QTY FAILS FA# 0 Total: LATCH-UP DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION LATCH-UP I 1247 MAX17042 ZX384937AL JESD78A, I-TEST 25C 100mA 6 0 LATCH-UP I 1247 MAX17042 ZX384937AL JESD78A, I-TEST 25C 250mA 6 0 LATCH-UP V 1247 MAX17042 ZX384937AL JESD78A, V-SUPPLY TEST 25C 6 0 READPOIN QTY FAILS FA# 0 Total: OPERATING LIFE DESCRIPTION DATE CODE/PRODUCT/LOT CONDITION HIGH TEMP OP LIFE 1003 MAX17042 QJ000200DA 125C, 5.5 VOLTS 192 HRS 45 0 HIGH TEMP OP LIFE 1018 DS28E10 QH000900A 125C, 3.6 VOLTS 192 HRS 45 0 HIGH TEMP OP LIFE 1134 MAX17048 ZJ213800AB 125C, 5.0 VOLTS 192 HRS 77 0 READPOIN Total: FAILURE RATE: MTTF (YRS): 3768 FITS: 30.3 DEVICE HOURS: 30241710 FAILS: 0 QTY FAILS FA# 0 Cumulative monitor data for the S18 Process results in a FIT Rate of 0.05 @ 25C and 0.93 @ 55C (0.8 eV, 60% UCL). MAX17042, MAX17047, MAX17050 and MAX17051 are built with the identical die.